Wafer management chip COB quality inspection sorting equipment
By designing the COB quality inspection and sorting equipment for wafer management chips, using a combined mechanical structure and antenna shield, the problems of low manual sorting efficiency and electromagnetic interference are solved, and efficient and accurate chip sorting and coding are achieved.
Patent Information
- Application Number
- CN202422057423.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-23
- Publication Date
- 2025-07-18
- Estimated Expiration
- 2034-08-23
AI Technical Summary
In the prior art, the sorting of wafer management chips mainly relies on manual operation, is inefficient, and requires wearing an electrostatic bracelet to prevent electromagnetic interference, affecting chip performance.
A wafer management chip COB quality inspection and sorting equipment is designed, including equipment bracket, antenna position adjustment knob, universal wheel, roof plate, motor, limit frame, encoder, antenna shielding cover and other components. Through the cooperation of mobile parts and sliding frames, the chip quality inspection is realized, and external electromagnetic interference is shielded through multiple antenna shields to ensure the pure signal.
It improves the sorting efficiency of wafer management chips, avoids the adverse effects of electromagnetic interference on chip performance, ensures signal accuracy, and improves the operation convenience of staff.
Smart Images
Figure CN223113605U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of wafer management chip sorting, in particular to a COB quality inspection and sorting device for wafer management chips. Background Art
[0002] Wafer management chips play a crucial role in electronic devices. With the rapid development of electronic technology, the demand for wafer management chips in various electronic products is increasing continuously. These chips are widely used in devices such as smart phones, tablet computers, laptop computers, servers, etc., and are responsible for managing key functions such as power supply, signal transmission, and data storage. Therefore, efficient and accurate production and sorting of wafer management chips have become an important task in the electronic manufacturing industry.
[0003] In the existing technology, although the sorting of round management chips can be achieved, it is generally carried out manually. Manual sorting not only has low work efficiency, but also requires wearing an electrostatic bracelet to prevent external electromagnetic interference signals, resulting in the possibility that external electromagnetic interference may have an adverse impact on the performance of the chips, and the practicability is poor. Summary of the Invention
[0004] The technical problem to be solved by the utility model is to provide a COB quality inspection and sorting device for wafer management chips, which can effectively solve the problems in the existing technology that although the sorting of wafer management chips can be achieved, it is generally carried out manually. Manual sorting not only has low work efficiency, but also requires wearing an electrostatic bracelet to prevent external electromagnetic interference signals, resulting in the possibility that external electromagnetic interference may have an adverse impact on the performance of the chips, and the practicability is poor.
[0005] The technical solution adopted by the utility model is: a COB quality inspection and sorting device for wafer management chips, including a device bracket and an antenna position adjustment knob. The bottom of the device bracket is fixedly installed with universal wheels, the top of the device bracket is fixedly installed with a top plate, the bottom of the top plate is fixedly installed with a first motor, the top of the top plate is fixedly installed with a first limiting frame, a first lead screw is fixedly installed on the output shaft of the first motor, a coding machine is fixedly installed on the top of the first limiting frame, a scale is fixedly installed on the top of the top plate, a chute is opened on the top of the first limiting frame, a fixing plate is slidably connected inside the chute, a limiting block is fixedly installed on the front side of the fixing plate, a coding antenna is fixedly installed inside the limiting block, a power switch is arranged on the front side of the device bracket, a start-stop button is arranged on the top of the top plate, a clamping plate is fixedly installed on the top of the top plate, a sorting box is fixedly installed on the top of the clamping plate, an indicator light is arranged on the top of the clamping plate, a horizontal movement component is fixedly installed on the top of the top plate, a vertical movement component is fixedly installed on the top of the top plate, and a third motor is fixedly installed on the bottom of the top plate.
[0006] Preferably, the horizontal movement component includes a second motor and a sliding frame. A moving member is slidably connected to the outside of the sliding frame. An antenna shielding cover and a detection fixture are fixedly installed on the top of the moving member. A probe and a glass tube are fixedly installed on the top of the detection fixture. The moving member is adapted to the sliding frame, and the detection fixture, the probe, and the glass tube are in one-to-one correspondence.
[0007] Through the above technical solution, through the cooperation of the moving member and the sliding frame, when movement is required, the second motor can provide power for the moving member, enabling the moving member to move left and right on the front side of the sliding frame. At the same time, through the cooperation of the detection fixture, the probe, and the glass tube, when the chip body is located at the detection fixture, the probe and the glass tube can be brought into contact with the chip body to perform quality inspection of the chip.
[0008] Preferably, there are a plurality of the same antenna shielding covers, and a detection fixture is fixedly installed between two of the antenna shielding covers.
[0009] Through the above technical solution, by setting a plurality of antenna shielding covers, external electromagnetic interference signals can be more comprehensively shielded, avoiding the possible adverse effects of external electromagnetic interference on the performance of the chip, such as signal distortion and increased bit error rate, ensuring that the detection fixture can receive pure chip signals, and avoiding signal disorders among multiple detection fixtures.
[0010] Preferably, the vertical movement component includes a second limiting frame. A moving block is slidably installed on the outside of the second limiting frame. A second lead screw is fixedly installed at the bottom of the moving block. A first placement plate is fixedly installed at the top of the second limiting frame. A second placement plate is inserted and installed on the top of the first placement plate. A placement fixture is inserted and installed on the top of the second placement plate. A card slot is formed on the top of the placement fixture. A chip body is arranged on the top of the placement fixture. The output shaft of the third motor is fixedly installed with the second lead screw, and the second lead screw penetrates through the first placement plate and extends to the bottom of the second placement plate.
[0011] Through the above technical solution, through the design of the second lead screw, when the chip body is located on the top of the placement fixture, after detection, the third motor can be driven to rotate the second lead screw, enabling the top of the second lead screw to push out the second placement plate, facilitating the quick removal of the chip body.
[0012] Preferably, there are two groups of the same card slots, and each group has three of the same card slots. The card slots are symmetrically distributed about the center line of the chip body.
[0013] Through the above technical solution, through the design of the card slots, the card slots at the four corner positions facilitate the positioning of the chip body, preventing it from being easily displaced. And the card slots on both sides enable the staff to insert their fingers into them, facilitating the quick removal of the chip body.
[0014] Preferably, the same number of sorting boxes and indicator lights are provided, and the multiple sorting boxes and indicator lights correspond one by one.
[0015] Through the above technical solution, through the cooperation of the sorting box and the indicator light, when the chip body is placed in the sorting box, the indicator light can be turned on, which is convenient for the staff to understand the storage situation inside the sorting box. At the same time, the sorting boxes and indicator lights on both sides can also be classified. One side of the sorting box is for the tested chips, and the other side is for the untested chips, which is convenient for classification processing and can improve the work efficiency.
[0016] Preferably, the antenna position adjustment knob penetrates through the fixing plate and extends into the inside of the first limiting frame, and the scale is located outside the coding machine.
[0017] Through the above technical solution, through the design of the antenna position adjustment knob, the fixing plate can slide in the chute. Then, by turning the antenna position adjustment knob, fine adjustment of the coding antenna can be achieved, and at the same time, it is convenient to code the chips.
[0018] Compared with the prior art, the present utility model provides a COB quality inspection and sorting device for wafer management chips, which has the following beneficial effects:
[0019] 1. For this COB quality inspection and sorting device for wafer management chips, by setting multiple antenna shielding covers, external electromagnetic interference signals can be more comprehensively shielded, avoiding the possible adverse effects of external electromagnetic interference on the performance of the chips, such as signal distortion, increased error rate, etc., ensuring that the detection fixture can receive pure chip signals and avoiding signal chaos among multiple detection fixtures;
[0020] 2. For this COB quality inspection and sorting device for wafer management chips, through the cooperation of the sorting box and the indicator light, when the chip body is placed in the sorting box, the indicator light can be turned on, which is convenient for the staff to understand the storage situation inside the sorting box. At the same time, the sorting boxes and indicator lights on both sides can also be classified. One side of the sorting box is for the tested chips, and the other side is for the untested chips, which is convenient for classification processing and can improve the work efficiency.
[0021] 3. For this COB quality inspection and sorting device for wafer management chips, through the design of the antenna position adjustment knob, the fixing plate can slide in the chute. Then, by turning the antenna position adjustment knob, fine adjustment of the coding antenna can be achieved, and at the same time, it is convenient to code the chips. Through the cooperation of the detection fixture, the probe and the glass tube, when the chip body is located with the detection fixture, the probe and the glass tube can be in contact with the chip body for quality inspection of the chip. BRIEF DESCRIPTION OF THE DRAWINGS
[0022] Figure 1 Schematic three-dimensional structure of the present utility model Figure 1 ;
[0023] Figure 2 Schematic diagram of the three-dimensional structure of the present utility model Figure 2 ;
[0024] Figure 3 Schematic diagram of the side structure of the present utility model;
[0025] Figure 4 Schematic diagram of the installation structure of the detection fixture and the probe of the present utility model;
[0026] Figure 5 Of the present utility model Figure 1 Schematic diagram of the enlarged structure at position A.
[0027] Wherein: 1. Equipment support; 2. Universal wheel; 3. Top plate; 4. Motor 1; 5. Limit frame 1; 6. Lead screw 1; 7. Coder; 8. Scale; 9. Slide groove; 10. Antenna position adjustment knob; 11. Fixed plate; 12. Limit block; 13. Coding antenna; 14. Power switch; 15. Start-stop button; 16. Clamping plate; 17. Classification box; 18. Indicator light; 19. Horizontal movement component; 1901. Motor 2; 1902. Moving part; 1903. Sliding frame; 1904. Antenna shielding cover; 1905. Detection fixture; 1906. Probe; 1907. Glass tube; 20. Vertical movement component; 2001. Limit frame 2; 2002. Moving block; 2003. Lead screw 2; 2004. Placing plate 1; 2005. Placing plate 2; 2006. Placing fixture; 2007. Card slot; 2008. Chip body; 21. Motor 3. Specific embodiments
[0028] Next, the technical solutions in the embodiments of the present utility model will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present utility model. Obviously, the described embodiments are only a part of the embodiments of the present utility model, rather than all of the embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present utility model.
[0029] Embodiment 1: As Figures 1 - 5As shown in the figure, a COB quality inspection and sorting device for a wafer management chip provided by the present utility model includes a device support 1 and an antenna position adjustment knob 10. A universal wheel 2 is fixedly installed at the bottom of the device support 1, a top plate 3 is fixedly installed at the top of the device support 1, a first motor 4 is fixedly installed at the bottom of the top plate 3, a first limit frame 5 is fixedly installed at the top of the top plate 3, a first lead screw 6 is fixedly installed on the output shaft of the first motor 4, a coding machine 7 is fixedly installed at the top of the first limit frame 5, a scale 8 is fixedly installed at the top of the top plate 3, a sliding groove 9 is opened at the top of the first limit frame 5, a fixing plate 11 is slidably connected inside the sliding groove 9, a limit block 12 is fixedly installed on the front side of the fixing plate 11, a coding antenna 13 is fixedly installed inside the limit block 12, a power switch 14 is arranged on the front side of the device support 1, a start-stop button 15 is arranged on the top of the top plate 3, a clamping plate 16 is fixedly installed at the top of the top plate 3, a sorting box 17 is fixedly installed at the top of the clamping plate 16, an indicator light 18 is arranged on the top of the clamping plate 16, a horizontal movement component 19 is fixedly installed at the top of the top plate 3, a vertical movement component 20 is fixedly installed at the top of the top plate 3, and a third motor 21 is fixedly installed at the bottom of the top plate 3.
[0030] Specifically, the horizontal movement component 19 includes a second motor 1901 and a sliding frame 1903. A moving part 1902 is slidably connected to the outside of the sliding frame 1903. An antenna shielding cover 1904 and a detection fixture 1905 are fixedly installed on the top of the moving part 1902. A probe 1906 and a glass tube 1907 are fixedly installed on the top of the detection fixture 1905. The moving part 1902 and the sliding frame 1903 are adapted to each other. The detection fixture 1905, the probe 1906, and the glass tube 1907 are in one-to-one correspondence. The advantage is that through the cooperation of the moving part 1902 and the sliding frame 1903, when movement is required, the second motor 1901 can provide power for the moving part 1902, enabling the moving part 1902 to move left and right in front of the sliding frame 1903. At the same time, through the cooperation of the detection fixture 1905, the probe 1906, and the glass tube 1907, when the chip body 2008 is located at the detection fixture 1905, the probe 1906 and the glass tube 1907 can be brought into contact with the chip body 2008.
[0031] Specifically, the same number of antenna shielding covers 1904 are provided. A detection fixture 1905 is fixedly installed between two antenna shielding covers 1904. The advantage is that by providing multiple antenna shielding covers 1904, external electromagnetic interference signals can be more comprehensively shielded, avoiding the possible adverse effects of external electromagnetic interference on the performance of the chip, such as signal distortion and increased error rate, ensuring that the detection fixture 1905 can receive pure chip signals and preventing signal chaos among multiple detection fixtures 1905.
[0032] Specifically, the vertical moving component 20 includes a second limiting frame 2001. A moving block 2002 is slidably installed on the outside of the second limiting frame 2001. A second lead screw 2003 is fixedly installed at the bottom of the moving block 2002. A first placing plate 2004 is fixedly installed at the top of the second limiting frame 2001. A second placing plate 2005 is inserted and installed at the top of the first placing plate 2004. A placing fixture 2006 is inserted and installed at the top of the second placing plate 2005. A card slot 2007 is formed at the top of the placing fixture 2006. A chip body 2008 is arranged at the top of the placing fixture 2006. The output shaft of the third motor 21 is fixedly installed with the second lead screw 2003. The second lead screw 2003 penetrates through the first placing plate 2004 and extends to the bottom of the second placing plate 2005. The advantage is that through the design of the second lead screw 2003, when the chip body 2008 is located at the top of the placing fixture 2006, after detection, the second lead screw 2003 can be driven to rotate by the third motor 21, and the top of the second lead screw 2003 can eject the second placing plate 2005, which is convenient for quickly taking out the chip body 2008.
[0033] Embodiment 2: As Figures 2 - 5 shown, as an improvement to the previous embodiment.
[0034] Specifically, there are two identical groups of card slots 2007. Each group of card slots 2007 has three identical ones. The card slots 2007 are symmetrically distributed about the center line of the chip body 2008. The advantage is that through the design of the card slots 2007, the card slots 2007 at the four corner positions are convenient for limiting the chip body 2008 to prevent it from being easily displaced. And for the card slots 2007 on both sides, the fingers of the staff can be inserted into them, which is convenient for quickly taking out the chip body 2008.
[0035] Specifically, there are multiple identical classification boxes 17 and indicator lights 18. The multiple classification boxes 17 and indicator lights 18 correspond one by one. The advantage is that through the cooperation of the classification boxes 17 and the indicator lights 18, when the chip body 2008 is placed in the classification box 17, the indicator light 18 can be lit, which is convenient for the staff to understand the storage situation inside the classification box 17. At the same time, the classification boxes 17 and indicator lights 18 on both sides can also be classified. The classification box 17 on one side places the detected chips, while the other side places the undetected chips, which is convenient for classification processing and can improve the work efficiency.
[0036] Specifically, the antenna position adjustment knob 10 penetrates through the fixed plate 11 and extends to the inside of the first limiting frame 5. The scale 8 is located outside the coding machine 7. The advantage is that through the design of the antenna position adjustment knob 10, the fixed plate 11 can slide in the sliding groove 9, and then by rotating the antenna position adjustment knob 10, the fine adjustment of the coding antenna 13 can be realized, and at the same time, it is convenient to code the chips.
[0037] Working principle: During use, through the cooperation of the moving member 1902 and the sliding frame 1903, when movement is required, the motor two 1901 can provide power for the moving member 1902, enabling the moving member 1902 to move left and right on the front side of the sliding frame 1903. At the same time, through the cooperation of the detection fixture 1905, the probe 1906, and the glass tube 1907, when the chip body 2008 is located at the detection fixture 1905, the probe 1906 and the glass tube 1907 can be brought into contact with the chip body 2008. By providing multiple antenna shielding covers 1904, external electromagnetic interference signals can be more comprehensively shielded, preventing external electromagnetic interference from potentially having an adverse impact on the performance of the chip, such as signal distortion and increased bit error rate, ensuring that the detection fixture 1905 can receive pure chip signals and avoiding signal chaos among multiple detection fixtures 1905. Through the design of the lead screw two 2003, when the chip body 2008 is located on top of the placement fixture 2006, after detection, the motor three 21 can drive the lead screw two 2003 to rotate, causing the top of the lead screw two 2003 to push out the placement plate two 2005, facilitating the quick removal of the chip body 2008. Through the design of the card slots 2007, the card slots 2007 at the four corner positions facilitate the positioning of the chip body 2008, preventing it from easily shifting. Additionally, the card slots 2007 on both sides allow the fingers of the operator to be inserted, facilitating the quick removal of the chip body 2008. Through the cooperation of the sorting box 17 and the indicator light 18, when the chip body 2008 is placed in the sorting box 17, the indicator light 18 will light up, enabling the operator to understand the storage situation inside the sorting box 17. At the same time, the sorting boxes 17 and indicator lights 18 on both sides can also be sorted. One side of the sorting box 17 is for placing the detected chips, while the other side is for placing the undetected chips, facilitating classification processing and improving the work efficiency. Through the design of the antenna position adjustment knob 10, the fixing plate 11 can slide in the chute 9, and then by rotating the antenna position adjustment knob 10, fine adjustment of the coded antenna 13 can be achieved, while also facilitating the coding of the chip.
[0038] Although the embodiments of the present invention have been shown and described, for those of ordinary skill in the art, it can be understood that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principle and spirit of the present invention. The scope of the present invention is defined by the appended claims and their equivalents.
Claims
1. A COB quality inspection and sorting device for wafer management chips, comprising a device support (1) and an antenna position adjustment knob (10), characterized in that: The bottom of the equipment support (1) is fixedly installed with universal wheels (2). The top of the equipment support (1) is fixedly installed with a top plate (3). The bottom of the top plate (3) is fixedly installed with a first motor (4). The top of the top plate (3) is fixedly installed with a first limit frame (5). A first lead screw (6) is fixedly installed on the output shaft of the first motor (4). A coding machine (7) is fixedly installed on the top of the first limit frame (5). A scale (8) is fixedly installed on the top of the top plate (3). A chute (9) is opened on the top of the first limit frame (5). A fixing plate (11) is slidably connected inside the chute (9). A limit block (12) is fixedly installed on the front side of the fixing plate (11). A coding antenna (13) is fixedly installed inside the limit block (12). A power switch (14) is arranged on the front side of the equipment support (1). A start-stop button (15) is arranged on the top of the top plate (3). A clamping plate (16) is fixedly installed on the top of the top plate (3). A sorting box (17) is fixedly installed on the top of the clamping plate (16). An indicator light (18) is arranged on the top of the clamping plate (16). A horizontal moving assembly (19) is fixedly installed on the top of the top plate (3). A vertical moving assembly (20) is fixedly installed on the top of the top plate (3). A third motor (21) is fixedly installed on the bottom of the top plate (3).
2. The COB quality inspection and sorting equipment for a wafer management chip according to claim 1, characterized in that: The horizontal moving assembly (19) includes a second motor (1901) and a sliding frame (1903). A moving part (1902) is slidably connected to the outside of the sliding frame (1903). An antenna shielding cover (1904) and a detection fixture (1905) are fixedly installed on the top of the moving part (1902). A probe (1906) and a glass tube (1907) are fixedly installed on the top of the detection fixture (1905). The moving part (1902) and the sliding frame (1903) are adapted to each other. The detection fixture (1905), the probe (1906) and the glass tube (1907) are in one-to-one correspondence.
3. The COB quality inspection and sorting equipment for a wafer management chip according to claim 2, characterized in that: The same number of antenna shielding covers (1904) are provided. A detection fixture (1905) is fixedly installed between two antenna shielding covers (1904).
4. A wafer management chip COB quality inspection and sorting device according to claim 1, characterized in that: The vertical moving assembly (20) includes a second limit frame (2001). A moving block (2002) is slidably installed on the outside of the second limit frame (2001). A second lead screw (2003) is fixedly installed on the bottom of the moving block (2002). A first placement plate (2004) is fixedly installed on the top of the second limit frame (2001). A second placement plate (2005) is inserted and installed on the top of the first placement plate (2004). A placement fixture (2006) is inserted and installed on the top of the second placement plate (2005). A card slot (2007) is opened on the top of the placement fixture (2006). A chip body (2008) is arranged on the top of the placement fixture (2006). The output shaft of the third motor (21) is fixedly installed with the second lead screw (2003). The second lead screw (2003) penetrates through the first placement plate (2004) and extends to the bottom of the second placement plate (2005).
5. A wafer management chip COB quality inspection and sorting device according to claim 4, characterized in that: There are two identical sets of the card slots (2007), and each set has three identical card slots (2007). The card slots (2007) are symmetrically distributed about the center line of the chip body (2008).
6. The COB quality inspection and sorting equipment for a wafer management chip according to claim 1, wherein: There are multiple identical classification boxes (17) and indicator lights (18), and the multiple classification boxes (17) and indicator lights (18) are in one-to-one correspondence.
7. A COB quality inspection and sorting device for a wafer management chip according to claim 1, characterized in that: The antenna position adjustment knob (10) penetrates through the fixed plate (11) and extends into the inside of the first limiting frame (5), and the scale (8) is located outside the coding machine (7).