LPDDR chip testing device

Abstract

The utility model discloses an LPDDR chip testing device, which relates to the technical field of LPDDR chip testing, and comprises a testing equipment main body, a display screen is embedded in the upper part of the front surface of the testing equipment main body, a testing cavity is formed in the lower part of the front surface of the testing equipment main body, and the display screen is arranged in the testing cavity. A transparent glass plate communicated with the testing cavity is embedded in the lower portion of the front face of the testing equipment body, a testing head is arranged on the top face of the inner wall of the testing cavity, two sets of testing probes in bilateral symmetry are arranged at the bottom of the testing head, and through grooves communicated with the testing cavity are formed in the two sides of the testing equipment body; the LPDDR chip testing device has the advantages that the conveying belt penetrating through the testing cavity is arranged to convey an LPDDR chip, so that the LPDDR chip is not prone to falling off in the testing process, the testing efficiency is improved, and the testing efficiency is improved. And a large amount of dust cannot enter the test cavity, so that the accuracy of test data is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of LPDDR chip testing, in particular to an LPDDR chip testing device. Background Art

[0002] Low Power Double Data Rate (LPDDR) is a communication standard developed by the US JEDEC Solid State Technology Association for low-power memory, specifically for mobile electronic products.

[0003] After LPDDR chips are produced, they need to be tested using a test device to check whether the circuits inside the pins are complete. However, when testing chips with existing test devices, workers need to manually place the chips under the test probes of the test device, and then operate the probes through the system to complete the test of the pins on the top surface of the chip. This manual chip placement method is not only cumbersome to operate, but also during the process of the workers placing the chips, dust outside the test device may enter the test cavity in large quantities. Once a large amount of dust enters the test cavity, it will cause deviations in the test results. Therefore, a more complete LPDDR chip testing device is needed to solve the above-mentioned problems. Utility Model Content

[0004] The purpose of the utility model is to provide a LPDDR chip testing device.

[0005] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a LPDDR chip testing device, comprising a test device body, a display screen embedded in the upper front of the test device body, a test cavity provided below the front of the test device body, a transparent glass plate connected to the test cavity embedded below the front of the test device body, a test head provided on the top surface of the inner wall of the test cavity, two groups of left-right symmetrical test probes provided on the bottom of the test head, through slots connected to the test cavity provided on both sides of the test device body, horizontal plates fixedly connected on both sides of the test device body below the through slots, a conveyor belt located below the test probes provided in the test cavity, two ends of the conveyor belt respectively passing through the two through slots and respectively mounted on the top surfaces of the two horizontal plates, a placement frame for holding the LPDDR chip fixedly connected to the top surface of the conveyor belt, a clamping structure for fixing the LPDDR chip provided in the placement frame, and the placement frame can be moved from the outside of the test device body to the test cavity through the conveyor belt, and then moved out of the test cavity.

[0006] As a further solution of the present invention: the clamping structure includes telescopic rods, springs and triangular splints. There are two groups of telescopic rods and they are symmetrically fixed to the front and rear sides of the inner wall of the placement frame. There are two triangular splints and they are respectively fixed to the ends of the two groups of telescopic rods that are close to each other. There are multiple springs and they are respectively movably sleeved on the surface of each telescopic rod.

[0007] As a further solution of the present invention: the sides of the two triangular splints close to each other are both inclined, and the sides of the two triangular splints close to each other are both provided with mutually symmetrical grooves, and rubber pads are provided inside the grooves.

[0008] As a further solution of the present invention: two mutually symmetrical pull rods are fixed on the sides of the two triangular splints away from each other, the pull rods pass through the side wall of the placement frame, and a round rod is fixed to one end of the pull rod located outside the placement frame.

[0009] As a further solution of the present invention: a second interception plate is fixedly connected between the two sides of the inner wall of the through slot below the conveyor belt, a first interception plate is fixedly connected between the two sides of the inner wall of the through slot inside the conveyor belt, and a plastic curtain is fixedly connected between the two sides of the inner wall of the through slot above the conveyor belt.

[0010] As a further solution of the present invention: an L-shaped limiting plate is fixedly connected to one side of the two horizontal plates that are away from each other.

[0011] By adopting the above technical solution, compared with the prior art, the beneficial effects of the present invention are:

[0012] The utility model conveys the LPDDR chip by setting a conveyor belt that passes through the test cavity, so that a large amount of dust will not enter the test cavity during the test process, thereby improving the accuracy of the test data. The specific operation is to open the conveyor belt, move the placement frame on the top surface of the conveyor belt to the outside of the test equipment body, then take out the LPDDR chip to be tested, and press it horizontally between the two triangular clamps in the placement frame. As the chip moves downward, the two triangular clamps will move toward the inner wall of the placement frame. When the side of the chip moves into the groove on the side of the triangular clamp, the chip will be unable to continue. Press down, and the staff only needs to release the chip, the triangular clamp will automatically reset under the action of the telescopic rod and the spring, so that the two triangular clamps will clamp the chip in the placement frame, and then open the conveyor belt, move the placement frame to the test cavity, and when the placement frame moves to just below the test probe, close the conveyor belt, then open the test head and test probe to perform current testing on the pins on the top surface of the LPDDR chip in the placement frame. The test data will be transmitted to the display screen. After the test is completed, continue to open the conveyor belt, move the placement frame out of the test cavity, and take out the LPDDR chip in the placement frame.

[0013] Other advantages, objectives and features of the present invention will be described in part in the following description and will be apparent to those skilled in the art based on an examination of the following or may be learned from the practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 This is a schematic diagram of the cross-sectional structure of the utility model;

[0015] Figure 2 This is a schematic structural diagram of the through slot of the utility model from the side;

[0016] Figure 3 This is a schematic diagram of the structure of the placement frame of the utility model from a top view;

[0017] Figure 4 This is a schematic structural diagram of the triangular splint of the utility model from a side view.

[0018] In the figure: 1. Test equipment body; 2. Display screen; 3. Test cavity; 4. Test head; 5. Transparent glass plate; 6. Through slot; 7. Horizontal plate; 8. Conveyor belt; 9. L-shaped limit plate; 10. Placement frame; 11. First intercepting plate; 12. Second intercepting plate; 13. Plastic curtain; 14. Telescopic rod; 15. Spring; 16. Triangular splint; 17. Pull rod; 18. Round rod; 19. Groove; 20. Rubber pad; 21. Test probe. DETAILED DESCRIPTION

[0019] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings. It should be noted that the description of these embodiments is used to help understand the present invention, but does not constitute a limitation of the present invention.

[0020] In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0021] Please see the attached Figure 1 -Attached Figure 4The utility model is a LPDDR chip testing device, comprising a testing device body 1, a display screen 2 is embedded in the upper front of the testing device body 1, a testing cavity 3 is provided below the front of the testing device body 1, a transparent glass plate 5 connected to the testing cavity 3 is embedded in the lower front of the testing device body 1, a testing head 4 is provided on the top surface of the inner wall of the testing cavity 3, two groups of bilaterally symmetrical testing probes 21 are provided at the bottom of the testing head 4, through slots 6 connected to the testing cavity 3 are provided on both sides of the testing device body 1, and the testing device body is provided with a plurality of symmetrical test probes 21. Both sides of the body 1 below the through slot 6 are fixedly connected with horizontal plates 7. A conveyor belt 8 is provided in the test cavity 3 below the test probe 21. The two ends of the conveyor belt 8 pass through the two through slots 6 respectively and are respectively installed on the top surfaces of the two horizontal plates 7. The top surface of the conveyor belt 8 is fixedly connected with a placement frame 10 for holding the LPDDR chip. The placement frame 10 is provided with a clamping structure for fixing the LPDDR chip. The placement frame 10 can be moved from the outside of the test equipment body 1 to the test cavity 3 through the conveyor belt 8, and then moved out of the test cavity 3.

[0022] In one embodiment of the present invention: the clamping structure includes a telescopic rod 14, a spring 15 and a triangular splint 16, there are two groups of telescopic rods 14 and they are symmetrically fixed to the front and back sides of the inner wall of the placement frame 10, there are two triangular splints 16 and they are respectively fixed to the ends of the two groups of telescopic rods 14 that are close to each other, there are multiple springs 15, and they are respectively movably sleeved on the surface of each telescopic rod 14.

[0023] In one embodiment of the present invention, the two triangular splints 16 are inclined on their sides close to each other, and are provided with symmetrical grooves 19 on their sides close to each other, with rubber pads 20 provided inside the grooves 19 .

[0024] In one embodiment of the present invention, two symmetrical pull rods 17 are fixed on the side of the two triangular splints 16 that are away from each other. The pull rods 17 pass through the side wall of the placement frame 10, and a round rod 18 is fixed to the end of the pull rod 17 that is located outside the placement frame 10. The pull rods 17 can move the two triangular splints 16 away from each other, thereby conveniently removing the LPDDR chip in the placement frame 10.

[0025] In one embodiment of the present invention: a second interception plate 12 is fixedly connected between the two sides of the inner wall of the through groove 6 below the conveyor belt 8, a first interception plate 11 is fixedly connected between the two sides of the inner wall of the through groove 6 inside the conveyor belt 8, and a plastic curtain 13 is fixedly connected between the two sides of the inner wall of the through groove 6 above the conveyor belt 8. The first interception plate 11, the second interception plate 12 and the plastic curtain 13 can effectively prevent a large amount of dust from entering the test cavity 3.

[0026] In one embodiment of the present invention, an L-shaped limiting plate 9 is fixedly connected to one side of the two transverse plates 7 that are away from each other. The L-shaped limiting plate 9 can limit the placement frame 10 .

[0027] Working principle:

[0028] First, connect the test equipment body 1 to the power supply, then turn on the conveyor belt 8, move the placement frame 10 on the top surface of the conveyor belt 8 to the outside of the test equipment body 1, then take out the LPDDR chip to be tested, and press it horizontally between the two triangular clamps 16 in the placement frame 10. As the chip moves downward, the two triangular clamps 16 will move toward the inner wall of the placement frame 10. When the side of the chip moves into the groove 19 on the side of the triangular clamp 16, the chip will no longer be able to be pressed down. The staff only needs to release the chip, and the triangular clamp 16 will automatically reset under the action of the telescopic rod 14 and the spring 15, so that the two triangular clamps 16 will clamp the chip firmly. In the placement frame 10, the conveyor belt 8 is then opened, and the placement frame 10 is moved into the test cavity 3. When the placement frame 10 moves to directly below the test probe 21, the conveyor belt 8 is closed. At this time, the test head 4 and the test probe 21 are opened to perform a current test on the pins on the top surface of the LPDDR chip in the placement frame 10. The test data will be transmitted to the display screen 2. After the test is completed, the conveyor belt 8 is continued to be opened, and the placement frame 10 is moved out of the test cavity 3, and the LPDDR chip in the placement frame 10 is taken out. During this process, no large amount of dust will enter the test cavity 3, thereby making the test result more accurate. At this point, the entire workflow is completed.

[0029] The above-mentioned front, back, left, right, up and down are all based on the Figure 1 As a benchmark, according to the person's observation perspective, the side of the device facing the observer is defined as the front, the left side of the observer is defined as the left, and so on.

[0030] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the scope of protection of the present invention.

[0031] It should be noted that the equipment structure and drawings of the present invention mainly describe the principle of the present invention. In terms of the technology of the design principle, the settings of the device's power mechanism, power supply system and control system are not fully described. On the premise that those skilled in the art understand the principle of the above-mentioned utility model, they can clearly know the details of its power mechanism, power supply system and control system. The control method of the application document is automatic control through a controller, and the control circuit of the controller can be realized by simple programming by those skilled in the art.

[0032] The standard parts used can be purchased from the market and can be customized according to the description in the specification and drawings. The specific connection methods of each part adopt conventional means such as mature bolts, rivets, welding, etc. in the existing technology. The machinery, parts and equipment all adopt conventional models in the existing technology, and the components known to technical personnel in this field, their structures and principles can be known to these technical personnel through technical manuals or through conventional experimental methods.

[0033] The embodiments of the present invention are described in detail above with reference to the accompanying drawings, but the present invention is not limited to the described embodiments.

[0034] For those skilled in the art, it is possible to make various changes, modifications, substitutions and variations to these embodiments without departing from the principles and spirit of the present invention, and they still fall within the scope of protection of the present invention.

Claims

1. A LPDDR chip testing device, comprising a testing device body (1), characterized in that: A display screen (2) is embedded above the front of the test device body (1), a test cavity (3) is provided below the front of the test device body (1), a transparent glass plate (5) connected to the test cavity (3) is embedded below the front of the test device body (1), a test head (4) is provided on the top surface of the inner wall of the test cavity (3), two groups of left-right symmetrical test probes (21) are provided at the bottom of the test head (4), through slots (6) connected to the test cavity (3) are provided on both sides of the test device body (1), and both sides of the test device body (1) below the through slot (6) are provided. A transverse plate (7) is fixedly connected, and a conveyor belt (8) is provided in the test cavity (3) and is located below the test probe (21). The two ends of the conveyor belt (8) respectively pass through the two through slots (6) and are respectively installed on the top surfaces of the two transverse plates (7). A placement frame (10) for holding an LPDDR chip is fixedly connected to the top surface of the conveyor belt (8). A clamping structure for fixing the LPDDR chip is provided in the placement frame (10). The placement frame (10) can be moved from the outside of the test device body (1) to the test cavity (3) through the conveyor belt (8), and then moved out of the test cavity (3).

2. The LPDDR chip testing device according to claim 1, wherein: The clamping structure comprises a telescopic rod (14), a spring (15) and a triangular clamp (16). The telescopic rod (14) has two groups and is symmetrically fixed to the front and rear sides of the inner wall of the placement frame (10). The triangular clamp (16) has two groups and is respectively fixed to the ends of the two groups of telescopic rods (14) close to each other. There are multiple springs (15) and they are respectively movably sleeved on the surface of each telescopic rod (14).

3. The LPDDR chip testing device according to claim 2, wherein: The sides of the two triangular splints (16) close to each other are both inclined, and the sides of the two triangular splints (16) close to each other are both provided with mutually symmetrical grooves (19), and rubber pads (20) are arranged inside the grooves (19).

4. The LPDDR chip testing device according to claim 2, wherein: Two mutually symmetrical pull rods (17) are fixed on the sides of the two triangular splints (16) away from each other. The pull rods (17) pass through the side wall of the placement frame (10), and a round rod (18) is fixed to one end of the pull rod (17) located outside the placement frame (10).

5. The LPDDR chip testing device according to claim 1, wherein: A second interception plate (12) is fixedly connected between the two sides of the inner wall of the through slot (6) located below the conveyor belt (8), a first interception plate (11) is fixedly connected between the two sides of the inner wall of the through slot (6) located inside the conveyor belt (8), and a plastic curtain (13) is fixedly connected between the two sides of the inner wall of the through slot (6) located above the conveyor belt (8).

6. The LPDDR chip testing device according to claim 1, wherein: An L-shaped limiting plate (9) is fixedly connected to one side of the two transverse plates (7) that are away from each other.

Images