Test system of multifunctional optical device
By integrating eye diagram testing, wavelength and SMSR measurement, and power detection into a multifunctional optical device testing system, the problems of complex design and low efficiency in existing optical device testing systems have been solved, achieving high-precision and high-efficiency optical device performance testing.
Patent Information
- Application Number
- CN202520470718.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-14
- Publication Date
- 2026-01-13
- Estimated Expiration
- 2035-03-14
AI Technical Summary
Existing optical device testing systems are complex in design, have limited functionality, and low testing efficiency, making it difficult to meet the high-precision and high-efficiency requirements of the optical communication and optoelectronic fields.
Design a multifunctional optical device testing system that integrates eye diagram testing, wavelength and SMSR measurement, and power detection. It includes components such as a main control module, power supply module, fixtures, integrated testing equipment, spectrometer, and oscilloscope. It features one-click connection, automatic adjustment and testing, and automatic judgment functions to achieve efficient system operation.
It achieves high precision and high efficiency in optical device performance testing, with diverse functions and simple operation, meeting the needs of optical communication and optoelectronic fields.
Smart Images
Figure CN223796240U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of optical device technology, and in particular to a testing system for multifunctional optical devices. Background Technology
[0002] Optical device testing refers to the process of performance testing and quality evaluation of various optical devices. It plays a crucial role in fields such as optical communication, optoelectronics, and medical equipment. Currently, most testing systems for optical emitting devices (TOSAs) are complex in design, have relatively limited testing functions, and suffer from low testing efficiency; therefore, improvements are needed. Utility Model Content
[0003] The purpose of this invention is to provide a multifunctional optical device testing system that integrates eye diagram testing, wavelength and SMSR measurement, and power detection. This system is multifunctional, rationally designed, and easy to operate, and can meet the high-precision and high-efficiency requirements of optical communication, optoelectronics and other fields for optical device performance testing. It is highly practical.
[0004] To achieve the above objectives, the following technical solution is adopted:
[0005] A multifunctional optical device testing system includes a main control module, a power supply module, a fixture, an integrated testing device, a spectrometer, and an oscilloscope. The fixture holds the optical device to be tested and a TEC (Technology, Energy, and Device) component. The integrated testing device is connected to the main control module and includes a test enclosure, a power meter, a line demultiplexer, and an optical switch installed within the enclosure. The line demultiplexer has one input interface and four output interfaces, and the optical device is connected to the input interface of the line demultiplexer. The optical switch has a first output interface, a second output interface, a third output interface, and four input interfaces. The four output interfaces of the line demultiplexer are each connected to one of the input interfaces of the optical switch. The first output interface of the optical switch is connected to the oscilloscope, the second output interface is connected to the spectrometer, and the third output interface is connected to the power meter. The oscilloscope and spectrometer are also connected to the main control module, and the power supply module is connected to both the main control module and the optical device.
[0006] Furthermore, the power supply module includes an electrical switch connected to the main control module, an adapter board connected to the electrical switch, and an EVB board connected to the adapter board; the optical device is connected to the EVB board.
[0007] Furthermore, the test system for the multifunctional optical device also includes a bit error rate tester; the bit error rate tester is connected between the oscilloscope and the EVB board; the bit error rate tester is also connected to the main control module.
[0008] Furthermore, the test system for the multifunctional optical device also includes a variable optical attenuator; the first output interface of the optical switch is connected to an oscilloscope via the variable optical attenuator.
[0009] Furthermore, the test system for the multifunctional optical device also includes a TEC control module connected between the main control module and the TEC component.
[0010] Furthermore, the testing system for the multifunctional optical device also includes a TEC water-cooling module connected to the TEC component.
[0011] By adopting the above solution, the beneficial effects of this utility model are:
[0012] This utility model integrates eye diagram testing, wavelength and SMSR measurement, and power detection of optical devices into one unit. It has multiple functions, is reasonably designed, and is easy to operate. It can meet the high-precision and high-efficiency requirements of optical device performance testing in fields such as optical communication and optoelectronics, and has strong practicality. Attached Figure Description
[0013] Figure 1 This is a schematic diagram of the structure of this utility model;
[0014] Figure 2 This is a schematic diagram of the automatic adjustment process of this utility model;
[0015] The following are explanations of the labels in the attached diagram:
[0016] 1. Power meter; 2. Line demultiplexer; 3. Optical switch. Detailed Implementation
[0017] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.
[0018] Reference Figures 1 to 2As shown, this utility model provides a multifunctional optical device testing system. In one embodiment, it includes a main control module, a power supply module, a fixture, an integrated testing device, a spectrometer, and an oscilloscope. The fixture holds the optical device to be tested and a TEC component. The integrated testing device is connected to the main control module and includes a test housing, and a power meter 1, a line demultiplexer 2, and an optical switch 3 installed inside the test housing. The line demultiplexer 2 has one input interface and four output interfaces, and the optical device is connected to the input interface of the line demultiplexer 2. The optical switch 3 has a first output interface, a second output interface, a third output interface, and four input interfaces. The four output interfaces of the line demultiplexer 2 are respectively connected to one of the input interfaces of the optical switch 3. The first output interface of the optical switch 3 is connected to the oscilloscope, the second output interface of the optical switch 3 is connected to the spectrometer, and the third output interface of the optical switch 3 is connected to the power meter 1. The oscilloscope and the spectrometer are also connected to the main control module, and the power supply module is connected to the main control module and the optical device.
[0019] Continue to refer to Figure 1 As shown, in this embodiment, the optical device to be tested is a photoelectric emitter (TOSA), whose main function is to convert electrical signals into optical signals; the main control module is used to control and manage the entire system; the oscilloscope is used to evaluate the quality of the laser's emitted signal, i.e., eye diagram testing; the spectrometer is mainly used to monitor the laser's wavelength and common-mode rejection ratio; the integrated test equipment integrates an optical switch 3, a power meter 1, a channel demultiplexer (C-DEMUX), and a line demultiplexer 2 (L-DEMUX), used for optical path switching, optical power detection, and beam splitting, etc.
[0020] Meanwhile, the power supply module includes an electrical switch connected to the main control module, an adapter board connected to the electrical switch, and an EVB board connected to the adapter board; the optical device is connected to the EVB board. Specifically, the electrical switch (PC1267D) is connected to the adapter board via three HDMI cables. The adapter board is connected to the EVB board via FPC and DuPont wires. The EVB board is connected to the optical device via DC FPC and RF FPC. The electrical switch can provide current to the four levels of the EVB board. During testing, each signal can be individually switched on and off (the electrical switch can power the EVB board through the adapter board, and then provide current and EA signals to the four LDs corresponding to the DC and RF FPCs of the device through a crimping method, achieving modulation and power supply).
[0021] Meanwhile, the test system for the multifunctional optical device also includes a bit error rate (BER) meter; the BER meter is connected between the oscilloscope and the EVB board; the BER meter is also connected to the main control module; the test system for the multifunctional optical device also includes a variable optical attenuator; the first output interface of the optical switch 3 is connected to the oscilloscope via the variable optical attenuator. The BER meter is connected to the EVB board via 4 pairs of balanced receivers, totaling 8 RF lines. The EVB board has a built-in CDR for eye diagram template testing. The BER meter can detect the number of bit errors during information transmission to determine the quality of digital transmission. Simultaneously, the output light intensity of the laser can be adjusted via the variable optical attenuator (VOA) to meet the requirements of the test system.
[0022] Furthermore, the testing system for the multifunctional optical device also includes a TEC control module connected between the main control module and the TEC component; the testing system also includes a TEC water-cooling module connected to the TEC component. The TEC control module can detect the temperature status of the device under test to adjust the required testing environment, while the TEC water-cooling module can dissipate heat and cool the optical device.
[0023] In summary, the entire system operates as follows: the optical device under test emits Gaussian light of a specific wavelength through a receptacle, which is then split into four specific wavelengths by an L-DEMUX (line demultiplexer 2). Finally, the light enters an optical switch 3. The first path from the optical switch 3 goes to a VOA (variable optical attenuator) and then to an oscilloscope DCA for eye diagram testing; the second path goes to a spectrometer for wavelength and SMSR measurement; and the third path goes to an optical power meter 1 for power detection.
[0024] In addition, the system also features one-click connection, one-click calibration, automatic debugging, automatic judgment, and automatic data upload functions, specifically:
[0025] One-click connection function: After the system is set up, you only need to configure the communication address in the configuration file for the first time, and then run the automatic search to connect with one click;
[0026] One-click calibration function: One of the optical switches 3 is connected to the optical power meter 1 probe built into the integrated device. Then, the actual optical power is compared with the value obtained by DCA to calculate the insertion loss. This insertion loss will be inherited and used for subsequent materials.
[0027] Automatic adjustment function: Eye diagram adjustment first initializes an experience value, and then follows the steps as follows: Figure 2 The process shown is used for debugging and judgment. For unqualified materials, there will be a manual adjustment and confirmation step to prevent false detection and facilitate timely detection of abnormalities.
[0028] Automatic judgment function: First, a version of SPEC needs to be maintained. After the test is completed, the background will retrieve this configuration file to determine whether the test result is qualified.
[0029] Automatic data upload function: The background will package and save the test results of the spectrometer and DCA to the specified database address.
[0030] Figure 2 The parameters are defined as follows:
[0031] 1) Extinction Ratio: The extinction ratio is a crucial parameter in the measurement of optical communication transmitters, as its magnitude determines the quality of the communication signal. A higher extinction ratio indicates better logic discrimination at the receiver; a lower extinction ratio indicates that the signal is more susceptible to interference, and the system bit error rate will increase. The extinction ratio is defined as the ratio of the statistical average of the "1" level to the "0" level in the eye diagram.
[0032] 2) Eye Diagram Crossing Ratio: This measures the relationship between the crossover point amplitude and the signal "1" and "0" levels. Different crossover ratios transmit different signal levels. A standard signal typically has a crossover ratio of 50%, meaning that "1" and "0" each occupy half of the signal level. To measure this ratio, the statistical method shown below is used. The crossover level is calculated as the average value based on the center window of the vertical statistics at the crossover point. The proportional equation is as follows (where the 1 and 0 levels are averaged by taking the middle 20% of the eye diagram, i.e., converted from 40% to 60%):
[0033] 100 * (cross level - 0 level) / (1 level - 0 level).
[0034] 3) Average Power (PAV): The average power reflected by the eye diagram is the average value of the entire data stream. Unlike eye diagram amplitude measurement, average power is the average value of the histogram; if the data encoding is working properly, the average power should be 50% of the total eye diagram amplitude.
[0035] 4) Eye Diagram Jitter: Eye diagram jitter measures the change in the temporal position of the crossover point. Jitter describes the horizontal fluctuation of a signal, that is, the short-term deviation of the signal at a specific moment from its ideal time position. Jitter quality is one of the most frequently verified items for high-speed signals and is also one of the important measurement parameters, which can effectively verify the drift situation relative to the ideal time.
[0036] 5) Eye Mask Margin: The eye mask margin value indicates the extent to which the eye mask margin can expand, representing the degree of eye mask opening at the optimal sampling point. A distortion-free eye mask should have 100% opening, but real-world eye mask shapes vary greatly in height, width, and speed, resulting in different margin values. A larger margin value indicates a more standard eye mask and better signal quality.
[0037] 6) Post-cursor: When a bit passes through this channel, an output response is obtained, such as c(t) input, y(t) output.
[0038] also, Figure 2 In the code, "No1" indicates that if the first determination is negative, the following loop debugging will be executed; "No2" indicates that if the first adjustment loop fails, the second loop adjustment will be entered; or the third loop ("No3") will be entered directly; "±0.1" indicates the adjustment step, which is to add or subtract 0.1 from the initial value. For example, the loop points of EA are 2.1, 2.0, 1.9, 1.8, 2.3, 2.4, 2.5, 2.6, 2.7, and 2.8, while "±1.1", "±0.4", and "±50" have the same meaning.
[0039] 1) ER adjustment: First, determine whether ER meets the condition under the initial value. If not, execute No1 adjustment. That is, if ER still does not meet the judgment condition after adjusting parameter EA for one cycle, then jump to No3.
[0040] 2) Crossing adjustment: First, determine whether the current Crossing meets the conditions. If not, execute No1 adjustment. That is, after adjusting the Crossing parameter for one cycle, if the Crossing still does not meet the judgment conditions, then jump to No3.
[0041] 3) Mask Margin Adjustment: First, determine whether the current Mask Margin meets the conditions. If it does not meet the conditions, execute No1 adjustment. That is, after adjusting the Post_Cursor parameter for one cycle, if the Mask Margin still does not meet the conditions, jump to No2. That is, after adjusting the Swing parameter for one cycle, if the Mask Margin still does not meet the conditions, jump to No3. Otherwise, start testing.
[0042] The above are merely preferred embodiments of the present utility model and are not intended to limit the present utility model. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.
Claims
1. A test system for multifunctional optical devices, characterized by, The multifunctional optical device testing system comprises a main control module, a power supply module, a clamp, an integrated testing device, an optical spectrum analyzer and an oscilloscope; the clamp is provided with an optical device to be tested and a TEC assembly; the integrated testing device is connected with the main control module, and the integrated testing device comprises a testing box body, a power meter, a line demultiplexer and an optical switch which are arranged in the testing box body; the line demultiplexer is provided with one input interface and four output interfaces, and the optical device is connected with the input interface of the line demultiplexer; the optical switch is provided with a first output interface, a second output interface, a third output interface and four input interfaces; the four output interfaces of the line demultiplexer are connected with the input interfaces of the optical switch respectively; the first output interface of the optical switch is connected with the oscilloscope, the second output interface of the optical switch is connected with the optical spectrum analyzer, and the third output interface of the optical switch is connected with the power meter; the oscilloscope and the optical spectrum analyzer are also connected with the main control module; and the power supply module is connected with the main control module and the optical device.
2. The test system of multi-functional optical devices according to claim 1, characterized in that, The power supply module comprises an electric switch connected with the main control module, a switching plate connected with the electric switch and an EVB plate connected with the switching plate; and the optical device is connected with the EVB plate.
3. The test system of multi-functional optical devices according to claim 2, characterized in that, The multifunctional optical device testing system further comprises a bit error rate tester; the bit error rate tester is connected between the oscilloscope and the EVB plate; and the bit error rate tester is also connected with the main control module.
4. The test system of claim 1, wherein, The multifunctional optical device testing system further comprises a variable optical attenuator; the first output interface of the optical switch is connected with the oscilloscope through the variable optical attenuator.
5. The test system of claim 1, wherein, The multifunctional optical device testing system further comprises a TEC control module connected between the main control module and the TEC assembly.
6. The test system of claim 5, wherein, The multifunctional optical device testing system further comprises a TEC water cooling module connected with the TEC assembly.