Low-parasitism high-performance probe card for filter chip test

Abstract

The utility model discloses a low-parasitism high-performance probe card for filter chip testing. The probe card comprises a plurality of groups of first spring needles (2), a plurality of groups of second spring needles (3) and a needle seat (1), a plurality of groups of first needle holes (7) and a plurality of groups of second needle holes (8) are formed in the needle seat (1); the first spring needle (2) and the second spring needle (3) are different in thickness; the multiple groups of first spring needles (2) are arranged in the first needle holes (7) one by one; and the multiple groups of second spring needles (3) are arranged in the multiple groups of second needle holes (8) one by one. According to the low-parasitism high-performance probe card for the filter chip test, the parasitic inductance to the ground of the whole probe card is reduced to a lower level through two types of spring needles, so that the high-frequency characteristic of the probe card is preferably improved.

Description

Technical Field

[0001] This utility model relates to the field of radio frequency filter production and testing, and in particular to a low-parasitic, high-performance probe for testing filter chips. Background Technology

[0002] In the production testing and screening of RF filters, a test probe device is typically used to achieve good contact with the filter under test (DUT) to obtain performance data for batch screening. The screening test results provide crucial information for the use of filter products by end-users, and the accuracy and reliability of these tests are of paramount importance to filter manufacturers.

[0003] In existing technologies, a single probe uses only a spring pin of the same specification. In filter products, this cannot take into account the transmission characteristics of both signal pins and ground pins, resulting in excessive parasitic inductance and affecting the accuracy of the test. Utility Model Content

[0004] This invention specifically provides a low-parasitic, high-performance probe card for testing filter chips.

[0005] The low-parasitic high-performance probe card for filter chip testing provided in this embodiment includes multiple sets of first spring pins (2), multiple sets of second spring pins (3), and a pin seat (1); the pin seat (1) is provided with multiple sets of first pin holes (7) and multiple sets of second pin holes (8); the first spring pins (2) and the second spring pins (3) are of different thicknesses; multiple sets of first spring pins (2) are arranged one by one in the first pin holes (7); multiple sets of second spring pins (3) are arranged one by one in the multiple sets of second pin holes (8).

[0006] Preferably, the diameter of the first spring needle (2) is 120 micrometers.

[0007] Preferably, the diameter of the second spring needle (3) is 230 micrometers.

[0008] Preferably, a second pinhole (8) is provided after every two first pinholes (7) on the pin holder (1).

[0009] Preferably, the needle holder (1) is further provided with two sets of positioning posts (5); the two positioning posts are respectively fixed at two diagonal points of the needle holder (1).

[0010] Preferably, the needle holder (1) is further provided with two sets of positioning holes (4); the two positioning holes (4) are respectively located next to the two positioning posts (5).

[0011] Preferably, an insulating adhesive layer is provided between the inner walls of the first spring needle (2) and the first needle hole (7) and between the inner walls of the second spring needle (3) and the second needle hole (8).

[0012] The low-parasitic, high-performance probe card for filter chip testing provided by this invention reduces the parasitic inductance to ground of the entire probe card to a lower level through two types of spring pins, thereby improving the high-frequency characteristics of the probe card. Attached Figure Description

[0013] Figure 1 This is a schematic diagram of the low-parasitic, high-performance probe card for testing filter chips provided by this utility model.

[0014] Figure 2 This is a schematic diagram of the stage cross-sectional structure of the low-parasitic high-performance probe card for filter chip testing provided by this utility model.

[0015] Figure 3 A schematic cross-sectional view of the needle holder provided in an embodiment of this utility model;

[0016] Figure 4 This is a schematic diagram of the structure of the first spring pin (left) and the second spring pin (right) provided in the embodiment of this utility model. Detailed Implementation

[0017] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, the technical solutions of the embodiments of this utility model will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this utility model, not all embodiments. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0018] like Figures 1-4 As shown, the low-parasitic, high-performance probe card for filter chip testing provided in this embodiment includes multiple sets of first spring pins 2, multiple sets of second spring pins 3, and a pin holder 1. The pin holder 1 has multiple sets of first pin holes 7 and multiple sets of second pin holes 8. The first spring pins 2 and second spring pins 3 have different thicknesses. Each set of first spring pins 2 is disposed within a first pin hole 7; each set of second spring pins 3 is disposed within a second pin hole 8. Those skilled in the art will understand that by using two types of spring pins, the parasitic inductance to ground of the overall probe card is reduced to a lower level, thereby further improving the high-frequency characteristics of the probe card.

[0019] Furthermore, the diameter of the first spring pin 2 is 120 micrometers. Those skilled in the art will understand that the first spring pin 2 is a pogo pin signal pin, which is existing technology in the field and will not be described in detail here. The signal pin uses a fine needle with a diameter of 120 micrometers to achieve a 350-micrometer coaxial structure, realizing a high-frequency coaxial structure of RF ground-signal-ground while ensuring the reliability of signal pin interconnection.

[0020] Furthermore, the diameter of the second spring needle 3 is 230 micrometers. Those skilled in the art will understand that the second spring needle 3 is a grounding spring needle, which is prior art and will not be elaborated upon here. The second spring needle 3 uses a coarse needle with a diameter of 230 micrometers. In actual performance comparisons, the self-inductance of the coarse needle is approximately 0.25 nH, while that of the fine needle is 0.4 nH. By utilizing the low parasitic characteristics of the coarse needle, this application reduces the overall probe's parasitic inductance to ground to below 0.1 nH, further ensuring the high-frequency characteristics of the probe.

[0021] Furthermore, a second pinhole 8 is provided after every two first pinholes 7 on the pin holder 1.

[0022] Furthermore, the needle holder 1 is also provided with two sets of positioning posts 5; the two positioning posts are respectively fixed at two diagonally opposite positions of the needle holder 1. Those skilled in the art will understand that the positioning posts 5 are used for positioning during the assembly of the needle holder 1.

[0023] Furthermore, the needle holder 1 is also provided with two sets of positioning holes 4; the two positioning holes 4 are respectively located next to the two positioning posts 5.

[0024] Furthermore, an insulating adhesive layer is provided between the inner walls of the first spring needle 2 and the first needle hole 7, and between the inner walls of the second spring needle 3 and the second needle hole 8. Those skilled in the art will understand that the needle holder 1 of this application is made of beryllium copper, and a colloid meeting the design specifications is poured into the first needle hole 7 and the second needle hole 8. A spring needle is then inserted into the colloid, and the spring needle is alternately fixed to the needle holder 1.

[0025] Those skilled in the art will understand that by using metal material for the pin holder 1, and by contacting the peripheral printed circuit board circuit and the ground plane of the test machine, the parasitic inductance of the overall probe card is reduced, while the isolation characteristics between each signal pin are enhanced, thereby improving the accuracy and reliability of the test.

[0026] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this utility model, and not to limit it. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of this utility model.

Claims

1. A low-parasitic, high-performance probe for testing filter chips, characterized in that, It includes multiple sets of first spring needles (2), multiple sets of second spring needles (3), and needle base (1); the needle base (1) is provided with multiple sets of first needle holes (7) and multiple sets of second needle holes (8); the first spring needles (2) and the second spring needles (3) are of different thicknesses; the multiple sets of first spring needles (2) are arranged one by one in the first needle hole (7); the multiple sets of second spring needles (3) are arranged one by one in the multiple sets of second needle holes (8).

2. The low-parasitic, high-performance probe for filter chip testing as described in claim 1, characterized in that, The diameter of the first spring needle (2) is 120 micrometers.

3. The low-parasitic, high-performance probe for filter chip testing as described in claim 2, characterized in that, The diameter of the second spring needle (3) is 230 micrometers.

4. The low-parasitic, high-performance probe for filter chip testing as described in claim 3, characterized in that, A second pinhole (8) is provided after every two first pinholes (7) on the pin holder (1).

5. The low-parasitic, high-performance probe for filter chip testing as described in claim 4, characterized in that, The needle holder (1) is also provided with two sets of positioning posts (5); the two positioning posts are respectively fixed at two diagonal points of the needle holder (1).

6. The low-parasitic, high-performance probe for filter chip testing as described in claim 5, characterized in that, The needle holder (1) is also provided with two sets of positioning holes (4); the two positioning holes (4) are respectively located next to the two positioning posts (5).

7. The low-parasitic, high-performance probe for filter chip testing as described in claim 6, characterized in that, An insulating adhesive layer is provided between the inner walls of the first spring needle (2) and the first needle hole (7) and between the inner walls of the second spring needle (3) and the second needle hole (8).

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