Integrated circuit reliability test equipment
The design of integrated circuit reliability testing equipment solves the problem of insufficient detection of abnormal temperature rise in integrated circuits, realizes real-time monitoring and alarm of temperature changes in integrated circuits, and improves the reliability of testing.
Patent Information
- Application Number
- CN202423264036.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-30
- Publication Date
- 2026-02-10
- Estimated Expiration
- 2034-12-30
AI Technical Summary
Existing technologies cannot effectively detect whether integrated circuits are overheating abnormally during operation, and cannot provide early warnings, resulting in insufficient reliability testing.
An integrated circuit reliability testing device was designed, including a power supply module, a temperature detection module, an over-temperature detection module, a timing control module, a sample-and-hold module, and an alarm module. Through temperature detection, signal storage, and change detection, the device enables real-time monitoring and abnormal alarm of the integrated circuit temperature.
It enables effective detection of temperature changes in integrated circuits, provides timely alarms, and improves the reliability testing capabilities of integrated circuits.
Smart Images
Figure CN223897584U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of integrated circuit testing technology, specifically an integrated circuit reliability testing device. Background Technology
[0002] An integrated circuit (IC) is a circuit that integrates a number of commonly used electronic components, such as resistors, capacitors, and transistors, along with the interconnections between these components, using semiconductor technology to create a circuit with a specific function. To test the reliability of ICs, a temperature sensor is used to monitor the IC's temperature in real time during operation. A comparator is used to trigger an alarm when the temperature exceeds a set threshold. However, this method cannot detect whether the IC's heating process is abnormal or whether an IC is malfunctioning in advance, and therefore needs improvement. Utility Model Content
[0003] This utility model provides an integrated circuit reliability testing device to solve the problems mentioned in the background art.
[0004] To achieve the above objectives, this utility model provides the following technical solution:
[0005] An integrated circuit reliability testing device includes: a power supply module, an integrated circuit module, a temperature detection module, an over-temperature detection module, a timing control module, a sample and hold module, a temperature change detection module, and an alarm module;
[0006] The power supply module is connected to the temperature detection module and the timing control module. It is used to receive AC power and perform step-down, rectification and filtering on the AC power to output first power, perform voltage regulation on the first power and output second power, and transmit the second power to the timing control module when it receives the first control signal output by the temperature detection module.
[0007] An integrated circuit module, connected to the power module, is used to transmit first electrical energy to the connected integrated circuit;
[0008] The temperature detection module is used to receive the second electrical energy and perform temperature detection, output a first temperature signal, and output a first control signal when the first temperature signal is greater than the set temperature threshold.
[0009] An over-temperature detection module, connected to the temperature detection module, is used to set an over-temperature threshold and output a second control signal when the first temperature signal is greater than the over-temperature threshold.
[0010] A timing control module, connected to the temperature detection module, is used to set the sampling time and detection time, and upon receiving the second electrical energy and within the sampling time, outputs a first timing signal and within the detection time, outputs a second timing signal, and the first timing signal and the second timing signal are output cyclically.
[0011] The sampling and holding module is connected to the temperature detection module and the timing control module. When a first timing signal is received, it stores and transmits the first temperature signal. When a second timing signal is received, it holds the stored first temperature signal and outputs the first holding signal.
[0012] A temperature change detection module, connected to the temperature detection module, timing control module and sampling protection module, is used to subtract the first temperature signal and the first hold signal detected in real time. When the subtracted signal is greater than the set difference threshold and a second timing signal is received, a third control signal is output.
[0013] An alarm module, connected to the power supply module, over-temperature detection module, and temperature change detection module, is used to receive a second electrical energy and, upon receiving a second or third control signal, to trigger an alarm for abnormal temperature in the dust collection circuit.
[0014] As a further embodiment of this utility model: the power supply module includes a power interface, a first transformer, a first rectifier, a first voltage regulator, a second capacitor, and a first power transistor; the integrated circuit module includes an integrated circuit interface;
[0015] Preferably, the first and second ends of the power interface are respectively connected to the first and second ends of the primary side of the first transformer, the first and second ends of the secondary side of the first transformer are respectively connected to the first and second ends of the first rectifier, the third end of the first rectifier is connected to the first end of the first voltage regulator and the first end of the integrated circuit interface, and is connected to the fourth end of the first rectifier, the second end of the first voltage regulator, one end of the second capacitor and the ground through the first capacitor, the third end of the first voltage regulator is connected to the other end of the second capacitor and the drain of the first power transistor, the source of the first power transistor is connected to the timing control module, the gate of the first power transistor is connected to the temperature detection module, and the second end of the integrated circuit interface is grounded.
[0016] As a further embodiment of this utility model: the temperature detection module includes a first thermistor, a first resistor, a first comparator, and a first threshold device;
[0017] Preferably, one end of the first thermistor is connected to the third terminal of the first voltage regulator, the other end of the first thermistor is connected to the non-inverting terminal of the first comparator, the over-temperature detection module, the sample-and-hold module and the temperature change detection module and grounded through the first resistor, the inverting terminal of the first comparator is connected to the first threshold device, and the output terminal of the first comparator is connected to the gate of the first power transistor.
[0018] As a further embodiment of this utility model: the sample-and-hold module includes a first operational amplifier, a second resistor, a first analog switch, a third resistor, a third capacitor, and a second operational amplifier;
[0019] Preferably, the non-inverting input of the first operational amplifier is connected to the non-inverting input of the first comparator, the inverting input of the first operational amplifier is connected to the inverting input of the second operational amplifier, the output of the second operational amplifier, and the temperature change detection module through the second resistor, the non-inverting input of the second operational amplifier is connected to the fourth terminal of the first analog switch and grounded in sequence through the third capacitor and the third resistor, the third terminal of the first analog switch is connected to the output of the first operational amplifier, and the fifth terminal of the first analog switch is connected to the timing control module.
[0020] As a further embodiment of this utility model: the temperature change detection module includes a sixth resistor, a fifth resistor, a fourth resistor, a third operational amplifier, a seventh resistor, a first potentiometer, a first diode, and a first logic chip;
[0021] Preferably, the inverting input of the third operational amplifier is connected to one end of the seventh resistor and then connected to the output of the second operational amplifier through the sixth resistor. The non-inverting input of the third operational amplifier is connected to one end of the fourth resistor and then connected to the non-inverting input of the first comparator through the fifth resistor. The other end of the fourth resistor is grounded. The output of the third operational amplifier is connected to the other end of the seventh resistor and one end of the first potentiometer. The other end of the first potentiometer and the slider end are both connected to the cathode of the first diode. The anode of the first diode is connected to the B terminal of the first logic chip. The A terminal of the first logic chip is connected to the timing control module. The Y terminal of the first logic chip is connected to the alarm module.
[0022] As a further embodiment of this utility model: the over-temperature detection module includes a second potentiometer, a second diode, and a third diode; the alarm module includes an eighth resistor, a first speaker, and a first switching transistor;
[0023] Preferably, one end of the second potentiometer is connected to the non-inverting input of the first comparator, the other end of the second potentiometer and the slider end are both connected to the cathode of the second diode, the anode of the second diode is connected to the anode of the third diode, the cathode of the third diode is connected to the base of the first switching transistor and the Y terminal of the first logic chip, the emitter of the first switching transistor is grounded, the collector of the first switching transistor is connected to one end of the first speaker, and the other end of the first speaker is connected to the third terminal of the first voltage regulator through the eighth resistor.
[0024] As a further embodiment of this utility model: the timing control module includes a ninth resistor, a fifth capacitor, a fourth capacitor, a first timer, a fourth diode, a fifth diode, a third potentiometer, a fourth potentiometer, and a first inverter;
[0025] Preferably, the fourth and eighth terminals of the first timer are both connected to the source of the first power transistor and connected to the seventh terminal of the first timer, the anode of the fourth diode, and the cathode of the fifth diode through the ninth resistor. The anode of the fourth diode is connected to one end and the slider end of the third potentiometer, and the anode of the fifth diode is connected to one end and the slider end of the fourth potentiometer. The other end of the third potentiometer is connected to the other end of the fourth potentiometer, the sixth and second terminals of the first timer, and grounded through the fourth capacitor. The fifth terminal of the first timer is connected to the first terminal of the first timer and ground through the fifth capacitor. The third terminal of the first timer is connected to the fifth terminal of the first analog switch and the input terminal of the first inverter. The output terminal of the first inverter is connected to the A terminal of the first logic chip.
[0026] Compared with the prior art, the beneficial effects of this utility model are as follows: The integrated circuit reliability testing equipment of this utility model supplies power to the integrated circuit module by the power supply module, while the temperature detection module performs temperature detection. When the temperature exceeds the set temperature threshold, temperature change detection begins. During the sampling time, the timing control module controls the sample-and-hold module to perform signal storage and sampling transmission processing. After the sampling time ends, the detection time begins. During the detection time, the sample-and-hold module holds the stored signal, and the temperature change detection module judges the degree of temperature change during the detection time. When the degree of temperature change exceeds the set difference threshold or the over-temperature detection module detects over-temperature, the alarm module issues an abnormal temperature change alarm or an over-temperature alarm. This conveniently and effectively detects the degree of temperature change of the integrated circuit, thereby judging the reliability of the integrated circuit. Attached Figure Description
[0027] To more clearly illustrate the technical solutions of the embodiments of this utility model, the drawings used in the description of the embodiments of this utility model will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0028] Figure 1 This is a schematic block diagram of an integrated circuit reliability testing device provided as an example of the present invention.
[0029] Figure 2 A circuit diagram of an integrated circuit reliability testing device provided as an example of this utility model.
[0030] Figure 3 The connection circuit diagram of the timing control module provided for this utility model embodiment. Detailed Implementation
[0031] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.
[0032] In one embodiment, see Figure 1 An integrated circuit reliability testing device includes: a power supply module 1, an integrated circuit module 2, a temperature detection module 3, an over-temperature detection module 4, a timing control module 5, a sample and hold module 6, a temperature change detection module 7, and an alarm module 8.
[0033] Specifically, the power supply module 1 is connected to the temperature detection module 3 and the timing control module 5. It is used to receive AC power and perform step-down and rectification filtering on the AC power to output first power, perform voltage regulation on the first power and output second power, and transmit the second power to the timing control module 5 when it receives the first control signal output by the temperature detection module 3.
[0034] Integrated circuit module 2, connected to the power supply module 1, is used to transmit the first electrical energy to the connected integrated circuit;
[0035] Temperature detection module 3 is used to receive the second electrical energy and perform temperature detection, output a first temperature signal, and output a first control signal when the first temperature signal is greater than the set temperature threshold.
[0036] The over-temperature detection module 4 is connected to the temperature detection module 3 and is used to set an over-temperature threshold and output a second control signal when the first temperature signal is greater than the over-temperature threshold.
[0037] The timing control module 5 is connected to the temperature detection module 3 and is used to set the sampling time and detection time. When the second electrical energy is received and within the sampling time, it outputs a first timing signal and within the detection time, it outputs a second timing signal. The first timing signal and the second timing signal are output cyclically.
[0038] The sampling and holding module 6 is connected to the temperature detection module 3 and the timing control module 5. When a first timing signal is received, it stores and transmits the first temperature signal. When a second timing signal is received, it holds the stored first temperature signal and outputs the first holding signal.
[0039] Temperature change detection module 7 is connected to temperature detection module 3, timing control module 5 and sampling protection module. It is used to subtract the first temperature signal and the first hold signal detected in real time. When the subtracted signal is greater than the set difference threshold and a second timing signal is received, it outputs a third control signal.
[0040] The alarm module 8 is connected to the power module 1, the over-temperature detection module 4, and the temperature change detection module 7. It is used to receive the second electrical energy and to trigger an alarm for abnormal temperature in the dust collection circuit when it receives the second or third control signal.
[0041] In a specific embodiment, the power supply module 1 can be a power circuit composed of a power interface, transformer, rectifier, voltage regulator, etc., which can be connected to AC power, and perform voltage reduction, rectification, and filtering on the AC power, and perform voltage regulation. The integrated circuit module 2 can be an integrated interface circuit composed of an integrated circuit interface, which is connected to the power supply terminal of the integrated circuit. The temperature detection module 3 can be a temperature detection circuit composed of a thermistor, resistor, comparator, etc., which can perform temperature detection and compare the detected temperature signal with the voltage of a set temperature threshold, the temperature threshold being set as needed. The over-temperature detection module 4 can be an over-temperature detection circuit composed of a potentiometer and diode, which sets an over-temperature threshold and detects when the detected temperature signal is greater than the over-temperature threshold. When the temperature changes, it indicates that integrated circuit module 2 has overheated. The timing control module 5 can use a timing control circuit composed of a timer, potentiometer, diode, inverter, etc., which can set the sampling time and detection time. During the sampling time, it will output a first timing signal in a high-level state; during the detection time, it will output a second timing signal in a high-level state. The sampling time and detection time are adjustable. The sample-and-hold module 6 can use a sample-and-hold circuit composed of an operational amplifier, analog switch, capacitor, etc. During the sampling time, it will store and sample the temperature signal for transmission; during the detection time, it will hold the stored signal. The temperature change detection module 7 can use a temperature change detection circuit composed of diodes, operational amplifiers, resistors, etc. It can subtract the input signal and output a high-level signal when the difference is greater than a set difference threshold. Simultaneously, when the second timing signal is received, a third control signal is output. The alarm module 8 can use an alarm circuit composed of a speaker, transistor, and resistor to perform alarm operation.
[0042] In another embodiment, please refer to Figure 1 , Figure 2 and Figure 3 The power module 1 includes a power interface, a first transformer B1, a first rectifier T1, a first voltage regulator IC1, a second capacitor C2, and a first power transistor Q1; the integrated circuit module 2 includes an integrated circuit interface.
[0043] Specifically, the first and second ends of the power interface are respectively connected to the first and second ends of the primary side of the first transformer B1. The first and second ends of the secondary side of the first transformer B1 are respectively connected to the first and second ends of the first rectifier T1. The third end of the first rectifier T1 is connected to the first end of the first voltage regulator IC1 and the first end of the integrated circuit interface, and is connected to the fourth end of the first rectifier T1, the second end of the first voltage regulator IC1, one end of the second capacitor C2 and the ground end through the first capacitor. The third end of the first voltage regulator IC1 is connected to the other end of the second capacitor C2 and the drain of the first power transistor Q1. The source of the first power transistor Q1 is connected to the timing control module 5. The gate of the first power transistor Q1 is connected to the temperature detection module 3. The second end of the integrated circuit interface is grounded.
[0044] In a specific embodiment, the first voltage regulator IC1 can be a 7809 voltage regulator; the first power transistor Q1 can be an N-channel MOSFET.
[0045] Furthermore, the temperature detection module 3 includes a first thermistor NTC, a first resistor R1, a first comparator A1, and a first threshold device;
[0046] Specifically, one end of the first thermistor NTC is connected to the third terminal of the first voltage regulator IC1, and the other end of the first thermistor NTC is connected to the non-inverting terminal of the first comparator A1, the over-temperature detection module 4, the sample and hold module 6 and the temperature change detection module 7 and grounded through the first resistor R1. The inverting terminal of the first comparator A1 is connected to the first threshold device, and the output terminal of the first comparator A1 is connected to the gate of the first power transistor Q1.
[0047] In a specific embodiment, the first thermistor NTC can be a negative temperature coefficient thermistor; the first comparator A1 can be an LM358 comparator; and the first threshold device can be composed of a reference power supply and a resistor to provide a temperature threshold.
[0048] Furthermore, the sample-and-hold module 6 includes a first operational amplifier OP1, a second resistor R2, a first analog switch IC2, a third resistor R3, a third capacitor C3, and a second operational amplifier OP2;
[0049] Specifically, the non-inverting input of the first operational amplifier OP1 is connected to the non-inverting input of the first comparator A1. The inverting input of the first operational amplifier OP1 is connected to the inverting input of the second operational amplifier OP2, the output of the second operational amplifier OP2, and the temperature change detection module 7 through the second resistor R2. The non-inverting input of the second operational amplifier OP2 is connected to the fourth terminal of the first analog switch IC2 and grounded in sequence through the third capacitor C3 and the third resistor R3. The third terminal of the first analog switch IC2 is connected to the output of the first operational amplifier OP1. The fifth terminal of the first analog switch IC2 is connected to the timing control module 5.
[0050] In a specific embodiment, the first operational amplifier OP1 and the second operational amplifier OP2 can both be selected as OP07 operational amplifiers; the first analog switch IC2 can be selected as CD4066; and the third capacitor C3 is used for signal storage.
[0051] Furthermore, the temperature change detection module 7 includes a sixth resistor R6, a fifth resistor R5, a fourth resistor R4, a third operational amplifier OP3, a seventh resistor R7, a first potentiometer RP1, a first diode D1, and a first logic chip J1;
[0052] Specifically, the inverting input of the third operational amplifier OP3 is connected to one end of the seventh resistor R7 and then to the output of the second operational amplifier OP2 via the sixth resistor R6. The non-inverting input of the third operational amplifier OP3 is connected to one end of the fourth resistor R4 and then to the non-inverting input of the first comparator A1 via the fifth resistor R5. The other end of the fourth resistor R4 is grounded. The output of the third operational amplifier OP3 is connected to the other end of the seventh resistor R7 and one end of the first potentiometer RP1. The other end and the slider end of the first potentiometer RP1 are both connected to the cathode of the first diode D1. The anode of the first diode D1 is connected to the B terminal of the first logic chip J1. The A terminal of the first logic chip J1 is connected to the timing control module 5. The Y terminal of the first logic chip J1 is connected to the alarm module 8.
[0053] In a specific embodiment, the third operational amplifier OP3 can be an OP07 operational amplifier; the first logic chip J1 can be an AND gate chip; and the first potentiometer RP1 and the first diode D1 are set with a difference threshold.
[0054] Furthermore, the over-temperature detection module 4 includes a second potentiometer RP2, a second diode D2, and a third diode D3; the alarm module 8 includes an eighth resistor R8, a first speaker BL1, and a first switching transistor V1.
[0055] Specifically, one end of the second potentiometer RP2 is connected to the non-inverting input of the first comparator A1, and the other end of the second potentiometer RP2 and the slider end are both connected to the cathode of the second diode D2. The anode of the second diode D2 is connected to the anode of the third diode D3. The cathode of the third diode D3 is connected to the base of the first switching transistor V1 and the Y terminal of the first logic chip J1. The emitter of the first switching transistor V1 is grounded, and the collector of the first switching transistor V1 is connected to one end of the first speaker BL1. The other end of the first speaker BL1 is connected to the third terminal of the first voltage regulator IC1 through the eighth resistor R8.
[0056] In a specific embodiment, the second potentiometer RP2 and the second diode D2 are set to an over-temperature threshold; the first switching transistor V1 can be an NPN transistor.
[0057] Furthermore, the timing control module 5 includes a ninth resistor R9, a fifth capacitor C5, a fourth capacitor C4, a first timer IC3, a fourth diode D4, a fifth diode D5, a third potentiometer RP3, a fourth potentiometer RP4, and a first inverter INV1;
[0058] Specifically, the fourth and eighth terminals of the first timer IC3 are both connected to the source of the first power transistor Q1 and connected to the seventh terminal of the first timer IC3, the anode of the fourth diode D4, and the cathode of the fifth diode D5 through the ninth resistor R9. The anode of the fourth diode D4 is connected to one end and the slider end of the third potentiometer RP3. The anode of the fifth diode D5 is connected to one end and the slider end of the fourth potentiometer RP4. The other end of the third potentiometer RP3 is connected to the other end of the fourth potentiometer RP4, the sixth and second terminals of the first timer IC3, and grounded through the fourth capacitor C4. The fifth terminal of the first timer IC3 is connected to the first terminal and ground through the fifth capacitor C5. The third terminal of the first timer IC3 is connected to the fifth terminal of the first analog switch IC2 and the input terminal of the first inverter INV1. The output terminal of the first inverter INV1 is connected to the A terminal of the first logic chip J1.
[0059] In a specific embodiment, the first timer IC3 can be an NE555 chip; the first inverter INV1 can be a NOT gate chip; the third potentiometer RP3 and the fourth diode D4 set the sampling time, and the fifth diode D5 and the fourth diode D4 set the detection time.
[0060] In this embodiment of an integrated circuit reliability testing device, AC power is connected via a power interface. A first transformer B1, a first rectifier T1, and a first capacitor perform voltage reduction, rectification, and filtering to output first electrical energy, which powers the integrated circuit connected to the integrated circuit interface. This first electrical energy is then regulated by a first voltage regulator IC1 and a second capacitor C2 to output second electrical energy. A first thermistor NTC and a first resistor R1 sample the temperature and output a first temperature signal. When the first temperature signal exceeds the temperature threshold set by a first threshold device, a first comparator A1 outputs a first control signal and controls the first power transistor Q1 to conduct, energizing the first timer IC3. This timer, in conjunction with a ninth resistor R9, a fourth diode D4, a fifth diode D5, a third potentiometer RP3, a fourth potentiometer RP4, a fourth capacitor C4, and a fifth capacitor C5, begins timing operation. The sampling time is set by the fourth diode D4 and the third potentiometer RP3, and the detection time is set by the fourth potentiometer RP4 and the fifth diode D5. During the sampling time, the third terminal of the first timer IC3 outputs a first timing signal and controls the fifth terminal of the first analog switch IC2 to go high. When the first analog switch IC2 is open, the third and fourth terminals are turned on, the third capacitor C3 stores and samples the signal. During the detection time, the third terminal of the first timer IC3 stops outputting the first timing signal, and the first inverter INV1 outputs the second timing signal. The A terminal of the first logic chip J1 becomes high, the first analog switch IC2 is turned off, the third capacitor C3 holds the signal and outputs the first hold signal. The third operational amplifier OP3, together with the sixth resistor R6, the fifth resistor R5, the fourth resistor R4 and the seventh resistor R7, performs subtraction on the real-time detected first temperature signal and the first hold signal to obtain the first difference signal. When the first difference signal is greater than the difference threshold set by the first potentiometer RP1 and the first diode D1, it indicates that the temperature of the integrated circuit rises rapidly during the detection time, causing the B terminal of the first logic chip J1 to become high. The Y terminal of the first logic chip J1 will control the first switch V1 to turn on. At the same time, if the first temperature signal is greater than the over-temperature threshold set by the second potentiometer RP2 and the second diode D2, it will also control the first switch V1 to turn on, controlling the first speaker BL1 to sound an alarm.
[0061] It will be apparent to those skilled in the art that this invention is not limited to the details of the exemplary embodiments described above, and that it can be implemented in other specific forms without departing from the spirit or essential characteristics of this invention. Therefore, the embodiments should be considered illustrative and non-limiting in all respects, and the scope of this invention is defined by the appended claims rather than the foregoing description. Thus, it is intended that all variations falling within the meaning and scope of equivalents of the claims be included within this invention. No reference numerals in the claims should be construed as limiting the scope of the claims.
[0062] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.
Claims
1. An integrated circuit reliability testing device, characterized in that, The integrated circuit reliability testing equipment includes: a power supply module, an integrated circuit module, a temperature detection module, an over-temperature detection module, a timing control module, a sample and hold module, a temperature change detection module, and an alarm module; The power module is connected to the temperature detection module and the timing control module. It is used to receive AC power and perform step-down, rectification and filtering on the AC power to output first power, perform voltage regulation on the first power and output second power, and transmit the second power to the timing control module when it receives the first control signal output by the temperature detection module. The integrated circuit module is connected to the power module and is used to transmit the first electrical energy to the connected integrated circuit. The temperature detection module is used to receive the second electrical energy and perform temperature detection, output a first temperature signal, and output a first control signal when the first temperature signal is greater than a set temperature threshold. The over-temperature detection module is connected to the temperature detection module and is used to set an over-temperature threshold and output a second control signal when the first temperature signal is greater than the over-temperature threshold. The timing control module is connected to the temperature detection module and is used to set the sampling time and detection time. Upon receiving the second electrical energy and within the sampling time, it outputs a first timing signal and within the detection time, it outputs a second timing signal. The first timing signal and the second timing signal are output cyclically. The sampling and holding module is connected to the temperature detection module and the timing control module. When a first timing signal is received, it stores and transmits the first temperature signal. When a second timing signal is received, it holds the stored first temperature signal and outputs the first holding signal. The temperature change detection module is connected to the temperature detection module, the timing control module, and the sampling protection module. It is used to perform subtraction processing on the real-time detected first temperature signal and the first hold signal. When the subtracted signal is greater than the set difference threshold and a second timing signal is received, a third control signal is output. The alarm module is connected to the power supply module, the over-temperature detection module, and the temperature change detection module. It is used to receive the second electrical energy and to trigger an alarm for abnormal temperature in the dust collection circuit when a second or third control signal is received.
2. The integrated circuit reliability testing equipment according to claim 1, characterized in that, The power module includes a power interface, a first transformer, a first rectifier, a first voltage regulator, a second capacitor, and a first power transistor; the integrated circuit module includes an integrated circuit interface. The first and second ends of the power interface are respectively connected to the first and second ends of the primary side of the first transformer. The first and second ends of the secondary side of the first transformer are respectively connected to the first and second ends of the first rectifier. The third end of the first rectifier is connected to the first end of the first voltage regulator and the first end of the integrated circuit interface, and is connected to the fourth end of the first rectifier, the second end of the first voltage regulator, one end of the second capacitor, and ground through the first capacitor. The third end of the first voltage regulator is connected to the other end of the second capacitor and the drain of the first power transistor. The source of the first power transistor is connected to the timing control module, and the gate of the first power transistor is connected to the temperature detection module. The second end of the integrated circuit interface is grounded.
3. The integrated circuit reliability testing equipment according to claim 2, characterized in that, The temperature detection module includes a first thermistor, a first resistor, a first comparator, and a first threshold device; One end of the first thermistor is connected to the third terminal of the first voltage regulator, and the other end of the first thermistor is connected to the non-inverting terminal of the first comparator, the over-temperature detection module, the sample-and-hold module and the temperature change detection module and grounded through the first resistor. The inverting terminal of the first comparator is connected to the first threshold device, and the output terminal of the first comparator is connected to the gate of the first power transistor.
4. The integrated circuit reliability testing equipment according to claim 3, characterized in that, The sample-and-hold module includes a first operational amplifier, a second resistor, a first analog switch, a third resistor, a third capacitor, and a second operational amplifier; The non-inverting input of the first operational amplifier is connected to the non-inverting input of the first comparator. The inverting input of the first operational amplifier is connected to the inverting input of the second operational amplifier, the output of the second operational amplifier, and the temperature change detection module through the second resistor. The non-inverting input of the second operational amplifier is connected to the fourth terminal of the first analog switch and grounded through the third capacitor and the third resistor in sequence. The third terminal of the first analog switch is connected to the output of the first operational amplifier. The fifth terminal of the first analog switch is connected to the timing control module.
5. The integrated circuit reliability testing equipment according to claim 4, characterized in that, The temperature change detection module includes a sixth resistor, a fifth resistor, a fourth resistor, a third operational amplifier, a seventh resistor, a first potentiometer, a first diode, and a first logic chip; The inverting input of the third operational amplifier is connected to one end of the seventh resistor and then to the output of the second operational amplifier via the sixth resistor. The non-inverting input of the third operational amplifier is connected to one end of the fourth resistor and then to the non-inverting input of the first comparator via the fifth resistor. The other end of the fourth resistor is grounded. The output of the third operational amplifier is connected to the other end of the seventh resistor and one end of the first potentiometer. The other end of the first potentiometer and the slider end are both connected to the cathode of the first diode. The anode of the first diode is connected to the B terminal of the first logic chip. The A terminal of the first logic chip is connected to the timing control module. The Y terminal of the first logic chip is connected to the alarm module.
6. The integrated circuit reliability testing equipment according to claim 5, characterized in that, The over-temperature detection module includes a second potentiometer, a second diode, and a third diode; the alarm module includes an eighth resistor, a first speaker, and a first switching transistor. One end of the second potentiometer is connected to the non-inverting input of the first comparator. The other end of the second potentiometer and the slider end are both connected to the cathode of the second diode. The anode of the second diode is connected to the anode of the third diode. The cathode of the third diode is connected to the base of the first switching transistor and the Y terminal of the first logic chip. The emitter of the first switching transistor is grounded. The collector of the first switching transistor is connected to one end of the first speaker. The other end of the first speaker is connected to the third terminal of the first voltage regulator through the eighth resistor.
7. The integrated circuit reliability testing equipment according to claim 5, characterized in that, The timing control module includes a ninth resistor, a fifth capacitor, a fourth capacitor, a first timer, a fourth diode, a fifth diode, a third potentiometer, a fourth potentiometer, and a first inverter; The fourth and eighth terminals of the first timer are both connected to the source of the first power transistor and connected to the seventh terminal of the first timer, the anode of the fourth diode, and the cathode of the fifth diode through the ninth resistor. The anode of the fourth diode is connected to one end and the slider end of the third potentiometer, and the anode of the fifth diode is connected to one end and the slider end of the fourth potentiometer. The other end of the third potentiometer is connected to the other end of the fourth potentiometer, the sixth and second terminals of the first timer, and grounded through the fourth capacitor. The fifth terminal of the first timer is connected to the first terminal of the first timer and ground through the fifth capacitor. The third terminal of the first timer is connected to the fifth terminal of the first analog switch and the input terminal of the first inverter. The output terminal of the first inverter is connected to the A terminal of the first logic chip.