Probe and socket

Abstract

To provide a probe having low resistance and capable of coping with a high current, and a socket equipped with the same.SOLUTION: The probe includes a plate spring part and a substantially cylindrical part at least at one end of the plate spring part, and is formed of one conductive elastic plate-like member.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a probe and a socket. [Background technology]

[0002] Probes generally called pogo pins are made up of multiple components, and because of the contact points between the components, electrical resistance is relatively high, instability due to sliding is likely to occur, the allowable current is low, and they are more expensive than leaf spring probes.

[0003] Conventional flat spring probes are generally press-fit into a housing, which makes probe replacement impossible. Also, the hole in the housing for inserting the probe is rectangular to match the cross section of the flat spring, so molding the housing requires more processing technology than a round hole.

[0004] Patent Document 1 below discloses a contact pin made by bending a plate-shaped conductive material into a cylindrical shape around an axis extending in the longitudinal direction. However, the middle spring part has many slits, which increases the electrical resistance. [Prior art documents] [Patent documents]

[0005] [Patent Document 1] Japanese Patent Application Laid-Open No. 2006-266869 Summary of the Invention [Problem to be solved by the invention]

[0006] An example of an object of the present invention is to provide a probe and a socket equipped with the same that have a simple structure, low resistance, and are capable of handling high current. Other objects of the present invention will become apparent from the description of this specification. [Means for solving the problem]

[0007] One aspect of the present invention is a probe comprising a leaf spring portion and a substantially cylindrical portion at at least one end of the leaf spring portion, and formed from a single conductive elastic plate member.

[0008] The probe according to the above aspect of the present invention has a simple structure, has low resistance because it has no internal electrical contacts, and can handle high currents. [Brief explanation of the drawings]

[0009] [Figure 1] 1 is a perspective view of a probe 1 according to a first embodiment of the present invention. [Figure 2] 1 is a development view of a conductive elastic plate-like member for forming the probe 1. FIG. [Figure 3] FIG. 2 is a front cross-sectional view showing a socket 5 equipped with a probe 1. [Figure 4] FIG. 1 is a perspective view of a probe 1A according to a second embodiment of the present invention. [Figure 5] FIG. 10 is a perspective view of a probe 1B according to a third embodiment of the present invention. [Figure 6] FIG. 10 is a perspective view of a probe 1C according to a fourth embodiment of the present invention. [Figure 7] FIG. 10 is a perspective view of a probe 1D according to a fifth embodiment of the present invention. [Figure 8] FIG. 10 is a perspective view of a probe 1E according to a sixth embodiment of the present invention. [Figure 9] FIG. 2 is an enlarged perspective view of a main part of the probe 1E. [Figure 10] FIG. 10 is a development view of a conductive elastic plate-like member for forming a probe 1E. [Figure 11] FIG. 11 is a perspective view of a probe 1F according to a seventh embodiment of the present invention. [Figure 12] FIG. 10 is an enlarged perspective view of the main part of the tip side of the probe 1F. [Figure 13] FIG. 2 is an enlarged perspective view of a main part on the rear end side of the probe 1F. [Figure 14] FIG. 13 is a perspective view of a probe 1G according to an eighth embodiment of the present invention. DETAILED DESCRIPTION OF THE INVENTION

[0010] (Embodiment 1) A probe 1 according to a first embodiment of the present invention and a socket 5 including the probe will be described using Figures 1 to 3. As shown in these figures, the probe 1 has a leaf spring portion 11 and substantially cylindrical portions 12 and 13 as tubular portions at both ends thereof, and is formed from a single conductive elastic plate member 20 shown in Figure 2. The substantially cylindrical portion 12 is formed on the tip side of the probe 1, and the substantially cylindrical portion 13 is formed on the rear end side of the probe 1.

[0011] 2, which is used to fabricate the probe 1, is a metal plate made of a conductive and flexible copper alloy such as phosphor bronze or beryllium copper, and has a strip-shaped connecting portion 21 of a certain width that becomes the leaf spring portion 11, and end wide portions 22 and 23 that are wider than the strip-shaped connecting portion 21 and form the approximately cylindrical portions 12 and 13. The end wide portions 22 and 23 are then bent into arcs by sheet metal processing, thereby forming the approximately cylindrical portions 12 and 13 at both ends of the leaf spring portion 11, which consists of the strip-shaped connecting portion 21, as shown in FIG. 1. The approximately cylindrical portion 12 is made up of a pair of arc-shaped portions 12a and 12b, and the approximately cylindrical portion 13 is made up of a pair of arc-shaped portions 13a and 13b, so that slits 12c and 13c are formed at the butt joints of the pair of arc-shaped portions 12a and 12b and the pair of arc-shaped portions 13a and 13b, respectively.

[0012] As shown in FIG. 3 , the socket 5 includes multiple probes 1, a housing 30 made of a rigid, insulative hard material, and a testing board 40 fixed to the bottom surface of the housing 30. The housing 30 includes a first support member 31 having an insertion hole 31a into which the approximately cylindrical portion 12, which is the front end of the probe 1, is placed, and a second support member 32 having an insertion hole 32a into which the approximately cylindrical portion 13, which is the rear end, is placed. The first and second support members 31 and 32 are held at a fixed distance. The insertion holes 31a and 32a are round holes that are easy to machine and form, and support the approximately cylindrical portions 12 and 13 in the vertical direction without rattle, allowing them to move freely, e.g., slide freely. The testing board 40 has electrode pads that electrically contact the approximately cylindrical portion 13 of the probe 1, but the electrode pads are not shown.

[0013] The socket 5 is assembled, for example, by the following procedure. The probes 1, with their flat spring portions 11 in a straight state as shown in FIG. 1, are inserted into the insertion holes 31a and 32a of the first and second support members 31 and 32 before being fixed in position. Next, the second support member 32 is shifted in the direction of arrow P (horizontally) relative to the first support member 31, so that the flat spring portions 11 of each probe 1 are bent in the same direction, as shown in FIG. 3, and the relative positions of the first and second support members 31 and 32 are fixed. The insertion postures of the probes 1 are aligned in advance so that the width direction of the flat spring portions 11 is approximately perpendicular to the plane of the paper in FIG. 3. By bending the flat spring portions 11 in the same direction in this way, the flat spring portions 11 of each probe 1 are bent in the same direction during measurement, when the probes 1 are pressed against bumps (solder balls, etc.) 51 serving as electrodes of the device under test 50. As a result, the arrangement pitch of the insertion holes 31a and 32a can be narrowed, in other words, the arrangement intervals of the probes 1 can be narrowed.

[0014] When measuring the device under test 50, the device under test 50 is placed on the socket 5, the bumps 51 of the device under test 50 are brought into contact with the approximately cylindrical portion 12 that serves as the tip-side contact portion, and a load F is applied downward. The load F presses down the approximately cylindrical portion 12 of the probe 1 that protrudes from the housing portion 30, increasing the amount of deflection of the leaf spring portion 11, which enables the probe 1 to generate the required contact pressure on the bumps 51 while absorbing variations in the height of the bumps 51. At the same time, the approximately cylindrical portion 13 that serves as the rear-side contact portion comes into contact with the electrode pads of the testing board 40 with the required contact pressure.

[0015] According to this embodiment, the following effects can be achieved.

[0016] (1) The probe 1 is formed from a single conductive elastic plate member 20 so as to have a leaf spring portion 11 and substantially cylindrical portions 12 and 13 that serve as contact points on either side of the leaf spring portion 11. This makes it a single component, resulting in a simple and low-cost structure, and since there are no internal contact points or sliding parts, the electrical resistance is low and stable, and it can accommodate a large allowable current.

[0017] (2) The elastic plate-like member 20 used to make the probe 1 has a band-like connecting portion 21 of a constant width, which becomes the leaf spring portion 11. Since the leaf spring portion 11 has a constant width, the cross-sectional area of ​​the transverse section of the leaf spring portion 11 is constant, which prevents the bending stress applied to the probe 1 from concentrating locally when measuring the device under test shown in Figure 3.

[0018] (3) The housing portion 30 of the socket 5 includes a first support member 31 having an insertion hole 31a in which the substantially cylindrical portion 12, which is the tip end of the probe 1, is disposed, and a second support member 32 having an insertion hole 32a in which the substantially cylindrical portion 13, which is the rear end, is disposed, and the insertion holes 31a, 32a may be round holes corresponding to the substantially cylindrical portions 12, 13. This facilitates processing and results in a structure that allows the probe 1 to be replaced.

[0019] (4) When the insertion holes 31a, 32a of the housing portion 30 are circular holes, if both ends of the leaf spring portion 11 of the probe 1 remain thin, the position within the circular hole is unstable. However, by forming approximately cylindrical portions 12, 13 as approximately tubular portions at both ends of the probe 1, the position within the circular hole is stabilized, and it is also possible to accommodate narrower spacing between the electrodes of the device under test 50.

[0020] (5) In the housing 30, the probes 1 are supported with the leaf springs 11 bent in the same direction, so that the leaf springs 11 of the probes 1 bend in the same direction when measuring the device under test 50. As a result, contact between adjacent leaf springs 11 can be avoided, and the arrangement pitch of the insertion holes 31a, 32a can be narrowed.

[0021] (Embodiment 2) 4 shows a probe 1A according to a second embodiment of the present invention. In this case, the probe 1A has a leaf spring portion 11 and substantially cylindrical portions 12, 13A at both ends thereof, and differs from the first embodiment in that the substantially cylindrical portions 12, 13A are formed in opposite directions relative to the leaf spring portion 11. According to the second embodiment, the leaf spring portion 11 is more easily bent than in the first embodiment. The other configurations and effects are the same as those of the first embodiment.

[0022] (Embodiment 3) FIG. 5 shows a probe 1B according to a third embodiment of the present invention. In this case, the probe 1B has a structure in which an approximately cylindrical portion 14 is formed in the middle of the leaf spring portion 11. Since the approximately cylindrical portion 14 in the middle does not bend, the spring length is effectively shortened, and the spring pressure increases when testing the device under test. The other configurations are the same as those of the first embodiment. In the probe 1B, the spring pressure can be adjusted by forming the approximately cylindrical portion 14 in the middle of the leaf spring portion 11. The other effects are the same as those of the first embodiment.

[0023] (Embodiment 4) FIG. 6 shows a probe 1C according to a fourth embodiment of the present invention. In this case, the probe 1C has a structure in which a curved portion 15 curved along the longitudinal direction is formed in the middle of the leaf spring portion 11. The other configurations are the same as those of the first embodiment. In the probe 1C, by forming the curved portion 15 in the middle of the leaf spring portion 11, the bending direction can be set in advance and the spring pressure can be adjusted. The other effects are the same as those of the first embodiment.

[0024] (Embodiment 5) FIG. 7 shows a probe 1D according to a fifth embodiment of the present invention. In this case, the tip of the probe 1D, which is a substantially cylindrical portion 12A, has a mountain-shaped tip portion 16 at its tip edge that comes into contact with the bumps of the device under test. The other configurations are the same as those of the first embodiment shown in FIG. 1. Because the tip edge of the probe 1D has the mountain-shaped tip portion 16, contact can be improved by adapting it to the shape of the bumps of the device under test. The other effects are the same as those of the first embodiment.

[0025] (Embodiment 6) A probe 1E according to a sixth embodiment of the present invention will be described with reference to Figures 8 to 10. As shown in these figures, the probe 1E has two overlapping leaf spring portions 11B and approximately cylindrical portions 12B and 13B at both ends thereof, and is formed from a single conductive elastic plate member 25 shown in Figure 10. The approximately cylindrical portion 12B forms the leading end that contacts the bumps of the device to be measured, and the approximately cylindrical portion 13B forms the trailing end that contacts the electrode pads of the test board.

[0026] The elastic plate member 25 shown in FIG. 10 for fabricating the probe 1E is a metal plate made of a conductive and flexible copper alloy, such as phosphor bronze or beryllium copper. It includes a pair of uniform-width strip-shaped connecting portions 26A, 26B that form the leaf spring portion 11B, and end wide portions 27, 28 that are wider than the distance Q between the outer edges of the strip-shaped connecting portions 26A, 26B and are continuous with the strip-shaped connecting portions 26A, 26B. The end wide portions 27, 28 are used to form the approximately cylindrical portions 12B, 13B. The end wide portions 27, 28 are then wound into an annular shape by sheet metal processing, thereby forming the approximately cylindrical portion 12B, which has two overlapping portions as shown in FIG. 9. Although not shown, the approximately cylindrical portion 13B is also formed at the same time. At this time, the end wide portions 27, 28 are rounded so that the strip-shaped connecting portions 26A, 26B are positioned to overlap. The overlapping portion of the band-shaped connecting portions 26A and 26B forms the leaf spring portion 11B.

[0027] According to this embodiment 6, when comparing the leaf spring portion 11 of embodiment 1 with a leaf spring portion 11B of the same thickness (the sum of the thicknesses of the strip-shaped connecting portions 26A and 26B), the two-ply leaf spring portion 11B is more flexible, making it possible to reduce the spring pressure compared to embodiment 1. Other effects are the same as those of embodiment 1.

[0028] (Embodiment 7) FIG. 11 shows a probe 1F according to a seventh embodiment of the present invention. In this case, the probe 1F is configured by folding a long elastic plate-like member in half at a longitudinal midpoint and stacking the folded-over leaf spring portion 11C, and includes substantially cylindrical portions 17 and 18 at both ends of the leaf spring portion 11C. As shown in FIG. 12, the substantially cylindrical portion 17 is divided into opposing arc-shaped portions 17a and 17b by a slit 19, forming a substantially cylindrical shape overall. As shown in FIG. 13, the substantially cylindrical portion 18 at the rear end has a similar structure, but for processing reasons, it is located slightly forward of the folded rear end of the elastic plate-like member. The substantially cylindrical portion 17 forms the forward end that contacts the bumps of the measurement device, and the substantially cylindrical portion 18 forms the rear end that contacts the electrode pads of the test board.

[0029] According to this embodiment 7, when comparing the leaf spring portion 11 of embodiment 1 with a folded leaf spring portion 11C of the same thickness (same cross-sectional area as leaf spring portion 11), the folded leaf spring portion 11C is more flexible, making it possible to reduce the spring pressure compared to embodiment 1 even if the electrical resistance is the same. The substantially cylindrical portions 17 and 18, consisting of the opposing arc-shaped portions 17a and 17b, can be easily formed by sheet metal processing before folding the long elastic plate member. Other effects are the same as those of embodiment 1.

[0030] (Embodiment 8) FIG. 14 shows a probe 1G according to an eighth embodiment of the present invention. In this case, the probe 1G has gentle bends 35, 36 in the longitudinal direction of the middle part of the leaf spring part 11C that is folded in half. The other configurations are the same as those of the eighth embodiment shown in FIG. 12. According to this ninth embodiment, by forming the gentle bends 35, 36 in advance in the middle part of the leaf spring part 11C, the leaf spring part 11C becomes more flexible and the bending direction can be aligned. The other effects are the same as those of the first embodiment.

[0031] Although the embodiments and modifications of the present invention have been described above with reference to the drawings, these are merely examples of the present invention, and various configurations other than those described above can also be adopted.

[0032] In the first embodiment shown in FIG. 1 , the probe 1 has a generally cylindrical portion 12 at the distal end and a generally cylindrical portion 13 at the proximal end. However, the shape is not limited to a generally cylindrical shape and may be other cylindrical shapes that are inscribed in the circular hole of the socket housing, such as a polygonal cylindrical shape, or a shape in which a small-diameter arc-shaped portion is inserted inside an arc-shaped portion. When a polygonal cylindrical shape is formed from sheet metal, the corners of the polygonal cylindrical shape are rounded rather than sharp because an R of approximately twice the thickness of the sheet metal is applied. Furthermore, the lengths of the generally cylindrical portions at the distal end and the proximal end do not need to be the same. The portion of the generally cylindrical portion at the distal end that contacts the electrode of the device under test can be appropriately modified, such as a crown shape or a cone shape.

[0033] In the probe 1E relating to embodiment 6 shown in Figures 8 to 10, two constant-width strip-shaped connecting portions 26A, 26B are formed in the elastic plate-shaped member 25, thereby forming a double-structure leaf spring portion 11B in which the strip-shaped connecting portions 26A, 26B overlap.However, by using three or more strip-shaped connecting portions that form the leaf spring portion, a multi-structure leaf spring portion can be formed.

[0034] In the embodiment 1 shown in FIG. 1, the probe 1 has a tip end portion formed with an approximately cylindrical portion 12 and a rear end portion formed with an approximately cylindrical portion 13, but depending on conditions such as the area and arrangement pitch of the electrode pads on the testing board, it is also possible to omit the approximately cylindrical portion 13 at the rear end portion and have the end of the leaf spring portion 11 come into contact with the electrode pads on the testing board.

[0035] In the third embodiment shown in Fig. 5, a substantially cylindrical portion 14 is formed in the middle of the leaf spring portion 11, but if the purpose is to substantially shorten the leaf spring portion, a bent portion having, for example, a substantially L-shaped cross section may be formed in the middle. Also, by changing the width of the leaf spring portion midway, the spring pressure can be adjusted.

[0036] Although the socket 5 is illustrated as being equipped with the probe 1 of FIG. 1, the probe 1A of the second embodiment of FIG. 4, the probe 1B of the third embodiment of FIG. 5, the probe 1C of the fourth embodiment of FIG. 6, the probe 1D of the fifth embodiment of FIG. 7, the probe 1E of the sixth embodiment of FIG. 8, the probe 1F of the seventh embodiment of FIG. 11, or the probe 1G of the eighth embodiment of FIG. 14 can be used instead of the probe 1.

[0037] 3 has been described as having a test board 40, the socket may not have a test board. For example, there may be a configuration in which the test board is in a separate device and the socket without a test board is attached to the test board of the separate device.

[0038] In the housing 30 of the socket 5 shown in Fig. 3, the first and second insertion holes 31a, 32a of the first and second support members 31, 32, in which the ends of the individual probes 1 are arranged, are offset from each other in plan view. However, the first and second insertion holes 31a, 32a, in which the ends of the individual probes 1 are arranged, may be aligned in plan view. For example, the probe 1C of embodiment 4 shown in Fig. 6 has a structure in which a curved portion 15 is formed in the middle of the leaf spring portion 11, so that the first and second insertion holes 31a, 32a are aligned in plan view. In this case, by aligning the orientation of the curved portions 15 of each probe C, the arrangement pitch of the insertion holes 31a, 32a can be narrowed; in other words, the arrangement interval of the probes 1C can be narrowed.

[0039] According to the present specification, there are provided a probe and a socket having the following aspects.

[0040] (Aspect 1) A leaf spring portion; a substantially cylindrical portion at at least one end of the leaf spring portion, A probe formed from a single conductive elastic plate-like material.

[0041] According to the above-mentioned first aspect, the structure is simple, there are no internal electrical contacts, and therefore the resistance is low and it is possible to handle a high current.

[0042] (Aspect 2) The probe, wherein the portion of the elastic plate member that becomes the plate spring portion is in the shape of a strip having a constant width.

[0043] According to the above-mentioned second aspect, since the leaf spring portion has a constant width, the cross-sectional area of ​​the transverse section of the leaf spring portion is constant, and it is possible to prevent the bending stress applied to the probe when measuring the device under test from concentrating locally.

[0044] (Aspect 3) The probe, wherein the substantially tubular portion has a substantially cylindrical or substantially rectangular tubular outer shape.

[0045] According to the above-mentioned aspect 3, when the insertion hole of the housing part is a round hole, if both ends of the leaf spring part of the probe remain thin, the position within the round hole will be unstable. However, by forming an approximately cylindrical part with an approximately cylindrical or approximately square cylindrical outer shape at both ends of the probe, the position within the round hole can be stabilized.

[0046] (Aspect 4) The probe, wherein the leaf spring portion has a multi-layer structure in which portions of the elastic plate-shaped member that become the leaf spring portion are overlapped.

[0047] According to the above-mentioned fourth aspect, the leaf spring portion has a structure in which multiple portions of the elastic plate-shaped member that become the leaf spring portion are stacked on top of each other, and therefore is more flexible than a single leaf spring portion of the same thickness, making it possible to reduce the spring pressure.

[0048] (Aspect 5) The probe, wherein the leaf spring portion has a structure in which a portion of the elastic plate-like member that becomes the leaf spring portion is folded over, and the approximately cylindrical portion has arc-shaped portions that face each other.

[0049] According to the fifth aspect, the portion of the elastic plate-like member that becomes the leaf spring portion has a folded structure, which makes it more flexible than a single leaf spring portion of the same thickness, thereby making it possible to reduce the spring pressure. In addition, the approximately cylindrical portion can be easily formed by sheet metal processing.

[0050] (Aspect 6) The probe has a generally cylindrical portion formed in the middle of the leaf spring portion.

[0051] According to the above-described aspect, the substantially cylindrical portion formed in the middle of the leaf spring portion does not bend, so the leaf spring portion is effectively shortened, and the spring pressure increases when testing the device under test.

[0052] (Aspect 7) The probe, wherein the leaf spring portion has a curved portion or a gently bent portion formed thereon.

[0053] According to the seventh aspect, the curved or gently bent portions are formed, so that the bending direction of the leaf spring portions can be aligned. In addition, the leaf spring portions can be made more flexible, which can reduce the spring pressure.

[0054] (Aspect 8) the probe; a first support member having a first insertion hole into which one end of the probe is placed; a second support member having a second insertion hole in which the other end of the probe is placed;

[0055] According to the eighth aspect described above, it is possible to realize a socket that has the advantages of a probe, such as a simple structure, low resistance, and ability to handle high currents. In addition, the structure allows for probe replacement.

[0056] (Aspect 9) The socket has a first insertion hole and a second insertion hole in which the ends of the individual probes are placed, and the first insertion hole and the second insertion hole are offset in planar positions.

[0057] According to the above-mentioned ninth aspect, by supporting each probe with each leaf spring portion deflected in the same direction, it is possible to deflect each leaf spring portion of each probe in the same direction when measuring the device under test, which results in a narrower arrangement pitch of the first and second insertion holes.

[0058] (Aspect 10) The socket, wherein the first insertion hole and the second insertion hole are round holes.

[0059] According to the above-described aspect, the first and second insertion holes are round holes corresponding to the substantially cylindrical portions, which makes it easy to drill the first and second support members. [Explanation of symbols]

[0060] 1,1A,1B,1C,1D,1E,1F,1G probes 5 sockets 11, 11A, 11B, 11C Leaf spring part 12, 12A, 12B, 13, 13A, 13B, 14 Approximately cylindrical portion 15 Curved section 16. Mountain tip 17,18 Almost cylindrical part 20,25 Elastic plate-like member 27,28 Wide end 30 Housing section 31, 32 Support member 31a, 32a Insertion holes 35,36 Gentle bend 40 Test board 50 Device Under Test 51 Bump

Claims

1. A leaf spring portion; a substantially cylindrical portion at at least one end of the leaf spring portion, A probe formed from a single conductive elastic plate-like member.

2. The probe according to claim 1 , wherein the portion of the elastic plate member that becomes the plate spring portion is in the shape of a strip having a constant width.

3. The probe according to claim 1 or 2, wherein the substantially tubular portion has a substantially cylindrical or substantially rectangular tubular outer shape.

4. The probe according to claim 1 or 2, wherein the leaf spring portion has a multi-layer structure in which portions of the elastic plate-like member that become the leaf spring portion are overlapped.

5. The probe according to claim 1 or 2, wherein the leaf spring portion has a structure in which a portion of the elastic plate-like member that becomes the leaf spring portion is folded over, and the approximately cylindrical portion has arc-shaped portions that face each other.

6. The probe according to claim 1 , wherein a substantially cylindrical portion is formed in a middle portion of the leaf spring portion.

7. The probe according to claim 1 or 2, wherein the leaf spring portion has a curved portion or a gently bent portion formed thereon.

8. The probe according to claim 1 or 2; a first support member having a first insertion hole into which one end of the probe is placed; a second support member having a second insertion hole in which the other end of the probe is disposed.

9. 9. The socket according to claim 8, wherein the first insertion holes and the second insertion holes in which the ends of the individual probes are placed are offset in planar positions.

10. The socket according to claim 8 , wherein the first insertion hole and the second insertion hole are round holes.

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