Magnetic parameter detection fixture and system

Abstract

This application relates to the field of magnetic parameter detection technology, and discloses a magnetic parameter detection fixture and system. A first PCB detection board is mounted on a slide rail assembly of a drive machine and located at the bottom of the drive machine. A second PCB detection board is mounted on the slide rail assembly and parallel to the first PCB detection board. The first PCB detection board has a set of corresponding pads, and the second PCB detection board has a set of staggered pads. Several sub-pads of the corresponding pads and several sub-pads of the staggered pads correspond one-to-one and are electrically connected. The sub-pads of both the corresponding pads and the staggered pads are arranged in concentric inner and outer double rings. The sub-pads of the inner ring of the corresponding pads are aligned and electrically connected to the sub-pads of the outer ring, respectively. The sub-pads of the inner ring of the staggered pads are staggered and electrically connected to the sub-pads of the outer ring, respectively, to construct a detection magnetic field between the first PCB detection board and the second PCB detection board for the magnetic material to be tested. This application improves the cost-effectiveness of magnetic parameter detection.

Description

Technical Field

[0001] This application relates to the field of magnetic parameter detection technology, specifically to a magnetic parameter detection fixture and system. Background Technology

[0002] In the current field of wireless charging and wireless communication technology, especially in the manufacturing process of smart terminals involving NFC (Near Field Communication) and WPC (Wireless Power Consortium) configurations, the magnetic parameters (permeability, magnetic loss, etc.) of the magnetic materials used have a profound impact on the product's performance parameters. For example, the permeability of the magnetic material used in the product corresponds to the product's inductance value. Therefore, it is necessary to accurately detect the magnetic parameters of the magnetic material in order to control and design it, thereby ensuring product quality.

[0003] The magnetic parameter detection systems in related technologies are expensive and have high maintenance costs. Moreover, most of them do not come with test fixtures, and users need to make their own wire coils for testing. The sample preparation process is cumbersome and inefficient, and the operation depends on experience, which affects the stability and repeatability of the test. Utility Model Content

[0004] In view of this, this application provides a magnetic parameter detection fixture and system to solve the aforementioned technical problems.

[0005] In a first aspect, embodiments of this application disclose a magnetic parameter detection fixture, comprising:

[0006] A drive platform, wherein the drive platform is equipped with a slide rail assembly;

[0007] The first PCB testing board is mounted on the slide rail assembly and located at the bottom of the drive machine to support the magnetic material to be tested.

[0008] The second PCB detection board is disposed on the slide rail assembly and is parallel to the first PCB detection board, and there is an adjustable distance between the first PCB detection board and the second PCB detection board.

[0009] The first PCB testing board has a set of aligned pads, and the second PCB testing board has a set of misaligned pads. Several sub-pads of the aligned pads and several sub-pads of the misaligned pads correspond one-to-one and are electrically connected. The sub-pads of the aligned pads and the misaligned pads are arranged in concentric inner and outer double rings. The sub-pads of the inner ring of the aligned pads are aligned and electrically connected to the sub-pads of the outer ring, and the sub-pads of the inner ring of the misaligned pads are misaligned and electrically connected to the sub-pads of the outer ring, so as to construct a detection magnetic field between the first PCB testing board and the second PCB testing board for the magnetic material to be tested.

[0010] In one possible example, the co-position pad group includes several first pads and second pads, with the second pads located outside the first pads. The several first pads and second pads are arranged in concentric inner and outer double rings on the first PCB inspection board and are radially symmetrical. The misaligned pad group includes several third pads and fourth pads, with the third pads located outside the fourth pads. The several third pads and fourth pads are arranged in concentric inner and outer double rings on the second PCB inspection board and are radially symmetrical.

[0011] Mark a number of first pads as A1, A2, A3...An, and a number of second pads as B1, B2, B3...Bn. Then A1 is electrically connected to B1, A2 is electrically connected to B2, A3 is electrically connected to B3, and so on until An is electrically connected to Bn.

[0012] If several third pads are labeled as C1, C2, C3...Cn, and several fourth pads are labeled as D1, D2, D3...Dn, then C1 is set as the first external pad, Dn is set as the second external pad, and C2 is electrically connected to D1, C3 is electrically connected to D2, and so on until Cn is electrically connected to Dn-1.

[0013] Furthermore, each of the first pads corresponds to and is electrically connected to the third pad, and each of the second pads corresponds to and is electrically connected to the fourth pad.

[0014] In one possible example, on the second PCB inspection board and near the misaligned pad group, there are a first device lead pad and a second device lead pad, respectively. The first device lead pad is electrically connected to the first external pad, and the second device lead pad is electrically connected to the second external pad.

[0015] In one possible example, the slide rail assembly includes a first slide block and a first slide rail, the first slide rail being symmetrically connected to the front side of the drive machine, the first slide block being correspondingly matched on the first slide rail, and a first mounting plate being connected between the first slide blocks, and the first PCB detection board being connected to the first mounting plate.

[0016] In one possible example, the slide rail assembly includes a second slide block and a second slide rail. The second slide block is connected to the front side of the drive unit and located above the first slide block, and the second slide rail is correspondingly matched on the second slide block. A second mounting plate is connected to the second slide rail, and the second PCB detection board is connected to the second mounting plate.

[0017] In one possible example, a limiting element is provided on one side of the first slide rail and the second slide block to limit the relative sliding travel of the first slide block and the first slide rail, and the relative sliding travel of the second slide block and the second slide rail; the limiting element includes a limit sensor or a limit switch.

[0018] In one possible example, the upper surface of the first PCB test board is provided with a receiving annular groove for accommodating the magnetic material to be tested, and the receiving annular groove is located between two concentric rings formed by the first pad and the second pad.

[0019] In one possible example, the upper surface of the first PCB inspection board is provided with a pick-and-place slot, which is located on the side of the receiving ring groove, and the pick-and-place slot is connected and communicates with the receiving ring groove, and the depth of the pick-and-place slot is greater than the depth of the receiving ring groove.

[0020] In one possible example, the outer surfaces of the first pad, the second pad, the third pad, and the fourth pad are all plated with gold.

[0021] Secondly, embodiments of this application disclose a magnetic parameter detection system, including a tester and a magnetic parameter detection fixture as described in any of the above embodiments, wherein the magnetic parameter detection fixture is electrically connected to the tester.

[0022] In summary, compared with the prior art, this application discloses a magnetic parameter detection fixture. The first PCB detection board is mounted on the slide rail assembly of the drive machine and located at the bottom of the drive machine. The second PCB detection board is mounted on the slide rail assembly and is parallel to the first PCB detection board. The first PCB detection board has a set of corresponding pads, and the second PCB detection board has a set of staggered pads. Several sub-pads of the corresponding pads and several sub-pads of the staggered pads correspond one-to-one and are electrically connected. The sub-pads of the corresponding pads and the sub-pads of the staggered pads are arranged in concentric inner and outer double rings. The sub-pads of the inner ring of the corresponding pads are aligned and electrically connected to the sub-pads of the outer ring, respectively. The sub-pads of the inner ring of the staggered pads are staggered and electrically connected to the sub-pads of the outer ring, respectively. That is, through the above arrangement, a detection magnetic field for the magnetic material to be tested is constructed between the first PCB detection board and the second PCB detection board, thereby improving the efficiency and reliability of magnetic parameter detection. Attached Figure Description

[0023] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0024] Figure 1 This is a schematic diagram of the first structure of the magnetic parameter detection fixture of this application;

[0025] Figure 2 This is a schematic diagram of the second structure of the magnetic parameter detection fixture of this application;

[0026] Figure 3 This is a schematic diagram of the third structure of the magnetic parameter detection fixture in this application;

[0027] Figure 4 This is a top view of the structure of the first PCB testing board of this application;

[0028] Figure 5 This is a bottom view of the first PCB test board of this application;

[0029] Figure 6 This is a bottom view of the structure of the second PCB test board of this application;

[0030] Figure 7 This is a schematic diagram of the structure of the annular groove in this application;

[0031] Figure 8 This is a schematic diagram of the first structure of the co-position pad group in this application;

[0032] Figure 9 This is a schematic diagram of the first structure of the misaligned pad group in this application;

[0033] Figure 10 This is a schematic diagram of the second structure of the co-position pad group in this application;

[0034] Figure 11 This is a schematic diagram of the second structure of the misaligned pad group in this application;

[0035] Figure 12 This is a schematic diagram of the spring ejector pin structure of this application.

[0036] Figure 13 This is a structural block diagram of the magnetic parameter detection system of this application. Detailed Implementation

[0037] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the claims.

[0038] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element. Furthermore, components, features, and elements with the same names in different embodiments of this application may have the same meaning or different meanings, the specific meaning of which must be determined by its interpretation in that specific embodiment or further in conjunction with the context of that specific embodiment.

[0039] It should be understood that the specific embodiments described herein are merely illustrative of this application and are not intended to limit this application.

[0040] In the following description, the use of suffixes such as "module," "part," or "unit" to denote elements is solely for the purpose of illustrative purposes and has no specific meaning in itself. Therefore, "module," "part," or "unit" may be used interchangeably.

[0041] In the description of this application, it should be noted that the terms "upper," "lower," "left," "right," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on this application. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0042] The technical solutions shown in this application will be described in detail below through specific embodiments. It should be noted that the order of description of the following embodiments is not intended to limit the priority of the embodiments.

[0043] Please refer to Figures 1 to 3The magnetic parameter detection fixture of this application embodiment can be used to detect the magnetic permeability and magnetic loss of magnetic materials. Specifically, it includes a first PCB detection board 1 and a second PCB detection board 2. The first PCB detection board 1 carries the magnetic material to be tested. The first PCB detection board 1 and the second PCB detection board 2 are parallel to each other, and an adjustable distance is maintained between the first PCB detection board 1 and the second PCB detection board 2. Thus, the magnetic material to be tested is arranged between the first PCB detection board 1 and the second PCB detection board 2. After the adjustable distance between the first PCB detection board 1 and the second PCB detection board 2 is changed to make them electrically connected, a detection magnetic field can be constructed between the first PCB detection board 1 and the second PCB detection board 2 to act on the magnetic material to be tested, so as to detect the magnetic parameters of the magnetic material to be tested.

[0044] In the specific implementation process, we will continue to combine Figures 4 to 6 The first PCB testing board 1 has a co-position pad group 5, and the second PCB testing board 2 has a corresponding misaligned pad group 6. It can be understood that both the co-position pad group 5 and the misaligned pad group 6 are composed of several sub-pads. The several sub-pads of the co-position pad group 5 correspond one-to-one with the several sub-pads of the misaligned pad group 6. By changing the adjustable spacing between the first PCB testing board 1 and the second PCB testing board 2, the sub-pads of the co-position pad group 5 and the sub-pads of the misaligned pad group 6 can be electrically connected in a one-to-one correspondence. In this way, a detection magnetic field can be constructed between the first PCB testing board 1 and the second PCB testing board 2 to act on the magnetic material under test, so as to detect the magnetic parameters of the magnetic material under test.

[0045] Furthermore, continue to combine Figure 8 and Figure 9 The sub-pads of the co-position pad group 5 and the sub-pads of the misaligned pad group 6 are arranged in concentric inner and outer double rings. The sub-pads of the inner ring 5a of the co-position pad group 5 are electrically connected to the sub-pads of the outer ring 5b, respectively. The sub-pads of the inner ring 6a of the misaligned pad group 6 are electrically connected to the sub-pads of the outer ring 6b, respectively. Based on this, after setting a one-to-one correspondence between the sub-pads of the co-position pad group 5 and the sub-pads of the misaligned pad group 6, the co-position pad group 5 and the misaligned pad group 6 can be equivalent to forming a closed-loop winding coil of the magnetic material to be tested between the first PCB test board 1 and the second PCB test board 2. This creates a detection magnetic field between the first PCB test board 1 and the second PCB test board 2, which acts on the magnetic material to be tested to detect the magnetic parameters of the magnetic material.

[0046] It is understandable that the sub-pads of the inner ring 5a and the outer ring 5b of the co-position pad group 5, as well as the sub-pads of the inner ring 6a and the outer ring 6b of the misaligned pad group 6, are all equally spaced along the polar angle direction, and the inner and outer rings are also aligned one-to-one in the angular direction. Thus, the co-position pad group 5 with aligned electrical connection and the misaligned pad group 6 with misaligned electrical connection form a closed-loop circular layout conductive path in the space between the first PCB test board 1 and the second PCB test board 2, which is equivalent to a complete spiral coil structure, in order to establish a stable circular magnetic flux for the magnetic material under test, thereby realizing the accurate testing of its magnetic permeability, magnetic loss and other magnetic parameters. This avoids the disadvantages of the related technology that require manual wire threading for magnetic parameter testing, which is cumbersome, inefficient and dependent on experience, affecting the stability and repeatability of the test.

[0047] The alignment and electrical connection between the sub-pads of the inner ring 5a and the sub-pads of the outer ring 5b of the co-position pad group 5 can be achieved by the traces on the first PCB inspection board 1, and the misalignment and electrical connection between the sub-pads of the inner ring 6a and the sub-pads of the outer ring 6b of the misaligned pad group 6 can be achieved by the traces on the second PCB inspection board 2. The traces can be based on etching copper foil on the PCB inspection board to form a preset pattern.

[0048] In the specific implementation process, the electrical connection between the first PCB testing board 1 and the second PCB testing board 2 can be achieved through the connector 3. That is, the magnetic parameter detection fixture may include the connector 3, and the sub-pads of the corresponding co-position pad group 5 and the sub-pads of the misaligned pad group 6 are electrically connected through the connector 3.

[0049] In the specific implementation process, the adjustable spacing between the first PCB testing board 1 and the second PCB testing board 2 can be adjusted by the drive platform 4. That is, the magnetic parameter detection fixture may include the drive platform 4, which is equipped with a slide rail group 7. The first PCB testing board 1 is placed on the slide rail group 7 and located at the bottom of the drive platform 4 to carry the magnetic material to be tested. The second PCB testing board 2 is placed on the slide rail group 7 and is parallel to the first PCB testing board 1. The slide rail group 7 ensures that the relative distance between the first PCB testing board 1 and the second PCB testing board 2 is adjustable, thereby controlling the movement of the first PCB testing board 1 relative to the second PCB testing board 2, or the movement of the second PCB testing board 2 relative to the first PCB testing board 1, thereby establishing an electrical connection between the first PCB testing board 1 and the second PCB testing board 2. This is equivalent to forming a closed-loop winding coil around the magnetic material to be tested between the first PCB testing board 1 and the second PCB testing board 2.

[0050] In one example, continue to refer to Figure 10 and Figure 11The co-position pad group 5 comprises several sub-pads, which can be divided into first pads 51 and second pads 52. Specifically, the co-position pad group 5 includes several first pads 51 and second pads 52, with the second pads 52 located outside the first pads 51. These first pads 51 and second pads 52 are arranged in concentric inner and outer double rings on the first PCB inspection board 1, exhibiting radial symmetry. Similarly, the misaligned pad group 6 comprises several third pads 61 and fourth pads 62, with the third pads 61 located outside the fourth pads 62. These third pads 61 and fourth pads 62 are arranged in concentric inner and outer double rings on the second PCB inspection board 2, exhibiting radial symmetry.

[0051] It is understandable that radial symmetry setup means that several sub-pads are arranged at equal angles along multiple radial directions (or polar directions) radiating outward from the center of the circle, with the center of the circle as the center of symmetry, so as to form a ring-shaped symmetrical layout.

[0052] Based on this setting, it can be ensured that the detection magnetic field constructed between the first PCB detection board 1 and the second PCB detection board 2 is uniform.

[0053] Among them, several first pads 51 are labeled as A1, A2, A3...An, and several second pads 52 are labeled as B1, B2, B3...Bn. Then A1 is electrically connected to B1, A2 is electrically connected to B2, A3 is electrically connected to B3, and so on until An is electrically connected to Bn.

[0054] Mark several third pads 61 as C1, C2, C3...Cn, and several fourth pads 62 as D1, D2, D3...Dn. Then set C1 as the first external pad, Dn as the second external pad, and C2 and D1 electrically connected, C3 and D2 electrically connected, up to Cn and Dn-1 electrically connected.

[0055] Where n is an integer ≥ 4.

[0056] In addition, each first pad 51 corresponds to and is electrically connected to the third pad 61, and each second pad 52 corresponds to and is electrically connected to the fourth pad 62.

[0057] Therefore, the above connection method essentially constructs a circular forward current path. Taking C1 as the first external pad and Dn as the second external pad as an example, the current starts from C1, passes through A1→B1→D1→C2→A2→B2→D2→C3→A3→B3→D3… and finally returns to Dn. Thus, the same-position pad group 5 and the staggered pad group 6 can be equivalent to forming a closed-loop winding coil around the magnetic material to be tested between the first PCB test board 1 and the second PCB test board 2. This creates a detection magnetic field between the first PCB test board 1 and the second PCB test board 2, which acts on the magnetic material to be tested to detect its magnetic parameters.

[0058] Optionally, on the second PCB test board 2 and near the misaligned pad group 6, a first device lead pad 21 and a second device lead pad 22 are respectively provided. The first device lead pad 21 is electrically connected to the first external pad, and the second device lead pad 22 is electrically connected to the second external pad, for electrical connection with external test instruments and to form signal input / output ports.

[0059] In one example, each first pad 51 corresponds to a third pad 61 and is electrically connected via connector 3, and each second pad 52 corresponds to a fourth pad 62 and is electrically connected via connector 3.

[0060] Preferably, the co-position pad group 5 includes eight first pads 51 and eight second pads 52, and the misaligned pad group 6 includes eight third pads 61 and eight fourth pads 62. Based on the foregoing, it can be understood that:

[0061] The first pad 51 is labeled as A1, A2, A3, A4, A5, A6, A7, A8, and the second pad 52 is labeled as B1, B2, B3, B4, B5, B6, B7, B8. Then A1 and B1 are electrically connected, A2 and B2 are electrically connected, A3 and B3 are electrically connected, and so on up to A8 and B8.

[0062] The third pad 61 is labeled as C1, C2, C3, C4, C5, C6, C7, C8, and the fourth pad 62 is labeled as D1, D2, D3, D4, D5, D6, D7, D8. C1 is set as the first external pad, D8 as the second external pad, and C2 is electrically connected to D1, C3 is electrically connected to D2, and C8 is electrically connected to D7 to form a closed-loop winding coil wound around the magnetic material to be tested.

[0063] Of course, the specific number of pads included in the co-position pad group 5 and the misaligned pad group 6 in this embodiment of the application is not limited to this. Depending on the properties of the actual magnetic material to be tested or other environmental requirements, it can be designed to have other target numbers of pads, which will not be elaborated here.

[0064] It should be noted that the outer surfaces of the first pad 51, the second pad 52, the third pad 61, and the fourth pad 62 are all plated with gold to improve the electrical connection reliability and surface wear resistance of the pads, thereby increasing the service life of the fixture.

[0065] In one example, the first PCB inspection board 1 has an upper surface 1a and a lower surface 1b opposite each other. The first pad 51 and the second pad 52 of the co-position pad group 5 are connected to the lower surface 1b of the first PCB inspection board 1. The second PCB inspection board 2 has a lower surface 2b facing the upper surface 2a of the first PCB inspection board 1. The third pad 61 and the fourth pad 62 of the misaligned pad group 6 are connected to the lower surface 2b of the second PCB inspection board 2.

[0066] Preferably, the third pad 61 and the fourth pad 62 are electrically connected to the first pad 51 and the second pad 52 respectively after passing through the upper surface 2a of the second PCB inspection board 2.

[0067] In one example, based on the aforementioned connector 3 and continuing to combine Figure 7 The first PCB inspection board 1 is provided with a plurality of mounting holes 13. Each mounting hole 13 is connected to the first pad 51 and the second pad 52 by the upper surface 1a of the first PCB inspection board 1. One end of the connector 3 is fixed in the mounting hole 13. Thus, the connector 3 is fixed through the mounting hole 13 so as to electrically connect the first PCB inspection board 1 and the second PCB inspection board 2 through the connector 3. That is, the purpose of each first pad 51 corresponding to the third pad 61 and electrically connected through the connector 3, and each second pad 52 corresponding to the fourth pad 62 and electrically connected through the connector 3 is achieved.

[0068] Optionally, the connector 3 includes a spring pin to realize the electrical connection of the pads between the first PCB test board 1 and the second PCB test board 2. The spring structure of the spring pin can automatically compensate for the assembly gap and contact pressure changes, effectively reducing poor contact problems caused by manual errors, test board warping, etc., and improving the stability of measurement data.

[0069] Furthermore, the spring pins are small in size and can be arranged in a high density on the first PCB detection board 1 to meet the vertical connection requirements of multiple channels, without affecting the placement space of the magnetic material to be tested in the center.

[0070] For details, please refer to Figure 12The spring-loaded pin includes a needle head 31, a spring 32, and a needle body 33. One end of the needle body 33 is provided with a retaining groove 331 for accommodating the spring 32 and part of the needle head 31, which is used for the elastic extension and contraction of the needle head 31 relative to the needle body 33. The other end of the needle body 33 is fixed in the mounting hole 13. The needle head 31 abuts against the third pad 61 and the fourth pad 62, so that the spring-loaded pin connects the first pad 51 and the third pad 61, and the second pad 52 and the fourth pad 62, respectively.

[0071] The needle 31 is a conductive post, the rear of which is inserted into the snap-fit ​​groove 331 and maintains an elastic fit with the inside of the snap-fit ​​groove 331 under the action of spring force.

[0072] Optionally, a snap-fit ​​block 311 can be integrally connected to both sides of a portion of the needle 31. The snap-fit ​​block 311 snaps into the inner wall of the snap-fit ​​groove 331 near the end of the needle 31, and the two ends of the spring 32 respectively abut against the end of the snap-fit ​​groove 331 away from the needle 31 and a portion of the needle 31, so as to ensure the elastic extension and contraction of the needle 31 relative to the needle body 33, thereby avoiding the hard contact between the needle 31 and the third pad 61 and the fourth pad 62.

[0073] In one connection relationship, the other end of the needle body 33 passes through the mounting hole 13 and is soldered and fixed to the first pad 51 and the second pad 52 on the lower surface 1b of the first PCB detection board 1.

[0074] In one example, such as Figure 4 and Figure 7 As shown, the upper surface 1a of the first PCB test board 1 is provided with a receiving annular groove 11 for receiving the magnetic material to be tested. The receiving annular groove 11 is located between the concentric double rings constructed by the first pad 51 and the second pad 52.

[0075] Correspondingly, the magnetic material to be tested has a circular ring structure design, which matches the inner wall of the accommodating ring groove 11.

[0076] As an example, the magnetic materials to be tested include ferrite materials for NFC fabrication and nanocrystalline materials for WPC fabrication.

[0077] Furthermore, the upper surface 1a of the first PCB testing board 1 is provided with a pick-and-place groove 12, which is located on the side of the receiving ring groove 11. The pick-and-place groove 12 is connected and communicates with the receiving ring groove 11, and the groove depth of the pick-and-place groove 12 is greater than the groove depth of the receiving ring groove 11, thereby facilitating the pick-and-place of the magnetic material to be tested through the pick-and-place groove 12.

[0078] Optionally, the pick-and-place slot 12 is configured as a rectangular slot structure.

[0079] Preferably, the groove depth of the receiving annular groove 11 includes 0.4 mm.

[0080] In one example, the slide rail assembly 7 includes a first slide block 71 and a first slide rail 72. The first slide rail 72 is symmetrically connected to the front side of the drive machine 4 (arranged symmetrically from left to right). The first slide block 71 is matched with the first slide rail 72. It can be set in a block structure and its bottom is slidably engaged with the first slide rail 72, so it can move linearly along the slide rail direction of the first slide rail 72. A first mounting plate 73 is connected between the first slide blocks 71. The first PCB detection board 1 is connected to the first mounting plate 73, so the first mounting plate 73 supports and fixes the first PCB detection board 1.

[0081] Based on the sliding of the first slide block 71 on the first slide rail 72, the first PCB detection board 1 can move relative to the second PCB detection board 2, thereby making the spacing between the upper and lower detection boards adjustable, and based on this, the electrical connection between the first PCB detection board 1 and the second PCB detection board 2 can be controlled.

[0082] Preferably, the four corners of the first PCB testing board 1 are provided with threaded holes for fixing to the first mounting plate 73.

[0083] Furthermore, the slide rail assembly 7 includes a second slide block 74 and a second slide rail 75. The second slide block 74 is connected to the front side of the drive machine 4 and is located above the first slide block 71. The second slide rail 75 is correspondingly matched on the second slide block 74. A second mounting plate 76 is connected to the second slide rail 75. The second PCB detection board 2 is connected to the second mounting plate 76.

[0084] Preferably, the four corners of the second PCB detection board 2 are provided with threaded holes for fixing to the second mounting plate 76.

[0085] Based on the sliding of the second slide rail 75 on the second slide block 74, the second PCB detection board 2 can move relative to the first PCB detection board 1, thereby making the spacing between the upper and lower detection boards adjustable. Based on this, the electrical connection between the first PCB detection board 1 and the second PCB detection board 2 can be controlled.

[0086] Optionally, a limiting member 8 is provided on one side of the first slide rail 72 and the second slide block 74 to limit the relative sliding stroke of the first slide block 71 and the first slide rail 72, and the relative sliding stroke of the second slide block 74 and the second slide rail 75. The distance between the first PCB detection board 1 and the second PCB detection board 2 can be adjusted by the limiting member 8. The limiting member 8 includes a limiting sensor or a limiting switch.

[0087] Optionally, the limit sensor can be a photoelectric, Hall effect, or contact position detection element for real-time monitoring, while the limit switch can be a mechanical trigger switch.

[0088] Optionally, the first slide block 71 and the second slide rail 75 can be driven by a cylinder.

[0089] refer to Figure 13 This application also discloses a magnetic parameter detection system, including a tester 100 and a magnetic parameter detection fixture 200 as described in any of the above embodiments, wherein the magnetic parameter detection fixture 200 is electrically connected to the tester 100.

[0090] In one example, based on the foregoing embodiments, the input / output interface of the tester 100 can be electrically connected to the first device lead pad 21 and the second device lead pad 22, respectively.

[0091] Preferably, the tester 100 includes an LCR meter.

[0092] It should be noted that, during a testing process, based on the tester 100 and magnetic parameter testing fixture 200 of this application, the magnetic material to be tested can be placed in the receiving annular groove 11 of the first PCB test board 1, and the first PCB test board 1 and the second PCB test board 2 can be moved relative to each other via the slide rail group 7 until the needle tip 31 of the spring pin fixed on the mounting hole 13 of the first PCB test board 1 abuts against the third pad 61 and the fourth pad 62 of the misaligned pad group 6. Then, the electrical connection between the first PCB test board 1 and the second PCB test board 2 is established, and the input / output interface of the tester 100 can be electrically connected to the first device lead pad 21 and the second device lead pad 22. External pads (C1) and second external pads (Dn) are connected. Based on the circular sequence C1→A1→B1→D1→C2→A2→B2→D2→C3→A3→B3→D3……Dn, the co-position pad group 5 and the staggered pad group 6 form a closed-loop conductive path in the space between the first PCB inspection board 1 and the second PCB inspection board 2. This is equivalent to a complete spiral coil structure, which establishes a stable circular magnetic flux for the magnetic material under test. This enables accurate testing of its magnetic parameters such as permeability and magnetic loss. This avoids the drawbacks of related technologies, such as the need for manual wire threading for magnetic parameter testing, cumbersome sample preparation process, low efficiency, reliance on experience, and impact on test stability and repeatability.

[0093] The magnetic parameter detection fixture and system provided in this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. It should be noted that the descriptions of each embodiment in this application have different emphases. Parts not described in detail or in a certain embodiment can be referred to the relevant descriptions of other embodiments.

[0094] The above are merely preferred embodiments of this application and do not limit the patent scope of this application. The technical features of the technical solution of this application can be combined arbitrarily. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. Any equivalent structural or procedural transformations made using the content of this application's specification and drawings, or direct or indirect applications in other related technical fields, are also included within the patent protection scope of this application, as long as the combination of these technical features does not contradict each other.

Claims

1. A magnetic parameter detection fixture, characterized in that, include: A drive platform, wherein the drive platform is equipped with a slide rail assembly; The first PCB testing board is mounted on the slide rail assembly and located at the bottom of the drive machine to support the magnetic material to be tested. The second PCB detection board is disposed on the slide rail assembly and is parallel to the first PCB detection board, and there is an adjustable distance between the first PCB detection board and the second PCB detection board. The first PCB testing board has a set of aligned pads, and the second PCB testing board has a set of misaligned pads. Several sub-pads of the aligned pads and several sub-pads of the misaligned pads correspond one-to-one and are electrically connected. The sub-pads of the aligned pads and the misaligned pads are arranged in concentric inner and outer double rings. The sub-pads of the inner ring of the aligned pads are aligned and electrically connected to the sub-pads of the outer ring, and the sub-pads of the inner ring of the misaligned pads are misaligned and electrically connected to the sub-pads of the outer ring, so as to construct a detection magnetic field between the first PCB testing board and the second PCB testing board for the magnetic material to be tested.

2. The magnetic parameter detection fixture as described in claim 1, characterized in that, The co-position pad group includes several first pads and second pads, with the second pads located outside the first pads. The several first pads and second pads are arranged in concentric inner and outer double rings on the first PCB inspection board and are radially symmetrical. The misaligned pad group includes several third pads and fourth pads, with the third pads located outside the fourth pads. The several third pads and fourth pads are arranged in concentric inner and outer double rings on the second PCB inspection board and are radially symmetrical. Mark a number of first pads as A1, A2, A3...An, and a number of second pads as B1, B2, B3...Bn. Then A1 is electrically connected to B1, A2 is electrically connected to B2, A3 is electrically connected to B3, and so on until An is electrically connected to Bn. If several third pads are labeled as C1, C2, C3...Cn, and several fourth pads are labeled as D1, D2, D3...Dn, then C1 is set as the first external pad, Dn is set as the second external pad, and C2 is electrically connected to D1, C3 is electrically connected to D2, and so on until Cn is electrically connected to Dn-1. Furthermore, each of the first pads corresponds to and is electrically connected to the third pad, and each of the second pads corresponds to and is electrically connected to the fourth pad.

3. The magnetic parameter detection fixture as described in claim 2, characterized in that, On the second PCB inspection board and near the misaligned pad group, a first device lead pad and a second device lead pad are respectively provided. The first device lead pad is electrically connected to the first external pad, and the second device lead pad is electrically connected to the second external pad.

4. The magnetic parameter detection fixture as described in claim 1, characterized in that, The slide rail assembly includes a first slide block and a first slide rail. The first slide rail is symmetrically connected to the front side of the drive machine platform. The first slide block is correspondingly matched on the first slide rail. A first mounting plate is connected between the first slide blocks. The first PCB detection board is connected to the first mounting plate.

5. The magnetic parameter detection fixture as described in claim 4, characterized in that, The slide rail assembly includes a second slide block and a second slide rail. The second slide block is connected to the front side of the drive machine and located above the first slide block, and the second slide rail is correspondingly matched on the second slide block. A second mounting plate is connected to the second slide rail, and the second PCB detection board is connected to the second mounting plate.

6. The magnetic parameter detection fixture as described in claim 5, characterized in that, A limiting member is provided on one side of the first slide rail and the second slide block to limit the relative sliding stroke of the first slide block and the first slide rail, and the relative sliding stroke of the second slide block and the second slide rail; The limiting component includes a limit sensor or a limit switch.

7. The magnetic parameter detection fixture as described in claim 2, characterized in that, The upper surface of the first PCB test board is provided with a receiving ring groove for accommodating the magnetic material to be tested. The receiving ring groove is located between two concentric rings formed by the first pad and the second pad.

8. The magnetic parameter detection fixture as described in claim 7, characterized in that, The upper surface of the first PCB testing board is provided with a pick-and-place slot, which is located on the side of the receiving ring groove. The pick-and-place slot is connected and communicates with the receiving ring groove, and the depth of the pick-and-place slot is greater than the depth of the receiving ring groove.

9. The magnetic parameter detection fixture as described in claim 2, characterized in that, The outer surfaces of the first pad, the second pad, the third pad, and the fourth pad are all plated with gold.

10. A magnetic parameter detection system, characterized in that, It includes a testing instrument and a magnetic parameter detection fixture as described in any one of claims 1 to 9, wherein the magnetic parameter detection fixture is electrically connected to the testing instrument.

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