Integrated self-power-off SSD test assembly

By using an integrated self-power-off SSD testing component with multiple main control ports and a card-mounting component structure, the problems of easy loss of screw connections and inconvenient fixation in existing technologies are solved, enabling rapid fixation and testing of SSDs and improving operational efficiency.

CN224067422UActive Publication Date: 2026-03-31SHENZHEN XINKERUI ELECTRONIC TECHNOLOGY CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-03-20
Publication Date
2026-03-31

AI Technical Summary

Technical Problem

In current SSD testing processes, screw connections are prone to loss, and the connection of the fixing structure is severely tested, leading to inconvenience in operation.

Method used

An integrated self-power-off SSD testing component is designed, which adopts a structure with multiple main control ports and docking slots, combined with a locking component including a locking frame, locking springs and a retaining plate. It connects to a computer via a USB 3.0 extension cable, enabling simultaneous testing of 8 SSDs, and is equipped with a power-off protection structure to simplify operation.

Benefits of technology

It enables rapid mounting and testing of SSDs, reduces operation steps, improves testing efficiency, is small in size for easy maintenance, has an automatic power-off function, and is quick and convenient to operate.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of SSD test assemblies, in particular to an integrated self-power-off SSD test assembly which comprises a card opening device, a main control port is arranged at the front end of the card opening device, a butt joint groove and clamping assemblies are arranged at the bottom end of the main control port, the clamping assemblies are arranged at the upper end and the lower end of the butt joint groove, and each clamping assembly comprises a clamping frame and a clamping reed. The card opening device comprises a clamping frame, rotating grooves are formed in the two sides of the clamping frame, buckle plates are fixed to the two sides of the top end of the clamping frame, clamping reeds are fixed to the inner sides of each set of buckle plates and penetrate through the rotating grooves, clamping rods are fixed to the middles of the two sides of the clamping frame, and a power-off protection structure is arranged on the outer side of the card opening device and connected with a computer through a USB3.0 extension line. Eight SSDs can be tested at a time, the size is small, operation and maintenance are convenient, after a power-off protection structure is additionally arranged and a self-power-off function is achieved, production operation of an operator can be achieved without using a switch to control power-on and power-off and plugging and unplugging of the SSDs, and operation is convenient and rapid.
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Description

TECHNICAL FIELD

[0001] The utility model relates to SSD test assembly technical field, concretely relates to integrated self power-off SSD test assembly. BACKGROUND

[0002] After the SMT process, the hard disk needs to be tested, BIT tested, and opened, and the hard disk opening is usually a process of initializing and configuring the hard disk through specific software, so that it can work normally and be recognized by the computer system.

[0003] The existing solid state disk itself needs to be inserted into the fixed terminal connected to the detection box during testing, or the worker inserts the screw into the hole on the left side of the hard disk, rotates the screw manually, and fixes the hard disk. The two methods, due to the small size of the screw, need to use a screwdriver during installation, and the small screw is easy to lose. The other method only uses the fixed connection, which tests the structure connection. UTILITY MODEL CONTENT

[0004] Technical problem

[0005] To solve the above-mentioned shortcomings of the prior art, the utility model provides an integrated self power-off SSD test assembly, which can effectively solve the inconvenience caused by the bolt connection and the fixed terminal connection in the prior art.

[0006] Technical scheme

[0007] To achieve the above purpose, the utility model realizes the following technical scheme:

[0008] The utility model provides an integrated self power-off SSD test assembly, which comprises a card opening device, the front end of the card opening device is provided with a main control port, the bottom end of the main control port is provided with a docking groove and a card setting assembly, the card setting assembly is arranged at the upper and lower ends of the docking groove, the card setting assembly comprises a card setting frame and a clamping spring piece, rotating grooves are formed in the two sides of the card setting frame, clamping spring pieces are fixed on the inner sides of each group of the clamping plates, and the clamping spring pieces pass through the rotating grooves, clamping rods are fixed on the middle parts of the two sides of the card setting frame, and a power-off protection structure is arranged on the outside of the card opening device.

[0009] Further, the front and rear sides of the card setting frame are frame structures without faces, and the main control port, the docking groove and the card setting assembly are equally provided with multiple groups.

[0010] Further, the middle part of the buckle plate on both sides is convex to the inner side, and the buckle plate is a plastic sheet structure with elasticity.

[0011] Further, the main control port is a SATA2.5 structure, and the main control port is a USB bridge control, connected with a computer through a USB3.0 extension line, and the other end of the power-off protection structure is electrically connected with the computer.

[0012] Further, the inner top end of the buckle plate and the top end of the clamping spring plate are both inclined surface structures, the clamping spring plate is an arc structure, and the tail end of the clamping spring plate is provided with a buckle hook structure.

[0013] Further, the inner height of the clamping frame is flat with the height of the docking groove.

[0014] Further, each group of docking grooves is symmetrically arranged at the bottom of the main control port.

[0015] Beneficial effects

[0016] Compared with the known prior art, the technical scheme provided by the utility model has the following beneficial effects:

[0017] The utility model discloses a plurality of main control ports and docking groove structures are set up, and eight SATA2.5 USB bridge controls are integrated, connected with a computer through a USB3.0 extension line, so that eight SSD discs can be tested at a time, and the utility model is small in size, convenient to operate and maintain, and through the addition of the power-off protection structure, the operator can not use the switch to control the on-off power after realizing the self-power-off function, and the SSD can be inserted and pulled out, which is convenient and rapid.

[0018] In the device, the two ends of the SSD disc are fixedly connected with the clamping assembly, the top end of the clamping spring plate is outwardly folded and deflected through the inclined surface structure of the top end until the SSD disc is completely inserted between the two buckle plates, the two buckle plate structures can be clamped to clamp the SSD disc in the clamping frame, the clamping spring plate structure rotates in the rotating groove, extends, and the buckle hook structure at the tail end is clamped with the clamping rod to realize fixation, or the clamping spring plate can be inwardly pressed to realize the clamping function of the SSD disc. BRIEF DESCRIPTION OF DRAWINGS

[0019] In order to more clearly illustrate the technical solutions of the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings described below are only some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained from these drawings without creative labor.

[0020] Figure 1 The structure of the present application is shown in the figure.

[0021] Figure 2 The structure of the present application is shown in the figure.

[0022] Figure 3 The structure of the present application is shown in the figure.

[0023] Figure 4 The structure of the present application is shown in the figure.

[0024] The numbers in the figure represent: 1, card opening device; 2, main control port; 3, docking groove; 4, card setting assembly; 41, card setting frame; 42, rotating groove; 43, buckle plate; 44, card spring; 45, card setting rod; 5, power-off protection structure. DETAILED DESCRIPTION

[0025] In order to make the purpose, technical scheme and advantages of the embodiments of the present application more clear, the following will combine the drawings in the embodiments of the present application to clearly and completely describe the technical scheme in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of the present application.

[0026] The present application will be further described below in conjunction with the embodiments.

[0027] Embodiment: An integrated self-power-off SSD test assembly, referring to the attached Figure 1 -attached Figure 4, including the card opening device 1, the front end of the card opening device 1 is provided with the master control port 2, the bottom end of the master control port 2 is provided with the docking groove 3 and the card setting assembly 4, each group of docking grooves 4 is symmetrically arranged at the bottom of the master control 2; the card setting assembly 4 is arranged at the upper and lower ends of the docking groove 3, the card setting assembly 4 comprises a card setting frame 41 and a card spring piece 44, the two sides of the card setting frame 41 are provided with rotating grooves 42, the top end of the card setting frame 41 is fixed with buckling plates 43 on both sides, the inner side of each group of buckling plates 43 is fixed with the card spring piece 44, and the card spring piece 44 passes through the rotating groove 42, the middle part of the two sides of the card setting frame 41 is fixed with a card setting rod 45, and the outer side of the card opening device 1 is provided with a power-off protection structure 5;

[0028] The front and rear sides of the card setting frame 41 are frame structures without faces, and the master control port 2, the docking groove 3 and the card setting assembly 4 are equally provided with multiple groups; through the multiple groups of master control ports 1 and docking grooves 3, eight SATA2.5 to USB bridge controls are integrated, a USB3.0 extension line is connected with a computer, eight SSD disks can be tested at a time, the volume is small, and operation and maintenance are convenient; after the power-off protection structure 5 is added to realize the self-power-off function, the operator can no longer use the switch to control the on-off power, and the plug-in and plug-out of the SSD can be realized, which is convenient and rapid.

[0029] The middle part of the buckling plate 43 on both sides is protruded inward, and the buckling plate 43 is a plastic sheet structure with elasticity; the master control port 2 is a SATA2.5 structure, the master control port 2 is a USB bridge control, a USB3.0 extension line is connected with a computer, and the other end of the power-off protection structure 5 is electrically connected with the computer; the inner top end of the buckling plate 43 and the top end of the card spring piece 44 are inclined surface structures, the card spring piece 44 is an arc structure, and the tail end of the card spring piece 44 is provided with a buckling hook structure; the internal height of the card setting frame 41 is flat with the height of the docking groove 3; in the device, the two ends of the SSD disk are fixedly connected with the card setting assembly 4 through the card setting assembly 4 structure, in the card setting assembly 4, the SSD disk is inserted and pressed along the middle part of the card setting frame 41 to the bottom end, the top end of the card spring piece 44 can be folded and deflected outward through the top end inclined surface structure, until the SSD disk is completely inserted between the two groups of buckling plates 43, the two groups of buckling plates 43 can be clamped to fix the SSD disk in the card setting frame 41, the card spring piece 44 is rotated in the rotating groove 42, is stretched out, the buckling hook structure at the tail end is hooked with the card setting rod 45 to realize fixation, or is not hooked, and the clamping function of the SSD disk can also be realized through the inward extrusion of the card spring piece 44.

[0030] The above examples are only used to illustrate the technical solutions of the present application, and are not limiting; although the present application has been described in detail with reference to the foregoing examples, those skilled in the art should understand that the technical solutions recorded in the foregoing examples can still be modified, or some technical features therein can be replaced equivalently; and these modifications or replacements will not cause the essence of the corresponding technical solutions to deviate from the protection scope of the technical solutions of the embodiments of the present application.

Claims

1. An integrated self-power-off (SSD) test assembly, comprising: Including open card equipment (1), the front end of the open card equipment (1) is provided with master control mouth (2), the bottom end of the master control mouth (2) is provided with docking groove (3) and card set component (4), the card set component (4) is arranged in the upper and lower ends of docking groove (3), the card set component (4) includes card set frame (41) and card spring leaf (44), the both sides of the card set frame (41) are provided with rotating groove (42), the both sides of the top of the card set frame (41) are fixed with buckle plate (43), the inner side of each group of buckle plate (43) is fixed with card spring leaf (44), and the card spring leaf (44) passes through rotating groove (42), the middle part of the both sides of the card set frame (41) is fixed with card set rod (45), the outside of the open card equipment (1) is provided with power-off protection structure (5).

2. The integrated self- power-off SSD test assembly of claim 1, wherein, The front and rear sides of the card set frame (41) are frame structures without faces, and the master control mouth (2), the docking groove (3) and the card set component (4) are all provided with multiple groups at equal intervals.

3. The integrated self- power-off SSD test assembly of claim 1, wherein, The middle part of the buckle plate (43) on both sides is convex to the inner side, and the buckle plate (43) is a plastic sheet structure with elasticity.

4. The integrated self- power-off SSD test assembly of claim 1, wherein, The master control mouth (2) is a SATA2.5 structure, and the master control mouth (2) is converted into a USB bridge master control, connected with a computer through a USB3.0 extension line, and the other end of the power-off protection structure (5) is electrically connected with the outside computer.

5. The integrated self- power-off SSD test assembly of claim 4, wherein, The inner top end of the buckle plate (43) and the top end of the card spring leaf (44) are both inclined surface structures, the card spring leaf (44) is an arc structure, and the tail end of the card spring leaf (44) is provided with a back hook structure.

6. The integrated self- power-off SSD test assembly of claim 1, wherein, The internal height of the card set frame (41) is level with the height of the docking groove (3).

7. The integrated self- power-off SSD test assembly of claim 1, wherein, Each group of the docking groove (3) is symmetrically arranged at the bottom of the master control mouth (2).