Reflective film strip testing assembly

Abstract

The utility model relates to a reflective film strip test assembly, which comprises a first laminating piece and a second laminating piece which are oppositely arranged at an interval, and a conductive piece arranged between the first laminating piece and the second laminating piece, and the conductive piece is arranged on the surface, facing the second laminating piece, of the first laminating piece. And at least part of the conductive parts are arranged on the first laminated part at intervals, and intervals for placing the reflective film belts are arranged between the conductive parts and the second laminated part. The reflective film tape testing assembly can be used for testing the insulativity, the safety and the quality stability of the reflective film tape.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of photovoltaic, in particular to a reflective film tape testing assembly. BACKGROUND

[0002] At present, in the photovoltaic industry, in order to improve the efficiency of photovoltaic modules, reflective film tapes are often pasted on the back glass between the cell pieces and the cell strings. The metal reflective layer on the surface of the reflective film tape can reflect light and improve the light utilization rate of the photovoltaic module. The photovoltaic module is often packaged with a low-thickness adhesive film. The solder strip on the cell piece may pierce the adhesive film and then contact the metal reflective layer of the reflective film tape, resulting in power attenuation.

[0003] Therefore, an insulating layer can be added to the surface of the traditional reflective film tape. When the adhesive film is thin and the solder strip pierces the adhesive film, the solder strip will contact the insulating layer on the surface of the reflective film tape, thereby reducing the risk of the solder strip contacting the metal reflective layer. However, there is no method for testing the performance of the reflective film tape with an insulating layer in the prior art. In order to ensure the insulation, safety and quality stability of the reflective film tape, it is necessary to provide a feasible testing method. UTILITY MODEL CONTENT

[0004] Therefore, it is necessary to provide a reflective film tape testing assembly that can test the insulation, safety and quality stability of the reflective film tape.

[0005] The present application provides a reflective film tape testing assembly, which comprises a first laminating piece and a second laminating piece arranged opposite to each other, and a conductive piece arranged between the first laminating piece and the second laminating piece, wherein the conductive piece is arranged on the surface of the first laminating piece facing the second laminating piece.

[0006] The conductive piece is a plurality of conductive pieces, at least part of the conductive pieces are arranged on the first laminating piece, and the conductive pieces and the second laminating piece have a space for placing the reflective film tape.

[0007] In some embodiments, at least part of the surfaces of the conductive pieces are provided with protrusions.

[0008] In some embodiments, the conductive pieces provided with the protrusions on the surfaces are a plurality of conductive pieces, and the conductive pieces provided with the protrusions on the surfaces are arranged on the surface of the first laminating piece facing the second laminating piece.

[0009] In some embodiments, the protrusions are spherical and / or spheroid metal particles.

[0010] In some embodiments, among the conductive members, at least a plurality of the conductive members are wound together.

[0011] In some embodiments, a plurality of the conductive members arranged in a wound manner form a conductive component, and the conductive components are multiple and are spaced apart and arranged on a surface of the first laminate facing the second laminate.

[0012] In some embodiments, each of the conductive members extends along a first direction;

[0013] The reflective film strip extends along a second direction, which is different from the first direction, and each of the conductive elements is in contact with the reflective film strip.

[0014] In some embodiments, a first adhesive film layer is provided on the surface of the first laminate facing the second laminate, and each of the conductive elements is fixed to the surface of the first laminate via the first adhesive film layer.

[0015] In some embodiments, the conductive member includes a cylindrical metal core and a welding layer covering a side surface of the metal core.

[0016] In some embodiments, the diameter of the conductive member is 0.16 mm to 0.35 mm.

[0017] The reflective film test assembly described above can be used to measure reflective film used in the photovoltaic field. During testing, the reflective film can be placed in the gap between a conductive element and a second laminate. It will be understood that the reflective film comprises a substrate structure, a metal reflective layer, and an insulating layer, which are sequentially stacked. When placing the reflective film in the gap between the conductive element and the second laminate, the substrate structure of the reflective film is placed on the second laminate, with the conductive element and the insulating layer of the reflective film in contact. The test assembly, with the reflective film placed, is then laminated between the first and second laminates. After lamination, the resistance between any two conductive elements spaced apart can be measured to characterize the performance of the reflective film. If the resistance between the two conductive elements is not measured, it indicates that the insulating layer of the reflective film is of good insulation performance and was not pierced by the conductive elements during the lamination process. If the resistance between the two conductive elements is measured, it indicates that the insulating layer of the reflective film has been pierced by both conductive elements. The reflective film tape test assembly of the present application can be used to test the insulation, safety and quality stability of the reflective film tape. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 A schematic structural diagram of a reflective film tape test assembly provided in one embodiment of the present application;

[0019] Figure 2 A schematic structural diagram of a reflective film tape is provided for one embodiment of the present application;

[0020] Figure 3 This is a schematic structural diagram of a reflective film tape test assembly provided in one embodiment of the present application.

[0021] Description of Reference Numerals

[0022] 10. First laminate; 20. Second laminate; 30. Conductive member; 31. Raised portion; 40. Reflective film tape; 41. Insulating layer; 42. Metal reflective layer; 43. Structural layer; 44. Base material layer; 45. Adhesive layer. DETAILED DESCRIPTION

[0023] To make the above-mentioned objects, features, and advantages of the present application more clearly understood, the specific embodiments of the present application are described in detail below with reference to the accompanying drawings. The following description sets forth many specific details to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways than those described herein, and those skilled in the art can make similar improvements without violating the scope of the present application. Therefore, the present application is not limited to the specific embodiments disclosed below.

[0024] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this application pertains. The terms used herein in the specification of this application are for the purpose of describing specific embodiments only and are not intended to limit this application. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0025] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0026] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be understood to indicate or imply relative importance or implicitly identify the technical features being referred to. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of such features. In the description of this application, "plurality" means at least two, such as two, three, etc., unless otherwise specifically defined.

[0027] In this application, unless otherwise specified or limited, the terms "installed," "connected," "connect," "fixed," etc. should be understood in a broad sense. For example, they can refer to fixed connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; internal communication between two elements or interaction between two elements, unless otherwise specified. Those skilled in the art will understand the specific meanings of the above terms in this application based on specific circumstances.

[0028] Reference Figure 1 As shown, the present application provides a reflective film tape test assembly, comprising a first laminate 10 and a second laminate 20 disposed relative to each other and spaced apart, and a conductive member 30 disposed between the first laminate 10 and the second laminate 20. The conductive member 30 is disposed on the surface of the first laminate 10 facing the second laminate 20. There are a plurality of conductive members 30, at least some of which are spaced apart on the first laminate 10, and a space is provided between the conductive members 30 and the second laminate 20 for placing the reflective film tape 40.

[0029] The reflective film tape test assembly can be used to measure the reflective film tape 40 in the photovoltaic field. During the test, the reflective film tape 40 can be set at the interval between the conductive member 30 and the second laminate 20. Figure 2 As shown, it can be understood that the reflective film tape 40 includes a substrate structure, a metal reflective layer 42, and an insulating layer 41, which are sequentially stacked. When the reflective film tape 40 is placed in the gap between the conductive element 30 and the second laminate 20, the substrate structure of the reflective film tape 40 is placed on the second laminate 20, and the conductive element 30 and the insulating layer 41 of the reflective film tape 40 are in contact. The test assembly with the reflective film tape 40 is then laminated using the first laminate 10 and the second laminate 20. After lamination, the performance of the reflective film tape 40 can be characterized by testing the resistance between any two spaced conductive elements 30. If the test result of the resistance between the two conductive elements 30 is not measured, it means that the insulating layer of the reflective film tape 40 has good insulation performance and was not pierced by the conductive element 30 during the lamination process. If the test result of the resistance between the two conductive elements 30 is measured, it indicates that the insulating layer of the reflective film tape 40 has been pierced by both conductive elements 30. The reflective film tape testing assembly of the present application can be used to test the insulation, safety and quality stability of the reflective film tape 40 .

[0030] In some embodiments, in the conductive member 30 , a protrusion 31 is provided on the surface of at least a portion of the conductive member 30 .

[0031] After the welding of the welding strip, the surface of the welding strip will partially melt to form a protrusion. By setting a protrusion 31 on the surface of at least part of the conductive part 30, the morphology of the welding strip after welding can be simulated to detect the ability of the insulating layer 41 of the reflective film strip 40 to resist protrusion puncture.

[0032] In some embodiments, there are multiple conductive members 30 with protrusions 31 on their surfaces. The multiple conductive members 30 with protrusions 31 on their surfaces are disposed at intervals on the surface of the first laminate 10 facing the second laminate 20 .

[0033] By placing a reflective film tape 40 between the conductive member 30 and the second laminate 20 and laminating the test assembly with the reflective film tape 40, using the first laminate 10 and the second laminate 20, the state after the welding and lamination of the welding tape can be simulated. Testing the resistance between any two spaced conductive members 30 with raised portions 31 on their surfaces can simulate the ability of the insulating layer 41 of the reflective film tape 40 to resist puncture by the raised portions. If the resistance test result between the two spaced conductive members 30 with raised portions 31 on their surfaces is not measured, it means that the insulating layer of the reflective film tape 40 has good insulation performance and was not punctured by the raised portions during the lamination process. If the resistance test result between the two spaced conductive members 30 with raised portions 31 on their surfaces can be measured, it indicates that the insulating layer 31 of the reflective film tape 40 has been punctured by the raised portions 31.

[0034] In some embodiments, the protrusions 31 are spherical and / or spherical-like metal particles.

[0035] In some embodiments, the protrusions 31 are spherical and / or spherical-like tin particles.

[0036] In some embodiments, among the conductive members 30 , at least a plurality of conductive members 30 are wound together.

[0037] During the ribbon welding process, the ribbon may experience abnormalities such as deviation, rollover, and twisting. The winding arrangement of multiple conductive members 30 can simulate the abnormal morphology that may occur after the ribbon is welded, thereby testing the ability of the insulating layer 41 of the reflective film tape 40 to resist puncture by the abnormal morphology ribbon.

[0038] In some embodiments, a plurality of conductive members 30 arranged in a wound manner form a conductive assembly. The conductive assembly is multiple and is arranged at intervals on the surface of the first laminate 10 facing the second laminate 20.

[0039] By placing the reflective film tape 40 in the gap between the conductive component and the second laminate 20, and laminating the test component after the reflective film tape 40 is placed using the first laminate 10 and the second laminate 20, the state after the welding and lamination of the welding ribbon can be simulated. Testing the resistance value between any two conductive components spaced apart can simulate the ability of the insulating layer 41 of the reflective film tape 40 to resist puncture by welding ribbons with abnormal morphology. If the test result of the resistance value between the two conductive components spaced apart is not measured, it means that the insulating layer of the reflective film tape 40 has good insulation performance and was not punctured by welding ribbons with abnormal morphology during the lamination process. If the test result of the resistance value between the two conductive components spaced apart can be measured, it indicates that the insulating layer 31 of the reflective film tape 40 has been punctured by welding ribbons with abnormal morphology.

[0040] In some embodiments, each conductive element 30 extends along a first direction, and the reflective film strip 40 extends along a second direction that is different from the first direction. Each conductive element 30 contacts the reflective film strip 40 .

[0041] It can be understood that, each conductive member 30 extending along the first direction means that the conductive member 30 without the protrusion 31 on the surface, the conductive member 30 with the protrusion 31 on the surface, and the conductive assembly all extend along the first direction. Figure 3 As shown, exemplary, Figure 3 The X direction is the first direction, and the Y direction is the second direction. The reflective tape 40 extends in a second direction different from the first direction, so that the reflective tape 40 can simultaneously contact the conductive member 30 without the protrusions 31, the conductive member 30 with the protrusions 31, and the conductive assembly, facilitating simultaneous testing of the laminated reflective tape 40 under various conditions.

[0042] In some embodiments, the second direction is perpendicular to the first direction.

[0043] In some embodiments, a first adhesive film layer is provided on the surface of the first laminate 10 facing the second laminate 20 , and each conductive element 30 is fixed to the surface of the first laminate 10 via the first adhesive film layer.

[0044] In some embodiments, a second adhesive film layer is disposed on the surface of the insulating layer 41 away from the metal reflective layer 42 , and each conductive element 30 is fixed to the surface of the insulating layer 41 via the second adhesive film layer.

[0045] In some embodiments, the conductive member 30 includes a cylindrical metal core and a solder layer covering a side surface of the metal core.

[0046] In some embodiments, the conductive member 30 is a welding ribbon for connecting different battery cells by welding.

[0047] In some embodiments, the metal core is a copper metal core.

[0048] In some embodiments, the solder layer is a tin layer.

[0049] In some embodiments, the diameter of the conductive member 30 is 0.16mm-0.35mm.

[0050] Optionally, the diameter of the conductive member 30 is 0.16mm, 0.17mm, 0.18mm, 0.19mm, 0.2mm, 0.21mm, 0.22mm, 0.23mm, 0.24mm, 0.25mm, 0.26mm, 0.27mm, 0.28mm, 0.29mm, 0.3mm, 0.31mm, 0.32mm, 0.33mm, 0.34mm or 0.35mm. Alternatively, the diameter of the conductive member 30 can also be within a range between any two diameters mentioned above.

[0051] Referring again to Figure 2 As shown in the drawings, another embodiment of the present application provides a reflective film tape 40, which comprises a substrate structure, a metal reflective layer 42 and an insulating layer 41 which are sequentially stacked. The reflective film tape 40 can be used to test the performance of the reflective film tape 40 by any one of the reflective film tape test assemblies.

[0052] In some embodiments, the metal reflective layer 42 is an aluminum metal reflective layer 42.

[0053] In some embodiments, the substrate structure comprises a structure layer 43, a base material layer 44 and an adhesive layer 45 which are sequentially stacked, and the metal reflective layer 42 is disposed on a surface of the structure layer 43 away from the base material layer 44.

[0054] In some embodiments, the surface of the structure layer 43 away from the base material layer 44 has a concave-convex structure, and the metal reflective layer 42 covers the concave-convex structure.

[0055] Any combination of the technical features of the above-mentioned embodiments can be made. In order to make the description simple, all possible combinations of the technical features in the above-mentioned embodiments are not described, however, as long as the combination of the technical features does not exist, it should be considered as the scope of the present application.

[0056] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent. It should be noted that a person skilled in the art could make various modifications and improvements without departing from the spirit of the present application, all of which fall within the scope of protection of the present application. Therefore, the scope of protection of the patent in this application shall be based on the appended claims, and the specification and drawings may be used to interpret the claims.

Claims

1. A reflective film tape test assembly, characterized in that: The invention comprises a first laminate (10) and a second laminate (20) which are arranged with a relative spacing, and a conductive member (30) arranged between the first laminate (10) and the second laminate (20), wherein the conductive member (30) is arranged on a surface of the first laminate (10) facing the second laminate (20); There are a plurality of conductive members (30), at least some of which are spaced apart on the first laminate (10), and a space for placing a reflective film tape (40) is provided between the conductive members (30) and the second laminate (20).

2. The reflective film tape test assembly according to claim 1, characterized in that: In the conductive member (30), a protrusion (31) is provided on the surface of at least a portion of the conductive member (30).

3. The reflective film tape test assembly according to claim 2, characterized in that: There are a plurality of the conductive members (30) with the protrusions (31) provided on the surface thereof, and the conductive members (30) with the protrusions (31) provided on the surface thereof are spaced apart and arranged on the surface of the first laminate (10) facing the second laminate (20).

4. The reflective film tape test assembly according to claim 2, characterized in that: The protrusions (31) are spherical and / or quasi-spherical metal particles.

5. The reflective film tape test assembly according to claim 3, characterized in that: Among the conductive members (30), at least a plurality of the conductive members (30) are wound and arranged.

6. The reflective film tape test assembly according to claim 5, characterized in that: A plurality of the conductive members (30) arranged in a wound manner form a conductive component. There are a plurality of the conductive components, and the plurality of the conductive components are arranged at intervals on the surface of the first laminate (10) facing the second laminate (20).

7. The reflective film tape test assembly according to claim 6, characterized in that: Each of the conductive members (30) extends along a first direction; The reflective film strip (40) extends along a second direction, which is different from the first direction, and each of the conductive elements (30) is in contact with the reflective film strip (40).

8. The reflective film tape test assembly according to claim 6, characterized in that: A first adhesive film layer is provided on the surface of the first laminate (10) facing the second laminate (20), and each of the conductive elements (30) is fixed to the surface of the first laminate (10) via the first adhesive film layer.

9. The reflective film tape test assembly according to any one of claims 1 to 8, characterized in that: The conductive member (30) comprises a cylindrical metal core and a welding layer covering the side surface of the metal core.

10. The reflective film tape test assembly according to claim 9, characterized in that: The diameter of the conductive member (30) is 0.16 mm to 0.35 mm.

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