Butterfly laser test fixture with shielding
By designing a shielded butterfly laser test fixture, the problem of low accuracy of the test data is solved. The clamping unit, protection structure and temperature stabilization unit are used to achieve high accuracy and stability in the butterfly laser testing process.
Patent Information
- Application Number
- CN202422288779.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-19
- Publication Date
- 2025-07-25
- Estimated Expiration
- 2034-09-19
AI Technical Summary
During the testing of existing butterfly lasers, the test data is low, mainly due to the lack of shielding structure, which leads to external noise and radiation, as well as temperature fluctuations caused by instability in heat dissipation.
A shielded butterfly laser test fixture is designed, including a clamping unit, a temperature stabilizing unit and a protection structure. The clamping unit ensures that the pins are subjected to uniform force, the protective structure shields external noise and radiation, and the temperature stabilizing unit dissipates heat.
It improves the data accuracy of the butterfly laser test, avoids the influence of external noise and radiation, ensures the stability of the temperature, and thus improves the reliability of the test results.
Smart Images

Figure CN223155078U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of butterfly laser testing, in particular to a butterfly laser testing fixture with shielding. Background Art
[0002] With the continuous improvement of the application environment requirements of butterfly laser devices, the requirements for the encapsulation production testing of butterfly laser devices are also continuously increasing. The purpose of product testing itself is to screen out defective products. In the prior art, most of the connectors used in traditional butterfly laser testing have an elastic pin structure, which is usually only applicable to testing environments with not very high requirements. The elastic pins have a short service life, and the state of the contact points is uncontrollable, so they cannot be applied to more stringent testing environments. Moreover, during the testing process, the pins of the butterfly laser need to be abutted against the plug pins provided by the connector itself, and the pressure plate used to press the pins of the butterfly laser and the plug pins cannot be self-corrected and adjusted, resulting in uneven stress at different positions of the pressing part. For butterfly lasers that need to be repeatedly tested during the encapsulation process, it is easy to cause batch damage, not only failing to achieve the purpose of screening out defective products, but also increasing the generation of defective products.
[0003] In order to avoid the problem of uneven stress during the process of pressing the pins of the laser, which may cause damage to the laser, a connector is usually designed to achieve the purpose of uniform stress during the process of pressing the pins of the laser. For example, the Chinese patent with the authorization announcement number CN220525862U discloses a connector for testing butterfly laser devices. By arranging a plurality of plug pins inserted into the holes on the base, and arranging side plates on the side of the base, and arranging limiting grooves corresponding to the positions of the holes on the side plates, it is ensured that when the pins of the laser are inserted from the limiting grooves, they are abutted against the upper ends of the plug pins inserted into the holes. And the pins of the laser and the plug pins are pressed by a pin pressing plate axially connected to one end of the base. A self-correcting pressure block is axially connected to the inner side of the pin pressing plate. During the process of the pin pressing plate pressing down, the self-correcting pressure block rotates and adjusts according to the stress, ensuring uniform stress on the pins at each position and avoiding the situation that the pins of the laser are damaged due to uneven stress during pressing.
[0004] However, it is found in the actual use process that during the testing process of butterfly lasers, even if the connector in the above-mentioned disclosed document is used, the accuracy of the test data is still relatively low. There are two reasons for the inaccurate test data: First, there is no shielding structure on the detection tool. Butterfly lasers are very sensitive to external noise, radiation, etc. External noise and radiation will have a great impact on the test data of butterfly lasers. Second, there is no heat dissipation structure on the detection tool. The temperature of the butterfly laser is unstable during the detection process, which affects the test data of the butterfly laser. Summary of the Utility Model
[0005] In view of the deficiencies in the above-mentioned background art, the present utility model proposes a butterfly laser test fixture with shielding, which solves the technical problem that the accuracy of test data is still relatively low during the test of existing butterfly lasers.
[0006] The technical solution of the present utility model is realized as follows: A butterfly laser test fixture with shielding includes a first housing. A second housing is provided at the bottom of the first housing, and a control circuit board is provided inside the second housing. The first housing is provided with a clamping unit for ensuring uniform force on the pins at various positions during the test of the butterfly laser, a temperature stabilization unit for dissipating heat from the butterfly laser during the test, and a protection structure for shielding the influence of external noise and radiation on the butterfly laser during the test. The control circuit board can be connected to the butterfly laser through the clamping unit.
[0007] Preferably, the two clamping units are oppositely arranged on the top of the first housing. The temperature stabilization unit includes a heat dissipation plate in contact with the butterfly laser, and the heat dissipation plate is located between the two clamping units.
[0008] Preferably, the clamping unit further includes a heat dissipation tooth structure, and the heat dissipation tooth structure is provided on the first housing. The heat dissipation plate is connected to the heat dissipation tooth structure.
[0009] Preferably, the two heat dissipation tooth structures are oppositely arranged on the first housing, and both of the two heat dissipation tooth structures are connected to the heat dissipation plate.
[0010] Preferably, the protection structure is a shielding cover that can wrap the butterfly laser during the test, and the shielding cover is rotatably provided on the top of the first housing.
[0011] Preferably, the heat dissipation plate is within the range wrapped by the shielding cover, and the heat dissipation tooth structure is outside the range wrapped by the shielding cover.
[0012] Preferably, the clamping unit includes a base, and pin mounting holes are provided on the base. Elastic pins are connected inside the pin mounting holes. The elastic pins extend out of the bottom surface of the base along the pin mounting holes, and the extending ends of the elastic pins are connected to the control circuit board. A pressing plate for pressing the pins of the butterfly laser is provided on the pin mounting holes, and the pressing plate is snap-fitted on the base.
[0013] Preferably, one end of the base is hinged to the pressing plate, and a locking block is provided at the other end. When the pressing plate rotates towards the locking block and presses the pins of the butterfly laser, the pressing plate is clamped by the locking block.
[0014] Preferably, the locking block is L-shaped, and the locking block is rotatably provided on the base.
[0015] Preferably, a power interface and a communication interface are respectively provided on the second housing, and both the power interface and the communication interface are connected to the control circuit board.
[0016] Advantages of the present utility model: The test fixture of the present utility model is provided with a clamping unit, a temperature stabilizing unit and a protection structure. The clamping unit can evenly press the pins of the butterfly laser and connect them to the control circuit board. Before testing the butterfly laser, the protection structure is used to wrap the outside of the butterfly laser to ensure that the influence of external noise and radiation on the butterfly laser is shielded during the testing process, and to avoid the situation that the test data of the butterfly laser is affected when the butterfly laser is affected by external noise and radiation during the detection process; The temperature stabilizing unit is used to dissipate heat from the butterfly laser being tested, avoiding the situation that the temperature of the butterfly laser is unstable during the detection process and affecting the test data of the butterfly laser; thereby greatly improving the accuracy of the test data of the butterfly laser during the test process. Description of the Drawings
[0017] In order to more clearly illustrate the embodiments of the present utility model, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present utility model, and those of ordinary skill in the art can obtain other drawings based on these drawings without creative efforts.
[0018] Figure 1 It is the front perspective view of the present utility model.
[0019] Figure 2 It is the rear perspective view of the present utility model.
[0020] Figure 3 It is the schematic diagram of the clamping unit of the present utility model.
[0021] Figure 4 It is the perspective view of the present utility model pressing the butterfly laser.
[0022] Figure 5 It is the top view of the present utility model pressing the butterfly laser.
[0023] In the figure, 1 is the first housing, 2 is the second housing, 3 is the clamping unit, 4 is the temperature stabilizing unit, 5 is the protection structure, 6 is the heat dissipation plate, 7 is the heat dissipation tooth structure, 8 is the base, 9 is the pin mounting hole position, 10 is the elastic pin, 11 is the pressing plate, 12 is the locking block, 13 is the power interface, 14 is the communication interface, 15 is the butterfly laser. Detailed Embodiments
[0024] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0025] Embodiment 1. A test fixture for a butterfly laser with shielding, as Figure 1 、 Figure 2 、 Figure 4 and Figure 5 shown, includes a first housing 1. A second housing 2 is provided at the bottom of the first housing 1. A control circuit board is provided in the second housing 2. A clamping unit 3 for ensuring uniform force on the pins at each position during the test of the butterfly laser, a temperature stabilization unit 4 for dissipating heat from the butterfly laser during the test, and a protection structure 5 for shielding the influence of external noise and radiation on the butterfly laser during the test are provided on the first housing 1. The control circuit board can be connected to the butterfly laser through the clamping unit 3. The test fixture of the present invention is provided with a clamping unit 3, a temperature stabilization unit 4, and a protection structure 5. The clamping unit 3 can evenly press the pins of the butterfly laser 15 and connect them to the control circuit board. Before testing the butterfly laser 15, the protection structure 5 is used to wrap around the outside of the butterfly laser 15 to ensure shielding the influence of external noise and radiation on the butterfly laser 15 during the test, and to avoid the situation that the test data of the butterfly laser is affected when the butterfly laser is exposed to external noise and radiation during the detection process; the temperature stabilization unit 4 is used to dissipate heat from the butterfly laser 15 being tested to avoid the situation that the temperature of the butterfly laser is unstable during the detection process and affects the test data of the butterfly laser; thereby greatly improving the accuracy of the test data of the butterfly laser during the test process, and solving the technical problem that the accuracy of the test data of the existing butterfly laser is still relatively low during the test process.
[0026] Embodiment 2. On the basis of Embodiment 1, a test fixture for a butterfly laser with shielding, as Figure 1 、 Figure 2 、 Figure 4 and Figure 5As shown, two of the clamping units 3 are oppositely arranged on the top of the first housing 1. The temperature stabilization unit 4 includes a heat dissipation plate 6 in contact with the butterfly laser. The heat dissipation plate 5 is located between the two clamping units 3. That is, the two oppositely arranged clamping units 3 are used to clamp the pins on both sides of the butterfly laser 15 respectively, and the two oppositely arranged clamping units 3 apply pressure to the pins on both sides of the butterfly laser 15 respectively, so that the clamping units 3 apply uniform pressure to the pins at various positions of the butterfly laser 15, avoiding the situation that the pins of the butterfly laser 15 are damaged due to uneven force during pressing. The heat dissipation plate 5 is provided to fit with the butterfly laser 15. On the one hand, it provides support for the test of the butterfly laser 15, and on the other hand, it transfers the heat generated by the butterfly laser 15 during the test, dissipating heat from the butterfly laser 15, and avoiding the situation that the butterfly laser does not dissipate heat and the temperature rises during the detection, affecting the test data of the butterfly laser.
[0027] Embodiment 3, on the basis of Embodiment 2, a butterfly laser test fixture with shielding, as Figure 1 , Figure 2 , Figure 4 and Figure 5 shown, the clamping unit 3 further includes a heat dissipation tooth structure 7. The heat dissipation tooth structure 7 is arranged on the first housing 1, and the heat dissipation plate 6 is connected to the heat dissipation tooth structure 7. The setting of the heat dissipation tooth structure 7 can greatly increase the heat dissipation area, improve the heat dissipation efficiency, and dissipate a large amount of heat in a limited space, enabling efficient heat dissipation.
[0028] Embodiment 4, on the basis of Embodiment 3, a butterfly laser test fixture with shielding, as Figure 1 , Figure 2 , Figure 4 and Figure 5 shown, two of the heat dissipation tooth structures 7 are oppositely arranged on the first housing 1, and both of the two heat dissipation tooth structures 7 are connected to the heat dissipation plate 6. Two of the heat dissipation tooth structures 7 are arranged on the first housing 1, and both of the two heat dissipation tooth structures 7 are connected to the heat dissipation plate 6, increasing the heat transfer path and improving the heat dissipation efficiency.
[0029] Embodiment 5, on the basis of Embodiment 4, a butterfly laser test fixture with shielding, as Figure 1 , Figure 2 , Figure 4 and Figure 5As shown, the protection structure 5 is a shielding cover that can wrap the butterfly laser during the test process. The shielding cover is rotatably arranged on the top of the first housing 1. Before testing the butterfly laser 15, rotate the shielding cover so that the shielding cover wraps around the outside of the butterfly laser 15 to ensure that external noise and radiation are shielded during the test, avoiding the situation where the test data of the butterfly laser is affected when the butterfly laser is exposed to external noise and radiation during the detection process.
[0030] Embodiment 6, based on Embodiment 5, a butterfly laser test fixture with shielding, as Figure 1 、 Figure 2 、 Figure 4 and Figure 5 shown, the heat dissipation plate 6 is located within the range wrapped by the shielding cover, and the heat dissipation tooth structure 7 is located outside the range wrapped by the shielding cover. The heat dissipation tooth structure 7 is arranged outside the range wrapped by the shielding cover, avoiding the influence of the shielding cover on the heat dissipation performance of the heat dissipation tooth structure 7, so that when the test fixture tests the butterfly laser 15, the butterfly laser 15 can still dissipate heat quickly, ensuring that the test fixture will not be affected by the temperature rise.
[0031] Embodiment 7, based on any one of Embodiments 1 - 6, a butterfly laser test fixture with shielding, as Figure 1 、 Figure 2 、 Figure 3 、 Figure 4 and Figure 5 shown, the clamping unit 3 includes a base 8. The base 8 is provided with pin mounting holes 9. An elastic pin 10 is connected inside the pin mounting holes 9. The elastic pin 10 extends out of the bottom surface of the base 8 along the pin mounting holes 9, and the extending end of the elastic pin 10 is connected to the control circuit board; a pressing plate 11 for pressing the pins of the butterfly laser is provided on the pin mounting holes 9, and the pressing plate 11 is snap - connected to the base 8. The elastic pin 10 refers to a pin that can undergo a certain amount of elastic deformation. The setting of the elastic pin 10 is on the one hand to connect the control circuit board with the pins of the butterfly laser 15, and on the other hand, the certain elasticity of the elastic pin 10 avoids the situation where the pins are easily broken when the pressing plate 11 is pressed, further ensuring the electrical connection.
[0032] Embodiment 8, based on Embodiment 7, a butterfly laser test fixture with shielding, as Figure 1 、 Figure 2 、 Figure 3 、 Figure 4 and Figure 5As shown, one end of the base 8 is hinged to the pressing plate 11, and a locking block 12 is provided at the other end. When the pressing plate 11 rotates towards the locking block 12 and presses against the pins of the butterfly laser, the pressing plate 11 is clamped by the locking block 12. That is, by rotating the pressing plate 11, the pins of the butterfly laser 15 are tightly connected to the elastic pins 10, and then the pressing plate 11 is held in the state where the pins of the butterfly laser 15 are tightly connected to the elastic pins 10 by the locking block 12.
[0033] Embodiment 9. On the basis of Embodiment 8, a butterfly laser test fixture with shielding is as Figure 1 , Figure 2 , Figure 3 , Figure 4 and Figure 5 shown. The locking block 12 is in an L shape and is rotatably arranged on the base 8. The locking block 12 being rotatably arranged on the base 8 allows the position of the locking block 12 to be adjusted by rotating the locking block 12, so as to adjust the state of whether the locking block 12 clamps the pressing plate 11. The locking block 12 is in an L shape, one end of the L shape is rotatably connected to the base 8, and the other end of the L shape is in clamping fit with the pressing plate 11. Among them, the locking block 12 can be connected to the base 8 by bolts, and the position of the locking block 12 is adjusted by rotating the bolts.
[0034] Embodiment 10. On the basis of Embodiment 9, a butterfly laser test fixture with shielding is as Figure 2 shown. A power interface 13 and a communication interface 14 are respectively provided on the second housing 2, and both the power interface 13 and the communication interface 14 are connected to the control circuit board. The settings of the power interface 13 and the communication interface 14 facilitate connecting the control circuit board to an external signal, and can realize quickly connecting an external signal to the butterfly laser 15 for detection.
[0035] When implementing Embodiment 10, place the butterfly laser 15 on the heat dissipation plate 6, then rotate the pressing plate 11 to tightly connect the pins of the butterfly laser 15 to the elastic pins 10, then keep the pressing plate 11 in the state where the pins of the butterfly laser 15 are tightly connected to the elastic pins 10 by rotating the locking block 12, then rotate the shielding cover so that the shielding cover wraps the butterfly laser 15 to be tested, and then respectively connect the power interface 13 and the communication interface 14 to external signals, that is, connect the power interface 13 to a power signal and the communication interface 14 to a communication signal, then the butterfly laser 15 can be tested, and the heat generated by the butterfly laser 15 during the test is transferred by the heat dissipation plate 6 to the heat dissipation tooth structure 7 for heat dissipation.
[0036] The above are only the preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.
Claims
1. A test fixture for a shielded butterfly laser, comprising a first housing (1), characterized in that, A second housing (2) is provided at the bottom of the first housing (1). A control circuit board is provided inside the second housing (2). A clamping unit (3) for ensuring uniform force on the pins at various positions during the testing of the butterfly laser, a temperature stabilization unit (4) for dissipating heat from the butterfly laser during the testing, and a protection structure (5) for shielding the influence of external noise and radiation on the butterfly laser during the testing are provided on the first housing (1). The control circuit board can be connected to the butterfly laser through the clamping unit (3).
2. The butterfly laser test fixture with shielding according to claim 1, characterized in that, Two of the clamping units (3) are oppositely arranged at the top of the first housing (1). The temperature stabilization unit (4) includes a heat dissipation plate (6) in contact with the butterfly laser. The heat dissipation plate (6) is located between the two clamping units (3).
3. The butterfly laser test fixture with shielding according to claim 2, characterized in that The clamping unit (3) further includes a heat dissipation tooth structure (7). The heat dissipation tooth structure (7) is provided on the first housing (1). The heat dissipation plate (6) is connected to the heat dissipation tooth structure (7).
4. The butterfly laser test fixture with shielding according to claim 3, wherein Two of the heat dissipation tooth structures (7) are oppositely arranged on the first housing (1). Both of the two heat dissipation tooth structures (7) are connected to the heat dissipation plate (6).
5. The test fixture for a shielded butterfly laser according to claim 4, wherein The protection structure (5) is a shielding cover that can wrap the butterfly laser during the testing. The shielding cover is rotatably provided at the top of the first housing (1).
6. The test fixture for a butterfly laser with shielding according to claim 5, characterized in that, The heat dissipation plate (6) is within the range wrapped by the shielding cover. The heat dissipation tooth structure (7) is outside the range wrapped by the shielding cover.
7. The test fixture for the butterfly laser with shielding according to any one of claims 1 to 6, characterized in that The clamping unit (3) includes a base (8). A pin mounting hole (9) is provided on the base (8). An elastic pin (10) is connected inside the pin mounting hole (9). The elastic pin (10) extends out of the bottom surface of the base (8) along the pin mounting hole (9). The extending end of the elastic pin (10) is connected to the control circuit board. A pressing plate (11) for pressing the pins of the butterfly laser is provided on the pin mounting hole (9). The pressing plate (11) is snap-fitted on the base (8).
8. The shielded butterfly laser test fixture according to claim 7, wherein, One end of the base (8) is hinged to the pressing plate (11), and a locking block (12) is provided at the other end. When the pressing plate (11) rotates towards the locking block (12) and presses the pins of the butterfly laser, the pressing plate (11) is clamped by the locking block (12).
9. The shielded butterfly laser test fixture according to claim 8, wherein The locking block (12) is L-shaped. The locking block (12) is rotatably provided on the base (8).
10. The butterfly laser testing fixture with shielding according to claim 9, wherein A power interface (13) and a communication interface (14) are respectively provided on the second housing (2). Both the power interface (13) and the communication interface (14) are connected to the control circuit board.
Citation Information
Patent Citations
Connector for testing butterfly-shaped laser device
CN220525862U
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