A method for growing titanium nitride on silicon substrates without silicon nitride interface by using a titanium seed layer

Abstract

A titanium (Ti) seed layer is formed from a Ti source directly on the surface of the substrate, the surface being substantially free of oxides and nitrides, and reactive nitrogen species are introduced from a nitrogen plasma source and additional Ti is introduced from the Ti source, the nitrogen plasma (a) reacting with the Ti seed layer to form TiN, and (b) reacting with the additional Ti to form additional TiN, which together form a TiN superconducting layer in direct contact with the surface of the substrate.

Description

[Technical field]

[0001] The present invention relates generally to growing titanium nitride (TiN) on silicon substrates. More specifically, the present invention relates to growing a titanium (Ti) seed layer prior to growing TiN on silicon substrates that do not include a silicon nitride interface. [Background technology]

[0002] 1(A)-(C) show a prior art method for growing nitride on a silicon substrate. <100> / SiO x Wafer or Si <111> / SiO x A wafer is shown.

[0003] Figure 1(B) shows the SiO2 film removed by wet etching (e.g., buffered oxide etching). x Si with removed <100> or Si <111> The substrate is shown.

[0004] FIG. 1(C) shows a nitride layer (e.g., TiN layer, VN layer, MoN layer, etc.) formed by sputtering a metal (e.g., Ti, V, Mo, etc.) in the presence of an argon-nitrogen (Ar-N2) plasma. x FIG. 1(C) also illustrates a problem with these prior art nitride growth techniques. The high temperatures (above about 500° C.) and / or plasmas containing reactive nitrogen-based plasma species typically used in this process can result in the growth of nitride layers (e.g., TiN layers, VN layers, MoN layers, etc.). x layer) and Si <100> or Si <111> At the interface with the substrate, the top surface of the silicon substrate reacts to form SiN x Form.

[0005] 1(D) to 1(E) show the SiN layer between the TiN layer and the Si substrate layer. x An example of layer formation is shown.

[0006] The formation of such an intermediate silicon nitride layer is undesirable.

[0007] Embodiments of the present invention provide improvements over prior art systems and methods. Summary of the Invention

[0008] In one embodiment, the present invention provides a method that includes forming a titanium (Ti) seed layer from a Ti source directly on a surface of a substrate, where the surface is substantially free of oxides and nitrides; and incorporating reactive nitrogen species from a nitrogen plasma source and additional Ti from the Ti source, where the nitrogen plasma (a) reacts with the Ti seed layer to form TiN, and (b) reacts with the additional Ti to form additional TiN, where the TiN and additional TiN together form a TiN superconducting layer in direct contact with the surface of the substrate.

[0009] In another embodiment, the invention provides a device that includes a substrate and a TiN superconducting layer overlying and in contact with the substrate, the substrate being substantially free of both Ti and nitrogen, the TiN superconducting layer being formed by: forming a titanium (Ti) seed layer from a Ti source directly on a surface of the substrate, the surface being substantially free of oxides and nitrides; incorporating reactive nitrogen species from a nitrogen plasma source and additional Ti from a Ti source, the nitrogen plasma (a) reacting with the Ti seed layer to form TiN, and (b) reacting with the additional Ti to form additional TiN, the TiN and additional TiN together forming a TiN superconducting layer directly in contact with the surface of the substrate.

[0010] In yet another embodiment, the present invention provides a method including depositing titanium (Ti) to form a Ti layer on a surface of an underlayer, the surface of the underlayer being selected to be substantially free of oxides and nitrides; and directing additional Ti to the Ti layer in the presence of a reactive nitrogen species to form a TiN superconducting layer in contact with the surface of the underlayer, the nitrogen reacting with both the additional Ti and the Ti layer to form a TiN superconducting layer in contact with the surface of the underlayer.

[0011] In another embodiment, the present invention provides a method including forming a titanium (Ti) seed layer from a Ti source directly on a surface of a substrate, the surface being substantially free of oxides and nitrides; incorporating reactive nitrogen species from a nitrogen plasma source and additional Ti from the Ti source, the nitrogen plasma (a) reacting with the Ti seed layer to form TiN, and (b) reacting with the additional Ti to form additional TiN, the TiN and additional TiN together forming a TiN superconducting layer of a first thickness directly contacting the surface of the substrate; and raising the temperature of the substrate to greater than 100° C. while increasing the thickness of the TiN layer to a second thickness.

[0012] In yet another embodiment, the present invention provides a method comprising forming a seed layer from a metal source directly on a surface of a substrate, the source being selected from any of titanium (Ti), vanadium (V), zirconium (Zr), tungsten (W), tantalum (Ta), and molybdenum (Mo), the surface being substantially free of oxides and nitrides; and incorporating reactive nitrogen species from a nitrogen plasma source and an additional metal from a metal source selected from titanium (Ti), vanadium (V), zirconium (Zr), tungsten (W), tantalum (Ta), and molybdenum (Mo), the nitrogen plasma (a) reacting with the seed layer to form a nitride, and (b) reacting with the additional metal to form an additional nitride, the nitride and the additional nitride together forming a nitride superconducting layer directly in contact with the surface of the substrate.

[0013] In another embodiment, the invention provides a device that includes a substrate and a TiN superconducting layer overlying and in contact with the substrate, the substrate being substantially free of both Ti and nitrogen, the TiN superconducting layer being formed by: forming a titanium (Ti) seed layer from a Ti source directly on a surface of the substrate, the surface being substantially free of oxides and nitrides; incorporating reactive nitrogen species from a nitrogen plasma source and additional Ti from a Ti source, the nitrogen plasma (a) reacting with the Ti seed layer to form TiN, and (b) reacting with the additional Ti to form additional TiN, the TiN and additional TiN together forming a TiN superconducting layer in direct contact with the surface of the substrate, the TiN superconducting layer being etched to form a superconducting resonator, the superconducting resonator having a quality factor of 100,000 to 1 billion.

[0014] The present disclosure according to one or more various embodiments will be described in detail with reference to the following drawings. The drawings are provided for illustrative purposes only and merely illustrate examples of the present disclosure. These drawings are provided to facilitate the reader's understanding of the present disclosure and should not be considered as limiting the breadth, scope, or applicability of the present disclosure. It should be noted that for clarity and ease of illustration, the drawings are not necessarily drawn to scale. [Brief description of the drawings]

[0015] [Figure 1] Figures 1(A)-(C) show prior art methods for growing nitride on silicon substrates. Figure 1(B) shows a silicon substrate from which the SiOx has been removed by wet etching. Figure 1(C) shows a nitride layer formed by sputtering a metal in the presence of a nitrogen plasma. Figures 1(D)-1(E) show an example of the formation of an undesired SiNx layer between the TiN layer and the Si substrate layer. [Diagram 2] Figures 2(A)-(B) illustrate one embodiment of the method of the present invention in which a titanium (Ti) seed layer is formed directly on the surface of a substrate, and Figures 2(C)-(D) illustrate an example of the formation of a TiN layer and a Si substrate layer without any intermediate silicon nitride layer. [Diagram 3] Figure 3(A) shows a computer-aided design (CAD) of such a bare resonator in accordance with the teachings of the present invention, and Figure 3(B) shows an optical image of a bare resonator formed from superconducting titanium nitride (TiN) grown on top of a substrate in accordance with the teachings of the present invention. [Figure 4] FIG. 1 shows a graph of Q (in 103) versus Ti seed thickness (nm). DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0016] Although the invention has been illustrated and described in a preferred embodiment, the invention may be produced in many different configurations. A preferred embodiment of the invention has been shown in the drawings and will be described in detail herein, with the understanding that the present disclosure should be considered as an illustration of the principles of the invention and related functional specifications for its construction, and is not intended to limit the invention to the illustrated embodiment. Those skilled in the art will envision many other possible variations within the scope of the invention.

[0017] It should be noted that references in this description to "one embodiment" or "an embodiment" mean that the referenced feature is included in at least one embodiment of the invention. Moreover, separate references in this description to "one embodiment" do not necessarily refer to the same embodiment. However, such embodiments are not mutually exclusive unless so stated and unless otherwise readily apparent to one of ordinary skill in the art. Thus, the present invention may include any of the various combinations and / or integrations of the embodiments described herein.

[0018] FIG. 2(A) shows one embodiment of the method of the present invention. First, a substrate (e.g., Si <100> or Si <111> A titanium (Ti) seed layer is formed from a titanium (Ti) source directly on the surface of the substrate, which surface is free of oxides and nitrides. The thickness of the Ti seed on the surface of the substrate is in the range of 0.5 nm to 1 nm. The thickness of the Ti seed layer is less than 1 nm, preferably less than 8 Angstroms, and more preferably between 5 Angstroms and 7 Angstroms. Next, reactive nitrogen species are introduced from a nitrogen plasma source and additional Ti is introduced from a Ti source. The nitrogen plasma (a) reacts with the Ti seed layer to form titanium nitride (TiN) and (b) reacts with the additional Ti to form additional TiN, which together form a TiN superconducting layer in direct contact with the surface of the substrate as shown in Figure 2(B). The TiN layer formed has a final thickness in the range of 1 nm to 2000 nm.

[0019] Although the formation of TiN from a Ti seed layer is described, other seed layers and corresponding nitride layers are contemplated. For example, vanadium (V), zirconium (Zr), tungsten (W), tantalum (Ta), and molybdenum (Mo) having thicknesses ranging from 0.5 nm to 1 nm may be used for the seed layer, and their corresponding nitrides (e.g., VN, ZrN, WN). x ,TaN x , MoN x ) may be formed on a silicon substrate. The nitride layer may have a thickness in the range of 1 nm to 2000 nm.

[0020] 2(C)-(D) show an example of the formation of a TiN layer and a Si substrate layer without any intermediate silicon nitride layer. When growing TiN from a Ti seed on Si, the SiN x It is observed that no is formed.

[0021] In another embodiment, the invention provides a device that includes a substrate and a TiN superconducting layer overlying and in contact with the substrate, the substrate being substantially free of both Ti and nitrogen, the TiN superconducting layer being formed by forming a titanium (Ti) seed layer from a Ti source directly on a surface of the substrate, the surface being substantially free of oxides and nitrides, and incorporating reactive nitrogen species from a nitrogen plasma source and additional Ti from the Ti source, the nitrogen plasma (a) reacting with the Ti seed layer to form TiN, and (b) reacting with the additional Ti to form additional TiN, the TiN and additional TiN together forming a TiN superconducting layer directly in contact with the surface of the substrate.

[0022] SiN xThe quality factor (Q) of a superconducting resonator formed from such an interface-free TiN film is in the range of 100,000 to 1 billion. Figure 3(A) shows a computer-aided design (CAD) of such a bare resonator according to the teachings of the present invention. Figure 3(B) shows an optical image of a bare resonator formed from superconducting titanium nitride (TiN) grown on top of a silicon substrate according to the teachings of the present invention.

[0023] Figure 4 shows the quality factor Q (10 3 Figure 1 shows a graph of Q (unit: μm) versus time, from which it can be seen that Q improves gradually from 0.6 nm to 0.7 nm, and then drops sharply when the Ti seed layer thickness is 0.8 nm.

[0024] In yet another embodiment, the present invention provides a method including depositing titanium (Ti) to form a Ti layer on a surface of an underlayer, the surface of the underlayer being selected to be substantially free of oxides and nitrides, and directing additional Ti to the Ti layer in the presence of a nitrogen plasma to form a TiN superconducting layer in contact with the surface of the underlayer, the nitrogen plasma reacting with both the additional Ti and the Ti layer to form a TiN superconducting layer in contact with the surface of the underlayer.

[0025] In another embodiment, the present invention provides a method including forming a titanium (Ti) seed layer from a Ti source directly on a surface of a substrate, the surface being substantially free of oxides and nitrides; incorporating reactive nitrogen species from a nitrogen plasma source and additional Ti from the Ti source, the nitrogen plasma (a) reacting with the Ti seed layer to form TiN, and (b) reacting with the additional Ti to form additional TiN, the TiN and additional TiN together forming a TiN superconducting layer of a first thickness directly contacting the surface of the substrate; and raising the temperature of the substrate to greater than 100° C. while increasing the thickness of the TiN layer to a second thickness.

[0026] It is understood that any specific order or hierarchy of steps in the processes disclosed is an example of an example approach. Based upon design preferences, it is understood that the specific order or hierarchy of steps in the processes may be rearranged, or all of the illustrated steps may be performed. Some of the steps may be performed simultaneously.

[0027] Various modifications to these embodiments will be readily apparent, and the general principles defined herein may be applied to other embodiments. Thus, the claims are not intended to be limited to the embodiments set forth herein, but are to be accorded the full scope consistent with the claims of language, where reference to a singular element is intended to mean "one or more," not "one and only," unless specifically so stated. Unless specifically stated otherwise, the term "several" refers to one or more. Masculine pronouns (e.g., his) include feminine and neuter genders (e.g., hers and its), and vice versa. Headings and subheadings, when present, are used merely for convenience and do not limit the subject technology.

[0028] For example, a phrase such as "an embodiment" does not imply that the embodiment is essential to the subject technology or that the embodiment applies to all configurations of the subject technology. Disclosure relating to an embodiment may apply to all configurations or one or more configurations. For example, a phrase such as an embodiment may refer to one or more embodiments, and vice versa. For example, a phrase such as "a configuration" does not imply that such configuration is essential to the subject technology or that such configuration applies to all configurations of the subject technology. Disclosure relating to a configuration may apply to all configurations or one or more configurations. A configuration may refer to one or more configurations, and vice versa.

[0029] The various embodiments described above are provided merely as examples and should not be construed as limiting the scope of the present disclosure. Those skilled in the art will readily recognize various modifications and changes that can be made to the principles described herein without following the example embodiments and applications illustrated and described herein and without departing from the spirit and scope of the present disclosure.

[0030] Although this specification contains many specific implementation details, they should not be construed as limitations on the scope of any invention or scope that may be claimed, but rather as descriptions of features that may be specific to particular embodiments of a particular invention. Certain features described in the context of separate embodiments in this specification may also be implemented in combination in a single embodiment. Conversely, various features described in the context of a single embodiment may also be implemented in multiple embodiments separately or in any suitable subcombination. Furthermore, although features may be described above as operating in a particular combination and may initially be claimed as such, one or more features of a claimed combination may in some cases be deleted from the combination, and the claimed combination may be directed to a subcombination or a variation of the subcombination.

[0031] conclusion In the above embodiments, a system and method for growing a Ti seed layer prior to TiN growth on a Si substrate has been shown. Although various preferred embodiments have been shown and described, it will be understood that the invention is not intended to be limited by such disclosure, but rather to encompass all modifications within the spirit and scope of the invention as defined in the appended claims.

Claims

1. forming a titanium (Ti) seed layer from a Ti source directly on a surface of a substrate, the Ti seed layer having a thickness of 0.5 nm to 1 nm, the surface being substantially free of oxides and nitrides; incorporating reactive nitrogen species from a nitrogen plasma source and additional Ti from the Ti source, the reactive nitrogen species (a) reacting with the Ti seed layer to form TiN, and (b) reacting with the additional Ti to form additional TiN, the TiN and additional TiN together forming a TiN superconducting layer in direct contact with the surface of the substrate; A method comprising:

2. The method of claim 1 , wherein the substrate is substantially free of both nitrogen and titanium.

3. forming a titanium (Ti) seed layer from a Ti source directly on a surface of a substrate, the Ti seed layer having a first thickness of 0.5 nm to 1 nm, the surface being substantially free of oxides and nitrides; incorporating reactive nitrogen species from a nitrogen plasma source and additional Ti from the Ti source, the reactive nitrogen species (a) reacting with the Ti seed layer to form TiN, and (b) reacting with the additional Ti to form additional TiN, the TiN and additional TiN together forming a TiN superconducting layer in direct contact with the surface of the substrate; increasing a temperature of the substrate to greater than 100° C. to increase a thickness of the TiN superconducting layer from the first thickness to a second thickness; A method comprising:

4. The method of claim 3, wherein the second thickness is in the range of 1 nm to 2000 nm.

5. A substrate; a TiN superconducting layer overlying and in contact with the substrate, the substrate being substantially free of both Ti and nitrogen; The TiN superconducting layer is forming a titanium (Ti) seed layer from a Ti source directly on a surface of a substrate, the Ti seed layer having a thickness of 0.5 nm to 1 nm, the surface being substantially free of oxides and nitrides; incorporating reactive nitrogen species from a nitrogen plasma source and additional Ti from the Ti source, the reactive nitrogen species (a) reacting with the Ti seed layer to form TiN, and (b) reacting with the additional Ti to form additional TiN, the TiN and additional TiN together forming a TiN superconducting layer in direct contact with the surface of the substrate; A device formed by:

6. The device of claim 5, wherein the device is part of a superconducting resonator formed from the TiN superconducting layer, the superconducting resonator having a quality factor of 100,000 to 1 billion.

7. depositing titanium (Ti) to form a Ti layer on a surface of the underlayer, the surface being selected to be substantially free of oxides and nitrides; directing additional Ti toward the Ti layer in the presence of reactive nitrogen species to form a TiN superconducting layer contacting the surface of the underlayer, the reactive nitrogen species reacting with both the additional Ti and the Ti layer to form the TiN superconducting layer contacting the surface of the underlayer; A method comprising:

8. The method of claim 7, wherein the Ti layer has a thickness of 0.5 nm to 1 nm.

9. Directing the additional Ti in the presence of nitrogen comprises: forming the TiN superconducting layer having a first thickness of 0.5 nm to 2 nm; increasing the temperature of the underlayer to greater than 100° C. to increase the thickness of the TiN superconducting layer from the first thickness to a second thickness; The method of claim 7 or 8, comprising:

10. The method of claim 9, wherein the second thickness is in the range of 2 nm to 2000 nm.

11. forming a seed layer from a metal source directly on a surface of a substrate, the metal source being selected from any of titanium (Ti), vanadium (V), zirconium (Zr), tungsten (W), tantalum (Ta), and molybdenum (Mo), the surface being substantially free of oxides and nitrides; incorporating reactive nitrogen species from a nitrogen plasma source and an additional metal from the metal source, the reactive nitrogen species (a) reacting with the seed layer to form a nitride, and (b) reacting with the additional metal selected from titanium (Ti), vanadium (V), zirconium (Zr), tungsten (W), tantalum (Ta), and molybdenum (Mo) to form an additional nitride, the nitride and the additional nitride together forming a nitride superconducting layer of a first thickness directly contacting the surface of the substrate; A method comprising:

12. The method of claim 11 , wherein the metal source and the additional metal are titanium.

13. 13. The method of claim 11 or 12, wherein the substrate is substantially free of both nitrogen and the same metal as the metal source.

14. The method according to any one of claims 11 to 13, wherein the seed layer has a thickness of 0.5 nm to 1 nm.

15. The method according to any one of claims 11 to 14, wherein the first thickness is between 1 nm and 2 nm.

16. The method comprises:

16. The method of any one of claims 11 to 15, further comprising increasing the thickness of the nitride superconducting layer from the first thickness to a second thickness by bringing the temperature of the substrate to a temperature greater than 100°C.

17. The method of claim 16, wherein the second thickness is between 2 nm and 2000 nm.

18. A substrate; a TiN superconducting layer overlying and in contact with said substrate, said substrate being substantially free of both Ti and nitrogen, said TiN superconducting layer comprising: forming a titanium (Ti) seed layer from a Ti source directly on a surface of a substrate, the Ti seed layer having a thickness of 0.5 nm to 1 nm, the surface being substantially free of oxides and nitrides; by incorporating reactive nitrogen species from a nitrogen plasma source and incorporating additional Ti from the Ti source, the reactive nitrogen species (a) reacting with the Ti seed layer to form TiN, and (b) reacting with the additional Ti to form additional TiN, the TiN and additional TiN together forming a TiN superconducting layer in direct contact with the surface of the substrate; the TiN superconducting layer is etched to form a superconducting resonator; The quality factor of the superconducting resonator is between 100,000 and 1 billion.

19. The device of claim 18, wherein the Ti seed layer has a thickness of 5 Angstroms to 7 Angstroms.

Images