Standard test block for probe type film thickness tester
By designing standard test blocks in the probe film thickness tester, the grooves and test pieces on the base are used to solve the film thickness deviation caused by wear of the test block, and the intuitiveness of wear detection and measurement accuracy are achieved.
Patent Information
- Application Number
- CN202422339952.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-09-24
- Publication Date
- 2025-08-01
- Estimated Expiration
- 2034-09-24
AI Technical Summary
The test blocks of existing probe film thickness testers are prone to wear during operation, resulting in deviations in the optical film thickness and lack of effective wear detection standards.
A standard test block for a probe film thickness tester is designed, including a base and a correction assembly, with multiple grooves on the base, and the correction assembly includes multiple sets of test pieces. Through the fit of the test piece and groove, the test piece is directly observed whether the test block is worn.
It realizes intuitive detection of test block wear, improves measurement accuracy and reliability, and ensures the accuracy of film thickness testing.
Smart Images
Figure CN223179529U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of optical film thickness testing, in particular to a standard test block for a probe type film thickness tester. Background Art
[0002] A probe type film thickness tester is an instrument used to detect the thickness of a film layer in the manufacturing fields of touch screens, displays, etc. The film thickness plays a very important role in the optical and other characteristics of the product.
[0003] However, during the operation of the film thickness tester, the surface of its test block will inevitably be worn, resulting in a deviation in the film thickness of the optical film. Therefore, at present, there is an urgent need for a standard part that can measure whether the test block is worn. Summary of the Utility Model
[0004] The purpose of the utility model is to overcome the deficiencies in the prior art and provide a standard test block for a probe type film thickness tester, which can provide a standard part for measuring whether the test block is worn.
[0005] The purpose of the utility model is achieved by the following technical solutions:
[0006] The first aspect of the present application provides a standard test block for a probe type film thickness tester, including a base, on which a plurality of grooves are opened, and the grooves are respectively arranged at intervals; a calibration component, which includes a plurality of test pieces, and each test piece is respectively arranged on the base.
[0007] The test piece includes a first calibration block, a second calibration block and a third calibration block, and the first calibration block, the second calibration block and the third calibration block are respectively arranged on the base.
[0008] The height of the first calibration block is greater than the height of the second calibration block.
[0009] The height of the second calibration block is greater than the height of the third calibration block.
[0010] A first spacing is provided between the first calibration block and the second calibration block.
[0011] A second spacing is provided between the second calibration block and the third calibration block.
[0012] The length of the first calibration block is the same as the length of the second calibration block.
[0013] The length of the second calibration block is the same as the length of the third calibration block.
[0014] The groove has a rectangular cross-sectional structure.
[0015] The first calibration block, the second calibration block, and the third calibration block all have a rectangular cross-sectional structure.
[0016] Compared with the prior art, the present utility model has at least the following advantages:
[0017] By providing a plurality of test pieces and grooves, the test block on the film thickness machine can be directly calibrated between the test pieces and the grooves, so that it can be directly seen whether the test block is worn. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present utility model, the drawings required for use in the embodiments will be briefly introduced below.
[0019] Figure 1 It is a schematic structural diagram of a standard test block for a probe type film thickness tester in an embodiment of the present utility model. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0020] The embodiments of the present application will be described in more detail below with reference to the drawings. Although the embodiments of the present application are shown in the drawings, it should be understood that the present application can be implemented in various forms and should not be limited by the embodiments described herein. On the contrary, these embodiments are provided to make the present application more thorough and complete, and to fully convey the scope of the present application to those skilled in the art.
[0021] It should be understood that although the terms "first", "second", "third", etc. may be used in the present application to describe various information, these information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of the present application, the first information may also be referred to as the second information, and similarly, the second information may also be referred to as the first information. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present application, "a plurality" means two or more, unless otherwise specifically defined.
[0022] Unless otherwise clearly defined and limited, the terms "mounted", "connected", "connected", "fixed", etc. should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection or an integral body; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the internal communication of two components or the interaction relationship between two components. For those of ordinary skill in the art, the specific meanings of the above terms in the present application can be understood according to specific circumstances.
[0023] At present, the probe-type film thickness tester is an instrument used to detect the film thickness in the manufacturing fields of touch screens, displays, etc. The film thickness plays a very important role in the optical and other characteristics of the product. However, during the operation of the film thickness tester, the surface of its test block will inevitably be worn, which will lead to deviations in the film thickness of the optical film. Therefore, at present, there is an urgent need for a standard part that can measure whether the test block is worn.
[0024] In view of the above problems, the embodiment of the present application provides a standard test block for a probe-type film thickness tester, which can provide a standard part for measuring whether the test block is worn.
[0025] The technical solutions of the embodiments of the present application will be described in detail below with reference to the accompanying drawings.
[0026] Refer to Figure 1 , a standard test block for a probe-type film thickness tester, includes a base 100 and a calibration component 200. A plurality of grooves 110 are formed on the base 100, and the grooves 110 are spaced apart from each other. The calibration component 200 includes multiple groups of test pieces, and each test piece is disposed on the base 100.
[0027] It should be noted that the groove 110 has a rectangular cross-sectional structure, and the groove widths of each groove 110 are different to adapt to the widths of different test blocks. Specifically, by placing the test block into the groove 110 and observing whether there is a gap between the test block and the groove 110 or whether the test block can be placed into the groove 110, it can be confirmed whether the test block is worn. Further, by providing multiple groups of test pieces, the test block of the film thickness machine can be directly tested, so that it can be directly seen whether the test block is worn.
[0028] Refer to Figure 1 , specifically, the test piece includes a first calibration block 211, a second calibration block 212, and a third calibration block 213. The first calibration block 211, the second calibration block 212, and the third calibration block 213 are respectively disposed on the base. Preferably, the height of the first calibration block 211 is greater than the height of the second calibration block 212. Preferably, the height of the second calibration block 212 is greater than the height of the third calibration block 213. Preferably, a first spacing 214 is provided between the first calibration block 211 and the second calibration block 212. Preferably, a second spacing 215 is provided between the second calibration block 212 and the third calibration block 213. Preferably, the length of the first calibration block 211 is the same as the length of the second calibration block 212. Preferably, the length of the second calibration block 212 is the same as the length of the third calibration block 213. Preferably, the first calibration block 211, the second calibration block 212, and the third calibration block 213 all have a rectangular cross-sectional structure.
[0029] It should be noted that the test block of the film thickness measurement machine can determine whether there is wear on the height of the test block by measuring the heights of the first calibration block 211, the second calibration block 212, and the third calibration block 213. At the same time, by measuring the three calibration blocks, the measurement accuracy can be improved. Further, the present application can also directly measure the distances between the test block and the first calibration block 211 and the second calibration block 212, and between the second calibration block 212 and the third calibration block 213. In this way, it can be visually determined whether there is wear in the width direction of the test block. Among them, the first distance 214 and the second distance 215 can be adjusted according to the actual situation.
[0030] The solution of the present application has been described in detail above with reference to the accompanying drawings. In the above embodiments, the descriptions of the various embodiments have their own focuses. For the parts not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments. Those skilled in the art should also know that the actions and modules involved in the specification are not necessarily essential to the present application. In addition, it can be understood that the steps in the method embodiments of the present application can be adjusted, combined, and deleted according to actual needs, and the modules in the device embodiments of the present application can be combined, divided, and deleted according to actual needs.
[0031] The various embodiments of the present application have been described above. The above description is exemplary and not exhaustive, and is not limited to the disclosed embodiments. Many modifications and changes are obvious to those of ordinary skill in the art in the technical field without departing from the scope and spirit of the described embodiments. The choice of terms used herein is intended to best explain the principles of the embodiments, practical applications, or improvements to the technology in the market, or to enable other ordinary skill in the art in the technical field to understand the embodiments disclosed herein.
Claims
1. A standard test block for a probe-type film thickness tester, characterized in that, Comprising: A base, on which a plurality of grooves are formed, and the grooves are spaced apart from each other. A calibration assembly, which includes a plurality of test pieces, and each test piece is disposed on the base.
2. The standard test block for a probe-type film thickness tester according to claim 1, wherein, The test piece includes a first calibration block, a second calibration block and a third calibration block, and the first calibration block, the second calibration block and the third calibration block are respectively disposed on the base.
3. The standard test block for a probe type film thickness tester according to claim 2, characterized in that, The height of the first calibration block is greater than the height of the second calibration block.
4. The standard test block for a probe type film thickness tester according to claim 2, characterized in that, The height of the second calibration block is greater than the height of the third calibration block.
5. The standard test block for a probe type film thickness tester according to claim 2, characterized in that, A first spacing is provided between the first calibration block and the second calibration block.
6. The standard test block for a probe type film thickness tester according to claim 5, characterized in that, A second spacing is provided between the second calibration block and the third calibration block.
7. The standard test block for a probe type film thickness tester according to claim 6, characterized in that, The length of the first calibration block is the same as the length of the second calibration block.
8. The standard test block for a probe type film thickness tester according to claim 6, characterized in that, The length of the second calibration block is the same as the length of the third calibration block.
9. The standard test block for a probe type film thickness tester according to claim 1, characterized in that, The groove has a rectangular cross-sectional structure.
10. The standard test block for a probe-type film thickness tester according to claim 8, characterized in that, The first calibration block, the second calibration block and the third calibration block all have rectangular cross-sectional structures.