Control device for vehicle test and vehicle test system

Abstract

The utility model provides a control device for vehicle testing and a vehicle testing system. The control device comprises a circuit break control circuit and a second semiconductor switch circuit; the circuit break control circuit comprises a first semiconductor switch circuit and a circuit break switch, the enable end of the first semiconductor switch circuit is connected with a circuit break control signal, the first end is connected with a voltage signal, the second end is connected with the circuit break switch, and the circuit break switch is arranged in a test circuit of a vehicle test. The enabling end of the second semiconductor switch circuit is connected with a short-circuit control signal, the first end is connected with a vehicle test circuit, and the second end is connected with the power end of the test circuit. When the circuit break control signal is an enable signal, the first semiconductor switch circuit enables the circuit break switch to be disconnected, so that the test circuit is disconnected; and when the short circuit control signal is an enable signal, the first end and the second end of the second semiconductor switch circuit are conducted, so that the power supply end is short-circuited. Compared with a traditional relay, the size can be effectively reduced, and the weight is reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of vehicle testing, in particular to a control device for vehicle testing and a vehicle testing system. BACKGROUND

[0002] The testing process of a vehicle usually involves the operation control of a test bench or a test line (a line on which a signal line or a data line is located) on the vehicle, such as the positive and negative short-circuit operation, open-circuit operation, etc. of the bus of an automobile communication component ECU, an antenna signal line, etc.

[0003] At present, the control of the short-circuit operation, open-circuit operation, etc. of the test line is usually manually controlled or controlled by a relay circuit. Manual control requires an operator to select a signal line for operation, which is difficult to achieve efficient and accurate control. The control by a relay circuit results in a large and heavy testing device. CONTENT OF THE UTILITY MODEL

[0004] The present application provides a control device for vehicle testing and a vehicle testing system to solve at least one of the above technical problems in the prior art.

[0005] According to a first aspect of the present application, a control device for vehicle testing is provided, comprising:

[0006] an open-circuit control circuit, comprising a first semiconductor switch circuit and an open-circuit switch, an enable end of the first semiconductor switch circuit being connected to an open-circuit control signal, a first end of the first semiconductor switch circuit being connected to a voltage signal, and a second end of the first semiconductor switch circuit being connected to the open-circuit switch, and the open-circuit switch being arranged in a test line of vehicle testing;

[0007] a second semiconductor switch circuit for short-circuit control, an enable end of the second semiconductor switch circuit being connected to a short-circuit control signal, a first end of the second semiconductor switch circuit being connected to the test line of vehicle testing, and a second end of the second semiconductor switch circuit being connected to a power supply end of the test line;

[0008] wherein when the open-circuit control signal is an enable signal, the first semiconductor switch circuit causes the open-circuit switch to be disconnected, so as to cause the test line to be open-circuited.

[0009] wherein when the short-circuit control signal is an enable signal, the first end and the second end of the second semiconductor switch circuit are conductive, so that the power supply end is short-circuited.

[0010] In some embodiments, the first semiconductor switch circuit and the second semiconductor switch circuit are triode switch circuits.

[0011] In some embodiments, the second semiconductor switch circuit comprises a second semiconductor switch circuit for positive pole short circuit and a second semiconductor switch circuit for negative pole short circuit; the power supply end comprises a power supply positive pole and a power supply negative pole;

[0012] The enable end of the second semiconductor switch circuit for positive pole short circuit is connected with a positive pole short circuit control signal, the first end of the second semiconductor switch circuit for positive pole short circuit is connected with a test line of vehicle test, and the second end of the second semiconductor switch circuit for positive pole short circuit is connected with a power supply positive pole of the test line.

[0013] The enable end of the second semiconductor switch circuit for negative pole short circuit is connected with a negative pole short circuit control signal, the first end of the second semiconductor switch circuit for negative pole short circuit is connected with a test line of vehicle test, and the second end of the second semiconductor switch circuit for negative pole short circuit is connected with a power supply negative pole of the test line.

[0014] In some embodiments, the second semiconductor switch circuit for positive pole short circuit comprises a semiconductor switch sub-circuit, a second semiconductor switch and a second pull-up resistor;

[0015] The first end of the semiconductor switch sub-circuit is connected with the positive pole short circuit control signal, the second end of the semiconductor switch sub-circuit is connected with one end of the second pull-up resistor and a control end of the second semiconductor switch, and the third end of the semiconductor switch sub-circuit is connected with a power supply negative pole.

[0016] The other end of the second pull-up resistor and an input end of the second semiconductor switch are connected with the power supply positive pole, and an output end of the second semiconductor switch is connected with the test line.

[0017] In some embodiments, the semiconductor switch sub-circuit comprises a third semiconductor switch, a first resistor and a second resistor;

[0018] One end of the first resistor and one end of the second resistor are connected with the positive pole short circuit control signal, the other end of the first resistor is connected with a power supply negative pole, and the other end of the second resistor is connected with a control end of the third semiconductor switch.

[0019] An input end of the third semiconductor switch is connected with one end of the second pull-up resistor and a control end of the second semiconductor switch, and an output end of the third semiconductor switch is connected with a power supply negative pole.

[0020] In some embodiments, the second semiconductor switch circuit for negative pole short circuit comprises a fourth semiconductor switch, a third resistor and a fourth resistor;

[0021] One end of the third resistor and one end of the fourth resistor are connected to the negative short circuit control signal, the other end of the third resistor is connected to the negative pole of the power supply, and the other end of the fourth resistor is connected to the control end of the fourth semiconductor switch.

[0022] The input end of the fourth semiconductor switch is connected to the test line, and the output end of the fourth semiconductor switch is connected to the negative pole of the power supply.

[0023] In some embodiments, the first semiconductor switch circuit comprises a first semiconductor switch and a first pull-up resistor.

[0024] One end of the first pull-up resistor and the control end of the first semiconductor switch are connected to the open circuit control signal, and the other end of the first pull-up resistor is connected to the voltage signal.

[0025] The input end of the first semiconductor switch is connected to the voltage signal, and the output end of the first semiconductor switch is connected to the open circuit switch.

[0026] In some embodiments, the first semiconductor switch circuit further comprises an LED lamp.

[0027] One end of the LED lamp is connected to the output end of the first semiconductor switch, and the other end of the LED lamp is connected to the negative pole of the power supply.

[0028] In some embodiments, the open circuit switch comprises a relay, one end of the coil of the relay is connected to the second end of the first semiconductor switch circuit, and the other end of the coil is connected to the negative pole of the power supply; the first contact and the second contact of the relay are arranged in the test line.

[0029] According to the second aspect of the present application, a vehicle test system is provided, comprising the above-mentioned control device.

[0030] In some embodiments, the above-mentioned vehicle test system further comprises a host computer for providing an open circuit control signal and a short circuit control signal, and the host computer is connected to the enable end of the first semiconductor switch circuit and the second semiconductor switch circuit.

[0031] In summary, the control device for vehicle test and the vehicle test system provided by the present application have at least the following beneficial effects:

[0032] On one hand, the circuit breaking control circuit employs a first semiconductor switch circuit and a circuit breaker. The first semiconductor switch circuit switches its state according to the received circuit breaking control signal to control the on / off state of the circuit breaker, thereby achieving circuit breaking operation of the test circuit based on the semiconductor switch. On the other hand, a second semiconductor switch circuit switches its state according to the received short-circuit control signal to control the on / off state of the line connecting the power supply terminal and the test circuit in the second semiconductor switch circuit, thereby achieving short-circuit operation of the power supply terminal based on the semiconductor switch. Thus, using a semiconductor switch circuit to achieve circuit breaking operation of the test circuit and short-circuit operation of the power supply terminal, compared to the traditionally used relays, can effectively reduce size and weight, avoiding problems caused by space constraints, and is highly advantageous in the trend of miniaturization of electronic devices. Moreover, by setting the circuit breaking control signal and the short-circuit control signal, automated control can be achieved, thereby realizing efficient and precise operation control. Attached Figure Description

[0033] To more clearly illustrate the technical solutions in the specific embodiments of this application, the accompanying drawings used in the specific embodiments will be briefly introduced below in conjunction with the accompanying drawings. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings or solutions can be obtained based on these drawings without creative effort.

[0034] Figure 1 This is a structural block diagram of a control device for vehicle testing in one embodiment of this application;

[0035] Figure 2 This is a circuit diagram of a control device for vehicle testing in one embodiment of this application. Detailed Implementation

[0036] In the description of this application, it should be understood that the use of terms such as "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential" to indicate orientation or positional relationship, unless otherwise specified, is understood to be based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing this application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0037] Furthermore, features specified with "first" or "second" for descriptive purposes only should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Features specified with "first" or "second" may explicitly or implicitly include at least one of the specified features. The description of "multiple" generally means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0038] In this application, unless otherwise explicitly specified and limited, terms such as "installation," "connection," "joining," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can be a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0039] In the description of this specification, the terms "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that the specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0040] This application provides a control device for vehicle testing, referenced... Figure 1 The device includes a circuit breaker control circuit for circuit breaking control and a second semiconductor switch circuit 130 for short-circuit control. The circuit breaker control circuit includes a first semiconductor switch circuit 110 and a circuit breaker 120.

[0041] The enable terminal of the first semiconductor switch circuit 110 is connected to the circuit breaker control signal, the first terminal of the first semiconductor switch circuit 110 is connected to the voltage signal, the second terminal of the first semiconductor switch circuit 110 is connected to the circuit breaker 120, and the circuit breaker 120 is set in the test circuit of the vehicle test.

[0042] The voltage signal is used to provide the required voltage to the first semiconductor switching circuit 110. The circuit breaker control signal can be either an enable signal or a disable signal; for example, the enable signal and the disable signal can be either a high-level signal or a low-level signal, respectively. When the circuit breaker control signal is an enable signal, it indicates that the circuit breaker control signal is used to control the circuit breaker. In this case, the first semiconductor switching circuit 110 opens the circuit breaker switch 120. Since the circuit breaker switch 120 is located in the test circuit, the test circuit is thus opened, achieving circuit breaker control of the test circuit. When the circuit breaker control signal is a disable signal, it indicates that the circuit breaker control signal is used to control the circuit breaker. In this case, the first semiconductor switching circuit 110 closes the circuit breaker switch 120, thereby ensuring that the test circuit is not open. Specifically, the circuit breaker control signal can control the state of the first semiconductor switching circuit 110 to switch between conducting and non-conducting states, thereby controlling whether the circuit breaker switch 120 is open.

[0043] The enable terminal of the second semiconductor switch circuit 130 is connected to a short-circuit control signal. The first terminal of the second semiconductor switch circuit 130 is connected to the test circuit of the vehicle test, and the second terminal of the second semiconductor switch circuit 130 is connected to the power supply terminal of the test circuit. Specifically, the power supply terminal of the test circuit may include a positive power supply terminal and a negative power supply terminal.

[0044] The short-circuit control signal can be either an enable signal or a disable signal. When the short-circuit control signal is an enable signal, it indicates that the short-circuit control signal is used to control a short circuit. In this case, the first and second terminals of the second semiconductor switch circuit 130 are connected, that is, the line connecting the power supply terminal and the test line in the second semiconductor switch circuit 130 is connected, thereby short-circuiting the power supply terminal. When the short-circuit control signal is a disable signal, it indicates that the short-circuit control signal is used to control no short circuit. In this case, the first and second terminals of the second semiconductor switch circuit 130 are disconnected, thereby preventing a short circuit to the power supply terminal.

[0045] The aforementioned control device for vehicle testing comprises two parts. First, the circuit breaker control circuit uses a first semiconductor switch circuit 110 and a circuit breaker 120. The first semiconductor switch circuit 110 switches its state according to the received circuit breaker control signal to control the on / off state of the circuit breaker 120, thereby achieving circuit breaker operation on the test circuit based on the semiconductor switch. Second, the second semiconductor switch circuit 130 switches its state according to the received short-circuit control signal to control the on / off state of the line connecting the power supply terminal and the test circuit in the second semiconductor switch circuit 130, thereby achieving short-circuit operation on the power supply terminal based on the semiconductor switch. Thus, using a semiconductor switch circuit to achieve circuit breaker operation on the test circuit and short-circuit operation on the power supply terminal, compared to traditionally used relays, can effectively reduce size and weight, avoiding problems caused by space constraints, and is highly advantageous in the trend of miniaturization of electronic devices. Moreover, by setting the circuit breaker control signal and the short-circuit control signal, automated control can be achieved, thereby realizing efficient and precise operation control.

[0046] In one embodiment, the first semiconductor switching circuit 110 and the second semiconductor switching circuit 130 are transistor switching circuits. A transistor switching circuit is a circuit that uses a transistor as a switching element to control the on / off state of a circuit; that is, the device used for switching control in the circuit is a transistor. Compared to using other switching elements, transistors are smaller and lighter, thus reducing the overall size and weight of the structure.

[0047] In one embodiment, the first semiconductor switch circuit 110 includes a first semiconductor switch and a first pull-up resistor. The enable terminal of the first semiconductor switch circuit 110 includes a control terminal of the first semiconductor switch and one end of the first pull-up resistor. Specifically, the control terminal of the first semiconductor switch and one end of the first pull-up resistor are connected to a circuit breaker control signal. The first terminal of the first semiconductor switch circuit 110 includes the other end of the first pull-up resistor and the input terminal of the first semiconductor switch. Specifically, the other end of the first pull-up resistor is connected to a voltage signal, and the input terminal of the first semiconductor switch is connected to a voltage signal. The second terminal of the first semiconductor switch circuit 110 includes the output terminal of the first semiconductor switch. Specifically, the output terminal of the first semiconductor switch is connected to a circuit breaker 120. By employing a semiconductor switch and switching the switch state according to the circuit breaker control signal, the on / off state of the circuit breaker 120 is controlled to perform automatic disconnection control operation on the test circuit.

[0048] For example Figure 2As shown, the first semiconductor switch circuit 110 includes a first semiconductor switch Q4 and a first pull-up resistor R10. The input terminal of the first semiconductor switch Q4 and one end of the first pull-up resistor R10 are connected to a +5V voltage signal. The control terminal of the first semiconductor switch Q4 is connected to a circuit breaker control signal via port MCU_Port_1, where port MCU_Port_1 can be an I / O port. It is understood that in other embodiments, voltage signals of other values ​​can be selected according to the operating requirements of the electronic device. Furthermore, the first semiconductor switch circuit 110 may also include other auxiliary devices, such as a first current-limiting resistor R7. The control terminal of the first semiconductor switch Q4 is connected to port MCU_Port_1 via the first current-limiting resistor R7 to receive the circuit breaker control signal.

[0049] Specifically, the first semiconductor switch Q4 can be a transistor, such as an 8550PNP transistor. Transistors are significantly cheaper than relays, and their small size and light weight reduce material usage and unit material costs, while also lowering labor costs associated with fault repair and complex operations. It is understood that in other embodiments, the first semiconductor switch Q4 can also be other types of semiconductor switching devices, such as MOSFETs, IGBTs, etc.

[0050] In one embodiment, reference Figure 2 The first semiconductor switch circuit 110 also includes an LED light. One end of the LED light is connected to the output terminal of the first semiconductor switch Q4, and the other end of the LED light is connected to the negative terminal of the power supply. When the first semiconductor switch Q4 is turned on, the LED light is lit due to power supply; when the first semiconductor switch Q4 is turned off, the LED light is not lit. Thus, by connecting the LED light to the output terminal of the first semiconductor switch Q4, the on / off state of the first semiconductor switch Q4 can be indicated for easy viewing.

[0051] Furthermore, such as Figure 2 As shown, the first semiconductor switching circuit 110 may further include a second current resistor R8, which is disposed in the branch where the LED lamp is located and connected in series with the LED lamp to protect the LED lamp by limiting current.

[0052] In one embodiment, the circuit breaker 120 includes a relay. One end of the relay coil is connected to the second terminal of the first semiconductor switching circuit 110, and the other end of the coil is connected to the negative terminal of the power supply. The first and second contacts of the relay are disposed in a test circuit. When the first semiconductor switching circuit 110 is turned on, the relay coil is energized, and the coil controls the closing or opening of the first and second contacts to realize the on / off control of the circuit breaker 120.

[0053] For example Figure 2As shown, the relay coil JK1A is connected to the output terminal of the first semiconductor switch Q4. The relay uses a normally closed switch JK1B, that is, when the coil JK1A is de-energized, the first contact 3 and the second contact 2 are closed. Figure 2 In this circuit, JK1C is another switch integrated into the relay, which can be used to connect other circuits. The working principle of the circuit breaker control is as follows:

[0054] Disabled: The MCU_Port_1 input is high, the first pull-up resistor R10 provides a weak pull-up, the base voltage of the first semiconductor switch Q4 is equal to the emitter voltage, the emitter and collector are not conducting, the relay coil JK1A is not energized, and since the test line Bench_ECU_signal_wire is connected to the first contact 3 and the second contact 2 (normally closed) of the normally closed switch JK1B, the first contact 3 and the second contact 2 are still closed, so this is a normal state.

[0055] Enable: When the input level of port MCU_Port_1 is low, the base of the first semiconductor switch Q4 is pulled low by port MCU_Port_1. At this time, the voltage difference between the base voltage and the emitter voltage is greater than 0.3 volts. The 5 volts of the emitter is connected to the collector. There is 5 volts at terminal 1 of the relay coil JK1A. After the current flows through the coil JK1A, it returns to the negative terminal from terminal 8, realizing the coil is energized. This controls the first contact 3 and the second contact 2 of the normally closed switch JK1B to open, thereby achieving the purpose of circuit breaking.

[0056] It is understood that in other embodiments, the relay may also be of other types, such as a relay with a normally open switch. The two contacts of the normally open switch are connected in the test circuit. By de-energizing the coil, the normally open switch is controlled to be in the open state, thereby achieving the purpose of circuit breaking.

[0057] In one embodiment, reference Figure 2 The second semiconductor switching circuit 130 includes a second semiconductor switching circuit 131 for short-circuiting the positive terminal and a second semiconductor switching circuit 132 for short-circuiting the negative terminal; the power supply terminal includes a power supply positive terminal and a power supply negative terminal.

[0058] The enable terminal of the second semiconductor switch circuit 131 for positive short circuit is connected to a positive short circuit control signal, for example, through port MCU_Port_2, which can be an I / O port. The first terminal of the second semiconductor switch circuit 131 for positive short circuit is connected to the test circuit of the vehicle test; the second terminal of the second semiconductor switch circuit 131 for positive short circuit is connected to the positive terminal of the power supply of the test circuit, for example, the positive terminal of the power supply provides a +12V voltage.

[0059] The enable terminal of the second semiconductor switch circuit 132 for negative short circuit is connected to the negative short circuit control signal, for example, through port MCU_Port_3, which can be an I / O port. The first terminal of the second semiconductor switch circuit 132 for negative short circuit is connected to the test circuit of the vehicle test, and the second terminal of the second semiconductor switch circuit 132 for negative short circuit is connected to the negative power supply of the test circuit.

[0060] By employing two second semiconductor switching circuits, one for positive short-circuit control and the other for negative short-circuit control, the test circuit can be short-circuited to both the positive and negative terminals.

[0061] In one embodiment, the second semiconductor switch circuit 131 for positive short circuit includes a semiconductor switch sub-circuit, a second semiconductor switch, and a second pull-up resistor. The enable terminal of the second semiconductor switch circuit 131 for positive short circuit includes a first terminal of the semiconductor switch sub-circuit, which is connected to a positive short circuit control signal. The second terminal of the semiconductor switch sub-circuit is connected to one end of the second pull-up resistor and the control terminal of the second semiconductor switch. The third terminal of the semiconductor switch sub-circuit is connected to the negative terminal of the power supply. The second terminal of the second semiconductor switch circuit 131 for positive short circuit includes the other end of the second pull-up resistor and the input terminal of the second semiconductor switch, which are connected to the positive terminal of the power supply. The output terminal of the second semiconductor switch serves as the first terminal of the second semiconductor switch circuit 131 for positive short circuit and is connected to a test circuit.

[0062] For example Figure 2 As shown, one end of the second pull-up resistor R9 and the control terminal of the second semiconductor switch Q2 are connected to the semiconductor switch sub-circuit, and the other end of the second pull-up resistor R9 and the input terminal of the second semiconductor switch Q2 are connected to the positive terminal of the power supply providing +12V voltage. Specifically, the second semiconductor switch Q2 can be a transistor, such as an 8550PNP transistor. Under the influence of the level input to port MCU_Port_2, the semiconductor switch sub-circuit controls the level of the control terminal of the second semiconductor switch Q2 to control the second semiconductor switch Q2 to be turned on or off, thereby controlling the continuity between the positive terminal of the power supply connected in the second semiconductor switch circuit 131 used for positive short circuit and the test circuit.

[0063] In one embodiment, reference Figure 2 The semiconductor switch sub-circuit includes a third semiconductor switch Q1, a first resistor R11, and a second resistor R1. Specifically, the third semiconductor switch Q1 can be a transistor, such as an 8050NPN transistor. It is understood that in other embodiments, the third semiconductor switch Q1 can also be other types of semiconductor switching devices.

[0064] One end of the first resistor R11 and one end of the second resistor R1 form the first terminal of the semiconductor switch sub-circuit, used to connect the positive short-circuit control signal, for example, through port MCU_Port_2. The other end of the first resistor R11 is connected to the negative terminal of the power supply, and the other end of the second resistor R1 is connected to the control terminal of the third semiconductor switch Q1. The input terminal of the third semiconductor switch Q1 is the second terminal of the semiconductor switch sub-circuit, connected to one end of the second pull-up resistor R9 and the control terminal of the second semiconductor switch Q2. The output terminal of the third semiconductor switch Q3 is the third terminal of the semiconductor switch sub-circuit, connected to the negative terminal of the power supply.

[0065] Furthermore, the second semiconductor switching circuit 131 for positive short-circuiting may also include other auxiliary devices. (See reference) Figure 2 The second semiconductor switch circuit 131 for positive short circuit also includes a third current-limiting resistor R3 and a fifth current-limiting resistor R5, and the semiconductor switch sub-circuit also includes a fourth current-limiting resistor R4. The control terminal of the second semiconductor switch Q2 is connected to the input terminal of the third semiconductor switch Q3 through the third current-limiting resistor R3; the input terminal of the second semiconductor switch Q2 is connected to the positive terminal of the power supply through the fifth current-limiting resistor; and the output terminal of the third semiconductor switch Q3 is connected to the negative terminal of the power supply through the fourth current-limiting resistor.

[0066] Due to the danger and special nature of short-circuit operation, the second semiconductor switch circuit 131 used for positive short circuit uses a fourth current-limiting resistor R4 and a fifth current-limiting resistor R5 to protect against burnout due to excessive current, thereby reducing the risk of damage to test personnel and equipment caused by short-circuit operation.

[0067] The working principle of short-circuiting the positive terminal is as follows:

[0068] Disabled: When the input level of MCU_Port_2 is low, the base of the third semiconductor switch Q1 is low. At this time, the emitter and collector of the third semiconductor switch are not conducting. Due to the weak pull-up of the second pull-up resistor R9 to 12V, the collector of the third semiconductor switch Q1 is high. After passing through the third current-limiting resistor R3, the base of the second semiconductor switch Q2 is also high. Therefore, the collector and emitter of the second semiconductor switch Q2 are not conducting. So at this time, the collector terminal of the second semiconductor switch Q2 is not affected by the Bench_ECU_signal_wire test line.

[0069] Enable: When the MCU_Port_2 input is high, the base of the third semiconductor switch Q1 is high. At this time, the emitter and collector of the third semiconductor switch are connected, and the voltage at the collector flows from the emitter to the negative terminal, pulling the collector level low. Since the base of the second semiconductor switch Q2 is connected to the collector of the third semiconductor switch Q1 through the third current-limiting resistor R3, the base of the second semiconductor switch Q2 is also pulled low. At this time, the collector and emitter of Q2 are connected, and the 12V voltage flows through the fifth current resistor R5, the emitter of the second semiconductor switch Q2, and finally to the test circuit Bench_ECU_signal_wire. At this time, the test circuit Bench_ECU_signal_wire is also 12V, thus achieving the purpose of short-circuiting the positive terminal.

[0070] In one embodiment, the second semiconductor switch circuit 132 for negative short circuit includes a fourth semiconductor switch, a third resistor, and a fourth resistor. The enable terminal of the second semiconductor switch circuit 132 for negative short circuit includes one end of the third resistor and one end of the fourth resistor, which are connected to a negative short circuit control signal. The other end of the third resistor is connected to the negative power supply, and the other end of the fourth resistor is connected to the control terminal of the fourth semiconductor switch. The first terminal of the second semiconductor switch circuit 132 for negative short circuit includes the input terminal of the fourth semiconductor switch, which is connected to a test circuit. The second terminal of the second semiconductor switch circuit 132 for negative short circuit includes the output terminal of the fourth semiconductor switch, which is connected to the negative power supply.

[0071] For example Figure 2 As shown, the second semiconductor switch circuit 132 for negative short circuit includes a fourth semiconductor switch Q3, a third resistor R12, and a fourth resistor R2. Specifically, the fourth semiconductor switch Q3 can be a transistor, such as an 8050NPN transistor.

[0072] Furthermore, the second semiconductor switch circuit 132 for negative short circuit may also include a sixth current-limiting resistor R6, and the output terminal of the fourth semiconductor switch Q3 is connected to the negative power supply through the sixth current-limiting resistor R6. By using the sixth current-limiting resistor R6, the test circuit can be protected against burnout due to excessive current, reducing the risk of damage to test personnel and equipment due to short circuit operation.

[0073] The working principle of short-circuiting the negative terminal is as follows:

[0074] Disabled: When port MCU_Port_3 is low, the collector and emitter of the fourth semiconductor switch Q3 are not conducting. The test line Bench_ECU_signal_wire cannot flow through the collector of the fourth semiconductor switch Q3 to the negative power supply connected to the emitter. This is the normal state.

[0075] Enable: When port MCU_Port_3 is high, the collector and emitter of the fourth semiconductor switch Q3 are connected. The test line Bench_ECU_signal_wire flows through the collector of the fourth semiconductor switch Q3 to the sixth current-limiting resistor R6 connected to the emitter, and finally connects to the negative terminal of the power supply, thereby achieving the purpose of short-circuiting the negative terminal.

[0076] Specifically, when executing a command to short-circuit the positive terminal, a command to close the negative terminal short circuit is executed first, with a preset delay of, for example, 500 milliseconds, to wait for the command to complete and the voltage level to return to 0 before executing the command to short-circuit the positive terminal. Executing the command to short-circuit the positive terminal involves inputting a high level to port MCU_Port_2, while executing the command to close the negative terminal short circuit involves inputting a low level to port MCU_Port_3. Therefore, before inputting a high level to port MCU_Port_2, a low level is first input to port MCU_Port_3 with a preset delay. Conversely, when executing a command to short-circuit the negative terminal, a command to close the positive terminal short circuit is executed first, with a preset delay to wait for the command to complete and the voltage level to return to 0 before executing the command to short-circuit the negative terminal. In this way, by configuring the signal input, it is impossible for short circuits to both the positive and negative terminals of the same test line to exist simultaneously, thereby avoiding human error and further reducing the risk of damage to test personnel and equipment due to short-circuit operations.

[0077] This application also provides a vehicle testing system, including the control device described above.

[0078] In one embodiment, the vehicle testing system further includes a host computer for providing open-circuit control signals and short-circuit control signals, the host computer being connected to the enable terminals of the first semiconductor switch circuit 110 and the second semiconductor switch circuit 130.

[0079] Specifically, the host computer sends commands to the control device via a USB serial data cable to control the circuit breaking and short-circuiting operations of the corresponding test lines, and can also query the current on / off status of the control device. This serial command control method greatly simplifies the operation process; users only need to send simple instructions to accurately control the operation, eliminating the need for complex programming or manual debugging. This lowers the operational threshold, allowing even non-technical personnel to quickly get started, saving significant time and improving work efficiency. It changes the cumbersome manual hardware operation mode of traditional testing, reducing the risk of electric shock and short-circuit fires caused by human error, and achieving intelligent, simplified, and safe hardware control.

[0080] The technical features described above can be combined arbitrarily. Although not all possible combinations of these technical features are described, any combination of these technical features should be considered to be covered by this specification, provided that such combination does not contain contradictions.

[0081] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A control device for vehicle testing, characterized in that, include: The circuit breaking control circuit includes a first semiconductor switching circuit and a circuit breaker. The enable terminal of the first semiconductor switching circuit is connected to a circuit breaking control signal, the first terminal of the first semiconductor switching circuit is connected to a voltage signal, the second terminal of the first semiconductor switching circuit is connected to the circuit breaker, and the circuit breaker is installed in the test circuit of the vehicle test. A second semiconductor switching circuit for short-circuit control, wherein the enable terminal of the second semiconductor switching circuit is connected to a short-circuit control signal, the first terminal of the second semiconductor switching circuit is connected to a test circuit for vehicle testing, and the second terminal of the second semiconductor switching circuit is connected to the power supply terminal of the test circuit. When the circuit breaker control signal is an enable signal, the first semiconductor switching circuit opens the circuit breaker to disconnect the test line. When the short-circuit control signal is an enable signal, the first and second terminals of the second semiconductor switch circuit are connected, thereby short-circuiting the power supply terminal.

2. The control device according to claim 1, characterized in that, The first semiconductor switching circuit and the second semiconductor switching circuit are transistor switching circuits.

3. The control device according to claim 1, characterized in that, The second semiconductor switching circuit includes a second semiconductor switching circuit for short-circuiting the positive terminal and a second semiconductor switching circuit for short-circuiting the negative terminal; the power supply terminal includes a positive power supply terminal and a negative power supply terminal; The enable terminal of the second semiconductor switch circuit for positive short circuit is connected to the positive short circuit control signal, the first terminal of the second semiconductor switch circuit for positive short circuit is connected to the test circuit of the vehicle test, and the second terminal of the second semiconductor switch circuit for positive short circuit is connected to the positive power supply of the test circuit. The enable terminal of the second semiconductor switch circuit for negative short circuit is connected to the negative short circuit control signal, the first terminal of the second semiconductor switch circuit for negative short circuit is connected to the test circuit of the vehicle test, and the second terminal of the second semiconductor switch circuit for negative short circuit is connected to the negative power supply of the test circuit.

4. The control device according to claim 3, characterized in that, The second semiconductor switch circuit for positive short circuit includes a semiconductor switch sub-circuit, a second semiconductor switch, and a second pull-up resistor. The first terminal of the semiconductor switch sub-circuit is connected to the positive short-circuit control signal, the second terminal of the semiconductor switch sub-circuit is connected to one end of the second pull-up resistor and the control terminal of the second semiconductor switch, and the third terminal of the semiconductor switch sub-circuit is connected to the negative terminal of the power supply. The other end of the second pull-up resistor and the input terminal of the second semiconductor switch are connected to the positive terminal of the power supply, and the output terminal of the second semiconductor switch is connected to the test circuit.

5. The control device according to claim 4, characterized in that, The semiconductor switch sub-circuit includes a third semiconductor switch, a first resistor, and a second resistor; One end of the first resistor and one end of the second resistor are connected to the positive short-circuit control signal, the other end of the first resistor is connected to the negative power supply, and the other end of the second resistor is connected to the control terminal of the third semiconductor switch. The input terminal of the third semiconductor switch is connected to one end of the second pull-up resistor and the control terminal of the second semiconductor switch, and the output terminal of the third semiconductor switch is connected to the negative terminal of the power supply.

6. The control device according to claim 3, characterized in that, The second semiconductor switching circuit for negative short circuit includes a fourth semiconductor switch, a third resistor, and a fourth resistor; One end of the third resistor and one end of the fourth resistor are connected to the negative short-circuit control signal, the other end of the third resistor is connected to the negative power supply, and the other end of the fourth resistor is connected to the control terminal of the fourth semiconductor switch. The input terminal of the fourth semiconductor switch is connected to the test circuit, and the output terminal of the fourth semiconductor switch is connected to the negative terminal of the power supply.

7. The control device according to claim 1, characterized in that, The first semiconductor switching circuit includes a first semiconductor switch and a first pull-up resistor; One end of the first pull-up resistor and the control terminal of the first semiconductor switch are connected to the circuit breaking control signal, and the other end of the first pull-up resistor is connected to the voltage signal. The input terminal of the first semiconductor switch is connected to the voltage signal, and the output terminal of the first semiconductor switch is connected to the circuit breaker.

8. The control device according to claim 7, characterized in that, The first semiconductor switching circuit also includes an LED light; One end of the LED lamp is connected to the output terminal of the first semiconductor switch, and the other end of the LED lamp is connected to the negative terminal of the power supply.

9. The control device according to claim 1, characterized in that, The circuit breaker includes a relay, one end of the relay coil is connected to the second terminal of the first semiconductor switching circuit, and the other end of the relay coil is connected to the negative terminal of the power supply; the first contact and the second contact of the relay are arranged in the test circuit.

10. A vehicle testing system, characterized in that, Includes the control device as described in any one of claims 1-9.

11. The vehicle testing system according to claim 10, characterized in that, It also includes a host computer for providing circuit breaker control signals and short-circuit control signals, the host computer being connected to the enable terminals of the first semiconductor switch circuit and the second semiconductor switch circuit.

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