Testing device of laser ranging circuit

Abstract

The utility model relates to a testing device for a laser ranging circuit, belongs to the technical field of laser ranging, and solves the problems of inconvenience and low efficiency in testing the laser ranging circuit in the prior art. The testing device comprises a single-chip microcomputer embedded module and a serial port screen module. The single-chip microcomputer embedded module comprises an actual data receiving interface, a measurement data receiving interface and an output display interface. The actual data receiving interface is used for receiving actual distance data; the measurement data receiving interface is connected with the laser ranging circuit and is used for receiving measurement distance data; the output display interface is connected with the serial port screen module through a USART bus; and the serial port screen module is used for displaying the measured distance data and the actual distance data. And rapid and efficient testing of the laser ranging circuit is realized.

Description

Technical Field

[0001] The utility model relates to the technical field of laser distance measurement, in particular to a test device for a laser distance measurement circuit. Background Art

[0002] Laser ranging is the use of laser to accurately measure the distance to the target. When working, the laser rangefinder emits a laser beam to the target, and the photoelectric element receives the laser beam reflected by the target. The timer measures the time from the emission to the reception of the laser beam, and calculates the distance from the observer to the target.

[0003] After a certain period of use, the laser rangefinder may have a large error, so it is necessary to test it regularly and debug the laser rangefinder according to the test results. In the prior art, when debugging the laser rangefinder, a manual method is usually used, which is inefficient and inconvenient to test.

[0004] Therefore, there is an urgent need for a technical solution that can quickly and efficiently test the laser rangefinder. Utility Model Content

[0005] In view of the above analysis, the utility model aims to provide a test device for a laser ranging circuit, so as to solve the problems of inconvenience and low efficiency in testing the laser ranging circuit in the prior art.

[0006] The purpose of this utility model is mainly achieved through the following technical solutions:

[0007] The test device includes a single-chip embedded module and a serial port screen module;

[0008] The single-chip embedded module includes an actual data receiving interface, a measurement data receiving interface and an output display interface;

[0009] The actual data receiving interface is used to receive the actual distance data; the measurement data receiving interface is connected to the laser distance measurement circuit to receive the measurement distance data; the output display interface is connected to the serial port screen module through the USART bus;

[0010] The serial port screen module is used to display the measured distance data and the actual distance data.

[0011] Based on the further improvement of the above scheme, the test device also includes a power module, which includes a fuse FUSE1, an AC-DC power supply Power1, a DC-DC power supply Power2 and a linear voltage regulator integrator U1;

[0012] One end of the fuse FUSE1 is used as the positive input end of the power module, and the other end is connected to the negative input end of the AC-DC power supply Power1; the output end of the AC-DC power supply Power1 is used as the first output end of the power module, connected to the laser ranging circuit, and used to provide power to the laser ranging circuit;

[0013] The output end of the AC-DC power supply Power1 is connected to the input end of the DC-DC power supply Power2 at the same time; the output end of the DC-DC power supply Power2 serves as the second output end of the power module and is connected to the serial port screen module to provide power to the serial port screen module;

[0014] The output end of the DC-DC power supply Power2 is simultaneously connected to the input end of the linear voltage regulator integrator U1. The output end of the linear voltage regulator integrator U1 serves as the third output end of the power module and is connected to the single-chip embedded module to provide power to the single-chip embedded module.

[0015] Based on the further improvement of the above solution, the AC-DC power supply Power1 is S-75W-24V-3.1A, the DC-DC power supply Power2 is DPL6-W24S5FB-1, and the linear voltage regulator integrator U1 is AMS1117-3.3.

[0016] Based on the further improvement of the above solution, the power supply module further includes a first capacitor C1, a second capacitor C2 and a third capacitor C3;

[0017] The L port of the AC-DC power supply Power1 is connected to the other end of the fuse FUSE1, and the N port of the AC-DC power supply Power1 is used as the negative input terminal of the power module; the Vol port of the AC-DC power supply Power1 is used as the positive output terminal of the AC-DC power supply Power1, and the GND port of the AC-DC power supply Power1 is used as the negative output terminal of the AC-DC power supply Power1;

[0018] The +Vin port of the DC-DC power supply Power2 is connected to the positive output terminal of the AC-DC power supply Power1, and the -Vin port of the DC-DC power supply Power2 is connected to the negative output terminal of the AC-DC power supply Power1; the +5V port of the DC-DC power supply Power2 is connected to the serial port screen module, one end of the first capacitor C1, one end of the second capacitor C2 and the Vin port of the linear voltage regulator integrator U1, and the GND port of the DC-DC power supply Power2 is connected to the other end of the first capacitor C1, the other end of the second capacitor C2 and the GND port of the linear voltage regulator integrator U1;

[0019] The out port of the linear voltage regulator integrator U1 is connected to the single-chip embedded module and one end of the third capacitor C3 at the same time, and the other end of the third capacitor C3 is grounded.

[0020] Based on the further improvement of the above solution, the single-chip embedded module includes a fourth capacitor C4, a sixth capacitor C6, a second resistor R2, a CPU U3, a crystal oscillator JZ1 and a photoelectric isolation switch U2;

[0021] The PA6 port of the CPU U3 is connected to one end of the sixth capacitor C6 and ground at the same time, the other end of the sixth capacitor C6 is connected to the N port of the photoelectric isolation switch U2, the P port of the photoelectric isolation switch U2 is connected to one end of the second resistor R2, and the other end of the second resistor R2 is connected to the out port of the linear voltage regulator integrator U1; the D1 port of the photoelectric isolation switch U2 is connected to the laser ranging circuit for receiving the ranging signal, and the D2 port of the photoelectric isolation switch U2 is grounded;

[0022] The OSC_IN port of the CPU U3 is connected to the OUT port of the crystal oscillator JZ1, the GND port of the crystal oscillator JZ1 is grounded, the VCC port of the crystal oscillator JZ1 is connected to one end of the fourth capacitor C4, and the other end of the fourth capacitor C4 is grounded;

[0023] The PA2 and PA3 ports of CPU U3 are connected to the serial screen module respectively;

[0024] The PA11 and PA12 ports of CPU U3 are connected to the laser ranging circuit respectively.

[0025] Based on the further improvement of the above scheme, CPU U3 is JCER32F103Q-100, crystal oscillator JZ1 is JZPB-28-8-V3-A5-C3-D, and crystal oscillator JZ1 is GH3123J.

[0026] Based on the further improvement of the above scheme, the test device also includes an RS232 interface integrated circuit U4 and a CAN interface integrated circuit U5, the RS232 interface integrated circuit U4 is ER3232SS, and the CAN interface integrated circuit U5 is CTM1051AM;

[0027] The CPU U3 is connected to the serial port screen via the RS232 interface integrated circuit U4, and the CPU U3 is connected to the laser ranging circuit via the CAN interface integrated circuit U5.

[0028] Based on the further improvement of the above solution, the T1 IN port of the RS232 interface integrated circuit U4 is connected to the PA2 port of the CPU U3, and the T1 OUT port of the RS232 interface integrated circuit U4 is connected to the serial port screen;

[0029] The R1 OUT port of the RS232 interface integrated circuit U4 is connected to the PA3 port of the CPU U3, and the R1 IN port of the RS232 interface integrated circuit U4 is connected to the serial port screen.

[0030] Based on the further improvement of the above solution, the serial port screen module includes serial port screen Screen0, and the serial port screen Screen0 is DC10600B101-01CF-RTC;

[0031] The TXD port of the serial port screen Screen0 is connected to the R1 IN port of the RS232 interface integrated circuit U4; the RXD port of the serial port screen Screen0 is connected to the R1 OUT port of the RS232 interface integrated circuit U4;

[0032] The GND port of the serial port screen Screen0 is grounded, and the VCC port of the serial port screen Screen0 is connected to the +5V port of the DC-DC power supply Power2.

[0033] Based on the further improvement of the above solution, the TXD port of the CAN interface integrated circuit U5 is connected to the PA12 port of the CPU U3, and the RXD port of the CAN interface integrated circuit U5 is connected to the PA11 port of the CPU U3;

[0034] The CANL port and CANH port of the CAN interface integrated circuit U5 are connected to the laser ranging circuit via the CAN bus;

[0035] The VCC port of the CAN interface integrated circuit U5 is connected to the out port of the linear voltage regulator integrator U1 through the twelfth capacitor C12.

[0036] Compared with the prior art, the present invention can achieve at least one of the following beneficial effects:

[0037] 1. The actual distance data and the measured distance data are received through the single-chip embedded module to realize the rapid acquisition of the measurement data of the laser ranging circuit. The actual distance data and the measured distance data are displayed through the serial port screen, so that it can be intuitively seen whether the distance measurement of the laser ranging circuit under test meets the accuracy requirements, and the test is convenient;

[0038] 2. By setting up a multi-level power supply module, each level of voltage can work stably during the test, reducing the error caused by voltage instability in the laser ranging test and improving the test efficiency.

[0039] In the present invention, the above-mentioned technical solutions can also be combined with each other to achieve more preferred combination solutions. Other features and advantages of the present invention will be described in the following content, and some advantages can be obvious from the description or understood by implementing the present invention. The purpose and other advantages of the present invention can be achieved and obtained through the contents specifically pointed out in the text and the drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] The accompanying drawings are only used for the purpose of illustrating specific embodiments and are not to be considered as limiting the present invention. In the entire drawings, the same reference symbols represent the same components.

[0041] Figure 1 A schematic diagram of the structure of a test device for a laser ranging circuit provided in an embodiment of the utility model;

[0042] Figure 2 A schematic diagram of the structure of a power module provided in an embodiment of the utility model;

[0043] Figure 3 A schematic diagram of the structure of a single-chip embedded module provided by an embodiment of the utility model;

[0044] Figure 4 A schematic diagram of the structure of the RS232 interface integrated circuit provided by the embodiment of the utility model;

[0045] Figure 5 A schematic diagram of the structure of the serial port screen provided in the embodiment of the utility model;

[0046] Figure 6 A schematic diagram of the structure of a CAN interface integrated circuit provided in an embodiment of the utility model. DETAILED DESCRIPTION

[0047] The preferred embodiments of the present invention are described in detail below in conjunction with the accompanying drawings, wherein the accompanying drawings constitute a part of the present application and are used together with the embodiments of the present invention to illustrate the principles of the present invention, but are not used to limit the scope of the present invention.

[0048] A specific embodiment of the utility model discloses a test device for a laser ranging circuit, such as Figure 1 As shown, the test device includes a single-chip embedded module and a serial port screen module;

[0049] The single-chip embedded module includes an actual data receiving interface, a measurement data receiving interface and an output display interface;

[0050] The actual data receiving interface is used to receive the actual distance data; the measurement data receiving interface is connected to the laser distance measurement circuit to receive the measurement distance data; the output display interface is connected to the serial port screen module through the USART bus;

[0051] The serial port screen module is used to display the measured distance data and the actual distance data.

[0052] Specifically, Figure 1As shown, in the test device of the laser ranging circuit, the measurement data receiving interface of the single-chip embedded module is connected to the laser ranging circuit to receive the measured distance data of the target object by the laser ranging circuit. At the same time, the actual data receiving interface is used to receive the actual distance data of the target object. The actual distance data and the measured distance data are displayed through the serial port screen module to realize the test of the laser ranging circuit.

[0053] Preferably, if Figure 1 As shown, the testing device also includes a power supply module.

[0054] Specifically, Figure 2 As shown, the power module includes a fuse FUSE1, an AC-DC power supply Power1, a DC-DC power supply Power2 and a linear voltage regulator integrator U1;

[0055] One end of the fuse FUSE1 serves as the positive input end of the power module, and the other end is connected to the positive input end of the AC-DC power supply Power1; the output end of the AC-DC power supply Power1 serves as the first output end of the power module, and is connected to the laser ranging circuit to provide power to the laser ranging circuit;

[0056] The output end of the AC-DC power supply Power1 is connected to the input end of the DC-DC power supply Power2 at the same time; the output end of the DC-DC power supply Power2 serves as the second output end of the power module and is connected to the serial port screen module to provide power to the serial port screen module;

[0057] The output end of the DC-DC power supply Power2 is simultaneously connected to the input end of the linear voltage regulator integrator U1. The output end of the linear voltage regulator integrator U1 serves as the third output end of the power module and is connected to the single-chip embedded module to provide power to the single-chip embedded module.

[0058] Specifically, Figure 2 As shown, the input end of the power module can be directly connected to a household AC 220V power supply, which has a wider range of applications; the AC power supply is converted into a DC power supply through the AC-DC power supply Power1, and the 220V voltage is converted into a 24V voltage at the same time. The 24V voltage is connected to the DC-DC power supply Power2 in one way, and the 24V voltage is connected to the laser ranging circuit in another way to provide power for the laser ranging circuit. The DC-DC power supply Power2 converts the 24V voltage into a 5V voltage. The 5V voltage is divided into two ways, one of which is connected to the serial port screen module to provide power for the serial port screen module, and the other is connected to the linear voltage regulator integrator U1. The linear voltage regulator integrator U1 converts the 5V voltage into a 3.3V voltage and outputs it to the microcontroller embedded module to provide power.

[0059] Preferably, Figure 2As shown, the AC-DC power supply Power1 is S-75W-24V-3.1A, the DC-DC power supply Power2 is DPL6-W24S5FB-1, and the linear voltage regulator integrator U1 is AMS1117-3.3.

[0060] Preferably, if Figure 2 As shown, the power supply module also includes a first capacitor C1, a second capacitor C2 and a third capacitor C3;

[0061] The L port of the AC-DC power supply Power1 is connected to the other end of the fuse FUSE1, and the N port of the AC-DC power supply Power1 is used as the negative input terminal of the power module; the Vol port of the AC-DC power supply Power1 is used as the positive output terminal of the AC-DC power supply Power1, and the GND port of the AC-DC power supply Power1 is used as the negative output terminal of the AC-DC power supply Power1;

[0062] The +Vin port of the DC-DC power supply Power2 is connected to the positive output terminal of the AC-DC power supply Power1, and the -Vin port of the DC-DC power supply Power2 is connected to the negative output terminal of the AC-DC power supply Power1; the +5V port of the DC-DC power supply Power2 is connected to the serial port screen module, one end of the first capacitor C1, one end of the second capacitor C2 and the Vin port of the linear voltage regulator integrator U1, and the GND port of the DC-DC power supply Power2 is connected to the other end of the first capacitor C1, the other end of the second capacitor C2 and the GND port of the linear voltage regulator integrator U1;

[0063] The out port of the linear voltage regulator integrator U1 is connected to the single-chip embedded module and one end of the third capacitor C3 at the same time, and the other end of the third capacitor C3 is grounded.

[0064] It can be understood that by stabilizing the 5V voltage through the first capacitor C1 and the second capacitor C2 and stabilizing the 3.3V voltage through the third capacitor C3, a stable power supply environment can be provided to the test device, thereby improving the efficiency of the test device.

[0065] Preferably, if Figure 3 As shown, the single-chip embedded module includes a fourth capacitor C4, a sixth capacitor C6, a second resistor R2, a CPU U3, a crystal oscillator JZ1 and a photoelectric isolation switch U2;

[0066] The PA6 port of the CPU U3 is connected to one end of the sixth capacitor C6 and ground at the same time, the other end of the sixth capacitor C6 is connected to the N port of the photoelectric isolation switch U2, the P port of the photoelectric isolation switch U2 is connected to one end of the second resistor R2, and the other end of the second resistor R2 is connected to the out port of the linear voltage regulator integrator U1; the D1 port of the photoelectric isolation switch U2 is connected to the laser ranging circuit for receiving the ranging signal, and the D2 port of the photoelectric isolation switch U2 is grounded;

[0067] The OSC_IN port of the CPU U3 is connected to the OUT port of the crystal oscillator JZ1, the GND port of the crystal oscillator JZ1 is grounded, the VCC port of the crystal oscillator JZ1 is connected to one end of the fourth capacitor C4, and the other end of the fourth capacitor C4 is grounded;

[0068] The PA2 and PA3 ports of CPU U3 are connected to the serial screen module respectively;

[0069] The PA11 and PA12 ports of CPU U3 are connected to the laser ranging circuit respectively.

[0070] Specifically, the D1 port of the photoelectric isolator U2 is connected to the laser ranging circuit for receiving the ranging signal, which includes the measured distance data. The ranging signal KK is controlled by the photoelectric isolator U2 and transmitted to the CPU U3 for storage, and the measured distance data can be displayed on the serial port screen module.

[0071] Specifically, the PA2 port and PA3 port of the CPU U3 are connected to the serial screen through the serial port, and the content to be displayed is transmitted to the display screen module for display.

[0072] Specifically, the PA11 port and the PA12 port of the CPU U3 are connected to the laser ranging circuit via the CAN bus, thereby realizing communication between the CPU U3 and the laser ranging circuit.

[0073] Specifically, the crystal oscillator JZ1 provides a clock for the CPU U3, which can improve the accuracy of the test.

[0074] Preferably, CPU U3 is JCER32F103Q-100, crystal oscillator JZ1 is JZPB-28-8-V3-A5-C3-D, and crystal oscillator JZ1 is GH3123J.

[0075] Preferably, if Figure 4 and Figure 6 As shown, the test device also includes an RS232 interface integrated circuit U4 and a CAN interface integrated circuit U5, the RS232 interface integrated circuit U4 is ER3232SS, and the CAN interface integrated circuit U5 is CTM1051AM;

[0076] The CPU U3 is connected to the serial port screen via the RS232 interface integrated circuit U4, and the CPU U3 is connected to the laser ranging circuit via the CAN interface integrated circuit U5.

[0077] Specifically, the test device is provided with both an RS232 interface integrated circuit U4 and a CAN interface integrated circuit U5. The RS232 interface integrated circuit U4 is used to realize connection and communication with the serial port screen module, and the CAN interface integrated circuit U5 is used to realize connection and communication with the laser ranging circuit.

[0078] Preferably, if Figure 4 As shown, the T1 IN port of the RS232 interface integrated circuit U4 is connected to the PA2 port of the CPU U3, and the T1 OUT port of the RS232 interface integrated circuit U4 is connected to the serial port screen;

[0079] The R1 OUT port of the RS232 interface integrated circuit U4 is connected to the PA3 port of the CPU U3, and the R1 IN port of the RS232 interface integrated circuit U4 is connected to the serial port screen.

[0080] Specifically, Figure 4 As shown, capacitor C9 is connected between the C1+ port and C1- port of the RS232 interface integrated circuit U4; the V+ port of the RS232 interface integrated circuit U4 is connected to the 3.3V power supply through capacitor C8, and the V- port is connected to the ground terminal of the 3.3V power supply through capacitor C10; capacitor C11 is connected between the C2+ port and C2- port of the RS232 interface integrated circuit U4.

[0081] Preferably, if Figure 5 As shown, the serial port screen module includes serial port screen Screen0, and serial port screen Screen0 is DC10600B101-01CF-RTC;

[0082] The TXD port of the serial port screen Screen0 is connected to the R1 IN port of the RS232 interface integrated circuit U4; the RXD port of the serial port screen Screen0 is connected to the R1 OUT port of the RS232 interface integrated circuit U4;

[0083] The GND port of the serial port screen Screen0 is grounded, and the VCC port of the serial port screen Screen0 is connected to the +5V port of the DC-DC power supply Power2.

[0084] Preferably, if Figure 6 As shown, the TXD port of the CAN interface integrated circuit U5 is connected to the PA12 port of the CPU U3, and the RXD port of the CAN interface integrated circuit U5 is connected to the PA11 port of the CPU U3;

[0085] The CANL port and CANH port of the CAN interface integrated circuit U5 are connected to the laser ranging circuit via the CAN bus;

[0086] The VCC port of the CAN interface integrated circuit U5 is connected to the out port of the linear voltage regulator integrator U1 through the twelfth capacitor C12.

[0087] Specifically, Figure 6 As shown, the CANH port of the CAN interface integrated circuit U5 is connected to the laser ranging circuit through the resistor R4, and is also connected to the laser ranging circuit through the CANL port.

[0088] Compared with the prior art, the test device for the laser ranging circuit provided by the embodiment of the utility model receives the actual distance data and the measured distance data through the single-chip embedded module, realizes the rapid acquisition of the measured data of the laser ranging circuit, and displays the actual distance data and the measured distance data through the serial port screen, so that it can be intuitively seen whether the distance measurement of the laser ranging circuit under test meets the accuracy requirement, and the test is convenient; at the same time, by setting a multi-level power supply module, each level of voltage can work stably during the test process, reducing the error caused by voltage instability to the laser ranging test, and improving the test efficiency.

[0089] Those skilled in the art can understand that the program / software involved in the single-chip embedded module in the above embodiment is a common method in the prior art, such as running the test method for the laser ranging circuit in the prior art in the single-chip embedded module, and the present invention does not involve any improvement in software. The present invention only needs to connect each device with corresponding functions through the connection relationship given in the embodiment of the present invention, which does not involve any improvement in program software. As for the connection method between the hardware devices with corresponding functions, it can be implemented by those skilled in the art using the prior art, and will not be described in detail here.

[0090] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any changes or substitutions that can be easily thought of by any technician familiar with the technical field within the technical scope disclosed in the present invention should be included in the protection scope of the present invention.

Claims

1. A test device for a laser ranging circuit, characterized in that: The test device includes a single-chip embedded module and a serial port screen module; The single-chip embedded module includes an actual data receiving interface, a measurement data receiving interface and an output display interface; The actual data receiving interface is used to receive the actual distance data; the measurement data receiving interface is connected to the laser distance measurement circuit to receive the measurement distance data; the output display interface is connected to the serial port screen module through the USART bus; The serial port screen module is used to display the measured distance data and the actual distance data.

2. The testing device according to claim 1, characterized in that: The test device also includes a power module, which includes a fuse FUSE1, an AC-DC power supply Power1, a DC-DC power supply Power2 and a linear voltage regulator integrator U1; One end of the fuse FUSE1 serves as the positive input end of the power module, and the other end is connected to the positive input end of the AC-DC power supply Power1; the output end of the AC-DC power supply Power1 serves as the first output end of the power module, and is connected to the laser ranging circuit to provide power to the laser ranging circuit; The output end of the AC-DC power supply Power1 is connected to the input end of the DC-DC power supply Power2 at the same time; the output end of the DC-DC power supply Power2 serves as the second output end of the power module and is connected to the serial port screen module to provide power to the serial port screen module; The output end of the DC-DC power supply Power2 is simultaneously connected to the input end of the linear voltage regulator integrator U1. The output end of the linear voltage regulator integrator U1 serves as the third output end of the power module and is connected to the single-chip embedded module to provide power to the single-chip embedded module.

3. The testing device according to claim 2, characterized in that: The AC-DC power supply Power1 is S-75W-24V-3.1A, the DC-DC power supply Power2 is DPL6-W24S5FB-1, and the linear voltage regulator integrator U1 is AMS1117-3.

3.

4. The testing device according to claim 3, characterized in that: The power module also includes a first capacitor C1, a second capacitor C2 and a third capacitor C3; The L port of the AC-DC power supply Power1 is connected to the other end of the fuse FUSE1, and the N port of the AC-DC power supply Power1 is used as the negative input terminal of the power module; the Vol port of the AC-DC power supply Power1 is used as the positive output terminal of the AC-DC power supply Power1, and the GND port of the AC-DC power supply Power1 is used as the negative output terminal of the AC-DC power supply Power1; The +Vin port of the DC-DC power supply Power2 is connected to the positive output terminal of the AC-DC power supply Power1, and the -Vin port of the DC-DC power supply Power2 is connected to the negative output terminal of the AC-DC power supply Power1; The +5V port of the DC-DC power supply Power2 is connected to the serial port screen module, one end of the first capacitor C1, one end of the second capacitor C2 and the Vin port of the linear voltage regulator integrator U1, and the GND port of the DC-DC power supply Power2 is connected to the other end of the first capacitor C1, the other end of the second capacitor C2 and the GND port of the linear voltage regulator integrator U1; The out port of the linear voltage regulator integrator U1 is connected to the single-chip embedded module and one end of the third capacitor C3 at the same time, and the other end of the third capacitor C3 is grounded.

5. The testing device according to claim 4, characterized in that: The single-chip embedded module includes a fourth capacitor C4, a sixth capacitor C6, a second resistor R2, a CPU U3, a crystal oscillator JZ1 and a photoelectric isolation switch U2; The PA6 port of the CPU U3 is connected to one end of the sixth capacitor C6 and ground at the same time, the other end of the sixth capacitor C6 is connected to the N port of the photoelectric isolation switch U2, the P port of the photoelectric isolation switch U2 is connected to one end of the second resistor R2, and the other end of the second resistor R2 is connected to the out port of the linear voltage regulator integrator U1; the D1 port of the photoelectric isolation switch U2 is connected to the laser ranging circuit for receiving the ranging signal, and the D2 port of the photoelectric isolation switch U2 is grounded; The OSC_IN port of the CPU U3 is connected to the OUT port of the crystal oscillator JZ1, the GND port of the crystal oscillator JZ1 is grounded, the VCC port of the crystal oscillator JZ1 is connected to one end of the fourth capacitor C4, and the other end of the fourth capacitor C4 is grounded; The PA2 and PA3 ports of CPU U3 are connected to the serial screen module respectively; The PA11 and PA12 ports of CPU U3 are connected to the laser ranging circuit respectively.

6. The testing device according to claim 5, characterized in that: CPU U3 is JCER32F103Q-100, crystal oscillator JZ1 is JZPB-28-8-V3-A5-C3-D, and crystal oscillator JZ1 is GH3123J.

7. The testing device according to claim 5, characterized in that: The test device also includes an RS232 interface integrated circuit U4 and a CAN interface integrated circuit U5, wherein the RS232 interface integrated circuit U4 is ER3232SS and the CAN interface integrated circuit U5 is CTM1051AM; The CPU U3 is connected to the serial port screen via the RS232 interface integrated circuit U4, and the CPU U3 is connected to the laser ranging circuit via the CAN interface integrated circuit U5.

8. The testing device according to claim 7, characterized in that: The T1 IN port of the RS232 interface integrated circuit U4 is connected to the PA2 port of the CPU U3, and the T1 OUT port of the RS232 interface integrated circuit U4 is connected to the serial port screen; The R1 OUT port of the RS232 interface integrated circuit U4 is connected to the PA3 port of the CPU U3, and the R1 IN port of the RS232 interface integrated circuit U4 is connected to the serial port screen.

9. The testing device according to claim 8, characterized in that: The serial port screen module includes serial port screen Screen0, and serial port screen Screen0 is DC10600B101-01CF-RTC; The TXD port of the serial port screen Screen0 is connected to the R1 IN port of the RS232 interface integrated circuit U4; the RXD port of the serial port screen Screen0 is connected to the R1 OUT port of the RS232 interface integrated circuit U4; The GND port of the serial port screen Screen0 is grounded, and the VCC port of the serial port screen Screen0 is connected to the +5V port of the DC-DC power supply Power2.

10. The testing device according to claim 7, characterized in that: The TXD port of the CAN interface integrated circuit U5 is connected to the PA12 port of the CPU U3, and the RXD port of the CAN interface integrated circuit U5 is connected to the PA11 port of the CPU U3; The CANL port and CANH port of the CAN interface integrated circuit U5 are connected to the laser ranging circuit via the CAN bus; The VCC port of the CAN interface integrated circuit U5 is connected to the out port of the linear voltage regulator integrator U1 through the twelfth capacitor C12.

Images