Photoelectric coupler testing device

Abstract

The utility model discloses a photoelectric coupler testing device which comprises a base, a high-temperature testing mechanism and a low-temperature testing mechanism are installed on the left side and the right side of the top of the base, a humidifying assembly is installed on the top of the high-temperature testing mechanism, and a housing is installed on the base and located on the outer side of the high-temperature testing mechanism, the outer side of the low-temperature testing mechanism and the outer side of the humidifying assembly. The housing is provided with a normal-temperature testing area between the high-temperature testing mechanism and the low-temperature testing mechanism, the housing is provided with a transparent double door at one side of the normal-temperature testing area, the bottom of the normal-temperature testing area is provided with a clamping testing seat, the bottom of the clamping testing seat is connected with a moving mechanism, and the moving mechanism is arranged in the base. According to the utility model, the long-term use environment is simulated through extreme conditions such as high temperature, high humidity or low temperature, so that the test result can accurately reflect the aging condition in actual use, devices with hidden faults can be eliminated through the aging test, the reliability of outgoing products is ensured, and the accidental failure risk in actual application is reduced.

Description

Technical Field

[0001] This utility model belongs to the field of optocoupler testing technology, and specifically relates to an optocoupler testing device. Background Technology

[0002] An optocoupler is a semiconductor device that achieves electrical isolation through optical signals. Its core function is to convert an input electrical signal into an optical signal, and then convert it back into an electrical signal output through a photosensitive device at the output end. Optocouplers are used in a wide range of fields, including power systems, industrial automation, communication systems, medical equipment, and automotive electronics. In actual production, it is necessary to test the aging of optocouplers to simulate complex working conditions and ensure their stability in high-voltage scenarios such as industrial control and power systems. However, existing testing devices cannot accurately simulate the working conditions of optocouplers in complex real-world environments, resulting in test results that do not accurately reflect their aging status in actual use. Therefore, there is an urgent need for an optocoupler testing device to solve the above problems. Utility Model Content

[0003] In view of the problems mentioned above in the background technology, the purpose of this utility model is to provide an optocoupler testing device.

[0004] To achieve the above-mentioned technical objectives, the technical solution adopted by this utility model is as follows:

[0005] An optocoupler testing device includes a base. A high-temperature testing mechanism and a low-temperature testing mechanism are installed on the top left and right sides of the base. A humidification component is installed on the top of the high-temperature testing mechanism. A cover is installed on the outside of the high-temperature testing mechanism, the low-temperature testing mechanism, and the humidification component. A room-temperature testing area is provided between the high-temperature testing mechanism and the low-temperature testing mechanism in the cover. A transparent double door is provided on one side of the room-temperature testing area in the cover. A clamping test seat is provided at the bottom of the room-temperature testing area. A moving mechanism is connected to the bottom of the clamping test seat and is disposed inside the base.

[0006] Further specifying, the high-temperature testing mechanism includes a high-temperature testing chamber, within which a high-temperature testing cavity is provided. A heating device is installed on the top of the high-temperature testing cavity, and a first temperature sensor is installed inside the high-temperature testing cavity. The high-temperature testing chamber has a high-temperature cavity inlet / outlet on one side of the high-temperature testing cavity. A high-temperature sealing plate is installed outside the high-temperature cavity inlet / outlet of the high-temperature testing chamber. First guide rails are slidably connected to both sides of the high-temperature sealing plate, and the first guide rails are fixedly installed on the high-temperature testing chamber. A first connecting locking plate is installed on the top of the high-temperature sealing plate, and a first electric push rod is installed on the top of the first connecting locking plate. The other side of the first electric push rod is installed on the top inner side of the housing. This structural design facilitates high-temperature testing of the optocoupler.

[0007] Further specifying, the low-temperature testing mechanism includes a low-temperature testing chamber, within which a low-temperature testing cavity is provided. A refrigeration device is installed on the top of the low-temperature testing cavity, and a second temperature sensor is installed inside the low-temperature testing cavity. The low-temperature testing chamber has a low-temperature cavity inlet / outlet on one side of the low-temperature testing cavity. A low-temperature sealing plate is installed outside the low-temperature cavity inlet / outlet of the low-temperature testing chamber. Second guide rails are slidably connected to both sides of the low-temperature sealing plate, and the second guide rails are fixedly installed on the low-temperature testing chamber. A second connecting locking plate is installed on the top of the low-temperature sealing plate, and a second electric push rod is installed on the top of the second connecting locking plate. The other side of the second electric push rod is installed on the top inner side of the casing. This structural design facilitates low-temperature testing of the optocoupler.

[0008] Further specifying, the humidification assembly includes a humidification chamber mounted on top of the high-temperature test chamber. Water pumps are installed on both sides inside the humidification chamber. The output end of the water pumps is connected to a delivery pipe, and the output end of the delivery pipe is connected to an atomizing nozzle. The atomizing nozzle is located inside the high-temperature test chamber and below the heating device. This structural design facilitates testing of the optocoupler in a humid environment.

[0009] Further specifying, the moving mechanism includes a drive motor, the power output end of which is connected to a transmission wheel. The transmission wheel is connected to a transmission belt, and the other side of the transmission belt is connected to a drive wheel. The drive wheel is connected to a lead screw, and bearings are installed on both sides of the lead screw, which are mounted inside the base on both sides. The lead screw is connected to a nut moving seat, and a moving seat is installed on top of the nut moving seat. The top of the moving seat is mounted on the bottom of the clamping test seat. The base has guide grooves at the corresponding moving seats, and the moving seats are slidably disposed within the guide grooves. Folding covers are installed on both sides of the moving seats, and the other side of the folding covers is mounted on the side wall of the guide groove. This structural design facilitates the movement of the optocoupler in the high-temperature test mechanism, the low-temperature test mechanism, and the room-temperature test area, improving the test results.

[0010] The beneficial effects of this utility model are as follows: By setting up a high-temperature testing mechanism, a low-temperature testing mechanism, a humidification component, and a normal-temperature testing area, this utility model simulates the long-term use environment under extreme conditions such as high temperature, high humidity, or low temperature. It can quickly identify problems such as defects in the packaging material of optocouplers, poor soldering, or chip performance degradation, providing data support for life assessment. The test results can accurately reflect the aging situation in actual use. Through aging tests, devices with hidden faults can be eliminated, ensuring the reliability of products leaving the factory and reducing the risk of unexpected failures in actual applications. Attached Figure Description

[0011] This utility model can be further illustrated by the non-limiting embodiments given in the accompanying drawings;

[0012] Figure 1 This is a schematic diagram of the axial structure of an optocoupler testing device according to an embodiment of the present invention;

[0013] Figure 2 This is a schematic cross-sectional view of an optocoupler testing device according to an embodiment of the present invention.

[0014] Figure 3 This is a schematic diagram of the moving mechanism structure of an optocoupler testing device according to an embodiment of the present invention;

[0015] The symbols for the main components are explained below:

[0016] Base 1;

[0017] High temperature testing mechanism 2, high temperature testing chamber 201, high temperature testing cavity 202, heating device 203, first temperature sensor 204, high temperature cavity inlet / outlet 205, high temperature sealing plate 206, first guide rail 207, first connecting lock plate 208, first electric push rod 209;

[0018] Low temperature testing mechanism 3, low temperature testing chamber 301, low temperature testing cavity 302, refrigeration device 303, second temperature sensor 304, low temperature cavity inlet / outlet 305, low temperature sealing plate 306, second guide rail 307, second connecting lock plate 308, second electric push rod 309.

[0019] Humidification component 4, humidification box 401, water pump 402, delivery pipe 403, atomizing nozzle 404;

[0020] 5. Housing; 6. Room temperature test area; 7. Transparent double door; 8. Test clamping fixture;

[0021] The moving mechanism 9, drive motor 901, transmission wheel 902, transmission belt 903, drive wheel 904, lead screw 905, bearing 906, nut moving seat 907, moving seat 908, guide slide 909, and folding cover 910. Detailed Implementation

[0022] To enable those skilled in the art to better understand this utility model, the technical solution of this utility model will be further described below in conjunction with the accompanying drawings and embodiments.

[0023] Example 1, such as Figure 1 and Figure 2 As shown, an optocoupler testing device has a high-temperature testing mechanism 2 and a low-temperature testing mechanism 3 installed on the top left and right sides of a base 1. A humidifying component 4 is installed on the top of the high-temperature testing mechanism 2. A cover 5 is installed on the outside of the high-temperature testing mechanism 2, the low-temperature testing mechanism 3 and the humidifying component 4 on the base 1. A normal temperature testing area 6 is provided between the high-temperature testing mechanism 2 and the low-temperature testing mechanism 3 in the cover 5. A transparent double door 7 is provided on one side of the normal temperature testing area 6 in the cover 5. A clamping test seat 8 is provided at the bottom of the normal temperature testing area 6. A moving mechanism 9 is connected to the bottom of the clamping test seat 8 and is located inside the base 1.

[0024] In this embodiment, when the aging of the optocoupler needs to be tested, the transparent double door 7 is first opened, the optocoupler to be tested is placed on the clamping test seat 8, and the transparent double door 7 is closed. At this time, the optocoupler is in the room temperature test zone 6, and aging tests can be performed at room temperature. When it is necessary to simulate the usage environment, the moving mechanism 9 is activated, which moves the clamping test seat 8. The clamping test seat 8 moves the optocoupler to the high temperature test chamber 2 or the low temperature test chamber 3. The high temperature test chamber 2 and the low temperature test chamber 3 simulate the high temperature or low temperature environment when the optocoupler is in use, which facilitates the aging test of the optocoupler. When the optocoupler is undergoing high temperature testing in the high temperature test chamber 2, the humidification component 4 can also be activated, so that the optocoupler can be subjected to aging tests in a high temperature and high humidity environment, thereby improving the accuracy of the test.

[0025] By simulating long-term use environments under extreme conditions such as high temperature, high humidity, or low temperature, problems such as defects in the packaging materials of optocouplers, poor soldering, or chip performance degradation can be quickly identified, providing data support for life assessment. Aging tests can eliminate devices with hidden faults, ensuring the reliability of products leaving the factory and reducing the risk of unexpected failures in practical applications.

[0026] Example 2, as Figure 2As shown, this embodiment adds the following structure based on embodiment 1: the high-temperature testing mechanism 2 includes a high-temperature testing chamber 201, a high-temperature testing cavity 202 is provided inside the high-temperature testing chamber 201, a heating device 203 is installed on the top of the high-temperature testing cavity 202, a first temperature sensor 204 is installed inside the high-temperature testing cavity 202, a high-temperature cavity inlet / outlet 205 is provided on one side of the high-temperature testing cavity 202 in the high-temperature testing chamber 201, a high-temperature sealing plate 206 is installed on the outside of the high-temperature cavity inlet / outlet 205 in the high-temperature testing chamber 201, a first guide rail 207 is slidably connected to both sides of the high-temperature sealing plate 206, the first guide rail 207 is fixedly installed on the high-temperature testing chamber 201, a first connecting locking plate 208 is installed on the top of the high-temperature sealing plate 206, a first electric push rod 209 is installed on the top of the first connecting locking plate 208, and the other side of the first electric push rod 209 is installed on the top of the inner side of the cover 5.

[0027] In this embodiment, when a high-temperature test is required, the first electric push rod 209 is activated, causing it to drive the first connecting locking plate 208. The first connecting locking plate 208 then drives the high-temperature sealing plate 206 upward along the first guide rail 207, thereby exposing the high-temperature chamber inlet / outlet 205 after the high-temperature sealing plate 206 moves upward. Simultaneously, the moving mechanism 9 is activated, causing it to drive the clamping test seat 8. The clamping test seat 8 then moves the optocoupler from the high-temperature chamber inlet / outlet 205 into the high-temperature test chamber 202. Once the optocoupler enters the high-temperature test chamber 202... The first electric push rod 209 pushes the first connecting lock plate 208, which in turn pushes the high-temperature sealing plate 206 to reset along the first guide rail 207, thereby sealing the high-temperature test chamber 202. Then, the heating device 203 is activated to increase the ambient temperature inside the high-temperature test chamber 202, thus simulating a high-temperature environment for the optocoupler and further improving the test effect. The first temperature sensor 204 can detect the internal ambient temperature. After the optocoupler is kept in the high-temperature test chamber 202 for 30 minutes, it moves into the low-temperature test mechanism 3.

[0028] Example 3, as Figure 2As shown, this embodiment adds the following structure based on embodiment 1: the low-temperature testing mechanism 3 includes a low-temperature testing chamber 301, a low-temperature testing cavity 302 is provided inside the low-temperature testing chamber 301, a refrigeration device 303 is installed on the top of the low-temperature testing cavity 302, a second temperature sensor 304 is installed inside the low-temperature testing cavity 302, a low-temperature cavity inlet / outlet 305 is provided on one side of the low-temperature testing cavity 302 in the low-temperature testing chamber 301, a low-temperature sealing plate 306 is installed on the outside of the low-temperature cavity inlet / outlet 305 in the low-temperature testing chamber 301, a second guide rail 307 is slidably connected to both sides of the low-temperature sealing plate 306, the second guide rail 307 is fixedly installed on the low-temperature testing chamber 301, a second connecting locking plate 308 is installed on the top of the low-temperature sealing plate 306, a second electric push rod 309 is installed on the top of the second connecting locking plate 308, and the other side of the second electric push rod 309 is installed on the top of the inner side of the cover 5.

[0029] In this embodiment, during the low-temperature test, the second electric push rod 309 is activated, causing it to drive the second connecting locking plate 308. The second connecting locking plate 308 then drives the low-temperature sealing plate 306 to move upward along the second guide rail 307, thus exposing the low-temperature chamber inlet / outlet 305 after the second guide rail 307 moves upward. Simultaneously, the moving mechanism 9 is activated, causing it to drive the clamping test seat 8. The clamping test seat 8 then moves the optocoupler from the low-temperature chamber inlet / outlet 305 into the low-temperature test chamber 302. Once the optocoupler enters the low-temperature test chamber 302... The second electric push rod 309 pushes the second connecting lock plate 308, which in turn pushes the low-temperature sealing plate 306 to reset along the second guide rail 307, thereby sealing the low-temperature test chamber 302. Then, the cooling device 303 is activated to cool the low-temperature test chamber 302, thus simulating a low-temperature environment for the optocoupler and further improving the test effect. The second temperature sensor 304 can detect the internal ambient temperature. By cyclically switching between high and low temperatures, the reliability of the optocoupler under extreme temperatures can be tested.

[0030] Example 4, as Figure 2 As shown, this embodiment adds the following structure based on embodiment 1: the humidification component 4 includes a humidification box 401 installed on the top of the high temperature test chamber 201, water pumps 402 are installed on both sides inside the humidification box 401, the output end of the water pump 402 is connected to a delivery pipe 403, the output end of the delivery pipe 403 is connected to an atomizing nozzle 404, the atomizing nozzle 404 is disposed inside the high temperature test chamber 202 and located below the heating device 203.

[0031] In this embodiment, when the optocoupler is moved into the high-temperature test chamber 202 for testing, the water pump 402 can also be started to pump water from the humidification box 401 into the delivery pipe 403, and then output the water from the delivery pipe 403 to the atomizing nozzle 404. The water is then atomized and sprayed out through the atomizing nozzle 404 to simulate a humid environment, thereby enabling the optocoupler to be tested in a humid environment.

[0032] Example 5, as Figure 2 and Figure 3 As shown, this embodiment adds the following structure based on embodiment 1: the moving mechanism 9 includes a drive motor 901, the power output end of the drive motor 901 is connected to a transmission wheel 902, the transmission wheel 902 is connected to a transmission belt 903, the other side of the transmission belt 903 is connected to a drive wheel 904, the drive wheel 904 is connected to a lead screw 905, bearings 906 are installed on both sides of the lead screw 905, the bearings 906 are installed on both sides inside the base 1, the lead screw 905 is connected to a nut moving seat 907, a moving seat 908 is installed on the top of the nut moving seat 907, the top of the moving seat 908 is installed on the bottom of the clamping test seat 8, the base 1 is provided with a guide groove 909 at the corresponding moving seat 908, the moving seat 908 is slidably disposed in the guide groove 909, folding covers 910 are installed on both sides of the moving seat 908, and the other side of the folding cover 910 is installed on the side wall of the guide groove 909.

[0033] In this embodiment, during use, the drive motor 901 is started, which drives the transmission wheel 902. The transmission wheel 902 drives the transmission belt 903, which in turn drives the drive wheel 904. This causes the drive wheel 904 to drive the lead screw 905 to rotate along the bearing 906. The rotating lead screw 905 then drives the nut moving seat 907 to move. The nut moving seat 907 then drives the moving seat 908 to move along the guide groove 909. This causes the moving seat 908 to move the clamping test seat 8 so that it can enter the high-temperature testing mechanism 2 and the low-temperature testing mechanism 3. When the moving seat 908 moves the clamping test seat 8, it compresses one side of the folding cover 910 and stretches the other side of the folding cover 910, thereby isolating the guide groove 909 and preventing leakage of high-temperature and low-temperature ambient temperatures within the high-temperature testing mechanism 2 and the low-temperature testing mechanism 3, which would affect the testing results.

[0034] The above embodiments are merely illustrative of the principles and effects of this utility model and are not intended to limit the scope of this utility model. Any person skilled in the art can modify or alter the above embodiments without departing from the spirit and scope of this utility model. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and technical concept disclosed in this utility model should still be covered by the claims of this utility model.

Claims

1. A photoelectric coupler testing device, characterized by: The device includes a base (1), on the top left and right sides of the base (1) are a high temperature testing mechanism (2) and a low temperature testing mechanism (3). A humidifying component (4) is installed on the top of the high temperature testing mechanism (2). A cover (5) is installed on the outside of the high temperature testing mechanism (2), the low temperature testing mechanism (3) and the humidifying component (4) on the base (1). A room temperature testing area (6) is provided between the high temperature testing mechanism (2) and the low temperature testing mechanism (3) on the cover (5). A transparent double door (7) is provided on one side of the room temperature testing area (6). A clamping test seat (8) is provided at the bottom of the room temperature testing area (6). A moving mechanism (9) is connected to the bottom of the clamping test seat (8). The moving mechanism (9) is located inside the base (1).

2. The optocoupler testing device according to claim 1, characterized in that: The high-temperature testing mechanism (2) includes a high-temperature testing chamber (201), which contains a high-temperature testing cavity (202). A heating device (203) is installed on the top of the high-temperature testing cavity (202). A first temperature sensor (204) is installed inside the high-temperature testing cavity (202). The high-temperature testing chamber (201) has a high-temperature cavity inlet / outlet (205) on one side of the high-temperature testing cavity (202). A high-temperature sealing plate (206) is installed on the outside of the high-temperature sealing plate (206). A first guide rail (207) is slidably connected to both sides of the high-temperature sealing plate (206). The first guide rail (207) is fixedly installed on the high-temperature test chamber (201). A first connecting lock plate (208) is installed on the top of the high-temperature sealing plate (206). A first electric push rod (209) is installed on the top of the first connecting lock plate (208). The other side of the first electric push rod (209) is installed on the top of the inner side of the cover (5).

3. The optocoupler testing device according to claim 2, characterized in that: The low-temperature testing mechanism (3) includes a low-temperature testing chamber (301), a low-temperature testing cavity (302) is provided inside the low-temperature testing chamber (301), a refrigeration device (303) is installed on the top of the low-temperature testing cavity (302), a second temperature sensor (304) is installed inside the low-temperature testing cavity (302), and a low-temperature cavity inlet / outlet (305) is provided on one side of the low-temperature testing cavity (302) of the low-temperature testing chamber (301). A low-temperature sealing plate (306) is installed on the outside of the cover (5). A second guide rail (307) is slidably connected to both sides of the low-temperature sealing plate (306). The second guide rail (307) is fixedly installed on the low-temperature test chamber (301). A second connecting lock plate (308) is installed on the top of the low-temperature sealing plate (306). A second electric push rod (309) is installed on the top of the second connecting lock plate (308). The other side of the second electric push rod (309) is installed on the top of the inner side of the cover (5).

4. A photoelectric coupler testing device according to claim 3, wherein: The humidification assembly (4) includes a humidification chamber (401) installed on top of the high temperature test chamber (201). Water pumps (402) are installed on both sides inside the humidification chamber (401). The output end of the water pump (402) is connected to a delivery pipe (403). The output end of the delivery pipe (403) is connected to an atomizing nozzle (404). The atomizing nozzle (404) is located inside the high temperature test chamber (202) and below the heating device (203).

5. An opto-coupler testing apparatus as claimed in claim 4, wherein: The moving mechanism (9) includes a drive motor (901), the power output end of which is connected to a transmission wheel (902). The transmission wheel (902) is connected to a transmission belt (903), and the other side of the transmission belt (903) is connected to a drive wheel (904). The drive wheel (904) is connected to a lead screw (905), and bearings (906) are installed on both sides of the lead screw (905). The bearings (906) are installed on both sides inside the base (1), and the lead screw (905) is connected to a screw... The female movable seat (907) has a movable seat (908) mounted on its top. The top of the movable seat (908) is mounted on the bottom of the clamping test seat (8). The base (1) has a guide groove (909) at the corresponding movable seat (908). The movable seat (908) is slidably disposed in the guide groove (909). Folding covers (910) are mounted on both sides of the movable seat (908). The other side of the folding cover (910) is mounted on the side wall of the guide groove (909).

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