Alloy chemical element two-dimensional distribution detection system

Abstract

The utility model provides an alloy chemical element two-dimensional distribution detection system, and belongs to the technical field of metal detection. The alloy chemical element two-dimensional distribution detection system comprises an emitter, a light splitting part and a photoelectric detector, the emitter is configured to be capable of emitting laser, when the laser irradiates a sample, the sample can generate plasma light beams, the plasma light beams comprise characteristic light beams of at least two elements, and when the plasma light beams irradiate the light splitting part, the photoelectric detector emits photoelectric signals. Wherein the characteristic light beam of one element can penetrate through the light splitting part, the characteristic light beam of the other element can be reflected on the light splitting part so as to separate the plasma light beam into two characteristic light beams containing different element characteristics, and the photoelectric detector is configured to be capable of receiving the characteristic light beams of the elements so as to detect the content of the elements. According to the two-dimensional distribution detection system for the alloy chemical elements, the sample detection time can be shortened, and the efficiency of analyzing the distribution of various elements in the sample is improved.

Description

Technical Field

[0001] This utility model relates to the field of metal detection technology, and in particular to a two-dimensional distribution detection system for alloy chemical elements. Background Technology

[0002] The widespread application of alloy materials in aerospace, automotive manufacturing, and electronic devices is primarily due to their excellent mechanical properties and chemical stability. However, the properties of an alloy are often closely related to the spatial distribution of its constituent elements. For example, localized enrichment of certain elements can lead to a decrease in the material's mechanical strength or corrosion resistance. Therefore, rapid and accurate analysis of the elemental distribution in alloys is crucial for optimizing material properties and controlling quality.

[0003] While traditional analytical techniques such as energy-dispersive spectroscopy, wavelength-dispersive spectroscopy, or mass spectrometry offer high precision, they suffer from limitations in sample preparation, detection speed, and large-area distribution analysis. Particularly in industrial production, these methods often require significant time for sample polishing and cannot meet the demands for rapid, batch detection. Utility Model Content

[0004] This invention provides a two-dimensional distribution detection system for alloy chemical elements, the purpose of which is to shorten the sample detection time and improve the efficiency of analyzing the distribution of various elements in the sample.

[0005] To achieve the above objectives, this utility model provides a two-dimensional distribution detection system for alloy chemical elements, used to detect samples containing at least two elements, including:

[0006] The emitter is configured to emit a laser, which, when irradiated by the laser, enables the sample to generate a plasma beam, the plasma beam comprising characteristic beams of at least two of the elements;

[0007] A beam splitter, when the plasma beam is irradiated by the beam splitter, allows the characteristic beam of one element to pass through the beam splitter, while the characteristic beam of the other element is reflected on the beam splitter, thereby splitting the plasma beam into two characteristic beams containing different elemental characteristics.

[0008] A photodetector is configured to receive the characteristic beams of different elements to detect the content of the elements.

[0009] In one embodiment, the detection system includes a moving platform on which the sample is placed. The sample and the moving platform remain relatively stationary, so that the moving platform can move the sample in three intersecting directions.

[0010] In one embodiment, the detection system includes a first focusing lens disposed between the transmitter and the sample, such that the first focusing lens can focus the laser onto the sample.

[0011] In one embodiment, the detection system includes a collimating lens disposed between the sample and the beam splitter, such that the collimating lens can collimate the plasma beam into the beam splitter.

[0012] In one embodiment, the detection system includes a notch filter configured to block the laser beam. The notch filter is disposed between the beam splitter and the collimating lens to filter the laser beam from the plasma beam.

[0013] In one embodiment, the detection system includes a first bandpass filter and a second bandpass filter, both configured to transmit only the characteristic beam of one of the elements. The photodetector includes a first detector and a second detector. The first bandpass filter is disposed between the beam splitter and the first detector so that the first detector receives the characteristic beam of one of the elements. The second bandpass filter is disposed between the beam splitter and the second detector so that the second detector receives the characteristic beam of the other element.

[0014] In one embodiment, the detection system includes a second focusing lens and a third focusing lens. The second focusing lens is disposed between the first bandpass filter and the first detector to focus one of the characteristic beams onto the first detector. The third focusing lens is disposed between the second bandpass filter and the second detector to focus another of the characteristic beams onto the second detector.

[0015] The above-mentioned solution of this utility model has the following beneficial effects:

[0016] In this embodiment, a laser is used to generate a plasma beam containing the characteristic sets of each element in the sample. After separation by a beam splitter, the plasma beam is divided into characteristic beams of two elements. These beams are then detected by a photodetector to determine the content and proportion of the two elements in the sample. Since laser irradiation is used, it is not sensitive to the roughness of the sample surface, eliminating the need for complex pretreatment and significantly reducing preparation time. The detection system of this application can detect both rough and smooth samples, making it highly practical. Furthermore, the high speed of light allows for rapid detection at a preset location. Subsequently, the sample can be moved to another location for detection, enabling large-area elemental distribution analysis of the sample in a short time, resulting in high detection efficiency.

[0017] Other beneficial effects of this invention will be described in detail in the following detailed description section. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the structure of a two-dimensional distribution detection system for alloy chemical elements in one embodiment of the present invention;

[0019] Figure 2 This is a top view of the sample set on a mobile platform in one embodiment of the present invention.

[0020] [Explanation of Labels in the Attached Images]

[0021] 1. Sample; 2. Emitter; 21. Laser; 3. Beam splitter; 4. Photodetector; 41. First detector; 42. Second detector; 5. Moving platform; 6. First focusing lens; 7. Collimating lens; 8. Notch filter; 91. First bandpass filter; 92. Second bandpass filter; 10. Second focusing lens; 11. Third focusing lens. Detailed Implementation

[0022] To make the technical problems, solutions, and advantages of this utility model clearer, a detailed description will be provided below with reference to the accompanying drawings and specific embodiments. Obviously, the described embodiments are only some, not all, of the embodiments of this utility model. All other embodiments obtained by those skilled in the art based on the embodiments of this utility model without creative effort are within the scope of protection of this utility model. Furthermore, the technical features involved in the different embodiments of this utility model described below can be combined with each other as long as they do not conflict with each other.

[0023] In the description of this utility model, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the accompanying drawings and are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this utility model. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0024] In the description of this utility model, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "joining" should be interpreted broadly. For example, they can refer to a locking connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model based on the specific circumstances.

[0025] Laser-induced breakdown spectroscopy (LIBS) technology has gradually become an important method for elemental analysis due to its fast analysis speed, lack of complex sample preparation requirements, and ability to simultaneously detect multiple elements. This application proposes a two-dimensional distribution detection system for alloy chemical elements based on LIBS technology, which can achieve high-resolution and high-efficiency detection of alloy element distribution without the need for rigorous sample pretreatment, and is suitable for distribution measurement of large-area alloy samples.

[0026] Specifically, please refer to Figure 1A two-dimensional distribution detection system for alloy chemical elements is used to detect a sample 1 containing at least two elements. The detection system includes an emitter 2, a beam splitter 3, and a photodetector 4. Sample 1 contains at least two elements and can be an alloy to be analyzed for elemental distribution. The emitter 2 is configured to emit a laser 21. The wavelength range of the laser 21 emitted by the emitter 2 can be from ultraviolet to infrared wavelengths, and the pulse width range of the laser 21 can be from femtoseconds to milliseconds. The type of emitter 2 is not limited here. When the laser 21 irradiates sample 1, sample 1 generates a plasma beam, which includes characteristic beams of at least two elements. When the plasma beam irradiates the beam splitter 3, the characteristic beam of one element is transmitted through the beam splitter 3, and the characteristic beam of the other element is reflected through the beam splitter 3, thus separating the plasma beam into two characteristic beams containing different elemental characteristics. The beam splitter 3 can be a beam splitter with a 1:1 transmittance-to-reflection ratio for the characteristic beams of the two elements. This means that only the characteristic beam of one element can completely pass through the beam splitter, while the characteristic beam of the other element is completely reflected, thus ensuring equal separation of the plasma beams. Alternatively, the beam splitter 3 can be a dichroic mirror with high transmittance for the characteristic beam of one element and high reflectance for the characteristic beam of the other element. Two photodetectors 4 can be installed downstream of the beam splitter 3, enabling them to receive the characteristic beams of different elements and thus detect the elemental content in sample 1.

[0027] For example, please refer to Figure 1 The laser 21 emitted by the transmitter 2 illuminates a preset position on the sample 1, causing a plasma beam to be generated at that position. This plasma beam enters the beam splitter 3 at a 45° incident angle, splitting into two mutually perpendicular feature beams containing different elemental characteristics. Two photodetectors 4 are positioned downstream of the beam splitter 3, with the lines connecting one photodetector 4 and the beam splitter 3 perpendicular to each other. This allows the two photodetectors 4 to receive the two feature beams containing different elemental characteristics, thereby enabling the detection of the element content at the preset position on the sample 1. By moving the sample 1 and repeating the above process, the element content at different positions on the sample 1 can be detected, thus obtaining the alloy element content ratio at each position within a certain area.

[0028] In this embodiment, a plasma beam carrying the characteristic sets of each element is generated in sample 1 by laser 21. After separation by beam splitter 3, the plasma beam is separated into characteristic beams of two elements. After detection by photodetector 4, the content and ratio of the two elements in sample 1 can be determined. Since laser 21 is used for irradiation, it is not sensitive to the roughness of the sample 1 surface, eliminating the need for complex pretreatment of sample 1 and significantly reducing the preparation time for detection. The detection system of this application can detect both rough and smooth samples 1, making it highly practical. Furthermore, the high speed of light allows for rapid detection at a preset position. Subsequently, sample 1 can be moved to another position for detection, enabling large-area elemental distribution analysis of sample 1 to be completed in a short time, resulting in high detection efficiency.

[0029] In one embodiment, please refer to Figure 1 and Figure 2 The detection system includes a moving platform 5, on which sample 1 is placed. Sample 1 remains relatively stationary with respect to the moving platform 5, allowing the moving platform 5 to move sample 1 along three intersecting directions. For example, the moving platform 5 can move along three mutually perpendicular directions (X, Y, and Z) to move sample 1 in these directions. Sample 1 moves in the Z direction so that laser 21 can be focused on it. Sample 1 also moves within the plane formed by the X and Y directions, allowing it to move along a specific path to adjust the position of laser 21 irradiating sample 1. This enables the detection system to detect the content and proportion of each element in sample 1 over a relatively large range.

[0030] In one embodiment, please refer to Figure 1 The detection system includes a first focusing lens 6, which is positioned between the transmitter 2 and the sample 1. The first focusing lens 6 focuses the laser 21 onto the sample 1, thereby ensuring that the energy of the laser 21 is sufficiently transmitted to the sample 1, thus enabling the sample 1 to generate a plasma beam effectively. The first focusing lens 6 can be an objective lens, possessing high transmittance and a high damage threshold for the laser 21 wavelength band. The objective lens can be a lens-type objective lens or a reflective objective lens. It should be noted that the elemental distribution spatial resolution achievable by the detection system of this application is determined by the capability of the first focusing lens 6.

[0031] In one embodiment, please refer to Figure 1The detection system includes a collimating lens 7, which is positioned between the sample 1 and the beam splitter 3 to collimate the plasma beam into the beam splitter 3. It should be noted that when the laser 21 focuses and irradiates the surface of the sample 1, the resulting plasma beam diverges in all directions. The collimating lens 7 is a convex lens. When the position of the diverging plasma beam source (i.e., the position where the laser 21 focuses on the surface of the sample 1) coincides with the focal point of the collimating lens 7, the diverging plasma beam within the range of the collimating lens 7 can be collimated, allowing the plasma beam to enter the beam splitter 3 at a better angle and direction. The collimating lens 7 can be a positive focal length lens made of quartz glass or other materials with high transmittance for characteristic beams of elements within the sample 1.

[0032] In one embodiment, please refer to Figure 1 The detection system includes a notch filter 8, which is configured to block laser 21. The notch filter 8 is disposed between the beam splitter 3 and the collimating lens 7 so that the notch filter 8 can filter the laser 21 in the plasma beam to protect the components located downstream of the beam splitter 3, such as the beam splitter 3 and the photodetector 4.

[0033] In one embodiment, please refer to Figure 1 The detection system includes a first bandpass filter 91 and a second bandpass filter 92. Both the first bandpass filter 91 and the second bandpass filter 92 are configured to transmit only the feature beam of one element. The photodetector 4 includes a first detector 41 and a second detector 42. The first bandpass filter 91 is disposed between the beam splitter 3 and the first detector 41 to further purify the feature beam incident on the first detector 41, so that the first detector 41 receives the feature beam of one element. The second bandpass filter 92 is disposed between the beam splitter 3 and the second detector 42 to further purify the feature beam incident on the second detector 42, so that the second detector 42 receives the feature beam of another element. For example, the first bandpass filter 91 has high transmittance only for the feature beam of one element in sample 1, and near-zero transmittance for the feature beams of other elements, to purify the feature beam of the element to be detected incident on the first detector 41. The first bandpass filter 91 and the second bandpass filter 92 correspond to the feature beams of different elements, respectively.

[0034] In one embodiment, please refer to Figure 1The detection system includes a second focusing lens 10 and a third focusing lens 11. The second focusing lens 10 is disposed between the first bandpass filter 91 and the first detector 41 to focus one type of characteristic beam onto the first detector 41, allowing the characteristic beam to enter the first detector 41 sufficiently, thereby enabling the first detector 41 to detect the characteristic beam effectively. The third focusing lens 11 is disposed between the second bandpass filter 92 and the second detector 42 to focus another type of characteristic beam onto the second detector 42, allowing the characteristic beam to enter the second detector 42 sufficiently, thereby enabling the second detector 42 to detect the characteristic beam effectively. For example, the second focusing lens 10 and the third focusing lens 11 can be positive focal length lenses made of quartz glass or other materials with high transmittance for characteristic beams of various elements within the sample 1.

[0035] The above description is the preferred embodiment of this utility model. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the principle of this utility model, and these improvements and modifications should also be considered within the protection scope of this utility model.

Claims

1. A two-dimensional distribution detection system for alloy chemical elements, used to detect samples containing at least two elements, characterized in that, include: The emitter is configured to emit a laser, which, when irradiated by the laser, enables the sample to generate a plasma beam, the plasma beam comprising characteristic beams of at least two of the elements; A beam splitter, when the plasma beam is irradiated by the beam splitter, allows the characteristic beam of one element to pass through the beam splitter, while the characteristic beam of the other element is reflected on the beam splitter, thereby splitting the plasma beam into two characteristic beams containing different elemental characteristics. A photodetector is configured to receive the characteristic beams of different elements to detect the content of the elements.

2. The alloy chemical element two-dimensional distribution detection system according to claim 1, characterized in that, The detection system includes a moving platform, on which the sample is placed. The sample and the moving platform remain relatively stationary, so that the moving platform can move the sample in three intersecting directions.

3. The alloy chemical element two-dimensional distribution detection system according to claim 1, characterized in that, The detection system includes a first focusing lens disposed between the transmitter and the sample, so that the first focusing lens can focus the laser onto the sample.

4. The alloy chemical element two-dimensional distribution detection system according to claim 1, characterized in that, The detection system includes a collimating lens disposed between the sample and the beam splitter, so that the collimating lens can collimate the plasma beam into the beam splitter.

5. The alloy chemical element two-dimensional distribution detection system according to claim 4, characterized in that, The detection system includes a notch filter configured to block the laser beam. The notch filter is disposed between the beam splitter and the collimating lens so that it can filter the laser beam from the plasma beam.

6. The alloy chemical element two-dimensional distribution detection system according to claim 1, characterized in that, The detection system includes a first bandpass filter and a second bandpass filter, both configured to transmit only the characteristic beam of one of the elements. The photodetector includes a first detector and a second detector. The first bandpass filter is disposed between the beam splitter and the first detector, so that the first detector receives the characteristic beam of one of the elements. The second bandpass filter is disposed between the beam splitter and the second detector, so that the second detector receives the characteristic beam of the other element.

7. The alloy chemical element two-dimensional distribution detection system according to claim 6, characterized in that, The detection system includes a second focusing lens and a third focusing lens. The second focusing lens is disposed between the first bandpass filter and the first detector to focus one of the characteristic beams onto the first detector. The third focusing lens is disposed between the second bandpass filter and the second detector to focus another of the characteristic beams onto the second detector.

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