Testing device
By using a combination of buffer pressure head and elastic element for fixing, the problems of unreliable fixing and damage of common mode inductors are solved, thereby improving stability and lifespan.
Patent Information
- Application Number
- CN202422884014.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-25
- Publication Date
- 2025-12-02
- Estimated Expiration
- 2034-11-25
AI Technical Summary
The existing common-mode inductor fixing method causes damage to the test fixture board and common-mode inductor structure, affecting the accuracy of test data and the life of the device, and manual pressing is not reliable.
The common mode inductor is pressed to the designated position on the test fixture plate by using a combination of a buffer pressure head and an elastic element for fixing. The buffer pressure head is driven by the pressing rod to press the common mode inductor to the designated position on the test fixture plate. The elastic deformation of the elastic element is used for buffering to achieve flexible pressing.
It improves the user experience and stability, prevents common mode inductor breakage and test fixture damage, and extends the service life of the device.
Smart Images
Figure CN223624264U_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of component testing technology, and in particular to a testing device. Background Technology
[0002] Common-mode inductors, as an ideal common-mode noise suppression solution, are widely used in various industries such as communications, automotive, computers, home appliances, and aerospace. In addition to the inductance and impedance specified in the datasheet, key parameters of common-mode inductors include S-parameters. S-parameters more intuitively reflect the filtering capability of common-mode inductors for both common-mode and differential-mode signals. Measuring the inductance, impedance, and S-parameters of a common-mode inductor requires fixing the inductor to a designated position on a test fixture and connecting the pins of the test fixture to a vector network analyzer.
[0003] Currently, when testing common mode inductors using existing test fixtures, there are generally two ways to fix the common mode inductor at a designated position on the test fixture: the first method is to use soldering to fix the common mode inductor at the designated position on the test fixture; the second method is to manually press the common mode inductor to fix it at the designated position on the test fixture. While both methods described above can secure the common-mode inductor to a designated location on the test fixture, the first method, due to soldering, requires a high temperature of approximately 400°C during replacement. This can lead to issues such as loosening of the copper foil on the test fixture, solder covering the traces, and detachment of the inductor's top and bottom leads. This damage to both the test fixture and the common-mode inductor's structure shortens their lifespan and affects the accuracy of test data. The second method, involving manual pressing, is less secure and prone to poor contact of the common-mode inductor's pads. Therefore, it is necessary to design a new method to secure the common-mode inductor to its designated location on the test fixture. Utility Model Content
[0004] In view of this, it is necessary to provide a testing device that can solve the above-mentioned technical problems.
[0005] To solve the above-mentioned technical problems, this application provides the following technical solution:
[0006] A testing apparatus, comprising:
[0007] The base includes a support platform and a support arm, wherein the support arm is fixedly connected to the support platform;
[0008] The test fixture plate is installed on the support platform;
[0009] A stop bar is provided through the support arm and slidably connected to the support arm. A buffer head is connected to one end of the stop bar facing the support platform, and a limit head is provided on the other end of the stop bar.
[0010] The elastic element is pre-compressed and fitted onto the abutment rod, and abuts against the support arm and the limiting head respectively;
[0011] The pressing rod is rotatably connected to the support arm. The pressing rod can press down the abutment through the limiting head to press and limit the common mode inductor placed on the test fixture plate with the buffer pressure head.
[0012] Understandably, the aforementioned structural design allows operators to press down on the pressure rod to force the buffer head to compress and limit the common-mode inductor to a designated position on the test fixture. During this process, the elastic deformation of the elastic element can be used to buffer the downward pressure of the pressure rod. This improves the operator's experience in controlling the test device, making operation simple and ensuring the stability of the common-mode inductor when fixed in the designated position on the test fixture, while also meeting the requirements for repeated use of the test device. Furthermore, the structural characteristics of the buffer head allow for flexible compression of the common-mode inductor, preventing breakage of the common-mode inductor and damage to the test fixture during compression, thereby extending the service life of the test device.
[0013] In one embodiment, a limiting sleeve is connected to one end of the abutment facing the support platform;
[0014] The buffer head is fixedly installed inside the limiting sleeve and protrudes outward relative to the limiting sleeve in the direction toward the support platform.
[0015] Understandably, the buffer head is mounted on the stop rod via a limiting sleeve, which facilitates the assembly of the buffer head on the stop rod.
[0016] In one embodiment, the limiting sleeve is threadedly connected to the abutment.
[0017] Understandably, the limiting sleeve is connected to the stop rod by a thread, which facilitates the assembly of the limiting sleeve on the stop rod.
[0018] In one embodiment, the buffer head is configured as a rigid sponge.
[0019] Understandably, configuring the buffer inductor as a rigid sponge allows for the use of readily available materials, thus reducing costs. Furthermore, the material properties of the rigid sponge increase the contact area between the buffer inductor and the common mode inductor when the buffer inductor is pressed against it, thereby further improving the stability of the common mode inductor when it is fixed at a designated position on the test fixture board.
[0020] In one embodiment, the support arm has a support sleeve, and the support arm can slide with the abutment through the support sleeve;
[0021] Wherein, one end of the elastic element away from the limiting head abuts against the support sleeve, and the support sleeve can limit the movement stroke of the abutment rod in the support sleeve by the elastic element.
[0022] It is understandable that the maximum compression of the elastic element when it is compressed is used to limit the maximum stroke of the push rod when it moves relative to the support sleeve. This can further prevent the common mode inductor from breaking and the test fixture plate from being damaged due to excessive force during the push rod pressing the common mode inductor.
[0023] In one embodiment, the elastic element is configured as a compression spring.
[0024] It is understandable that configuring the elastic element as a compression spring allows for the use of locally sourced materials, thus reducing costs.
[0025] In one embodiment, the pressing rod is provided with a protrusion, and the pressing rod can press down the limiting head through the protrusion.
[0026] In one embodiment, the bump has an arcuate convex surface, and the bump can press against the limiting head through the arcuate convex surface.
[0027] It is understandable that by utilizing the structural characteristics of the arc-shaped convex surface, the frictional force when the pressing rod and the abutment rod come into contact can be reduced, thereby facilitating the pressing rod's pressing drive on the abutment rod.
[0028] In one embodiment, the support platform is provided with a boss, and the support platform is able to support the test fixture plate through the boss, so that the electrical connectors on the test fixture plate are located on the outside of the boss.
[0029] Understandably, the above structural design prevents damage to electrical connectors when the test fixture is assembled on the support platform.
[0030] In one embodiment, the pressing rod and the support arm are rotatably connected by bolts and nuts.
[0031] Due to the application of the above solution, this application has the following advantages compared with the prior art:
[0032] The testing device claimed in this application, through the aforementioned structural design, allows operators to press down on the pressing rod to drive the buffer head to compress and limit the common-mode inductor to a designated position on the test fixture plate. During this process, the elastic deformation of the elastic element buffers the downward pressure of the pressing rod. This improves the operator's experience in controlling the testing device, making operation simple and ensuring the stability of the common-mode inductor when fixed in the designated position on the test fixture plate, while also meeting the requirements for repeated use of the testing device. Furthermore, the structural characteristics of the buffer head allow for flexible compression of the common-mode inductor, preventing breakage of the common-mode inductor and damage to the test fixture plate during compression, thereby extending the service life of the testing device. Attached Figure Description
[0033] To more clearly illustrate the technical solutions in the embodiments of this application or the conventional technology, the drawings used in the description of the embodiments or the conventional technology will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0034] Figure 1 This is a schematic diagram of the structure of a testing device provided in an embodiment of this application.
[0035] Reference numerals: 100, testing device; 10, base; 11, support platform; 111, boss; 12, support arm; 121, support sleeve; 20, testing fixture plate; 21, electrical connector; 30, push rod; 31, buffer pressure head; 32, limit head; 33, limit sleeve; 40, elastic element; 50, pressing rod; 51, protrusion; 511, arc-shaped convex surface; 60, bolt and nut. Detailed Implementation
[0036] To make the above-mentioned objectives, features, and advantages of this application more apparent and understandable, the specific embodiments of this application are described in detail below with reference to the accompanying drawings. Many specific details are set forth in the following description to provide a thorough understanding of this application. However, this application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar modifications without departing from the spirit of this application. Therefore, this application is not limited to the specific embodiments disclosed below.
[0037] It should be noted that when a component is referred to as being "fixed to" or "set on" another component, it can be directly on the other component or there may be an intermediate component. When a component is considered to be "connected to" another component, it can be directly connected to the other component or there may be an intermediate component present. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used in this application's specification are for illustrative purposes only and do not represent the only possible implementation.
[0038] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, such as two, three, etc., unless otherwise explicitly specified.
[0039] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature and the second feature are in indirect contact through an intermediate medium. Furthermore, "above," "over," and "on top" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.
[0040] Unless otherwise defined, all technical and scientific terms used in this application have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. The term "and / or" as used in this application includes any and all combinations of one or more of the associated listed items.
[0041] like Figure 1As shown, the test apparatus 100 claimed in this application includes a base 10, a test fixture plate 20, a push rod 30, an elastic element 40, and a pressing rod 50. The base 10 includes a support platform 11 and a support arm 12, with the support arm 12 fixedly connected to the support platform 11. The test fixture plate 20 is mounted on the support platform 11. The push rod 30 passes through the support arm 12 and is slidably connected to it. A buffer pressure head 31 is connected to one end of the push rod 30 facing the support platform 11, and a limit head 32 is provided on the other end of the push rod 30. The elastic element 40 is pre-compressed and fitted onto the push rod 30, and abuts against the support arm 12 and the limit head 32 respectively. The pressing rod 50 is rotatably connected to the support arm 12, and the pressing rod 50 can press down on the push rod through the limit head 32 to press and limit the common mode inductor (not shown) placed on the test fixture plate 20 with the buffer pressure head 31. It should be noted that the structural composition of the test fixture 20 and the working principle of how to test the common mode inductance parameters can be achieved using existing conventional methods, and will not be elaborated here.
[0042] It is understood that when the testing device 100 is working, the operator can drive the buffer pressure head 31 to press and limit the common mode inductor to the designated position on the test fixture plate 20 by pressing down the pressing rod 50. During this process, the elastic deformation of the elastic element 40 can be used to buffer the pressing of the pressing rod 50. This improves the operator's experience in operating the testing device 100, making the operation simple and ensuring the stability of the common mode inductor when it is fixed in the designated position on the test fixture plate 20, and meeting the need for repeated use of the testing device 100. On the other hand, the structural characteristics of the buffer pressure head 31 can be used to achieve flexible pressing of the common mode inductor, which can prevent the common mode inductor from breaking and the test fixture plate 20 from being damaged during the pressing process of the buffer pressure head 31, thereby improving the service life of the testing device 100.
[0043] like Figure 1 As shown, in one embodiment, the support platform 11 is provided with a boss 111, and the support platform 11 can support the test fixture plate 20 through the boss 111, so that the electrical connector 21 on the test fixture plate 20 is located on the outside of the boss 111. This can prevent damage to the electrical connector 21 when the test fixture plate 20 is assembled on the support platform 11.
[0044] like Figure 1As shown, in one embodiment, the support arm 12 has a support sleeve 121, and the support arm 12 can slide with the abutment 30 through the support sleeve 121; wherein, the end of the elastic member 40 away from the limiting head 32 abuts against the support sleeve 121, and the support sleeve 121 can limit the movement stroke of the abutment 30 in the support sleeve 121 through the elastic member 40. That is, the maximum compression amount when the elastic member 40 is compressed is used to limit the maximum stroke of the abutment 30 when it moves relative to the support sleeve 121, which can further prevent the common mode inductor from breaking and the test fixture plate 20 from being damaged due to excessive force during the pressing of the abutment 30 against the common mode inductor.
[0045] like Figure 1 As shown, in one embodiment, a limiting sleeve 33 is connected to one end of the abutment 30 facing the support platform 11; a buffer head 31 is fixedly installed inside the limiting sleeve 33 and protrudes outward relative to the limiting sleeve 33 in the direction toward the support platform 11. This facilitates the assembly of the buffer head 31 onto the abutment 30. Here, the buffer head 31 is fixed to the limiting sleeve 33 in a tight fit manner.
[0046] like Figure 1 As shown, in one embodiment, the buffer pressure head 31 is configured as a rigid sponge. Configuring the buffer pressure head 31 as a rigid sponge allows for the use of readily available materials, reducing costs. Furthermore, the material properties of the rigid sponge increase the contact area between the buffer pressure head 31 and the common mode inductor when pressing against it, thus further improving the stability of the common mode inductor when fixed at a designated position on the test fixture plate 20. It is understood that in other embodiments, the buffer pressure head 31 may also be configured as a rubber part or other highly elastic object, which will not be elaborated upon here.
[0047] like Figure 1 As shown, in one embodiment, the limiting sleeve 33 is threaded onto the abutment rod 30. This facilitates the assembly of the limiting sleeve 33 onto the abutment rod 30. It is understood that in other embodiments, the connection method for assembling the limiting sleeve 33 onto the abutment rod 30 may also be snap-fit, welding, adhesive, etc., which will not be elaborated here.
[0048] like Figure 1 As shown, in one embodiment, the elastic element 40 is configured as a compression spring. It is understood that configuring the elastic element 40 as a compression spring allows for the use of readily available materials, thus reducing costs. It is also understood that in other embodiments, the elastic element 40 may be a rubber sleeve or other highly elastic object, which will not be elaborated upon here.
[0049] like Figure 1As shown, in one embodiment, the pressing rod 50 is provided with a protrusion 51, and the pressing rod 50 can press down the limiting head 32 through the protrusion 51.
[0050] like Figure 1 As shown, in one embodiment, the protrusion 51 has an arcuate convex surface 511, and the protrusion 51 can press against the limiting head 32 through the arcuate convex surface 511. Utilizing the structural characteristics of the arcuate convex surface 511, the frictional force when the pressing rod 50 contacts the abutment rod 30 can be reduced, thereby facilitating the pressing drive of the pressing rod 50 on the abutment rod 30.
[0051] like Figure 1 As shown, in one embodiment, the pressing rod 50 and the support arm 12 are rotatably connected by a bolt and nut 60. Here, the bolt passes through the corresponding holes in the support arm 12 and the pressing rod 50, and is secured by the nut. It should be noted that the portion of the bolt located within the pressing rod 50 and the support arm 12 is clearance-fitted with both, thus not affecting the rotation of the pressing rod 50 on the support arm 12. It is understood that in other embodiments, the pressing rod 50 and the support arm 12 can also be hinged using a pin (not shown), as long as the rotatable connection between the pressing rod 50 and the support arm 12 can be satisfied.
[0052] When the testing device 100 of this application is working, the common mode inductor is placed at a designated position on the testing fixture plate 20. The pressing rod 50 is pressed down by hand, causing the pressing rod 50 to press down against the pressing rod 30 and compress the elastic element 40, thereby driving the buffer pressure head 31 to press and limit the common mode inductor to the designated position on the testing fixture plate 20. This can determine the position of the common mode inductor on the testing fixture plate 20 and make the common mode inductor electrically connected to the testing fixture plate 20. In this way, the testing fixture plate 20 can test the parameters of the common mode inductor through an external testing device, and finally realize the detection of the parameters of the common mode inductor. It should be noted that in actual operation, the common mode inductor can be placed at the approximate position of the test fixture plate 20, and the position of the common mode inductor on the test fixture plate 20 can be adjusted based on the position of the pressed rigid sponge until the common mode inductor can be pressed and limited by the rigid sponge; in other embodiments, a specified position can also be marked on the test fixture plate 20 to identify and determine the position of the common mode inductor on the test fixture plate 20.
[0053] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.
[0054] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the scope of protection of this application. Therefore, the patent protection scope of this application should be determined by the appended claims.
Claims
1. A testing device, characterized in that, The testing apparatus (100) includes: The base (10) includes a support platform (11) and a support arm (12), the support arm (12) being fixedly connected to the support platform (11); The test fixture plate (20) is installed on the support platform (11); A stop rod (30) is provided through the support arm (12) and slidably connected to the support arm (12). A buffer pressure head (31) is connected to one end of the stop rod (30) facing the support platform (11). A limit head (32) is provided on the other end of the stop rod (30). The elastic element (40) is pre-compressed and fitted onto the abutment (30), and abuts against the support arm (12) and the limiting head (32) respectively; The pressing rod (50) is rotatably connected to the support arm (12). The pressing rod (50) can press down the abutment rod (30) through the limiting head (32) to press and limit the common mode inductor placed on the test fixture plate (20) with the buffer pressure head (31).
2. The testing apparatus according to claim 1, characterized in that, A limiting sleeve (33) is connected to one end of the abutment (30) facing the support platform (11); The buffer head (31) is fixedly installed inside the limiting sleeve (33) and protrudes outward relative to the limiting sleeve (33) toward the support platform (11).
3. The testing apparatus according to claim 2, characterized in that, The limiting sleeve (33) is threaded onto the abutment (30).
4. The testing apparatus according to claim 2, characterized in that, The buffer head (31) is configured as a rigid sponge.
5. The testing apparatus according to claim 1, characterized in that, The support arm (12) has a support sleeve (121), and the support arm (12) can slide with the abutment (30) through the support sleeve (121); Wherein, one end of the elastic element (40) away from the limiting head (32) abuts against the support sleeve (121), and the support sleeve (121) can limit the movement of the abutment (30) in the support sleeve (121) by the elastic element (40).
6. The testing apparatus according to claim 1, characterized in that, The elastic element (40) is configured as a compression spring.
7. The testing apparatus according to claim 1, characterized in that, The pressing rod (50) is provided with a protrusion (51), and the pressing rod (50) can press down the limiting head (32) through the protrusion (51).
8. The testing apparatus according to claim 7, characterized in that, The protrusion (51) has an arc-shaped convex surface (511), and the protrusion (51) can press against the limiting head (32) through the arc-shaped convex surface (511).
9. The testing apparatus according to claim 1, characterized in that, The support platform (11) is provided with a boss (111), and the support platform (11) can support the test fixture plate (20) through the boss (111), so that the electrical connector (21) on the test fixture plate (20) is located on the outside of the boss (111).
10. The testing apparatus according to claim 1, characterized in that, The pressing rod (50) and the support arm (12) are rotatably connected by bolts and nuts (60).