Novel motor driving chip batch testing device

Abstract

The utility model discloses a novel motor drive chip batch test device, which relates to the technical field of chip test, and comprises a test board, a support frame, a test board and a chip test seat, the support frame is arranged on the test board, a ball screw is rotatably arranged on the bottom surface of a top plate of the support frame, and the chip test seat is arranged on the top plate of the support frame. One end of the ball screw is directly connected with an output shaft of a motor installed on the supporting frame, a sliding block is installed on a nut of the ball screw, an electric telescopic rod is installed at the bottom of the sliding block, a mounting plate is installed at the bottom of the electric telescopic rod, and a plurality of suction cups are evenly installed on the mounting plate. According to the utility model, through mutual cooperation of the ball screw, the slide block, the electric telescopic rod, the mounting plate, the negative pressure suction combined pipeline and the sucker, motor driving chips can be moved out in a centralized manner, and testing of the next batch of chips is facilitated, so that the efficiency of batch testing of the chips is improved, and the labor intensity of testers is reduced.

Description

Technical Field

[0001] This utility model relates to the field of chip testing technology, specifically a novel batch testing device for motor drive chips. Background Technology

[0002] A motor driver chip is a chip that integrates CMOS control circuitry and DMOS power devices. It is mainly used to form a complete motion control system with the main processor, motor, and incremental encoder. It can drive inductive loads such as DC motors, stepper motors, and relays. The motor driver chip has control signals and enable control terminals, usually using standard TTL logic levels, and has two enable control terminals. Through internally integrated circuit regulation and power amplification functions, this chip can achieve high-performance, multi-microstep, and high-current drive circuits.

[0003] Motor driver chips need to be tested before leaving the factory, and they can only be used if they pass the test. However, when the existing motor driver chips are tested in batches, each motor driver chip needs to be manually removed from the chip test socket after the test is completed. This is undoubtedly more time-consuming and labor-intensive, and will reduce the efficiency of batch testing. Utility Model Content

[0004] The purpose of this invention is to provide a novel batch testing device for motor drive chips to solve the problems mentioned in the background art.

[0005] To achieve the above objectives, this utility model provides the following technical solution:

[0006] A novel batch testing device for motor drive chips includes a test bench, a support frame, a test board, and a chip test socket. The support frame is mounted on the test bench. A ball screw is rotatably mounted on the bottom surface of the top plate of the support frame. One end of the ball screw is directly connected to the output shaft of a motor mounted on the support frame. A slider is mounted on the nut of the ball screw. An electric telescopic rod is mounted at the bottom of the slider. A mounting plate is mounted at the bottom of the electric telescopic rod. Several suction cups are evenly mounted on the mounting plate. The suction cups are interconnected through a negative pressure suction combination pipe located above the mounting plate. A suction pipe is externally connected to the negative pressure suction combination pipe and is connected to a negative pressure suction pump mounted above the support frame. The test board is fixedly mounted on the surface of the test bench.

[0007] As a further embodiment of this utility model: a plurality of chip test slots are evenly provided on the test board, a chip test socket is installed in the chip test slot, an MCU main control chip is installed on the test platform 1, and each chip test socket is connected in series with a 32-channel analog switch installed on the corresponding MCU main control chip through a wire. The 32-channel analog switch is electrically connected to the MCU main control chip through a wire.

[0008] As a further embodiment of this utility model: the negative pressure suction combination pipe includes a first connecting pipe, a second connecting pipe and a tee pipe, the suction cups in the same horizontal row are connected by the first connecting pipe, the first connecting pipe is connected by the second connecting pipe, a tee pipe is installed on the second connecting pipe, and the second connecting pipe is connected to the suction pipe through the tee pipe.

[0009] As a further improvement of this utility model, the top of the slider is slidably connected to the guide rail mounted on the bottom surface of the top plate of the support frame.

[0010] As a further improvement of this utility model, the suction cup and the chip test slot are arranged in a one-to-one correspondence in space.

[0011] As a further improvement of this utility model, a cabinet door is installed on the front of the test bench.

[0012] Compared with the prior art, the beneficial effects of this utility model are:

[0013] 1. This utility model uses a ball screw, slider, electric telescopic rod, mounting plate, negative pressure suction combination pipe and suction cup to work together to centrally remove motor-driven chips, which facilitates the testing of the next batch of chips, thereby improving the efficiency of chip batch testing and reducing the labor intensity of testing personnel.

[0014] 2. This utility model sets up an MCU main control chip and a 32-channel analog switch. The MCU main control chip outputs different signals through the 32-channel analog switch, which can simultaneously control 32 motor drive chips for testing, thereby improving chip testing efficiency and better meeting the needs of mass chip factory testing. Attached Figure Description

[0015] Figure 1 This is a schematic diagram of the overall structure of a novel batch testing device for motor drive chips.

[0016] Figure 2 A novel batch testing device for motor driver chips Figure 1 Top view of the test board.

[0017] Figure 3 A novel batch testing device for motor driver chips Figure 1 A schematic diagram of the combined medium and negative pressure suction pipeline.

[0018] Figure 4 This diagram shows the connection between the MCU main control chip and the 32-channel analog switch in a batch testing device for a novel motor drive chip.

[0019] 1. Test bench; 2. Support frame; 3. Ball screw; 4. Slider; 5. Electric telescopic rod; 6. Mounting plate; 7. Negative pressure suction combination pipe; 701. First connecting pipe; 702. Second connecting pipe; 703. T-connector; 8. Suction cup; 9. Test board; 10. Guide rail; 11. Negative pressure suction pump; 12. Suction pipe; 13. Motor; 14. Chip test slot; 15. Chip test socket; 16. 32-channel analog switch; 17. MCU main control chip; 18. Cabinet door. Detailed Implementation

[0020] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0021] Please see Figure 1 and Figure 3 In this embodiment of the present invention, a novel batch testing device for motor drive chips includes a test bench 1, a support frame 2, a test board 9, and a chip test socket 15. The support frame 2 is mounted on the test bench 1. A ball screw 3 is rotatably mounted on the bottom surface of the top plate of the support frame 2. One end of the ball screw 3 is directly connected to the output shaft of a motor 13 mounted on the support frame 2. A slider 4 is mounted on the nut of the ball screw 3. The top of the slider 4 is slidably connected to a guide rail 10 mounted on the bottom surface of the top plate of the support frame 2. The guide rail 10 allows the slider 4 to move... To maintain stability during operation and reduce or avoid chip shaking during handling, an electric telescopic rod 5 is installed at the bottom of the slider 4, and an installation plate 6 is installed at the bottom of the electric telescopic rod 5. Several suction cups 8 are evenly installed on the installation plate 6. In this application, 32 suction cups 8 are used. The suction cups 8 are interconnected through a negative pressure suction combination pipe 7 set above the installation plate 6. The negative pressure suction combination pipe 7 is connected to a suction pipe 12. The suction pipe 12 is connected to a negative pressure suction pump 11 installed above the support frame 2. A test plate 9 is fixedly installed on the surface of the test bench 1.

[0022] The negative pressure suction combination pipe 7 includes a first connecting pipe 701, a second connecting pipe 702, and a tee pipe 703. Suction cups 8 in the same horizontal row are connected through the first connecting pipe 701. The first connecting pipe 701 is connected through the second connecting pipe 702. A tee pipe 703 is installed on the second connecting pipe 702. The second connecting pipe 702 is connected to the suction pipe 12 through the tee pipe 703. The negative pressure suction combination pipe 7 can connect 32 suction cups 8 to each other and all of them are connected to the suction pipe 12, so that each suction cup 8 can be used normally.

[0023] Please see Figure 2 and Figure 4 The test board 9 has several chip test slots 14 evenly spaced, and chip test sockets 15 are installed in the chip test slots 14. The chip test sockets 15 are existing mature products, and there are VQFN packaged test sockets and SOP packaged test sockets on the market. The test platform 1 is equipped with an MCU main control chip 17. Each chip test socket 15 is connected in series with a 32-channel analog switch 16 installed on the corresponding MCU main control chip 17 through wires. The 32-channel analog switch 16 is model ADG726BSUZ. The 32-channel analog switch 16 is electrically connected to the MCU main control chip 17 through wires. The MCU main control chip 17 is model STM32F407ZGT6.

[0024] The suction cup 8 and the chip test slot 14 are arranged in a one-to-one correspondence in space, which ensures that each chip can be sucked out of the chip test socket 15.

[0025] The front of the test bench 1 is equipped with a cabinet door 18. The cabinet door 18 allows the interior of the test bench 1 to be used for storing items, enriching the functionality of the device and making it more practical.

[0026] The working principle of this utility model is as follows:

[0027] In use, the motor driver chips to be tested in batches are first placed into the chip test sockets 15 in sequence, so that the motor driver chips are electrically connected to the chip test sockets 15. Then, the MCU main control chip 17 outputs different signals through the connection of each 32-channel analog switch 16, so that 32 motor driver chips can be controlled simultaneously for batch testing. After the test is completed, the electric telescopic rod 5 is activated. The electric telescopic rod 5 extends and moves the mounting plate 6 downward until each suction cup 8 on the mounting plate 6 contacts the corresponding motor driver chip. Then, the negative pressure suction pump 11 is activated. The negative pressure suction pump 11 pumps the suction into each suction cup 8 through the suction pipe 12 and the negative pressure suction combination pipe 7. Air is drawn in to create negative pressure in each suction cup 8, which holds the motor drive chip in place. Then, the motor 13 drives the ball screw 3 to rotate, which in turn drives the slider 4 to slide along the guide rail 10. This causes the motor drive chips to be moved out of the test board 9. If any chip fails the test, it can be removed first, and the corresponding suction cup 8 can be plugged with a stopper or other material. Then, the other qualified motor drive chips can be moved together. Finally, the negative pressure suction pump 11 is turned off, and the tested drive chips are moved to the next processing station or collection container. This reduces manual labor intensity and improves testing efficiency.

[0028] Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing embodiments or make equivalent substitutions for some of the technical features. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A novel batch testing device for motor drive chips, comprising a test bench (1), a support frame (2), a test board (9), and a chip test socket (15), characterized in that: A support frame (2) is installed on the test bench (1). A ball screw (3) is rotatably installed on the bottom surface of the top plate of the support frame (2). One end of the ball screw (3) is directly connected to the output shaft of the motor (13) installed on the support frame (2). A slider (4) is installed on the nut of the ball screw (3). An electric telescopic rod (5) is installed at the bottom of the slider (4). An installation plate (6) is installed at the bottom of the electric telescopic rod (5). Several suction cups (8) are evenly installed on the installation plate (6). The suction cups (8) are connected to each other through a negative pressure suction combination pipe (7) set above the installation plate (6). The negative pressure suction combination pipe (7) is connected to a suction pipe (12). The suction pipe (12) is connected to a negative pressure suction pump (11) installed above the support frame (2). A test plate (9) is fixedly installed on the surface of the test bench (1).

2. The novel batch testing device for motor driver chips according to claim 1, characterized in that: The test board (9) has a number of chip test slots (14) evenly distributed. A chip test socket (15) is installed in the chip test slot (14). An MCU main control chip (17) is installed on the test platform (1). Each chip test socket (15) is connected in series with a 32-channel analog switch (16) installed on the corresponding MCU main control chip (17) through a wire. The 32-channel analog switch (16) is electrically connected to the MCU main control chip (17) through a wire.

3. The novel batch testing device for motor driver chips according to claim 1, characterized in that: The negative pressure suction combination pipe (7) includes a first connecting pipe (701), a second connecting pipe (702), and a three-way pipe (703). The suction cups (8) in the same horizontal row are connected through the first connecting pipe (701). The first connecting pipe (701) is connected through the second connecting pipe (702). A three-way pipe (703) is installed on the second connecting pipe (702). The second connecting pipe (702) is connected to the suction pipe (12) through the three-way pipe (703).

4. The novel batch testing device for motor driver chips according to claim 1, characterized in that: The top of the slider (4) is slidably connected to the guide rail (10) mounted on the bottom surface of the top plate of the support frame (2).

5. The novel batch testing device for motor driver chips according to claim 1, characterized in that: The suction cup (8) and the chip test slot (14) are arranged in a one-to-one spatial correspondence.

6. The novel batch testing device for motor driver chips according to claim 1, characterized in that: The front of the test bench (1) is equipped with a cabinet door (18).

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