IGBT (Insulated Gate Bipolar Translator) test board

By integrating an adjustable inductor module and a data detection module, the limitations of traditional IGBT testing equipment in flexibly adjusting current and voltage are overcome. This enables flexible current and voltage adjustment and data detection of IGBT units, adapting to different model and specification requirements and reducing equipment costs and maintenance complexity.

CN223664725UActive Publication Date: 2025-12-12SHANGHAI ELECTRIC FUJI ELECTRIC POWER TECH CO LTD
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Patent Information

Application Number
CN202423087041.7
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-12-13
Publication Date
2025-12-12
Estimated Expiration
2034-12-13

AI Technical Summary

Technical Problem

Traditional IGBT testing equipment has limitations in flexibly adjusting current and voltage, resulting in inaccurate test parameters and a high risk of damage to IGBT units.

Method used

It adopts an adjustable inductor module and a data detection module. The number of turns and resistance value of the inductor coil are adjusted through a gear set. Combined with real-time detection by current and voltage sensors, it provides flexible current and voltage adjustment and uploads the data to the data analysis platform.

Benefits of technology

It enables flexible current and voltage adjustment of IGBT units, adapting to different model and specification requirements, reducing equipment costs and maintenance complexity, and improving test safety and accuracy.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model provides an IGBT (Insulated Gate Bipolar Translator) test board, which relates to the technical field of semiconductor test and comprises an adjustable inductance module, one side of the adjustable inductance module is connected with a power supply module, and the other side of the adjustable inductance module is connected and installed in a test circuit on the test board and is used for providing adjustable impact current for the test circuit; and the data detection module is arranged on the test board, is connected with the IGBT unit in the test circuit, and is used for detecting current and voltage on the IGBT unit. The beneficial effects are that the IGBT module is installed in the test circuit, the adjustable inductance module is connected between the power supply module and the test circuit, the voltage provided by the power supply module is adjusted through the adjustable inductance module, and the current and voltage supplied to the IGBT unit can be flexibly adjusted; the method is crucial for simulating transient load change possibly encountered by the IGBT in an actual working environment. The test bench can adapt to the test requirements of IGBTs of different models and specifications, and the acquisition cost and maintenance complexity of test equipment are reduced.
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Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of semiconductor testing, especially to an IGBT test board. BACKGROUND

[0002] In the test of semiconductor elements, especially insulated gate bipolar transistors (IGBT), it is often necessary to apply high voltage and high intensity current, which makes the test process itself potentially damage the equipment. Therefore, it is particularly important and indispensable to ensure the absolute safety of the test environment and to escort the entire test process through a device that can accurately and reliably regulate voltage and current.

[0003] Unfortunately, the traditional test device often has certain limitations in design, especially in the flexible adjustment of the current and voltage supplied to the IGBT unit. This deficiency not only limits the accurate setting of test parameters, but also greatly increases the possibility of damage to the IGBT unit due to improper current or voltage in the test link. In view of this, it is particularly urgent to develop or adopt a test system that integrates high-precision control technology and advanced protection mechanisms. SUMMARY

[0004] In view of the problems existing in the prior art, the utility model provides an IGBT test board, which comprises:

[0005] An adjustable inductance module is connected to a power supply module on one side and to a test circuit installed on the test board on the other side, for providing adjustable impact current to the test circuit;

[0006] A data detection module is provided on the test board and connected to the IGBT unit in the test circuit, for detecting the current and voltage on the IGBT unit.

[0007] Preferably, the adjustable inductance module comprises:

[0008] A gear set, wherein a main gear of the gear set is provided with a main inductor coil, and a secondary gear of the gear set is provided with a secondary inductor coil;

[0009] The wires on the main inductor coil and the secondary inductor coil are connected, and the number of turns of the wires on the main inductor coil and the secondary inductor coil is changed by rotating the main gear and the secondary gear to adjust the impact current.

[0010] Preferably, the main magnetic core in the main inductor coil is connected with an adjustable resistor.

[0011] Preferably, the secondary magnetic core in the secondary inductor coil is connected with an adjustable resistor.

[0012] Preferably, the data detection module comprises:

[0013] A current sensor, electrically connected with the IGBT unit, for detecting the current on the IGBT unit;

[0014] A voltage sensor, electrically connected with the IGBT unit, for detecting the voltage on the IGBT unit.

[0015] Preferably, the power supply module is an AC / DC power supply, providing 220V AC or 800V DC.

[0016] Preferably, the data detection module is further connected with an external data analysis platform, and the detected current and voltage on the IGBT unit are uploaded to the data analysis platform.

[0017] The above technical solution has the following advantages or beneficial effects: the IGBT module is installed in the test circuit, the adjustable inductance module is connected between the power supply module and the test circuit, the voltage provided by the power supply module is adjusted through the adjustable inductance module, the current and voltage supplied to the IGBT unit can be flexibly adjusted, which is crucial for simulating the transient load changes that the IGBT may encounter in the actual working environment. The test bench can adapt to the test requirements of IGBTs of different models and specifications, and reduces the purchase cost and maintenance complexity of the test equipment. BRIEF DESCRIPTION OF DRAWINGS

[0018] Figure 1 For the preferred embodiment of the present application, a structure diagram of an IGBT test bench is shown in the figure.

[0019] Figure 2 For the preferred embodiment of the present application, a structure diagram of an adjustable inductance module is shown in the figure. DETAILED DESCRIPTION

[0020] The present application will be described in detail below with reference to the accompanying drawings and specific embodiments. The present application is not limited to this embodiment, as long as it conforms to the spirit of the present application, other embodiments can also belong to the scope of the present application.

[0021] In the preferred embodiment of the present application, based on the above problems existing in the prior art, an IGBT test bench is provided, as shown in the figure, comprising: Figure 1

[0022] An adjustable inductance module 1, one side of the adjustable inductance module 1 is connected with a power supply module 2, and the other side is connected with a test circuit 3 installed on a test bench 10, for providing adjustable impact current to the test circuit 3;

[0023] ​The data detection module 4 is arranged on the test bench 10, is connected with the IGBT unit 31 in the test circuit 3, and is used for detecting the current and voltage on the IGBT unit 31.

[0024] Specifically, the IGBT test bench provided in the embodiment can be provided with the test circuit 3, such as a performance test or a durability test, and the like, the IGBT unit 31 is installed in the test circuit 3, the adjustable inductance module 1 is connected between the power supply module 2 and the test circuit 3, the voltage provided by the power supply module 2 is adjusted through the adjustable inductance module 1, and then the adjustable impulse current is provided for the test circuit 3, which is crucial for simulating the transient load change that the IGBT may encounter in the actual working environment.

[0025] The current and voltage of the IGBT module are detected in real time through the data detection module 4, rich data support is provided for subsequent performance evaluation and fault diagnosis, problems can be quickly located, and the design and use of the IGBT are optimized.

[0026] Due to the high integration and flexibility of the adjustable inductance module 1, the test circuit 3 and the data detection module 4 on the test bench 10, the test bench can adapt to the test requirements of IGBTs of different models and specifications, and the purchase cost and maintenance complexity of test equipment are reduced.

[0027] In the preferred embodiment of the utility model, as shown in Figure 2 The adjustable inductance module 1 comprises:

[0028] A gear set, wherein the main gear 11 of the gear set is provided with the inductance main coil 12, and the auxiliary gear 13 of the gear set is provided with the inductance auxiliary coil 14.

[0029] The wires on the inductance main coil 12 and the inductance auxiliary coil 14 are connected, the number of turns of the wires on the inductance main coil 12 and the inductance auxiliary coil 14 is changed by rotating the main gear 11 and the auxiliary gear 13, and the impulse current is adjusted.

[0030] Specifically, as shown in Figure 2 The number of turns of the wires on the inductance main coil 12 and the inductance auxiliary coil 13 is changed by rotating the main gear 11 and the auxiliary gear 13, and the impulse current is adjusted. The structure is simple, and the adjustment mode is flexible and convenient.

[0031] In the preferred embodiment of the utility model, the main magnetic core in the inductance main coil 12 is connected with an adjustable resistor.

[0032] In the preferred embodiment of the utility model, the auxiliary magnetic core in the inductance auxiliary coil 14 is connected with an adjustable resistor.

[0033] Specifically, in the main magnetic core and the auxiliary magnetic core are connected with a single adjustable resistance, for the main magnetic core / auxiliary magnetic core voltage division, by adjusting the magnetic core to adjust the inductance of the main coil / auxiliary coil inductance value.

[0034] In the preferred embodiment of the utility model, the data detection module 4 comprises:

[0035] The current sensor 41 is electrically connected with the IGBT unit 31 and is used for detecting the current on the IGBT unit 31.

[0036] The voltage sensor 42 is electrically connected with the IGBT unit 31 and is used for detecting the voltage on the IGBT unit 31.

[0037] In the preferred embodiment of the utility model, the power supply module 2 is an AC / DC power supply, which provides 220V AC or 800V DC.

[0038] Specifically, in the embodiment, the power supply can provide stable 220VAC / 800VDC voltage, which meets the voltage requirements of different test currents, so that the test bench can adapt to different models and specifications of IGBT test requirements, and reduces the purchase cost and maintenance complexity of the test equipment.

[0039] In the preferred embodiment of the utility model, the data detection module 4 is also connected with an external data analysis platform 5, and the detected current and voltage on the IGBT unit 31 are uploaded to the data analysis platform 5.

[0040] Specifically, in the embodiment, the data detection module can record the current and voltage data in the test process comprehensively, and upload them to the data analysis platform for deep analysis by the existing analysis software configured in the data analysis platform, so as to more accurately evaluate the performance state.

[0041] The above is only the preferred embodiment of the utility model, and does not limit the implementation and protection scope of the utility model, and those skilled in the art should realize that any equivalent replacement and obvious change obtained by applying the contents of the specification and drawings should be included in the protection scope of the utility model.

Claims

1. An IGBT test bench, characterized by, The utility model relates to a test system for IGBT (Insulated Gate Bipolar Transistor) module, which comprises: an adjustable inductance module, one side of which is connected with a power supply module and the other side of which is connected with a test circuit installed on a test bench, for providing adjustable impact current to the test circuit; a data detection module, which is arranged on the test bench and connected with an IGBT unit in the test circuit, for detecting the current and voltage on the IGBT unit.

2. The IGBT test bench of claim 1, wherein, The adjustable inductance module comprises: a gear set, a main gear of which is provided with a main inductance coil and a secondary gear of which is provided with a secondary inductance coil; the electric wires on the main inductance coil and the secondary inductance coil are connected, and the number of turns of the electric wires on the main inductance coil and the secondary inductance coil is changed by rotating the main gear and the secondary gear, so as to adjust the impact current.

3. The IGBT test bench of claim 2, wherein, A main magnetic core in the main inductance coil is connected with an adjustable resistor.

4. The IGBT test board of claim 2, wherein, A secondary magnetic core in the secondary inductance coil is connected with an adjustable resistor.

5. The IGBT test bench of claim 1, wherein, The data detection module comprises: a current sensor, which is electrically connected with the IGBT unit, for detecting the current on the IGBT unit; a voltage sensor, which is electrically connected with the IGBT unit, for detecting the voltage on the IGBT unit.

6. The IGBT test bench of claim 1, wherein, The power supply module is an AC / DC power supply, which provides 220V AC or 800V DC.

7. The IGBT test bench of claim 1, wherein, The data detection module is further connected with an external data analysis platform, and the detected current and voltage on the IGBT unit are uploaded to the data analysis platform.