Radian detection device

Abstract

The embodiment of the utility model provides a radian detection device, and relates to the technical field of heat dissipation. The radian detection device comprises a mounting plate, an X-direction detection piece and a Y-direction detection piece, the mounting plate is used for bearing a to-be-detected substrate, the X-direction detection piece is arranged on the mounting plate, the Y-direction detection piece is arranged in the mounting plate, and the to-be-detected substrate is sequentially placed on the X-direction detection piece and the Y-direction detection piece. Therefore, the X-direction detection piece and the Y-direction detection piece are respectively pressed down, so that the X-direction detection piece and the Y-direction detection piece respectively measure the radians of the to-be-detected substrate in the X direction and the Y direction. And after the bottom surface of the to-be-detected substrate is in contact with the X-direction detection piece and the Y-direction detection piece, the X-direction detection piece and the Y-direction detection piece are pressed under the action of self gravity, so that the X-direction detection piece and the Y-direction detection piece respectively measure the radians of the to-be-detected substrate in the X direction and the Y direction.

Description

Technical Field

[0001] The utility model relates to the technical field of heat dissipation, and in particular to a radian detection device. Background Art

[0002] In the current new energy vehicle industry, IGBT power modules are in a crucial position. As a component with the second highest cost after batteries, IGBT power modules are mainly responsible for the power conversion and energy control of the entire electric vehicle. The IGBT power module in the prior art mainly includes three components: a heat sink substrate, a DBC substrate and a silicon chip (including an IGBT chip and a diode chip). The heat sink substrate is the heat dissipation function structure and channel of the IGBT core. The heat sink substrate used in the car must have good thermal conductivity, a thermal expansion coefficient that matches the chip and copper-clad ceramic substrate and other components, as well as sufficient hardness and durability. The heat sink substrate often uses a copper flat-bottom heat sink substrate for indirect liquid cooling. A layer of thermal grease is applied under the heat sink substrate, which is tightly attached to the liquid cooling plate. The liquid cooling plate is connected to the coolant, and the heat dissipation path is chip-DBC substrate-flat-bottom heat sink substrate-thermal grease-liquid cooling plate-coolant. Therefore, it can be seen that the heat dissipation method of the heat sink substrate needs to be precisely fitted with the liquid cooling plate.

[0003] Since the heat dissipation substrate in the prior art may not be flat enough, resulting in insufficient close fit between the heat dissipation substrate and the liquid cooling plate, which ultimately leads to a poor heat dissipation effect, a device for quickly detecting the curvature of the heat dissipation substrate is proposed. Utility Model Content

[0004] The utility model provides a radian detection device, which can quickly detect the flatness of a heat dissipation substrate and quickly screen out abnormal heat dissipation substrates.

[0005] The embodiments of the present invention can be implemented as follows:

[0006] The embodiment of the utility model provides a radian detection device, which comprises:

[0007] A mounting plate, the mounting plate being used to carry a substrate to be inspected;

[0008] An X-direction detection member, the X-direction detection member is arranged on the mounting plate;

[0009] A Y-direction detection member, the Y-direction detection member is arranged on the mounting plate;

[0010] The substrate to be inspected is used to be placed on the X-direction detection member and the Y-direction detection member in sequence, thereby pressing down the X-direction detection member and the Y-direction detection member respectively, so that the X-direction detection member and the Y-direction detection member respectively measure the curvature of the substrate to be inspected in the X direction and in the Y direction.

[0011] Optionally, the X-direction detection component includes a first positioning structure and a first micrometer, the first positioning structure is arranged on the mounting plate along the X-axis direction, the first micrometer is inverted on the mounting plate, and the probe of the first micrometer is higher than the first positioning structure, and the substrate to be detected is used to press down the probe of the first micrometer, so as to measure the curvature of the substrate to be detected in the X-axis direction.

[0012] Optionally, the first positioning structure includes at least three first positioning pins, at least three first positioning pins are all arranged on the mounting plate, the probe of the first micrometer is located at the midpoint of the closed structure surrounded by at least three first positioning pins, and at least three first positioning pins are all used to contact the bottom surface of the substrate to be inspected to support the substrate to be inspected.

[0013] Optionally, the number of the first positioning pins is three, and the three first positioning pins are arranged in an isosceles triangle.

[0014] Optionally, the Y-direction detection component includes a second positioning structure and a second micrometer, the second positioning structure is arranged on the mounting plate along the Y-axis direction, the second micrometer is inverted on the mounting plate, and the probe of the second micrometer is higher than the second positioning structure, and the substrate to be detected is used to press down the probe of the second micrometer, so as to measure the curvature of the substrate to be detected in the Y-axis direction.

[0015] Optionally, the second positioning structure includes at least three second positioning pins, and the at least three second positioning pins are all arranged on the mounting plate. The probe of the second micrometer is located at the midpoint of the closed structure surrounded by the at least three second positioning pins, and the at least three second positioning pins are all used to contact the bottom surface of the substrate to be inspected to support the substrate to be inspected.

[0016] Optionally, the number of the second positioning pins is three, and the three second positioning pins are arranged in an isosceles triangle.

[0017] Optionally, the curvature detection device further comprises a limiting structure, wherein the limiting structure is arranged on the mounting plate, and the limiting structure is arranged outside the X-direction detection component and the Y-direction detection component.

[0018] Optionally, the curvature detection device further comprises a base, and the mounting plate is detachably disposed on the base.

[0019] Optionally, the curvature detection device further comprises a positioning clamp, wherein the positioning clamp is disposed on the base and is used to locate the position of the mounting plate.

[0020] The beneficial effects of the arc detection device of the embodiment of the utility model include, for example:

[0021] The radian detection device comprises a mounting plate, an X-direction detection member and a Y-direction detection member, wherein the mounting plate is used to carry a substrate to be detected, the X-direction detection member is arranged on the mounting plate, and the Y-direction detection member is arranged on the mounting plate, wherein the substrate to be detected is used to be placed on the X-direction detection member and the Y-direction detection member in sequence, thereby pressing down the X-direction detection member and the Y-direction detection member respectively, so that the X-direction detection member and the Y-direction detection member respectively measure the radian of the substrate to be detected in the X direction and in the Y direction. When in use, the substrate to be detected is placed on the X-direction detection member and the Y-direction detection member in sequence, and after the bottom surface of the substrate to be detected contacts the X-direction detection member and the Y-direction detection member, the X-direction detection member and the Y-direction detection member will be pressed down under the action of its own gravity, so that the X-direction detection member and the Y-direction detection member respectively measure the radian of the substrate to be detected in the X direction and in the Y direction, thereby quickly screening out the substrate to be detected with an uneven surface. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the utility model and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0023] Figure 1 A schematic diagram of the structure of the first viewing angle of the curvature detection device provided in this embodiment;

[0024] Figure 2 A schematic diagram of the structure of the curvature detection device provided by this embodiment at a second viewing angle;

[0025] Figure 3 This is a schematic structural diagram of the mounting plate, the X-direction detection member, the Y-direction detection member, and the limit structure provided in this embodiment.

[0026] Icons: 10-mounting plate; 11-first mounting hole; 12-second mounting hole; 20-X direction detection piece; 21-first positioning structure; 211-first positioning pin; 22-first micrometer; 30-Y direction detection piece; 31-second positioning structure; 311-second positioning pin; 32-second micrometer; 40-limiting structure; 50-base; 70-positioning clamp; 100-arc detection device. DETAILED DESCRIPTION

[0027] In order to make the purpose, technical scheme and advantages of the embodiments of the utility model clearer, the technical scheme in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model. Obviously, the described embodiments are part of the embodiments of the utility model, not all of the embodiments. Generally, the components of the embodiments of the utility model described and shown in the drawings here can be arranged and designed in various different configurations.

[0028] Therefore, the following detailed description of the embodiments of the present invention provided in the accompanying drawings is not intended to limit the scope of the present invention to be protected, but merely represents selected embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0029] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0030] In the description of the present utility model, it should be noted that if the terms "upper", "lower", "inside", "outside", etc. appear, the orientation or position relationship indicated is based on the orientation or position relationship shown in the accompanying drawings, or is the orientation or position relationship in which the utility model product is usually placed when used. It is only for the convenience of describing the utility model and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it cannot be understood as a limitation on the present utility model.

[0031] In addition, the terms “first”, “second”, etc., if used, are merely used to distinguish between the descriptions and should not be understood as indicating or implying relative importance.

[0032] It should be noted that, in the absence of conflict, the features in the embodiments of the present invention may be combined with each other.

[0033] In the current new energy vehicle industry, IGBT power modules are in a crucial position. As a component with the second highest cost after batteries, IGBT power modules are mainly responsible for the power conversion and energy control of the entire electric vehicle. The IGBT power module in the prior art mainly includes three components: a heat sink substrate, a DBC substrate and a silicon chip (including an IGBT chip and a diode chip). The heat sink substrate is the heat dissipation function structure and channel of the IGBT core. The heat sink substrate used in the car must have good thermal conductivity, a thermal expansion coefficient that matches the chip and copper-clad ceramic substrate and other components, as well as sufficient hardness and durability. The heat sink substrate often uses a copper flat-bottom heat sink substrate for indirect liquid cooling. A layer of thermal grease is applied under the heat sink substrate, which is tightly attached to the liquid cooling plate. The liquid cooling plate is connected to the coolant, and the heat dissipation path is chip-DBC substrate-flat-bottom heat sink substrate-thermal grease-liquid cooling plate-coolant. Therefore, it can be seen that the heat dissipation method of the heat sink substrate needs to be precisely fitted with the liquid cooling plate.

[0034] Since the heat dissipation substrate in the prior art may not be flat enough, resulting in insufficient close fit between the heat dissipation substrate and the liquid cooling plate, which ultimately leads to a poor heat dissipation effect, a device for quickly detecting the curvature of the heat dissipation substrate is proposed.

[0035] Please refer to Figure 1-Figure 3 This embodiment provides a curvature detection device 100, which can effectively improve the above-mentioned technical problems, can quickly detect the flatness of the heat dissipation substrate, and quickly screen out abnormal heat dissipation substrates.

[0036] Please refer to Figure 1-Figure 3 The curvature detection device 100 includes a mounting plate 10, an X-direction detection member 20 and a Y-direction detection member 30. The mounting plate 10 is used to carry a substrate to be detected. The X-direction detection member 20 is arranged on the mounting plate 10, and the Y-direction detection member 30 is arranged on the mounting plate 10. The substrate to be detected is used to be placed on the X-direction detection member 20 and the Y-direction detection member 30 in sequence, thereby pressing down the X-direction detection member 20 and the Y-direction detection member 30 respectively, so that the X-direction detection member 20 and the Y-direction detection member 30 respectively measure the curvature of the substrate to be detected in the X direction and in the Y direction.

[0037] Specifically, the heat dissipation method of the heat dissipation substrate in the prior art needs to be precisely fitted with the liquid cooling plate. If the curvature does not match, there may be a gap between the heat dissipation substrate and the liquid cooling plate, and the thermal grease may be unevenly applied, affecting the heat dissipation effect, thereby causing the module shell temperature to rise, affecting the service life and performance of the IGBT. In order to solve this technical problem, the curvature detection device 100 provided in this embodiment, when in use, places the substrate to be detected on the X-direction detection member 20 and the Y-direction detection member 30 in sequence. After the bottom surface of the substrate to be detected contacts the X-direction detection member 20 and the Y-direction detection member 30, the X-direction detection member 20 and the Y-direction detection member 30 will be pressed down under the action of its own gravity, so that the X-direction detection member 20 and the Y-direction detection member 30 respectively measure the curvature of the substrate to be detected in the X direction and the Y direction, thereby quickly screening out the substrate to be detected with an uneven surface.

[0038] Specifically, the curvature detection device 100 provided in this embodiment can quickly detect the curvature of a large number of heat dissipation substrates, and effectively screen out heat dissipation substrates with abnormal curvatures from entering production, thereby resulting in poor heat dissipation effect of the final product, affecting the service life and performance of the IGBT.

[0039] It should be noted that the X-direction detection member 20 includes a first positioning structure 21 and a first micrometer 22. The first positioning structure 21 is arranged on the mounting plate 10 along the X-axis direction. The first micrometer 22 is inverted on the mounting plate 10, and the probe of the first micrometer 22 is higher than the first positioning structure 21. The substrate to be detected is used to press down the probe of the first micrometer 22, so as to measure the curvature of the substrate to be detected in the X-axis direction. Among them, the first micrometer 22 is arranged below the mounting plate 10, and the mounting plate 10 is provided with a first mounting hole 11. When the first micrometer 22 is inverted below the mounting plate 10, the probe of the first micrometer 22 passes through the first mounting hole 11, so as to expose the surface of the mounting plate 10.

[0040] Specifically, the first micrometer 22 is fixed below the mounting plate 10 via a spacer block.

[0041] In this embodiment, the first positioning structure 21 includes at least three first positioning pins 211, and at least three first positioning pins 211 are all arranged on the mounting plate 10. The probe of the first micrometer 22 is located at the midpoint of the closed structure surrounded by at least three first positioning pins 211, and at least three first positioning pins 211 are all used to contact the bottom surface of the substrate to be detected to support the substrate to be detected. Among them, the vertex of the probe of the first micrometer 22 is higher than the vertex of the first positioning pin 211, so that the bottom surface of the substrate to be detected can accurately press down the probe of the first micrometer 22, thereby ensuring the accuracy of the detection.

[0042] Specifically, the number of the first positioning pins 211 is three, and the three first positioning pins 211 are arranged in an isosceles triangle. The straight line where the height of the isosceles triangle formed by the three first positioning pins 211 is located is arranged along the X-axis direction. In other embodiments, the number of the first positioning pins 211 can be increased or decreased, which is not specifically limited here.

[0043] It should also be explained that the Y-direction detection member 30 includes a second positioning structure 31 and a second micrometer 32. The second positioning structure 31 is arranged on the mounting plate 10 along the Y-axis direction. The second micrometer 32 is inverted on the mounting plate 10, and the probe of the second micrometer 32 is higher than the second positioning structure 31. The substrate to be detected is used to press down the probe of the second micrometer 32, so as to measure the curvature of the substrate to be detected in the Y-axis direction.

[0044] Specifically, the second positioning structure 31 includes at least three second positioning pins 311, and the at least three second positioning pins 311 are all arranged on the mounting plate 10. The probe of the second micrometer 32 is located at the midpoint of the closed structure surrounded by the at least three second positioning pins 311. The at least three second positioning pins 311 are all used to contact the bottom surface of the substrate to be inspected to support the substrate to be inspected.

[0045] The mounting plate 10 is provided with a second mounting hole 12 . When the second micrometer 32 is inverted below the mounting plate 10 , the probe of the second micrometer 32 passes through the second mounting hole 12 , thereby exposing the surface of the mounting plate 10 .

[0046] In this embodiment, the number of the second positioning pins 311 is three, and the three second positioning pins 311 are arranged in an isosceles triangle. The straight line where the height of the isosceles triangle formed by the three second positioning pins 311 is located is arranged along the Y-axis direction. In other embodiments, the number of the second positioning pins 311 can be increased or decreased, which is not specifically limited here.

[0047] Specifically, the mounting plate 10 is a square plate structure, and the first micrometer 22 and the second micrometer 32 are respectively arranged at intervals along the length direction of the mounting plate 10 .

[0048] In this embodiment, during the curvature detection of the same substrate to be detected, the first micrometer 22 and the second micrometer 32 need to detect the same detection point on the substrate to be detected. In order to ensure that the first micrometer 22 and the second micrometer 32 can detect the curvature of the same detection point, the curvature detection device 100 in this embodiment also includes a limiting structure 40, which is arranged on the mounting plate 10, and the limiting structure 40 is provided on the outside of the X-direction detection member 20 and the Y-direction detection member 30.

[0049] In this embodiment, the limiting structure 40 includes a plurality of limiting pins, which are respectively arranged at intervals on the outside of the first positioning structure 21 and the second positioning structure 31, wherein four limiting pins are respectively provided on the outside of the first positioning structure 21 and the second positioning structure 31, and the four limiting pins are used to limit the position of the substrate to be inspected, so that the first micrometer 22 and the second micrometer 32 can perform arc detection on the same detection point of the substrate to be inspected.

[0050] It should also be explained that the curvature detection device 100 also includes a base 50 and a positioning clamp 70. The mounting plate 10 is detachably arranged on the base 50. The positioning clamp 70 is arranged on the base 50. The positioning clamp 70 is used to locate the position of the mounting plate 10. There are six positioning clamps 70. The base 50 is a square plate structure. Three positioning clamps 70 are respectively arranged on the two long sides of the base 50. The positioning clamp 70 can fix mounting plates 10 of different sizes on the base 50 to prevent the mounting plate 10 from shaking, so that the mounting plate 10 can be quickly fitted with the base 50, thereby keeping the mounting plate 10 in a horizontal state. The mounting plate 10 and the base 50 of the curvature detection device 100 are detachably connected, and mounting plates 10 of different sizes can be replaced, so as to perform curvature detection on substrates to be detected of different sizes, saving costs.

[0051] Furthermore, the curvature detection device 100 also includes a support and a base plate, the top end of the support is connected to the base 50, and the bottom end of the support is connected to the base plate. The support can provide an installation space between the base 50 and the base plate, thereby facilitating the installation of the first micrometer 22 and the second micrometer 32.

[0052] In this embodiment, the number of the pillars is four, and the length of the pillars is 150 mm.

[0053] In summary, an embodiment of the utility model provides a curvature detection device 100, which includes a mounting plate 10, an X-direction detection member 20 and a Y-direction detection member 30. The mounting plate 10 is used to carry a substrate to be detected, the X-direction detection member 20 is arranged on the mounting plate 10, and the Y-direction detection member 30 is arranged on the mounting plate 10. The substrate to be detected is used to be placed on the X-direction detection member 20 and the Y-direction detection member 30 in sequence, thereby pressing down the X-direction detection member 20 and the Y-direction detection member 30 respectively, so that the X-direction detection member 20 and the Y-direction detection member 30 respectively measure the curvature of the substrate to be detected in the X direction and in the Y direction. When in use, the substrate to be inspected is placed on the X-direction detection member 20 and the Y-direction detection member 30 in sequence. After the bottom surface of the substrate to be inspected contacts the X-direction detection member 20 and the Y-direction detection member 30, the X-direction detection member 20 and the Y-direction detection member 30 are pressed down by their own gravity, so that the X-direction detection member 20 and the Y-direction detection member 30 respectively measure the curvature of the substrate to be inspected in the X direction and the Y direction, thereby quickly screening out substrates to be inspected with uneven surfaces.

[0054] The above is only a specific implementation of the utility model, but the protection scope of the utility model is not limited thereto. Any changes or substitutions that can be easily thought of by a person skilled in the art within the technical scope disclosed by the utility model should be included in the protection scope of the utility model. Therefore, the protection scope of the utility model should be based on the protection scope of the claims.

Claims

1. A curvature detection device, characterized in that: include: A mounting plate (10), wherein the mounting plate (10) is used to carry a substrate to be inspected; An X-direction detection member (20), wherein the X-direction detection member (20) is arranged on the mounting plate (10); A Y-direction detection member (30), wherein the Y-direction detection member (30) is arranged on the mounting plate (10); The substrate to be inspected is used to be placed on the X-direction detection member (20) and the Y-direction detection member (30) in sequence, thereby pressing down the X-direction detection member (20) and the Y-direction detection member (30) respectively, so that the X-direction detection member (20) and the Y-direction detection member (30) respectively measure the curvature of the substrate to be inspected in the X direction and in the Y direction.

2. The arc detection device according to claim 1, characterized in that: The X-direction detection member (20) comprises a first positioning structure (21) and a first micrometer (22); the first positioning structure (21) is arranged on the mounting plate (10) along the X-axis direction; the first micrometer (22) is inverted on the mounting plate (10); and a probe of the first micrometer (22) is higher than the first positioning structure (21); the substrate to be detected is used to press down the probe of the first micrometer (22), so as to measure the curvature of the substrate to be detected in the X-axis direction.

3. The arc detection device according to claim 2, characterized in that: The first positioning structure (21) comprises at least three first positioning pins (211), and the at least three first positioning pins (211) are all arranged on the mounting plate (10). The probe of the first micrometer (22) is located at the midpoint of a closed structure surrounded by the at least three first positioning pins (211), and the at least three first positioning pins (211) are all used to contact the bottom surface of the substrate to be inspected so as to support the substrate to be inspected.

4. The arc detection device according to claim 3, characterized in that: The number of the first positioning pins (211) is three, and the three first positioning pins (211) are arranged in an isosceles triangle.

5. The arc detection device according to claim 1, characterized in that: The Y-direction detection member (30) comprises a second positioning structure (31) and a second micrometer (32); the second positioning structure (31) is arranged on the mounting plate (10) along the Y-axis direction; the second micrometer (32) is inverted on the mounting plate (10); and a probe of the second micrometer (32) is higher than the second positioning structure (31); the substrate to be detected is used to press down the probe of the second micrometer (32), so as to measure the curvature of the substrate to be detected in the Y-axis direction.

6. The arc detection device according to claim 5, characterized in that: The second positioning structure (31) comprises at least three second positioning pins (311), and the at least three second positioning pins (311) are all arranged on the mounting plate (10). The probe of the second micrometer (32) is located at the midpoint of a closed structure surrounded by the at least three second positioning pins (311), and the at least three second positioning pins (311) are all used to contact the bottom surface of the substrate to be inspected so as to support the substrate to be inspected.

7. The arc detection device according to claim 6, characterized in that: The number of the second positioning pins (311) is three, and the three second positioning pins (311) are arranged in an isosceles triangle.

8. The arc detection device according to any one of claims 1 to 7, characterized in that: The curvature detection device (100) further comprises a limiting structure (40), wherein the limiting structure (40) is arranged on the mounting plate (10), and the limiting structure (40) is arranged outside the X-direction detection component (20) and the Y-direction detection component (30).

9. The arc detection device according to any one of claims 1 to 7, characterized in that: The curvature detection device (100) further comprises a base (50), and the mounting plate (10) is detachably arranged on the base (50).

10. The arc detection device according to claim 9, characterized in that: The curvature detection device (100) further comprises a positioning clamp (70), wherein the positioning clamp (70) is arranged on the base (50), and the positioning clamp (70) is used to locate the position of the mounting plate (10).

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