Wire harness inspection device

By constructing a wire harness testing device using discrete components, utilizing optocouplers and LED indicators to detect wire breakage, setting up constant current circuits and resistor protection, using integrated components to fix the wires, and using diodes to clamp the wire sequence, the problems of low efficiency and poor reliability in wire harness testing are solved, achieving efficient and reliable wire harness testing.

CN224005238UActive Publication Date: 2026-03-17杭州重芯力智能装备有限公司
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-03-28
Publication Date
2026-03-17

AI Technical Summary

Technical Problem

Existing technologies for wire harness testing are inefficient, manual testing is prone to errors, microcontroller testing is prone to damage and costly, voltage comparison methods are prone to errors, microcontroller I/O port requirements are high, and maintenance is complex.

Method used

Discrete components are used to construct the detection and indication circuits. Optocouplers and LED indicators are used to indicate wire breakage. Constant current circuits and resistor protection devices are set up. Integrated components are used to fix the wires. Diodes clamp the wire sequence and eliminate the use of microcontrollers.

Benefits of technology

It improves the efficiency and reliability of wire harness testing, reduces the failure rate, simplifies the maintenance process, and ensures current stability and correct wiring sequence.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to a wire harness inspection device which comprises more than two groups of detection loops, and each group of detection loops comprises a power supply, a wiring assembly, an LED indicating lamp and a photoelectric coupler which are sequentially connected in series. The wiring assembly is used for connecting a to-be-tested wire and connecting the to-be-tested wire between the positive electrode of the power supply and the LED indicating lamp in series, and the electric signal input end of the photoelectric coupler is connected between the LED indicating lamp and the negative electrode of the power supply in series; the prompting loop comprises a prompting power supply and a prompter which are connected in series, and the electric signal output ends of all the photoelectric couplers are connected between the prompting power supply and the prompter in series, so that the labor input is reduced, the use of a single chip microcomputer is eliminated, the detection efficiency is improved, and the failure rate of the inspection device is reduced.
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Description

Technical Field

[0001] This application relates to the field of wire harness inspection technology, and in particular to a wire harness inspection device. Background Technology

[0002] In factory workshops, problems such as incorrect wiring sequence and broken wires frequently occur when manufacturing equipment with wire harnesses. If the quality and sequence of the wires are not inspected, connecting broken wire harnesses or wires with incorrect connection sequence to the equipment will cause damage. Therefore, wire inspection is crucial.

[0003] Currently, there are generally two methods for testing wire harnesses: manual testing and microcontroller-controlled circuit testing. Manual testing using a multimeter is inefficient, and workers are prone to fatigue and errors after long hours of work. Microcontroller-controlled circuit testing, such as the Chinese utility model patent titled "A Wire Harness Sequence Detection Circuit" (publication number CN221782314U), uses a microcontroller to collect the voltage signal of the wire harness under test and compare it with a preset voltage. If the voltage does not match, the LED light will not illuminate, indicating that the wiring sequence is incorrect or the wire quality is problematic.

[0004] Regarding the aforementioned existing technology, the inventor points out that this method of judging wire sequence and quality through microcontroller control has many drawbacks. First, the frequent plugging and unplugging of wires during testing leads to voltage overshoot, which easily damages the microcontroller, even with added protection devices. This also increases costs and makes it unsuitable for long-term use. Second, using microcontroller control for wire sequence inspection requires programming, which is inconvenient and increases unnecessary time expenditure. For a circuit system, fewer components mean fewer interference factors, reducing the probability of failure. Third, wire harnesses often contain a considerable number of wires, with 6 to 10 being common. Using voltage comparison for multiple sets of wires results in multiple sets of comparison voltages. Since microcontrollers are typically powered by 5V or 3.3V, further decomposing this voltage into multiple sets leads to small intervals between these sets, easily causing voltage comparison errors. Fourth, if a multi-group sequential comparison method using a single-chip microcontroller is adopted, a large number of single-chip microcontroller I / O ports are required, which places high demands on the single-chip microcontroller. Furthermore, multi-port single-chip microcontrollers often require specialized equipment for replacement when damaged, making maintenance complex. Utility Model Content

[0005] To overcome the above-mentioned shortcomings, this application provides a wire harness inspection device that reduces manual labor, eliminates the use of microcontrollers, improves inspection efficiency, and reduces the failure rate of the inspection device.

[0006] The wire harness inspection device provided in this application adopts the following technical solution:

[0007] A wire harness inspection device, comprising:

[0008] Two or more detection circuits are provided. Each detection circuit includes a power supply, a wiring assembly, an LED indicator, and an optocoupler connected in series. The wiring assembly is used to connect the wire under test and connect the wire under test in series between the positive terminal of the power supply and the LED indicator. The electrical signal input terminal of the optocoupler is connected in series between the LED indicator and the negative terminal of the power supply.

[0009] The prompting circuit includes a prompting power supply and a prompting device connected in series, and the electrical signal output terminals of all the optocouplers are connected in series between the prompting power supply and the prompting device.

[0010] By adopting the above technical solution, both the detection circuit and the indication circuit are constructed using discrete components, eliminating the use of microcontrollers or chips, reducing the inspection failure rate caused by microcontrollers, and improving detection efficiency. The detection circuit and the indication circuit are used in conjunction with an optocoupler. When the wire in one of the detection circuits is open-circuited, the corresponding LED indicator in the detection circuit is off, the indicator in the indication circuit does not provide a warning, while the LED indicators in other detection circuits are lit. Thus, the presence or absence of an open circuit in the wire under test is indicated by the on / off state of the LED indicator.

[0011] Optionally, the detection circuit further includes a constant current circuit assembly connected in series between the LED indicator and the electrical signal input terminal of the optocoupler.

[0012] By adopting the above technical solution and setting the constant current circuit components, damage to the LED indicator and optocoupler caused by excessive current in the detection circuit is avoided, thereby improving current stability.

[0013] Optionally, the detection circuit further includes a resistor connected in series between the LED indicator and the electrical signal input terminal of the optocoupler.

[0014] By adopting the above technical solution and setting the resistor, damage to the power supply caused by short circuits in other components in the detection circuit can be avoided.

[0015] Optionally, the detection loop may be configured with six or more groups.

[0016] By adopting the above technical solution and setting up more than six detection loops, it is possible to simultaneously detect more than six wires to be tested, thereby improving detection efficiency.

[0017] Optionally, the wiring assembly includes a first terminal and a second terminal, the first terminal being connected to the positive terminal of the power supply, the second terminal being connected to the LED indicator, and the wire to be tested being connected between the first terminal and the second terminal.

[0018] By adopting the above technical solution, the wiring terminals are set up to facilitate the connection of the wires to be tested, which is convenient and quick.

[0019] Optionally, the wiring harness inspection device further includes a first integrated component and a second integrated component, with all the wiring assemblies fixedly installed between the first integrated component and the second integrated component.

[0020] By adopting the above technical solution, a first integrated component and a second integrated component are set up to integrate the fixed wiring assembly, which avoids the wire harness being scattered and improves the integration level.

[0021] Optionally, all the wiring assemblies are arranged linearly between the first integration and the second integration.

[0022] By adopting the above technical solution, the wiring assembly is linearly arranged between the first and second integrated components, which facilitates the differentiation, disassembly, and repair of the wires under test.

[0023] Optionally, all the power supplies are arranged linearly and in the same order as the wiring assemblies between the first and second integrated components. Along the sorting direction, a diode is connected between the positive terminal of the previous power supply and the negative terminal of the next power supply, and all the diodes face the same direction.

[0024] By adopting the above technical solution, the clamping function of the diode is used to clamp the circuit where the wires are connected in the wrong order, so that the LED indicator in the detection circuit where the wires are connected in the wrong order and are later in the sequence is turned off, thereby indicating the detection circuit where the wires under test are connected in the wrong order.

[0025] In summary, this application includes at least one of the following beneficial technical effects:

[0026] The testing device is built using discrete components, eliminating the use of microcontrollers or chips, reducing the failure rate and improving testing efficiency. Additionally, a diode clamping and bypass circuit for incorrect wiring is implemented, ensuring that the LED indicator in the detection circuit for incorrect wire sequence is off, thus indicating the incorrect wiring sequence and facilitating troubleshooting. Attached Figure Description

[0027] Figure 1 This is a circuit diagram of the wire harness inspection device in Embodiment 1.

[0028] Figure 2 This is a circuit diagram of an optocoupler.

[0029] Figure 3 This is a circuit diagram of the wire harness inspection device in Embodiment 2.

[0030] Figure 4 This is a circuit diagram of the wire harness inspection device in Embodiment 3.

[0031] Figure 5 This is a circuit diagram of the wire harness inspection device in Embodiment 4.

[0032] Figure 6 This is a circuit diagram of the wire harness inspection device in Example 5.

[0033] Figure 7 This is a circuit diagram of the wire harness inspection device in Example 6.

[0034] Figure 8 This is a schematic diagram of the structure of the first integrated component and the second integrated component connecting the wire to be tested in Embodiment Six.

[0035] Figure 9 This is a circuit diagram showing the connection of diodes between power supplies in Embodiment 7.

[0036] Figure 10 This is a circuit diagram in Example 7 showing the incorrect connection sequence of the wires under test in the first and second circuits, omitting the third to sixth circuits, constant current circuit components, and resistors.

[0037] Explanation of reference numerals in the attached figures:

[0038] 100. Power supply; 200. Cable under test; 300. Wiring assembly; 301. First integrated component; 302. Second integrated component; 303. First terminal block; 304. Second terminal block; 400. LED indicator; 500. Optocoupler; 600. Indicator; 700. Indicator power supply; 800. Constant current circuit assembly; 900. Resistor. Detailed Implementation

[0039] The present application will be further described in detail below with reference to the accompanying drawings.

[0040] This application discloses a wire harness inspection device, including an inspection circuit and a prompting circuit. The inspection circuit comprises two or more sets. Each inspection circuit includes a power supply 100, a wiring assembly 300, an LED indicator 400, and an optocoupler 500 connected in series. The wiring assembly 300 connects the wire under test 200 and connects the wire under test 200 in series between the positive terminal of the power supply 100 and the LED indicator 400. The electrical signal input terminal of the optocoupler 500 is connected in series between the LED indicator 400 and the negative terminal of the power supply 100. The prompting circuit includes a prompting power supply 700 and a prompter 600 connected in series. The electrical signal input terminals of all optocouplers 500 are connected in series between the prompting power supply 700 and the prompter 600. The entire inspection circuit is constructed using discrete components, eliminating the need for microcontrollers and chips, thus reducing the failure rate associated with microcontrollers. Specific embodiments are disclosed below. Example 1:

[0041] Reference Figure 1 In this embodiment, two detection circuits are provided. For ease of explanation, the positive terminal of the power supply 100 in the first detection circuit is called V1 terminal, and the negative terminal grounded is called GND1 terminal. The positive terminal of the power supply 100 in the second detection circuit is called V2 terminal, and the negative terminal grounded is called GND2 terminal.

[0042] The optocoupler 500 is an electro-optical-electrical conversion device that transmits electrical signals using light as a medium. The optocoupler 500 has an electrical signal input circuit and an electrical signal output circuit, and the electrical signal input circuit and the electrical signal output circuit communicate via optical signals. (Refer to...) Figure 2 U1 is the current inlet of the electrical signal input circuit of the optocoupler 500, U2 is the current outlet of the electrical signal input circuit of the optocoupler 500, U3 is the current inlet of the electrical signal output circuit of the optocoupler 500, and U4 is the current outlet of the electrical signal output circuit of the optocoupler 500. Terminals U1 and U2 are connected in series between the LED indicator 400 and the negative terminal of the power supply 100, while terminals U3 and U4 are connected in series between the indicator power supply 700 and the indicator 600. When no current flows through the electrical signal input circuit of the optocoupler 500, there is also no current in the electrical signal output circuit of the optocoupler 500, which is equivalent to the electrical signal output circuit of the optocoupler 500 being in an open-circuit state.

[0043] The wiring assembly 300 includes a first terminal block 303 and a second terminal block 304. The first terminal block 303 is connected to the positive terminal of the power supply 100, and the second terminal block 304 is connected to the LED indicator 400. The wire under test 200 is connected between the first terminal block 303 and the second terminal block 304. The arrangement of the first terminal block 303 and the second terminal block 304 facilitates the installation and removal of the wire under test 200.

[0044] The implementation principle of Example 1 is as follows:

[0045] When the test wires 200 in both detection loops are intact and in good condition, both detection loops are closed, and the LED indicator lights 400 in both detection loops are lit. At the same time, the optocouplers 500 in both detection loops are in working condition, that is, the electrical signal output circuit of the optocoupler 500 is in a connected state. At this time, the indication circuit is in a closed state, and the indicator 600 is activated. The indicator 600 is generally a buzzer.

[0046] When the test cable 200 in the first detection loop is open-circuited, while the test cable 200 in the second detection loop is intact, the first detection loop is in an open-circuit state, and the LED indicator 400 in the first detection loop is off, while the LED indicator 400 in the second detection loop is lit. The on / off state of the LED indicator 400 is used to determine whether the test cable 200 in the corresponding detection loop is open-circuited. Simultaneously, because the first detection loop is open-circuited, no current flows through the electrical signal input terminal of the optocoupler 500 in the first detection loop, and at the same time, no current flows through the electrical signal output terminal of the optocoupler 500 in the first detection loop. Therefore, the indication circuit is in an open-circuit state, and the indicator 600 does not operate.

[0047] Similarly, when the test cable 200 in the second detection circuit is open and the test cable 200 in the first detection circuit is intact and in good condition, the LED indicator 400 in the first detection circuit will light up, the LED indicator 400 in the second detection circuit will be off, and the indicator 600 will not work.

[0048] Similarly, when the test wire 200 in both detection circuits is open, the LED indicator 400 in both detection circuits will be off, and the indicator 600 will not work.

[0049] Therefore, as long as the cable under test 200 is in an open circuit state, the LED indicator 400 in the corresponding detection circuit connected to the cable will be off, and the indicator 600 will not work, thereby quickly identifying the problematic cable under test 200 and improving detection efficiency. Example 2:

[0050] Reference Figure 3The difference from Embodiment 1 is that the detection circuit also includes a constant current circuit component 800, which is connected in series between the LED indicator 400 and the electrical signal input terminal of the optocoupler 500. A constant current circuit is an electronic circuit capable of stably providing a constant current output. Its core function is to maintain the stability of the output current under load changes or power fluctuations, ensuring the operational stability of the driven device. In this embodiment, a commonly used constant current circuit can be used in the constant current circuit component 800. The constant current circuit component 800 can protect the LED indicator 400 and the optocoupler 500 under current fluctuations. Example 3:

[0051] Reference Figure 4 The difference from Embodiment 1 is that the detection circuit also includes a resistor 900, which is connected in series between the LED indicator 400 and the electrical signal input terminal of the optocoupler 500. In this embodiment, the resistor 900 is provided to prevent the power supply 100 from burning out when other components in the detection circuit are short-circuited. Example 4:

[0052] Reference Figure 5 This embodiment is a combination of Embodiments 2 and 3, namely, a constant current circuit component 800 and a resistor 900 are set in the detection circuit. Specifically, the resistor 900 is connected in series between the constant current circuit component 800 and the LED indicator 400 to improve the stability and safety of the current in the detection circuit. Example 5:

[0053] Reference Figure 6 The difference from Embodiment 1 is that in this embodiment, six sets of detection circuits are set, which can simultaneously perform open circuit detection on six wires 200 to be tested, thereby further improving the detection efficiency. Example 6:

[0054] The difference from Embodiment 1 is that this embodiment also includes a first integrated component 301 and a second integrated component 302, with all wiring assemblies 300 fixedly installed between the first integrated component 301 and the second integrated component 302. The arrangement of the first integrated component 301 and the second integrated component 302 is used to integrate the wiring assemblies 300 in all detection circuits, thereby integrating the test wires 200 connected in the wiring assemblies 300, avoiding scattering, and facilitating wire management and disassembly.

[0055] Reference Figure 7 and Figure 8 Based on the six sets of detection circuits in Embodiment 5, a first integrated component 301 and a second integrated component 302 are provided, and the wiring components 300 in the six sets of detection circuits are all fixed between the first integrated component 301 and the second integrated component 302.

[0056] Furthermore, in a more preferred embodiment, all wiring components 300 are linearly arranged between the first integrated component 301 and the second integrated component 302 to facilitate numbering and management of each group of detection circuits. For example, in this embodiment, along the linear arrangement direction of the wiring components 300, the six groups of detection circuits are respectively referred to as the first group of circuits, the second group of circuits, the third group of circuits, the fourth group of circuits, the fifth group of circuits, and the sixth group of circuits. Example 7:

[0057] Reference Figure 9 Based on Embodiment Six, all power supplies 100 are linearly arranged in the same order as the wiring assembly 300 between the first integrated component 301 and the second integrated component 302. Along the sorting direction, a diode is connected between the positive terminal of the previous power supply 100 and the negative terminal of the next power supply 100, and all diodes face the same direction. It should be noted that in this embodiment, the linear arrangement of all power supplies 100 in the same order as the wiring sequence between the first integrated component 301 and the second integrated component 302 refers to the numbering order, not the spatial order.

[0058] Specifically, in conjunction with the appendix Figure 8 and attached Figure 9 In this embodiment, a diode is connected between the positive terminal of the power supply 100 in the first circuit and the negative terminal of the power supply 100 in the second circuit, with the diode extending from the positive terminal of the power supply 100 in the first circuit toward the negative terminal of the power supply 100 in the second circuit.

[0059] A diode is connected between the positive terminal of the power supply 100 in the second circuit and the negative terminal of the power supply 100 in the third circuit, with the diode extending from the positive terminal of the power supply 100 in the second circuit toward the negative terminal of the power supply 100 in the third circuit.

[0060] A diode is connected between the positive terminal of the power supply 100 in the third circuit and the negative terminal of the power supply 100 in the fourth circuit. The diode extends from the positive terminal of the power supply 100 in the third circuit to the negative terminal of the power supply 100 in the fourth circuit.

[0061] A diode is connected between the positive terminal of the power supply 100 in the fourth circuit and the negative terminal of the power supply 100 in the fifth circuit, with the diode extending from the positive terminal of the power supply 100 in the fourth circuit toward the negative terminal of the power supply 100 in the fifth circuit.

[0062] A diode is connected between the positive terminal of the power supply 100 in the fifth circuit and the negative terminal of the power supply 100 in the sixth circuit. The diode extends from the positive terminal of the power supply 100 in the fifth circuit to the negative terminal of the power supply 100 in the sixth circuit.

[0063] By utilizing the clamping function of diodes, the circuit with incorrect wire sequence is clamped, causing the LED indicator 400 in the detection circuit with incorrect wire sequence and later in the sequence to be in an off state, thereby indicating the detection circuit where the wire 200 under test is incorrectly connected.

[0064] Specifically, refer to Figure 10 When the test wire 200 in the first circuit and the test wire 200 in the second circuit are connected to each other, the diode between the positive terminal of the power supply 100 in the first circuit and the negative terminal of the power supply 100 in the second circuit can clamp the voltage in the second circuit, so that no current flows through the second circuit. At this time, the LED indicator 400 in the second circuit is off, and the indicator 600 in the indication circuit is not working, while the LED indicator 400 in the first circuit is lit.

[0065] Similarly, when the test cable 200 in the second circuit is connected incorrectly to the test cable 200 in the third circuit, the LED indicator 400 in the third circuit will be off. When the test cable 200 in the third circuit is connected incorrectly to the test cable 200 in the fourth circuit, the LED indicator 400 in the fourth circuit will be off. When the test cable 200 in the fourth circuit is connected incorrectly to the test cable 200 in the fifth circuit, the LED indicator 400 in the fifth circuit will be off. When the test cable 200 in the fifth circuit is connected incorrectly to the test cable 200 in the sixth circuit, the LED indicator 400 in the sixth circuit will be off.

[0066] It should be noted that after the integrated component is used to integrate the wiring assembly 300, the test wires 200 between two adjacent sets of detection circuits are prone to being connected incorrectly, while the test wires 200 between two sets of detection circuits in different groups have a low probability of being connected incorrectly. Therefore, it is not necessary to consider the case of incorrect connection between different groups.

[0067] Therefore, in this embodiment, as long as the LED indicator 400 in one of the detection circuits is off, the indicator 600 will not work, and it can be determined that the wire 200 under test in that detection circuit has a problem of open circuit or incorrect connection, and needs to be repaired immediately.

[0068] The above are all preferred embodiments of this application, and are not intended to limit the scope of protection of this application. Therefore, all equivalent changes made in accordance with the structure, shape and principle of this application should be covered within the scope of protection of this application.

Claims

1. A wiring harness inspection apparatus characterized by comprising: The application relates to a wire harness inspection device. The detection circuit comprises a power supply (100), a wiring assembly (300), an LED indicator (400) and a photoelectric coupler (500) connected in series, the wiring assembly (300) is used for connecting a wire to be tested (200) and connecting the wire to be tested (200) in series between the positive pole of the power supply (100) and the LED indicator (400), and the electrical signal input end of the photoelectric coupler (500) is connected in series between the LED indicator (400) and the negative pole of the power supply (100). The prompting circuit comprises a prompting power supply (700) and a prompter (600) connected in series, and the electrical signal output end of all the photoelectric couplers (500) is connected in series between the prompting power supply (700) and the prompter (600).

2. The wiring harness inspection apparatus according to claim 1, characterized by The detection circuit further comprises a constant current circuit assembly (800) connected in series between the LED indicator (400) and the electrical signal input end of the photoelectric coupler (500).

3. The wiring harness inspection apparatus according to claim 1, characterized by, The detection circuit further comprises a resistor (900) connected in series between the LED indicator (400) and the electrical signal input end of the photoelectric coupler (500).

4. The wiring harness inspection apparatus according to claim 1, characterized by The detection circuit comprises six or more groups.

5. The wiring harness inspection apparatus according to claim 1, characterized by The wiring assembly (300) comprises a first wiring terminal (303) and a second wiring terminal (304), the first wiring terminal (303) is connected with the positive pole of the power supply (100), the second wiring terminal (304) is connected with the LED indicator (400), and the wire to be tested (200) is connected between the first wiring terminal (303) and the second wiring terminal (304).

6. The wiring harness inspection apparatus according to any one of claims 1 to 5, characterized by The wire harness inspection device further comprises a first integrated part (301) and a second integrated part (302), and all the wiring assemblies (300) are fixedly installed between the first integrated part (301) and the second integrated part (302).

7. The wiring harness inspection apparatus according to claim 6, characterized by All the wiring assemblies (300) are linearly arranged between the first integrated part (301) and the second integrated part (302).

8. The wiring harness inspection apparatus according to claim 7, characterized by All the power supplies (100) are linearly arranged and arranged in the same order as the wiring assemblies (300) arranged between the first integrated part (301) and the second integrated part (302), a diode is connected between the positive pole of a previous power supply (100) and the negative pole of a next power supply (100) in the arranging direction, and all the diodes are oriented in the same direction.

Citation Information

Patent Citations

  • Wire harness sequence detection circuit

    CN221782314U