Single-channel photoelectric chip convenient to test

Abstract

The utility model relates to the technical field of chips, and provides a single-channel photoelectric chip convenient to test, which comprises a protective bottom frame, and the top of the protective bottom frame is provided with a protective top frame. According to the single-channel photoelectric chip convenient to test, the chip body can be placed on the top plate at the bottom of the chip body under the action of the arranged top plate and bottom plate which are opposite to each other on the chip body, and after the chip body slides outwards from the protective bottom frame through the top plate at the bottom, the front surface of the chip body can be detected through the test mechanism; and after the chip body is conveyed into the protection bottom frame again, the front surface of the chip body faces downwards and is in contact with the surface of the top plate at the bottom position through relative overturning of the two top plates, and the chip body is moved out of the protection bottom frame and the protection top frame again. Therefore, the reverse side position of the bottom of the chip body and the external pin part of the chip body can be detected more efficiently, and the detection efficiency of the whole chip is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of chips, and in particular to a single-channel photoelectric chip which is easy to test. Background Art

[0002] Optoelectronic chips, also known as optoelectronic integrated circuits, are a technology that integrates optoelectronic devices and electronic devices on the same chip. Optoelectronic chips can convert optical signals into electrical signals or convert electrical signals into optical signals, realizing the conversion and transmission between light and electricity.

[0003] A Chinese patent discloses an optoelectronic chip with the publication number CN213988907U. The article states that "the optoelectronic chip includes a circular photosensitive surface, the circular photosensitive surface includes an inner circle detection area and an outer ring detection area arranged concentrically, the inner circle detection area is divided into a plurality of independent inner circle areas, the outer ring detection area is divided into a plurality of independent outer ring areas; the outer ring detection area surrounds the inner circle detection area"; the optoelectronic chip increases the chip's own detection area to improve the accuracy of chip detection, and the chip itself is small in size. Before the chip is installed, its external pins are vertical to the ground, and the external pins also need to be connected and tested. The chip cannot be flipped over more effectively to facilitate complete detection of the external pins and the optoelectronic chip itself. Utility Model Content

[0004] The utility model aims to provide a single-channel optoelectronic chip that is easy to test, which solves the problem in the related art that the chip cannot be more effectively flipped during use to facilitate complete detection of external pins and the optoelectronic chip itself.

[0005] The technical solution of the utility model is as follows:

[0006] A single-channel optoelectronic chip that is easy to test comprises a protective bottom frame, a protective top frame is arranged on the top of the protective bottom frame, two ends of the protective bottom frame are rotatably connected to main rotating shafts through openings, two connecting rods are fixedly installed between the main rotating shafts, connecting plates are fixedly installed at both ends of the two connecting rods, a bottom rod is fixedly installed on one side of the connecting plate, a top rod is slidably connected to the outer side of the bottom rod, a bottom plate is fixedly installed on the bottom end of the top rod, the top of the bottom plate is slidably connected to the top plate, and a chip body is placed on the top of the top plate.

[0007] Preferably, a positioning outer plate is fixedly mounted on the other end of the top plate, and a plurality of first electric telescopic rods are fixedly mounted on the inner wall of the top end of the positioning outer plate.

[0008] Preferably, positioning inner plates are fixedly mounted on the telescopic ends of the plurality of first electric telescopic rods.

[0009] Preferably, a plurality of second electric telescopic rods are fixedly mounted on one side of the top of the bottom plate, and telescopic ends of the plurality of second electric telescopic rods are fixedly connected to one end of the top plate.

[0010] Preferably, a limit spring is fixedly mounted on one end of the bottom rod, and the other end of the limit spring is fixedly connected to one end of the inner wall of the top rod.

[0011] Preferably, a protective plate is rotatably connected to the outer side of the protective bottom frame.

[0012] Preferably, two placement holes are provided on the inner wall on the other side of the protective bottom frame.

[0013] Preferably, the inner walls of the two placement holes are rotatably connected with a connecting spring, and the other end of the connecting spring is rotatably connected to one side of the top of the protective plate.

[0014] Preferably, a plurality of rotating rings are fixedly mounted on one end of the protective bottom frame and the protective top frame, and the inner walls of the plurality of rotating rings are rotatably connected to rotating shafts.

[0015] Preferably, an operating shaft is fixedly mounted on one end of the main shaft.

[0016] Beneficial effects of the utility model:

[0017] By setting up two opposite top plates and bottom plates to act on the chip body, the chip body can be placed on the top plate at the bottom position therebetween. After the top plate slides out from the protective bottom frame at the bottom position, the front side of the chip body can be inspected by a testing mechanism. After the chip body is sent to the inside of the protective bottom frame again, the two top plates can be relatively flipped so that the front side of the chip body faces downward and contacts the surface of the top plate at the bottom position. After the protective bottom frame and the protective top frame are moved out again, the bottom reverse side of the chip body and the external pin part of the chip body can be inspected and processed more efficiently, thereby improving the overall chip inspection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The utility model is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0019] Figure 1 It is a schematic diagram of the overall structure of the utility model;

[0020] Figure 2 This is a schematic diagram of the structure of the rotating ring of the utility model;

[0021] Figure 3 This is a schematic diagram of the top plate structure of the utility model;

[0022] Figure 4 This is a schematic diagram of the internal structure of the top rod of the utility model;

[0023] Figure 5 This is a schematic diagram of the bottom plate structure of the utility model;

[0024] Figure 6 This is a schematic diagram of the structure of the protective plate of the utility model;

[0025] In the figure: 1. Protective bottom frame; 2. Protective top frame; 3. Main rotating shaft; 4. Connecting rod; 5. Connecting plate; 6. Bottom rod; 7. Top rod; 8. Bottom plate; 9. Top plate; 10. Chip body; 11. Positioning outer plate; 12. First electric telescopic rod; 13. Positioning inner plate; 14. Second electric telescopic rod; 15. Limiting spring; 16. Protective plate; 17. Placement hole; 18. Connecting spring; 19. Rotating ring; 20. Rotating shaft; 21. Operating shaft. DETAILED DESCRIPTION

[0026] The following will be combined with the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0027] See also Figure 1 , Figure 3 as well as Figure 6The present embodiment proposes a single-channel optoelectronic chip that is easy to test. In the process of testing the chip body 10, the protective bottom frame 1 is provided with a protective top frame 2 on the top of the protective bottom frame 1. The protective bottom frame 1 and the protective top frame 2 are used to protect the entire chip body 10 to prevent the chip body 10 from being damaged by the external pins on the chip body 10 during the testing movement, and to reduce the contact between the chip body 10 and the external environment, and reduce the adhesion and precipitation of dust on the chip body 10. The two ends of the protective bottom frame 1 are rotated through the openings. A main shaft 3 is connected, two connecting rods 4 are fixedly installed between the main shafts 3, connecting plates 5 are fixedly installed at both ends of the two connecting rods 4, a bottom rod 6 is fixedly installed on one side of the connecting plate 5, a top rod 7 is slidably connected to the outer side of the bottom rod 6, a bottom plate 8 is fixedly installed at the bottom end of the top rod 7, a top plate 9 is slidably connected to the top of the bottom plate 8, a chip body 10 is placed on the top of the top plate 9, the chip body 10 is placed between the two top plates 9, and the bottom of the chip body 10 contacts the top plate 9 at the bottom position, at this time, the top plate 9 and the bottom plate 8 are correspondingly fitted to keep the chip body 10 in the protective The bottom frame 1 has a protective function inside. When the chip body 10 needs to be inspected, the top plate 9 can slide on the bottom plate 8 to drive the chip body 10 facing up to slide out from the inside of the protective bottom frame 1. At this time, the front and side of the chip body 10 can be inspected. After the inspection is completed, the top plate 9 is reversely slid to be collected into the protective bottom frame 1 to continue to protect the chip body 10. When the back side and external pins of the chip body 10 need to be inspected, the main shaft 3 can be used to drive the connecting rod 4 and the connecting plate 5 to slide in the protective bottom frame 1. The rotation of the frame 1 and the protective top frame 2 allows the chip body 10 between the two top plates 9 to be turned over by the rotation of the overall structure of the protective top frame 2 and the protective bottom frame 1, so that the external pin part of the chip body 10 is placed upward, and the front of the chip body 10 contacts the top plate 9 at the bottom. At this time, the chip body 10 is driven to move outward again by the top plate 9. At this time, the chip body 10 is placed upward, which makes it easier to detect the chip body 10 as a whole, thereby improving the convenience of detecting the overall optoelectronic chip.

[0028] See also Figure 2 , Figure 4 as well as Figure 5The present embodiment provides a single-channel optoelectronic chip that is easy to test. When the chip body 10 needs to be installed, a positioning outer plate 11 is fixedly installed at the other end of the top plate 9. A plurality of first electric telescopic rods 12 are fixedly installed on the inner wall of the top end of the positioning outer plate 11. A positioning inner plate 13 is fixedly installed at the telescopic ends of the plurality of first electric telescopic rods 12. The chip body 10 can be driven to move outward through the top plate 9. At this time, the first electric telescopic rod 12 inside the positioning outer plate 11 slides toward the bottom end, so that the first electric telescopic rod 12 drives the positioning inner plate 13 to move out from the inside of the positioning outer plate 11. At the same time, the top plate 9 drives the chip body 10 to move, and the bottom end of the positioning inner plate 13 is connected with the front end of the desired installation position. The chip body 10 is touched to facilitate the positioning operation of the position where the chip body 10 is required to be installed. At this time, the chip body 10 is grabbed and kept motionless, and the chip body 10 is separated from the top plate 9 by the reverse sliding of the top plate 9. After the chip body 10 is separated from the top plate 9, it is easier to insert the external pin part of the chip body 10 into the required installation structure for installation, thereby preventing the chip body 10 and the external pins from being damaged due to the crooked insertion of the external pins. A plurality of second electric telescopic rods 14 are fixedly installed on one side of the top of the bottom plate 8, and the telescopic ends of the plurality of second electric telescopic rods 14 are fixedly connected to one end of the top plate 9. The top plate 9 can be moved in the telescopic belt between the top plate 9 and the bottom plate 8 by the second electric telescopic rods 14 The chip body 10 is moved outward from the inside of the protective bottom frame 1, and a limit spring 15 is fixedly installed at one end of the bottom rod 6, and the other end of the limit spring 15 is fixedly connected to one end of the inner wall of the top rod 7. The limit spring 15 acts between the bottom rod 6 and the top rod 7, so that the chip body 10 is more convenient to be prevented between the two top plates 9. The outer side of the protective bottom frame 1 is rotatably connected with a protective plate 16, and the inner wall of the other side of the protective bottom frame 1 is provided with two placement holes 17. The inner walls of the two placement holes 17 are rotatably connected with a connecting spring 18, and the other end of the connecting spring 18 is rotatably connected to one side of the top of the protective plate 16. When the chip body 10 moves outward, the positioning outer plate 11 can push the protective plate 16, so that the protective plate 16 can be used to prevent the chip body 10 from moving outward. The chip body 10 slides to the outside of the protective bottom frame 1, and the protective plate 16 rotates outward, so that the top plate 9 drives the chip body 10 to move outside the protective bottom frame 1. When the top plate 9 is retracted into the protective bottom frame 1, the protective plate 16 can be manually pulled downward, so that after the top plate 9 is retracted into the protective bottom frame 1, the protective plate 16 is kept in contact with the outside of the protective bottom frame 1 through the action of the connecting spring 18. One end of the protective bottom frame 1 and the protective top frame 2 are fixedly installed with multiple rotating rings 19, and the inner walls of the multiple rotating rings 19 are rotatably connected with a rotating shaft 20. The rotating shaft 20 and the rotating ring 19 can facilitate the opening and closing of the protective bottom frame 1 and the protective top frame 2. One end of the main rotating shaft 3 is fixedly installed with an operating shaft 21.

[0029] In the present embodiment, when in use, the chip body 10 is first placed between the two top plates 9, and the bottom of the chip body 10 contacts the top plate 9 at the bottom position. When it is necessary to inspect the front of the chip body 10, the chip body 10 can be driven by the top plate 9 to slide out from the inside of the protective bottom frame 1. After the inspection is completed, it slides in the opposite direction to be collected into the inside of the protective bottom frame 1, and continues to play a protective role during the movement of the chip body 10. When the back side of the chip body 10 is inspected, the main rotating shaft 3 can be used to drive the overall structure inside the protective bottom frame 1 and the protective top frame 2 to flip, so that the external pins of the chip body 10 between the top plates 9 are rotated to face upward, and the front of the chip body 10 contacts the top plate 9 at the bottom position, so that when the top plate 9 drives the chip body 10 to slide outward, it is easier to perform inspection operations on the bottom part and the external pin part of the chip body 10, thereby improving the convenience of the overall structure in performing inspection operations on the optoelectronic chip.

[0030] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A single-channel optoelectronic chip that is easy to test, comprising a protective bottom frame (1), a protective top frame (2) being arranged on the top of the protective bottom frame (1), characterized in that: The two ends of the protective bottom frame (1) are rotatably connected to the main rotating shaft (3) through openings, two connecting rods (4) are fixedly installed between the main rotating shafts (3), and connecting plates (5) are fixedly installed at both ends of the two connecting rods (4). A bottom rod (6) is fixedly installed on one side of the connecting plate (5), and a top rod (7) is slidably connected to the outer side of the bottom rod (6). A bottom plate (8) is fixedly installed at the bottom end of the top rod (7), and a top plate (9) is slidably connected to the top of the bottom plate (8), and a chip body (10) is placed on the top of the top plate (9).

2. A single-channel optoelectronic chip that is easy to test according to claim 1, characterized in that: A positioning outer plate (11) is fixedly mounted on the other end of the top plate (9), and a plurality of first electric telescopic rods (12) are fixedly mounted on the inner wall of the top end of the positioning outer plate (11).

3. A single-channel optoelectronic chip that is easy to test according to claim 2, characterized in that: Positioning inner plates (13) are fixedly mounted on the telescopic ends of the plurality of first electric telescopic rods (12).

4. A single-channel optoelectronic chip that is easy to test according to claim 1, characterized in that: A plurality of second electric telescopic rods (14) are fixedly mounted on one side of the top of the bottom plate (8), and the telescopic ends of the plurality of second electric telescopic rods (14) are fixedly connected to one end of the top plate (9).

5. The single-channel optoelectronic chip that is easy to test according to claim 1, characterized in that: A limit spring (15) is fixedly mounted on one end of the bottom rod (6), and the other end of the limit spring (15) is fixedly connected to one end of the inner wall of the top rod (7).

6. The single-channel optoelectronic chip that is easy to test according to claim 1, characterized in that: The outer side of the protective bottom frame (1) is rotatably connected with a protective plate (16).

7. A single-channel optoelectronic chip that is easy to test according to claim 6, characterized in that: Two placement holes (17) are provided on the inner wall of the other side of the protective bottom frame (1).

8. The single-channel optoelectronic chip that is easy to test according to claim 7, characterized in that: The inner walls of the two placement holes (17) are rotatably connected with a connecting spring (18), and the other end of the connecting spring (18) is rotatably connected to one side of the top of the protective plate (16).

9. The single-channel optoelectronic chip that is easy to test according to claim 1, characterized in that: A plurality of rotating rings (19) are fixedly mounted on one end of the protective bottom frame (1) and the protective top frame (2), and the inner walls of the plurality of rotating rings (19) are rotatably connected to rotating shafts (20).

10. The single-channel optoelectronic chip that is easy to test according to claim 1, characterized in that: An operating shaft (21) is fixedly mounted on one end of the main rotating shaft (3).

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