Semiconductor reliability test probe

Abstract

The utility model relates to the technical field of semiconductor test probes, and discloses a semiconductor reliability test probe, which comprises a probe body and a first probe head, a second probe head is arranged on the left side of the probe body, the first probe head is arranged on the right side of the probe body, a first fixing seat is fixedly connected to one side of the outside of the probe body, and a second fixing seat is fixedly connected to the other side of the outside of the probe body. A second fixing seat is fixedly connected to the other side of the exterior of the needle body, a second protective sleeve is arranged on the left side of the needle body, and a second connecting seat is fixedly connected to one side of the second fixing seat. According to the semiconductor reliability test probe, the first fixing seat and other parts are arranged, the first protective sleeve is detachably clamped outside the first connecting seat, and the second protective sleeve is detachably clamped outside the second connecting seat, so that when the semiconductor reliability test probe is not used, the first protective sleeve can be clamped outside the first connecting seat to be fixed; and the second protective sleeve is clamped on the second connecting seat to be fixed, so that the needle head can be protected, and the problem that the position of the needle head is inconvenient to protect is solved.

Description

TECHNICAL FIELD

[0001] The utility model relates to a semiconductor test probe technical field, concretely is a semiconductor reliability test probe. BACKGROUND

[0002] Semiconductor refers to the conductivity performance between conductor and insulator at normal temperature, and the conductivity performance of semiconductor can be controlled through external conditions such as temperature, illumination and doping, and semiconductor is widely used in electronic equipment, and semiconductor test probe is the key part of connecting chip, wafer and equipment test, and is mainly used in semiconductor chip design verification, wafer test and finished product test link.

[0003] According to the design of the prior art semiconductor reliability test probe, the position of the needle head is not convenient to protect before use, so that the needle head is prone to wear, and the test quality is affected, therefore, the structure needs to be improved.

[0004] Now, a new type of semiconductor reliability test probe is proposed to solve the above problems. UTILITY MODEL CONTENTS

[0005] The utility model aims at providing a semiconductor reliability test probe to solve the problem of inconvenient protection of the position of the needle head in the background art.

[0006] To achieve the above object, the utility model provides the following technical scheme: a semiconductor reliability test probe, including needle body and first needle head, the left side of needle body is provided with second needle head, the right side of needle body is provided with first needle head, one side of needle body outside is fixedly connected with first fixed seat, the other side of needle body outside is fixedly connected with second fixed seat, the left side of needle body is provided with second protective sleeve, one side of second fixed seat is fixedly connected with second connecting seat, one side of first fixed seat is fixedly connected with first connecting seat, the outside of first needle head is provided with first protective sleeve.

[0007] Preferably, the first protective sleeve is detachably connected to the outside of the first connecting seat, and the second protective sleeve is detachably connected to the outside of the second connecting seat.

[0008] Preferably, the inside of the needle body is provided with a mounting groove, and the first needle head and the second needle head are respectively fixedly connected with a mounting seat on one side, and the mounting seat is detachably embedded in the inside of the mounting groove.

[0009] Preferably, the needle body is provided with a protective sleeve outside, and a magic tape face is fixedly connected to the front end of the protective sleeve outside.

[0010] Preferably, the front end of the protective sleeve is fixedly connected with a Velcro surface, and the Velcro surface is matched with the position of the Velcro surface.

[0011] Preferably, the outer part of the mounting seat is provided with external threads, the inner wall of the mounting groove is provided with internal threads, and the mounting seat is detachably embedded in the inner part of the mounting groove.

[0012] Compared with the prior art, the semiconductor reliability test probe not only realizes the protection of the needle heads on both sides, but also realizes the quick disassembly and replacement of the needle heads.

[0013] By setting the first fixing seat, the first connecting seat, the first protective sleeve, the second fixing seat, the second connecting seat and the second protective sleeve, the first protective sleeve is detachably connected to the outer part of the first connecting seat, and the second protective sleeve is detachably connected to the outer part of the second connecting seat, so that the needle heads can be protected when not in use.

[0014] By setting the needle body, the mounting seat and the mounting groove, the mounting groove is arranged in the inner part of the needle body on both sides, the mounting seat is fixedly connected to one side of the first needle head and the second needle head, and the mounting seat is detachably embedded in the inner part of the mounting groove, so that the mounting seat is provided with external threads and the inner wall of the mounting groove is provided with internal threads, and the two groups of needle heads can be conveniently disassembled.

[0015] By setting the needle body, the protective sleeve, the Velcro surface and the Velcro surface, the protective sleeve is arranged on the outer part of the needle body, the Velcro surface is fixedly connected to the front end of the outer part of the protective sleeve, the Velcro surface is fixedly connected to the front end of the inner part of the protective sleeve, the Velcro surface is matched with the position of the Velcro surface, the Velcro surface is attached to the outer part of the Velcro surface, and the protective sleeve can be conveniently fixed on the outer part of the needle body to avoid scratching when not in use. BRIEF DESCRIPTION OF DRAWINGS

[0016] Figure 1 It is a front view of the sectional structure of the utility model;

[0017] Figure 2 It is a side view of the connection between the first protective sleeve and the first fixing seat of the utility model;

[0018] Figure 3 It is a front view of the connection between the first pillow and the needle body of the utility model;

[0019] Figure 4 It is a front view of the connection between the protective sleeve and the needle body of the utility model.

[0020] In the figure: 1, needle body; 2, protective sleeve; 3, magic tape surface; 4, magic tape hair surface; 5, first fixed seat; 6, first connecting seat; 7, first protective sleeve; 8, first needle; 9, mounting seat; 10, mounting groove; 11, second needle; 12, second fixed seat; 13, second connecting seat; 14, second protective sleeve. DETAILED DESCRIPTION

[0021] The technical solutions in the embodiments of the utility model will be clearly and completely described below with reference to the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the utility model.

[0022] Embodiment 1: please refer to Figures 1-4 A semiconductor reliability test probe, including needle body 1 and first needle 8, the left side of needle body 1 is provided with second needle 11, the right side of needle body is provided with first needle 8, one side of needle body 1 outside is fixedly connected with first fixed seat 5, the other side of needle body 1 outside is fixedly connected with second fixed seat 12, the left side of needle body 1 is provided with second protective sleeve 14, one side of second fixed seat 12 is fixedly connected with second connecting seat 13, one side of first fixed seat 5 is fixedly connected with first connecting seat 6, the outside of first needle 8 is provided with first protective sleeve 7;

[0023] First protective sleeve 7 is detachably clamped on the outside of first connecting seat 6, and second protective sleeve 14 is detachably clamped on the outside of second connecting seat 13;

[0024] Specifically, as shown in Figure 1 And Figure 2 When not in use, first protective sleeve 7 can be clamped on the outside of first connecting seat 6 to be fixed, and second protective sleeve 14 can be clamped on second connecting seat 13 to be fixed, so as to protect the needle.

[0025] Embodiment 2: the inside of needle body 1 on both sides is provided with mounting groove 10, and one side of first needle 8 and second needle 11 is respectively fixedly connected with mounting seat 9, and mounting seat 9 is detachably embedded in the inside of mounting groove 10;

[0026] The outside of mounting seat 9 is provided with external thread, and the inner wall of mounting groove 10 is provided with internal thread, and mounting seat 9 is detachably embedded in the inside of mounting groove 10;

[0027] Specifically, as shown in Figure 1 And Figure 3As shown, the inside of the two sides of the needle body 1 is provided with a mounting groove 10, one side of the first needle 8 and the second needle 11 is fixedly connected with a mounting seat 9, the mounting seat 9 is embedded in the inside of the mounting groove 10 and can be detached, when two groups of needles need to be detached, the outer thread of the mounting seat 9 and the inner thread of the inner wall of the mounting groove 10 can be used to facilitate detachment, so that the needle can be quickly and conveniently detached and replaced.

[0028] As shown in

[0029] The front end of the inside of the protective sleeve 2 is fixedly connected with a magic tape face 3, and the position of the magic tape face 3 coincides with that of the magic tape hair face 4.

[0030] Specifically, as shown in Figure 1 and Figure 4 As shown, the outside of the protective sleeve 2 is provided with a magic tape hair face 4, the inside of the protective sleeve 2 is fixedly connected with a magic tape face 3, and the position of the magic tape face 3 coincides with that of the magic tape hair face 4, so that the magic tape hair face 4 is attached to the outside of the magic tape face 3, and the protective sleeve 2 can be conveniently fixed on the outside of the needle body 1, avoiding scratching on the outside when not in use.

[0031] Working principle: when the utility model is used, first, the inside of the two sides of the needle body 1 is provided with a mounting groove 10, one side of the first needle 8 and the second needle 11 is fixedly connected with a mounting seat 9, the mounting seat 9 is embedded in the inside of the mounting groove 10 and can be detached, when two groups of needles need to be detached, the outer thread of the mounting seat 9 and the inner thread of the inner wall of the mounting groove 10 can be used to facilitate detachment, so that the needle can be quickly and conveniently detached and replaced, then, the outside of the needle body 1 is provided with a protective sleeve 2, the front end of the outside of the protective sleeve 2 is fixedly connected with a magic tape hair face 4, the front end of the inside of the protective sleeve 2 is fixedly connected with a magic tape face 3, and the position of the magic tape face 3 coincides with that of the magic tape hair face 4, so that the magic tape hair face 4 is attached to the outside of the magic tape face 3, and the protective sleeve 2 can be conveniently fixed on the outside of the needle body 1, avoiding scratching on the outside when not in use, finally, the first protective sleeve 7 is detachably clamped on the outside of the first connecting seat 6, and the second protective sleeve 14 is detachably clamped on the outside of the second connecting seat 13, so that the first protective sleeve 7 can be clamped on the outside of the first connecting seat 6 to be fixed, and the second protective sleeve 14 can be clamped on the second connecting seat 13 to be fixed, and the needle can be protected.

[0032] It is apparent for a person skilled in the art that the present application is not restricted to the details of the above exemplary embodiments, but that it can be implemented in other concrete forms without departing from the spirit or the essential characteristics of the present application. Therefore, the embodiments should be considered as exemplary only, and not limiting, the scope of the present application being defined by the appended claims rather than the above description, and all changes coming within the meaning and range of equivalency of the claims are therefore intended to be embraced therein. Any reference signs in the claims should not be construed as limiting the claims concerned.

Claims

1. A semiconductor reliability test probe comprising a needle body (1) and a first needle tip (8), characterized in that: The left side of the needle body (1) is provided with a second needle (11), the right side of the needle body (1) is provided with a first needle (8), one side of the outside of the needle body (1) is fixedly connected with a first fixed seat (5), the other side of the outside of the needle body (1) is fixedly connected with a second fixed seat (12), the left side of the needle body (1) is provided with a second protective sleeve (14), one side of the second fixed seat (12) is fixedly connected with a second connecting seat (13), one side of the first fixed seat (5) is fixedly connected with a first connecting seat (6), the outside of the first needle (8) is provided with a first protective sleeve (7).

2. The semiconductor reliability test probe of claim 1, wherein: The first protective sleeve (7) is detachably clamped on the outside of the first connecting seat (6), and the second protective sleeve (14) is detachably clamped on the outside of the second connecting seat (13).

3. The semiconductor reliability test probe of claim 1, wherein: The inside of the both sides of the needle body (1) is provided with a mounting groove (10), one side of the first needle (8) and the second needle (11) is respectively fixedly connected with a mounting seat (9), and the mounting seat (9) is detachably embedded in the inside of the mounting groove (10).

4. The semiconductor reliability test probe of claim 1, wherein: The outside of the needle body (1) is provided with a protective sleeve (2), and the front end of the outside of the protective sleeve (2) is fixedly connected with a magic tape wool surface (4).

5. The semiconductor reliability test probe of claim 4, wherein: The front end of the inside of the protective sleeve (2) is fixedly connected with a magic tape paste surface (3), and the magic tape paste surface (3) is matched with the position of the magic tape wool surface (4).

6. The semiconductor reliability test probe of claim 3, wherein: The outside of the mounting seat (9) is provided with an external thread, the inner wall of the mounting groove (10) is provided with an internal thread, and the mounting seat (9) is detachably embedded in the inside of the mounting groove (10).

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