Temperature rise test device

Abstract

The utility model discloses temperature rise test device. The device includes: temperature rise test unit is connected with current generator, makes the current from current generator input conductor unit and carries out temperature rise test, resistance test unit is connected with direct current source, makes the test current from direct current source input conductor unit, and resistance test unit is set to test the resistance between each one of conductor unit multiple measuring points and the initial measuring point of conductor unit, switching unit, based on the temperature of multiple measuring points, switching unit switches between temperature rise test mode and resistance test mode, in temperature rise test mode, switching unit makes the circuit between temperature rise test unit and conductor unit conduct, and makes the circuit between resistance test unit and conductor unit disconnect, in resistance test mode, switching unit makes the circuit between temperature rise test unit and conductor unit disconnect, and makes the circuit between resistance test unit and conductor unit conduct. The temperature rise test device improves the safety and efficiency of test.

Description

Technical Field

[0001] This utility model belongs to the field of power equipment testing technology, and specifically relates to a temperature rise test device that does not require human intervention. Background Technology

[0002] In the field of power equipment, equipment and methods for temperature rise testing of high-voltage switchgear have been widely researched and applied. Temperature rise testing is a crucial step in evaluating the thermal stability and electrical performance of high-voltage switchgear under rated current, especially in the reliability testing of high-voltage switches in power systems. Current temperature rise testing equipment generally uses high-current generators to simulate the current load of high-voltage switchgear under actual operating conditions. By monitoring the temperature change of the equipment when current flows through it, the temperature rise characteristics and thermal stability of the equipment are evaluated.

[0003] In traditional temperature rise tests, once the conductor temperature is detected to have reached and stabilized within the expected temperature range, the test operator needs to manually turn off the high current generator, disconnect the current loop, and then reconfigure the test equipment to connect the resistance measurement circuit. Utility Model Content

[0004] Existing high-voltage switch temperature rise testing equipment faces challenges in terms of safety, data accuracy, efficiency, operational complexity, and automation when measuring the resistance of conductors after temperature stabilization. This application aims to at least partially address one of the technical problems in the existing technology.

[0005] According to one aspect of the present invention, a temperature rise testing device is provided, characterized in that the temperature rise testing device comprises: a temperature rise testing unit connected to a current generator, such that current from the current generator is input to the conductor unit for a temperature rise test, and the temperature rise testing unit is configured to measure the temperature of a plurality of measuring points on the conductor unit; a resistance testing unit connected to a DC power supply, such that a test current from the DC power supply is input to the conductor unit, and the resistance testing unit is configured to test the resistance between each of the plurality of measuring points on the conductor unit and an initial measuring point on the conductor unit; and a switching unit, which switches between a temperature rise testing mode and a resistance testing mode based on the temperature of the plurality of measuring points, wherein, in the temperature rise testing mode, the switching unit connects the circuit between the temperature rise testing unit and the conductor unit and disconnects the circuit between the resistance testing unit and the conductor unit, and in the resistance testing mode, the switching unit disconnects the circuit between the temperature rise testing unit and the conductor unit and connects the circuit between the resistance testing unit and the conductor unit.

[0006] With the above-mentioned temperature rise test device, without the need for the operator to manually switch the circuit connection, a high-precision voltage tester can be used automatically to measure the static state of different measuring points of the conductor.

[0007] Preferably, the temperature rise test device further includes: a plurality of measuring units, each of the plurality of measuring units being disposed at one of the plurality of measuring points, the measuring unit measuring the temperature at the corresponding measuring point and generating a temperature signal; and a temperature rise measuring unit receiving the temperature signal generated by the plurality of measuring units, and generating a temperature stability signal when the temperature signal indicates that the temperature of the conductor unit is stable.

[0008] The temperature rise test device described above can accurately obtain the resistance value between different measuring points of the conductor, and avoid the possibility that manual operation may result in an inaccurate selection of the measurement time point, which would affect the accuracy of the resistance measurement.

[0009] Preferably, in response to the temperature stabilization signal, the temperature rise test unit enters a closed state; in response to the temperature stabilization signal, the switching unit switches to the resistance test mode.

[0010] The above-mentioned temperature rise test device avoids the interruption time caused by manual circuit switching, which may affect the accuracy of the measurement results, because the resistance of the conductor may change due to natural temperature fluctuations.

[0011] Preferably, the resistance testing unit includes: a voltage measuring device that measures the potential difference between each of the plurality of measuring points of the conductor unit and an initial measuring point of the conductor unit; and a resistance determining device that determines the resistance between each of the plurality of measuring points of the conductor unit and the initial measuring point of the conductor unit based on the potential difference and the test current.

[0012] The aforementioned temperature rise test device enhances the automated switching capability between the current loop and the resistance measurement loop, automates the testing process, and improves the ease of use and reliability of the equipment.

[0013] Preferably, the switching unit includes: an isolating switch connected between the temperature rise test unit and the conductor unit; an A-phase relay group including a first relay and a second relay, the first relay being connected between the DC power supply and the A-phase terminal of the conductor unit, and the second relay being connected between the A-phase terminal of the conductor unit and the resistance test unit; a B-phase relay group including a third relay and a fourth relay, the third relay being connected between the DC power supply and the B-phase terminal of the conductor unit, and the fourth relay being connected between the B-phase terminal of the conductor unit and the resistance test unit; and a C-phase relay group including a fifth relay and a sixth relay, the fifth relay being connected between the DC power supply and the C-phase terminal of the conductor unit, and the sixth relay being connected between the C-phase terminal of the conductor unit and the resistance test unit.

[0014] The above-mentioned temperature rise test device automatically switches multi-phase high-voltage switchgear to the resistance measurement circuit, avoiding the need for a carefully designed sequence and complex operation process required by manual operation, thereby reducing the complexity of the test and avoiding human error.

[0015] Preferably, in the temperature rise test mode, the isolating switch is closed, and the A-phase relay group, the B-phase relay group, and the C-phase relay group are all de-energized; in the resistance test mode, the isolating switch is open, and the A-phase relay group, the B-phase relay group, and the C-phase relay group are energized sequentially.

[0016] With the above-mentioned temperature rise test device, when multi-phase high-voltage switchgear automatically switches to the resistance measurement circuit, it avoids the carefully designed sequence and complex operation process required by manual operation, thereby realizing the automation of the test process and improving the ease of use and reliability of the equipment.

[0017] Preferably, the measuring unit includes a temperature sensor, and the temperature rise measuring unit monitors the fluctuation amplitude of the temperature signal, and generates the temperature stability signal when the fluctuation amplitude is less than a predetermined threshold.

[0018] The aforementioned temperature rise test device avoids the problem that manual operation may lead to inaccurate selection of the measurement time point, thus affecting the accuracy of the resistance value measurement.

[0019] The technical solution of this utility model achieves the following technical effects: the technical solution for automatically measuring conductor resistance aims to improve the safety, accuracy and efficiency of the test, while simplifying the operation process and improving the level of automation. Attached Figure Description

[0020] The accompanying drawings, which are included to provide a further understanding of the present invention and form part of this application, illustrate exemplary embodiments of the present invention and, together with their description, serve to explain the present invention, but do not constitute an undue limitation thereof. In the drawings:

[0021] Figure 1 This is a structural example diagram of a temperature rise test apparatus according to an embodiment of this application.

[0022] Figure 2 This is an example circuit connection diagram of a temperature rise test apparatus according to an exemplary embodiment of this application. Detailed Implementation

[0023] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present invention.

[0024] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this utility model are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of the utility model described herein can be implemented in orders other than those illustrated or described herein. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion; for example, a process, method, system, product, or apparatus that comprises a series of steps or steps is not necessarily limited to those steps or steps explicitly listed, but may include other steps or steps not explicitly listed or inherent to such processes, methods, products, or apparatus.

[0025] Traditional temperature rise tests typically involve operators manually switching circuit connections and using a high-precision voltage tester to measure the potential difference between different measuring points on the conductor in a static state, thereby calculating the conductor's resistance at a stable temperature. However, this manual switching process has the following problems:

[0026] 1. Operational safety risks: When manually switching circuits, operators may face the risk of electric shock or misoperation, especially in environments involving high voltage and high current.

[0027] 2. Data Accuracy: Interruptions caused by manually switching circuits may affect the accuracy of measurement results, as the resistance of a conductor may change due to natural temperature fluctuations. Furthermore, manual operation may result in imprecise selection of the measurement time point, thus affecting the accuracy of the resistance measurement.

[0028] 3. Inefficiency: Manually switching circuits requires additional time and manpower, which affects the efficiency and productivity of the entire temperature rise test.

[0029] 4. Complexity and operational difficulty: For multi-phase high-voltage switchgear, manually switching to the resistance measurement circuit requires a carefully designed sequence and complex operating procedures, which increases the complexity of the test and may lead to human error.

[0030] 5. Insufficient automation: Current temperature rise testing equipment lacks the ability to automatically switch between current loop and resistance measurement loop, which makes it impossible to automate the testing process and reduces the ease of use and reliability of the equipment.

[0031] In summary, existing high-voltage switch temperature rise testing equipment faces challenges in terms of safety, data accuracy, efficiency, operational complexity, and automation when measuring the resistance of a conductor after its temperature has stabilized.

[0032] In view of these shortcomings of traditional temperature rise test equipment and methods, this utility model proposes a technical solution for automatically measuring conductor resistance in its independent claims, aiming to improve the safety, accuracy and efficiency of the test, while simplifying the operation process and improving the level of automation.

[0033] Figure 1 This is a structural example diagram of a temperature rise testing device according to an embodiment of this application. Figure 1As shown, the temperature rise test device 10 includes a temperature rise test unit 104, a resistance test unit 106, and a switching unit 108. Specifically, the test object of the temperature rise test device 10 is a conductor unit 102, which has multiple measuring points. The temperature rise test unit 104 inputs current from a high-current generator into the conductor unit 102 to perform a temperature rise test. A high-current generator is a device capable of providing a large amount of current to simulate the operation of a high-voltage switch under high load conditions and to test its performance and stability. The resistance test unit 106 inputs a test current from a DC power supply into the conductor unit 102 to test the resistance between each of the multiple measuring points of the conductor unit 102 and the initial measuring point of the conductor unit 102. The switching unit 108 switches between a temperature rise test mode and a resistance test mode based on the temperature of multiple measuring points. In the temperature rise test mode, the switching unit 108 connects the circuit between the temperature rise test unit 104 and the conductor unit 102 and disconnects the circuit between the resistance test unit 106 and the conductor unit 102. In the resistance test mode, the switching unit 108 disconnects the circuit between the temperature rise test unit 104 and the conductor unit 102 and connects the circuit between the resistance test unit 106 and the conductor unit 102.

[0034] Furthermore, in the temperature rise test mode, the switching unit connects the circuit between the temperature rise test unit and the conductor unit, allowing a large current to flow through the conductor, simulating the current condition of a high-voltage switch under actual operating conditions to measure the temperature change of the conductor. Simultaneously, it disconnects the circuit between the resistance test unit and the conductor unit to ensure that the resistance measurement circuit is not affected during the temperature rise process, thus ensuring measurement accuracy.

[0035] In resistance testing mode, the switching unit disconnects the circuit between the temperature rise test unit and the conductor unit, stopping the supply of high current to prevent current from interfering with the results when measuring resistance. Simultaneously, it reconnects the circuit between the resistance test unit and the conductor unit, allowing a high-precision voltage tester to be connected to different measuring points on the conductor to measure the potential difference. Combined with the known test current, the resistance value of the conductor at a stable temperature is calculated.

[0036] This design not only improves the accuracy and efficiency of testing, but also ensures the safety of the testing process. By using automated control, it avoids the risks that may be caused by manual operation, enabling the temperature rise test and resistance test of high voltage switches to be carried out efficiently on the same equipment without the need for additional equipment or complicated operations.

[0037] Next, we will refer to Figure 2 This describes in detail the temperature rise testing device of an exemplary embodiment of the present invention. Figure 2As shown, the temperature rise test device 20 includes: a temperature rise test unit 204, a resistance test unit 206, a DC power supply 208, and a temperature rise measurement unit 210. The test object of the temperature rise test device 20 is a conductor unit 202. Multiple measuring points are set on the conductor unit 202, such as the multiple measuring points where relays K1...Kn are located. The temperature rise test unit 204 inputs current from a high-current generator into the conductor unit 202 to perform the temperature rise test. The temperature rise test unit 204 has three-phase terminals, namely, phase A terminal, phase B terminal, and phase C terminal, which are respectively connected to the corresponding phase terminals of the conductor unit 202. The resistance test unit 206 inputs test current from the DC power supply 208 into the conductor unit 202, testing each of the multiple measuring points of the conductor unit 202 against the initial measuring point of the conductor unit 202 (i.e., the...Kn). Figure 2 As shown, the resistance between the initial measuring points (such as relays K01, K02, and K03) is considered. The switching unit switches between a temperature rise test mode and a resistance test mode based on the temperatures of multiple measuring points. In the temperature rise test mode, the switching unit connects the circuit between the temperature rise test unit 204 and the conductor unit 202, and disconnects the circuit between the resistance test unit 206 and the conductor unit 202. In the resistance test mode, the switching unit disconnects the circuit between the temperature rise test unit 204 and the conductor unit 202, and connects the circuit between the resistance test unit 206 and the conductor unit 202.

[0038] The temperature rise testing device 20 also includes multiple measuring units (not shown), each of which is set at one of the multiple measuring points shown in K1...Kn. The measuring unit measures the temperature at the corresponding measuring point and generates a temperature signal. The temperature rise measuring unit 210 receives the temperature signals generated by the multiple measuring units, and when the temperature signals indicate that the temperature of the conductor unit 202 is stable, the temperature rise measuring unit 210 generates a temperature stabilization signal.

[0039] Multiple measurement units refer to a series of devices or sensors specifically designed to collect and record physical parameters (such as temperature). These units are installed at different locations or measurement points within a conductor unit to achieve multi-point synchronous monitoring. In the testing environment of high-voltage switchgear, these measurement points are selected to cover critical areas of the conductor, ensuring the comprehensiveness and effectiveness of data acquisition.

[0040] Specifically, each of the multiple measurement units corresponds to a specific measurement point on the conductor unit. These measurement points may include, but are not limited to, the starting point, ending point, connection point, or heat-generating part of the conductor. Their positions are designed to reflect the actual temperature distribution and changes of the conductor under high current. In the temperature rise test mode, the measurement unit is mainly responsible for detecting the temperature change at each measurement point and recording the temperature rise process.

[0041] Specifically, the temperature rise measurement unit 210 monitors the fluctuation amplitude of the temperature signal and generates a temperature stabilization signal when the fluctuation amplitude is less than a predetermined threshold. Next, in response to the temperature stabilization signal (e.g., the temperature rise measurement unit 210 transmits the temperature stabilization signal to the temperature rise test unit 204), the temperature rise test unit 204 enters a closed state. In response to the temperature stabilization signal (e.g., the temperature rise measurement unit 210 transmits the temperature stabilization signal to the switching unit), the switching unit switches to the resistance test mode.

[0042] Specifically, the switching unit includes: disconnector switch K21, A-phase relay group, B-phase relay group and C-phase relay group.

[0043] Disconnecting switch K21 is connected between temperature rise test unit 204 and conductor unit 202. Phase A relay group includes a first relay K11 and a second relay K01. The first relay K11 is connected between DC power supply 208 and the Phase A terminal of conductor unit 202, and the second relay K01 is connected between the Phase A terminal of conductor unit 202 and resistance test unit 206. Phase B relay group includes a third relay K12 and a fourth relay K01. The third relay K12 is connected between DC power supply 208 and the Phase B terminal of conductor unit 202, and the fourth relay K01 is connected between the Phase B terminal of conductor unit 202 and resistance test unit 206. Phase C relay group includes a fifth relay K13 and a sixth relay K03. The fifth relay K13 is connected between DC power supply 208 and the Phase C terminal of conductor unit 202, and the sixth relay K03 is connected between the Phase C terminal of conductor unit 202 and resistance test unit 206. Additionally, relay K14 is connected between DC power supply 208 and the output terminal of conductor unit 202.

[0044] In the temperature rise test mode, the isolating switch K21 is closed, and all relay groups (A-phase, B-phase, and C-phase) are de-energized. Additionally, a routine temperature rise test is performed, with the temperature rise measurement unit 210 measuring the temperature at multiple measuring points (such as the points where relays K1...Kn are located) on the conductor unit 202. Once the temperature rise measurement unit 210 or the host computer software detects that the conductor temperature has stabilized, the switching unit switches the temperature rise test device 20 to the resistance test mode. In the resistance test mode, the isolating switch K21 is opened to cut off the current loop, and then the relay groups (A-phase, B-phase, and C-phase), relays K01, K02, and K03 at the initial measuring point, and relays K1...Kn at the multiple measuring points are energized. In this circuit, relays K11, K12, and K13 control the A / B / C three-phase circuits respectively. During circuit measurement, relays K11, K12, and K13 can be energized sequentially, thereby supplying each phase conductor with a 100A / 200A DC resistance test circuit (where the current is measurable). The resistance test unit 206 may include a high-precision voltage measuring instrument, which measures the potential difference between different measuring points (i.e., the measuring points corresponding to relays K1...Kn) and the initial measuring points of each phase (i.e., the measuring points corresponding to relays K01, K02, and K03). Then, the resistance test unit 206 can divide this potential difference by the measured current to obtain the resistance between the measuring points (i.e., the measuring points corresponding to relays K1...Kn) and the initial measuring points of each phase (i.e., the measuring points corresponding to relays K01, K02, and K03).

[0045] Furthermore, although not shown, the measuring unit may include a temperature sensor, and the temperature rise measuring unit monitors the fluctuation amplitude of the temperature signal and generates a stable temperature signal when the fluctuation amplitude is less than a predetermined threshold.

[0046] The technical solution of this utility model achieves the following technical effects: It proposes a technical solution for automatically measuring conductor resistance, aiming to improve the safety, accuracy and efficiency of the test, while simplifying the operation process and improving the level of automation.

[0047] The above description is merely a preferred embodiment of this utility model and is not intended to limit the scope of this utility model. Various modifications and variations can be made to this utility model by those skilled in the art. Any modifications, equivalent substitutions, or improvements made within the principles of this utility model should be included within the protection scope of this utility model.

Claims

1. A temperature rise test device (10), characterized in that, The temperature rise test device includes: Temperature rise test unit (104), the temperature rise test unit is connected to a current generator, so that the current from the current generator is input to the conductor unit to perform a temperature rise test, and the temperature rise test unit is set to measure the temperature of multiple measuring points on the conductor unit; A resistance testing unit (106) is connected to a DC power supply, such that a test current from the DC power supply is input to the conductor unit. The resistance testing unit is configured to test the resistance between each of the plurality of test points on the conductor unit and an initial test point on the conductor unit. The switching unit (108) switches between a temperature rise test mode and a resistance test mode based on the temperature of the plurality of measuring points. In the temperature rise test mode, the switching unit connects the circuit between the temperature rise test unit and the conductor unit and disconnects the circuit between the resistance test unit and the conductor unit. In the resistance test mode, the switching unit disconnects the circuit between the temperature rise test unit and the conductor unit and connects the circuit between the resistance test unit and the conductor unit.

2. The temperature rise test apparatus according to claim 1, characterized in that, The temperature rise test device also includes: A plurality of measuring units, each of which is disposed at one of the plurality of measuring points, wherein the measuring units are configured to measure the temperature at the corresponding measuring point and generate a temperature signal; and The temperature rise measurement unit (210) receives the temperature signal generated by the plurality of measurement units, and generates a temperature stability signal when the temperature signal indicates that the temperature of the conductor unit is stable.

3. The temperature rise test apparatus according to claim 2, characterized in that, In response to the temperature stabilization signal, the temperature rise test unit enters a shutdown state; and In response to the temperature stabilization signal, the switching unit switches to the resistance test mode.

4. The temperature rise test apparatus according to any one of claims 1 to 3, characterized in that, The resistance testing unit includes: A voltage measuring device configured to test the potential difference between each of the plurality of measuring points of the conductor unit and an initial measuring point of the conductor unit; and A resistance determining device, wherein the resistance measuring device is configured to determine the resistance between each of the plurality of measuring points of the conductor unit and an initial measuring point of the conductor unit based on the potential difference and the test current.

5. The temperature rise test apparatus according to any one of claims 1 to 3, characterized in that, The switching unit includes: A disconnecting switch (K21) is connected between the temperature rise test unit and the conductor unit; The A-phase relay group includes a first relay (K11) and a second relay (K01). The first relay is connected between the DC power supply and the A-phase terminal of the conductor unit, and the second relay is connected between the A-phase terminal of the conductor unit and the resistance testing unit. The B-phase relay group includes a third relay (K12) and a fourth relay (K02). The third relay is connected between the DC power supply and the B-phase terminal of the conductor unit, and the fourth relay is connected between the B-phase terminal of the conductor unit and the resistance testing unit. The C-phase relay group includes a fifth relay (K13) and a sixth relay (K03). The fifth relay is connected between the DC power supply and the C-phase terminal of the conductor unit, and the sixth relay is connected between the C-phase terminal of the conductor unit and the resistance testing unit.

6. The temperature rise test apparatus according to claim 5, characterized in that, In the temperature rise test mode, the isolating switch is closed, and all relay groups (phase A, phase B, and phase C) are de-energized; and In the resistance test mode, the isolating switch is open, and the A-phase relay group, the B-phase relay group, and the C-phase relay group are energized in sequence.

7. The temperature rise test apparatus according to claim 2, characterized in that, The measurement unit includes a temperature sensor, and the temperature rise measurement unit is configured to monitor the fluctuation amplitude of the temperature signal, and generate the temperature stability signal when the fluctuation amplitude is less than a predetermined threshold.

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