Diode pin tension testing device
The diode pin tension test device designed by combining a U-shaped clamping base and an electric push rod solves the problem of low testing efficiency caused by the complex fixation of existing devices, and achieves fast and accurate tension measurement and improved safety.
Patent Information
- Application Number
- CN202421998063.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-08-19
- Publication Date
- 2025-10-28
- Estimated Expiration
- 2034-08-19
AI Technical Summary
The fixing structure of the existing tensile test device is complex, and the diode pin fixing process is cumbersome, resulting in low test efficiency and failure to meet the needs of rapid testing.
A combination design of a U-shaped clamping seat, a pressure plate, an electric push rod and a tension sensor connector is adopted. The electric push rod drives the pressure plate and the U-shaped clamping seat to clamp the diode pin, and the first electric push rod moves the U-shaped clamping seat to apply tension. A transparent cover is used to prevent pin sputtering.
It realizes fast and accurate diode pin pull test, improves test efficiency and safety, reduces error and clamping resistance, and enhances protection effect.
Smart Images

Figure CN223485680U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of diode pin testing technology, specifically a diode pin pull force testing device. Background Technology
[0002] A diode is an electronic device made of semiconductor materials. It was the world's first semiconductor device, consisting of a PN junction, corresponding electrode leads, and a packaged casing. Types of diodes include ordinary diodes, Zener diodes, switching diodes, and light-emitting diodes, and they are widely used in household appliances such as televisions and radios, as well as various electronic instruments and equipment. After the diode is manufactured, it is necessary to check whether the solder pull force on the leads meets the requirements.
[0003] Chinese Patent Publication No. CN218098592U, authorized on December 20, 2022, discloses a lead pull force testing device for diode production. The proposed solution includes a workbench, a driving component, a fixing component, and a pull force sensor mounted on the workbench. The fixing component includes a fastening pull force member and a threaded ring. The fastening pull force member is generally frustum-shaped. The threaded ring is rotatably connected to the outer wall of the fastening pull force member. The fastening pull force member is evenly divided into several segments from the larger diameter end to the smaller diameter end, and the middle part of the fastening pull force member is hollow. This invention, by setting up the fixing component, allows the upper and lower leads of the diode to be inserted into the middle of two sets of fastening pull force members respectively. By rotating the threaded ring, the internal diameter at the port of the fastening pull force member gradually decreases, thereby clamping the diode leads and facilitating the installation and pull force testing of the diode by the operator.
[0004] Existing tensile testing devices have complex fixing structures, and the process of fixing diode pins is cumbersome. They cannot quickly fix diode pins for tensile testing, which reduces testing efficiency and fails to meet usage requirements. Utility Model Content
[0005] The purpose of this invention is to provide a diode pin pull force testing device to solve the problems mentioned in the background art, such as the complex fixing structure of existing pull force testing devices, the cumbersome process of fixing diode pins, the inability to quickly fix diode pins for pull force testing, reduced testing efficiency, and failure to meet usage requirements.
[0006] To achieve the above objectives, this utility model provides the following technical solution: a diode pin pull force testing device, comprising a test platform, a U-shaped clamping seat disposed on the top of the test platform, two U-shaped clamping seats being disposed, a connecting plate disposed on one side of each of the two U-shaped clamping seats, and the connecting plate being fixedly connected to the test platform, a pull force sensor connector disposed on one side of each of the two U-shaped clamping seats, and the pull force sensor connector being fixedly connected to the U-shaped clamping seat, a first electric push rod disposed between the pull force sensor connector and the connecting plate, and the first electric push rod being connected to the pull force sensor connector and the connecting plate by screws, a pressure plate disposed on the inner side of each of the two U-shaped clamping seats, a second electric push rod disposed above the pressure plate, and the second electric push rod being connected to the U-shaped clamping seat and the pressure plate by screws, and an electronic control panel disposed on one side of the test platform, and the electronic control panel being fixedly connected to the test platform.
[0007] Preferably, the upper end of the test platform is provided with a first sliding groove, the inside of the first sliding groove is provided with a first slider, and the first slider is slidably connected to the test platform, and the first slider is fixedly connected to the lower end of the U-shaped clamp.
[0008] Preferably, the lower end of the U-shaped clamp is provided with a ball bearing, and the ball bearing is disposed on both sides of the first slider. The ball bearing contacts the upper end of the test platform, and the ball bearing is in rolling connection with both the test platform and the U-shaped clamp.
[0009] Preferably, the bottom of the U-shaped clamping seat and the lower end of the pressure plate are both provided with rubber pads, and the rubber pads are integrated with the U-shaped clamping seat and the pressure plate. The rubber pads are provided with open grooves.
[0010] Preferably, a second sliding groove is provided on the inner side wall of the U-shaped clamping seat, a second slider is provided on one side of the pressure plate, and the second slider is fixedly connected to the pressure plate. One end of the second slider extends into the interior of the second sliding groove, and the second slider is slidably connected to the U-shaped clamping seat.
[0011] Preferably, the cross-sections of the first slider, the first groove, the second groove, and the second slider are all trapezoidal.
[0012] Preferably, a transparent cover is provided above the test platform, and the transparent cover is L-shaped. A hinge is provided between the transparent cover and the test platform, and the transparent cover and the test platform are rotatably connected by the hinge. An anti-collision strip is provided at one end of the transparent cover, and the anti-collision strip is fixedly connected to the transparent cover.
[0013] Compared with the prior art, the beneficial effects of the present invention are:
[0014] 1. This utility model device comprises a U-shaped clamping seat, a pressure plate, a second electric push rod, a first electric push rod, and a tension sensor connector. The second electric push rod drives the pressure plate to descend, clamping and fixing the two pins of the diode through the U-shaped clamping seat and the pressure plate. Simultaneously, the first electric push rod drives the U-shaped clamping seat to move. As the U-shaped clamping seat moves, a tension force is applied to the pins of the diode. The tension sensor connector measures the tension force applied to the diode pins, and the diode pin tension test is realized based on the measured tension force data.
[0015] 2. The utility model device, through the setting of the transparent cover, can be lowered during testing to wrap the diode under test, preventing the diode pins from being sputtered out when they are pulled off instantly, thus improving testing safety. Attached Figure Description
[0016] Figure 1 It is a schematic diagram of the overall structure of the utility model;
[0017] Figure 2 This is a cross-sectional view of the present invention;
[0018] Figure 3 For the utility model Figure 2 A magnified view of a portion of area A;
[0019] Figure 4 This diagram shows the connection between the U-shaped clamp and the test bench of this utility model.
[0020] In the diagram: 1. Test bench; 2. Electrical control panel; 3. U-shaped clamp; 4. Connecting plate; 5. First electric push rod; 6. First slide groove; 7. Pressure plate; 8. Second electric push rod; 9. Transparent cover; 10. Anti-collision strip; 11. Hinge; 12. Rubber pad; 13. Tension sensor connector; 14. First slider; 15. Second slide groove; 16. Second slider; 17. Opening groove; 18. Ball bearing. Detailed Implementation
[0021] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.
[0022] Please see Figure 1-4This utility model provides an embodiment of a diode pin pull force testing device, including a test platform 1. Two U-shaped clamping seats 3 are provided on the top of the test platform 1. Each U-shaped clamping seat 3 has a connecting plate 4 on one side, and the connecting plate 4 is fixedly connected to the test platform 1. Each U-shaped clamping seat 3 has a pull force sensor connector 13 on one side, and the pull force sensor connector 13 is fixedly connected to the U-shaped clamping seat 3. A first electric push rod 5 is provided between the pull force sensor connector 13 and the connecting plate 4, and the first electric push rod 5 is connected to the pull force sensor connector 13 and the connecting plate 4 by screws. Each U-shaped clamping seat 3 has a pressure plate 7 on its inner side, and a second electric push rod 8 is provided above the pressure plate 7, and the second electric push rod 8 is connected to the U-shaped clamping seat 3 and the pressure plate 7 by screws. An electronic control panel 2 is provided on one side of the test platform 1, and the electronic control panel 2 is fixedly connected to the test platform 1.
[0023] In use: Insert the two leads of the diode into the U-shaped clamp 3, drive the second electric push rod 8 to drive the pressure plate 7 to descend, and clamp and fix the two leads of the diode through the U-shaped clamp 3 and the pressure plate 7. At the same time, drive the first electric push rod 5 to drive the U-shaped clamp 3 to move. As the U-shaped clamp 3 moves, it applies a pulling force to the leads of the diode. The tension sensor connector 13 measures the tension applied to the leads of the diode, and the diode lead tension test is realized based on the measured tension data.
[0024] Please see Figure 1 , Figure 2 and Figure 4 The upper end of the test bench 1 is provided with a first slide groove 6, and the interior of the first slide groove 6 is provided with a first slider 14, which is slidably connected to the test bench 1. The first slider 14 is fixedly connected to the lower end of the U-shaped clamp 3. The lower end of the U-shaped clamp 3 is provided with a ball bearing 18, which is located on both sides of the first slider 14. The ball bearing 18 contacts the upper end of the test bench 1, and is rollably connected to both the test bench 1 and the U-shaped clamp 3. The first slider 14 slides in the first slide groove 6 as the U-shaped clamp 3 moves, guiding the moving U-shaped clamp 3. The ball bearing 18 can not only support the U-shaped clamp 3, but also reduce the moving resistance of the U-shaped clamp 3, reduce the measurement error of the tension sensor connector 13, and improve the test accuracy of the diode pin tension.
[0025] Please see Figure 1 , Figure 2 and Figure 3 Rubber pads 12 are provided at the bottom of the U-shaped clamping seat 3 and the lower end of the pressure plate 7. The rubber pads 12 are integrated with the U-shaped clamping seat 3 and the pressure plate 7. The rubber pads 12 are provided with opening grooves 17. The rubber pads 12 protect the diode pins being clamped. The opening grooves 17 increase the force-bearing area of the diode pins and improve the clamping effect of the diode pins.
[0026] Please see Figure 2 and Figure 3 The inner wall of the U-shaped clamping seat 3 is provided with a second sliding groove 15, and a second slider 16 is provided on one side of the pressure plate 7. The second slider 16 is fixedly connected to the pressure plate 7. One end of the second slider 16 extends into the interior of the second sliding groove 15, and the second slider 16 is slidably connected to the U-shaped clamping seat 3. The cross sections of the first slider 14, the first sliding groove 6, the second sliding groove 15, and the second slider 16 are all trapezoidal. The second slider 16 slides in the second sliding groove 15 as the pressure plate 7 rises and falls, thus guiding the rising and falling pressure plate 7.
[0027] Please see Figure 1 A transparent cover 9 is installed above the test platform 1, and the transparent cover 9 is L-shaped. A hinge 11 is installed between the transparent cover 9 and the test platform 1, and the transparent cover 9 and the test platform 1 are rotatably connected through the hinge 11. An anti-collision strip 10 is installed at one end of the transparent cover 9, and the anti-collision strip 10 is fixedly connected to the transparent cover 9. During the test, the transparent cover 9 is lowered to wrap the diode under test, preventing the diode pin from being sputtered out when it is pulled off instantly, thus improving the test safety.
[0028] Working principle: The two leads of the diode are inserted into the U-shaped clamp 3. The second electric push rod 8 is driven to lower the pressure plate 7. The two leads of the diode are clamped and fixed by the U-shaped clamp 3 and the pressure plate 7. At the same time, the first electric push rod 5 is driven to move the U-shaped clamp 3. As the U-shaped clamp 3 moves, a pulling force is applied to the leads of the diode. The tension sensor connector 13 measures the tension applied to the leads of the diode. The diode lead tension test is realized based on the measured tension data. The rubber pad 12 protects the clamped diode leads. The slot 17 increases the force-bearing area of the diode leads and improves the diode lead clamping effect. During the test, the transparent cover 9 is lowered to wrap the diode under test, preventing the diode leads from being sputtered out when they are pulled off instantly, thus improving the test safety.
[0029] The contents not described in detail in this specification are existing technologies known to those skilled in the art.
[0030] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.
Claims
1. A diode lead pull force testing device, comprising a test stand (1), characterized in that: A U-shaped clamping seat (3) is provided above the test platform (1). There are two U-shaped clamping seats (3). A connecting plate (4) is provided on one side of each of the two U-shaped clamping seats (3), and the connecting plate (4) is fixedly connected to the test platform (1). A tension sensor connector (13) is provided on one side of each of the two U-shaped clamping seats (3), and the tension sensor connector (13) is fixedly connected to the U-shaped clamping seat (3). A space is provided between the tension sensor connector (13) and the connecting plate (4). There is a first electric push rod (5), and the first electric push rod (5) is connected to the tension sensor connector (13) and the connecting plate (4) by screws. The inner sides of the two U-shaped clamps (3) are provided with pressure plates (7). A second electric push rod (8) is provided above the pressure plate (7), and the second electric push rod (8) is connected to the U-shaped clamps (3) and the pressure plate (7) by screws. An electric control panel (2) is provided on one side of the test bench (1), and the electric control panel (2) is fixedly connected to the test bench (1).
2. The diode lead pull force testing device according to claim 1, characterized in that: The upper end of the test bench (1) is provided with a first slide groove (6), and the interior of the first slide groove (6) is provided with a first slider (14), and the first slider (14) is slidably connected to the test bench (1), and the first slider (14) is fixedly connected to the lower end of the U-shaped clamp (3).
3. The diode lead pull force testing device according to claim 1, characterized in that: The lower end of the U-shaped clamp (3) is provided with a ball (18), and the ball (18) is located on both sides of the first slider (14). The ball (18) is in contact with the upper end of the test table (1), and the ball (18) is in rolling connection with both the test table (1) and the U-shaped clamp (3).
4. The diode lead pull force testing device according to claim 1, characterized in that: The bottom of the U-shaped clamping seat (3) and the lower end of the pressure plate (7) are both provided with rubber pads (12), and the rubber pads (12) are connected to the U-shaped clamping seat (3) and the pressure plate (7) as a whole. The rubber pads (12) are provided with opening grooves (17).
5. The diode lead pull-out force testing device according to claim 1, characterized in that: The inner wall of the U-shaped clamping seat (3) is provided with a second sliding groove (15), and a second slider (16) is provided on one side of the pressure plate (7). The second slider (16) is fixedly connected to the pressure plate (7). One end of the second slider (16) extends into the interior of the second sliding groove (15), and the second slider (16) is slidably connected to the U-shaped clamping seat (3).
6. The diode lead pull force testing device according to claim 1, characterized in that: The cross-sections of the first slider (14), the first groove (6), the second groove (15), and the second slider (16) are all trapezoidal.
7. The diode lead pull-out force testing device according to claim 1, characterized in that: A transparent cover (9) is provided above the test platform (1), and the transparent cover (9) is L-shaped. A hinge (11) is provided between the transparent cover (9) and the test platform (1), and the transparent cover (9) and the test platform (1) are rotatably connected by the hinge (11). A collision protection strip (10) is provided at one end of the transparent cover (9), and the collision protection strip (10) is fixedly connected to the transparent cover (9).
Citation Information
Patent Citations
Pin tension testing device for diode production
CN218098592U