Systems and methods for depth-resolved metrology and analysis using x-rays

Abstract

A system and method for analyzing a three-dimensional structure of a sample includes generating a first X-ray beam, the first X-ray beam having a first energy bandwidth less than 20 eV full width at half maximum and a first mean X-ray energy in a range of 1 eV to 1 keV higher than an absorption edge energy of a first atomic element of interest, and collimated to have a first collimation angle range of less than 7 mrad in at least one direction perpendicular to a propagation direction of the first X-ray beam; illuminating the sample with the first X-ray beam at a plurality of angles of incidence relative to a substantially flat surface of the sample, the angles of incidence being in a range of 3 mrad to 400 mrad; and simultaneously detecting reflected portions of the first X-ray beam from the sample and detecting X-ray fluorescence and / or photoelectrons from the sample.

Description

[Technical field]

[0001] Priority claim This application claims the benefit of priority to U.S. Provisional Patent Application No. 63 / 079,940, filed September 17, 2020, which is incorporated by reference in its entirety. [Background technology]

[0002] background Field This application relates generally to systems and methods for analyzing samples using X-ray reflectometry, X-ray fluorescence, and / or X-ray photoelectron spectroscopy.

[0003] 2. Description of Related Art Physical limitations to scaling have naturally driven the semiconductor industry towards 3D architectures, which often include nanometer-thick multi-stack layers containing multiple materials. Examples include gate-all-around (GAA) field-effect transistors, 3D NAND memory devices, and magnetoresistive random access memories. Fabricating these devices involves many processing steps, including deposition of thin films and film stacks, doping, etching, and chemical-mechanical polishing.

[0004] Dimensional and / or material metrology of as-fabricated devices is used both during research and development and for inspection (e.g., process monitoring during many of the processing steps to ensure that the as-fabricated device is within acceptable parameters or process windows). Typical parameters of interest include film structure dimensions (e.g., film thickness), elemental or specific material distributions, dopant concentrations, elemental compositions, chemical species, and other parameters. For 3D architectures, depth resolution (e.g., spatial resolution perpendicular to the surface of the wafer) of 2 nm or better may be desirable.

[0005] A current example of a novel 3D semiconductor architecture is that of a gate-all-around (GAA) device that includes nanosheets and nanowires. Information desired for process monitoring and metrology during fabrication includes structural information of the initial superlattice (e.g., thickness of the Si nanosheets and SiGe layers), residues after removal of the sacrificial nanosheet layer, silicon oxide formation, and parameters related to the gate dielectric layer. Parameters related to the gate dielectric layer include the dielectric thickness in the depth direction around each nanosheet, the variation of the difference between the dielectric thicknesses above and below the nanosheet, the variation of the dopants (used to tune the work function) in each layer of the dielectric, and dopant diffusion.

[0006] 3D architectures are challenging traditional approaches to metrology and inspection. Characterization techniques using incident X-rays offer unique advantages because they do not require destructive sample preparation and can provide transmission to detect subsurface structures. X-ray reflectivity (XRR) is a useful technique to characterize surfaces and interfaces with sub-nanometer resolution, including the roughness and diffusivity of buried layers, as well as the thickness of single and multilayer stacks. Summary of the Invention [Problem to be solved by the invention]

[0007] XRR curves are largely determined by the electron density distribution along the surface normal of the sample and lack elemental and material specificity. Structure determination by XRR itself is an ill-posed inverse problem, since different sets of parameters, including thickness, interface roughness, different material compositions and mass densities, may result in the same XRR curve, especially for XRR with low signal-to-noise ratios due to various factors such as short data collection times limited by throughput requirements in some applications. [Means for solving the problem]

[0008] overview In one embodiment disclosed herein, a method for analyzing a three-dimensional structure of a sample is provided. The method includes generating a first X-ray beam having a first energy bandwidth less than 20 eV at full width at half maximum and a first average X-ray energy in a range of 1 eV to 1 keV (e.g., in a range of 1 eV to 5 eV) higher than a first absorption edge energy of a first atomic element of interest. The first X-ray beam is collimated to have a first collimation angle range of less than 7 mrad in at least one direction perpendicular to a first propagation direction of the first X-ray beam. The method further includes irradiating the sample with the first X-ray beam at a plurality of angles of incidence relative to a substantially flat surface of the sample. The angles of incidence of the plurality of angles of incidence are in a range of 3 mrad to 400 mrad. The method further includes simultaneously detecting a reflected portion of the first X-ray beam from the sample and detecting X-ray fluorescence and / or photoelectrons from the sample.

[0009] In another aspect disclosed herein, a method for analyzing a layered structure comprising substantially parallel interfaces is provided. The method includes irradiating the layered structure with an incident X-ray beam at one or more angles of incidence in the range of 3 mrad to 400 mrad relative to the substantially parallel interfaces. The incident X-ray beam has an energy bandwidth of less than 20 eV at full width at half maximum and an average X-ray energy in the range of 1 eV to 1 keV (e.g., in the range of 1 eV to 5 eV) higher than the absorption edge energy of the atomic element of interest. The incident X-ray beam has sufficient coherence to generate X-ray intensity modulation within the layered structure by constructive and destructive interference of the incident X-ray beam with X-rays of the incident X-ray beam reflected by the substantially parallel interfaces of the layered structure. The method further includes simultaneously detecting at least a portion of the X-rays reflected by the substantially parallel interfaces and detecting X-ray fluorescence and / or photoelectrons from the layered structure.

[0010] In another aspect disclosed herein, a system for analyzing a three-dimensional structure of a sample is provided. The system comprises at least one X-ray source configured to generate at least one X-ray beam having an energy bandwidth of less than 20 eV at full width at half maximum and an average X-ray energy in the range of 1 eV to 1 keV higher than the absorption edge energy of the atomic element of interest. The at least one X-ray beam is collimated to have a collimation angle range of less than 7 mrad in at least one direction perpendicular to the propagation direction of the at least one X-ray beam. The at least one X-ray source is further configured to direct the at least one X-ray beam to irradiate the sample at a plurality of angles of incidence relative to a substantially flat surface of the sample. The angles of incidence of the plurality of angles of incidence are in the range of 3 mrad to 400 mrad. The system further comprises at least one first detector configured to detect a reflected portion of the at least one X-ray beam from the sample. The system further includes at least one second detector configured to detect X-ray fluorescence and / or photoelectrons from the sample simultaneously with the at least one first detector detecting the reflected portion of the at least one X-ray beam. [Brief description of the drawings]

[0011] [Figure 1] FIG. 1 is a schematic diagram of an exemplary system for XRR and XRF and / or XPS from a sample to be analyzed, according to certain embodiments described herein. [Diagram 2] 1 is a schematic diagram of an exemplary X-ray generator according to certain embodiments described herein. [Figure 3A] FIG. 2 is a schematic diagram of an exemplary X-ray optical subsystem that receives X-rays generated by an exemplary X-ray generator in accordance with certain implementations described herein. [Figure 3B] 3B is a schematic diagram of an exemplary aperture at the exit end of the second X-ray optical element of FIG. 3A according to certain embodiments described herein. [Figure 4A] 1 is a flow diagram of an exemplary method for analyzing a three-dimensional structure of a sample, according to certain embodiments described herein. [Figure 4B] 4 is a flow diagram of another exemplary method for analyzing a three-dimensional structure of a sample, according to certain embodiments described herein. [Figure 4C] 4 is a flow diagram of another exemplary method for analyzing a three-dimensional structure of a sample, according to certain embodiments described herein. [Figure 5A] 4B is a flow diagram of another exemplary method including aspects of the exemplary method of FIG. 4A, according to certain implementations described herein. [Figure 5B] 4C is a flow diagram of another exemplary method including aspects of the exemplary method of FIG. 4B, according to certain implementations described herein. [Figure 6] 1 is a flow diagram of an exemplary method for inspection (e.g., process monitoring) according to certain implementations described herein. [Figure 7A] 1A-1D are schematic diagrams of three exemplary simulation models of semiconductor nanosheet stack structures according to certain embodiments described herein. [Figure 7B] 7B is a graph (e.g., curve) of simulated XRR data corresponding to the three exemplary simulation models of FIG. 7A simulated to be collected using three X-ray energies, according to certain embodiments described herein. [Figure 7C] 7C is a graph of simulated differences by simple subtraction between the three XRR curves of FIG. 7B at three X-ray energies, according to certain embodiments described herein. [Figure 7D] 1 is a graph of a simulated signal of HfM5N7 characteristic XRF lines as a function of incidence angle with an excitation X-ray energy of 1.74 keV, according to certain embodiments described herein. [Figure 7E] 1 is a graph of simulated XRR signal difference at three different X-ray energies showing sensitivity to interface and surface roughness in accordance with certain embodiments described herein. [Figure 8A]1A-1D are schematic diagrams of two exemplary simulation models of semiconductor nanosheet stack structures according to certain embodiments described herein. [Figure 8B] 8B is a graph of simulated XRF signals from the two models of FIG. 8A at two different excitation X-ray energies, according to certain embodiments described herein. [Figure 8C] 8C is a graph of the simulated difference by simple subtraction between the two Hf XRF curves of FIG. 8B at two excitation X-ray energies according to certain embodiments described herein. [Figure 8D] 8B is a graph (e.g., curves) of simulated XRR signals corresponding to the two exemplary simulation models of FIG. 8A simulated to be collected from the Si nanosheet structure of FIG. 8A using three X-ray energies, according to certain embodiments described herein. [Figure 8E] 8E is a graph of the difference between the simulated XRR signals of FIG. 8D according to certain embodiments described herein. [Figure 9] 1 is a graph illustrating the results of a dual energy method in which XRF signals are collected for two different atomic elements of interest, according to certain embodiments described herein. [Figure 10] 1 is a schematic diagram of a layered material structure being irradiated by an incident X-ray beam, according to certain embodiments described herein. [Figure 11] FIG. 2 shows calculated XRR curves from a layered material structure and the relative phase difference at three indicated interfaces of the layered material structure, according to certain embodiments described herein. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0012] Detailed Description To add elemental specificity, it has previously been disclosed to collect X-ray photoelectron spectra (XPS) and X-ray fluorescence signals (XRF) along with XRR to obtain elemental and material information (e.g., Wu et al., U.S. Pat. No. 10,151,713). However, such previous systems had various limitations that were not adequately addressed. For example, the inelastic mean free path (IMFP) of XPS photoelectrons is generally independent of the material being analyzed and varies as a function of the kinetic energy E of the photoelectrons (e.g., empirically ≤ E for E > 100 eV). 0.78 , which is proportional to the surface area of ​​the sample, typically less than 10 nm. IMFP results in substantial attenuation of photoelectrons as they propagate from their point of generation to the surface of the object, thus resulting in insufficient signal for photoelectrons from elements of interest located deeper than 10 nm from the surface. XRF can provide elemental specificity without the substantial attenuation suffered by XPS, but previous techniques used incident X-rays with energies too low to excite the XRF of many important elements (e.g., Wu et al. used an Al X-ray source with 1.5 keV X-rays). Multiple energy excitations can be used to generate photoelectrons of different selected energies and different selected IMFPs and / or refractive indices in the sample in order to tailor the photoelectron IMFP, photoemission angle, and / or refractive index as desired.

[0013] As another exemplary limitation, the XRF signals of previous techniques are generally weak for many elements of interest in semiconductor front-end device manufacturing due to their small amounts (e.g., dopants, gate dielectrics such as HfO2, layers with single-digit nm thickness, and etching residues). Moreover, these small amounts are located in small analysis areas / volumes, further reducing the signal. Due to the low XRF signal, when using an X-ray source with multiple X-ray generating materials described herein, the incident X-ray energy can be selected and used to select the characteristic fluorescent X-rays of the elements of interest, since the XRF signal generation efficiency is highly dependent on the excitation X-ray energy and is maximized when the X-ray energy is slightly higher than the absorption edge of the element (e.g., the characteristic X-ray generation efficiency decreases with the cube of the excitation X-ray energy minus the absorption edge energy). Furthermore, the XRF signal from the substrate material can result in a large background contribution that can obscure the XRF signal from elements with characteristic X-ray energies smaller than the substrate, e.g., a strong Si substrate signal can reduce the signal-to-noise ratio (SNR) of the M-lines of Hf and La as the elements of interest. By using an x-ray source having multiple x-ray generating materials as described herein, selecting the incident x-ray energy to be less than the K-absorption edge energy of Si (e.g., SiC) can be used to improve the SNR of such lines.

[0014] As another exemplary limitation, standard XRR measurements (alone or in combination with other techniques such as XPS and / or XRF) can be performed by acquiring data at many small angle steps (e.g., over a reasonably wide angle range). These XRR measurements utilize long data collection times to obtain acceptable data quality and therefore may be too slow to meet desired process monitoring rates for semiconductor device manufacturing.

[0015] These limitations have not been adequately addressed by previous XRR techniques, which were performed at very low angles of incidence measured relative to the sample surface and, as a result, did not focus the incident X-ray beam onto semiconductor test patterns (e.g., ranging from 40 microns x 40 microns to 40 microns x 300 microns). Additionally, previous XRR techniques utilized filters and / or monochromatic X-ray optics (e.g., multilayer or single crystal) to monochromatize the XRR's incident X-rays, reducing the flux from the laboratory X-ray source.

[0016] FIG. 1 illustrates a schematic of an exemplary system 10 for XRR and XRF and / or XPS from a sample 20 to be analyzed, according to certain embodiments described herein. The system 10 can be configured to perform methods of metrology and / or inspection of at least a portion of the sample 20 described herein. For example, the sample 20 can comprise a substrate 22 (e.g., a silicon wafer) and a plurality of layered material structures 24 (e.g., nanosheet transistors) on a substantially planar surface 26 of the sample 20. In certain embodiments, the XRR divergence can be less than 10 mrad, less than 5 mrad, and / or less than 3 mrad, and the measurement sensitivity in the depth direction can be 0.1 nm or less for a given atomic element of interest (e.g., an atomic element detected within a portion of the sample 20).

[0017] In certain embodiments, the exemplary system 10 includes an X-ray source 30 configured to generate a first X-ray beam 32. The first X-ray beam 32 has a first energy bandwidth less than 20 eV full width at half maximum and a first average X-ray energy in a range of 1 eV to 1 keV (e.g., in a range of 1 eV to 5 eV) higher than a first absorption edge energy of a first atomic element of interest (e.g., an atomic element detected within a portion of the sample 20 being analyzed). The first X-ray beam 32 is collimated to have a first collimation angle range of less than 7 mrad in at least one direction perpendicular to a first propagation direction of the first X-ray beam 32. The X-ray source 30 is configured to irradiate the layered material structure 24 with the first X-ray beam 32 at a plurality of angles of incidence 34 relative to the surface 26, the angles of incidence being in a range of 3 mrad to 400 mrad. For example, at least a portion of the X-ray source 30 and / or sample 20 can be mounted on at least one stage (not shown) configured to precisely adjust and set the angle of incidence 34 of the first X-ray beam 32 relative to the surface 26. For example, the at least one stage can include an electromechanical system configured to direct the X-ray beam onto a layered material structure on a flat surface at a predetermined grazing incidence angle or over a predetermined angular range of incidence angles.

[0018] In certain embodiments, the exemplary system 10 of FIG. 1 further comprises at least one first X-ray detector 40 configured to detect (e.g., measure) the reflected portion 36 of the first X-ray beam 32 from the sample 20, and at least one energy-resolving second detector 50 configured to detect (e.g., measure) X-ray fluorescence (XRF) 52 and / or photoelectrons 54 from the sample 20 simultaneously with the at least one first X-ray detector 40 detecting the reflected portion 36 of the first X-ray beam 32.

[0019] In certain embodiments, as shown generally in FIG. 1 , the X-ray source 30 comprises at least one X-ray generator 60 configured to generate X-rays 62 and at least one X-ray optical subsystem 70 configured to receive at least a portion of the X-rays 62 and generate a first X-ray beam 32 comprising at least a portion of the received X-rays 62.

[0020] 2 is a schematic diagram of an exemplary X-ray generator 60 according to certain implementations described herein. The X-ray generator 60 may comprise at least one X-ray target 64 including a thermally conductive substrate 65 (e.g., copper, diamond) and at least one structure 66 embedded on or in at least a portion of a surface of the substrate 65, the at least one structure 66 comprising at least one thermally conductive material 67 (e.g., diamond) in thermal communication with the substrate 65 and at least one X-ray generating material 68 on the at least one thermally conductive material 67 (e.g., in the form of a thin film deposited on the thermally conductive material 67). The substrate 65 may be in thermal communication with at least one heat dissipation structure (e.g., heat pipe, liquid coolant, other material with high thermal conductivity). The at least one X-ray generating material 68 is configured to generate X-rays 62 in response to bombardment by at least one electron beam (not shown).

[0021] The x-rays 62 can include x-rays having a characteristic x-ray energy (e.g., characteristic x-ray emission) of at least one x-ray generating material in a low energy range (e.g., less than 5.4 keV, less than 3 keV, in the range of 0.1 keV to 50 keV, in the range of 0.2 keV to 5.5 keV, in the range of 0.5 keV to 5.5 keV). For example, the at least one x-ray generating material 68 can include at least one atomic element configured to generate x-rays 62 having a low energy K characteristic ray energy, a low energy L characteristic ray energy, and / or a low energy M characteristic ray energy. Examples of the at least one atomic element include, but are not limited to, substantially pure or alloyed or compound forms of silicon, magnesium, aluminum, carbon (e.g., in the form of silicon carbide or SiC), nitrogen (e.g., in the form of TiN), fluorine (e.g., in the form of MgF2), oxygen (e.g., in the form of Al2O3), calcium (e.g., in the form of CaF2), titanium (e.g., K characteristic line energy of about 0.5 keV), rhodium (e.g., L characteristic line energy of 2.7 keV), tungsten (e.g., M characteristic line energy of 1.8 keV). Other examples of the at least one atomic element include, but are not limited to, MgO, SrB6, CaB6, CaO, HfO2, LaB6, GeN, and other boride, nitride, oxide, and fluoride compounds. In certain embodiments, at least 50% (e.g., at least 70%, at least 85%) of the X-rays 62 generated by the X-ray generator 60 have energies that are in a narrow energy band (e.g., having a radiation width of less than 4 eV) at the characteristic X-ray emission energy.

[0022] In certain implementations, the x-ray generator 60 comprises multiple structures 66 including different x-ray generating materials 68 configured to generate x-rays 62 having different x-ray spectra and different characteristic x-ray emission lines. For example, the different structures 66 can be separated from one another but in thermal communication with a common substrate 65 such that an electron beam can strike only one structure 66 at a time to generate a single x-ray spectrum. In certain implementations, the structures 66 can include multiple x-ray generating materials 68 (e.g., a layer of MgF on a layer of SiC), and the layer thicknesses can be configured such that an incident electron beam can simultaneously generate multiple different x-ray spectra. The plurality of structures 66 may include an x-ray generating material 68, may have a predetermined thermal conductivity and melting point, and may be configured to generate characteristic x-rays (e.g., Kα characteristic lines from BeO, C, B4C, TiB2, Ti3N4, MgO, SiC, Si, MgF, Mg, Al, Al2O3, Ti, V, Cr; Lα characteristic lines from Sr, Zr, Mo, Ru, Rh, Pd, Ag and compounds thereof having melting points above 1000° C.; Mα characteristic lines from Hf, Ta, W, Ir, Os, Pt, Au, W and compounds thereof having melting points above 1000° C.). In certain embodiments, the x-ray generating material 68 is selected to generate x-rays having energies greater than the absorption edge energies of the atomic elements of the sample 20 being analyzed. Since the x-ray fluorescence cross section of an atomic element is maximized when the exciting x-ray energy is slightly above the absorption edge energy of the atomic element, it may be useful to select the average x-ray energy of the first x-ray beam 32 to optimize the efficiency of production of XRF x-rays 52.

[0023] Table 1 lists some exemplary x-ray generating materials 68 and characteristic x-rays that are compatible with certain embodiments described herein.

[0024] [Table 1]

[0025] For certain such x-ray generating materials 68 (e.g., SiC, Mo, Rh, Ti, Cr, Cu), the x-ray optical subsystem 70 may include a filter / monochromator.

[0026] In certain embodiments in which the at least one x-ray generating material 68 comprises a nominally electrically insulating material (e.g., MgF), the at least one x-ray generating material 68 has a thickness (e.g., less than 10 microns, less than 2 microns) that is sufficiently small so that the material conducts electrons to the underlying substrate. In certain other embodiments in which the at least one x-ray generating material 68 comprises a nominally insulating material, the at least one structure 66 further comprises an electrically conductive conduit configured to prevent charging of the at least one x-ray generating material 68. For example, the at least one structure 66 can comprise a layer (e.g., 1 micron to 10 microns thick) of the x-ray generating material 68 on the electrically and thermally conductive material 67. Various x-ray generators 60 and x-ray targets 64 compatible with certain embodiments described herein are disclosed in U.S. Pat. No. 10,658,145, which is incorporated herein by reference in its entirety.

[0027] 3A illustrates a schematic diagram of an exemplary X-ray optical subsystem 70 (e.g., an X-ray optical train) that receives X-rays 62 generated by an exemplary X-ray generator 60 according to certain implementations described herein. The X-ray optical subsystem 70 of FIG. 3A includes a plurality of X-ray optical elements 72 configured to receive at least a portion of the X-rays 62 and generate a first X-ray beam 32 that includes at least a portion of the received X-rays 62 (e.g., at least 85% of the X-ray flux of at least one of the characteristic X-rays from the X-ray generator 60). For example, the plurality of X-ray optical elements 72 can include at least one axisymmetric capillary section, each section having at least one secondary (e.g., parabolic, elliptical, hyperbolic) reflective surface 74 configured to reflect at least a portion of the X-rays 62. In certain other implementations, at least one of the X-ray optical elements 72 is not axisymmetric and / or includes a curved crystal or multi-layer mirror. The plurality of X-ray optical elements 72 may include an X-ray reflective coating configured to increase the X-ray reflectivity or critical angle of the X-ray optical elements 72. In certain embodiments, the X-ray optical subsystem 70 further includes a controllably adjustable stage (e.g., a support) to which the components of the X-ray optical subsystem 70 are mounted, the stage configured to align the components of the X-ray optical subsystem 70 with each other and with the X-ray generator 60.

[0028] In certain embodiments, the plurality of X-ray optical elements 72 have a plurality of secondary reflective surfaces 74 (e.g., Wolter-type optics). In certain embodiments, the reflective surfaces of the plurality of X-ray optical elements 72 are coated with a thin layer (e.g., 1-10 nm thick) of at least one high atomic number element to increase the critical angle of the X-ray optical elements 72 and provide a large solid angle of acceptance. In certain other embodiments, the reflective surfaces 74 of the plurality of X-ray optical elements 72 are coated with a multi-layer coating that serves to reduce the polychromaticity of the incident X-rays 62 (e.g., reduce the energy bandwidth of the resulting first X-ray beam 32).

[0029] 3A, the plurality of X-ray optical elements 72 comprises a first X-ray optical element 72a including a collimating Wolter type I mirror having reflective surfaces 74a, 74b, and a second X-ray optical element 72b including a focusing Wolter type I mirror having reflective surfaces 74c, 74d. In certain other embodiments, the first X-ray optical element 72a comprises a parabolic reflective surface 74 configured to collimate at least a portion of the X-rays 62 received from the X-ray generator 60, and the second X-ray optical element 72b comprises a parabolic reflective surface 74 configured to focus at least a portion of the collimated X-rays 62 received from the first X-ray optical element 72a. In certain embodiments, the X-ray optical subsystem 70 further comprises a beam stop 76 configured to block X-rays 62 that would otherwise pass through the X-ray optical subsystem 70 without reflecting off the plurality of X-ray optical elements 72.

[0030] In certain embodiments, the X-ray optical subsystem 70 further comprises at least one aperture 77 (e.g., beam slit, pinhole) configured to collimate the focused X-rays 62 from the multiple X-ray optical elements 72 in at least one direction by limiting the divergence of the first X-ray beam 32 incident on the sample 20. FIG. 3B illustrates a schematic of an exemplary aperture 77 at the exit end of the second X-ray optical element 72b of FIG. 3A according to certain embodiments described herein. In certain embodiments, the at least one aperture 77 provides angular collimation in at least one direction such that the first X-ray beam 32 in the reflected direction appears as a plane wave. The angular collimation of the aperture 77 can be determined by the following equation:

[0031]

number

[0032] where Δθ is the angular collimation, λ is the wavelength of the X-rays 62 incident on the aperture 77, and d is the period of the interference pattern produced by the incident and reflected X-ray waves. In certain embodiments, the angular collimation of the at least one aperture 77 is less than 5 mrad. In certain embodiments, the at least one aperture 77 is defined by at least two radiopaque elements 78 configured to block at least a portion of the X-rays 62 and be adjustably moved (e.g., by a motor) relative to one another such that a size (e.g., width) of the at least one aperture 77 through which at least a portion of the X-rays 62 can propagate to the sample 20 can be controllably adjusted. The size of the at least one aperture 77 can be a function of a size (e.g., along a reflection dimension) of a feature of the sample 20 to be analyzed.

[0033] The at least one aperture 77 may be upstream or downstream of the plurality of X-ray optical elements 70, or may be between the X-ray optical elements 72 of the plurality of X-ray optical elements 72. For example, in the case of the plurality of X-ray optical elements 72 with two parabolic reflecting surfaces, the at least one aperture 77 may be disposed between the two parabolic reflecting surfaces. For example, as shown diagrammatically in FIG. 3A, the at least one aperture 77 may be downstream of the plurality of X-ray optical elements 72. The at least one aperture 77 may be used to restrict the size and / or angular range of the first X-ray beam 32 on the surface of the layered structure of the sample 20 and to impose a predetermined amount of spatial coherence to form a standing wave at the surface of the layered structure of the sample 20.

[0034] In certain embodiments, the size (eg, footprint) F of the first X-ray beam 32 on the sample 20 can be expressed as:

[0035]

number

[0036] where s is the beam size along the tangential (e.g., reflective) direction and α is the angle of incidence 34 of the first X-ray beam 32 with respect to the surface 26. In a particular embodiment, the size L of the aperture 77 (e.g., near the exit end of the multiple X-ray optical elements 72) is defined as follows:

[0037]

number

[0038] For example, for L=300 microns and incidence angle α=41 mrad (e.g., 1.74 keV on Pt coated glass), aperture 77, which defines the size of first X-ray beam 32 in one dimension, can be equal to 12.3 microns. Using aperture 77 with multiple X-ray optics 72 that produce a 20 micron diameter spot transmits approximately 60% of the X-ray flux incident on aperture 77 that would otherwise be delivered to sample 20 (no other dimension is reduced). Note that for an 8 keV standing wave, aperture 77 is too small (or features too large) to be of practical value, as shown in Table 2.

[0039] [Table 2]

[0040] In certain embodiments, the size of aperture 77 can be significantly increased to transmit sufficient x-ray flux to sample 20. In certain embodiments, the feature size is 500 microns in length, rather than 300 microns as described above, and the width of aperture 77 can be increased even further.

[0041] In certain embodiments, the X-ray optical subsystem 70 further comprises a filter and / or a monochromator configured to monochromatize the X-rays of the first X-ray beam 32. Any X-ray monochromator known to one skilled in the art may be used, examples of which include, but are not limited to, channel cut crystals, flat crystals (e.g., Si(111)), and synthetic multilayers. In certain embodiments, the monochromator is between the first X-ray optical element 72a (e.g., a collimating first parabolic mirror) and the second X-ray optical element 72b such that the first X-ray optical element 72a (e.g., a collimating first parabolic mirror) collimates at least a portion of the X-rays 62 from the X-ray generator 60 (e.g., X-rays 62 incident on a two or four bounce crystal) and the second X-ray optical element 72b focuses at least a portion of the X-rays 62 from the first X-ray optical element 72a (e.g., to a spot size of less than 40 microns (FWHM)). In certain embodiments, the monochromator comprises at least one multi-layer coating on at least one interior surface of X-ray optical subsystem 70. In certain embodiments where X-rays 62 generated by X-ray generator 60 are sufficiently monochromatic to form a standing X-ray wave in a layered material structure (e.g., in some embodiments where the X-ray generating material includes Mg, Al, and / or Si), X-ray optical subsystem 70 can be excluded from having a multi-layer or crystal monochromator.

[0042] In certain embodiments, the average X-ray energy of the incident first X-ray beam 32 can be selected to reduce (e.g., suppress) X-ray background contributions to the detected characteristic XRF X-rays 52 of the atomic elements of the sample 20 being analyzed due to spectral interference and / or detector noise contributions (e.g., incomplete charge collection). Energy dispersive detectors (e.g., SDDs) have a finite energy resolution (e.g., about 125 eV to detect 5.9 keV X-rays), and spectral interference (e.g., overlap) between the characteristic X-rays of the atomic elements of interest and the characteristic X-rays of the dominant atomic elements in the layered material structure 24 of the sample 20 can make detection and quantification of the atomic elements of interest difficult and result in long data acquisition times. For example, for a stack of three Si nanosheet transistors, Si is the dominant atomic element, and the energy of the characteristic Si K line is about 1.74 keV. HfO2 is a widely used gate dielectric material, and the characteristic M line energy of Hf is about 1.64 keV, which differs from the characteristic Si Kα line energy by about 100 eV. In certain embodiments, the use of Si Ka x-rays as first x-ray beam 32 does not produce Si Kα characteristic XRF x-rays 52 in sample 20 .

[0043] In certain embodiments, the at least one first X-ray detector 40 is selected from the group consisting of a proportional counter, a silicon drift detector, a direct detection X-ray charge-coupled device (CCD), and a pixel array photon counting detector. In certain embodiments, the at least one energy-resolving second detector 50 comprises an X-ray detector selected from the group consisting of a silicon drift detector (SDD), a proportional detector, an ionization chamber, a wavelength dispersive detection system, or any other energy-resolving X-ray detector compatible with measuring XRF.

[0044] In certain embodiments, the at least one energy-resolving second detector 50 comprises an energy-resolving photoelectron detector. For example, the energy-resolving photoelectron detector can comprise an angle-resolving hemispherical XPS electron energy analyzer that has an angular resolution of about 1 degree and utilizes an electron projection lens column for parallel collection of angle-resolved data to accommodate an angular range of up to 60-80 degrees along the non-dispersive direction. Other exemplary energy-resolving photoelectron detectors compatible with certain implementations described herein include, but are not limited to, retarding field analyzers, cylindrical mirror analyzers, and time-of-flight analyzers. In certain embodiments, angle-resolved XPS measurements can be obtained from large samples, such as complete semiconductor wafers, that may be too large to be placed at the desired grazing incidence angle in the XPS spectrometer. The position of the energy-resolving photoelectron detector relative to the sample can remain fixed throughout the angular range, and the portion of the sample illuminated by the incident X-rays can remain constant during irradiation. Although the footprint of the X-ray spot size increases for decreasing grazing incidence angles (e.g., when the sample is rotated relative to the incident X-ray beam), in certain embodiments, using a combination of source-defined small area analysis and parallel collection, the analysis area can be substantially independent of the grazing incidence angle.

[0045] In certain embodiments, the at least one first X-ray detector 40 and / or the at least one energy-resolving second detector 50 are equipped with one or more apertures (eg, beam slits, pinholes) at the input of the detector.

[0046] Exemplary Methods 4A is a flow diagram of an exemplary method 100 for analyzing a three-dimensional structure of a sample 20 (e.g., using single-energy X-ray metrology to characterize spatial structure and material composition) according to certain embodiments described herein. At operational block 110, the method 100 includes generating a first X-ray beam 32 having a first energy bandwidth less than 20 eV at full width at half maximum and a first average X-ray energy in a range of 1 eV to 1 keV (e.g., in a range of 1 eV to 5 eV) higher than a first absorption edge energy of a first atomic element of interest. The first X-ray beam 32 is collimated to have a first collimation angular range of less than 7 mrad (e.g., less than 4 mrad, less than 1 mrad) in at least one direction perpendicular to a first propagation direction of the first X-ray beam 32.

[0047] In certain embodiments, the first absorption edge energy (e.g., 0.1 keV to 5.4 keV) of the first atomic element of interest is less than the absorption edge energy of a major atomic element of the sample 20 being analyzed (e.g., an atomic element that constitutes at least 20% of the atoms of the sample 20). For example, for a sample 20 including a silicon substrate, the first absorption edge energy of the first atomic element of interest is less than 1.84 keV. In certain embodiments, at least 50% of the X-rays of the first X-ray beam 32 irradiating the sample 20 have an X-ray energy that is 100 eV greater than the first absorption edge energy of the first atomic element of interest. In certain embodiments, the X-ray energy bandwidth is obtained using an X-ray optical subsystem including a monochromator and / or a filter, and generating the first X-ray beam 32 includes filtering the X-rays 62 to have the first energy bandwidth.

[0048] In certain embodiments, the first X-ray beam 32 impinges on the sample 20 in a reflection plane (e.g., a scattering plane) that includes a first propagation direction and a direction perpendicular to the surface 26, and the first X-ray beam 32 has a collimation angle (e.g., a collimation angle range) in the reflection plane (e.g., that includes a surface normal to the first X-ray beam 32 and the surface 26) and a convergence angle (e.g., a convergence angle range) in a convergence direction in a plane perpendicular to the reflection plane (e.g., in a sagittal plane), where the collimation angle is smaller than the convergence angle.

[0049] At operational block 120, the method 100 further includes irradiating the sample 20 with the first X-ray beam 32 at a plurality of angles of incidence 34 ranging from 3 mrad to 400 mrad relative to the substantially flat surface 26 of the sample 20. For example, the first X-ray beam 32 may irradiate the substantially flat region of the sample 20 at a grazing incidence angle (e.g., an angle between the surface 26 of the sample 20 and the first X-ray beam 32) between 5 mrad and 25 mrad.

[0050] At operational block 130, the method 100 further includes simultaneously detecting the reflected portion 36 of the first X-ray beam 32 from the sample 20 (e.g., XRR data) and detecting X-ray fluorescence 52 (e.g., XRF data) and / or photoelectrons 54 (e.g., XPS data) from the sample 20. In certain embodiments, the method 100 further includes analyzing the detected XRR data (e.g., the first XRR data) and XRF data together (e.g., at operational block 132) to obtain structural and material information about the sample 20. For example, when irradiating the sample 20 with the first X-ray beam 32 and simultaneously detecting the reflected portion 36 of the first X-ray beam 32 and detecting the XRF X-rays 52 and / or photoelectrons 54 after the sample 20 has undergone at least one processing procedure, the method 100 may further include obtaining a first set of spatial and / or compositional information about the sample 20 by analyzing at least the detected first reflected portion 36, the detected XRF X-rays 52, and / or the detected photoelectrons 54 and comparing the first set of spatial and / or compositional information about the sample 20 with a second set of spatial and / or compositional information about the sample 20 before the sample 20 has undergone at least one processing procedure. Figure 5A is a flow diagram of another exemplary method 100 including aspects of the exemplary method 100 of Figure 4A (e.g., examples of operational blocks 110, 120, 130, and 132) in accordance with certain implementations described herein.

[0051] FIG. 4B is a flow diagram of another exemplary method 100 for analyzing a three-dimensional structure of a sample 20 (e.g., using dual-energy X-ray metrology to characterize spatial structure and material composition) according to certain embodiments described herein. In addition to the operational blocks 110, 120, 130 of FIG. 4A, the method 100 of FIG. 4B further includes generating a second X-ray beam in operational block 140, the second X-ray beam having a second energy bandwidth of less than 20 eV at full width at half maximum and a second average X-ray energy in a range of 1 eV to 1 keV (e.g., in a range of 1 eV to 5 eV) lower than a first absorption edge energy of the first atomic element of interest. The second X-ray beam is collimated to have a second collimation angle range of less than 7 mrad (e.g., less than 4 mrad, less than 1 mrad) in at least one direction perpendicular to a second propagation direction of the second X-ray beam. The method 100 of FIG. 4B further includes irradiating the sample 20 with a second X-ray beam at operation block 150 and detecting a second reflected portion of the second X-ray beam from the sample 20 (e.g., second XRR data) at operation block 160. In certain implementations, the method 100 of FIG. 4B further includes obtaining spatial and compositional information about the sample 20 by analyzing the detected second reflected portion (e.g., second XRR data) along with the detected first reflected portion (e.g., first XRR data), detected X-ray fluorescence (e.g., XRF data), and / or detected photoelectrons (e.g., XPS data) (e.g., XPS data). FIG. 5B is a flow diagram of another exemplary method 100 including aspects of the exemplary method 100 of FIG. 4B (e.g., examples of operation blocks 110, 120, 130, 140, 150, 160, and 162) according to certain implementations described herein.

[0052] FIG. 4C is a flow diagram of another exemplary method 100 for analyzing the three-dimensional structure of a sample 20 (e.g., using dual-energy X-ray metrology to characterize spatial structure and material composition) according to certain embodiments described herein. In addition to the operational blocks 110, 120, 130 of FIG. 4A, the method 100 of FIG. 4C further includes generating a second X-ray beam at operational block 170, the second X-ray beam having a second energy bandwidth less than 20 eV at full width at half maximum and a second average X-ray energy in a range of 1 eV to 1 keV (e.g., in a range of 1 eV to 5 eV) higher than the second absorption edge energy. In certain embodiments, the second absorption edge energy is of a first atomic element of interest, and the first absorption edge energy and the second absorption edge energy are separated from each other by at least 1 keV. For example, the first absorption edge energy can be an L-edge energy of the first atomic element of interest, and the second absorption edge energy can be an M-edge energy of the first atomic element of interest. In certain other embodiments, the second absorption edge energy is of a second atomic element of interest different from the first atomic element of interest. The second X-ray beam is collimated to have a second collimation angle range of less than 7 mrad (e.g., less than 4 mrad, less than 1 mrad) in at least one direction perpendicular to a second propagation direction of the second X-ray beam. The method 100 of FIG. 4C further includes irradiating the sample 20 with the second X-ray beam at operation block 180 and detecting a second reflected portion of the second X-ray beam from the sample 20 (e.g., second XRR data) at operation block 190. In certain embodiments, the method 100 of FIG. 4C further includes obtaining spatial and compositional information about the sample 20 by analyzing the detected second reflected portion (e.g., the second XRR data) along with the detected first reflected portion (e.g., the first XRR data), the detected X-ray fluorescence (e.g., the XRF data), and / or the detected photoelectrons (e.g., the XPS data).

[0053] In certain embodiments, some a priori spatial and material knowledge of the sample 20 is already known. For example, the spatial and material of the sample can be pre-characterized before one or more new process steps are performed (e.g., adding or removing material, such as adding a dielectric layer on silicon nanosheets using atomic layer deposition). Metrology of the sample 20 after the one or more process steps can include selecting an atomic element of the material added in the one or more new process steps as the atomic element of interest, or selecting an atomic element of the material removed (e.g., residue) as the atomic element of interest, and performing the methods disclosed herein. In certain embodiments, the known spatial and material information can be used in analyzing XRR and XRF data obtained using an X-ray beam (e.g., first X-ray beam 32) having an average X-ray energy in a range of 1 eV to 1 keV (e.g., in a range of 1 eV to 5 eV, in a range of 5 eV to 1 keV) higher than the absorption edge energy of the element of interest. In certain other embodiments, XRR data collected using a second X-ray beam that is lower than the absorption edge energy of the element of interest (e.g., having an average X-ray energy in the range of 1 eV to 1 keV or 1 eV to 5 eV) and other beam characteristics substantially similar to the beam characteristics of the first X-ray beam 32 can further be used.

[0054] In certain embodiments, XRR and XRF data obtained over a narrow range of grazing angles or at a small number of discrete grazing angles are measured and analyzed to obtain spatial and material information about the one or more added or removed materials. The narrow range of grazing angles and / or the discrete grazing angles can be selected based on the sensitivity (e.g., change) of the XRR and XRF data in response to the spatial and material information about the one or more added or removed materials. The sensitivity can be predetermined by analysis (e.g., simulation) or measurement. Advantages of certain such embodiments include increased metrology measurement throughput.

[0055] 6 is a flow diagram of an exemplary method 200 for inspection (e.g., process monitoring) according to certain embodiments described herein. The exemplary method 200 can be used to measure one or more preselected spatial and material parameters of a 3D structure on a flat substrate by measuring XRR and / or XRF data at a finite number of grazing angles selected for high sensitivity to certain preselected parameters. At operational block 210, the method 200 includes selecting (e.g., predetermining) at least one element of interest (EOI) within the preselected material. At operational block 220, the method 200 further includes generating an X-ray beam for the XRR and XRF measurements. The X-ray beam has an energy bandwidth of less than 20 eV (e.g., full width at half maximum) and an average X-ray energy in the range of 1 eV to 1 keV (e.g., in the range of 1 eV to 5 eV, in the range of 5 eV to 1 keV) higher than the absorption edge energy of the element of interest (EOI), and is collimated in at least one direction to have a collimation angle of less than 7 mrad (e.g., less than 4 mrad, less than 1 mrad). In certain embodiments, the absorption edge energy of the element of interest is selected to be between 0.1 keV and 5.4 keV. In certain embodiments, the average X-ray energy is less than the absorption edge energy of the major element of the substrate (e.g., 1.84 keV for a silicon substrate).

[0056] At operation block 230, method 200 further includes selecting (e.g., predetermining) a limited number of specific grazing incidence angles (e.g., less than 20, 50, or 100, with at least 20% of the grazing incidence angles being well separated from one another) for XRR and XRF signal collection. The specific grazing incidence angles can be selected due to their high sensitivity to one or more preselected specific parameters. In certain implementations, the specific grazing incidence angles correspond to peaks in the expected XRR and / or XRF signals. In certain implementations, data is also collected at specific grazing incidence angles that correspond to expected valleys and / or peaks in the XRR curve and / or XRF spectrum. In certain such implementations, the peaks in the XRR signal of the EOI correspond to positive interference of the exciting X-ray beam (e.g., first X-ray beam 32) in sample 20 at the layer containing the EOI. At operation block 240, method 200 further includes collimating the X-ray beam to less than 3 mrad in at least one direction (e.g., in the reflecting plane).

[0057] At operation block 250, the method 200 further includes directing an X-ray beam at a predetermined grazing incidence angle onto an area on the flat substrate of the sample 20, and simultaneously collecting XRR and XRF data at the predetermined grazing incidence angle, at operation block 260. At operation block 270, the method 200 further includes analyzing the XRR and XRF data together to obtain structural and material information of the sample.

[0058] In certain embodiments, the method 200 includes collecting a first XRR curve having a first average X-ray energy higher than the absorption edge energy of the EOI, and collecting a second XRR curve having a second average X-ray energy lower than the absorption edge energy of the EOI. The first and second XRR curves can be collected sequentially or simultaneously, and the data of the first and second XRR curves can be analyzed together to obtain structural and material information of the sample. In certain embodiments, the first XRR data set and the XRF data are collected at a first average X-ray energy higher than the absorption edge energy of the EOI, and the second XRR data set is collected at a second average X-ray energy lower than the absorption edge energy of the EOI. The first and second XRR data sets can be collected sequentially or simultaneously, and the first and second XRR data sets can be analyzed together with the XRF data to obtain structural and material information of the sample.

[0059] In certain embodiments, analyzing the measurement data (e.g., at operational blocks 132, 162, 270) includes one or more of: comparing at least a portion of the measurement data to expected values ​​from one or more simulated models of the specimen; comparing at least a portion of the measurement data to a priori information (e.g., prior to the process) to determine changes; and comparing at least a portion of the measured data to measurements from a known reference specimen. In certain embodiments, the analysis may enable the determination of deviations of physical dimensions of the specimen 20 from expected values ​​(e.g., from a priori information, expected simulated values, and / or known reference values). Such deviation measurements may be used to provide process monitoring (e.g., rapid feedback to a device during a manufacturing process) by generating automatic alerts when measured deviations are outside a predetermined range from expected values. In certain embodiments, the methods described herein may be used to measure 3D spatial information of a finite number of material layers that include one or more atomic elements of interest.

[0060] Example Applications Applications of certain implementations described herein include metrology and / or inspection of semiconductor processes (e.g., determining deposition uniformity) for gate-all-around (GAA) devices, for example, during or after dielectric deposition on silicon nanosheets, during / after dummy gate removal, etc. In certain embodiments, the sample analyzed is a semiconductor sample (e.g., a semiconductor wafer). In certain embodiments, the area of ​​interest on the sample is a test pattern or scribe line of the semiconductor sample, and in certain other embodiments, the area of ​​interest is an active area of ​​the semiconductor sample. In certain embodiments, the X-ray beam footprint on the sample surface in at least the smaller of the two dimensions parallel to the surface is less than 100 microns.

[0061] Depth-resolved HfO2 thickness in nanosheet stacks Certain implementations described herein can provide depth-resolved thickness characterization of HfO2 within semiconductor nanosheet stacks. For example, the X-ray generator 60 can utilize an X-ray generating material 68 including Si (e.g., SiC) configured to generate Si Kα X-rays 62. The Si Kα X-rays 62 have a mean X-ray energy (1.74 keV) that is lower than the Si absorption edge but higher than the two M absorption edges of Hf (M4 at 1.7164 keV and M5 at 1.6617 keV). The X-ray optical subsystem 70 can include one or more focusing X-ray optical elements used in combination with a collimating beam block (e.g., aperture, slit, pinhole) and can be configured to collimate the X-ray beam 32 to have a collimation angle range of 3 mrad in a direction in the scattering plane that includes the incident X-ray beam and the surface normal. The first X-ray beam 32 can be focused and collimated to be incident on the sample 20 with a spot size of 50 x 500 microns FWHM or less (e.g., 50 x 300 microns, 40 x 500 microns, 40 x 300 microns, or smaller), and XRR and XRF signals can be collected over a range of incidence angles (e.g., 3 mrad to 300 mrad).

[0062] FIG. 7A illustrates three exemplary simulation models of semiconductor nanosheet stack structures according to certain embodiments described herein. Each of the exemplary simulation models has a Si nanosheet having a thickness of 10 nm along the depth direction, and the lateral dimension perpendicular to the depth direction can be any size (e.g., in the range of 1 nm to 10 nm, in the range of 10 nm to 50 nm, or 50 nm or more). The Si nanosheets are surrounded by a dielectric material, HfO2, having a thickness of (i) 2 nm, (ii) 1.5 nm, or (iii) 1 nm, and are separated from each other by an air gap having a depth thickness of (i) 6 nm, (ii) 7 nm, or (iii) 8 nm. The thickness of the air gap is equal to 10 nm minus the thickness of the adjacent HfO2 dielectric layer (e.g., for a HfO2 dielectric layer having a thickness of 2 nm, the air gap thickness is 10 nm-(2·2 nm)=6 nm).

[0063] FIG. 7B shows graphs (e.g., curves) of simulated XRR data corresponding to the three exemplary simulation models of FIG. 7A simulated to be collected using three X-ray energies according to certain embodiments described herein. Each of the graphs in FIG. 7B represents simulated XRR intensity as a function of incidence angle with different X-ray energies, simulated to be collected from the Si nanosheet structure of FIG. 7A with HfO2 layers of (i) 2 nm, (ii) 1.5 nm, and (iii) 1 nm. The leftmost graph has an X-ray energy of 1.49 keV (e.g., Al characteristic emission X-rays), the middle graph has an X-ray energy of 1.74 keV (e.g., Si characteristic emission X-rays from SiC), and the rightmost graph has an X-ray energy of 9.7 keV.

[0064] FIG. 7C shows a graph of simulated differences by simple subtraction between the three XRR curves of FIG. 7B at three X-ray energies, according to certain embodiments described herein. FIG. 7C shows that the difference in XRR intensity increases with increasing X-ray energy, and at higher X-ray energies, most of the XRR information is at very low angles of incidence (e.g., less than 1 degree). XRR measurements at such low angles of incidence can spread the X-ray beam footprint over a larger area than is desirable. In certain embodiments, XRR measurements are performed using an X-ray energy of 1.74 keV, and the XRR curves show substantial differences as a function of HfO2 layer thickness over a wider range of angles of incidence (e.g., 1.5 degrees to 7 degrees).

[0065] FIG. 7D shows a graph of a simulated signal of HfM5N7 characteristic XRF line as a function of incident angle with an excitation X-ray energy of 1.74 keV according to certain embodiments described herein. Note that the vertical axis values ​​represent the number of XRF photons expected for one incident photon. Since the incident X-ray energy is slightly higher than the M absorption edge of Hf, the incident X-ray is efficient for exciting the Hf M X-ray fluorescence signal. Furthermore, the 1.74 keV Si characteristic emission X-ray does not excite X-ray fluorescence from the bulk Si substrate, thereby increasing the signal-to-noise ratio of the measured Hf XRF signal. FIGS. 7A-7D demonstrate the advantage of using an X-ray generating material 68 that generates X-rays with characteristic X-ray energies (e.g., 1.74 keV) above the absorption edge energies of the atomic elements of the bulk sample being analyzed according to certain embodiments described herein.

[0066] FIG. 7E shows a graph of simulated XRR signal differences at three different X-ray energies showing sensitivity to interface and surface roughness according to certain embodiments described herein. The simulated XRR signal differences in FIG. 7E are between a first model of Si nanosheet structure assuming zero roughness at all surfaces and interfaces and a second model assuming 1 nm roughness at the top surface and 0.5 nm roughness at the interfaces. FIG. 7E demonstrates that as the X-ray energy decreases (i.e., as the X-ray wavelength increases), the effect of roughness on the XRR signal decreases. Such information can be used to normalize the data. FIG. 7E also demonstrates the advantage of using a dual energy methodology according to certain embodiments described herein.

[0067] 8A-8E demonstrate other scenarios similar to those of FIGs 7A-7E, but with altered layer thicknesses. Additionally, the scenarios of FIGs 8A-8E represent a two-energy approach, where each X-ray energy is selected to be above one of the absorption edges of the atomic energies of interest, 1.74 keV above the Hf M absorption edge (e.g., generated by a Si-based source) and 9.713 keV above the Hf L absorption edge (e.g., generated by a Au-based source).

[0068] FIG. 8A shows a schematic of two exemplary simulation models of a semiconductor nanosheet stack structure according to certain embodiments described herein. Each of the exemplary simulation models has a Si nanosheet with a thickness of 10 nm along the depth direction, and the lateral dimension perpendicular to the depth direction can be any size (e.g., in the range of 1 nm to 10 nm, in the range of 10 nm to 50 nm, or 50 nm or more). The Si nanosheets are surrounded by a dielectric material, HfO2, where (i) the first model has a 2 nm thick top HfO2 layer above each Si nanosheet and a 1.5 nm thick bottom HfO2 layer below each Si nanosheet, and (ii) the second model has a 1.5 nm thick top HfO2 layer above each Si nanosheet and a 2 nm thick bottom HfO2 layer below each Si nanosheet. In both models, the Si nanosheets are separated from each other by an air gap with a thickness of 6.5 nm in the depth direction. FIG. 8A shows a challenging scenario where the overall HfO2 signal remains the same despite the different structures.

[0069] FIG. 8B shows a graph of simulated XRF signals from the two models of FIG. 8A at two different excitation X-ray energies, according to certain embodiments described herein. For an excitation X-ray with an X-ray energy of 9.713 keV (e.g., from an Au-based source), the XRF signals of the simulated Hf L3M5 XRF line collected as a function of incidence angle from the two models show some characteristic information, despite the fact that both models contain the same amount of HfO2. For an excitation X-ray with an X-ray energy of 1.74 keV (e.g., from a SiC-based source), the XRF signals of the simulated Hf M5N7 XRF line collected as a function of incidence angle from the two models also show some characteristic information. The characteristic information arises from the interference pattern caused by reflections from the Si nanosheets in the region of constructive interference in the target HfO2 layer, which provides a stronger signal. In certain embodiments, the XRF signal is collected at the first 3-5 peaks and valleys of the XRF signal, since a smaller incidence angle provides a higher sensitivity to the top layer. FIG. 8B also shows that as the angle of incidence increases, the XRF signal “flipped” between the first model having a greater signal intensity than the second model, and the first model having a lesser signal intensity than the second model.

[0070] 8C shows a graph of the simulated difference by simple subtraction between the two Hf XRF curves of FIG. 8B at two excitation X-ray energies, according to certain embodiments described herein. As shown in FIG. 8C, using an excitation X-ray energy of 9.713 keV results in a larger difference in the XRF signals, but with a smaller angle of incidence.

[0071] 8D shows graphs (e.g., curves) of simulated XRR signals corresponding to the two exemplary simulation models of FIG. 8A simulated to be collected from the Si nanosheet structure of FIG. 8A using three X-ray energies according to certain embodiments described herein. The leftmost graph has an X-ray energy of 1.49 keV (e.g., Al characteristic emission X-rays below the Hf M absorption edge), the middle graph has an X-ray energy of 1.74 keV (e.g., Si characteristic emission X-rays from SiC above the Hf M absorption edge), and the rightmost graph has an X-ray energy of 2.23 keV (e.g., above the Si K absorption edge). For each of the excitation X-ray energies, the XRR signals from the two models show the difference from each other as a function of the angle of incidence.

[0072] FIG. 8E shows a graph of the difference between the simulated XRR signals of FIG. 8D according to certain embodiments described herein. FIG. 8E demonstrates the advantage of certain embodiments of selecting an exciting X-ray energy below the first absorption edge of the substrate and / or cap layer (e.g., silicon). The rightmost graph of FIG. 8E demonstrates that absorption by the substrate and cap layer attenuates the detectable difference between the XRR signals.

[0073] FIG. 9 shows a graph illustrating the results of a dual energy method in which XRF signals are collected for two different atomic elements of interest according to certain embodiments described herein. The XRF signal of the second atomic element of interest can be collected in addition to the XRF signal of the first atomic element of interest. The second atomic element of interest can be another component of the material / layer / sample being analyzed. For example, for HfO2, the second atomic element of interest is oxygen and the first atomic element of interest is Hf, as shown in FIG. 9. In the XRF signal of FIG. 9, the dual energy method uses a first excitation X-ray energy above the absorption edge of the first atomic element of interest (e.g., Hf) and a second excitation X-ray energy below the absorption edge of the first atomic element of interest, and also generates an XRF signal using both excitation X-ray energies of the second atomic element of interest (e.g., oxygen). This additional data can be used to characterize the HfO2 layer thickness in metrology acquisition or inspection acquisition techniques as described herein.

[0074] Characterization of specific elements Certain embodiments described herein can be used to distinguish between Si and SiGe layers in processes commonly used to develop silicon nanosheets. For Ge and any other target elements with an absorption edge between 0.8 keV and 1.5 keV, examples include atomic elements with atomic numbers 4 (B) to 11 (Na), 19 (K) to 31 (Ge), and 40 (Zr) to 64 (Gd), a target containing Mg or a Mg compound (e.g., MgCl) can be used with an electron impact X-ray source to generate X-rays with X-ray energies ranging from 1 eV to 1 keV (e.g., in the range of 1 eV to 5 eV) above the absorption edge of the target element.

[0075] Certain embodiments described herein can be used to detect other atomic elements of interest. For example, for atomic elements of interest having an absorption edge between 0.8 keV and 1.5 keV, including atomic elements with atomic numbers between 8 (O) and 12 (Mg), 22 (Ti) and 34 (Se), and 49 (In) and 68 (Er), Al K-rays (1.486 keV) generated by an electron impact X-ray source using a target containing Al or an Al compound can be used. In another example, for atomic elements of interest having an absorption edge between 0.8 keV and 1.74 keV, including atomic elements with atomic numbers between 9 (F) and 13 (Al), 24 (Cr) and 35 (Br), and 56 (Ba) and 73 (Ta), Si K-rays (1.74 keV) generated by an electron impact X-ray source using a target containing Si or an Si compound can be used. Alternatively, W Mα-rays (1.8 keV) generated by an electron impact X-ray source using a target containing W or a W compound can be used.

[0076] Further Exemplary Embodiments In certain embodiments, XRR can be measured over a range of Q values ​​(eg, 0-0.15), where Q is defined as follows:

[0077]

number

[0078] where θ is the angle of incidence and λ is the wavelength of the incident X-ray. In certain embodiments, XRR is performed at low X-ray energies near (e.g., within 10%, within 20%) but below the absorption edge of atomic elements of the substrate and / or multilayer that are not the atomic elements of interest. In certain such embodiments, XRR measurements can be performed for X-ray energies near (e.g., within 10%, within 20%) or below the absorption edge of the atomic elements of interest.

[0079] Certain embodiments described herein provide metrology using two or more X-ray energies (e.g., a finite number of XRR measurements taken at a finite number of angles of incidence with two or more X-ray energies). For example, these X-ray energies can have a refractive index difference of more than 10% in the real and / or imaginary parts with respect to the material containing the atomic element of interest. In certain such embodiments, one X-ray energy can be below the absorption edge of the atomic element of interest and the other X-ray energy can be above the absorption edge. The incident X-ray beam can have a small energy bandwidth and a small collimation angle range. The sample structure (e.g., thickness of the Si nanosheet, spacing between the Si nanosheet and the substrate) at a first stage of fabrication (e.g., before deposition of the atomic element of interest, e.g., HfO2) may already be known, and metrology can be used to analyze the sample structure at a second stage of fabrication (e.g., after deposition of the atomic element of interest).

[0080] Certain embodiments include simulating XRR curves for various structures and various X-ray energies, examples of which include HfO2 layer on Si nanosheets using X-rays with X-ray energies of Mg K-line, or Al K-line and Si K-line; Ge layer in Si / SiGe nanosheet stack using X-rays with X-ray energies of Mg, Al or Si K-line; Si layer of Si nanosheets using X-rays with X-ray energies of Si or Al K-line (below the Si K-edge absorption edge) and one of Mo, Rh or Pd L-line. Certain embodiments include using XRR data with at least two X-ray energies to determine structural information of target atomic elements in layered material structures on flat substrates. As described herein, simulations have shown that Si Kα (1.74 keV energy) and Al Kα (1.5 keV) X-rays can be used together to measure HfO2 film thickness variations using XRR to provide complementary data, due in part to the fact that the Si Kα radiation is above the Hf M-edge energy and below the Si K-edge energy, while the Al Kα radiation is below the Hf M-edge energy.

[0081] In certain embodiments, the metrology can further include collecting characteristic X-ray fluorescence of the atomic element of interest at an X-ray excitation energy greater than the absorption edge energy of the atomic element of interest but less than 3 keV during at least one XRR measurement to efficiently generate characteristic X-ray fluorescence of the atomic element of interest to provide complementary information. In certain embodiments, the XRR data is used together with the XRF data to determine structural information of the atomic element of interest in a layered material structure on a flat substrate.

[0082] To monitor a manufacturing process in which a target atomic element is included in a layered material structure, certain embodiments can include selecting a finite number of X-ray measurements that have a strong correlation (e.g., response) with at least one target atomic element in the structure, collecting a data set of the at least one target atomic element on a reference standard with the selected number of X-ray measurements, collecting a data set of the at least one target atomic element on a test object with the same selected number of X-ray measurements, calculating the deviation (e.g., difference) of the two data sets, and determining whether the deviation is within a process window of a structural parameter of the target atomic element. A specific selection of examples of a finite number of X-ray measurements can include a finite number of measurements using an X-ray energy that is higher than the absorption edge of the target atomic element but less than 1 keV. The incident X-ray beam can have a small energy bandwidth and a small collimation angle range.

[0083] In a particular embodiment, the thickness of the HfO2 layer on three Si nanosheets (e.g., each Si nanosheet having a thickness of 10 nm and a pitch of 20 nm between adjacent nanosheets) is monitored using Si Kα X-rays and / or Al Kα X-rays at a finite number of angles of incidence. In one example, the three Si nanosheet structures can be simulated with at least two models, each model having corresponding HfO2 layer thicknesses equal to each other on both sides of all three Si nanosheets (e.g., the HfO2 layer thicknesses of the models differ from each other by 0.5 nm; the first model has a HfO2 layer thickness equal to 1.5 nm, and the second model has a HfO2 layer thickness equal to 2.0 nm). In another example, the three Si nanosheet structures can be simulated with at least two models, each model having a top HfO2 layer thickness equal to each other (e.g., 2.0 nm), a bottom HfO2 layer thickness equal to each other (e.g., 1.5 nm), and the top HfO2 layer thickness differs from the bottom HfO2 layer thickness. In another example, a three Si nanosheet structure can be simulated with at least two models, each model in which the top and bottom HfO2 thicknesses of the top and bottom Si nanosheets are the same as each other (e.g., top Si nanosheet: 2.0 nm on both top and bottom; bottom Si nanosheet: 1.5 nm on both top and bottom), and the HfO2 layer thicknesses of the top and bottom surfaces of the middle Si nanosheet are equal to the average of the HfO2 layer thicknesses of the top and bottom Si nanosheets (e.g., 1.75 nm on both top and bottom Si nanosheets). For each example, data can be acquired at one or two angles of incidence (e.g., selected to be sufficiently sensitive to differences between models).

[0084] In a particular embodiment, the relative thickness of the Si and SiGe layers of the three-layer Si / SiGe nanosheet stack on at least one test sample is monitored using Si Kα x-rays and reference data obtained from at least one reference sample (e.g., each Si / SiGe nanosheet of at least one reference sample having a thickness of 10 nm and a pitch of 20 nm between adjacent Si / SiGe nanosheets). In one example, the reference sample has a Si / SiGe thickness ratio for each of the Si / SiGe nanosheets equal to 1.05, and the reference data from the reference sample and the test data from the at least one test sample can be obtained at one or two angles of incidence (e.g., selected because they are expected to be sufficiently sensitive to the thickness ratio relative to the reference data from the base sample). In another example, the reference data is obtained from a reference sample in which the top, middle, and bottom Si / SiGe nanosheets have different Si / SiGe thickness ratios (e.g., top nanosheet: 1.0; middle nanosheet: 0.98; bottom nanosheet: 0.95). The reference and test data can be acquired at a finite number of XRR measurement points (e.g., selected because they are expected to be sufficiently sensitive to the thickness ratio of the reference data from the reference sample).

[0085] In certain embodiments, constructive and destructive interference of X-rays reflected from interfaces of the layered material structure with incident X-rays can be used to provide additional sensitivity to structural parameters. In certain embodiments, a finite number of characteristic XRF measurements can be obtained with incident X-ray energies higher than the absorption edge of the atomic element of interest but less than 1 keV. The incident X-ray beam can have sufficient coherence to generate X-ray intensity modulations inside the layered material structure by constructive and destructive interference of the incident X-rays and X-rays reflected by interfaces of the layered material structure. The X-ray energy can be selected to efficiently generate characteristic fluorescent X-rays and / or to provide a sufficiently high signal-to-background ratio (e.g., using incident Si K-line X-rays for efficient generation of Hf M-line fluorescent X-rays and incident Al K-line X-rays for efficient generation of Ge L-line fluorescent X-rays).

[0086] For example, the layered material structure may include three Si nanosheets (e.g., 10 nm thick each) separated from each other by air / vacuum regions, and a thin (e.g., less than 3 nm thick) HfO2 layer surrounding the Si nanosheets (see, e.g., Figures 7A and 8A). The X-ray transmittance of the characteristic oxygen K-line fluorescence and characteristic Hf L-line fluorescence through 20 nm of Si may be greater than 90%, with sufficient transmittance for the characteristic fluorescence generated on the underside of the lower Si nanosheet. To generate O characteristic K-line fluorescence, the excitation X-rays may have an X-ray energy greater than 532 eV, which is the oxygen K absorption edge energy. To efficiently generate O characteristic K-line fluorescence and have a sufficiently high X-ray flux within a narrow enough spectral bandwidth to generate X-ray intensity modulation inside the layered material structure, an X-ray source with target materials including Mg, Al, and / or Si and their related compounds (e.g., SiC) may be used. To generate Hf characteristic L-line fluorescence X-rays, the excitation X-rays can have an X-ray energy greater than the Hf M3 absorption edge energy of 1.662 keV. To efficiently generate Hf characteristic L-line fluorescence X-rays and have a sufficiently high X-ray flux within a sufficiently narrow spectral bandwidth to generate X-ray intensity modulation inside the layered material structure, an X-ray source having a target material including Si, Mo, Ru, Rh, Pd, W, Ir, Pt, Au, Ti, and / or Cr and their related compounds can be used to generate at least one characteristic X-ray having an X-ray energy in the range of 1.662 keV to 5.5 keV.

[0087] 10 illustrates a schematic of a layered material structure 320 illuminated by an incident X-ray beam 332, according to certain embodiments described herein. The incident X-ray beam 332 is incident on a layered material structure 324 (e.g., in an air / vacuum environment) on a substantially flat substrate 322 (e.g., a Si wafer), which includes two Si layers 325 on the substrate 322 and an air / vacuum gap region 326 below them. If the angle of incidence 334 is greater than the critical angle for total reflection, an X-ray reflection 336 occurs at every interface between the Si layers 325 and the gap region 326 that has an X-ray refractive index difference (e.g., between the Si layers 325 and the gap region 326). As shown in FIG. 10, the reflected X-ray beam 336 includes a first reflected X-ray beam 336a reflected from the top interface of the two Si layers 325 and the Si substrate 322 (long dashed line), and second reflected X-ray beams 336b from portions of the first reflected X-ray beam 336a reflected from various interfaces of the layered material structure 324, and FIG. 10 shows only some of these second reflected X-ray beams 336b.

[0088] When the incident X-ray beam 332 has sufficient longitudinal (e.g., temporal) coherence, the first reflected X-ray beam 336a and the second reflected X-ray beam 336b interfere with each other and with the incident X-ray beam 332. For example, the temporal coherence length of the X-ray beam is approximately equal to the X-ray wavelength λ multiplied by λ / Δλ, where Δλ is the spectral bandwidth. For a given spectral resolution λ / Δλ, the temporal coherence length is proportional to the X-ray wavelength. The interference results in X-ray intensity modulation inside the layered material structure 320. When the incident X-ray beam 332 has sufficient transverse (e.g., spatial) coherence, the X-ray intensity modulation can be maintained. The X-ray intensity modulation can be used to probe spatial information of at least one target atomic element in the layered material structure 324. When the incident X-ray beam 332 has sufficient longitudinal (e.g., temporal) coherence and sufficient lateral (e.g., spatial) coherence, the X-ray intensity from the interference of the incident X-ray beam 332 and the reflected X-ray beam 336 can be expressed as follows:

[0089]

number

[0090] where A1 and A2 are the amplitudes of the incident X-ray beam 332 and the reflected X-ray beam 336, respectively, and φ is the relative phase difference between the incident X-ray beam 332 and the reflected X-ray beam 336.

[0091] For the layered material structure 322 shown in Fig. 10, the X-ray intensity modulation in the layered material structure 322 results from the interference of the incident X-ray beam 332 with the first and second reflected X-ray beams 336a,b. The first reflected X-ray beam 336a results from the incident X-ray beam 332 reflected by the interface of two regions of the layered material structure 322 (e.g., the Si layer 325 and the gap 326), and the second reflected X-ray beam 336b results from the first reflected X-ray beam 336a further reflected by the interface of the two regions of the layered material structure 322. The amplitude of the second reflected X-ray beam 336b is generally weaker than the amplitude of the first reflected X-ray beam 336a. For example, assuming negligible amplitude reduction from attenuation and reflection of the incident X-ray beam 332 by the layered material structure 324, the X-ray intensity I1 at the bottom surface of the lower Si layer 325 (e.g., the Si layer closest to the substrate 322) can be approximated and expressed as follows:

[0092]

number

[0093] where A0 is the amplitude of the incident X-ray beam 332, A1 and A2 are the amplitudes of the first reflected X-ray beam 336a reflected from the lower surfaces of the substrate 322 and the lower Si layer 325, respectively, and φ is the relative phase difference between the incident X-ray beam 332 at the lower surface of the lower Si layer 325 and the first reflected X-ray beam 336a reflected from the substrate 322, which is approximately equal to the X-ray beam path length of the incident X-ray beam 332 from the lower surface of the lower Si layer 325 to the substrate 322 plus the X-ray beam path length of the first reflected X-ray 336a reflected from the substrate 322 to the lower surface of the lower Si layer 325.

[0094] When A0 is much larger than A1 and A2, the X-ray intensity I1 at the bottom surface of the lower Si layer 325 can be approximated and expressed as:

[0095]

number

[0096] By varying the angle of incidence of the incident X-ray beam 332, the X-ray intensity I1 at the lower surface of the lower Si layer 325 can be varied by 4·A0·A1, thereby providing information about the atomic elemental composition at the lower surface of the lower Si layer 325. Similarly, the approximate X-ray intensity at the upper surface of the lower Si layer 325 can be expressed as (assuming the spacing between the lower surface of the lower Si layer 325 and the substrate 322 is the same as the thickness of the lower Si layer 325) as follows:

[0097]

number

[0098] Here, A3 is the amplitude of the first reflected X-ray beam 326a reflected from the top surface of the lower Si layer 325.

[0099] Therefore, at the same incidence angle 334, the X-ray intensity on the top surface of the lower Si layer 325 is modulated by 2·A0·A1·cos(φ)+2·A0·A2·cos(φ), while the X-ray intensity on the bottom surface of the lower Si layer 325 is modulated by 2·A0·A1·cos(φ). Table 3 below shows the values ​​of B=2·A0·A1·cos(φ) and C=2·A0·A1·cos(φ)+2·A0·A2·cos(φ) for several selected values ​​of φ.

[0100] [Table 3]

[0101] If A1=A2, which can be a good approximation when the energy of the incident X-ray beam 332 is greater than 1 keV, then Table 2 can be simplified to have values ​​based on the coefficients A0·A1, as shown in Table 4.

[0102] [Table 4]

[0103] As shown in Tables 2 and 3, in certain embodiments, the relative X-ray intensity at the top and bottom surfaces of the bottom Si layer can be changed by changing the relative phase difference, which can be used to obtain relative information of materials on the two surfaces (e.g., relative Ge residue on the two surfaces after SiGe etching during nanosheet transistor fabrication process, thickness of HfO2 layers on both of the two surfaces). In certain embodiments, by selecting the appropriate value, the maximum or minimum value of the X-ray intensity can be obtained on one of the two surfaces, allowing the selection of optimal conditions for process monitoring during semiconductor device fabrication.

[0104] The above discussion has focused on the calculation of X-ray intensity modulation at the interface of the lower Si layer 325 in a layered material structure 324 that includes only two layer pairs of Si layer / gap regions, as well as at the top and bottom surfaces of the lower Si layer 325. However, in certain implementations, the method of using X-ray interference to generate X-ray intensity modulation in an incident X-ray beam 332 with sufficient coherence conditions can be generalized to any layered material structure 324 with a finite number of layers. Certain such embodiments can be used for metrology and process monitoring where only a small number of measurements optimized for a particular material and / or structural parameters are used as a reference under the same measurement conditions on a reference standard.

[0105] In certain embodiments, the X-ray intensity modulation within a sample can be represented by X-ray reflectivity, which is proportional to the sum of all reflected X-rays emerging from the surface of the sample and can be expressed as a percentage of the incident X-ray beam. X-ray reflectivity measures only the X-ray intensity of the reflected beam, not the phase of the reflected X-ray beam. As a result, X-ray reflectivity measurements do not provide information about the X-ray intensity distribution within the sample.

[0106] 11 shows a calculated XRR curve from a layered material structure 324 including two pairs of Si / gap regions with 10 nm thick Si layers 325 spaced 10 nm apart (e.g., with a 20 nm period) on a silicon substrate 322 (see, e.g., FIG. 10). The XRR curve includes reflectivity minima and maxima resulting from interference of the incident X-ray beam 332 and all reflected X-ray beams 336 from the interfaces of the layered material structure 324. The reflectivity minima and maxima are directly related to the X-ray intensity modulation within the layered material structure 324.

[0107] 11 also shows diagrammatically the relative phase difference at the three indicated interfaces, i.e., the top surface of the two Si layers 325 and the substrate 322, for four angles of incidence where the XRR curves are at a minimum or maximum. The first minimum occurs for an angle of incidence where the phase difference between the first reflected X-ray beam 336a from the top surface of the top Si layer 325 and the first reflected X-ray beam 336a reflected from the substrate 322 results in destructive interference. The first maximum occurs for an angle of incidence where the phase difference between the first reflected X-ray beam 336a from the top surface of the top Si layer 325 and the first reflected X-ray beam 336a reflected from the substrate 322 results in constructive interference.

[0108] Certain embodiments described herein can be used to characterize the depth distribution of one or more atomic elements of interest in a layered material structure on a flat substrate at various depths. For example, the relative amount of an atomic element (e.g., Ge) at or near the top and bottom surfaces of two Si layers 325 can be measured using four values ​​of the angle of incidence selected to provide greater differences in response to the incident X-ray beam 332 (e.g., to detect Ge characteristic X-rays). Certain embodiments described herein can be used to measure one or more atomic elements of interest at any depth (e.g., not limited to a particular interface) within the layered material structure. Certain embodiments described herein can be used to analyze layered material structures including multiple layers with or without periodicity.

[0109] The particular embodiment described herein involves the specific selection of a finite number of example x-ray measurements.

[0110] Certain embodiments described herein utilize low energy X-rays with long coherence lengths. For example, Cu Kα1 and Kα2 are 400X, 1.5A yields 600A (60nm) with a multi-layer monochromator, and a single crystal monochromator must be used to obtain 4000 times the resolution (simply select Kα1) to obtain a coherence length of 600nm. For Si Kα, the coherence length is 1740 / 0.7>2000x×0.6nm=1200nm. Furthermore, lower energy X-rays offer advantages for metrology and process monitoring with a small X-ray beam footprint on the sample, since the X-ray incidence angle to each object plane is proportional to the critical angle, the angular collimation of the incident X-ray beam is proportional to the X-ray wavelength, and the fluorescence cross section of many low-Z elements of interest in semiconductor devices, such as O in HfO2, is larger. The HfO2 thickness can be measured using one of the two elements, assuming the stoichiometry remains the same and / or is known by other techniques.

[0111] In certain embodiments where the incident X-ray beam is sagittally focused to a size of less than 40 microns on the sample, multiple test pads can be used along the tangential direction, examples of which include one or more of: large convergence angles or high angles of incidence; high angle harmonics (e.g., high angles with shorter standing waves and therefore higher resolution); dual X-ray energies above and below the absorption edge of the target atomic elements and / or atomic elements in the target material; and X-ray wavelengths shorter than half the standing wave pitch.

[0112] In certain embodiments, the incident X-ray beam can be directed onto a sample that includes at least one layered material structure. For example, for a sample that includes a flat material structure, the angle of incidence can be less than 20 degrees and greater than the critical angle of total external reflection of the flat substrate or the critical angle of the layered material structure, whichever is greater. The X-ray intensity variation within the layered material structure can be changed by changing the grazing incidence angle for a fixed X-ray probing energy or by changing the X-ray energy for a fixed grazing incidence angle.

[0113] In certain embodiments, the X-ray energy of the incident X-ray beam is selected to generate secondary particles with short penetration depths in the sample to obtain element-specific depth information. Using two or more secondary particles with different short penetration lengths can achieve high depth measurement sensitivity and reasonably large probing depths. In certain embodiments, multiple X-ray energies of the incident X-ray beam can be used and optimized for a range of atomic elements to generate secondary particles with desired penetration lengths. The depth probing capabilities of these techniques can be used alone or in combination with each other.

[0114] Certain embodiments can be used to measure structures in depth and / or 3D with nanometer resolution. For example, an incident X-ray beam with certain attributes can be directed onto one or more layered material structures at a grazing incidence angle relative to a flat surface of a substrate to generate X-ray intensity variations along a surface normal of the flat surface of the substrate, the X-ray intensity variations resulting from interference of the incident X-ray beam with X-rays reflected from interfaces of the layered material structures and the substrate. By adjusting the grazing incidence angle, the X-ray intensity distribution along the surface normal can be changed. Absorption (e.g., ionization) of X-rays by one or more atomic elements in the layered material structures can generate secondary particles (e.g., characteristic X-ray fluorescence, photoelectrons, and Auger electrons). The characteristic X-ray fluorescence and Auger electrons are highly atomic element specific and independent of the X-ray energy of the X-ray beam. If the incident X-ray beam is monochromatic, the photoelectrons are also atomic element specific because their energy is equal to the difference between the X-ray energy of the incident beam and the binding energy of the electrons in the atomic elements. For a given structure (e.g., a thin layer), the number of secondary particles generated by an atomic element is proportional to the X-ray intensity in the layer and the atomic number of the atomic element. Thus, the amount of one or more atomic elements in a layered material structure can be measured by measuring the number of secondary particles specific to the atomic element. With a calibrated standard reference sample, this technique can be used to measure and monitor the amount of atomic elements in materials of interest in semiconductor manufacturing processes to ensure that the manufacturing process is within a given process window. Since the X-ray intensity distribution can vary between 1 nm and 20 nm depending on the X-ray energy and the grazing incidence angle, by adjusting the grazing incidence angle, the distribution of one or more atomic elements along the surface normal of a flat surface can be measured. X-ray intensity variations along the surface normal may be particularly well suited for the study of layered material structures of semiconductor devices and their manufacturing processes.

[0115] In certain embodiments, the X-ray energy of the incident X-ray beam is selected to efficiently generate a large number of at least two secondary particles having an effective linear attenuation length (e.g., equivalent to the inelastic mean free path of photoelectrons and Auger electrons) between 1 nm and 500 nm and a ratio of their effective linear attenuation lengths of more than 50%. A relatively short effective linear attenuation length may be useful to obtain a relatively strong dependence of the secondary particle penetration from the origin of the secondary particle to the surface of the layered material structure. A large difference between their effective linear attenuation lengths may be useful to balance depth measurement sensitivity with sufficient measurement depth. For example, the photoelectron energy can be varied by selecting the X-ray energy of the incident beam. Furthermore, photoelectrons from two different electron shells in an atom have different energies and different corresponding effective linear attenuation lengths.

[0116] In certain embodiments, the incident X-ray beam is monochromatic or quasi-monochromatic, with more than 50% of the X-rays within an energy bandwidth of less than 1%. The incident X-ray energy can be selected to generate photoelectrons from one atomic element with an energy difference of more than 300 eV. The incident X-ray energy can be selected to generate photoelectrons from Auger electrons from the same atomic element or different atomic elements with an energy difference of more than 300 eV. The incident X-ray energy can be selected to generate X-rays with one or more characteristic X-ray energies from one or more atomic elements such that the linear attenuation length of the generated X-rays through the layered material structure is less than 200 nm. In certain embodiments, two or more incident X-ray energies are used to generate secondary particles with a linear attenuation length of less than 500 nm and an inelastic mean free path of less than 30 nm for the characteristic X-rays. Multiple secondary particles with linear attenuation lengths (X-rays) or inelastic mean free paths (electrons) can be detected and used to obtain structural information of the layered material structure. The efficiency of secondary particle generation by one or more atomic elements in a layered material structure can be varied by varying the x-ray beam intensity while varying the grazing incidence angle for a given x-ray beam energy. For example, the grazing incidence angle can be scanned over a range of grazing incidence angles while secondary particles are collected. X-ray reflectivity can be measured and used to calibrate or determine the value of the grazing incidence angle. In certain embodiments, secondary particles are collected simultaneously with x-ray reflectivity measurements over a range of grazing incidence angles. Data from the two measurements can be used to obtain structural and material information about the layered material structure.

[0117] Certain embodiments described herein can avoid one or more challenges or problems found in other analytical techniques. For example, light scattering measurements are model dependent (e.g., often require imaging to provide a model), which can be confounded due to the increasing complexity of layered material structures and shrinking feature dimensions of new semiconductor devices. Electron microscopy (EM) and atomic force microscopy (AFM) typically require destructive sample preparation to obtain depth information of layered material structures, which can be time-consuming and destructive, and therefore undesirable for process monitoring techniques. Electron microprobe-based techniques can be limited in detection sensitivity due to large continuous bremsstrahlung X-ray backgrounds (e.g., in electron-induced X-ray fluorescence spectroscopy) and / or large electron backgrounds (e.g., in Auger spectroscopy), and can require destructive sample preparation of thin cross sections for high depth resolution. Additionally, electron beam-induced carbon deposition on the analysis area can result in measurement errors related to the amount of carbon deposited on the analysis area, and charging can be problematic, especially when detecting low energy characteristic X-rays or Auger electrons. Transmission small-angle X-ray scattering (tSAXS) systems with laboratory X-ray sources may not have acceptable throughput for measuring layered material structures with sufficient depth resolution.

[0118] Although commonly used terms are used to describe systems and methods of particular embodiments for ease of understanding, these terms are used herein to have their broadest reasonable interpretation. Various aspects of the present disclosure are described with respect to illustrative examples and embodiments, but the disclosed examples and embodiments should not be construed as limiting. Conditional terms such as "can," "could," "might," or "may," unless otherwise specified or understood otherwise within the context in which they are used, are generally intended to convey that certain embodiments include certain features, elements, and / or steps, while other embodiments do not. Thus, such conditional terms are generally not intended to imply that the features, elements, and / or steps are somehow required for one or more embodiments. In particular, the terms "comprises" and "comprising" should be construed as referring to elements, components, or steps in a non-exclusive manner, indicating that the referenced element, component, or step may be present or utilized or may be combined with other elements, components, or steps not expressly referenced.

[0119] Conjunction terms such as the phrase "at least one of X, Y, and Z" should be understood within the context in which they are generally used to convey that an item, term, etc., can be either X, Y, or Z, unless otherwise indicated. Thus, such conjunctive terms are generally not intended to imply that a particular embodiment requires the presence of at least one of X, at least one of Y, and at least one of Z.

[0120] Terms of degree as used herein, such as the terms "approximately," "about," "generally," and "substantially," refer to values, amounts, or characteristics that are close to the stated value, amount, or characteristic that still performs a desired function or achieves a desired result. For example, the terms "approximately," "about," "generally," and "substantially" may refer to amounts that are within ±10%, ±5%, ±2%, ±1%, or ±0.1% of the stated amount. As another example, the terms "approximately parallel" and "substantially parallel" refer to values, amounts, or characteristics that deviate from exactly parallel by ±10 degrees, ±5 degrees, ±2 degrees, ±1 degree, or ±0.1 degrees, and the terms "approximately perpendicular" and "substantially perpendicular" refer to values, amounts, or characteristics that deviate from exactly perpendicular by ±10 degrees, ±5 degrees, ±2 degrees, ±1 degree, or ±0.1 degrees. Ranges disclosed herein also encompass any and all overlaps, subranges, and combinations thereof. Words such as "up to," "at least," "greater than," "less than," "between," and the like, include the recited numbers. As used herein, the meaning of "a," "an," and "said" includes plural references unless the context clearly dictates otherwise. Although structures and / or methods are described herein with respect to elements labeled with ordinal adjectives (e.g., first, second, etc.), the ordinal adjectives are used merely as labels to distinguish one element from another, and the ordinal adjectives are not used to indicate the order of these elements or their use.

[0121] Various configurations have been described above. It should be understood that the embodiments disclosed herein are not mutually exclusive and can be combined with each other in various configurations. Although the present invention has been described with reference to these specific configurations, the description is intended to illustrate the present invention and not to limit it. Various modifications and applications will occur to those skilled in the art without departing from the true spirit and scope of the present invention. Thus, for example, in any method or process disclosed herein, the acts or operations constituting the method / process may be performed in any suitable order and are not necessarily limited to any particular disclosed order. Features or elements from the various embodiments and examples described above can be combined with each other to generate alternative configurations that are compatible with the embodiments disclosed herein. Various aspects and advantages of the embodiments have been described where appropriate. It should be understood that not all such aspects or advantages are necessarily achieved in accordance with any particular embodiment. Thus, for example, it should be recognized that various embodiments can be implemented to achieve or optimize one advantage or group of advantages as taught herein without necessarily achieving other aspects or advantages as may be taught or suggested herein.

Claims

1. 1. A method for analyzing a three-dimensional structure of a sample, the method comprising: generating a first x-ray beam, the first x-ray beam having a first energy bandwidth less than 20 eV at full width at half maximum and a first average x-ray energy in a range of 1 eV to 1 keV higher than a first absorption edge energy of a first target atomic element, the first x-ray beam being collimated to have a first collimation angular range less than 7 mrad in at least one direction perpendicular to a first propagation direction of the first x-ray beam; irradiating the sample with the first x-ray beam at a plurality of angles of incidence relative to a substantially planar surface of the sample, the angles of incidence for the plurality of angles of incidence being in a range of 3 mrad to 400 mrad; simultaneously detecting a reflected portion of the first X-ray beam from the sample and detecting X-ray fluorescence and / or photoelectrons from the sample; Including, the sample comprises a silicon substrate and the first mean x-ray energy is less than the 1.84 keV absorption edge energy of silicon.

2. The method of claim 1 , wherein the first absorption edge energy of the first target atomic element is in the range of 0.1 keV to 5.4 keV.

3. The method of claim 1 , wherein the first collimation angular range is less than 4 mrad.

4. 2. The method of claim 1, wherein the first average x-ray energy is in the range of 1 eV to 5 eV higher than the first absorption edge energy of the first target atomic element.

5. 2. The method of claim 1, wherein the generating the first x-ray beam comprises irradiating at least one x-ray producing material with electrons and emitting x-rays from the at least one x-ray producing material that produces characteristic x-rays in a range of 100 eV to 5.5 keV.

6. The method of claim 5 , wherein the generating the first x-ray beam further comprises filtering the x-rays to have the first energy bandwidth.

7. 2. The method of claim 1, wherein the first x-ray beam impinges on the sample at a reflection plane that includes the first propagation direction and a direction normal to the surface, and the first x-ray beam has a collimation angle at the reflection plane that is less than a convergence angle of the first x-ray beam at a plane normal to the reflection plane.

8. The irradiating the sample with the first X-ray beam and the simultaneously detecting the reflected portion of the first X-ray beam and detecting the X-ray fluorescence and / or the photoelectrons are performed after the sample has undergone at least one processing procedure, the method comprising: obtaining a first set of spatial and / or compositional information about the sample by analyzing at least the detected first reflected portion and / or the detected X-ray fluorescence and / or the detected photoelectrons; comparing the obtained first set of spatial and / or compositional information about the sample with a second set of spatial and / or compositional information about the sample before the sample was subjected to the at least one processing procedure; The method of claim 1 further comprising:

9. generating a second X-ray beam, the second X-ray beam having a second energy bandwidth less than 20 eV at full width at half maximum and a second mean X-ray energy in a range of 1 eV to 1 keV lower than the first absorption edge energy of the first target atomic element, the second X-ray beam being collimated to have a second collimation angular range of less than 7 mrad in at least one direction perpendicular to a second propagation direction of the second X-ray beam; irradiating the sample with the second X-ray beam; detecting a second reflected portion of the second x-ray beam from the sample; The method of claim 1 further comprising:

10. The irradiating of the sample with the first X-ray beam and the simultaneous detecting of the reflected portion of the first X-ray beam and detecting the X-ray fluorescence and / or photoelectrons are performed after the sample has undergone at least one processing step, the method comprising:

10. The method of claim 9, further comprising obtaining spatial and compositional information about the sample by analyzing the detected second reflected portion along with the detected first reflected portion, the detected X-ray fluorescence, and / or the detected photoelectrons.

11. generating a second X-ray beam, the second X-ray beam having a second energy bandwidth less than 20 eV at full width at half maximum and a second mean X-ray energy in a range of 1 eV to 1 keV higher than a second absorption edge energy of the first target atomic element, the first absorption edge energy and the second absorption edge energy being separated from one another by at least 1 keV, the second X-ray beam being collimated to have a second collimation angular range of less than 7 mrad in at least one direction perpendicular to a second propagation direction of the second X-ray beam; irradiating the sample with the second X-ray beam; detecting a second reflected portion of the second x-ray beam from the sample; The method of claim 1 further comprising:

12. generating a second X-ray beam, the second X-ray beam having a second energy bandwidth less than 20 eV at full width at half maximum and a second mean X-ray energy in a range of 1 eV to 1 keV higher than a second absorption edge energy of a second target atomic element different from the first target atomic element, the second X-ray beam being collimated to have a second collimation angular range of less than 7 mrad in at least one direction perpendicular to a second propagation direction of the second X-ray beam; irradiating the sample with the second X-ray beam; detecting a second reflected portion of the second x-ray beam from the sample; The method of claim 1 further comprising:

13. 2. The method of claim 1, wherein the plurality of angles of incidence comprises less than 100 angles of incidence, and at least 20% of the angles of incidence are separated from one another by at least 3 mrad.

14. 14. The method of claim 13, further comprising selecting at least some of the angles of incidence to correspond to expected extrema in the detected reflected portion of the first X-ray beam from the sample and / or expected extrema in the detected X-ray fluorescence from the sample.

15. - analyzing the deviation between an expected value and the detected reflected portion and / or between an expected value and the detected X-ray fluorescence; initiating an alert in response to the deviation being outside a predetermined range; The method of claim 14 further comprising:

16. 1. A method for analyzing a layered structure comprising substantially parallel interfaces, the method comprising: irradiating the layered structure with an incident X-ray beam at one or more angles of incidence relative to the substantially parallel interfaces in a range of 3 mrad to 400 mrad, the incident X-ray beam having an energy bandwidth of less than 20 eV at full width at half maximum and an average X-ray energy in a range of 1 eV to 1 keV higher than an absorption edge energy of an atomic element of interest, the incident X-ray beam having sufficient coherence to generate an X-ray intensity modulation within the layered structure due to interference of the incident X-ray beam with X-rays of the incident X-ray beam reflected by the substantially parallel interfaces of the layered structure; simultaneously detecting at least a portion of the x-rays reflected by the substantially parallel interfaces and detecting x-ray fluorescence and / or photoelectrons from the layered structure; the layered structure comprises a silicon substrate, and the average x-ray energy is less than the 1.84 keV absorption edge energy of silicon.

17. 17. The method of claim 16, wherein the average x-ray energy is in the range of 1 eV to 5 eV higher than the absorption edge energy of the target atomic element.

18. 1. A system for analyzing a three-dimensional structure of a sample, the system comprising: at least one X-ray source configured to generate at least one X-ray beam having an energy bandwidth of less than 20 eV at full width at half maximum and an average X-ray energy in a range of 1 eV to 1 keV higher than an absorption edge energy of an atomic element of interest, the at least one X-ray beam being collimated to have a collimation angle range of less than 7 mrad in at least one direction perpendicular to a propagation direction of the at least one X-ray beam, the at least one X-ray source being further configured to direct the at least one X-ray beam to irradiate the sample at an angle of incidence relative to a substantially flat surface of the sample, the angle of incidence being in a range of 3 mrad to 400 mrad; at least one first detector configured to detect a reflected portion of the at least one X-ray beam from the sample; at least one second detector configured to detect X-ray fluorescence and / or photoelectrons from the sample simultaneously with the at least one first detector detecting the reflected portion of the at least one X-ray beam; the sample comprises a silicon substrate, and the average x-ray energy is less than the 1.84 keV absorption edge energy of silicon.

19. 20. The system of claim 18, wherein the average x-ray energy is in the range of 1 eV to 5 eV higher than the absorption edge energy of the target atomic element.

20. The sample has a layered structure comprising a plurality of layers and a plurality of substantially parallel interfaces between the layers, and the method comprises: generating measurement data using the detected reflected portion and the detected X-ray fluorescence and / or photoelectrons from the sample; obtaining depth-resolved information indicative of the layers and / or interfaces of the sample from the measurement data, said obtaining including comparing at least a portion of the measurement data to expected measurement data values ​​from one or more simulated models of the sample, previously measured data values ​​obtained from the sample, and / or measured data values ​​from a reference sample; The method of claim 1 further comprising:

21. 21. The method of claim 20, wherein the first X-ray beam has an angle of incidence with respect to a substantially planar surface of the sample, and wherein the irradiating forms a standing X-ray wave in the layered structure by interference of the first X-ray beam with X-rays of the first X-ray beam reflected by the interfaces of the layered structure, the standing X-ray wave having an X-ray intensity modulation in a direction perpendicular to the interfaces, and the method further comprises adjusting the angle of incidence to position nodes and antinodes of the standing X-ray wave along the direction perpendicular to the interfaces at predetermined locations within the layered structure relative to the plurality of layers and the plurality of substantially parallel interfaces.

22. 10. The method of claim 1 , wherein the specimen has a layered structure with a plurality of layers and a plurality of substantially parallel interfaces between the layers, and the first X-ray beam produces X-ray maxima or minima at interfaces of the substantially parallel interfaces.

23. 2. The method of claim 1 , wherein the sample has a layered structure comprising a plurality of layers and a plurality of substantially parallel interfaces between the layers, and the first X-ray beam interacts with the plurality of substantially parallel interfaces to form an X-ray intensity modulation within the layered structure in a direction perpendicular to the interfaces due to interference of the first X-ray beam with X-rays reflected by the interfaces.

24. 24. The method of claim 23, wherein the x-ray intensity modulation at a first interface of the plurality of substantially parallel interfaces varies as a first function of the angle of incidence and the x-ray intensity modulation at a second interface of the substantially parallel interfaces varies as a second function of the angle of incidence, the second function being different from the first function.

25. 10. The method of claim 1, wherein the depth-resolved information of the sample is indicative of at least one layer thickness of the sample in a direction substantially perpendicular to the surface.

26. 20. The system of claim 18, wherein the sample has a layered structure with a plurality of layers and a plurality of substantially parallel interfaces between the layers, and the at least one X-ray beam has sufficient coherence to generate a standing X-ray wave having an X-ray intensity modulation within the layered structure in a direction perpendicular to the surface by interference of the at least one X-ray beam with X-rays of the at least one X-ray beam reflected by the substantially parallel interfaces of the layered structure.

27. 27. The system of claim 26, further comprising at least one stage configured to adjust and set the angle of incidence of the at least one X-ray beam with respect to the surface to a particular predetermined value such that node and antinode positions of the standing X-ray wave are adjusted and set with respect to the layers and interfaces along the direction normal to the surface.

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