Phase noise analyzer spread spectrum device and phase noise analysis system

Abstract

The utility model provides a phase noise analyzer spread spectrum device and a phase noise analysis system. The phase noise analyzer spread spectrum device comprises a to-be-detected source signal processing assembly, a first reference signal generating assembly, a second reference signal generating assembly, a first frequency conversion assembly and a second frequency conversion assembly. The to-be-tested source signal processing assembly is electrically connected with the first frequency conversion assembly and the second frequency conversion assembly. The first reference signal generation component is electrically connected with the first frequency conversion component; the first reference signal generation assembly is used for generating two paths of first reference signals, one path is input into the first frequency conversion assembly, and the other path is connected to the phase noise baseband analyzer; the second reference signal generation component is electrically connected with the second frequency conversion component; and the second reference signal generation assembly is used for generating two paths of second reference signals, one path is input into the second frequency conversion assembly, and the other path is connected to the phase noise baseband analyzer. According to the invention, the reference source and the local oscillator are combined into one, so that the cost of the device is reduced, and the accuracy of phase noise measurement is improved.

Description

TECHNICAL FIELD

[0001] The utility model relates to the technical field of phase noise analysis, specifically relates to a kind of phase noise analyzer spread spectrum device and phase noise analysis system. BACKGROUND

[0002] Phase noise analyzer is a kind of signal analyzer for measuring signal source stability, and its main function is to measure the phase noise spectrum of signal source. With the progress of technology, the quality of existing signal source is higher and higher. This puts forward higher requirements for phase noise analyzer. The existing phase noise analysis technology is divided into two categories: analog phase-locked type and digital type. Among them, analog phase-locked type is the traditional classic method. This method is difficult to implement and requires complex calibration process. The classic model is HP3048A of Hewlett-Packard Company in the United States. This model has been the industry standard for more than 40 years. The other type is digital phase noise analyzer. After 20 years of development, this series of products has been gradually popularized and applied. The method of extending the frequency of phase noise analyzer mainly adopts down-conversion, that is, the high-frequency signal is converted to low-frequency (baseband) signal, and the phase measurement is completed in the baseband. In order to increase the measurement capacity, the mainstream method now adopts "double-channel down-conversion" to complete. After using double-channel down-conversion, the classic correlation operation can be used to remove the noise generated by the reference source and down-conversion module, and the phase noise of the measured signal can be extracted with high quality. Figure 1 、 Figure 2 、 Figure 3 As shown in the prior art.

[0003] However, these devices have their own problems. For Figure 1 , since the ADC reference clock of the two channels is synchronized by phase-locked loop, that is, the two clock signals are correlated within the bandwidth of the phase-locked loop (such as 0.1 Hz). The correlation algorithm is invalid within the bandwidth of the phase-locked loop, and the noise of the ADC clock itself cannot be effectively removed. Therefore, the application frequency offset measurement range of the device is limited, that is, the phase noise at a too small frequency offset cannot be measured. Figure 2 Two channels are needed to complete phase-locked loop, which can easily introduce a series of additional problems, and it is difficult to improve the noise system performance index. Figure 3 The reference source and the local oscillator source are completed respectively, which is high in cost.

[0004] Based on the above problems, it is necessary to design a phase noise analyzer that can offset noise and further improve performance. Utility model content

[0005] The utility model provides a kind of phase noise analyzer spread spectrum device and phase noise analysis system to solve the defects existing in prior art.

[0006] A phase noise analyzer spread spectrum device, comprising: a to-be-tested source signal processing assembly, a first reference signal generating assembly, a second reference signal generating assembly, a first frequency conversion assembly and a second frequency conversion assembly;

[0007] The to-be-tested source signal processing assembly is electrically connected with the first frequency conversion assembly and the second frequency conversion assembly respectively; the to-be-tested source signal processing assembly is used for dividing an accessed to-be-tested source signal into a first to-be-tested source signal and a second to-be-tested source signal, and inputting the first to-be-tested source signal into the first frequency conversion assembly and inputting the second to-be-tested source signal into the second frequency conversion assembly;

[0008] The first reference signal generating assembly is electrically connected with the first frequency conversion assembly; the first reference signal generating assembly is used for generating two paths of first reference signals, one path of the first reference signals is input into the first frequency conversion assembly, and the other path is accessed into a phase noise baseband analyzer;

[0009] The first frequency conversion assembly is used for mixing one path of the first reference signals and the first to-be-tested source signal, and outputting a first measurement signal;

[0010] The second reference signal generating assembly is electrically connected with the second frequency conversion assembly; the second reference signal generating assembly is used for generating two paths of second reference signals, one path of the second reference signals is input into the second frequency conversion assembly, and the other path is accessed into a phase noise baseband analyzer;

[0011] The second frequency conversion assembly is used for mixing the second reference signals and the second to-be-tested source signal, and outputting a second measurement signal.

[0012] Further, the phase noise analyzer spread spectrum device, the first reference signal generating assembly comprises: a first oscillator, a first power divider;

[0013] The output end of the first oscillator is connected with the input end of the first power divider; the first power divider comprises two output ends outputting two paths of the first reference signals, one output end is connected with the input end of the first frequency conversion assembly; and the other output end is connected to a phase noise baseband analyzer.

[0014] Further, the phase noise analyzer spread spectrum device, the second reference signal generating assembly comprises: a second oscillator, a second power divider;

[0015] The output end of the second oscillator is connected with the input end of the second power divider; the second power divider comprises two output ends outputting two paths of the second reference signals, one output end is connected with the input end of the second frequency conversion assembly; and the other output end is connected to a phase noise baseband analyzer.

[0016] Further, the phase noise analyzer spread spectrum device as described above, the to-be-tested source signal processing assembly comprises: a to-be-tested source signal input interface, a third power divider;

[0017] The to-be-tested source signal input interface is connected with the input end of the third power divider; the third power divider comprises two output ends, which are respectively used for outputting the first to-be-tested source signal and the second to-be-tested source signal.

[0018] Further, the phase noise analyzer spread spectrum device as described above, the to-be-tested source signal processing assembly further comprises: a third oscillator;

[0019] The third oscillator is used for generating a to-be-tested source signal, and an output end thereof is connected with the to-be-tested source signal input interface.

[0020] Further, the phase noise analyzer spread spectrum device as described above, the first oscillator, the second oscillator and the third oscillator are all thermostatic crystal oscillators.

[0021] Further, the phase noise analyzer spread spectrum device as described above further comprises a first low-pass filter;

[0022] An output end of the first frequency conversion assembly is connected with an input end of the first low-pass filter; and an output end of the first low-pass filter is connected to the phase noise baseband analyzer.

[0023] Further, the phase noise analyzer spread spectrum device as described above further comprises a second low-pass filter;

[0024] An output end of the second frequency conversion assembly is connected with an input end of the second low-pass filter; and an output end of the second low-pass filter is connected to the phase noise baseband analyzer.

[0025] A phase noise analysis system, comprising the spread spectrum device as described in any one of the preceding items, and further comprising a phase noise baseband analyzer, wherein the phase noise baseband analyzer at least comprises four signal access channels, and the four signal access channels are respectively provided with a first reference signal input port, a second reference signal input port, a first measurement signal input port and a second measurement signal input port; wherein,

[0026] Another path of the first reference signal of the first reference signal generation assembly is input into the first reference signal input port;

[0027] Another path of the second reference signal of the second reference signal generation assembly is input into the second reference signal input port;

[0028] The first measurement signal output by the first frequency conversion assembly is input into the first measurement signal input port;

[0029] The second measurement signal output by the second frequency conversion component is input to the second measurement signal input port.

[0030] The phase noise analyzer spread spectrum device and the phase noise analysis system provided by the application directly combine the reference source and the local oscillator by the first reference signal generation component and the second reference signal generation component, can offset the noise without using the phase-locked loop, not only reduces the cost of the spread spectrum device, but also ensures the high consistency of the phase and frequency between the reference signal and the to-be-measured source signal, thereby reducing the phase error caused by different sources and improving the accuracy of the phase noise analysis. BRIEF DESCRIPTION OF DRAWINGS

[0031] Figure 1 It is a structural schematic diagram of a phase noise analyzer spread spectrum device in the prior art;

[0032] Figure 2 It is a structural schematic diagram of a phase noise analyzer spread spectrum device in the prior art;

[0033] Figure 3 It is a structural schematic diagram of a phase noise analysis system in the prior art;

[0034] Figure 4 It is a structural schematic diagram of a phase noise analyzer spread spectrum device in the prior art;

[0035] Figure 5 It is a structural schematic diagram of a phase noise analysis system in the prior art;

[0036] Figure 6 It is a schematic diagram of test results of a 102.4M constant temperature crystal oscillator as a reference source testing a 100M constant temperature crystal oscillator;

[0037] REFERENCE SIGNS:

[0038] 1-third oscillator; 2-third power divider; 3-first oscillator; 4-first power divider; 5-first frequency mixer; 6-second frequency mixer; 7-second power divider; 8-second oscillator; 9-first low pass filter; 10-second low pass filter; 11-phase noise baseband analyzer. DETAILED DESCRIPTION

[0039] In order to make the purpose, technical scheme and advantages of the utility model more clear, the technical scheme in the utility model will be described clearly and completely below in combination with the drawings in the utility model. Obviously, the described embodiments are part of the embodiments of the utility model, rather than all the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by the person skilled in the art without creative labor belong to the protection scope of the utility model.

[0040] Please refer to Figure 1 , Figure 1 is a dual-channel mode, two ADC clocks are independent but locked by a phase-locked loop. Figure 2 , a dual-channel phase-locked mode, two independent channels complete phase locking respectively, and finally do correlation calculation. Figure 3 In the prior art, the reference source and the local oscillator are separated, which causes resource waste. Figure 1 , figure, Figure 3 The phase noise baseband analyzer spread spectrum device provided by the utility model solves the problems in the prior art. Figure 4 As shown in the figure,

[0041] The measured source signal processing assembly, the first reference signal generating assembly, the second reference signal generating assembly, the first frequency conversion assembly and the second frequency conversion assembly are electrically connected respectively; the measured source signal processing assembly is used for dividing the accessed measured source signal into a first measured source signal and a second measured source signal, and inputting the first measured source signal into the first frequency conversion assembly and the second measured source signal into the second frequency conversion assembly.

[0042] The first reference signal generating assembly and the first frequency conversion assembly are electrically connected; the first reference signal generating assembly is used for generating two first reference signals, one of which is input into the first frequency conversion assembly and the other is directly accessed into the phase noise baseband analyzer; the first frequency conversion assembly is used for mixing one of the first reference signals and the first measured source signal generated by the first reference signal generating assembly, and outputs a first measurement signal.

[0043] The second reference signal generating assembly and the second frequency conversion assembly are electrically connected; the second reference signal generating assembly is used for generating two second reference signals, one of which is input into the second frequency conversion assembly and the other is directly accessed into the phase noise baseband analyzer; the second frequency conversion assembly is used for mixing the second reference signal generated by the second reference signal generating assembly and the second measured source signal, and outputs a second measurement signal.

[0044] The phase noise baseband analyzer spread spectrum device provided by the application directly combines the reference source and the local oscillator by the first reference signal generating assembly and the second reference signal generating assembly, can offset noise without using a phase-locked loop, not only reduces the cost of the spread spectrum device, but also ensures that the phase and frequency of the reference signal and the measured source signal are highly consistent, thereby reducing the phase error introduced by different sources and improving the accuracy of phase noise analysis.

[0045] Further, as Figure 5As shown, the first reference signal generating component includes a first oscillator 3, a first power divider 4, the output of the first oscillator 3 is connected to the input of the first power divider 4, the first power divider 4 includes two outputs, one of which is connected to the input of the first frequency conversion component, and the other is connected to the phase noise baseband analyzer for analysis.

[0046] Specifically, the first oscillator 3 is responsible for generating a stable oscillation signal with a specific frequency. This signal serves as a reference signal, and its stability and accuracy are crucial to the performance of the entire system. The frequency, phase noise, and other parameters of the oscillator's output signal will directly affect the quality of subsequent signal processing. Therefore, the first oscillator 3 needs to have high stability, low phase noise, and other characteristics. In this embodiment, the first oscillator 3 uses a local oscillator. The first power divider 4 is used to evenly (or in a certain proportion) divide the signal power received from the first oscillator 3 into two outputs, one of which is connected to the input of the first frequency conversion component to provide the required reference signal for the frequency conversion component. The other output is connected to the phase noise baseband analyzer for analysis and measurement of the phase noise of the reference signal.

[0047] The conventional phase noise baseband analyzer spread spectrum device has the defects of high cost and high system noise because the reference source and the local oscillator are usually separate. The first oscillator 3 is used as both a reference source and a local oscillator in this application, realizing the combination of the two. This combined design simplifies the system structure, reduces the number of components, and thus reduces the complexity and cost of the system. Moreover, since the reference source and the local oscillator are combined in the same frequency conversion channel, the noise can be partially canceled, which helps to improve the system performance.

[0048] The phase noise baseband analyzer spread spectrum device provided by the application realizes the combination of the reference source and the oscillator through the cooperation of the first oscillator and the first power divider, not only reducing the cost of the spread spectrum device, but also reducing the system noise, thereby improving the accuracy of phase noise analysis.

[0049] Further, the second reference signal generating component includes a second oscillator 8, a second power divider 7,

[0050] The output of the second oscillator 8 is connected to the input of the second power divider 7, the second power divider 7 includes two outputs, one of which is connected to the input of the second frequency conversion component, and the other is connected to the phase noise baseband analyzer. In this embodiment, the second oscillator 8 uses a local oscillator.

[0051] In the embodiments of the present application, the first frequency conversion component and the second frequency conversion component are both formed by mixers. Specifically, the first frequency conversion component can be a first mixer, and the second frequency conversion component can be a second mixer.

[0052] The second reference signal generation component provided in the present application has a similar principle to the reference signal generation component, which will not be described here.

[0053] Further, the to-be-tested source signal processing component comprises a to-be-tested source signal input interface and a third power divider 2. The to-be-tested source signal input interface is connected to the input end of the third power divider 2. The third power divider 2 comprises two output ends, which are respectively used for outputting a first to-be-tested source signal and a second to-be-tested source signal.

[0054] Further, the to-be-tested source signal processing component further comprises a third oscillator 1. The output end of the third oscillator 1 is connected to the to-be-tested source signal input interface.

[0055] Further, the first oscillator 3, the second oscillator 8 and the third oscillator 1 are all oven-controlled crystal oscillators.

[0056] Specifically, since the oven-controlled crystal oscillator has the characteristics of high precision and high stability, low phase noise, easy integration and testing, etc., the first oscillator 3, the second oscillator 8 and the third oscillator 1 are all formed by oven-controlled crystal oscillators in the present application, which can effectively improve the precision of analyzing the phase noise.

[0057] Further, the phase noise baseband analyzer spread spectrum device provided in the present application further comprises a first low-pass filter 9 and a second low-pass filter 10. The output end of the first frequency conversion component is electrically connected to the input end of the first low-pass filter 9. The output end of the second frequency conversion component is electrically connected to the input end of the second low-pass filter 10. The output ends of the first low-pass filter 9 and the second low-pass filter 10 are respectively connected to the phase noise baseband analyzer.

[0058] Specifically, the mixed frequency signals output from the first mixer 5 and the second mixer 6 are respectively subjected to low-pass filtering by the first low-pass filter 9 and the second low-pass filter 10, and the filtered mixed frequency signals are input into the phase noise baseband analyzer for analysis.

[0059] The phase noise baseband analyzer spread spectrum device provided in the present application can effectively remove the high-frequency noise of the mixed frequency signals through the first low-pass filter 9 and the second low-pass filter 10, thereby further improving the analysis precision of the phase noise.

[0060] As an example, the frequency of the to-be-tested source is 100 MHz, and the frequencies of the first oscillator 3 and the second oscillator 8 are both 102.4 MHz.

[0061] Specifically, when the local oscillator signal is close to the frequency of the source to be tested, the frequency of the difference frequency signal generated after mixing is low, which helps to reduce the processing requirements of the test system for high-frequency signals, thereby improving the test efficiency. The frequency of the source to be tested is 100MHz in the present application; the frequencies of the first oscillator 3 and the second oscillator 8 are both 102.4MHz, which can make the difference frequency signal generated in the mixing process relatively low.

[0062] Further, the first oscillator 3, the second oscillator 8 and the third oscillator 1 are all oven controlled crystal oscillators (OCXO).

[0063] Specifically, the oven controlled crystal oscillator greatly reduces the frequency drift caused by temperature changes, so that the signal frequency output by the oscillator remains highly consistent over a long period of time, thereby improving the accuracy and reliability of the phase noise test.

[0064] Further, in order to further improve the accuracy and reliability of the phase noise test, the first mixer 5 or the second mixer 6 uses a passive mixer ade-42mh+. The first low-pass filter 9 and the second low-pass filter 10 are selected according to the frequency band requirements. In the application embodiment, a 50M low-pass filter can be selected.

[0065] Further, the signal source indicators of the first oscillator 3 and the second oscillator 8 are equal to or higher than the indicator of the third oscillator 1.

[0066] Specifically, when the signal source indicators of the first oscillator 3 and the second oscillator 8 are not worse than the indicator of the source to be tested 1, the test speed can be accelerated. And when the signal source indicators of the oscillators are superior to or equal to the source to be tested, it can be ensured that the error introduced by the oscillators in the mixing and filtering process will not be greater than the error of the source to be tested itself. This helps to reduce the accumulation of errors in the test process and improves the accuracy and reliability of the test.

[0067] Further, the indicators include frequency stability and phase noise.

[0068] Specifically, frequency stability refers to the ability of an oscillator to maintain its output frequency constant over a long period of time. It is one of the important indicators to measure the performance of an oscillator. In the phase noise test, the frequency stability of the local oscillator must be high enough to ensure that the slight change of its output frequency will not have a significant impact on the test results. If the frequency stability of the local oscillator is poor, the accuracy of the test results will be questioned. In addition, phase noise is a physical quantity that describes the degree of random fluctuation of the phase of an oscillator output signal over time. It is a key indicator to measure the short-term frequency stability of an oscillator. In the phase noise test, the phase noise of the local oscillator must be lower than that of the source to be tested to ensure that the test system can accurately capture the phase noise information of the source to be tested. If the phase noise of the local oscillator is high, it will mask the phase noise of the source to be tested, resulting in inaccurate test results. Therefore, in order to ensure the test speed and accuracy, the signal source of the first oscillator 3 and the second oscillator 8 in the present application must not be worse than the indicators of the source to be tested 1 in terms of frequency stability and phase noise. In practical applications, a local oscillator with excellent performance is usually selected as the signal source.

[0069] The present application also provides a phase noise analysis system, comprising the spread spectrum device as claimed in any one of the above, further comprising a phase noise baseband analyzer, the phase noise baseband analyzer at least comprising four signal access channels, and the four signal access channels are respectively provided with a first reference signal input port, a second reference signal input port, a first measurement signal input port and a second measurement signal input port; wherein,

[0070] Another path of the first reference signal of the first reference signal generating assembly is input into the first reference signal input port; another path of the second reference signal of the second reference signal generating assembly is input into the second reference signal input port; the first measurement signal output by the first frequency conversion assembly is input into the first measurement signal input port after processing; the second measurement signal output by the second frequency conversion assembly is input into the second measurement signal input port after processing.

[0071] The phase noise analysis system provided by the present application, as shown in Figure 5 The structure is as follows:

[0072] The to-be-tested source output from the third oscillator passes through the power divider 2, and the to-be-tested source is divided into two paths, one of which enters the first mixer 5, and the other enters the second mixer 6; the signal output from the first oscillator 3 passes through the first power divider 4, and is divided into two paths, one of which directly enters the four-channel phase noise baseband analyzer 11, and the other enters the first mixer 5; the signal output from the second oscillator 8 passes through the second power divider 7, and is divided into two paths, one of which directly enters the four-channel phase noise baseband analyzer 11, and the other enters the second mixer 6; the signal output from the first mixer 5 passes through the first low-pass filter 9, and enters the four-channel phase noise baseband analyzer 11; the signal output from the second mixer 6 passes through the second low-pass filter 10, and enters the four-channel phase noise baseband analyzer 11; the four-channel phase noise baseband analyzer 11 analyzes the four input paths to determine the phase noise.

[0073] The phase noise analysis system provided in the application has the working process as follows:

[0074] The third oscillator 1 is used to generate a to-be-tested signal, which will be processed by subsequent circuits to measure the phase noise thereof. The third power divider 2 receives the signal from the third oscillator 1, and uniformly divides the signal into two paths. The two paths of signals enter the first mixer 5 and the second mixer 6 respectively. The first oscillator 3 and the second oscillator 8 respectively divide the local oscillator signals generated thereby into two paths after passing through the first power divider 4 and the second power divider 7, one of which directly enters the four-channel phase noise baseband analyzer 11 as a reference signal; the other enters the mixer to mix with the to-be-tested signal output from the first power divider 4, so as to generate a difference frequency signal, which carries the phase information of the to-be-tested signal and the local oscillator signal. Then the difference frequency signal passes through a low-pass filter to filter out the high-frequency components in the mixer output signal, and only the low-frequency components related to the phase noise are reserved. Finally, the phase noise baseband analyzer 11 receives the signals from the first power divider 4 and the second power divider 7, and the two local oscillator signals with the high-frequency components filtered out, and determines the phase noise level of the to-be-tested source by analyzing the phase difference and spectral characteristics of the four signals.

[0075] The system provided by the application adopts the constant temperature crystal oscillator 102.4M which is suitable for testing 100M DUT; generally, the signal source indicators of the first oscillator 3 and the second oscillator 8 are not worse than the DUT indicators, so as to accelerate the testing speed. The DUT output from the third oscillator 1 is divided into two paths by the third power divider 2 and enters two frequency conversion units respectively; the reference signal output from the first oscillator 3 passes through the first power divider 4, one path of which enters the phase noise baseband analyzer as the reference source 1, and the other path of which enters the frequency conversion unit. The reference signal output from the second oscillator 8 passes through the power divider, one path of which enters the phase noise baseband analyzer as the reference source 2, and the other path of which enters the frequency conversion unit. Finally, the signal is connected to the four-channel phase noise baseband analyzer, and is respectively REF1, DUT1, DUT2 and REF2.

[0076] Please refer to Figure 6 It can be seen that the system provided by the application effectively improves the accuracy of phase noise measurement.

[0077] Finally, it should be noted that: the above examples are only used to illustrate the technical solutions of the present application, and not to limit them; although the present application has been described in detail with reference to the foregoing examples, those skilled in the art should understand that: it can still modify the technical solutions recorded in the foregoing examples, or make equivalent replacement for part of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A spread spectrum device for a phase noise analyzer, characterized in that, include: The signal processing component for the source under test, the first reference signal generation component, the second reference signal generation component, the first frequency conversion component, and the second frequency conversion component; The signal processing component of the source under test is electrically connected to the first frequency conversion component and the second frequency conversion component respectively; The signal processing component for the source under test is used to divide the incoming source under test signal into a first source under test signal and a second source under test signal, and input the first source under test signal into the first frequency converter component and the second source under test signal into the second frequency converter component; The first reference signal generation component and the first frequency conversion component are electrically connected; The first reference signal generation component is used to generate two first reference signals, one of which is input to the first frequency conversion component and the other is connected to the phase noise baseband analyzer. The first frequency conversion component is used to mix one of the first reference signals and the first source signal under test, and output a first measurement signal. The second reference signal generation component and the second frequency conversion component are electrically connected; the second reference signal generation component is used to generate two second reference signals, one of which is input to the second frequency conversion component and the other is connected to the phase noise baseband analyzer; The second frequency conversion component is used to mix the second reference signal and the second source signal under test, and output the second measurement signal.

2. The spread spectrum apparatus for a phase noise analyzer according to claim 1, characterized in that, The first reference signal generation component includes: a first oscillator (3) and a first power divider (4); The output terminal of the first oscillator (3) is connected to the input terminal of the first power divider (4); the first power divider (4) includes two output terminals that output two first reference signals, one of which is connected to the input terminal of the first frequency converter component; the other output terminal is connected to the phase noise baseband analyzer.

3. The spread spectrum device for a phase noise analyzer according to claim 2, characterized in that, The second reference signal generation component includes: a second oscillator (8) and a second power divider (7); The output of the second oscillator (8) is connected to the input of the second power divider (7); the second power divider (7) includes two outputs that output two channels of the second reference signal, one of which is connected to the input of the second frequency converter component; the other output is connected to the phase noise baseband analyzer.

4. The phase noise analyzer spread spectrum device according to claim 3, characterized in that, The signal processing component for the source under test includes: a signal input interface for the source under test and a third power divider (2). The input interface of the source under test signal is connected to the input terminal of the third power divider (2); the third power divider (2) includes two output terminals, which are used to output the first source under test signal and the second source under test signal, respectively.

5. The phase noise analyzer spread spectrum device according to claim 4, characterized in that, The signal processing component for the source under test also includes: a third oscillator (1); The third oscillator (1) is used to generate the source signal to be tested, and its output is connected to the input interface of the source signal to be tested.

6. The spread spectrum apparatus for a phase noise analyzer according to claim 5, characterized in that, The first oscillator (3), the second oscillator (8), and the third oscillator (1) are all temperature-controlled crystal oscillators.

7. The spread spectrum apparatus for a phase noise analyzer according to claim 5, characterized in that, It also includes a first low-pass filter (9); The output terminal of the first frequency converter is connected to the input terminal of the first low-pass filter (9); the output terminal of the first low-pass filter (9) is connected to the phase noise baseband analyzer.

8. The spread spectrum apparatus for a phase noise analyzer according to claim 5, characterized in that, It also includes a second low-pass filter (10); The output terminal of the second frequency converter is connected to the input terminal of the second low-pass filter (10); the output terminal of the second low-pass filter (10) is connected to the phase noise baseband analyzer.

9. A phase noise analysis system, characterized in that, The spread spectrum apparatus, as described in any one of claims 1 to 8, further includes a phase noise baseband analyzer, wherein the phase noise baseband analyzer includes at least four signal input channels, and the four signal input channels are respectively provided with a first reference signal input port, a second reference signal input port, a first measurement signal input port, and a second measurement signal input port; wherein, The other path of the first reference signal generation component is input to the first reference signal input port; Another path of the second reference signal generation component is input to the second reference signal input port; The first measurement signal output by the first frequency converter is input to the first measurement signal input port; The second measurement signal output by the second frequency converter is input to the second measurement signal input port.

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