Single-work-station multifunctional test equipment

Abstract

The utility model discloses a multifunctional test device with a single work station. The device comprises a rack, a positioning carrier which is arranged on a test station in the rack and is used for positioning a product, and a test module which is relatively arranged above the positioning carrier, the driving module is used for driving the positioning carrier to ascend and descend so as to realize mold combination or mold opening of the positioning carrier and the test mold, the signal control switching device is connected to the output end of the test module, and the output end of the signal control switching device is connected with a plurality of test instruments. The test module transmits a total signal of a product to the signal control switching device, and the signal control switching device selectively performs one or more tests on the product through switching signals. According to the utility model, one or more tests can be selectively carried out on a product on a single work station through switching signals, and a certain test can be randomly switched, so that the flexibility and the universality are good.

Description

[Technical Field]

[0001] This utility model belongs to the field of testing equipment technology, and in particular relates to a single-station multi-functional testing device. [Background Technology]

[0002] With the advancement of radio frequency (RF) technology, the accuracy requirements for antennas are also increasing, leading to a growing demand for ICT testing in production. Therefore, both RF and ICT testing of antennas are necessary. However, the testing environments for RF and ICT differ, making simultaneous testing impossible. Current antenna manufacturers typically use two sets of fixtures for RF and ICT testing respectively, requiring two operators to perform the tests on each fixture, resulting in high labor and equipment costs.

[0003] Existing technologies include antenna test fixtures that can be used for both types of testing. For example, Chinese Patent Publication No. CN215678457U discloses an antenna test fixture including a frame, an antenna plate mounted on the frame, and a carrier plate positioned below the antenna plate. The carrier plate has test positions for fixing the antenna. A driving component is mounted on the frame to drive the antenna plate and carrier plate to abut against each other. The antenna plate also has an RF test assembly for contacting or separating RF probes from the antenna. Although this solution can achieve both RF and ICT testing on the same fixture, the following problems still exist:

[0004] (1) The test fixture has a complex structure and is equipped with multiple probes. Before testing, it requires multiple positioning and probe insertion, which reduces the testing cycle time.

[0005] (2) During testing, ICT testing can only be performed first, and then RF testing can be completed. Testing can only be performed in the above order, and the order of testing is limited.

[0006] (3) Only the above two tests can be performed. If other tests need to be arranged, it cannot be completed.

[0007] Therefore, it is necessary to provide a single-station, multi-functional testing device to solve the above-mentioned technical problems. [Utility Model Content]

[0008] The main purpose of this utility model is to provide a single-station multi-functional testing device that can selectively perform one or more tests on a product by switching signals on a single station, and can be switched to a certain test at will, with good flexibility and versatility.

[0009] This utility model achieves the above-mentioned objectives through the following technical solution: a single-station multi-functional testing device, comprising a frame, a positioning carrier for positioning products mounted on a testing station within the frame, a testing module positioned opposite the positioning carrier, a driving module for driving the positioning carrier to rise and fall to achieve mold assembly or mold opening between the positioning carrier and the testing module, and a signal control switching device connected to the output end of the testing module. The output end of the signal control switching device is connected to several testing instruments. The testing module transmits the total signal of the product to the signal control switching device, and the signal control switching device selectively performs one or more tests on the product by switching signals.

[0010] Furthermore, some of the aforementioned test instruments include RF test instruments for performing RF testing on the product and ICT test instruments for performing ICT testing on the product.

[0011] Furthermore, the positioning carrier is equipped with a positioning structure for the positioning product.

[0012] Furthermore, the drive module includes a cylinder mounted on the frame and a lifting frame driven by the cylinder to move up and down, with the positioning carrier fixed to the upper end of the lifting frame.

[0013] Furthermore, the test module includes a test board disposed directly above the positioning carrier and a PCB adapter board disposed on the test board. The PCB adapter board is provided with a plurality of test probes, and a clamping plate for pressing the product is disposed on the lower surface of the PCB adapter board.

[0014] Furthermore, the test plate is provided with a number of positioning pins, and the positioning carrier is provided with positioning holes that cooperate with the positioning pins for positioning.

[0015] Furthermore, the test probe passes through the clamping plate and extends out of the lower surface of the clamping plate. The lower surface of the clamping plate is provided with a positioning post sleeved on the outer periphery of the test probe. The positioning post is provided with a conforming hole that conforms to the shape of the test probe. The test probe extends downward through the clamping plate and passes out of the lower surface of the positioning post.

[0016] Furthermore, a first wire is connected to the test board, and the other end of the first wire is connected to the signal control switching device.

[0017] Furthermore, the signal control switching device is electrically connected to the RF test instrument via a second wire, and the signal control switching device is electrically connected to the ICT test instrument 7 via a third wire.

[0018] Furthermore, the first wire transmits the product's total signal to the signal control switching device, the signal control switching device switches to the first sub-signal and transmits the first sub-signal to the RF test instrument for RF testing via the second wire, and the signal control switching device switches to the second sub-signal and transmits the second sub-signal to the ICT test instrument for ICT testing via the third wire.

[0019] Compared with the prior art, the advantages of this utility model of a single-station multi-functional testing device are as follows:

[0020] (1) Only one test station is set on the rack. The test station is equipped with a positioning carrier for positioning products and a test module located above the positioning carrier. The positioning carrier and the test module have simple structures. The drive module drives the positioning carrier to rise and cooperate with the test module to close the mold and achieve electrical contact. The operation is simple and convenient. The test module transmits the total signal of the product to the signal control switching device. If RF testing is required, the signal control switching device switches to the first sub-signal and transmits the first sub-signal to the RF test instrument through the second wire for RF testing. If ICT testing is required, the signal control switching device switches to the second sub-signal and transmits the second sub-signal to the ICT test instrument through the third wire for ICT testing. The two tests can be switched at will. RF testing can be performed first and then ICT testing, or ICT testing can be performed first and then RF testing, or only one side of RF testing and ICT testing can be performed. Therefore, on the same test station, when the product is placed on the same positioning carrier, the signal control switching device can selectively perform one or more tests on the product by switching signals. Moreover, it can switch to a certain test at will, which is flexible and versatile.

[0021] (2) The total signal of the product has been transmitted to the signal control switching device through the first wire. Multiple corresponding test wires are connected from the output end of the signal control switching device and connected to the corresponding test devices to perform corresponding tests. Therefore, on the same test station, the product is placed on the same positioning carrier. The signal control switching device can selectively perform multiple tests on the product by switching signals. Multiple tests are not limited to RF tests and ICT tests, but can also include other test items. Moreover, it can be switched to a certain test at will, which is flexible and versatile. [Attached Image Description]

[0022] Fig. 1 This is a three-dimensional structural diagram of a single-station multi-functional testing device according to an embodiment of the present utility model;

[0023] Fig. 2 This is a three-dimensional structural diagram of the positioning carrier and drive module according to an embodiment of the present utility model;

[0024] Fig. 3 This is a three-dimensional structural diagram of the test module in an embodiment of this utility model;

[0025] The numbers in the diagram represent:

[0026] 100-Single-Station Multifunctional Testing Equipment;

[0027] 1-Frame; 2-Positioning carrier; 21-Positioning structure;

[0028] 3-Test module, 31-Test board, 32-PCB adapter board, 33-Test probe, 34-Pressure plate, 35-Positioning post, 36-First lead wire;

[0029] 4-Drive module, 41-Cylinder, 42-Lifting frame;

[0030] 5-Signal control switching device, 51-Second wire, 52-Third wire;

[0031] 6-RF test instruments; 7-ICT test instruments.

Detailed Implementation Methods

[0032] Example 1:

[0033] Please refer to Figs. 1-3 This embodiment is a single-station multi-functional testing device 100. The single-station multi-functional testing device 100 includes a frame 1, a positioning carrier 2 set on the testing station within the frame 1 for positioning the product, a testing module 3 positioned above the positioning carrier 2, a driving module 4 for driving the positioning carrier 2 to rise and fall to achieve mold closing or opening between the positioning carrier 2 and the testing module 3, and a signal control switching device 5 connected to the output end of the testing module 3. The output end of the signal control switching device 5 is connected to several testing instruments, including an RF testing instrument 6 for RF testing of the product and an ICT testing instrument 7 for ICT testing of the product. The testing module 3 transmits the total signal of the product to the signal control switching device 5. The signal control switching device 5, the RF testing instrument 6, and the ICT testing instrument 7 are all separately set on the side of the frame 1. The testing instruments can be added or removed according to the actual testing items, which is simple and convenient.

[0034] The positioning carrier 2 is provided with a positioning structure 21 for positioning the product. In this embodiment, the positioning structure 22 consists of a fixed limiting block and a movable limiting block. The movable limiting block is set on the positioning carrier 2 by a spring. In other embodiments, a receiving groove for positioning the product may also be provided, with a positioning block for positioning the product provided on the outer periphery of the receiving groove, and an opening clamping assembly for opening the positioning. The specific structure of the positioning carrier 2 is not limited here, nor is the positioning structure 21 for positioning the product. The positioning structure 21 may be modified according to the actual product shape and structure.

[0035] The drive module 4 includes a cylinder 41 mounted on the frame 1 and a lifting frame 42 driven by the cylinder 41 to move up and down. The positioning carrier 2 is fixed to the upper end of the lifting frame 42.

[0036] The test module 3 includes a test board 31 positioned directly above the positioning carrier 2 and a PCB adapter board 32 positioned on the test board 31. The PCB adapter board 32 is provided with a number of test probes 33. A clamping plate 34 for pressing the product is provided on the lower surface of the PCB adapter board 32. The test probes 33 pass through the clamping plate 34 and extend out of the lower surface of the clamping plate 34 so as to be able to make contact with the pin corner of the product for testing.

[0037] The test plate 31 is provided with several positioning pins. Correspondingly, the positioning carrier 2 is provided with positioning holes that cooperate with the positioning pins for positioning. When the positioning carrier 2 moves upward, the positioning pins are inserted into the positioning holes to achieve positioning of the positioning carrier 2 and the test plate 31. When the positioning pins are inserted into the position, the positioning carrier 2 and the test plate 31 are closed, the clamping plate 34 is pressed on the product, and at the same time the test probe 33 contacts the pin corner of the product to achieve electrical conduction.

[0038] The lower surface of the clamping plate 34 is contoured to the product. The clamping plate 34 contacts the product and presses it against the product surface. The lower surface of the clamping plate 34 is provided with a positioning post 35 that is sleeved on the outer periphery of the test probe 33. The positioning post 35 is provided with a contour hole that is contoured to the test probe 33. The test probe 33 extends downward through the clamping plate 34 and passes through the lower surface of the positioning post 35. The positioning post 35 is sleeved on the outer periphery of the test probe 33 to prevent the test probe 33 from deforming or bending when it contacts the pin corner of the product.

[0039] The test board 31 is connected to a first wire 36, the other end of which is connected to a signal control switching device 5. The output of the signal control switching device 5 is connected to an RF test instrument 6 and an ICT test instrument 7. The signal control switching device 5 and the RF test instrument 6 are electrically connected through a second wire 51, and the signal control switching device 5 and the ICT test instrument 7 are electrically connected through a third wire 52.

[0040] After the test board 31 makes electrical contact with the product, the total signal of the product is transmitted to the signal control switching device 5 through the first wire 36. If RF testing is required, the signal control switching device 5 switches to the first sub-signal and transmits the first sub-signal to the RF test instrument 6 through the second wire 51 for RF testing. If ICT testing is required, the signal control switching device 5 switches to the second sub-signal and transmits the second sub-signal to the ICT test instrument 7 through the third wire 52 for ICT testing. The two tests can be switched at will. RF testing can be performed first, followed by ICT testing, or ICT testing can be performed first, followed by RF testing, or only one side of RF testing or ICT testing can be performed. Therefore, on the same test station, when the product is placed on the same positioning carrier 2, the signal control switching device 5 can selectively perform one or more tests on the product by switching signals, and can switch to a certain test at will, which is flexible and versatile.

[0041] The signal control switching device 5 is a switch box. In electrical testing, a switch box typically refers to a device used to manage and control different paths in a circuit. It allows testers to change the current flow path by switching switches, thereby enabling the testing of different components or circuit sections. This type of device is very common in electrical engineering and electronic testing because it simplifies complex testing processes and improves efficiency and safety. Switch boxes are existing technology and will not be discussed further here.

[0042] Example 2:

[0043] This embodiment is largely the same as Embodiment 1, except that the various testing instruments include multiple testing devices for performing various other tests on the product, not limited to RF and ICT tests, but also including other test items; or other test items can be selected, excluding RF and ICT tests, i.e., tests other than RF and ICT tests are performed. Specific test items are not limited here. Since the product's total signal has been transmitted to the signal control switching device 5 through the first wire 36, multiple corresponding test wires only need to be connected from the output of the signal control switching device 5 and connected to the corresponding testing devices to perform the corresponding tests. Therefore, at the same testing station, when the product is placed on the same positioning carrier 2, the signal control switching device 5 can selectively perform multiple tests on the product by switching signals, and can switch to any test at will, offering good flexibility and versatility. The multiple tests and corresponding testing devices are set according to the actual situation and are not limited here.

[0044] The above descriptions are merely some embodiments of this utility model. For those skilled in the art, various modifications and improvements can be made without departing from the inventive concept of this utility model, and all such modifications and improvements fall within the protection scope of this utility model.

Claims

1. A single-station multi-functional testing device, characterized in that: It includes a frame, a positioning carrier for positioning the product on a test station within the frame, a test module positioned above the positioning carrier, a drive module for driving the positioning carrier to rise and fall to achieve mold assembly or mold opening between the positioning carrier and the test module, and a signal control switching device connected to the output end of the test module. The output end of the signal control switching device is connected to several test instruments. The test module transmits the total signal of the product to the signal control switching device, and the signal control switching device selectively performs one or more tests on the product by switching signals.

2. The single-station multi-functional testing equipment as described in claim 1, characterized in that: The aforementioned test instruments include RF test instruments for performing RF testing on products and ICT test instruments for performing ICT testing on products.

3. The single-station multi-functional testing equipment as described in claim 1, characterized in that: The positioning carrier is equipped with a positioning structure for the positioning product.

4. The single-station multi-functional testing equipment as described in claim 1, characterized in that: The drive module includes a cylinder mounted on the frame and a lifting frame driven by the cylinder to move up and down. The positioning carrier is fixed to the upper end of the lifting frame.

5. The single-station multi-functional testing equipment as described in claim 2, characterized in that: The test module includes a test board positioned directly above the positioning carrier and a PCB adapter board positioned on the test board. The PCB adapter board is provided with several test probes, and a clamping plate for pressing the product is provided on the lower surface of the PCB adapter board.

6. The single-station multi-functional testing equipment as described in claim 5, characterized in that: The test plate is provided with a number of positioning pins, and the positioning carrier is provided with positioning holes that cooperate with the positioning pins for positioning.

7. The single-station multi-functional testing equipment as described in claim 5, characterized in that: The test probe passes through the clamping plate and extends out of the lower surface of the clamping plate. The lower surface of the clamping plate is provided with a positioning post sleeved on the outer periphery of the test probe. The positioning post is provided with a conforming hole that conforms to the shape of the test probe. The test probe extends downward through the clamping plate and passes out of the lower surface of the positioning post.

8. The single-station multi-functional testing equipment as described in claim 5, characterized in that: The test board is connected to a first wire, and the other end of the first wire is connected to the signal control switching device.

9. The single-station multi-functional testing equipment as described in claim 8, characterized in that: The signal control switching device is electrically connected to the RF test instrument via a second wire, and the signal control switching device is electrically connected to the ICT test instrument via a third wire.

10. A single-station multi-functional testing device as described in claim 9, characterized in that: The first wire transmits the product's total signal to the signal control switching device. The signal control switching device switches to the first sub-signal and transmits the first sub-signal to the RF test instrument for RF testing via the second wire. The signal control switching device then switches to the second sub-signal and transmits the second sub-signal to the ICT test instrument for ICT testing via the third wire.

Images