Microprogrammed control unit (MCU) chip test experiment device

Abstract

The utility model discloses an MCU chip test experiment device, which relates to the field of MCU chip test experiments and comprises a replaceable MCU chip test circuit, a crystal oscillator circuit, a power supply and switch circuit, an analog electricity / digital electricity switching circuit, an NRST test circuit, a liquid crystal control circuit, a serial port test circuit, an I2C test circuit, an ADC test circuit and a GPIO characteristic test circuit. The output end of the replaceable MCU chip test circuit is electrically connected with the input ends of the crystal oscillator circuit, the power supply and switch circuit, the analog / digital power switching circuit, the NRST test circuit, the serial port test circuit, the I2C test circuit, the ADC test circuit and the GPIO characteristic test circuit. The MCU chip test experiment device is comprehensive in test function, integrates various test circuits, can realize comprehensive test of the MCU chip, is wide in application range, and can test MCU chips of various models due to the design that the MCU chip test circuits can be replaced.

Description

Technical Field

[0001] This utility model relates to the field of MCU chip testing experiments, and in particular to an MCU chip testing experimental device. Background Technology

[0002] With the advancement of technology, MCU chips are widely used in various electronic devices and systems due to their advantages such as small size, low power consumption, and low cost. MCU chips have broad application prospects and huge market potential in the field of microelectronic systems. However, due to the wide variety of MCU chips, different models of MCU chips have different functions and characteristics. Therefore, it is particularly important to conduct comprehensive and accurate testing of MCU chips. Existing testing methods not only test only a single chip model, but also have low resource utilization and are difficult to meet the growing testing needs.

[0003] Therefore, it is necessary to propose an experimental device for testing MCU chips to solve the above problems. Utility Model Content

[0004] The main purpose of this invention is to provide an experimental device for testing MCU chips, which can effectively solve the problems in the background art.

[0005] To achieve the above objectives, the technical solution adopted by this utility model is as follows:

[0006] An MCU chip testing experimental device includes a replaceable MCU chip testing circuit, a crystal oscillator circuit, a power supply and switching circuit, an analog-to-digital switching circuit, an NRST testing circuit, a liquid crystal control circuit, a serial port testing circuit, an I2C testing circuit, an ADC testing circuit, and a GPIO characteristic testing circuit. The output terminal of the replaceable MCU chip testing circuit is electrically connected to the input terminals of the crystal oscillator circuit, the power supply and switching circuit, the analog-to-digital switching circuit, the NRST testing circuit, the serial port testing circuit, the I2C testing circuit, the ADC testing circuit, and the GPIO characteristic testing circuit. The output terminal of the liquid crystal control circuit is electrically connected to the input terminals of the power supply and switching circuit, the analog-to-digital switching circuit, and the NRST testing circuit.

[0007] Preferably, the replaceable MCU chip test circuit includes a replaceable MCU chip test socket for replacing different types of MCU chips. The replaceable MCU chip test circuit is used to bring out each pin of the MCU chip for connection to a crystal oscillator circuit, power supply and switching circuit, analog-to-digital switching circuit, NRST test circuit, serial port test circuit, I2C test circuit, ADC test circuit and GPIO characteristic test circuit.

[0008] Preferably, the crystal oscillator circuit is used to provide a stable clock signal for the MCU chip to ensure the accuracy of the test results, and the crystal oscillator circuit is connected to the crystal pin of the replaceable MCU chip test circuit.

[0009] Preferably, the power supply and switching circuit is used to provide a stable power supply. The power supply and switching circuit includes two terminals connected to the source meter and two relay control circuits. The first terminal of the two terminals connected to the source meter is VDD_IN and VSS_IN, with VDD_IN connected to the positive input terminal of the source meter and VSS_IN connected to the negative input terminal of the source meter. The source meter is used to provide a precise power input. The second terminal of the two terminals connected to the source meter is VDDA_IN and VSSA_IN, with VDDA_IN connected to the positive input terminal of the source meter and VSSA_IN connected to the negative input terminal of the source meter. VDD is a digital power supply, and VDDA is an analog power supply. The digital power supply VDD and the analog power supply VDDA are supplied with power input by the same source meter.

[0010] The first relay control circuit in the two-way relay control circuit is used to control the inputs of VDD and VSS. When the source meter is selected for power supply via the LCD screen, the positive input of the source meter is connected to the VDD pin of the MCU chip, and the negative input of the source meter is connected to the VSS pin of the MCU chip. The second relay control circuit in the two-way relay control circuit controls the inputs of VDDA and VSSA. When the source meter is selected for power supply via the LCD screen, the positive input of the source meter is connected to the VDDA pin of the MCU chip, and the negative input of the source meter is connected to the VSSA pin of the MCU chip.

[0011] Preferably, the analog-to-digital switching circuit is used to implement the analog power supply VDDA and the digital power supply VDD of the analog MCU chip. The analog-to-digital switching circuit is powered separately by two source meters. It includes a relay switching circuit, which is controlled by an LCD control circuit. The LCD control circuit includes a VDDA independent button, which is used to disconnect the analog power supply VDDA from the digital power supply VDD, so that a separate power supply is provided by the second source meter.

[0012] Preferably, the NRST test circuit is used to test the reset function of the MCU chip to ensure that the MCU chip can reset normally under abnormal conditions. The NRST test circuit includes a second relay switching circuit for switching the input of the reset signal. The second relay switching circuit is controlled by the liquid crystal control circuit. When the liquid crystal control circuit includes a regular NRST button and an independent NRST button, the regular NRST button is used to send the reset signal by the regular reset circuit, and the independent NRST button is used to send the reset signal by the signal generator.

[0013] Preferably, the liquid crystal control circuit includes a liquid crystal screen and a signal conversion circuit. The liquid crystal control circuit is used to switch and control the display content of the liquid crystal screen, so that users can view test data and results in real time. The liquid crystal screen includes three button selections: the first button is for turning the power supply switch on and off, and is used to control two relays of the power supply and switching circuit; the second button is for simulating the power supply status, including a VDDA independent button and a VDDA integrated button, and is used to control one relay of the analog-to-digital discrete circuit; the third button is for resetting the circuit status, including an NRST normal button and an NRST independent button, and is used to control one relay of the NRST test circuit.

[0014] Preferably, the serial port test circuit is used to test the serial communication function of the MCU chip to ensure that it can communicate with other devices via serial port; the I2C test circuit is used to test the I2C communication interface function of the MCU chip; the ADC test circuit is used to test the analog-to-digital conversion function of the MCU chip to ensure that it can accurately convert analog signals into digital signals; and the GPIO characteristic test circuit is used to test the general-purpose input / output interface function of the MCU chip to ensure that it can communicate normally with external devices.

[0015] Compared with the prior art, the present invention has the following beneficial effects:

[0016] 1. This MCU chip testing experimental device is easy to operate. Users can easily select test items and view test results through the LCD screen. Using a source meter as the input signal unit and output measurement unit, the test accuracy is higher and more reliable, and it can observe subtle changes caused by circuit changes.

[0017] 2. This MCU chip testing experimental device has comprehensive testing functions, integrates multiple testing circuits, and can realize comprehensive testing of MCU chips. It has a wide range of applications, and the design of replaceable MCU chip testing circuits allows the device to test various models of MCU chips.

[0018] 3. This MCU chip testing experimental device is compatible with multiple chips through a replaceable MCU chip testing circuit and uses a digital source meter as a measurement device. It can perform fast and accurate tests on multiple items, including MCU power consumption test, MCU analog power supply discrete test, NRST reset circuit characteristic test, GPIO test, built-in ADC module test, and integrated USART communication. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the overall structure of this utility model;

[0020] Figure 2 This is the PCB diagram of this utility model;

[0021] Figure 3 This is a test flowchart for this utility model;

[0022] Figure 4 This is the circuit diagram of this utility model;

[0023] Figure 5 This is the circuit diagram of this utility model;

[0024] Figure 6 This is the circuit diagram of this utility model.

[0025] In the diagram: 1. Replaceable MCU chip test circuit; 2. Crystal oscillator circuit; 3. Power supply and switching circuit; 4. Analog / digital switching circuit; 5. NRST test circuit; 6. LCD control circuit; 7. Serial port test circuit; 8. I2C test circuit; 9. ADC test circuit; 10. GPIO characteristic test circuit. Detailed Implementation

[0026] To make the technical means, creative features, objectives and effects of this utility model easier to understand, the present utility model will be further described below in conjunction with specific embodiments.

[0027] like Figures 1-3 As shown, an MCU chip testing experimental device includes a replaceable MCU chip testing circuit 1, a crystal oscillator circuit 2, a power supply and switching circuit 3, an analog-to-digital switching circuit 4, an NRST testing circuit 5, a liquid crystal control circuit 6, a serial port testing circuit 7, an I2C testing circuit 8, an ADC testing circuit 9, and a GPIO characteristic testing circuit 10. The output terminal of the replaceable MCU chip testing circuit 1 is electrically connected to the input terminals of the crystal oscillator circuit 2, the power supply and switching circuit 3, the analog-to-digital switching circuit 4, the NRST testing circuit 5, the serial port testing circuit 7, the I2C testing circuit 8, the ADC testing circuit 9, and the GPIO characteristic testing circuit 10. The output terminal of the liquid crystal control circuit 6 is electrically connected to the input terminals of the power supply and switching circuit 3, the analog-to-digital switching circuit 4, and the NRST testing circuit 5.

[0028] The replaceable MCU chip test circuit 1 includes a test chip socket for replacing different types of MCU chips. The replaceable MCU chip test circuit 1 is used to bring out the pins of the MCU chip and connect them to the crystal oscillator circuit 2, power supply and switching circuit 3, analog-to-digital switching circuit 4, NRST test circuit 5, serial port test circuit 7, I2C test circuit 8, ADC test circuit 9 and GPIO characteristic test circuit 10.

[0029] Crystal oscillator circuit 2 is used to provide a stable clock signal for the MCU chip to ensure the accuracy of test results. Crystal oscillator circuit 2 is connected to the crystal pin of the replaceable MCU chip test circuit 1.

[0030] The power supply and switching circuit 3 is used to provide a stable power supply. The power supply and switching circuit 3 includes two terminals connected to the source meter and two relay control circuits. The first terminal connected to the source meter is VDD_IN and VSS_IN. VDD_IN is connected to the positive input of the source meter, and VSS_IN is connected to the negative input of the source meter. The source meter is used to provide a precise power input. The second terminal connected to the source meter is VDDA_IN and VSSA_IN. VDDA_IN is connected to the positive input of the source meter, and VSSA_IN is connected to the negative input of the source meter. VDD is a digital power supply, and VDDA is an analog power supply. The digital power supply VDD and the analog power supply VDDA are powered by the same source meter.

[0031] The first relay control circuit in the two-channel relay control circuit controls the inputs of VDD and VSS. When the source meter is selected for power supply via the LCD screen, the positive input of the source meter is connected to the VDD pin of the MCU chip, and the negative input of the source meter is connected to the VSS pin of the MCU chip. The second relay control circuit in the two-channel relay control circuit controls the inputs of VDDA and VSSA. When the source meter is selected for power supply via the LCD screen, the positive input of the source meter is connected to the VDDA pin of the MCU chip, and the negative input of the source meter is connected to the VSSA pin of the MCU chip.

[0032] The analog-to-digital power switching circuit 4 is used to implement the analog power VDDA and digital power VDD of the analog MCU chip. The analog-to-digital power switching circuit 4 is powered separately by two source meters. It includes a relay switching circuit 1, which is controlled by the LCD control circuit 6. The LCD control circuit 6 includes a VDDA independent button, which is used to disconnect the analog power supply VDDA from the digital power supply VDD, and provide a separate power supply from the second source meter.

[0033] The NRST test circuit 5 is used to test the reset function of the MCU chip to ensure that the MCU chip can reset normally under abnormal conditions. The NRST test circuit 5 includes a relay switching circuit 2, which is used to switch the input of the reset signal. The relay switching circuit 2 is controlled by the LCD control circuit 6. When the LCD control circuit 6 includes an NRST regular button and an NRST independent button, the NRST regular button is used to send the reset signal from the regular reset circuit, and the NRST independent button is used to send the reset signal from the signal generator.

[0034] The LCD control circuit 6 includes an LCD screen and a signal conversion circuit. The LCD control circuit 6 is used to switch and control the display content of the LCD screen, allowing users to view test data and results in real time. The LCD screen includes three button selections: the first button is for turning the power switch on and off, and it controls two relays in the power supply and switching circuits; the second button is for simulating power supply status, including a VDDA independent button and a VDDA integrated button, and it controls one relay in the analog-to-digital discrete circuit; the third button is for resetting the circuit status, including an NRST normal button and an NRST independent button, and it controls one relay in the NRST test circuit.

[0035] The serial port test circuit 7 is used to test the serial communication function of the MCU chip to ensure that it can communicate with other devices via serial port; the I2C test circuit 8 is used to test the I2C communication interface function of the MCU chip; the ADC test circuit 9 is used to test the analog-to-digital conversion function of the MCU chip to ensure that it can accurately convert analog signals into digital signals; and the GPIO characteristic test circuit 10 is used to test the general-purpose input / output interface function of the MCU chip to ensure that it can communicate normally with external devices.

[0036] It should be noted that this utility model is an experimental device for testing MCU chips. When in use, the QFN36 test socket is used as the test socket for the replaceable MCU chip test circuit 1. The MCU chip to be tested is placed in the QFN36 test socket, wherein the upper left corner of the QFN36 test socket is pin 1.

[0037] Connect the power supply and switching circuit 3 to the power socket of the experimental platform and turn it on. Select the corresponding test circuit and set the parameters. Setting the parameters means connecting the red terminal of FORCE_HI of the first source meter to VDD_IN of the MCU experimental kit, and the black terminal FORCE_LO to VSS_IN of the MCU experimental kit. Set the first source meter to voltage source and current detection mode; set the voltage of the first source meter to 3.3V and the current limit to 100mA. Select two-wire connection for the first source meter. After selection, the first source meter is set up. At this time, the first source meter supplies power to the device. Click the switch of the first source meter to turn it on. At this time, the blue light of the switch button of the first source meter will light up, and the output of the first source meter will be turned on. Click the power switch on the LCD screen to power the MCU chip in the test device. LED2 and LED3 on the test device will light up, indicating that the total power supply of the MCU has been connected.

[0038] Select the operating mode, including power consumption in running mode and power consumption in sleep mode. Different power consumption tests correspond to different test programs.

[0039] Connect the serial port of the program downloader to the program download port of the MCU chip testing device to download the program for the corresponding working mode.

[0040] After the program download is complete, disconnect the program downloader, click the NRST reset button on the MCU chip test device to reset the MCU chip, restart it, and observe the current reading of the first source meter. The current reading at this time corresponds to the typical current value of the MCU chip in the operating mode with all peripherals turned off.

[0041] The foregoing has shown and described the basic principles, main features, and advantages of this utility model. Those skilled in the art should understand that this utility model is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of this utility model. Various changes and modifications can be made to this utility model without departing from its spirit and scope, and all such changes and modifications fall within the scope of the claims. The scope of protection of this utility model is defined by the appended claims and their equivalents.

Claims

1. An MCU chip testing experimental device, comprising a replaceable MCU chip testing circuit (1), a crystal oscillator circuit (2), a power supply and switching circuit (3), an analog-to-digital switching circuit (4), an NRST testing circuit (5), a liquid crystal control circuit (6), a serial port testing circuit (7), an I2C testing circuit (8), an ADC testing circuit (9), and a GPIO characteristic testing circuit (10), characterized in that: The output of the replaceable MCU chip test circuit (1) is electrically connected to the input of the crystal oscillator circuit (2), power supply and switching circuit (3), analog-to-digital switching circuit (4), NRST test circuit (5), serial port test circuit (7), I2C test circuit (8), ADC test circuit (9) and GPIO characteristic test circuit (10). The output of the liquid crystal control circuit (6) is electrically connected to the input of the power supply and switching circuit (3), analog-to-digital switching circuit (4) and NRST test circuit (5).

2. The MCU chip testing experimental device according to claim 1, characterized in that: The replaceable MCU chip test circuit (1) includes a replaceable MCU chip test socket for replacing different types of MCU chips. The replaceable MCU chip test circuit (1) is used to bring out each pin of the MCU chip and connect it to the crystal oscillator circuit (2), power supply and switching circuit (3), analog-to-digital switching circuit (4), NRST test circuit (5), serial port test circuit (7), I2C test circuit (8), ADC test circuit (9) and GPIO characteristic test circuit (10).

3. The MCU chip testing experimental device according to claim 1, characterized in that: The crystal oscillator circuit (2) is used to provide a stable clock signal for the MCU chip to ensure the accuracy of the test results. The crystal oscillator circuit (2) is connected to the crystal pin of the replaceable MCU chip test circuit (1).

4. The MCU chip testing experimental device according to claim 1, characterized in that: The power supply and switching circuit (3) is used to provide a stable power supply. The power supply and switching circuit (3) includes two terminals connected to the source meter and two relay control circuits. The first terminal connected to the source meter is VDD_IN and VSS_IN. VDD_IN is connected to the positive input of the source meter, and VSS_IN is connected to the negative input of the source meter. The source meter is used to provide a precise power input. The second terminal connected to the source meter is VDDA_IN and VSSA_IN. VDDA_IN is connected to the positive input of the source meter, and VSSA_IN is connected to the negative input of the source meter. VDD is a digital power supply, and VDDA is an analog power supply. The digital power supply VDD and the analog power supply VDDA are powered by the same source meter. The first relay control circuit in the two-way relay control circuit is used to control the inputs of VDD and VSS. When the source meter is selected for power supply via the LCD screen, the positive input of the source meter is connected to the VDD pin of the MCU chip, and the negative input of the source meter is connected to the VSS pin of the MCU chip. The second relay control circuit in the two-way relay control circuit controls the inputs of VDDA and VSSA. When the source meter is selected for power supply via the LCD screen, the positive input of the source meter is connected to the VDDA pin of the MCU chip, and the negative input of the source meter is connected to the VSSA pin of the MCU chip.

5. The MCU chip testing experimental device according to claim 1, characterized in that: The analog power / digital power switching circuit (4) is used to realize the analog power VDDA and digital power VDD of the analog MCU chip. The analog power / digital power switching circuit (4) is powered separately by two source meters. It includes a relay switching circuit, which is controlled by the liquid crystal control circuit (6). The liquid crystal control circuit (6) includes a VDDA independent button, which is used to disconnect the analog power supply VDDA from the digital power supply VDD and provide a separate power supply by the second source meter.

6. The MCU chip testing experimental apparatus according to claim 1, characterized in that: The NRST test circuit (5) is used to test the reset function of the MCU chip to ensure that the MCU chip can be reset normally under abnormal conditions. The NRST test circuit (5) includes a relay switching circuit 2 for switching the input of the reset signal. The relay switching circuit 2 is controlled by the liquid crystal control circuit (6). When the liquid crystal control circuit (6) includes an NRST regular button and an NRST independent button, the NRST regular button is used to send the reset signal by the regular reset circuit, and the NRST independent button is used to send the reset signal by the signal generator.

7. The MCU chip testing experimental apparatus according to claim 1, characterized in that: The liquid crystal control circuit (6) includes a liquid crystal screen and a signal conversion circuit. The liquid crystal control circuit (6) is used to switch and control the display content of the liquid crystal screen, so that users can view test data and results in real time. The liquid crystal screen includes three button selections. The first button is for turning the power supply switch on and off. The first button is used to control two relays of the power supply and switching circuit. The second button is used to simulate the power supply status, including the VDDA independent button and the VDDA integrated button. The second button is used for one relay of the analog-digital discrete circuit. The third button is a reset circuit status button, including the NRST regular button and the NRST independent button. The third button is used to control one relay of the NRST test circuit.

8. The MCU chip testing experimental device according to claim 1, characterized in that: The serial port test circuit (7) is used to test the serial communication function of the MCU chip to ensure that it can communicate with other devices via serial port; the I2C test circuit (8) is used to test the I2C communication interface function of the MCU chip; the ADC test circuit (9) is used to test the analog-to-digital conversion function of the MCU chip to ensure that it can accurately convert analog signals into digital signals; the GPIO characteristic test circuit (10) is used to test the general-purpose input / output interface function of the MCU chip to ensure that it can communicate normally with external devices.

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