Test equipment for liquid crystal display module

Abstract

The application discloses a test device for liquid crystal display module, which is used for improving the transfer efficiency of samples between different temperature zones. The application comprises a test box, a cylindrical gate and a moving table. The test box is internally provided with a high-temperature zone and a low-temperature zone, the high-temperature zone and the low-temperature zone are separated by a partition wall, and the cylindrical gate is rotatably arranged in the partition wall. The cylindrical gate is internally provided with a containing cavity, and the side wall of the cylindrical gate is provided with an opening in communication with the containing cavity. The cylindrical gate is controlled to rotate so that the opening faces the low-temperature zone or the high-temperature zone. The moving table is used for carrying a sample to be tested, and the moving table is controlled to be movable into the containing cavity so that the sample to be tested is transferred between the high-temperature zone and the low-temperature zone along with the rotation of the cylindrical gate.

Description

Technical Field

[0001] This application relates to the field of display module testing technology, and in particular to a testing device for liquid crystal display modules. Background Technology

[0002] During the manufacturing process of liquid crystal display (LCD) modules, thermal shock testing is often required to assess their resilience and reliability under rapid changes in extreme temperatures. Currently, the industry commonly uses a three-chamber (or three-slot) thermal shock test chamber to perform this test. The working area of ​​this equipment is typically divided into a high-temperature zone (+80 degrees Celsius), a low-temperature zone (-40 degrees Celsius), and a transition channel for sample transfer. A movable basket carries the test sample and moves it back and forth between the high and low temperature zones, subjecting the sample to severe temperature shocks.

[0003] Traditional three-chamber thermal shock test chambers typically isolate the high and low temperature zones using sliding or lifting isolation doors. These doors are constructed of metal sheets filled with thermal insulation material, and the edges are fitted with silicone sealing strips resistant to both high and low temperatures. When the isolation door is closed, the door presses against the sealing strips to create a seal, thus separating the high and low temperature zones.

[0004] However, traditional isolation doors use a sliding or lifting mechanism. During sample transfer, the basket can only carry the sample through after the isolation door is fully opened or closed. The operation is relatively cumbersome, and the opening and closing of the door takes a certain amount of time, reducing the efficiency of sample transfer between different temperature zones. Utility Model Content

[0005] To address the aforementioned technical problems, this application provides a testing device for liquid crystal display modules, which can improve the transfer efficiency of samples between different temperature zones.

[0006] The technical solution provided in this application is described below: This application provides a testing device for liquid crystal display modules, including: Test box, cylindrical gate and moving platform; The test chamber is equipped with a high-temperature zone and a low-temperature zone, which are separated by a partition wall. The columnar gate is rotatably installed in the partition wall. The cylindrical gate has an internal cavity, and the side wall of the cylindrical gate has an opening communicating with the cavity. The cylindrical gate is rotated in a controlled manner so that the opening faces the low temperature zone or the high temperature zone. The moving stage is used to carry the sample to be tested. The moving stage is controlled to move into the receiving cavity so that the sample to be tested can be transferred between the high temperature zone and the low temperature zone as the cylindrical gate rotates.

[0007] Optionally, the test chamber has transparent observation windows on the walls corresponding to the high-temperature zone and the low-temperature zone, respectively, for observing the sample to be tested.

[0008] Optionally, the transparent viewing window is made of tempered glass or acrylic sheet.

[0009] Optionally, the cylindrical gate has an internal cavity or is filled with heat-insulating material.

[0010] Optionally, a sealing layer is provided on the wall surface of the partition wall that cooperates with the column gate, and the sealing layer abuts against the outer peripheral wall of the column gate.

[0011] Optionally, the area of ​​the opening is smaller than the area of ​​the wall surface.

[0012] Optionally, a drive motor is installed inside the partition wall. The drive motor is located above the column gate and connected to the column gate. The drive motor is used to drive the column gate to rotate.

[0013] Optionally, the test chamber is equipped with a heating device and a cooling device on its top. The heating device is connected to the high-temperature zone and is used to maintain the temperature of the high-temperature zone. The cooling device is connected to the low-temperature zone and is used to maintain the temperature of the low-temperature zone.

[0014] Optionally, a first guide rail is provided at the bottom of the test chamber, and a second guide rail is provided at the bottom of the receiving cavity. When the opening faces the high temperature zone or the low temperature zone, the first guide rail and the second guide rail are connected so that the moving stage can move along the first guide rail and the second guide rail.

[0015] Optionally, thermometers are installed in both the high-temperature zone and the low-temperature zone.

[0016] As can be seen from the above technical solutions, this application has the following beneficial effects: This application establishes a high-temperature zone and a low-temperature zone within a test chamber, separated by a partition wall. A rotatable cylindrical gate is installed within the partition wall, housing a cavity inside the gate. An opening on one side of the gate connects to the internal cavity. The gate rotates controllably to orient the opening towards either the high-temperature or low-temperature zone. A movable stage is installed inside the test chamber to carry the sample. This stage is controllably movable. Therefore, when transferring the sample between different temperature zones, the cylindrical gate is rotated so that the opening faces the stage in the current temperature zone, moving the stage and sample into the cavity. The gate is then rotated again to face the other temperature zone, and the stage is moved out. This eliminates the need for independent door opening and closing waiting time, improving the efficiency of sample transfer between different temperature zones. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of a test device for a liquid crystal display module according to this application; Figure 2 This is another schematic diagram of a testing device for a liquid crystal display module according to this application; Figure 3 This is a front view schematic diagram of a test device for a liquid crystal display module according to this application; Figure 4 This is a cross-sectional schematic diagram of a test device for a liquid crystal display module according to this application; Figure 5 This is a schematic diagram showing the connection between a cylindrical gate and a drive motor in a test device for a liquid crystal display module according to this application; In the figure, test chamber 01, column gate 02, moving stage 03, high temperature zone 04, low temperature zone 05, partition wall 06, opening 07, sample to be tested 08, transparent observation window 09, drive motor 10, heating device 11, cooling device 12, first guide rail 13, second guide rail 14, and door 15. Detailed Implementation

[0018] In this application, the terms "upper", "lower", "left", "right", "front", "rear", "top", "bottom", "inner", "outer", "middle", "vertical", "horizontal", "lateral", "longitudinal" and other terms indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only used to describe the relative positional relationship between the components or parts and do not specifically limit the specific installation orientation of each component or part.

[0019] Furthermore, in addition to indicating location or positional relationship, some of the aforementioned terms may also have other meanings. For example, the term "above" may also be used in some cases to indicate a certain dependency or connection relationship. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.

[0020] Furthermore, the terms "installation," "setup," "equipped with," "connection," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral structure; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium, or an internal connection between two devices, components, or parts. Those skilled in the art can understand the specific meaning of these terms in this application based on the specific circumstances.

[0021] Furthermore, the structures, proportions, sizes, etc., drawn in the accompanying drawings of this application are only used to complement the content disclosed in the specification for those skilled in the art to understand and read, and are not intended to limit the conditions under which this application can be implemented. Therefore, they have no substantial technical significance. Any modification to the structure, change in the proportional relationship, or adjustment of the size, without affecting the effects and purposes that this application can produce, should still fall within the scope of the technical content disclosed in this application.

[0022] The technical solutions of this application will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0023] Traditional sliding or lifting isolation doors consume time when opening and closing, resulting in low sample transfer efficiency. This application proposes a testing device with a liquid crystal display module, which can improve the transfer efficiency of samples between different temperature zones. The specific description of this application is as follows: See Figures 1 to 5 The testing equipment for a liquid crystal display module provided in this application includes: The test chamber 01 comprises a cylindrical gate 02 and a moving stage 03. The test chamber 01 has a high-temperature zone 04 and a low-temperature zone 05, which are separated by a partition wall 06. The cylindrical gate 02 is rotatably mounted in the partition wall 06. The cylindrical gate 02 has a receiving cavity inside, and the side wall of the cylindrical gate 02 has an opening 07 communicating with the receiving cavity. The cylindrical gate 02 is rotated in a controlled manner so that the opening 07 faces the low-temperature zone 05 or the high-temperature zone 04. The moving stage 03 is used to carry the sample 08 to be tested. The moving stage 03 is controlled to move into the receiving cavity so that the sample 08 to be tested can be transferred between the high-temperature zone 04 and the low-temperature zone 05 as the cylindrical gate 02 rotates.

[0024] The test chamber 01 is internally divided into a high-temperature zone 04 and a low-temperature zone 05, which are physically separated by a partition wall 06. The partition wall 06 not only divides the different temperature zones but also effectively reduces heat exchange between the high-temperature zone 04 and the low-temperature zone 05, ensuring temperature stability in each zone. It should be noted that each of the high-temperature zone 04 and the low-temperature zone 05 is equipped with a door 15. The door 15 is opened to allow for sample loading and unloading, and must be kept tightly closed during the thermal shock test.

[0025] The partition wall 06 is filled with heat-insulating materials, such as glass wool or aluminum silicate fiber felt, to further reduce heat transfer between the high-temperature zone 04 and the low-temperature zone 05, thereby improving the accuracy of temperature control. The partition wall 06 is sealed to the inner wall of the test chamber 01 using sealant or sealing strips to prevent air leakage between the high-temperature zone 04 and the low-temperature zone 05, which could affect the temperature control performance.

[0026] A columnar gate 02 is rotatably installed in a partition wall 06 between a high-temperature zone 04 and a low-temperature zone 05. The inside of the columnar gate 02 is hollowed out to form a receiving cavity. An opening 07 is provided on one side of the columnar gate 02, and the opening 07 communicates with the receiving cavity. The columnar gate 02 can be rotated in a controlled manner so that the opening 07 faces the low-temperature zone 05 or the high-temperature zone 04, thereby realizing the communication and isolation between different temperature zones and the receiving cavity.

[0027] The moving stage 03 is used to carry the sample 08 to be tested, i.e., the LCD display module. After being controlled, the moving stage 03 moves within the test chamber 01, such as by remote control of forward and stop. The moving stage 03 can be moved under control into the receiving cavity of the cylindrical gate 02, at which time the sample 08 to be tested enters the receiving cavity so that it can be transferred between different temperature zones as the cylindrical gate 02 rotates.

[0028] In thermal shock testing, the sample to be tested 08 needs to stay in the high temperature zone 04 for a preset time, which can be 8 hours, 10 hours or longer. The duration of stay is set according to the specific test requirements. Similarly, the duration of stay in the low temperature zone 05 is also the same.

[0029] In the thermal shock test, after the residence time in the high temperature zone 04 is sufficient, the cylindrical gate 02 is first controlled to rotate so that the opening 07 on the cylindrical gate 02 faces the high temperature zone 04. At this time, the moving stage 03 is controlled to move through the opening 07 and enter the receiving cavity. Then, the cylindrical gate 02 is controlled to continue to rotate until the opening 07 on the cylindrical gate 02 faces the low temperature zone 05. Finally, the moving stage 03 is controlled to move out of the receiving cavity and enter the low temperature zone 05.

[0030] By repeating the above transfer process of the test sample 08, the test sample 08 can be cycled multiple times between the high temperature zone 04 and the low temperature zone 05 to simulate the extreme temperature changes that may be encountered in actual use, thereby evaluating the tolerance and reliability of the liquid crystal display module.

[0031] Compared with the traditional three-chamber thermal shock test chamber, this application uses the rotation of the column gate 02 to transfer the sample 08 to be tested between different temperature zones. Unlike traditional equipment, it does not require waiting for the isolation door to be fully opened or closed, which greatly shortens the sample transfer time and improves the efficiency of the entire testing process.

[0032] Because the transfer process is fast and efficient, this application can achieve more frequent temperature shock cycles and complete more tests in the same amount of time, thereby accelerating the product testing process.

[0033] In addition, during the rotation of the column gate 02, the high-temperature zone 04 and the low-temperature zone 05 are always kept separate, thereby reducing the temperature fluctuation between the high-temperature zone 04 and the low-temperature zone 05.

[0034] In an optional embodiment, the test chamber 01 is provided with transparent observation windows 09 on the walls corresponding to the high temperature zone 04 and the low temperature zone 05, respectively, for observing the sample 08 to be tested.

[0035] Transparent observation windows 09 are installed on the walls of test chamber 01, corresponding to the high-temperature zone 04 and the low-temperature zone 05, respectively. This allows operators to easily observe the changes in the state of the sample 08 under test in real time during the thermal shock test. In the thermal shock test of the LCD display module, the sample may exhibit various abnormalities due to drastic temperature changes, such as screen display abnormalities, structural deformation, and material aging. Through the transparent observation windows 09, operators can promptly identify problems and record relevant data without opening test chamber 01, providing crucial information for subsequent product analysis and improvement.

[0036] In this optional embodiment, the transparent observation window 09 is made of tempered glass or acrylic sheet. In this embodiment, both tempered glass and acrylic sheet have high light transmittance, providing a clear, distortion-free field of view, allowing the operator to accurately observe detailed changes in the sample.

[0037] In an optional embodiment, the cylindrical gate 02 has an internal cavity or is filled with heat-insulating material.

[0038] The cavity can play a certain role in heat insulation. The column gate 02 is located between the high temperature zone 04 and the low temperature zone 05. Its internal cavity can prevent the rapid transfer of heat and reduce the temperature diffusion and transfer between the high temperature zone 04 and the low temperature zone 05.

[0039] Alternatively, insulation material can be filled inside the column gate 02 to achieve the effect of blocking heat transfer. The specific insulation material can be asbestos, calcium silicate board, polyurethane foam, etc.

[0040] In an optional embodiment, a sealing layer is provided on the wall surface of the partition wall 06 that cooperates with the column gate 02, and the sealing layer abuts against the outer peripheral wall of the column gate 02.

[0041] The sealing layer is set on the wall surface where the partition wall 06 and the column gate 02 meet, specifically on the surface where the partition wall 06 contacts the outer peripheral wall of the column gate 02. In this way, during the rotation of the column gate 02, the sealing layer can tightly abut against the outer peripheral wall of the gate, further blocking heat transfer.

[0042] In this optional embodiment, the area of ​​opening 07 is smaller than the area of ​​the wall.

[0043] In this embodiment, the area of ​​the opening 07 is smaller than the area of ​​the partition wall 06. Therefore, when the opening 07 is rotated to face the partition wall 06, the high-temperature zone 04 and the low-temperature zone 05 are double-layered blocked by the column gate 02. During the rotation, the high-temperature zone 04 and the low-temperature zone 05 can always be kept separate, further reducing the temperature influence between the high-temperature zone 04 and the low-temperature zone 05.

[0044] In an optional embodiment, a drive motor 10 is provided inside the partition wall 06. The drive motor 10 is located above the column gate 02 and connected to the column gate 02. The drive motor 10 is used to drive the column gate 02 to rotate.

[0045] In this embodiment, the drive motor 10 is located above the column gate 02 and is connected to the column gate 02 via gears. The drive motor 10 is generally a stepper motor or a servo motor.

[0046] In an optional embodiment, the top of the test chamber 01 is provided with a heating device 11 and a cooling device 12. The heating device 11 is connected to the high temperature zone 04 and is used to maintain the temperature of the high temperature zone 04. The cooling device 12 is connected to the low temperature zone 05 and is used to maintain the temperature of the low temperature zone 05.

[0047] The heating device 11 is installed at the top of the test chamber 01, connecting to the high-temperature zone 04. It mainly consists of heating elements, a fan, a temperature sensor, and a control system. The heating elements are high-efficiency electric heating tubes, evenly distributed inside the heating device 11, enabling rapid and uniform heat generation. The fan is installed on one side of the heating device 11, employing a centrifugal or axial flow fan with a large air volume and pressure, rapidly dissipating and evenly distributing the heat generated by the heating elements into the high-temperature zone 04.

[0048] The refrigeration unit 12 is installed at the top of the test chamber 01, connecting to the low-temperature zone 05. The refrigeration unit 12 mainly consists of a compressor, condenser, evaporator, and throttling device. The compressor compresses the low-temperature, low-pressure refrigerant gas into a high-temperature, high-pressure gas, providing power for the refrigeration cycle. The condenser is installed outside the refrigeration unit 12, using a cooling fan to dissipate the heat of the high-temperature, high-pressure refrigerant gas into the external environment, cooling the refrigerant gas and condensing it into a high-pressure liquid. The throttling device uses a thermostatic expansion valve or an electronic expansion valve to throttle and reduce the pressure of the high-pressure liquid refrigerant, turning it into a low-temperature, low-pressure liquid. The evaporator is installed inside the low-temperature zone 05. The low-temperature, low-pressure liquid refrigerant absorbs heat from the low-temperature zone 05 in the evaporator and evaporates into a low-temperature, low-pressure gas, thus achieving refrigeration in the low-temperature zone 05.

[0049] In an optional embodiment, a first guide rail 13 is provided at the bottom of the test chamber 01, and a second guide rail 14 is provided at the bottom of the receiving cavity. When the opening 07 faces the high temperature zone 04 or the low temperature zone 05, the first guide rail 13 and the second guide rail 14 are connected so that the moving stage 03 can move along the first guide rail 13 and the second guide rail 14.

[0050] The first guide rail 13 is respectively set at the bottom of the high temperature zone 04 and the bottom of the low temperature zone 05, and the second guide rail 14 is set at the bottom of the receiving cavity of the column gate 02, the bottom of the receiving cavity is flush with the bottom of the test box 01; the second guide rail 14 can rotate with the column gate 02, and when the column gate 02 rotates to the point where the second guide rail 14 is aligned with the first guide rail 13, the moving stage 03 can move on the first guide rail 13 and the second guide rail 14.

[0051] In an optional embodiment, thermometers are respectively installed in the high-temperature zone 04 and the low-temperature zone 05.

[0052] In this embodiment, by setting a thermometer, the temperature changes in the high-temperature zone 04 and the low-temperature zone 05 can be detected in real time, which facilitates timely adjustments when the temperature changes.

Claims

1. A testing device for a liquid crystal display module, characterized in that, include: Test box, cylindrical gate and moving platform; The test chamber is equipped with a high-temperature zone and a low-temperature zone, which are separated by a partition wall. The columnar gate is rotatably installed in the partition wall. The cylindrical gate has an internal cavity, and the side wall of the cylindrical gate has an opening communicating with the cavity. The cylindrical gate is rotated in a controlled manner so that the opening faces the low temperature zone or the high temperature zone. The moving stage is used to carry the sample to be tested. The moving stage is controlled to move into the receiving cavity so that the sample to be tested can be transferred between the high temperature zone and the low temperature zone as the cylindrical gate rotates.

2. The testing equipment according to claim 1, characterized in that, The test chamber has transparent observation windows on its walls corresponding to the high-temperature zone and the low-temperature zone, respectively, for observing the sample to be tested.

3. The testing equipment according to claim 2, characterized in that, The transparent viewing window is made of tempered glass or acrylic sheet.

4. The testing equipment according to any one of claims 1 to 3, characterized in that, The cylindrical gate has an internal cavity or is filled with heat-insulating material.

5. The testing equipment according to any one of claims 1 to 3, characterized in that, A sealing layer is provided on the wall surface of the partition wall that cooperates with the column gate, and the sealing layer abuts against the outer peripheral wall of the column gate.

6. The testing equipment according to claim 5, characterized in that, The area of ​​the opening is smaller than the area of ​​the wall.

7. The testing equipment according to any one of claims 1 to 3, characterized in that, A drive motor is installed inside the partition wall. The drive motor is located above the column gate and connected to the column gate. The drive motor is used to drive the column gate to rotate.

8. The testing equipment according to any one of claims 1 to 3, characterized in that, The test chamber is equipped with a heating device and a cooling device on its top. The heating device is connected to the high-temperature zone and is used to maintain the temperature of the high-temperature zone. The cooling device is connected to the low-temperature zone and is used to maintain the temperature of the low-temperature zone.

9. The testing equipment according to any one of claims 1 to 3, characterized in that, The bottom of the test chamber is provided with a first guide rail, and the bottom of the receiving cavity is provided with a second guide rail. When the opening faces the high temperature zone or the low temperature zone, the first guide rail and the second guide rail are connected so that the moving stage can move along the first guide rail and the second guide rail.

10. The testing equipment according to any one of claims 1 to 3, characterized in that, Thermometers are installed in both the high-temperature zone and the low-temperature zone.

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