Electron microscope sample clamp with adjustable height and rotation angle

Abstract

The utility model belongs to the technical field of detection, and discloses a height and rotation angle adjustable electron microscope sample clamp which comprises a support, a base connected to the support, a spherical groove formed in the base, a spherical connecting block connected in the spherical groove in a spherical mode, and a first threaded sleeve connected in the spherical connecting block in a penetrating mode. According to the scheme, the base is provided with the spherical groove and the spherical connecting block to form an adjustable spherical connecting mechanism, and the adjustable spherical connecting mechanism is matched with the first threaded sleeve penetrating through the sphere center and the adjusting rod extending long, so that precise adjustment of the height and the rotating angle of the objective table is achieved, and the fine adjustment precision is improved through the leverage effect of the adjusting rod; the problem of unstable adjustment caused by too short lever arm of a traditional structure is effectively solved; meanwhile, the adjusting rod with anti-skid lines at the bottom end and the liftable positioning block facilitate rapid positioning and resetting, the whole clamp is compact in structure and convenient and fast to operate, and the requirements for multiple angles, height fine adjustment and high stability of sample morphology observation and energy spectrum analysis under the electron microscope can be met.

Description

Technical Field

[0001] This utility model relates to the field of detection technology, and in particular to an electron microscope sample holder with adjustable height and rotation angle. Background Technology

[0002] When using an electron microscope to observe the morphology of samples, the observation surface of some samples is not parallel to the bottom surface, causing the observation surface to tilt after the sample is placed on the worktable, which affects the collection of electron signals and is not conducive to morphological observation and energy dispersive spectroscopy analysis. When observing multiple samples at the same time, the uneven height of the mosaic or original sample can cause an unsuitable focal point, affecting the imaging and energy dispersive spectroscopy analysis quality. Improper sample height may also damage the electron gun. Therefore, it is essential to design an electron microscope sample holder with adjustable height and rotation angle.

[0003] A search of Chinese utility model patent (publication number CN221351267U) reveals an electron microscope sample fixture with adjustable height and angle. The height of the worktable is adjusted by a telescopic support rod, and the angle of the worktable is adjusted by an angle adjustment mechanism, thereby achieving adjustment of the height of the sample mounted on the upper part of the worktable and the angle of the sample observation surface. The fixture has a simple structure, is easy to manufacture and use, and effectively solves the problems of large surface inclination of electron microscope samples making observation impossible, as well as inconsistent heights when observing multiple samples simultaneously, greatly improving experimental efficiency and the accuracy of experimental results.

[0004] However, practical application has revealed that this technical solution still has at least the following drawbacks:

[0005] In this scheme, the worktable can rotate freely through a spherical connecting mechanism. Although this structure is flexible, the need for fine-tuning of the angle is extremely high when observing samples under an electron microscope. Because the "lever arm" is very short when adjusting the spherical connecting block, even a slight touch of a finger may cause an excessive rotation angle, making it difficult to achieve precise control. Furthermore, this scheme lacks a mechanism for quickly resetting the worktable after the angle is adjusted, which will cause inconvenience when testing multiple batches of samples. Utility Model Content

[0006] This invention aims to provide an electron microscope sample holder with adjustable height and rotation angle to solve the problems mentioned in the background art. This solution uses a spherical groove and a spherical connecting block on the base to form an adjustable spherical connection mechanism. Combined with a first threaded sleeve penetrating the center of the sphere and a relatively long adjusting rod, it not only achieves precise adjustment of the stage height and rotation angle but also improves fine-tuning accuracy by utilizing the lever effect of the adjusting rod. This effectively overcomes the instability caused by the short lever arm in traditional structures. Simultaneously, the bottom end features an adjusting rod with anti-slip texture and a height-adjustable positioning block for quick positioning and reset. The entire holder is compact, easy to operate, and can meet the requirements of multi-angle, height fine-tuning, and high stability for sample morphology observation and energy dispersive spectroscopy analysis under an electron microscope.

[0007] To achieve the above objectives, this utility model provides the following technical solution:

[0008] An adjustable electron microscope sample holder includes a support, a base connected to the support, a spherical groove on the base, a spherical connecting block spherically connected within the spherical groove, a first threaded sleeve penetrating the spherical connecting block, an adjusting rod threadedly connected within the first threaded sleeve, one end of the adjusting rod extending to the upper side of the base and connected to a stage, and the other end of the adjusting rod extending a considerable distance to the lower side of the base, a platform connected to the inner end of the support, a second threaded sleeve penetrating the platform, a screw threadedly connected to the second threaded sleeve, a positioning block connected to the top of the screw, the positioning block being located directly below the adjusting rod, and a positioning groove matching the shape of the bottom of the adjusting rod being formed at the top of the positioning block.

[0009] Preferably, the inner wall of the spherical groove is covered with a rubber pad, which is pressed between the inner wall of the spherical groove and the spherical connecting block.

[0010] Preferably, the first threaded sleeve penetrates the center of the spherical connecting block.

[0011] Preferably, the adjusting rod is perpendicular to the stage.

[0012] Preferably, the centers of the positioning block and the spherical connecting block are located at the same vertical position.

[0013] Preferably, the bottom of the outer end of the adjusting rod is engraved with anti-slip texture, and the bottom end of the screw is connected to a knob.

[0014] The beneficial effects of this technical solution compared to existing technologies are as follows:

[0015] This design utilizes a spherical groove and a spherical connecting block on the base to form an adjustable spherical connection mechanism. Combined with a first threaded sleeve penetrating the center of the sphere and a relatively long adjusting rod, it not only achieves precise adjustment of the stage height and rotation angle but also enhances fine-tuning accuracy through the lever effect of the adjusting rod. This effectively overcomes the instability caused by the short lever arm in traditional structures. Furthermore, the bottom features an anti-slip textured adjusting rod and a height-adjustable positioning block for quick positioning and reset. The entire fixture is compact, easy to operate, and meets the requirements for multi-angle, height fine-tuning, and high stability in sample morphology observation and energy dispersive spectroscopy analysis under an electron microscope. Attached Figure Description

[0016] Figure 1 A schematic diagram of the overall structure of this utility model;

[0017] Figure 2 This is a partial cross-sectional structural schematic diagram provided for this utility model.

[0018] Reference numerals in the attached drawings: 1. Bracket; 2. Base; 3. Spherical groove; 4. Platform; 5. Adjusting rod; 6. Spherical connecting block; 7. First threaded sleeve; 8. Platform; 9. Second threaded sleeve; 10. Screw; 11. Positioning block. Detailed Implementation

[0019] When using an electron microscope to observe the morphology of samples, the observation surface of some samples is not parallel to the bottom surface, causing the observation surface to tilt after the sample is placed on the worktable, which affects the collection of electron signals and is not conducive to morphological observation and energy dispersive spectroscopy analysis. When observing multiple samples at the same time, the uneven height of the mosaic or original sample can cause an unsuitable focal point, affecting the imaging and energy dispersive spectroscopy analysis quality. Improper sample height may also damage the electron gun. Therefore, it is essential to design an electron microscope sample holder with adjustable height and rotation angle.

[0020] In some existing solutions, the stage is rotated freely through a spherical connecting mechanism. While this structure is flexible, it requires extremely precise angle adjustments when observing samples under an electron microscope. Because the "lever arm" of the spherical connecting block is very short when adjusting, even a slight touch of a finger can cause excessive rotation, making it difficult to achieve fine control. Furthermore, this type of solution lacks a mechanism for quickly resetting the stage after angle adjustment, which can be inconvenient when testing multiple batches of samples.

[0021] The present invention will now be described in further detail with reference to the accompanying drawings and embodiments:

[0022] like Figure 1-2The electron microscope sample holder shown includes a support 1, a base 2 connected to the support 1, a spherical groove 3 on the base 2, a spherical connecting block 6 spherically connected in the spherical groove 3, a first threaded sleeve 7 penetrating through the spherical connecting block 6, an adjusting rod 5 threadedly connected in the first threaded sleeve 7, one end of the adjusting rod 5 extending to the upper side of the base 2 and connected to a stage 4, and the other end of the adjusting rod 5 extending a considerable distance to the lower side of the base 2, a platform 8 connected to the inner end of the support 1, a second threaded sleeve 9 penetrating through the platform 8, a screw 10 threadedly connected to the second threaded sleeve 9, a positioning block 11 connected to the top of the screw 10, the positioning block 11 being located directly below the adjusting rod 5, and a positioning groove matching the shape of the bottom of the adjusting rod 5 being opened at the top of the positioning block 11.

[0023] In this embodiment, the height and rotation angle adjustable electron microscope sample holder, together with the spherical groove 3, the spherical connecting block 6, and the first screw sleeve 7 penetrating its center, constitute an adjustable spherical connecting mechanism. Combined with the extended structure of the adjusting rod 5, it enables free rotation angle adjustment and height fine-tuning of the stage 4. The user can operate it by touching the bottom of the outer end with anti-slip texture at the lower end of the adjusting rod 5. The lever effect of the adjusting rod 5 improves the adjustment accuracy, thus overcoming the difficulty of fine-tuning caused by the short lever arm in traditional solutions. Rotating the adjusting rod 5 can drive the stage 4 to adjust its height. The positioning block 11 is located directly below the adjusting rod 5 and has a positioning groove matching its bottom shape. When a quick reset of the stage 4 is needed, the user can rotate the screw 10 to raise the positioning block 11, embedding the bottom of the adjusting rod 5 into the positioning groove, thereby fixing the angle position of the spherical connecting block 6 and achieving stable reset of the stage 4. The overall structure is reasonable and compact, which is beneficial for efficient and accurate observation of samples under an electron microscope.

[0024] The inner wall of the spherical groove 3 is covered with a rubber pad, which is pressed between the inner wall of the spherical groove 3 and the spherical connecting block 6.

[0025] In this embodiment, the rubber pad forms a flexible contact surface between the inner wall of the spherical groove 3 and the spherical connecting block 6, which effectively increases the friction and prevents the platform 4 from loosening due to gravity or vibration after adjustment, thus ensuring the reliability of the angle adjustment. At the same time, the elasticity of the rubber pad can buffer the operating force, reduce the small displacement during the operation, and make the adjustment of the spherical connecting mechanism smoother and less prone to shaking.

[0026] The first threaded sleeve 7 penetrates the center of the spherical connecting block 6.

[0027] In this embodiment, the first threaded sleeve 7 is disposed through the center of the spherical connecting block 6 to ensure that the contact stress distribution between the adjusting rod 5 and the spherical connecting block 6 is uniform when rotating or lifting, thus avoiding structural wear or shaking of the platform 4 due to eccentric force. At the same time, this design ensures that the rotation axis of the spherical connecting block 6 coincides with the central axis of the adjusting rod 5, thereby improving the symmetry of the overall structure and the operational stability.

[0028] Adjustment rod 5 is perpendicular to platform 4.

[0029] In this embodiment, the adjusting rod 5 is vertically connected to the bottom of the platform 4, so that the height and rotation angle of the platform 4 are adjusted with the adjusting rod 5 as the central axis. When the user operates the adjusting rod 5, he / she can directly drive the platform 4 to make fine adjustments, reduce the offset caused by lateral force, and improve the accuracy and convenience of adjustment.

[0030] The centers of the positioning block 11 and the spherical connecting block 6 are set at the same vertical position.

[0031] In this embodiment, the center of the positioning block 11 and the center of the spherical connecting block 6 are on the same vertical line, ensuring that the positioning block 11 can be accurately embedded in the positioning groove at the bottom of the adjusting rod 5 when it rises, thereby achieving reliable limiting and fixing of the spherical connecting block 6, so that the stage 4 can quickly return to the preset angle position after multiple batches of sample testing, making it convenient for users to switch samples efficiently and saving adjustment time.

[0032] The bottom of the outer end of the adjusting rod 5 is engraved with anti-slip texture, and the bottom end of the screw 10 is connected to a knob.

[0033] In this embodiment, the anti-slip texture on the bottom of the outer end of the adjusting rod 5 can enhance the friction of the user's hand during operation, and avoid inaccurate adjustment due to finger slippage. The knob structure at the bottom of the screw 10 allows the user to quickly rotate it with one hand, realizing the up and down fine adjustment of the positioning block 11. This allows the spherical connecting block 6 to be quickly locked or released when needed, improving the overall ease of operation and fine adjustment accuracy of the fixture.

[0034] The above descriptions are merely embodiments of this utility model. Commonly known technical solutions and / or characteristics are not described in detail here. It should be noted that those skilled in the art can make various modifications and improvements without departing from the technical solution of this utility model. These modifications and improvements should also be considered within the scope of protection of this utility model, and will not affect the effectiveness of the implementation of this utility model or the practicality of the patent. The scope of protection claimed in this application should be determined by the content of its claims, and the specific embodiments described in the specification can be used to interpret the content of the claims.

Claims

1. A height- and angle-adjustable electron microscope sample holder, characterized in that: The system includes a bracket (1), a base (2) connected to the bracket (1), a spherical groove (3) on the base (2), a spherical connecting block (6) spherically connected in the spherical groove (3), a first threaded sleeve (7) penetrating the spherical connecting block (6), an adjusting rod (5) threadedly connected in the first threaded sleeve (7), one end of the adjusting rod (5) extending to the upper side of the base (2) and connected to a platform (4), and the other end of the adjusting rod (5) extending a long distance to the lower side of the base (2), a platform (8) connected to the inner end of the bracket (1), a second threaded sleeve (9) penetrating the platform (8), a screw (10) threadedly connected to the second threaded sleeve (9), a positioning block (11) connected to the top of the screw (10), the positioning block (11) being located directly below the adjusting rod (5), and a positioning groove matching the shape of the bottom of the adjusting rod (5) being opened at the top of the positioning block (11).

2. The electron microscope sample holder with adjustable height and rotation angle as described in claim 1, characterized in that: The inner wall of the spherical groove (3) is covered with a rubber pad, which is pressed between the inner wall of the spherical groove (3) and the spherical connecting block (6).

3. The electron microscope sample holder with adjustable height and rotation angle as described in claim 1, characterized in that: The first threaded sleeve (7) penetrates the center of the spherical connecting block (6).

4. The electron microscope sample holder with adjustable height and rotation angle as described in claim 1, characterized in that: The adjusting rod (5) is perpendicular to the platform (4).

5. The electron microscope sample holder with adjustable height and rotation angle as described in claim 1, characterized in that: The centers of the positioning block (11) and the spherical connecting block (6) are set at the same vertical position.

6. The electron microscope sample holder with adjustable height and rotation angle as described in claim 1, characterized in that: The bottom of the outer end of the adjusting rod (5) is engraved with anti-slip texture, and the bottom end of the screw (10) is connected to a knob.

Images