Storage chip test equipment convenient to disassemble

Abstract

The utility model discloses a storage chip testing device convenient to disassemble, which comprises a body mechanism, a testing head and a quick disassembling mechanism, the quick disassembling mechanism is arranged on one side of the body mechanism and can complete disassembling through one-time pulling, the quick disassembling mechanism comprises a base fixedly arranged on the top of a bottom plate, and when an inserting hole coincides with the horizontal position of a sliding rod, the base is inserted into the inserting hole. As one end of the sliding rod is not supported, the first spring is naturally opened immediately to push the limiting piece and the sliding rod on the inner wall of the limiting piece to slide to the position where the sliding rod is inserted into the insertion hole, the horizontal position of the push rod is limited, and finally the tray is dismounted, and during testing, reverse operation is performed to enable the second sliding block to move towards the center until the clamping block is inserted into the clamping groove, so that the tray can be fixed. According to the storage chip testing device, the situation that after the storage chip testing device completes testing, a worker needs to manually rotate a plurality of circles of screw rods for loosening can be effectively avoided, the labor input of the worker is effectively reduced, meanwhile, the convenience degree in the dismounting process is guaranteed, and the machining efficiency is improved.

Description

A memory chip testing device that is easy to disassemble Technical Field

[0001] This utility model belongs to the field of memory chip testing technology, specifically relating to a memory chip testing device that is easy to disassemble. Background Technology

[0002] Memory chip testing equipment is a specialized device used to test and verify the performance, functionality, and reliability of memory chips. These devices play a crucial role in the memory chip manufacturing process, ensuring that each chip meets the specified standards before leaving the factory. As memory technology continues to develop, these devices are also constantly being upgraded and improved to adapt to new testing requirements.

[0003] After completing the test, some existing memory chip testing equipment often requires personnel to manually rotate the positioning fixture's infeed screw several times to loosen the equipment's clamping limit on the tray containing the memory chips. When there are a large number of memory chips to be tested, the frequent rotation of the screw to disassemble the device will greatly increase the physical exertion of personnel and also have a relatively negative impact on testing efficiency. Summary of the Invention

[0004] The technical problem this invention aims to solve is to overcome existing defects and provide a memory chip testing device that is easy to disassemble. This addresses the issue mentioned in the background art that some existing memory chip testing devices often require manual rotation of the positioning clamp's infeed screw several times after testing to loosen the clamp's grip on the tray containing the memory chips. When there are many memory chips to be tested, this method of frequently rotating the screw several times greatly increases the physical exertion of personnel and also has a negative impact on testing efficiency.

[0005] To achieve the above objectives, this utility model provides the following technical solution: a memory chip testing device that is easy to disassemble, comprising a main body, a test head, and a quick-release mechanism disposed on one side of the main body, which can be disassembled by a single pull. The quick-release mechanism includes a base fixedly installed on the top of a base plate, a push rod slidably connected to the inner side of the base, an insertion hole provided on the inner side of one end of the push rod, a first slider fixedly connected to one end of the push rod, a plurality of first slide rails slidably connected to the bottom of the first slider, a plurality of rotating arms rotatably connected to the top of the first slider, a second slider rotatably connected to the inner side of one end of the rotating arm, and a plurality of second slide rails slidably connected to the bottom of the second slider. The test head has a base plate fixedly connected to the bottom of the first and second slide rails. A top plate is fixedly installed on the top of the test head. Several top plates are symmetrically arranged. An adjusting screw is threaded to the inner side of each top plate. A locking block is rotatably connected to one side of the adjusting screw. A side frame is fixedly connected to one side of the base. A sliding rod is slidably connected to the inner side of the side frame. One end of the sliding rod is slidably connected to the base. A limiting piece is fixedly connected to the outer side of one end of the sliding rod. A first spring is provided between the side frame and the limiting piece. A sliding rod is movably connected to the inner side of the first spring. Pushing the push rod will cause the top plates to open to both sides, releasing the limiting state and avoiding the need to rotate the screw several times to loosen the plate.

[0006] Preferably, a plurality of columns are symmetrically arranged on the outer side of the base plate, a top plate is fixedly connected to the top of the columns, a hydraulic telescopic cylinder is fixedly installed on the top of the top plate, a base plate is fixedly connected to the output end of the hydraulic telescopic cylinder, a plurality of limiting rods are symmetrically arranged on the top of the base plate, a test head is fixedly connected to the bottom of the base plate, a plurality of legs are symmetrically arranged on one side of the top of the base plate, a support plate is fixedly connected to the top of the legs, a tray is movably connected to the top of the support plate, and a plurality of slots are symmetrically arranged on both sides of the tray.

[0007] Preferably, a holding button is fixedly connected to one end of both the locking block and the slide rod, a top piece is threadedly connected to the outer side of the locking block, a side frame is slidably connected to the outer side of the slide rod, a lifting button is fixedly connected to one end of the push rod, and a base is slidably connected to the outer side of the push rod.

[0008] Preferably, a limit strip is fixedly connected to one side of both the first slide rail and the second slide rail, a first slider is slidably connected to the outer side of the first slide rail, and a second slider is slidably connected to the outer side of the second slide rail.

[0009] Preferably, a ball bearing is rotatably connected to the inner side of one end of the slide rod.

[0010] Preferably, a crossbar is fixedly connected between adjacent top pieces, and a second slider is fixedly connected to the bottom of the top piece.

[0011] Preferably, a sliding rod is fixedly connected to one side of the card block, and several sliding rods are symmetrically arranged. A top plate is slidably connected to the outside of the sliding rod.

[0012] Preferably, a second spring is movably connected to the outer side of one end of the locking block, and the second spring is located between the top plate and the holding button.

[0013] Compared with the prior art, this utility model provides a memory chip testing device that is easy to disassemble, and has the following advantages:

[0014] 1. This utility model uses a push rod to open a hydraulic telescopic cylinder, which moves the test head at the bottom of the substrate to the required height. The test head then tests the memory chip in the tray. After the test is completed, the lifting button is squeezed, and the push rod is pushed from the inside of the base to move the first slider to the outside of the first slide rail. The second slider is then pushed by the rotating arm to move to the outside of the second slide rail, causing the second slider to open to both sides until the outer wall of the card block is separated from the inner wall of the card slot, thus unlocking the tray. During the continuous sliding of the push rod, when the horizontal position of the insertion hole coincides with that of the slide rod, the first spring naturally opens due to the lack of support at one end of the slide rod, pushing the limit plate and the slide rod on its inner wall to slide to the position where the slide rod is inserted into the insertion hole, thus limiting the horizontal position of the push rod. Finally, the tray is removed. When testing, the operation is reversed, and the second slider is moved towards the center until the card block is inserted into the card slot to fix the tray. This effectively avoids the situation where personnel need to manually rotate the screw several times to loosen it after the memory chip testing equipment has completed the test. This effectively reduces the labor input of personnel, ensures the convenience of the removal process, and improves processing efficiency.

[0015] 2. By setting a shift rod, this utility model can effectively ensure the horizontal position of the adjusting block of the rotating adjusting screw, improve the stability of the block position during the contact force between the outer wall of the block and the inner wall of the slot, and reduce its swing amplitude.

[0016] 3. By incorporating ball bearings, this utility model effectively protects the push rod from wear at one end during its sliding motion within the base, thereby ensuring the lifespan of the push rod.

[0017] The parts of this device not covered herein are the same as or can be implemented using existing technologies. This utility model has a scientific and reasonable structure, is safe and convenient to use, and provides great help to people. Attached Figure Description

[0018] The accompanying drawings are provided to further illustrate the present invention and form part of the specification. They are used together with the embodiments of the present invention to explain the present invention, but do not constitute a limitation thereof. In the drawings:

[0019] Figure 1 is a schematic diagram of the isometric structure of a memory chip testing device that is easy to disassemble according to this utility model;

[0020] Figure 2 is an exploded view of a memory chip testing device that is easy to disassemble according to this utility model.

[0021] Figure 3 is an isometric structural diagram of the quick-release mechanism of a memory chip testing device that is easy to disassemble, as proposed in this utility model.

[0022] Figure 4 is an exploded view of the quick-release mechanism of a memory chip testing device that is easy to disassemble, as proposed in this utility model.

[0023] Figure 5 is an enlarged structural diagram of point A in Figure 4;

[0024] In the diagram: Main body mechanism 1, base plate 101, column 102, top plate 103, hydraulic telescopic cylinder 104, base plate 105, limit rod 106, test head 107, leg 108, tray 109, slot 110, support plate 111, quick release mechanism 2, base 201, push rod 202, insertion hole 203, first slider 204, first slide rail 205, rotating arm 206, second slider 207, second slide rail 208, top plate 209, adjusting screw 210, locking block 211, side frame 212, slide rod 213, limit piece 214, first spring 215, holding button 3, lifting button 4, limit strip 5, ball bearing 6, crossbar 7, moving rod 8, second spring 9. Detailed Implementation

[0025] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0026] Please refer to Figures 1-5. This utility model provides a technical solution: a memory chip testing device that is easy to disassemble, including a main body mechanism 1, a test head 107, and a quick-release mechanism 2 disposed on one side of the main body mechanism 1, which can be disassembled by a single pull. The quick-release mechanism 2 includes a base 201 fixedly installed on the top of the base plate 101. A push rod 202 is slidably connected to the inner side of the base 201. An insertion hole 203 is provided on the inner side of one end of the push rod 202. A first slider 204 is fixedly connected to one end of the push rod 202. A plurality of first slide rails 205 are slidably connected to the bottom of the first slider 204. A plurality of rotating arms 206 are rotatably connected to the top of the first slider 204. The inner side of one end of the rotating arm 206 rotates... A second slider 207 is connected, and several second slide rails 208 are slidably connected to the bottom of the second slider 207. A base plate 101 is fixedly connected to the bottom of the first slide rail 205 and the second slide rail 208. A top plate 209 is fixedly installed on the top of the test head 107. Several top plates 209 are symmetrically arranged. An adjusting screw 210 is threadedly connected to the inner side of the top plate 209. A locking block 211 is rotatably connected to one side of the adjusting screw 210. A side frame 212 is fixedly connected to one side of the base 201. A slide rod 213 is slidably connected to the inner side of the side frame 212. One end of the slide rod 213 is slidably connected to the base 201. A limiting piece 214 is fixedly connected to the outer side of one end of the slide rod 213. The side frame 212 and the limiting piece 214 are connected to each other. A first spring 215 is provided, and a slide rod 213 is movably connected to the inner side of the first spring 215. Pushing the push rod 202 will cause the top plate 209 to open to both sides, releasing the limiting state and avoiding the need to rotate the screw several times to loosen it. Opening the hydraulic telescopic cylinder 104 will move the test head 107 at the bottom of the substrate 105 to the required height. Opening the test head 107 will test the memory chip in the tray 109. After the test is completed, directly pinch the lifting button 4, push the push rod 202 on the inner side of the base 201, and drive the first slider 204 to slide on the outer side of the first slide rail 205. Driven by the rotating arm 206, the second slider 207 will slide on the outer side of the second slide rail 208, so that... The second slider 207 opens to both sides until the outer wall of the locking block 211 disengages from the inner wall of the slot 110, thus locking the position of the tray 109. During the continuous sliding of the push rod 202, when the horizontal position of the insertion hole 203 coincides with that of the slide rod 213, the first spring 215 naturally opens due to the lack of support at one end of the slide rod 213, pushing the limiting piece 214 and the slide rod 213 on its inner wall to slide to the position where the slide rod 213 is inserted into the insertion hole 203, thus restricting the horizontal position of the push rod 202. Finally, the tray 109 is removed. During testing, the operation is reversed so that the second slider 207 moves towards the center until the locking block 211 is inserted into the slot 110, thus fixing the tray 109.

[0027] In this utility model, preferably, a plurality of columns 102 are symmetrically arranged on the outer side of the base plate 101. A top plate 103 is fixedly connected to the top of the columns 102. A hydraulic telescopic cylinder 104 is fixedly installed on the top of the top plate 103. A base plate 105 is fixedly connected to the output end of the hydraulic telescopic cylinder 104. A plurality of limiting rods 106 are symmetrically arranged on the top of the base plate 105. A test head 107 is fixedly connected to the bottom of the base plate 105. A plurality of legs 108 are symmetrically arranged on one side of the top of the base plate 101. A support plate 111 is fixedly connected to the top of the legs 108. A tray 109 is movably connected to the top of the support plate 111. A plurality of slots 110 are symmetrically arranged on both sides of the tray 109. After locking the position of the tray 109, the hydraulic telescopic cylinder 104 is opened to drive the base plate 105 and the test head 107 to descend to the required height. The memory chip is then tested through the test head 107.

[0028] In this utility model, preferably, a holding button 3 is fixedly connected to one end of both the locking block 211 and the slide rod 213, a top piece 209 is threadedly connected to the outside of the locking block 211, a side frame 212 is slidably connected to the outside of the slide rod 213, a lifting button 4 is fixedly connected to one end of the push rod 202, and a base 201 is slidably connected to the outside of the push rod 202, which can effectively and conveniently allow personnel to directly pinch and rotate or pull.

[0029] In this utility model, preferably, a limiting strip 5 is fixedly connected to one side of both the first slide rail 205 and the second slide rail 208, a first slider 204 is slidably connected to the outside of the first slide rail 205, and a second slider 207 is slidably connected to the outside of the second slide rail 208, which can effectively limit the stroke of the first slide rail 205 and the second slide rail 208 and reduce the risk of falling off due to excessive sliding.

[0030] In this utility model, preferably, a ball bearing 6 is rotatably connected to the inner side of one end of the slide rod 213, which can effectively protect the push rod 202 from wear at one end of the slide rod 213 during the sliding process in the base 201, thereby ensuring the service life of the push rod 202.

[0031] In this utility model, preferably, a crossbar 7 is fixedly connected between adjacent top pieces 209, and a second slider 207 is fixedly connected to the bottom of the top piece 209, which can effectively ensure the stability of the structure between the top pieces 209.

[0032] In this utility model, preferably, a sliding rod 8 is fixedly connected to one side of the locking block 211, and several sliding rods 8 are symmetrically arranged. A top piece 209 is slidably connected to the outside of the sliding rod 8, which can effectively ensure that the horizontal position of the locking block 211 is adjusted by rotating the adjusting screw 210, improve the stability of the position of the locking block 211 during the contact force between the outer wall of the locking block 211 and the inner wall of the locking groove 110, and reduce its swing amplitude.

[0033] In this utility model, preferably, a second spring 9 is movably connected to the outer side of one end of the locking block 211. The second spring 9 is located between the top plate 209 and the holding button 3, which can effectively improve the stability of the locking block 211 and reduce the degree of loosening.

[0034] The working principle and usage process of this utility model are as follows: In use, the hydraulic telescopic cylinder 104 is opened to move the test head 107 at the bottom of the substrate 105 to the required height. The test head 107 is then opened to test the memory chip in the tray 109. After the test is completed, the lifting button 4 is directly squeezed, and the push rod 202 is pushed from the inside of the base 201, causing the first slider 204 to slide on the outside of the first slide rail 205. Pushed by the rotating arm 206, the second slider 207 is driven to slide on the outside of the second slide rail 208, causing the second slider 207 to open to both sides until the outer wall of the locking block 211 disengages from the inner wall of the slot 110, thus unlocking the tray 109. During the continuous sliding of the push rod 202, when the insertion hole 203 and the sliding rod... When the horizontal positions of 213 coincide, since one end of the slide rod 213 lacks support, the first spring 215 naturally opens, pushing the limiting piece 214 and the slide rod 213 on its inner wall to slide to the position where the slide rod 213 is inserted into the insertion hole 203, thus restricting the horizontal position of the push rod 202. Finally, the tray 109 is removed. During testing, the operation is reversed, so that the second slider 207 moves towards the center until the card block 211 is inserted into the card slot 110 to fix the tray 109. This effectively avoids the situation where personnel need to manually rotate the screw several times to loosen it after the memory chip testing equipment has completed the test. While effectively reducing the labor input, it also ensures the convenience of the removal process and improves the processing efficiency.

[0035] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A memory chip testing device that is easy to disassemble, characterized in that: The system includes a main body (1), a test head (107), and a quick-release mechanism (2) located on one side of the main body (1) that can be disassembled by a single pull. The quick-release mechanism (2) includes a base (201) fixedly installed on the top of the base plate (101). A push rod (202) is slidably connected to the inner side of the base (201). An insertion hole (203) is provided on the inner side of one end of the push rod (202). A first slider (204) is fixedly connected to one end of the push rod (202). Several first slide rails (205) are slidably connected to the bottom of the first slider (204). Several rotating arms (206) are rotatably connected to the top of the first slider (204). A second slider (207) is rotatably connected to the inner side of one end of the rotating arm (206). Several second slide rails (208) are slidably connected to the bottom of the second slider (207). The bottom of the first slide rails (205) and the second slide rails (208) are fixedly connected to the bottom of the base plate (101). 101), a top plate (209) is fixedly installed on the top of the test head (107). Several top plates (209) are symmetrically arranged. An adjusting screw (210) is threadedly connected to the inner side of the top plate (209). A locking block (211) is rotatably connected to one side of the adjusting screw (210). A side frame (212) is fixedly connected to one side of the base (201). A sliding rod (213) is slidably connected to the inner side of the side frame (212). The base (201) is slidably connected to one end of the sliding rod (213). A limiting piece (214) is fixedly connected to the outer side of one end of the sliding rod (213). A first spring (215) is provided between the side frame (212) and the limiting piece (214). The sliding rod (213) is movably connected to the inner side of the first spring (215). Pushing the push rod (202) can drive the top plate (209) to open to both sides, release the limiting state, and avoid the situation of loosening by rotating the screw several times.

2. The memory chip testing device with easy disassembly according to claim 1, characterized in that: A number of columns (102) are symmetrically arranged on the outer side of the base plate (101). A top plate (103) is fixedly connected to the top of the columns (102). A hydraulic telescopic cylinder (104) is fixedly installed on the top of the top plate (103). A base plate (105) is fixedly connected to the output end of the hydraulic telescopic cylinder (104). A number of limiting rods (106) are symmetrically arranged on the top of the base plate (105). A test head (107) is fixedly connected to the bottom of the base plate (105). A number of legs (108) are symmetrically arranged on one side of the top of the base plate (101). A tray (111) is fixedly connected to the top of the legs (108). A pallet (109) is movably connected to the top of the tray (111). A number of slots (110) are symmetrically arranged on both sides of the pallet (109).

3. The memory chip testing device with easy disassembly according to claim 1, characterized in that: The locking block (211) and the slide rod (213) are both fixedly connected to a holding button (3) at one end. The locking block (211) is threadedly connected to a top plate (209). The slide rod (213) is slidably connected to a side frame (212). The push rod (202) is fixedly connected to a lifting button (4) at one end. The push rod (202) is slidably connected to a base (201).

4. The memory chip testing device with easy disassembly according to claim 1, characterized in that: Limiting strips (5) are fixedly connected to one side of the first slide rail (205) and the second slide rail (208). A first slider (204) is slidably connected to the outside of the first slide rail (205), and a second slider (207) is slidably connected to the outside of the second slide rail (208).

5. The memory chip testing device with easy disassembly according to claim 1, characterized in that: A ball bearing (6) is rotatably connected to the inner side of one end of the slide bar (213).

6. The memory chip testing device with easy disassembly according to claim 1, characterized in that: The top plate (209) is fixedly connected with a crossbar (7) between adjacent pieces, and the bottom of the top plate (209) is fixedly connected with a second slider (207).

7. The memory chip testing device with easy disassembly according to claim 1, characterized in that: A sliding rod (8) is fixedly connected to one side of the card block (211). Several sliding rods (8) are symmetrically arranged, and a top piece (209) is slidably connected to the outside of the sliding rod (8).

8. The memory chip testing device with easy disassembly according to claim 3, characterized in that: A second spring (9) is movably connected to the outer side of one end of the locking block (211), and the second spring (9) is located between the top plate (209) and the holding button (3).

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