Connector four-wire testing device
By incorporating probe units with insulating structures into the connector testing device, the problem of low efficiency in single-pin testing in existing technologies is solved, enabling efficient, low-cost, and long-life connector testing with multi-pin four-wire testing.
Patent Information
- Application Number
- CN202423229872.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-24
- Publication Date
- 2026-02-10
- Estimated Expiration
- 2034-12-24
AI Technical Summary
Existing connector testing equipment can only perform single-pin testing, which is inefficient. Furthermore, multi-pin four-wire testing requires probes made of high-strength and high-hardness materials, which is costly and has a short lifespan.
Design a four-wire connector testing device, which adopts an insulating structure between the first probe piece and the second probe piece to form a probe unit. The probe unit is connected into one piece by glue or injection molding. Copper probe pieces and plastic pin plates are used, and the insulating structure is made of plastic, forming a structure with high overall strength and strong stability.
It achieves multi-needle electrical contact, improves testing efficiency, reduces material costs, extends probe life, and enables efficient use of small spaces for four-wire testing.
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Figure CN223897623U_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The utility model relates to connector testing device field, especially in a kind of connector four-line testing device. BACKGROUND
[0002] Connector is a kind of for electrical connection, signal transmission component.In the production and manufacturing process of connector, generally needs to carry out electrical test to connector.Among them, since the pin of connector is more more dense, the probe design space of connector testing device is very small.Therefore, the connector testing device in prior art can only carry out single needle test to the pin of connector, and the test efficiency is low.If the four-line test of multiple pins of connector is to be realized, probe needs to be made of high-strength, high-hardness, fatigue-resistant material, otherwise probe is easy to damage, and service life is very short, so material cost is higher.
[0003] Therefore, a kind of connector four-line testing device is needed to solve the above technical problems. UTILITY MODEL CONTENT
[0004] The utility model provides a kind of connector four-line testing device, to solve the problem that the connector testing device in prior art can only single needle test, efficiency is very low.
[0005] To solve the above technical problems, the technical scheme of the utility model is as follows: a kind of connector four-line testing device, it includes: test circuit board, needle plate and probe unit being set in the needle plate in through;
[0006] The probe unit includes first probe sheet, second probe sheet and insulation structure, the first probe sheet and the second probe sheet are arranged in parallel, the insulation structure is arranged between the first probe sheet and the second probe sheet, to separate the first probe sheet and second probe sheet with set distance, the test circuit board is fixedly connected with the needle plate, one end of the first probe sheet and second probe sheet is the connecting end for electrical contact with the test circuit board, the other end of the first probe sheet and second probe sheet is the test end for contact with the connector to be measured.
[0007] In the utility model, the insulation structure includes insulating sheet and insulating block, the insulating sheet is arranged between the first probe sheet and the second probe sheet in the region close to the test end, and a plurality of insulating blocks are arranged between the first probe sheet and the second probe sheet in the region away from the test end.
[0008] In the utility model, the insulation structure is the whole insulating sheet that fills the common area between the first probe sheet and the second probe sheet.
[0009] In the utility model, the first probe piece, the second probe piece and the insulating structure are connected as an integral structure through the mode of glue bonding.
[0010] In the utility model, the insulating structure is of plastic material, and the first probe piece, the second probe piece and the insulating structure are connected as an integral structure through the mode of injection molding.
[0011] In the utility model, the two sides of the connecting end of the first probe piece are located at the first height position and the second height position respectively, the first height position is higher than the second height position, the two sides of the connecting end of the second probe piece are also located at the first height position and the third height position respectively, the first height position is higher than the third height position, one side of the first height position of the connecting end of the first probe piece is oppositely arranged with one side of the third height position of the connecting end of the second probe piece, and one side of the second height position of the connecting end of the first probe piece is oppositely arranged with one side of the first height position of the connecting end of the second probe piece.
[0012] In the utility model, the connector four-line test device comprises two groups of needle plates, each group of needle plates is provided with a plurality of probe units arranged along the transverse direction, one side of the two groups of needle plates parallel to the transverse direction is in surface contact, the probe units on the two groups of needle plates extend in parallel, and the two ends of the two groups of needle plates are provided with connecting holes.
[0013] In the utility model, the first probe piece and the second probe piece all comprise a connecting portion and a test portion, the width of the test portion is smaller than the width of the connecting portion, the test end is located at one end of the test portion away from the connecting portion, the connecting end is located at one end of the connecting portion away from the test portion, and the connecting portion is clamped in the needle plate.
[0014] In the utility model, the test end of the first probe piece and the second probe piece is provided with an adaptive slot for electrically contacting the connector to be tested.
[0015] In the utility model, the needle plate is of plastic material, and the first probe piece and the second probe piece are of copper material.
[0016] Compared with the prior art, the utility model has the advantages that the connector four-line test device of the utility model sets the insulating structure between the first probe piece and the second probe piece to form a probe unit, so that the overall strength of the probe unit is high and stable, is not easy to damage, has long service life, and has compact structure, and small setting space can be efficiently utilized. BRIEF DESCRIPTION OF DRAWINGS
[0017] In order to more clearly illustrate the technical solutions of the embodiments of the present application or the prior art, the following briefly introduces the drawings needed in the embodiments. The drawings in the following description are only corresponding drawings of some embodiments of the present application.
[0018] Figure 1 The figure is a structural schematic diagram of a preferred embodiment of the connector four-wire testing device of the present application.
[0019] Figure 2 The figure is a structural schematic diagram of a probe unit of the connector four-wire testing device of the present application.
[0020] Figure 3 The figure is an exploded structural schematic diagram of the probe unit of the connector four-wire testing device of the present application.
[0021] Figure 4 The figure is a local structural schematic diagram of a connecting end of the probe unit of the connector four-wire testing device of the present application. DETAILED DESCRIPTION
[0022] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only some of the embodiments of the present application, but not all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.
[0023] The directional terms mentioned in the present application, such as "up", "down", "front", "back", "left", "right", "inner", "outer", "side", "top" and "bottom", are only the orientation of the drawings, and the directional terms are used to illustrate and understand the present application, but not to limit the present application.
[0024] The terms "first", "second" and the like in the present application are only for the purpose of description, and cannot be understood as indicating or implying relative importance, and are not limited as the order of precedence.
[0025] In the present application, unless otherwise explicitly specified and limited, the terms "mounting", "connection", "connection", "fixing" and the like should be understood broadly, for example, the connection can be detachable connection, or integral structure connection; can be mechanical connection, or electrical connection; can be direct connection, or indirect connection through intermediate medium; can be the internal communication of two elements or the interaction relationship of two elements. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.
[0026] The connector testing device in the prior art can only perform single-pin testing on the pins of the connector, and the testing efficiency is low. If four-wire testing is to be performed on the connector, probes made of high-strength, high-hardness and fatigue-resistant materials need to be used, otherwise the probes are prone to damage and have a short service life, and thus the material cost is high.
[0027] The following is a preferred embodiment of a connector four-wire testing device provided by the utility model, which can solve the above technical problems.
[0028] Please refer to Figure 1 , Figure 2 and Figure 3 , in the drawings, similar units are denoted by the same reference numerals.
[0029] The embodiment provides a connector four-wire testing device, which comprises a testing circuit board 11, a needle plate 12 and a probe unit 13 arranged through the needle plate 12.
[0030] The probe unit 13 comprises a first probe sheet 131, a second probe sheet 132 and an insulating structure 133, the first probe sheet 131 and the second probe sheet 132 are arranged in parallel, and the insulating structure 133 is arranged between the first probe sheet 131 and the second probe sheet 132 to separate the first probe sheet 131 and the second probe sheet 132 by a certain distance, the testing circuit board 11 is fixedly connected with the needle plate 12, one end of the first probe sheet 131 and the second probe sheet 132 is a connecting end 134 for electrically contacting the testing circuit board 11, and the other end of the first probe sheet 131 and the second probe sheet 132 is a testing end 135 for contacting a connector to be tested 14. The probe unit 13 is a whole structure with high strength and high stability, is not prone to damage, has a long service life, has a compact structure and can efficiently utilize a small setting space to form multi-pin electrical contact with the pins of the connector, thereby achieving the purpose of four-wire testing.
[0031] Please refer to Figure 3 , optionally, in the embodiment, the insulating structure 133 comprises an insulating sheet 1331 and insulating blocks 1332, the insulating sheet 1331 is arranged between the first probe sheet 131 and the second probe sheet 132 and close to the testing end 135, and the plurality of insulating blocks 1332 are arranged between the first probe sheet 131 and the second probe sheet 132 and away from the testing end 135. In this way, the strength of the connecting end of the probe unit 13 can be ensured while the material is reduced.
[0032] Optionally, the insulating structure 133 can also be an insulating sheet that fills the common region between the first probe sheet 131 and the second probe sheet 132.
[0033] Optionally, the first probe sheet 131, the second probe sheet 132 and the insulating structure 133 can be connected into an integral structure by means of adhesive bonding.
[0034] Optionally, the insulating structure 133 is made of plastic material, and the first probe piece 131, the second probe piece 132 and the insulating structure 133 are connected into an integrated structure by injection molding. It can be understood that a through hole or a sink groove can be arranged at a part of the first probe piece 131 and the second probe piece 132, so that the insulating structure 133 is injection molded into the through hole or the sink groove, thereby enhancing the connection stability of the first probe piece 131, the second probe piece 132 and the insulating structure 133.
[0035] Please refer to Figure 4 In the embodiment, the two sides of the connecting end 134 of the first probe piece 131 are located at the first height position and the second height position respectively, and the first height position is higher than the second height position. The two sides of the connecting end 134 of the second probe piece 132 are also located at the first height position and the third height position respectively, and the first height position is higher than the third height position. The second height position and the third height position can be equal or not equal.
[0036] The side where the first height position of the connecting end 134 of the first probe piece 131 is located is oppositely arranged with the side where the third height position of the connecting end 134 of the second probe piece 132 is located, and the side where the second height position of the connecting end 134 of the first probe piece 131 is located is oppositely arranged with the side where the first height position of the connecting end 134 of the second probe piece 132 is located. In this way, the parts at the first height positions of the first probe piece 131 and the second probe piece 132 can simultaneously make better electrical contact with the test circuit board 11.
[0037] Please refer to Figure 1 In the embodiment, the connector four-wire test device includes two groups of needle plates 12, each group of needle plates 12 is arranged with a plurality of probe units 13 in the transverse direction, the two groups of needle plates 12 are in surface contact on the side parallel to the transverse direction, the extension directions of the probe units 13 on the two groups of needle plates 12 are parallel, and the two ends of the two groups of needle plates 12 are provided with connecting holes 121. A test circuit board 11 is connected to the two groups of needle plates 12 by a connecting piece. The connecting piece can be a screw, a pin or the like. In this way, the probe units 13 of the two groups of needle plates 12 can be arranged in a non-flat structure, so as to be suitable for testing connectors with uneven pin feet. At the same time, when some probe units 13 are damaged, it is convenient to replace part of the needle plates 12 and the probe units 13 on the needle plates 12, and the recycling value is high.
[0038] In the embodiment, the first probe piece 131 and the second probe piece 132 each comprise a connecting portion 1311 and a testing portion 1312, the width of the testing portion 1312 is less than the width of the connecting portion 1311, the testing end 135 is located at one end of the testing portion 1312 away from the connecting portion 1311, the connecting end 134 is located at one end of the connecting portion 1311 away from the testing portion 1312, and the connecting portion 1311 is clamped in the needle plate 12.
[0039] In the embodiment, the testing end 135 of the first probe piece 131 and the second probe piece 132 is provided with an adaptive slot for electrically contacting the connector 14 to be tested.
[0040] In the embodiment, the needle plate 12 is made of plastic, and the first probe piece 131 and the second probe piece 132 are made of copper.
[0041] The connector four-wire testing device of the preferred embodiment sets the insulating structure between the first probe piece and the second probe piece to form the probe unit, so that the overall strength of the probe unit is high and stable, is not easy to damage, has a long service life, and has a compact structure, and can efficiently utilize a smaller setting space. The testing end 135 of the probe unit 13 is in electrical contact with the connector 14 to be tested, then the probe unit 13 is in electrical contact with the testing circuit board 11 through the connecting end 134, electrical communication between the testing circuit board 11 and the connector 14 to be tested is realized, and then a testing operation is performed.
[0042] In conclusion, although the utility model has disclosed the above-mentioned preferred embodiment, the above-mentioned preferred embodiment is not used to limit the utility model, ordinary skilled in the art can make various changes and decorations without departing from the spirit and scope of the utility model, therefore the protection scope of the utility model is subject to the range defined by the claims.
Claims
1. A four-wire connector testing device, characterized in that, include: The test circuit board, the needle plate, and the probe unit that penetrates the needle plate; The probe unit includes a first probe piece, a second probe piece, and an insulating structure. The first probe piece and the second probe piece are arranged in parallel. The insulating structure is disposed between the first probe piece and the second probe piece to separate the first probe piece and the second probe piece by a set distance. The test circuit board is fixedly connected to the probe plate. One end of the first probe piece and the second probe piece is a connection end for electrical contact with the test circuit board, and the other end of the first probe piece and the second probe piece is a test end for contact with the connector under test.
2. The connector four-wire testing device according to claim 1, characterized in that, The insulating structure includes an insulating sheet and insulating blocks. The insulating sheet is disposed in the region between the first probe sheet and the second probe sheet near the test end, and a plurality of the insulating blocks are disposed in the region between the first probe sheet and the second probe sheet away from the test end.
3. The connector four-wire testing device according to claim 1, characterized in that, The insulating structure is a single insulating sheet that covers the common area between the first probe sheet and the second probe sheet.
4. The connector four-wire testing device according to claim 1, characterized in that, The first probe piece, the second probe piece, and the insulating structure are connected as a single unit by adhesive bonding.
5. The connector four-wire testing device according to claim 1, characterized in that, The insulating structure is made of plastic, and the first probe sheet, the second probe sheet, and the insulating structure are connected as a single unit by injection molding.
6. The connector four-wire testing device according to claim 1, characterized in that, The two sides of the connecting end of the first probe piece are located at a first height position and a second height position, respectively. The first height position is higher than the second height position. The two sides of the connecting end of the second probe piece are also located at a first height position and a third height position, respectively. The first height position is higher than the third height position. The side of the connecting end of the first probe piece located at the first height position is opposite to the side of the connecting end of the second probe piece located at the third height position. The side of the connecting end of the first probe piece located at the second height position is opposite to the side of the connecting end of the second probe piece located at the first height position.
7. The connector four-wire testing device according to claim 1, characterized in that, The connector four-wire testing device includes two sets of pin plates. Each set of pin plates has multiple probe units arranged in a transverse direction. The two sets of pin plates are in surface contact on the side parallel to the transverse direction. The probe units on the two sets of pin plates extend in parallel directions. The two ends of the two sets of pin plates are provided with connection holes. A test circuit board is connected to the two sets of pin plates through a connector.
8. The connector four-wire testing device according to claim 1, characterized in that, Both the first probe piece and the second probe piece include a connecting portion and a testing portion. The width of the testing portion is smaller than the width of the connecting portion. The testing end is located at the end of the testing portion away from the connecting portion, and the connecting end is located at the end of the connecting portion away from the testing portion. The connecting portion is snapped into the probe plate.
9. The connector four-wire testing device according to claim 1, characterized in that, The test ends of the first probe piece and the second probe piece are provided with adapter slots for electrical contact with the connector under test.
10. The connector four-wire testing device according to claim 1, characterized in that, The needle plate is made of plastic, while the first probe piece and the second probe piece are made of copper.