Sample polishing and grinding tool

By designing a sample polishing tool with an independent pivot reference platform and open/close fixture, the problem of cumbersome sample alignment operation and large errors in the prior art is solved, and a more efficient sample alignment and polishing process is achieved.

CN222891062UActive Publication Date: 2025-05-23NINGBO XUSHENG AUTO TECH CO LTD
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Patent Information

Application Number
CN202421524403.1
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-06-28
Publication Date
2025-05-23
Estimated Expiration
2034-06-28

AI Technical Summary

Technical Problem

When the existing sample grinding tool holds multiple samples at the same time, adjusting the height of the sample is cumbersome and operating errors exist, which affects the working efficiency.

Method used

A sample polishing tool including a fixture and a reference platform is designed. The fixture is equipped with an opening/closing mechanism and the reference platform that can be pivoted independently. By rotating the reference platform to a preset position and the fixture is in an open state, the sample to be processed is aligned to the same polishing plane by gravity.

Benefits of technology

Simpler operations are achieved to align the planes to be processed for multiple samples to the required plane, improving work efficiency and reducing operating errors.

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Abstract

The utility model relates to a sample polishing and grinding tool, which comprises a clamp, and is characterized in that the clamp is provided with an opening / closing mechanism for inserting at least two samples to be processed, and is also provided with a reference platform which can independently pivot relative to the clamp and is provided with a reference plane, when the reference platform rotates to a preset position and is in an open state through the opening / closing mechanism, each sample to be machined can fall onto the reference platform under the action of the gravity of the sample to be machined so as to be located on the same polishing and grinding surface. The sample polishing and grinding tool has the advantages that through the reference platform which can independently pivot relative to the clamp, when the reference platform rotates to a preset position and the clamp is in an open state, all the samples to be machined are aligned to the same polishing and grinding plane under the action of the gravity of the samples to be machined; and the operation is relatively simple, convenient and fast.
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Description

Technical Field

[0001] The utility model relates to the technical field of grinding or polishing devices, in particular to a tooling which is convenient for polishing a sample. Background Art

[0002] At present, metallographic inspection is often used to determine the physical and mechanical properties of metal materials. Before metallographic inspection, it is usually necessary to grind and polish one of the planes of the plate sample, and then use a microscope to perform metallographic inspection on the plane. The traditional polishing method is that the operator holds a single sample on the polishing equipment. On the one hand, this method is less efficient when there are a large number of samples to be polished; on the other hand, since some samples are small, they may not be held steadily during the polishing process.

[0003] To this end, there are tools in the prior art that can clamp multiple samples at the same time. However, since each sample is usually obtained by cutting a whole plate into small pieces, the sizes of different samples may not be the same. This results in that when multiple samples are clamped and fixed at the same time, it is difficult to directly align the processing surfaces of each sample on the same plane, which may greatly extend the time for polishing multiple samples at the same time, thereby reducing work efficiency.

[0004] In view of the above defects, there is a fixture in the prior art, such as the one disclosed in the Chinese utility model patent "A small inspection specimen processing grinder fixture" with patent number CN202221401400.X (publication number CN218017867U). This type of fixture can not only clamp multiple specimens at the same time, but also align the processing planes of multiple specimens to one plane by adjusting the height of any one specimen separately.

[0005] However, this type of tooling still has certain defects in actual use. Specifically, since multiple samples are clamped at the same time, the method of aligning the processing planes of multiple samples to one plane by adjusting the height of any sample individually is relatively cumbersome and inefficient, and there will be large operating errors, making it difficult to ensure that the processing planes of multiple samples are indeed aligned, especially when a large number of samples are clamped at the same time. The above defects will be more obvious. Therefore, it is necessary to further improve the existing sample polishing tooling. Utility Model Content

[0006] The technical problem to be solved by the utility model is to provide another sample polishing tool for the above-mentioned existing technical status, and the tool can realize the alignment of the to-be-processed planes of multiple samples to the required planes with simpler operation.

[0007] The technical solution adopted by the utility model to solve the first technical problem is: the sample polishing tool includes a clamp, which is characterized in that: the clamp is provided with an opening / closing mechanism for inserting at least two samples to be processed, and is also provided with a reference platform that can pivot independently relative to the clamp and has a reference plane. When the reference platform is rotated to a preset position and is in an open state through the opening / closing mechanism, each of the samples to be processed can fall onto the reference platform by relying on its own gravity to be on the same polishing surface.

[0008] In order to enable the clamp to be closed to clamp the sample to be processed and to be opened to release the sample to be processed, preferably, the clamp includes a first clamping plate and a second clamping plate arranged opposite to each other, and the opening / closing mechanism is the same mechanism, which is used to open / close the clamp by operating the first clamping plate or the second clamping plate forward or backward relative to each other, and the reference platform is pivoted on the first clamping plate and / or the second clamping plate. When the clamp is in an open state, it means that the clamp does not clamp the sample to be processed; and when the clamp is in a closed state, it means that the clamp has clamped the sample to be processed.

[0009] In order to enable the opening / closing mechanism to open / close the clamp, preferably, the opening / closing mechanism includes a bolt for connecting the first clamping plate and the second clamping plate, and correspondingly, also includes a nut adapted to the bolt, so that the first clamping plate or the second clamping plate can move forward or backward relative to each other. Through the cooperation of the bolt and the nut, the first clamping plate and the second clamping plate can be moved away from each other to open the clamp, or moved closer to each other to close the clamp.

[0010] Further, in order to facilitate the operation of the operator, preferably, the head of the bolt and / or nut is provided with a butterfly structure. Using the butterfly bolt and / or butterfly nut allows the operator to open / close the clamp directly by hand-tightening.

[0011] In order to prevent multiple samples to be processed from scattering when the clamp is opened, preferably, the reference platform is provided with a wall portion extending at least partially along the periphery of the reference plane, the wall portion faces the clamp, and the wall portion and the reference platform also jointly surround a receiving space, which is used to receive each sample to be processed when the clamp is in the open state. Such a design is considered that since the clamp clamps multiple samples to be processed at the same time, when the clamp is opened, multiple samples to be processed fall together and may scatter in various directions, so the receiving space is provided to prevent multiple samples to be processed from scattering when the clamp is opened.

[0012] Furthermore, in order to enable the reference platform to rotate to a preset position, preferably, the reference platform is an L-shaped plate structure, wherein the receiving space is provided on the transverse part, and both sides of the end of the vertical part partially extend outward to form a rotation axis, and correspondingly, a mating portion adapted to the rotation axis is provided on the first clamping plate so that the reference platform can be rotated around the rotation axis to a preset position.

[0013] In order to prevent the reference platform from affecting the polishing work, preferably, the first clamping plate is also provided with a locking mechanism capable of locking the reference platform in the storage position. If the reference platform is always in the preset position, the reference platform will interfere with the polishing equipment when the sample to be processed is polished. Therefore, the locking mechanism needs to be provided so that when the reference platform rotates around the rotation axis from the preset position back to the storage position, the reference platform can be locked in the storage position to prevent the reference platform from affecting the polishing work.

[0014] In order to enable the locking mechanism to lock the reference platform, preferably, the locking mechanism includes a locking piece in the shape of a pin, and a buckle structure is provided at the end facing the reference platform, and correspondingly, the first clamping plate is provided with a channel for the locking piece to slide, and an elastic piece is provided in the channel, so that the locking piece always has a tendency to move along the channel toward the direction close to the reference platform. The channel can be, for example, a channel opened on the first clamping plate, and can accommodate a partial locking piece, and can guide the movement of the locking piece, and according to actual needs, the end of the locking piece can also be a structure such as a locking pin, a buckle, etc. to lock the reference platform.

[0015] In order to enable the locking member to release the reference platform, preferably, the locking member is at least partially protruded to form a triggering portion, and correspondingly, the side wall of the channel is provided with a hollow portion for the triggering portion to pass through, and when the triggering portion is triggered by the operator, the locking member can be carried to move in a direction away from the reference platform. Such a design is based on the consideration that if the triggering portion is not provided, it is inconvenient for the operator to release the reference platform, and the provision of the triggering portion can facilitate the operator to move the locking member away from the reference platform to release the reference platform.

[0016] In order to enable the reference platform to rotate to the preset position by itself, preferably, a torsion spring is provided on the rotation axis, and the torsion spring makes the reference platform always have a tendency to rotate around the rotation axis from the storage position toward the preset position. Such a design, on the one hand, enables the reference platform to rotate to the preset position by itself after being released by the locking mechanism, and on the other hand, enables the reference platform to remain in the preset position.

[0017] Compared with the prior art, the advantages of the present invention are that the sample polishing and grinding tooling has a reference platform that can pivot independently relative to the fixture. When the reference platform is rotated to a preset position and the fixture is in an open state, each sample to be processed is aligned on the same polishing plane by relying on its own gravity. The operation is relatively simple, convenient and quick. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 This is a schematic diagram of the structure of the sample polishing tool in the embodiment of the utility model;

[0019] Figure 2 It is a schematic diagram of the exploded structure of the sample polishing tooling in the embodiment of the utility model;

[0020] Figure 3 This is a schematic diagram of the structure of the reference platform in the embodiment of the utility model;

[0021] Figure 4 This is a schematic diagram of the structure of the locking member in the embodiment of the utility model;

[0022] Figure 5 This is a schematic diagram of the structure of the first clamping plate in the embodiment of the utility model;

[0023] Figure 6 This is a schematic diagram of the structure of the locking mechanism in the embodiment of the utility model;

[0024] Figure 7 It is a structural schematic diagram of the reference platform in the embodiment of the utility model when it is located at the storage position;

[0025] Figure 8 It is a structural schematic diagram of another angle when the reference platform is located at the storage position in the embodiment of the utility model;

[0026] Fig. 9 It is a schematic diagram of the state when the fixture in the embodiment of the utility model clamps a plurality of samples to be processed and the reference platform is located in the storage position;

[0027] Fig.10 It is a schematic diagram of another angle of state when the fixture in the embodiment of the utility model clamps a plurality of samples to be processed and the reference platform is located in the storage position;

[0028] Fig.11 It is a schematic diagram of the state when the fixture in the embodiment of the utility model clamps a plurality of samples to be processed and the reference platform is located at a preset position. DETAILED DESCRIPTION

[0029] The present invention is further described in detail below in conjunction with specific embodiments.

[0030] like Figures 1 to 8The sample polishing tool in this embodiment includes a fixture 1, see Figure 1 , Figure 2 , the fixture 1 is provided with an opening / closing mechanism 2 for inserting at least two samples M to be processed, and is also provided with a reference platform 3 which can be independently pivoted relative to the fixture 1 and has a reference plane N. When the reference platform 3 is rotated to a preset position and the opening / closing mechanism 2 is in an open state, each sample M to be processed can fall to the reference platform 3 by its own gravity to be on the same polishing surface. Specifically, in order to enable the fixture 1 to be closed to clamp the sample M to be processed and to be opened to release the sample M to be processed, the fixture 1 in this embodiment includes a first clamping plate 11 and a second clamping plate 12 arranged oppositely, and the opening / closing mechanism 2 is the same mechanism, which is used to open / close the fixture 1 by operating the first clamping plate 11 or the second clamping plate 12 forward or backward relative to each other, and the reference platform 3 is pivoted on the first clamping plate 11 and / or the second clamping plate 12. When the fixture 1 is in an open state, it means that the fixture 1 does not clamp the sample M to be processed; and when the fixture 1 is in a closed state, it means that the fixture 1 has clamped the sample M to be processed. Furthermore, the opening / closing mechanism 2 in this embodiment includes a bolt 21 for connecting the first clamping plate 11 and the second clamping plate 12, and correspondingly, also includes a nut 22 adapted to the bolt 21, so that the first clamping plate 11 or the second clamping plate 12 can move forward or backward relative to each other. And in order to facilitate the operation of the operator, the head of the bolt 21 and / or the nut 22 is provided with a butterfly structure, and the nut 22 in this embodiment is a butterfly nut, so that the operator can directly open / close the clamp 1 by hand-tightening.

[0031] like Figure 3As shown, in order to prevent multiple samples M to be processed from being scattered when the clamp 1 is opened, a wall portion 31 extending at least partially along the periphery of the reference plane N is further provided on the reference platform 3, the wall portion 31 faces the clamp 1, and the wall portion 31 and the reference platform 3 also jointly surround a receiving space 32, which is used to receive each sample M to be processed when the clamp is in the open state. Such a design is based on the consideration that since the clamp 1 clamps multiple samples M to be processed at the same time, when the clamp 1 is opened, the multiple samples M to be processed fall together and may be scattered in various directions, so the receiving space 32 is provided to prevent multiple samples M to be processed from being scattered when the clamp 1 is opened. Specifically, the reference platform 3 in the present embodiment is an L-shaped plate-like structure, wherein a receiving space 32 is provided on the transverse portion, and a rotation axis 33 is partially extended outward on both sides of the end of the vertical portion. Correspondingly, a fitting portion 13 adapted to the rotation axis 33 is provided on the first clamping plate 11 so that the reference platform 3 can rotate around the rotation axis 33 to a preset position. In order to prevent the reference platform 3 from affecting the polishing work, a locking mechanism 14 capable of locking the reference platform 3 in a storage position is also provided on the first clamping plate 11. If the reference platform 3 is always located in the preset position, interference with the reference platform 3 will occur when the polishing equipment is used to perform polishing work on the sample M to be processed. Therefore, the locking mechanism 14 needs to be provided so that when the reference platform 3 rotates from the preset position around the rotation axis 33 back to the storage position, the reference platform 3 can be locked in the storage position to prevent the reference platform 3 from affecting the polishing work. Figure 7 , Figure 8 As shown, at this time, the reference platform 3 is located in the storage position, and an inclination angle α is formed between the reference platform 3 and the horizontal plane. The inclination angle α in this embodiment is 55°. In this way, the reference platform 3 can be prevented from interfering with the polishing equipment. If necessary, the reference platform 3 can also be used to hold the polishing work.

[0032] Specifically, in order to enable the locking mechanism 14 to lock the reference platform 3, the locking mechanism 14 in this embodiment includes a pin-shaped locking member 141, and a buckle structure is provided at the end facing the reference platform 3. Correspondingly, the first clamping plate 11 is provided with a channel 15 for the locking member 141 to slide, and an elastic member 142 is provided in the channel 15, so that the locking member 141 always has a tendency to move along the channel 15 toward the direction close to the reference platform 3. Figure 4 As shown, in order to enable the locking member 141 to release the reference platform 3, the locking member 141 is at least partially protruded to form a triggering portion 143. Correspondingly, the side wall of the channel 15 is provided with a hollow portion 16 for the triggering portion 143 to pass through. When the triggering portion 143 is triggered by the operator, the locking member 141 can be moved away from the reference platform 3. This design can facilitate the operator to move the locking member 141 away from the reference platform 3 to release the reference platform 3. In addition, referring to Figure 5 , Figure 6 , the channel 15 and the hollow part 16 in this embodiment can also limit the moving path of the locking member 141. In order to enable the reference platform 3 to rotate to the preset position by itself, a torsion spring 34 is provided on the rotating shaft 33 in this embodiment, and the torsion spring 34 makes the reference platform 3 always have a tendency to rotate from the storage position to the preset position around the rotating shaft 33. Such a design, on the one hand, enables the reference platform 3 to rotate to the preset position by itself after being released by the locking mechanism 14, and on the other hand, it can also keep the reference platform 3 at the preset position.

[0033] The specific use process of the sample polishing tool provided in this embodiment is as follows:

[0034] like Fig. 9 As shown, at this time, the fixture 1 clamps a plurality of samples M to be processed, and the reference platform 3 is located in the storage position. Fig.10 , the states of the multiple samples M to be processed can be observed more intuitively. At this time, the samples M to be processed are not on the same polishing plane, and if the clamp 1 is opened, that is, when the gap H appears, the samples M to be processed will fall under the action of gravity; therefore, it is necessary to first release the locking mechanism 14 to the reference platform 3, such as Fig.11 As shown, the reference platform 3 is rotated to a preset position, and then each sample M to be processed will be aligned to the same polishing plane under the action of gravity, and then the fixture 1 is closed, and the reference platform 3 is rotated back to the storage position to start processing.

Claims

1. A specimen polishing tool, comprising a fixture (1), characterized in that: The clamp (1) is provided with an opening / closing mechanism (2) for inserting at least two samples to be processed (M), and is also provided with a reference platform (3) which can be independently pivoted relative to the clamp (1) and has a reference plane (N). When the reference platform (3) is rotated to a preset position and the opening / closing mechanism (2) is in an open state, each of the samples to be processed (M) can fall onto the reference platform (3) by its own gravity to be on the same polishing surface.

2. The sample polishing tool according to claim 1, characterized in that: The clamp (1) comprises a first clamp (11) and a second clamp (12) which are arranged opposite to each other, and the opening / closing mechanism (2) is the same mechanism, which is used to open / close the clamp (1) by operating the first clamp (11) or the second clamp (12) forward or backward relative to each other, and the reference platform (3) is pivoted on the first clamp (11) and / or the second clamp (12).

3. The sample polishing tool according to claim 2, characterized in that: The opening / closing mechanism (2) includes a bolt (21) for connecting the first clamping plate (11) and the second clamping plate (12), and correspondingly, also includes a nut (22) adapted to the bolt (21) so that the first clamping plate (11) or the second clamping plate (12) can move forward or backward relative to each other.

4. The sample polishing tool according to claim 3, characterized in that: The head of the bolt (21) and / or the nut (22) is provided with a butterfly structure.

5. The sample polishing tool according to any one of claims 2 to 4, characterized in that: The reference platform (3) is provided with a wall portion (31) extending at least partially along the periphery of the reference plane (N), the wall portion (31) faces the fixture (1), and the wall portion (31) and the reference platform (3) also jointly surround a receiving space (32), and the receiving space (32) is used to receive each of the samples to be processed (M) when the fixture (1) is in an open state.

6. The sample polishing tool according to claim 5, characterized in that: The reference platform (3) is an L-shaped plate structure, wherein the receiving space (32) is provided on the transverse portion, and the ends of the vertical portion are partially extended outward on both sides to form a rotation axis (33), and correspondingly, the first clamping plate (11) is provided with a matching portion (13) adapted to the rotation axis (33) so that the reference platform (3) can be rotated around the rotation axis (33) to a preset position.

7. The sample polishing tool according to claim 6, characterized in that: The first clamping plate (11) is also provided with a locking mechanism (14) capable of locking the reference platform (3) in a storage position.

8. The sample polishing tool according to claim 7, characterized in that: The locking mechanism (14) comprises a pin-shaped locking member (141), and a snap-fit ​​structure is arranged at the end facing the reference platform (3); correspondingly, the first clamping plate (11) is provided with a channel (15) for the locking member (141) to slide, and an elastic member (142) is arranged in the channel (15) so that the locking member (141) always has a tendency to move along the channel (15) in a direction close to the reference platform (3).

9. The sample polishing tool according to claim 8, characterized in that: The locking member (141) is at least partially protruded to form a triggering portion (143); correspondingly, the side wall of the channel (15) is provided with a hollow portion (16) for the triggering portion (143) to pass through; when the triggering portion (143) is triggered by an operator, the locking member (141) can be moved in a direction away from the reference platform (3).

10. The sample polishing tool according to any one of claims 6 to 9, characterized in that: A torsion spring (34) is provided on the rotating shaft (33), and the torsion spring (34) enables the reference platform (3) to always have a tendency to rotate around the rotating shaft (33) from a storage position toward a preset position.

Citation Information

Patent Citations

  • Grinding machine clamp for machining small inspection sample

    CN218017867U