Cable testing device and cable tester based on TDC length measurement and far-end line searching and aligning

Abstract

The utility model discloses a cable testing device and a cable tester based on TDC length measurement and far-end line searching, the device comprises a host module and an auxiliary module, a first MCU processing module in the host module sends trigger signals to a length measurement management module and a signal emission module; the length measurement management module writes a counting result into a result register; the signal transmitting module transmits a hunting trigger signal to the to-be-tested line group, and a hunting receiving module in the auxiliary machine module transmits a hunting result to the second MCU processing module; the second MCU processing module is used for determining line group hunting information, obtaining cable line sequence information of a to-be-tested line group through the first line sequence measurement module and the second line sequence measurement module, and generating a cable test result through the first MCU processing module, so that the cable length and the cable line sequence can be intelligently measured, and the test efficiency is improved. The accuracy of testing the length and the wire sequence of the cable can be improved, and the intelligence and the efficiency of testing the length and the wire sequence of the cable can be improved.

Description

Technical Field

[0001] The utility model relates to the technical field of line matching and cable testing, in particular to a cable testing device and a cable tester based on TDC length measurement and remote line matching. Background Art

[0002] With the continuous advancement of science and technology, communication technology has also developed rapidly. Various types of communication cables are increasingly used in network communications, data centers, and other fields. The data transmission efficiency of communication cables depends on the operating parameters of the cables, among which the length of the cable plays an important role in data transmission.

[0003] Currently, there are various methods for measuring cable length, including direct measurement, resistance measurement, and capacitance measurement. However, most existing methods require manual operation, resulting in inefficient and inaccurate testing and errors in the results. Therefore, it is crucial to provide a new cable tester that improves the intelligence and accuracy of cable length testing. Utility Model Content

[0004] The utility model provides a cable testing device and a cable tester based on TDC length measurement and remote line matching, which can realize intelligent measurement of cable length and cable line sequence, which is beneficial to improving the accuracy of testing cable length and line sequence, and is beneficial to improving the intelligence and efficiency of testing cable length and line sequence.

[0005] In order to solve the above technical problems, the first aspect of the present invention discloses a cable testing device based on TDC length measurement and remote line matching. The device includes a host module and a slave module, wherein the host module includes a first MCU processing module, a signal transmission module, a length measurement management module, and a first line sequence measurement module, and the slave module includes a second MCU processing module, a line matching receiving module, and a second line sequence measurement module, wherein:

[0006] A first end of the first MCU processing module is electrically connected to a first end of the length measurement management module, a second end of the first MCU processing module is electrically connected to a first end of the signal transmission module, a first end of the line group to be tested is electrically connected to a first end of the first line sequence measurement module and a second end of the signal transmission module, a first end of the line search and receiving module is used to electrically connect to a second end of the line group to be tested, a second end of the line search and receiving module is electrically connected to a first end of the second MCU processing module, a first end of the second line sequence measurement module is used to electrically connect to a third end of the line group to be tested, and a second end of the length measurement management module is used to electrically connect to a fourth end of the line group to be tested;

[0007] The first MCU processing module is configured to send a trigger signal to the length measurement management module and the signal transmission module;

[0008] The length measurement management module is configured to perform a counting operation based on the trigger signal to obtain a counting result, and write the counting result into a result register;

[0009] The signal transmitting module is configured to send a line search trigger signal to the line group to be tested based on the trigger signal;

[0010] The first line sequence measurement module is used to measure a target resistance value corresponding to the line group to be measured, and determine a target voltage based on the target resistance value;

[0011] The line search receiving module is used to perform a line search operation based on the line search trigger signal, obtain a line search result, and transmit the line search result to the second MCU processing module;

[0012] The second MCU processing module is configured to determine line group search information of the line group to be tested based on the line search trigger signal; wherein the line group search information includes one or more of cable direction information and cable position information of the line group to be tested;

[0013] A second line sequence measurement module determines a line sequence test result of the line group to be tested based on the target voltage;

[0014] The first MCU processing module is further configured to read the counting result stored in the result register and generate a cable test result based on the counting result.

[0015] As an optional implementation, in the first aspect of the present utility model, the host module further includes a first display module, wherein:

[0016] The first end of the first display module is electrically connected to the fourth end of the first MCU processing module;

[0017] The first MCU processing module is further configured to read the counting result of the result register corresponding to the length measurement management module through SPI communication, generate a counting display parameter based on the counting result, and transmit the counting display result to the first display module;

[0018] The first display module is used to display the counting result.

[0019] As an optional implementation, in the first aspect of the present utility model, the auxiliary machine module further includes a second display module, wherein:

[0020] The first end of the second display module is electrically connected to the second end of the second MCU processing module;

[0021] The second display module is configured to generate and output a display indication signal based on the cable test result.

[0022] As an optional implementation, in the first aspect of the present utility model, the auxiliary device module further includes an audio output module, wherein:

[0023] The first end of the audio output module is electrically connected to the third end of the second MCU processing module;

[0024] The audio output module is configured to generate and output an audio indication signal based on the cable test result.

[0025] As an optional implementation, in the first aspect of the present utility model, the first MCU processing module includes a target port, a first MOS transistor, a second MOS transistor, and a four-way buffer, wherein:

[0026] The first end of the target port is electrically connected to the first end of the first MOS transistor, the second end of the target port is electrically connected to the first end of the second MOS transistor, and the first end of the four-way buffer is electrically connected to the second end of the first MOS transistor and the second end of the second MOS transistor respectively.

[0027] As an optional implementation, in the first aspect of the present utility model, the first line sequence measurement module includes a first analog switch, a second analog switch, and a target selection circuit, wherein:

[0028] The third end of the first MCU processing module is electrically connected to the first end of the target selection circuit, the first end of the first analog switch is electrically connected to the second end of the target selection circuit, the first end of the second analog switch is electrically connected to the third end of the target selection circuit, and the fourth end of the target selection circuit is electrically connected to the third end of the line group to be tested.

[0029] As an optional implementation, in the first aspect of the present utility model, the length measurement management module includes a target chip, a third analog switch, and a high-speed comparator, wherein:

[0030] A first end of the third analog switch is electrically connected to a first end of the high-speed comparator, a second end of the high-speed comparator is used to electrically connect to a first end of the target chip, and a first end of the first MCU processing module is electrically connected to a second end of the target chip and a second end of the third analog switch respectively;

[0031] Wherein, the target chip is the MS1003 chip.

[0032] As an optional implementation, in the first aspect of the present utility model, the line search receiving module includes a target filter and a target amplifier, wherein:

[0033] The first end of the target filter is used to electrically connect to the fourth end of the line group to be tested, the second end of the target filter is electrically connected to the first end of the target amplifier, and the second end of the target amplifier is electrically connected to the first end of the second MCU processing module.

[0034] As an optional implementation, in the first aspect of the present utility model, the line search receiving module further includes a fourth analog switch, wherein:

[0035] A first end of the fourth analog switch is electrically connected to the second end of the target filter, and a second end of the fourth analog switch is electrically connected to the first end of the target amplifier.

[0036] A second aspect of the present invention discloses a cable tester, which includes any one of the cable testing devices based on TDC length measurement and remote pairing as disclosed in the first aspect.

[0037] Compared with the prior art, the embodiments of the present invention have the following beneficial effects:

[0038] The utility model provides a cable testing device and a cable tester based on TDC length measurement and remote line search, the device includes a host module and an auxiliary module, wherein the host module includes a first MCU processing module, a signal transmission module, a length measurement management module, and a first line sequence measurement module, and the auxiliary module includes a second MCU processing module, a line search receiving module, and a second line sequence measurement module, the first MCU processing module is used to send a trigger signal to the length measurement management module and the signal transmission module; the length measurement management module is used to perform a counting operation based on the trigger signal to obtain a counting result, and write the counting result to a result register; the signal transmission module is used to send a line search trigger signal to the line group to be tested based on the trigger signal; the first The line sequence measurement module is used to measure the target resistance value corresponding to the line group to be tested, and determine the target voltage based on the target resistance value; the line search receiving module is used to perform the line search operation based on the line search trigger signal, obtain the line search result, and transmit the line search result to the second MCU processing module; the second MCU processing module is used to determine the line group search information of the line group to be tested based on the line search trigger signal; wherein the line group search information includes one or more of the cable direction information and cable position information of the line group to be tested; the second line sequence measurement module determines the line sequence test result of the line group to be tested based on the target voltage; the first MCU processing module is also used to read the counting result stored in the result register, and generate the cable test result based on the counting result. It can be seen that the utility model can realize the intelligent measurement of cable length and cable line sequence, which is conducive to improving the accuracy of testing cable length and line sequence, as well as improving the intelligence and efficiency of testing cable length and line sequence. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0040] Figure 1 This is a structural diagram of a cable testing device based on TDC length measurement and remote pairing according to an embodiment of the present invention;

[0041] Figure 2 This is a structural diagram of another cable testing device based on TDC length measurement and remote pairing according to an embodiment of the present invention;

[0042] Figure 3 This is a structural diagram of a first MCU processing module disclosed in an embodiment of the present utility model;

[0043] Figure 4This is a structural diagram of a first line sequence measurement module disclosed in an embodiment of the present utility model;

[0044] Figure 5 This is a schematic diagram of the structure of a length measurement management module disclosed in the utility model;

[0045] Figure 6 This is a structural diagram of a line-finding receiving module disclosed in the utility model;

[0046] Figure 7 This is a structural diagram of an audio output module disclosed in the utility model;

[0047] Figure 8 This is a structural diagram of a first display module disclosed in the present utility model;

[0048] Figure 9 This is a structural diagram of a second display module disclosed in the present utility model;

[0049] Figure 10 The utility model is a structural diagram of a cable tester disclosed in an embodiment. DETAILED DESCRIPTION

[0050] For better understanding and implementation, the following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0051] It should be noted that, unless otherwise expressly specified and limited, the term "electrical connection" in the specification and claims of the present invention and the above-mentioned drawings should be understood in a broad sense. For example, it can be a fixed electrical connection, a detachable electrical connection, or an integral electrical connection; it can be a mechanical electrical connection, an electrical electrical connection, or can communicate with each other; it can be directly connected, or indirectly connected through an intermediate medium, or it can be the internal connection of two elements or the interaction relationship between two elements. In addition, the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order. The terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0052] This utility model discloses a cable tester based on TDC length measurement and remote pairing. It can intelligently measure cable length and cable sequence, which helps improve the accuracy of cable length and sequence testing, as well as the intelligence and efficiency of cable length and sequence testing. The following describes each of these in detail.

[0053] Example 1

[0054] See also Figure 1 , Figure 1 The present invention discloses a cable testing device based on TDC length measurement and remote pairing. Figure 1 As shown, the cable testing device based on TDC length measurement and remote pairing includes a host module 10 and a slave module 20, wherein the host module 10 includes a first MCU processing module 101, a signal transmission module 102, a length measurement management module 103, and a first line sequence measurement module 104, and the slave module 20 includes a second MCU processing module 201, a line search receiving module 202, and a second line sequence measurement module 203, wherein:

[0055] A first end of the first MCU processing module 101 is electrically connected to a first end of the length measurement management module 103, a second end of the first MCU processing module 101 is electrically connected to a first end of the signal transmission module 102, a first end of the line group to be tested is electrically connected to a first end of the first line sequence measurement module 104 and a second end of the signal transmission module 102, a first end of the line search and reception module 202 is used to electrically connect to a second end of the line group to be tested, a second end of the line search and reception module 202 is electrically connected to a first end of the second MCU processing module 201, a first end of the second line sequence measurement module 203 is used to electrically connect to a third end of the line group to be tested, and a second end of the length measurement management module 103 is used to electrically connect to a fourth end of the line group to be tested;

[0056] The first MCU processing module 101 is configured to send a trigger signal to the length measurement management module 103 and the signal transmission module 102;

[0057] The length measurement management module 103 is configured to perform a counting operation based on a trigger signal to obtain a counting result, and write the counting result into a result register;

[0058] The signal transmitting module 102 is configured to send a line search trigger signal to the line group to be tested based on the trigger signal;

[0059] A first line sequence measurement module 104 is configured to measure a target resistance value corresponding to the line group to be tested, and determine a target voltage based on the target resistance value;

[0060] The line search receiving module 202 is configured to perform a line search operation based on the line search trigger signal and obtain a line search result;

[0061] The second MCU processing module 201 is configured to determine line group search information of the line group to be tested based on the line search trigger signal; wherein the line group search information includes one or more of cable direction information and cable position information of the line group to be tested;

[0062] The second line sequence measurement module 203 determines the line sequence test result of the line group to be tested based on the target voltage;

[0063] The first MCU processing module 101 is further configured to read the counting result stored in the result register, and generate a cable test result based on the counting result.

[0064] In the embodiment of the present invention, optionally, the first MCU processing module 101 may send a trigger signal to the length measurement management module 103 via the MCU_TDC_START network. Further optionally, the trigger signal may include a TDC trigger signal.

[0065] In the embodiment of the present invention, further optionally, the first MCU processing module 101 sends a pulse wave to the line group to be tested through the MCU_TDC_CLOCK network.

[0066] In the embodiment of the present invention, optionally, the first MCU processing module 101 and the length measurement management module 103 may communicate via a high-speed SPI communication method.

[0067] In an embodiment of the present invention, optionally, the cable test result includes the cable length corresponding to the line group to be tested. Furthermore, the process of generating the cable test result is based on the time difference measurement (TDC) method for measurement, wherein the time difference measurement (TDC) is a method for measuring time intervals with high precision, which is widely used in the fields of ultrasonic flow meters, laser ranging, satellite navigation and positioning. There are three main TDC methods: analog method, digital method and digital insertion method; the analog method measures tiny time intervals by the charge and discharge time of the capacitor, and has extremely high precision; the digital method calculates the time difference by recording the number of reference clock cycles through a counter, and has good linearity; the digital insertion method combines the digital method and different insertion methods, and can achieve measurement with picosecond resolution, with the advantages of large measurement range, high linearity and high precision.

[0068] In an embodiment of the present invention, optionally, for example, the first MCU processing module sends a trigger signal to the length measurement management module via the MCU_TDC_START network, and simultaneously sends a pulse wave to the line group to be measured via the MCU_TDC_CLOCK network. At this time, the TDC gate circuit in the length measurement management module begins counting until the stop (stop1 / stop2) signal in the length measurement management module generates a record counting result. Counting stops after reaching the expected number of STOP pulses. After the time measurement is completed, the length measurement management module automatically writes the measurement results of each pulse to the corresponding result register in sequence. Further optionally, the stop signal indicates a trigger signal. When U14 receives the Stop signal, the internal gate circuit of U14 will stop counting. From the start of the START trigger signal to the end of the Stop trigger signal, the number of internal gate circuits of U14 during this period is the counting result.

[0069] In an embodiment of the present invention, further optionally, the second end of the first line sequence measurement module 104 can be electrically connected to the first end of the line finding and line sequence measurement port, and the second end of the line finding and line sequence measurement port is used to electrically connect to the second end of the line group to be tested; further, the first line sequence measurement module 104 and the signal transmission module 102 share a port and the port is used to electrically connect to the line group to be tested.

[0070] In the embodiment of the present invention, further optionally, the line sequence test result of the line group to be tested can be obtained by remote line alignment.

[0071] In the embodiment of the present invention, further optionally, the host line search signal transmission interface and the line interface share a port (RJ2), which can simultaneously transmit the line search signal and wait for the line signal, which is beneficial to improving the line search efficiency and accuracy.

[0072] In an embodiment of the present invention, further optionally, the first line sequence measurement module of the host, the second line sequence measurement module of the slave, and the line group to be tested are combined into different loops, and the different AD values ​​composed of these loops are detected by MCU_WIR_ADC to determine the line sequence, and then obtain the line sequence test result; wherein the AD value may include the numerical value after the analog signal is converted into a digital signal, that is, the result of analog-to-digital conversion (ADC).

[0073] It can be seen that implementation Figure 1The described cable tester based on TDC length measurement and remote line search can perform cable length measurement operations based on the time difference measurement method on the line group to be tested through the host module, and by designing the host module and the auxiliary module separately, it is convenient for maintenance and upgrading, and also facilitates the independent development and testing of different functional modules. The first MCU processing module is responsible for sending trigger signals to the length measurement management module and the signal transmission module, ensuring the timeliness and accuracy of signal processing. The length measurement management module performs counting operations based on the trigger signal and writes the results into the result register, which helps to achieve accurate measurement of the cable length. The line search operation performed by the signal transmission module and the line search receiving module can improve the test efficiency based on the automated line search process and thus improve the efficiency of measuring cable length. The first MCU processing module reads the counting results and the line search results, and generates a cable test result. The cable test result includes the cable length of the line group to be tested and the line sequence measurement Test results, which makes the test results more comprehensive and accurate. Through precise counting operations and automatic line searching, human errors are reduced. The first line sequence measurement module and the second line sequence measurement module can adapt to more types of cable testing needs, including complex line sequence identification, which is conducive to improving the intelligence and comprehensiveness of line sequence identification, and thus is conducive to improving the accuracy and reliability of line sequence test results, and is conducive to improving the intelligence and efficiency of line sequence test results, improving the accuracy of cable testing, and through the digital TDC application internal logic gate delay to measure the time interval with high precision. The circuit structure ensures that the circuit uses a special measurement method to make the time for the signal to pass through the logic gate very accurate. The highest measurement accuracy depends entirely on the internal propagation time through the logic gate, which is conducive to improving measurement accuracy, and is conducive to improving the accuracy and reliability of the length measurement of the line group to be tested, and thus is also conducive to improving the intelligence and efficiency of testing cable length.

[0074] In an optional embodiment, if Figure 2 As shown, the host module 10 further includes a first display module 105, wherein:

[0075] The first terminal of the first display module 105 is electrically connected to the fourth terminal of the first MCU processing module 101;

[0076] The first MCU processing module 101 is further configured to read the counting result of the result register corresponding to the length measurement management module 103 through SPI communication, generate a counting display parameter based on the counting result, and transmit the counting display result to the first display module 105;

[0077] The first display module 105 is used to display the counting result.

[0078] In this optional embodiment, SPI (Serial Peripheral Interface) is a common serial communication protocol used for communication between microcontrollers and various peripheral devices. Furthermore, SPI allows for simultaneous sending and receiving of data, i.e., full-duplex operation, and supports relatively high data transfer rates, the specific rate depending on the capabilities of the microcontroller and peripheral devices. SPI communication is synchronous, using a clock signal (SCLK) to synchronize data transfer.

[0079] In this optional embodiment, optionally, as Figure 9 As shown, Figure 9 This is a schematic diagram of the circuit structure corresponding to the first display module.

[0080] In this optional embodiment, optionally, the first display module can be a component for presenting information. Further, the first display module can be a device such as a display, a diode, a display screen, etc. that can be used to display information. The embodiment of the present utility model does not make specific limitations.

[0081] In this optional embodiment, optionally, for example, the first MCU processing module reads the technical results in the result register corresponding to the length measurement management module through SPI communication, and performs algorithm calculation, and the technical results will be displayed on the display module.

[0082] In this optional embodiment, the method of generating the counting display parameters based on the counting results may be one or more of data unit conversion, data display format adjustment, data calculation, etc., which is not specifically limited in the embodiment of the present utility model.

[0083] It can be seen that the implementation of this optional embodiment can use the SPI communication protocol, and the first MCU processing module can read the result register of the length measurement management module in real time, and quickly transmit the data to the first display module to ensure the timeliness of data display. The synchronization characteristics of SPI are used to ensure the synchronization of data transmission and display update, and avoid data dislocation or display delay. The first MCU processing module can perform algorithmic processing on the read counting results to achieve more complex functions, such as unit conversion, data display format adjustment, etc., which is conducive to improving the accuracy and reliability of generating counting display parameters, as well as improving the intelligence and efficiency of generating counting display parameters. Through clear display and fast data display, the user experience is enhanced, and the test results can be quickly conveyed to the user through visual indications, reducing the time for interpreting test data, which is conducive to improving the efficiency and timeliness of users understanding cable test results, and thus it is also conducive to improving the intuitiveness and convenience of users viewing counting results, as well as improving the convenience and experience of users using cable testers.

[0084] In another optional embodiment, as Figure 2 As shown, the auxiliary unit module 20 further includes a second display module 204, wherein:

[0085] A first end of the second display module 204 is electrically connected to a second end of the second MCU processing module 201;

[0086] The second display module 204 is configured to generate and output a display indication signal based on the cable test result.

[0087] In this optional embodiment, if Figure 8 As shown, Figure 8 Schematic diagram of the circuit structure corresponding to the second display module.

[0088] In this optional embodiment, the value of the received signal MCU_SCAN_ADC is the signal amplitude. The slave MCU processing module uses this amplitude to determine whether to output an audio signal. If the signal amplitude is too small or absent, no audio signal is output. When the signal amplitude reaches a predetermined value, an audio signal is output.

[0089] In this optional embodiment, the display indication signal may optionally include one or more of the number of lights, the color of lights, the brightness of lights, etc. used to indicate the signal.

[0090] In this optional embodiment, optionally, the second display module 204 includes a secondary machine signal strength indication module / second indication module, wherein the secondary machine signal strength indication module / second indication module includes three interfaces MCU_SIG_L, MCU_SIG_M, and MCU_SIG_H, and each interface corresponds to a signal indicator light, wherein the second MCU processing module controls the number of signal strength indicator lights that are lit by controlling MCU_SIG_L, MCU_SIG_M, and MCU_SIG_H to realize the indication of signal strength.

[0091] It can be seen that the implementation of this optional embodiment can output the corresponding display indication signal through the second display module. Through visual indication, the user can understand the results of the cable test more intuitively. The visual indication can quickly convey the test results to the user, reducing the time for interpreting the test data, which is conducive to improving the efficiency and timeliness of the user's understanding of the cable test results. The audio output module can emit specific sound signals to indicate specific problems of the cable, such as broken wires, short circuits, etc., and the second display module can display more detailed test results to help users accurately diagnose the problem, which can improve the accuracy and reliability of the second display module in generating and outputting the display indication signal. The display module can provide accurate test results, reduce human interpretation errors, and can also be based on a modular design so that the display module can be independently upgraded or maintained, thereby improving the flexibility and service life of the equipment, which in turn is conducive to improving the intelligence and convenience of user use.

[0092] In another optional embodiment, Figure 2 As shown, the auxiliary unit module 20 further includes an audio output module 205, wherein:

[0093] The first terminal of the audio output module 205 is electrically connected to the third terminal of the second MCU processing module 201;

[0094] The audio output module 205 is configured to generate and output an audio indication signal based on the cable test result.

[0095] In this optional embodiment, the audio output module 205 may further optionally include a filter, an amplifier submodule, and a speaker. The specific process of generating and outputting an audio indication signal based on the cable test result may be: outputting an MCU_PWM audio indication signal based on the signal amplitude, filtering it in U17 and amplifying it in U18 to cause speaker P1 to emit a line-finding sound. The audio indication signal may include a voice signal corresponding to the current cable test result, wherein the voice signal may include one or more of an indication prompt tone or a text or voice reminder message.

[0096] In this optional embodiment, optionally, as Figure 7 As shown, Figure 7 This is a schematic diagram of the circuit structure corresponding to the audio output module.

[0097] In this optional embodiment, the value of the received signal MCU_SCAN_ADC is the signal amplitude. The slave MCU processing module uses this amplitude to determine whether to output an audio signal. If the signal amplitude is too small or absent, no audio signal is output. When the signal amplitude reaches a predetermined value, an audio signal is output.

[0098] It can be seen that the implementation of this optional embodiment can output the corresponding audio indication signal through the audio output module. Through audio, the user can understand the results of the cable test more intuitively. The audio indication can quickly convey the test results to the user, reducing the time for interpreting the test data, which is conducive to improving the efficiency and timeliness of the user's understanding of the cable test results. In addition, the audio output module can emit specific sound signals to indicate specific problems of the cable, such as broken wires, short circuits, etc., which can improve the accuracy and reliability of the audio output module in generating and outputting audio indication signals. Audio can provide accurate test results, reduce human interpretation errors, and can also enable the audio output module to be independently upgraded or maintained based on modular design, thereby improving the flexibility and service life of the equipment, and thus helping to improve the intelligence and convenience of user use.

[0099] In another optional embodiment, Figure 3 As shown, Figure 3 This is a structural diagram of a first MCU processing module 101 disclosed in an embodiment of the present utility model. The first MCU processing module 101 includes a target port, a first MOS transistor, a second MOS transistor, and a four-way buffer, wherein:

[0100] The first end of the target port is electrically connected to the first end of the first MOS transistor, the second end of the target port is electrically connected to the first end of the second MOS transistor, and the first end of the four-way buffer is electrically connected to the second end of the first MOS transistor and the second end of the second MOS transistor respectively.

[0101] In this optional embodiment, the target port may optionally include MCU_SCAN_A and MCU_SCAN_B ports; further, the MCU_SCAN_A and MCU_SCAN_B ports control the first MOS transistor Q10 and the second MOS transistor Q11 to be turned on and off, thereby controlling the output transmission signal of the four-way buffer SN74HC125 with a three-state output of U16.

[0102] In this optional embodiment, optionally, the target port may further include four control pins: MCU_P_EN1, MCU_P_EN2, MCU_P_EN3, and MCU_P_EN4.

[0103] In this optional embodiment, optionally, the quad buffer is SN74HC125, which is a quad three-state non-inverting buffer / line driver that can provide four independent buffer channels. The output of each channel in the three-state output can be high level, low level or high impedance state (three-state), which allows multiple buffers to share the same bus line without interfering with each other.

[0104] It can be seen that the implementation of this optional embodiment can control the conduction and shutdown of the two MOS tubes based on the target port, thereby realizing the control of the four-way buffer to output the transmission signal. By using two MOS tubes, the signal flow direction of the target port can be more accurately controlled. The MOS tube can be used as a switch to achieve fast switching of the signal. In addition, the stability of the signal can be enhanced by the four-way buffer, and the attenuation of the signal during the transmission process can be reduced to ensure the integrity and reliability of the signal. The four-way buffer allows multiple signals to be transmitted through the same physical line, which improves the utilization rate of the line and reduces the wiring requirements. Moreover, through the control of the MCU, the working status of the MOS tube and the buffer can be dynamically configured as needed, which is conducive to improving the flexibility of the cable tester. The MOS tube has good signal isolation, prevents interference between different signals, and improves the anti-interference ability of the system. Furthermore, through the intelligent control of the MCU, the working status of the MOS tube and the buffer can be monitored in real time, potential problems can be discovered and handled in time, and the reliability of the cable tester can be improved. The data processing capability of the first MCU processing module and the accuracy, reliability and intelligence of data processing can be improved, thereby realizing intelligent measurement of cable length, which is beneficial to improving the accuracy of cable length testing, as well as improving the intelligence and efficiency of cable length testing.

[0105] In another optional embodiment, Figure 4 As shown, Figure 4 The present invention discloses a schematic structural diagram corresponding to a first line sequence measurement module 104. The first line sequence measurement module 104 includes a first analog switch, a second analog switch, and a target selection circuit, wherein:

[0106] The third end of the first MCU processing module is electrically connected to the first end of the target selection circuit, the first end of the first analog switch is electrically connected to the second end of the target selection circuit, the first end of the second analog switch is electrically connected to the third end of the target selection circuit, and the fourth end of the target selection circuit is electrically connected to the third end of the line group to be tested.

[0107] In this optional embodiment, optionally, the first analog switch may be a single-pole eight-throw analog switch, and the second analog switch may be a four-way single-pole single-throw analog switch.

[0108] In this optional embodiment, optionally, the target selection circuit may include MCU_WIR_EN0 and MCU_WIR_EN1 enable networks, and six selection networks MCU_WIR_A0, MCU_WIR_B0, MCU_WIR_C0, MCU_WIR_A1, MCU_WIR_B1, and MCU_WIR_C1.

[0109] In this optional embodiment, optionally, all target selection lines based on the first analog switch and the second analog switch, plus the slave remote wiring module and the cable to be tested are combined into different loops, and the MCU_WIR_ADC is used to detect the different AD values ​​of these loops to determine the line sequence.

[0110] In this optional embodiment, optionally, for example, Figure 4 As shown, U15 is enabled by MCU_WIR_EN0, and channel X0 is selected by MCU_WIR_A0, MCU_WIR_B0, and MCU_WIR_C0. U28 is enabled by MCU_WIR_EN1, and channel X1 is selected by MCU_WIR_A1, MCU_WIR_B1, and MCU_WIR_C1. The local and slave units form an ADC detection circuit: 3.3V→R40→U15's second pin→U15's 13th pin→R41→the first pin of RJ2 on the local unit→the first wire of the cable to be tested→the first pin of RJ3 on the slave unit→R53→D13→the second pin of RJ3 on the slave unit→the second wire of the cable to be tested→the second pin of RJ2 on the local unit→R42→U28's 14th pin→U28's 3rd pin→ground; the ADC detection port voltage is calculated as follows: The preliminary calculation formula is: U = 3.3*R40 / (R40+R41+R53+R42); when U15 fixedly selects channel X0, U28 is enabled through MCU_WIR_EN1, and the X0→X8 channels are scanned and switched through MCU_WIR_A1, MCU_WIR_B1, and MCU_WIR_C1, for the normal line sequence of the cable to be tested, the first wire of the cable to be tested is only related to the resistance value of R53. When it is disconnected, U = 3.3V is the maximum. When cross-connected to other core positions (such as the third wire of the cable to be tested), R53 in the above formula will become the resistance value of R50, and the voltage detected by the ADC port will change. Since the eight resistors R50-58 have different resistance values ​​and are fixed, the voltage detection of the ADC port will be significantly different, thereby determining the line sequence.

[0111] It can be seen that the implementation of this optional embodiment can form different loops through the first analog switch, the second analog switch and all target selection lines, combined with the auxiliary machine remote wiring module and the cable to be tested, and use MCU_WIR_ADC to detect the different AD values ​​composed of these loops to determine the line sequence. It can reduce the need for manual detection of the line sequence through automated electronic detection methods, reduce the possibility of human error, and use analog switches and selection networks to flexibly form a variety of different loop combinations to meet different detection needs. The line sequence can be quickly determined through the automated detection process, improving production efficiency and detection speed. It can accurately determine the line sequence through precise AD value measurement to ensure the correctness of the cable connection, and reduce line sequence errors caused by improper operation or negligence through automated operation, improve the reliability of the overall system, and help improve the stability and reliability of the cable tester operation, thereby realizing intelligent measurement of cable length, which is conducive to improving the accuracy of the test cable length, and is conducive to improving the intelligence and efficiency of the test cable length.

[0112] In another optional embodiment, Figure 5 As shown, Figure 5 This is a schematic structural diagram corresponding to a length measurement management module 103 disclosed in an embodiment of the present utility model. The length measurement management module 103 includes a target chip, a third analog switch, and a high-speed comparator, wherein:

[0113] A first end of the third analog switch is electrically connected to a first end of the high-speed comparator, a second end of the high-speed comparator is used to electrically connect to a first end of the target chip, and a first end of the first MCU processing module is electrically connected to a second end of the target chip and a second end of the third analog switch respectively;

[0114] Among them, the target chip is the MS1003 chip.

[0115] In this optional embodiment, the MS1003 chip optionally serves as a main measurement unit for time measurement (TDC), wherein the MS1003 chip is a high-performance time-to-digital converter (TDC) that can measure time intervals with extremely high precision.

[0116] In this optional embodiment, optionally, the third analog switch may include several single-pole double-throw analog switches.

[0117] In this optional embodiment, optionally, a high-speed comparator is an electronic component that can quickly compare two voltage signals and output a signal representing the relative magnitude of the two voltages.

[0118] In this optional embodiment, for example, the first MCU processing module controls the conduction state of the single-pole double-throw analog switch corresponding to the third analog switch to select the line group (1-2, 3-6, 4-5, 7-8) to be measured. When the RJ45 port RJ1 is connected to the cables to be tested of different lengths, the pulse wave will propagate in the cable to be tested and will be reflected when it reaches the end of the line to be tested. After the reflected signal passes through the high-speed comparator U13, a STOP signal is generated, and the length measurement management module stops working and obtains the counting result according to the test result sequence, and writes the counting result to the corresponding result register.

[0119] It can be seen that the implementation of this optional embodiment can control the conduction state of the third analog switch based on the first MCU processing module, and determine the line group to be tested and generate a counting result based on the obtained signal and then write it to the corresponding result register. It can provide extremely high measurement accuracy based on the MS1003 chip, and can measure very short time intervals, thereby achieving accurate length measurement. Moreover, different line groups can be flexibly selected for measurement through the multiple control pins of the control port to adapt to different test requirements, and the conduction state of the analog switch can be controlled by the MCU to automatically select the line group to be measured, reducing the complexity and error rate of manual operation, and the obtained technical results can be written to the corresponding result register, which can improve the accuracy and efficiency of subsequent reading and analysis of data, and can also improve the convenience of reading and analyzing data. By reducing manual operation and improving measurement accuracy, rework and scrap rates caused by measurement errors can be reduced, thereby reducing production costs, thereby realizing intelligent measurement of cable length, which is conducive to improving the accuracy of testing cable length, as well as improving the intelligence and efficiency of testing cable length.

[0120] In another optional embodiment, Figure 6 As shown, Figure 6 This is a structural diagram corresponding to a line-finding receiving module 202 disclosed in an embodiment of the present utility model. The line-finding receiving module 202 includes a target filter and a target amplifier, wherein:

[0121] The first end of the target filter is used to electrically connect to the fourth end of the line group to be tested, the second end of the target filter is electrically connected to the first end of the target amplifier, and the second end of the target amplifier is electrically connected to the first end of the second MCU processing module.

[0122] In this optional embodiment, optionally, the target filter may include a piezoelectric ceramic filter, wherein the piezoelectric ceramic filter can be used for frequency selection; further, the ceramic filter is used for signal processing of a specific frequency, such as SFU455B, which is mainly used to filter out other interference signals except the transmission signal.

[0123] In this optional embodiment, optionally, the target amplifier can be used to perform two-stage amplification on the signal and transmit the amplified signal to the second MCU processing module.

[0124] In this optional embodiment, further optionally, the first end of the target filter is electrically connected to the first end of the antenna, and the second end of the antenna is used to electrically connect to the fourth end of the line group to be tested; wherein, the signal received by the receiving antenna is frequency-selected by the piezoelectric ceramic filter Y3, and then input into the second MCU processing module after two-stage amplification by U20; further, when the transmitted signal propagates in the cable to be tested, electromagnetic waves will be formed around it, and the function of the antenna is to receive such electromagnetic waves.

[0125] It can be seen that the implementation of this optional embodiment can select the frequency of the signal based on the target filter and perform an amplification operation on the signal through the target amplifier and then transmit it to the second MCU processing module. It can effectively select the signal of a specific frequency through the piezoelectric ceramic filter, filter out other clutter signals, improve the purity of the signal, and perform two-stage amplification of the signal through the target amplifier to ensure that the signal strength is sufficient to be accurately identified and processed by the second MCU processing module. It can further receive the signal through the antenna and improve the module's reception ability for weak signals through the combination of the filter and the amplifier, and perform the corresponding frequency selection operation through the target filter, which can filter out other clutter signals through the target amplifier. The filter is used to suppress signals of non-target frequencies and reduce the impact of external noise and interference on the measurement results, which is beneficial to improving the accuracy of signal purity. After amplification and filtering, the signal is directly transmitted to the second MCU processing module to realize automated signal processing flow. As well as precise signal reception and processing, the accuracy and reliability of the measurement results are improved. Effective signal filtering can reduce the noise level of the signal to improve the signal-to-noise ratio. Stable signal amplification and filtering can help improve the stability of signal measurement, thereby realizing intelligent measurement of the direction and position of the cable, which is beneficial to improving the accuracy and reliability of measuring information such as the direction and position of the cable.

[0126] In another optional embodiment, Figure 6 As shown, the line search receiving module 202 further includes a fourth analog switch, wherein:

[0127] A first end of the fourth analog switch is electrically connected to the second end of the target filter, and a second end of the fourth analog switch is electrically connected to the first end of the target amplifier.

[0128] In this optional embodiment, optionally, the fourth analog switch is used to adjust the first-stage amplification factor corresponding to the target amplifier. Furthermore, the amplification factor is adjusted by the high and low levels of pins 9, 10, and 11 of the fourth analog switch, thereby achieving sensitivity adjustment.

[0129] In this optional embodiment, the amplification factor calculation formula may further include: (Vref - Vout) = R * (Vin - Vref) / R95. The fourth analog switch U19 switches the amplification factor by switching channels via MCU_4051_A, MCU_4051_B, and MCU_4051_C, changing the value of the connected resistor R. For example, if U19 switches to channel X0, the value of R is the value of the series resistor R87 on channel X0.

[0130] It can be seen that the implementation of this optional embodiment can adjust the first-level amplification factor of the target amplifier through the fourth analog switch, can adjust the amplification factor through the fourth analog switch, can dynamically adjust the gain of the amplifier according to the strength of the signal to adapt to different signal environments, and can select different amplification factors as needed, thereby improving the adaptability of the module to different signal conditions. Through the specific resistance value and the channel selection of the analog switch, the amplification factor can be precisely controlled to achieve fine signal adjustment. By adjusting the amplification factor, the signal-to-noise ratio of the signal can be optimized, and the clarity of the signal and the accuracy of the measurement can be improved. By adjusting the amplification factor, the signal overload or distortion can be prevented, and the stability of the system can be improved. By adaptively adjusting the amplification factor, the impact of external interference on the signal can be reduced, which is conducive to improving the accuracy and reliability of signal measurement, and then realizing intelligent measurement of the direction and position of the cable, which is conducive to improving the accuracy and reliability of measuring information such as the direction and position of the cable.

[0131] Example 2

[0132] See also Figure 10 , Figure 10 This is a structural diagram of a cable tester disclosed in an embodiment of the present utility model, and the cable tester includes any cable testing device based on TDC length measurement and remote pairing as in the first embodiment. The detection functions that can be achieved by this electronic product include but are not limited to the ability to intelligently measure the length of the cable, which is beneficial to improving the accuracy of the test cable length, as well as the intelligence and efficiency of the test cable length. It should be noted that for a detailed description of the cable testing device based on TDC length measurement and remote pairing, please refer to the specific description of the relevant content in the first embodiment, which will not be repeated in this embodiment.

[0133] It can be seen that implementation Figure 8 The electronic product described can realize intelligent measurement of cable length, which is beneficial to improving the accuracy of testing cable length, and is beneficial to improving the intelligence and efficiency of testing cable length.

[0134] The above is a detailed introduction to the cable testing device and cable tester based on TDC length measurement and remote pairing disclosed in the embodiments of the present invention. Specific embodiments are used in this article to illustrate the principles and implementation methods of the present invention, but the above preferred embodiments are not used to limit the present invention. The description of the above embodiments is only used to help understand the method of the present invention and its core idea; at the same time, for general technical personnel in this field, based on the ideas of the present invention, without departing from the spirit and scope of the present invention, there will be changes in the specific implementation methods and application scopes. Therefore, the scope of protection of the present invention is defined by the claims.

Claims

1. A cable testing device based on TDC length measurement and remote line matching, characterized in that: The device includes a host module and a slave module, wherein the host module includes a first MCU processing module, a signal transmission module, a length measurement management module, and a first line sequence measurement module, and the slave module includes a second MCU processing module, a line search receiving module, and a second line sequence measurement module, wherein: A first end of the first MCU processing module is electrically connected to a first end of the length measurement management module, a second end of the first MCU processing module is electrically connected to a first end of the signal transmission module, a first end of the line group to be tested is electrically connected to a first end of the first line sequence measurement module and a second end of the signal transmission module, a first end of the line search and receiving module is used to electrically connect to a second end of the line group to be tested, a second end of the line search and receiving module is electrically connected to a first end of the second MCU processing module, a first end of the second line sequence measurement module is used to electrically connect to a third end of the line group to be tested, and a second end of the length measurement management module is used to electrically connect to a fourth end of the line group to be tested; The first MCU processing module is configured to send a trigger signal to the length measurement management module and the signal transmission module; The length measurement management module is configured to perform a counting operation based on the trigger signal to obtain a counting result, and write the counting result into a result register; The signal transmitting module is configured to send a line search trigger signal to the line group to be tested based on the trigger signal; The first line sequence measurement module is used to measure a target resistance value corresponding to the line group to be measured, and determine a target voltage based on the target resistance value; The line search receiving module is configured to perform a line search operation based on the line search trigger signal to obtain a line search result; The second MCU processing module is configured to determine line group search information of the line group to be tested based on the line search trigger signal; wherein the line group search information includes one or more of cable direction information and cable position information of the line group to be tested; A second line sequence measurement module determines a line sequence test result of the line group to be tested based on the target voltage; The first MCU processing module is further configured to read the counting result stored in the result register and generate a cable test result based on the counting result.

2. The cable testing device based on TDC length measurement and remote pairing according to claim 1, characterized in that: The host module further includes a first display module, wherein: The first end of the first display module is electrically connected to the fourth end of the first MCU processing module; The first MCU processing module is further configured to read the counting result of the result register corresponding to the length measurement management module through SPI communication, generate a counting display parameter based on the counting result, and transmit the counting display result to the first display module; The first display module is used to display the counting result.

3. The cable testing device based on TDC length measurement and remote pairing according to claim 1, characterized in that: The auxiliary device module further includes a second display module, wherein: The first end of the second display module is electrically connected to the second end of the second MCU processing module; The second display module is configured to generate and output a display indication signal based on the cable test result.

4. The cable testing device based on TDC length measurement and remote pairing according to claim 3, characterized in that: The auxiliary machine module further includes an audio output module, wherein: The first end of the audio output module is electrically connected to the third end of the second MCU processing module; The audio output module is configured to generate and output an audio indication signal based on the cable test result.

5. The cable testing device based on TDC length measurement and remote pairing according to claim 1, characterized in that: The first MCU processing module includes a target port, a first MOS transistor, a second MOS transistor, and a four-way buffer, wherein: The first end of the target port is electrically connected to the first end of the first MOS transistor, the second end of the target port is electrically connected to the first end of the second MOS transistor, and the first end of the four-way buffer is electrically connected to the second end of the first MOS transistor and the second end of the second MOS transistor respectively.

6. The cable testing device based on TDC length measurement and remote line matching according to claim 1, characterized in that: The first line sequence measurement module includes a first analog switch, a second analog switch, and a target selection circuit, wherein: The third end of the first MCU processing module is electrically connected to the first end of the target selection circuit, the first end of the first analog switch is electrically connected to the second end of the target selection circuit, the first end of the second analog switch is electrically connected to the third end of the target selection circuit, and the fourth end of the target selection circuit is electrically connected to the third end of the line group to be tested.

7. The cable testing device based on TDC length measurement and remote pairing according to claim 1, characterized in that: The length measurement management module includes a target chip, a third analog switch, and a high-speed comparator, wherein: A first end of the third analog switch is electrically connected to a first end of the high-speed comparator, a second end of the high-speed comparator is used to electrically connect to a first end of the target chip, and a first end of the first MCU processing module is electrically connected to a second end of the target chip and a second end of the third analog switch respectively; Wherein, the target chip is the MS1003 chip.

8. The cable testing device based on TDC length measurement and remote line matching according to claim 1, characterized in that: The line-finding receiving module includes a target filter and a target amplifier, wherein: The first end of the target filter is used to electrically connect to the fourth end of the line group to be tested, the second end of the target filter is electrically connected to the first end of the target amplifier, and the second end of the target amplifier is electrically connected to the first end of the second MCU processing module.

9. The cable testing device based on TDC length measurement and remote pairing according to claim 8, characterized in that: The line search receiving module further includes a fourth analog switch, wherein: A first end of the fourth analog switch is electrically connected to the second end of the target filter, and a second end of the fourth analog switch is electrically connected to the first end of the target amplifier.

10. A cable tester, comprising the cable testing device based on TDC length measurement and remote pairing according to any one of claims 1 to 9.

Images