Inspection Socket

Abstract

To provide an inspection socket capable of easily holding an inspection object in an attitude so as to inspect the inspection object.SOLUTION: An inspection socket includes a first member and a second member. The first member and the second member are configured to face each other in a first direction and hold an inspection object between the first member and the second member. The inspection object can be inspected in a closed state in which the inspection object is held by the first and second members. The first member includes a first base section comprising: a first inspection unit configured so that the inspection object is located in the closed state; and a first pressing unit configured to press the first inspection unit in the first direction from the first member toward the second member. The second member includes a second base section comprising: a second inspection unit configured to face the first inspection unit in the closed state and hold the inspection object with the first inspection unit; and a second pressing unit configured to press the second inspection unit in the first direction from the second member toward the first member. The second pressing unit is configured to have pressing force larger than that of the first pressing unit.SELECTED DRAWING: Figure 2

Description

[Technical Field]

[0001] The present disclosure relates to a test socket. [Background technology]

[0002] Patent Document 1 describes a measurement socket used for testing the continuity of electronic modules, measuring their characteristics, and the like. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Application Publication No. 2018-49816 Summary of the Invention [Problem to be solved by the invention]

[0004] In general, in an inspection socket including the measurement socket of Patent Document 1, an inspection is performed with the inspection target held within the housing of the inspection socket. However, depending on the shape of the inspection target, it may be difficult to hold the inspection target in a position that allows inspection.

[0005] The present disclosure aims to provide an inspection socket that can more easily hold an object to be inspected in a position that allows inspection. [Means for solving the problem]

[0006] A test socket according to one aspect of the present disclosure includes: An inspection socket comprising a first member and a second member, the first member and the second member facing each other in a first direction, configured to be able to hold an inspection object between the first member and the second member, and capable of inspecting the inspection object in a closed state in which the inspection object is held by the first member and the second member, The first member is a first inspection unit configured so that the object to be inspected is positioned in the closed state; a first base portion having a first biasing portion configured to bias the first inspection portion in the first direction from the first member toward the second member, The second member is a second inspection unit configured to face the first inspection unit in the closed state and to be able to hold the inspection object together with the first inspection unit; a second base portion having a second biasing portion that biases the second inspection portion in the first direction from the second member toward the first member; The second biasing portion is configured so that the biasing force is greater than that of the first biasing portion. [Effects of the Invention]

[0007] According to the present disclosure, it is possible to provide an inspection socket that can more easily hold an object to be inspected in a position that allows inspection. [Brief explanation of the drawings]

[0008] [Figure 1] FIG. 1 is a schematic perspective view illustrating a test socket according to an embodiment of the present disclosure. [Figure 2] FIG. 2 is a schematic cross-sectional view of the test socket taken along line II-II of FIG. 1; [Figure 3] FIG. 2 is a schematic perspective view of the inspection socket of FIG. 1 in an open state. [Figure 4] FIG. 2 is a schematic exploded perspective view of the inspection socket of FIG. 1 as viewed from above. [Figure 5] FIG. 2 is a schematic exploded perspective view of the inspection socket of FIG. 1 as viewed from below. [Figure 6A] 2 is a schematic bottom perspective view of a first member of the inspection socket of FIG. 1; FIG. [Figure 6B] FIG. 6B is a schematic enlarged cross-sectional view taken along line VIB-VIB of the first member in FIG. 6A. [Figure 6C] FIG. 6B is a schematic enlarged cross-sectional view taken along line VIC-VIC of the first member in FIG. 6A. [Figure 7A] 2 is a schematic perspective top view of a second member of the test socket of FIG. 1; FIG. [Figure 7B]FIG. 7B is a schematic enlarged cross-sectional view of the second member taken along line VIIB-VIIB in FIG. 7A. [Figure 7C] FIG. 6 is a schematic enlarged cross-sectional view of the second member taken along line VIIC-VIIC in FIG. 7A. [Figure 7D] FIG. 7B is a schematic perspective view of a second floating member in the second member of FIG. 7A. [Figure 8] 7D and 7C are schematic plan views showing the positional relationship between the second floating member and the first inspection unit. [Figure 9] FIG. 1 is a perspective view showing an example of an inspection object. [Figure 10] 2 is a cross-sectional view taken along line II-II of FIG. 1 showing an example of the test socket in a closed state. [Figure 11A] FIG. 2 is a schematic perspective view showing a first modified example of the inspection socket of FIG. 1; [Figure 11B] FIG. 11B is a schematic perspective view showing the inspection socket of FIG. 11A in an open state. [Figure 12] FIG. 2 is a schematic perspective view showing a second modified example of the inspection socket of FIG. 1; [Figure 13A] FIG. 10 is a schematic perspective view showing a third modified example of the inspection socket of FIG. [Figure 13B] 13B is a schematic cross-sectional view of the test socket of FIG. 13A taken along line XIIIB-XIIIB. [Figure 13C] FIG. 13B is a schematic perspective view showing the inspection socket of FIG. 13A in an open state. DETAILED DESCRIPTION OF THE INVENTION

[0009] An example of the present disclosure will now be described with reference to the accompanying drawings. The following description is merely exemplary in nature and is not intended to limit the present disclosure, its application, or its uses. The drawings are schematic, and the ratios of dimensions and the like do not necessarily correspond to the actual ones. In the drawings, substantially identical components are designated by the same reference numerals.

[0010] In the following, an inspection socket used for inspecting an optical module (for example, a camera module, see FIG. 9) having a lens portion, which is an example of the inspection object 100, will be described as an example.

[0011] 1 and 2, a test socket 1 according to an embodiment of the present disclosure includes a first member 10 and a second member 20. Each of the first member 10 and the second member 20 has, for example, a substantially rectangular parallelepiped shape. The first member 10 and the second member 20 are arranged to face each other in a first direction (for example, the Z direction).

[0012] As shown in FIG. 2, the inspection socket 1 is configured to face each other in the first direction Z and to be able to hold the inspection object 100 between the first member 10 and the second member 20. This state in which the first member 10 and the second member 20 face each other closely in the first direction Z and the inspection object 100 can be held by the first member 10 and the second member 20 is called the "closed state." The inspection object 100 is, for example, an optical module. The second member 20 has a lens opening 26 at a position corresponding to the lens portion of the optical module in the closed state. The inspection socket 1 can inspect the inspection object 100 in the closed state.

[0013] In this embodiment, the inspection socket 1 is configured to be capable of assuming a closed state as shown in Figures 1 and 2, and a state in which the inspection object 100 is released from its hold as shown in Figure 3 (hereinafter referred to as the "open state").

[0014] The inspection socket 1 includes, for example, a pivoting portion 41 that rotatably connects the second member 20 to the first member 10. The pivoting portion 41 is disposed at one of both ends of the first member 10 in a second direction (for example, the X direction) that intersects with the first direction Z. The pivoting portion 41 is, for example, a hinge provided along a third direction (for example, the Y direction) that intersects with the first direction Z and the second direction X, and the first member 10 and the second member 20 are connected to each other so as to be rotatable about an axis of the hinge extending along the third direction Y. This allows the inspection socket 1 to pivot between a closed state and an open state. A latch 42 for maintaining the closed state is provided at the other end of the first member 10 (the end opposite to the pivoting portion 41).

[0015] 2, 4, and 5, the first member 10 includes a first base portion 11. The second member 20 includes a second base portion .

[0016] The first base portion 11 has a first inspection portion 12 and a first biasing portion 13. In this embodiment, the first base portion 11 has a first surface 111 that faces the second member 20 in the closed state, and a second surface 112 that faces the first surface 111 and is located on the opposite side from the second member 20. The first surface 111 and the second surface 112 are approximately parallel and extend along a plane (e.g., the XY plane) that is perpendicular to the first direction Z in the closed state. The first surface 111 is provided with the first inspection portion 12. The first surface 111 includes a portion that constitutes the first inspection portion 12 and a portion (peripheral portion) 15 that is located in a position that does not overlap with the first inspection portion 12 when viewed along the first direction Z.

[0017] As shown in FIGS. 2 and 3, the first inspection unit 12 is configured so that the inspection object 100 is positioned therein in the closed state. In this embodiment, the first inspection unit 12 is located approximately in the center of the first surface 111. The first inspection unit 12 is configured as a recess that opens to the first surface 111 and is recessed in a direction away from the second member 20 in the closed state. The first inspection unit 12 is configured so that at least a portion of the inspection object 100 can be accommodated therein. For example, as will be described later with reference to FIG. 6B, the first inspection unit 12 is a recess formed by the opposing surface 131a of the first biasing portion 13 and a side wall 141s of the first base portion 11 (first housing 14).

[0018] The first biasing portion 13 is configured to bias the first inspection portion 12 in the first direction Z from the first member 10 toward the second member 20. Therefore, the first inspection portion 12 is movable in the first direction Z relative to the first surface 111 (peripheral portion 15 of the first surface 111). Details of the first biasing portion 13 will be described later.

[0019] The second base portion 21 has a second inspection portion 22 and a second biasing portion 23. In the present embodiment, the second base portion 21 has a third surface 211 that faces the first member 10 in the closed state. The third surface 211 extends, for example, along the XY plane in the closed state. In the closed state, the third surface 211 is configured to contact the first surface 111 of the first member 10. The third surface 211 is provided with the second inspection portion 22. The third surface 211 includes a portion that constitutes the second inspection portion 22 and a peripheral portion 25 that is located in a position that does not overlap the second inspection portion 22 when viewed along the first direction Z.

[0020] As shown in FIG. 2, the second inspection unit 22 faces the first inspection unit 12 in the closed state, and is configured to be able to hold the inspection object 100 together with the first inspection unit 12. In this embodiment, the second inspection unit 22 is located approximately in the center of the third surface 211. The second inspection unit 22 is configured as a recess that opens to the third surface 211 and is recessed in a direction away from the first member 10 in the closed state. The second inspection unit 22 is configured to be able to accommodate at least a part of the inspection object 100. As will be described later with reference to FIGS. 7B to 7D, the second inspection unit 22 is, for example, a recess formed in a surface of the second biasing unit 23 (second floating member 231) that faces the first member 10.

[0021] The second biasing portion 23 is configured to bias the second inspection portion 22 in the first direction Z, from the second member 20 toward the first member 10. Therefore, the second inspection portion 22 is movable in the first direction Z relative to the third surface 211 (peripheral portion 25 of the third surface 211). The second biasing portion 23 will be described in detail later.

[0022] The second urging portion 23 is configured to have a greater urging force than the first urging portion 13. More specifically, the set load of the second urging portion 23 is greater than the set load of the first urging portion 13. In this embodiment, the first urging portion 13 has a first elastic member 132, and the second urging portion 23 has a second elastic member 232. The second elastic member 232 is configured to have a set load greater than the set load of the first elastic member 132.

[0023] When the inspection socket 1 is in a closed state, as shown in FIG. 2 , the first urging portion 13 is configured to contact the inspection object 100. The first urging portion 13 does not have to contact, for example, a peripheral portion 25 of the third surface 211 of the first base portion 11. This allows the urging force of the first urging portion 13 to be applied only to the inspection object 100. On the other hand, the second urging portion 23 is configured to contact, for example, both the inspection object 100 and the peripheral portion 15 of the first surface 111. This allows the urging force of the second urging portion 23 to be distributed and applied to the inspection object 100 and the first base portion 11 (for example, the first housing 14 described below). As described above, the second urging portion 23 has a larger urging force than the first urging portion 13. Therefore, even when the urging force of the first urging portion 13 is applied to the inspection object 100, the second urging portion 23 can maintain contact with the first surface 111. With this configuration, the inspection object 100 can be held between the first and second urging parts 13 and 23 while the inclination of the inspection object 100 is controlled by the second urging part 23. In this specification, "contact" may mean direct contact with the inspection object 100 or indirect contact via another member.

[0024] 2, 4, and 5, the first base portion 11 further includes, for example, a first housing 14, and the first biasing portion 13 is attached to the first housing 14. The second base portion 21 further includes, for example, a second housing 24, and the second biasing portion 23 is attached to the second housing 24.

[0025] The first housing 14 has, for example, a substantially rectangular parallelepiped shape. The first housing 14 has an upper surface located at one end in the first direction Z and facing the second member 20, a lower surface located at the other end in the first direction Z, and a first opening 141 penetrating in the first direction Z. In this embodiment, the upper surface of the first housing 14 constitutes a peripheral portion 15 of the first surface 111, and the lower surface of the first housing 14 constitutes the second surface 112. The first opening 141 is provided at a position corresponding to the first inspection unit 12 when viewed from the first direction Z. As shown in FIG. 4, the first opening 141 is configured so that the first biasing unit 13 is located within the first opening 141. As shown in FIG. 6B, which will be described later, a side wall 141s of the first opening 141 has a step corresponding to a side portion of the first biasing unit 13, specifically, a side portion of the first floating member 131 and a first push member 133.

[0026] The second housing 24 has, for example, a substantially rectangular parallelepiped shape. The second housing 24 has a lower surface facing the first member 10 and a second opening 241 penetrating in the first direction Z. In this embodiment, the lower surface of the second housing 24 constitutes the peripheral portion 25 of the third surface 211. The second opening 241 is provided at a position corresponding to the second inspection portion 22 when viewed from the first direction Z. As shown in FIG. 4, the second opening 241 is configured so that the second biasing portion 23 is located within the second opening 241. As shown in FIG. 7B, which will be described later, a step is provided in a side wall 241s of the second opening 241 corresponding to a side portion of the second biasing portion 23, more specifically, a side portion of the second floating member 231 and the second push member 233.

[0027] As shown in FIGS. 3 and 4 , the first member 10 further includes a test pin 50, a pin recess 16, and a connection member 60. The pin recess 16 is, for example, a recess that opens to the first surface 111 and is recessed in a direction away from the second member 20 in the closed state. A portion of the test pin 50 is exposed to the outside at the bottom surface of the pin recess 16. Another portion of the test pin 50 is electrically connected to the connection member 60 ( FIG. 2 ). During testing, a connector of the test object 100 is fitted into the test pin 50. In the closed state, the connector of the test object 100 is pressed by a protrusion 27 provided on the third surface 211 of the second member 20, thereby establishing electrical conduction with the test pin 50 and electrically connecting to a measuring device external to the test socket 1 via the connection member 60 ( FIG. 2 ). Note that the connection member 60 is omitted in some drawings, such as FIG. 1 .

[0028] The second member 20 further includes, for example, a cover case 28 located on the opposite side of the second base portion 21 from the first member 10. The cover case 28 is configured to cover the second biasing portion 23 and the second housing 24.

[0029] A more specific configuration of the first biasing portion 13 in the inspection socket 1 will be described with reference to FIGS. 6A to 6C.

[0030] In this embodiment, the first biasing portion 13 has a first floating member 131 on which the first inspection portion 12 is positioned during inspection, a first elastic member 132, and a first push member 133.

[0031] The first elastic member 132 is disposed between the first floating member 131 and the first push member 133 in the first direction Z. The first elastic member 132 is, for example, a member that is expandable and contractible along the first direction Z. The first elastic member 132 includes, for example, a plurality of coil springs (four in this example). These coil springs are disposed at the four corners of the rectangular lower surface 131b of the first floating member 131, respectively.

[0032] The first floating member 131 has, for example, a substantially rectangular prism shape, and is biased by a first elastic member 132 in the first direction Z from the first member 10 toward the second member 20. The first floating member 131 is supported by the first housing 14 in a state in which it is movable relative to the upper surface of the first housing 14 (i.e., the peripheral portion 15 of the first surface 111).

[0033] The first floating member 131 has an opposing surface 131a located at one end in the first direction Z and facing the second member 20, and a lower surface 131b located at the other end in the first direction Z and facing the opposing surface 131a. The opposing surface 131a constitutes a part of the first inspection unit 12. The opposing surface 131a and the lower surface 131b extend, for example, along the first surface 111. In this example, the first floating member 131 has a flange portion on its periphery, and the lower surface 131b is the lower surface of the flange portion and is slightly larger than the opposing surface 131a. In this embodiment, the opposing surface 131a is located within the first opening 141 of the first housing 14. Therefore, the opposing surface 131a, together with a portion of the side wall 141s of the first opening 141 located closer to the second member 20 than the opposing surface 131a, constitutes a recess (first inspection unit 12) in which a part of the inspection object 100 is accommodated in the closed state.

[0034] 6C, a substantially cylindrical first spring recess 1311 is provided at each of the four corners of the lower surface 131b of the first floating member 131. Each first spring recess 1311 is configured to accommodate a portion of a corresponding coil spring.

[0035] The first push member 133 is, for example, in the shape of a substantially rectangular plate. The first push member 133 is configured to hold the first elastic member 132 between itself and the first floating member 131. The first push member 133 is attached to the first housing 14. Four second spring recesses 1331 are provided on the top surface of the first push member 133 (the surface facing the first floating member 131). Each second spring recess 1331 is positioned so as to correspond to one of the first spring recesses 1311 of the first floating member 131. The second spring recesses 1331, together with the corresponding first spring recess 1311, form a substantially cylindrical spring accommodating section for accommodating a spring.

[0036] A more specific configuration of the second biasing portion 23 in the inspection socket 1 will be described with reference to FIGS. 7A to 7D and 8. FIG.

[0037] In this embodiment, the second biasing portion 23 has a second floating member 231 that faces the first member 10 in the closed state, a second elastic member 232, and a second push member 233.

[0038] The second elastic member 232 is disposed between the second floating member 231 and the second push member 233 in the first direction Z. The second elastic member 232 is, for example, a member that is expandable and contractible along the first direction Z. The second elastic member 232 includes, for example, a plurality of coil springs (four in this example). These coil springs are disposed at the four corners of the rectangular upper surface 231b of the second floating member 231. In this embodiment, the spring constant of the coil spring of the second elastic member 232 is greater than the spring constant of the coil spring of the first elastic member 132. This allows the biasing force of the second biasing portion 23 to be greater than the biasing force of the first biasing portion 13.

[0039] The second floating member 231 is biased by the second elastic member 232 in the first direction Z, from the second member 20 toward the first member 10. The second floating member 231 is supported by the second housing 24 in a state in which it is movable relative to the lower surface of the second housing 24 (i.e., the peripheral portion 25 of the third surface 211).

[0040] The second floating member 231 has a plate-shaped first portion p1 and a second portion p2 that protrudes from the first portion p1 toward the first member 10 in the closed state. A substantially circular opening 2312 capable of accommodating a lens portion of an optical module is provided approximately in the center of the first portion p1. The opening 2312 penetrates the first portion p1 in the first direction Z. The second floating member 231 further has a third portion p3 located radially outward from the second portion p2.

[0041] The first portion p1 is configured so that the second inspection unit 22 is located therein. In other words, the first portion p1 is configured so as to come into contact with the inspection object 100 in the closed state. The first portion p1 extends along the third surface 211. Although it depends on the shape of the optical module, the first portion p1 surrounds the opening 2312 when viewed along the first direction Z.

[0042] The second portion p2 is configured to protrude from the first portion p1 toward the first member 10 in the closed state and to come into contact with the first base portion 11 (for example, the first surface 111). In this embodiment, the second portion p2 surrounds the first portion p1. The second portion p2 has a contact surface 231c that faces the first member 10 in the closed state, and is configured to come into contact with the first surface 111 via the contact surface 231c. The second portion p2 is provided, for example, along the opening 2312. The second portion p2 is, for example, an annular convex portion whose apex is the contact surface 231c.

[0043] A surface 231a that can come into contact with the inspection object 100 in a closed state is provided between the opening 2312 of the first portion p1 and the second portion p2. A surface 231s that constitutes a part of the second inspection unit 22 is provided at a portion that faces the second portion p2 in the radial direction.

[0044] 7C, first spring recesses 2311, each having a cylindrical shape, are provided at each of the four corners of the top surface 231b of the second floating member 231 that faces the second push member 233. Each first spring recess 2311 is configured to accommodate a portion of a corresponding coil spring. When viewed from the first direction Z, the first spring recesses 2311 are arranged to overlap the second portion p2, for example.

[0045] The second push member 233 is, for example, in the shape of a substantially rectangular plate. The second push member 233 is configured to hold the second elastic member 232 between itself and the second floating member 231. The second push member 233 is attached to the second housing 24. Four second spring recesses 2331 are provided on the surface of the second push member 233 that faces the upper surface 231b of the second floating member 231. Each second spring recess 2331 is positioned so as to correspond to one of the first spring recesses 2311 of the second floating member 231. Each second spring recess 2331, together with the corresponding first spring recess 2311, constitutes a spring accommodating portion for accommodating a spring.

[0046] 7C, the second spring recess 2331 may include a cylindrical bottom c1 and a tapered opening c2 whose diameter increases from the bottom c1 toward the opening. The maximum diameter (the diameter closest to the second floating member 231) of the opening c2 of the second spring recess 2331 is larger than the diameter of the corresponding cylindrical first spring recess 2311. This allows the second spring recess 2331 and the first spring recess 2311 to form a spring accommodating section even when the second floating member 231 is tilted with respect to the second push member 233 (see FIG. 10).

[0047] FIG. 8 is a schematic plan view showing an example of the positional relationship between the second floating member 231 and the first inspection portion 12 of the first biasing portion 13. The first inspection portion 12 includes, for example, the opposing surface 131a of the first floating member 131 (see FIG. 6B). In this embodiment, in the closed state, when viewed along the first direction Z, the first inspection portion 12 at least partially overlaps with the first portion p1 of the second floating member 231. That is, when viewed along the first direction Z, the first inspection portion 12 and the second inspection portion 22 at least partially overlap. The first inspection portion 12 is also positioned so as not to overlap with the second portion p2 of the second floating member 231 when viewed along the first direction Z. When viewed along the first direction Z, the first inspection portion 12 is, for example, surrounded by the second portion p2.

[0048] 8, it is possible to apply the biasing force of the second biasing unit 23 to both the inspection object 100 and the first surface 111, and to apply the biasing force of the first biasing unit 13 only to the inspection object 100. When the first inspection unit 12 is arranged as shown in FIG. 8, in the closed state, the inspection object 100 located in the first inspection unit 12 can be brought into contact with the first portion p1 (second inspection unit 22) by the biasing force of the first biasing unit 13, while maintaining contact between the second portion p2 of the second biasing unit 23 and the first surface 111. Therefore, it is possible to hold the inspection object 100 between the first inspection unit 12 and the second inspection unit 22, while managing the tilt of the inspection object 100 by the second biasing unit 23.

[0049] The inspection socket 1 of this embodiment is configured so as to be able to inspect an optical module shown in FIG. 9 as an object 100 to be inspected.

[0050] The optical module shown in FIG. 9 includes a main body 103 including a holder 101 and a lens 102, a connector, and a flexible printed circuit board (FPC). The connector and flexible printed circuit board are omitted from FIGS. 3 and 9. The holder 101 has, for example, a substantially polygonal prism shape. The holder 101 has an upper surface 101a on which the lens 102 is provided and a lower surface 101b opposite the upper surface 101a. The upper surface 101a is perpendicular to the optical axis L of the lens 102 and can serve as a reference surface for managing the posture of the optical module during inspection. The lens 102 has, for example, a cylindrical shape that protrudes in the normal direction from the upper surface 101a of the holder 101. The main body 103 is connected to the flexible printed circuit board together with the connector. In the closed state, the connector of the optical module is electrically connected to an inspection pin 50 provided on the first base 11.

[0051] The first inspection unit 12 and the second inspection unit 22 are configured to accommodate the main body 103 of the optical module in the closed state. More specifically, as shown in FIG. 2 , in the closed state, the opposing surface 131a of the first biasing unit 13 (first floating member 131) is configured to contact the lower surface 101b of the holder unit 101. Also, the first portion p1 of the second biasing unit 23 (second floating member 231) is configured to contact the upper surface 101a of the holder unit 101. The second portion p2 is in contact with the first surface 111. By the second biasing unit 23 contacting both the upper surface 101a and the first surface 111 of the holder unit 101, the inclination of the upper surface 101a of the holder unit 101 with respect to the first surface 111 can be easily controlled. For example, the inspection socket 1 can regulate the upper surface 101a of the holder unit 101 to be parallel to or flush with the first surface 111. Therefore, the optical module can be easily held in the closed inspection socket 1 in a position where the optical axis L of the lens portion 102 is perpendicular to the first surface 111.

[0052] The lens opening 26 is configured so that the lens portion 102 of the optical module is located within the lens opening 26 in the closed state. Therefore, inspection can be performed with the lens portion 102 exposed on the upper surface of the inspection socket 1. The second elastic member 232 is located around the lens opening 26 when viewed along the first direction Z, for example. This allows a biasing force to be applied to the holder portion 101 located around the lens portion 102.

[0053] The test socket 1 can provide the following effects:

[0054] The inspection socket 1 includes a first member 10 and a second member 20. The first member 10 includes a first base portion 11 having a first inspection portion 12 configured to accommodate an inspection object 100 in the closed state and a first biasing portion 13. The first biasing portion 13 is configured to bias the first inspection portion 12 in a first direction from the first member toward the second member. The second member 20 includes a second base portion 21 having a second inspection portion 22 configured to face the first inspection portion 12 in the closed state and to be able to hold the inspection object 100 together with the first inspection portion 12, and a second biasing portion 23. The second biasing portion 23 is configured to bias the second inspection portion 22 in the first direction Z from the second member 20 toward the first member 10. The second biasing portion 23 is configured to exert a greater biasing force than the first biasing portion 13. According to this configuration, the presence of the first urging portion 13 and the second urging portion 23 makes it possible to manage the inclination of the inspection object 100, and the inspection object 100 can be easily held in a position that allows inspection.

[0055] To more accurately inspect an object under test, such as an optical module, it is necessary to perform the inspection while the object under test is held in an orientation that allows inspection within the inspection socket. For example, during inspection, an optical module is required to be held in a state where flatness is maintained, specifically, with the optical axis of the lens unit perpendicular to a horizontal plane (e.g., the second surface 112 of the inspection socket 1). However, depending on the shape and installation method of the object under test 100, it may be difficult to hold the object under test in an orientation that allows inspection within the inspection socket 1. For example, the bottom surface of the optical module (the surface opposite the lens unit) may not be formed so as to be perpendicular to the optical axis of the lens unit, making it difficult to control the tilt of the optical module. To address this issue, it is possible to strictly control the dimensional tolerance of the inspection socket so that the object under test can be held in a predetermined orientation. However, strict dimensional control of the inspection socket increases the number of inspection processes when manufacturing the inspection socket, which may increase manufacturing costs. Furthermore, this may reduce the yield of the inspection socket and increase the unit price of the inspection socket.

[0056] According to the inspection socket 1 of this embodiment, the inclination of the inspection object 100 can be controlled by the first biasing portion 13 and the second biasing portion 23, which has a biasing force greater than that of the first biasing portion 13. Therefore, in the closed state, the inspection object 100 can be held in a posture that allows inspection. As a result, the inspection of the inspection object 100 can be performed more accurately. Furthermore, the posture of the inspection object can be controlled with a simple configuration without imposing strict dimensional control on the inspection socket 1. Therefore, it is possible to provide an inspection socket 1 that is less expensive and has high productivity.

[0057] The test socket 1 can optionally employ one or more of the following configurations. That is, if one or more of the following configurations are included in the above-described embodiment, they can be optionally deleted, and if they are not included in the above-described embodiment, they can be optionally added.

[0058] In the closed state, the first surface 111 includes a peripheral portion 15 that is located at a position that does not overlap the first inspection unit 12 when viewed along the first direction Z, and the second biasing unit 23 is configured to come into contact with the inspection object 100 and the peripheral portion 15 on the first surface 111. With this configuration, it is possible to manage the inclination of the inspection object 100 relative to the first surface 111. For example, even if the second member 20 is inclined relative to the first member 10 due to the shape of the inspection object 100 or the like, it is possible to hold the inspection object 100 in a position that allows inspection.

[0059] For example, in the inspection socket 1 shown in FIG. 10, the second member 20 is inclined relative to the first member 10 in the closed state. More specifically, the third surface 211 is inclined relative to the first surface 111, and a gap g is generated between the first member 10 and the second member 20 at the end on the latch 42 side. Even in such a case, the second urging portion 23 is in contact with the first surface 111, so the inclination of the second urging portion 23 relative to the first surface 111 is corrected. For example, the inclination of the second urging portion 23 can be corrected so that the contact surface 231c of the second urging portion 23 is parallel to or flush with the first surface 111. Accordingly, the inclination of the inspection object 100 can also be corrected. Furthermore, if the surface 231a of the second force applying portion 23 that can contact the test object 100 and the contact surface 231c are parallel or flush, the test object 100 can be held so that the reference surface of the test object 100 (in Figure 9, the upper surface 101a of the holder portion 101) and the first surface 111 are parallel or flush.

[0060] The first surface 111 and the second surface 112 of the first base portion 11 are configured to be parallel to each other. With this configuration, for example, even if the second member 20 is tilted with respect to the first member 10 as shown in Fig. 10, the posture of the inspection object 100 can be controlled with respect to the second surface 112 of the first base portion 11. Therefore, by placing the inspection socket 1 so that the second surface 112 is horizontal, the inspection object 100 can be easily held horizontally.

[0061] In the closed state, the second biasing portion 23 has a first portion p1 that extends along the third surface 211 and where the second inspection portion 22 is located, and a second portion p2 that is located around the first portion p1 in a direction intersecting the first direction Z. In the closed state, the second portion p2 protrudes from the first portion p1 toward the first member 10 and contacts the first base portion 11.

[0062] According to this configuration, in the closed state, the second portion p2 contacts the first base portion 11, so that the inclination of the second biasing portion 23 relative to the first base portion 11 can be controlled. As a result, the inclination of the second inspection portion 22 is controlled, so that the inspection object 100 can be held in a position that allows inspection. Also, in the closed state, the inspection object 100 can be stably held within the recess defined by the first portion p1 and the second portion p2. Furthermore, after the inspection object 100 is placed on the first member 10, when the inspection object 100 is covered with the second member 20 to achieve the closed state, the convex second portion p2 functions as a guide, making it possible to suppress inclination or displacement of the inspection object 100.

[0063] The second portion p2 surrounds the first portion p1. This configuration makes it possible to more accurately control the tilt of the second inspection unit 22. Also, the inspection object 100 can be more stably held on the second inspection unit 22.

[0064] In the closed state, the first inspection unit 12 is positioned so as not to overlap the second part p2 when viewed along the first direction Z (see FIG. 8). With this configuration, the inclination (posture) of the inspection object 100 can be controlled by the first part p1 and the second part p2, while the inspection object 100 can be held between the first inspection unit 12 and the second inspection unit 22 of the first part p1.

[0065] The first biasing portion 13 includes a first floating member 131 on which the first inspection portion 12 is located, and a first elastic member 132. The first floating member 131 is arranged on the second member 20 side of the first elastic member 132. The second biasing portion 23 includes a second floating member 231 on which the second inspection portion 22 is located, and a second elastic member 232. The second floating member 231 is arranged on the first member 10 side of the second elastic member 232.

[0066] The first base portion 11 has a recess configured to be able to accommodate at least a part of the inspection object 100 therein.

[0067] The object to be inspected 100 is an optical module having a lens portion 102, the second member 20 has a lens opening 26 at a position corresponding to the lens portion 102, and the second biasing portion 23 has at least one second elastic member 232, which is located around the lens opening 26.

[0068] Test socket 1 can also be configured as follows:

[0069] The shape and configuration of the first member 10 and the second member 20 can be changed as desired depending on the design of the inspection socket 1. For example, the shape of the inspection socket 1 in the closed state is not limited to a substantially rectangular parallelepiped shape, and may be a substantially cylindrical shape or a substantially polygonal prism shape.

[0070] The positional relationship between the first member 10 and the second member 20 during inspection is not limited to the relationship shown in the figure. The second member 20 having the second biasing portion 23 with a larger biasing force may be located lower than the first member 10 having the first biasing portion 13.

[0071] The first member 10 and the second member 20 may be configured in any manner to be able to assume the closed and open states.

[0072] 11A and 11B is a double-latch type in which the first member 10 has latches 42, 43 on two side surfaces facing each other in the second direction X. The first member 10 is removably attached to the second member 20.

[0073] The test socket 1 may be configured in any manner to remain closed, and may include retention means other than a latch.

[0074] The structure, shape, material, etc. of the first base portion 11 and the second base portion 21 can be changed as desired. For example, the structure, shape, material, etc. of the first housing 14, the second housing 24, the first urging portion 13, and the second urging portion 23 can be changed as desired.

[0075] The biasing forces of the first biasing portion 13 and the second biasing portion 23 can be adjusted by any method. When springs are used as the first elastic member 132 and the second elastic member 232, the biasing forces (set loads) of the first biasing portion 13 and the second biasing portion 23 can be adjusted by the spring constants of the springs, the number of springs, the installation positions of the springs, etc. As an example, the spring constant of the springs of the second biasing portion 23 may be greater than the spring constant of the springs of the first biasing portion 13. Alternatively, or in addition, the number of springs of the second biasing portion 23 may be greater than the number of springs of the first biasing portion 13. This allows the biasing force of the second biasing portion 23 to be greater than the biasing force of the first biasing portion 13.

[0076] The first urging section 13 and the second urging section 23 may not have floating members 131, 231, and may be configured so that the elastic member directly contacts the inspection object 100. Furthermore, the configuration for supporting the elastic member in the first urging section 13 and the second urging section 23 is not particularly limited. For example, the first urging section 13 and the second urging section 23 may not have push members 133, 233.

[0077] The structure of the second floating member 231 can also be changed as desired. Each of the first portion p1 to the third portion p3 can have any shape. The second floating member 231 does not necessarily have to have the third portion p3. In the illustrated example, the second portion p2 has a square shape surrounding the first portion p1 when viewed along the first direction Z, but it may have other shapes, such as a square or C shape. Alternatively, the second portion p2 may include multiple portions arranged with gaps between them so as to surround the first portion p1. In the illustrated example, the second floating member 231 has a step where the second portion p2 protrudes further toward the first member 10 than the first portion p1, but the first portion p1 may also have a step where the first portion p1 protrudes further toward the first member 10 than the second portion p2. For example, in the closed state, when the upper surface 101a of the object to be inspected 100 is positioned below the first surface 111 (towards the second surface 112), the first portion p1 may be configured to protrude toward the first member 10 more than the second portion p2 that contacts the first base portion 11, and to come into contact with the upper surface 101a of the object to be inspected 100.

[0078] Furthermore, the first portion p1 and the second portion p2 of the second floating member 231 of the second biasing unit 23 may not form a step. For example, the portion of the second floating member 231 that comes into contact with the inspection object 100 and the portion (contact surface) that comes into contact with the first surface 111 of the second biasing unit 23 may be flush with each other. Even in this case, similar to the positional relationship described above with reference to FIG. 8, the first inspection unit 12 may be arranged so as not to overlap with the contact surface of the second biasing unit 23 in the closed state when viewed along the first direction Z.

[0079] The structure, material, arrangement, etc. of the first elastic member 132 and the second elastic member 232 can also be changed as desired.

[0080] When springs are used as the first elastic member 132 and the second elastic member 232, the number, arrangement, type, size, etc. of the springs can be changed as desired depending on the design of the inspection socket 1, etc. The number of springs for one floating member may be, for example, two to four. By arranging two or more springs at a distance on the underside of the floating member, it is possible to bias the floating member in the first direction Z while keeping it horizontal (parallel to the XY plane). Furthermore, if the number of springs for one floating member is four or less, an increase in the number of parts can be suppressed.

[0081] The number of springs for the floating member may be one. For example, in the inspection socket 1 shown in Fig. 12, the first biasing portion 13 has a single coil spring as the first elastic member 132. Similarly, the second biasing portion 23 has a single coil spring as the second elastic member 232, the second elastic member 232 having a spring constant greater than that of the coil spring of the first biasing portion 13. In Fig. 12, the push member, cover case, etc. are omitted in order to show the first elastic member 132 and the second elastic member 232.

[0082] One or both of the first elastic member 132 and the second elastic member 232 may include a rubber member. The material, shape, and number of the rubber members are not particularly limited. One or both of the first elastic member 132 and the second elastic member 232 may include a plurality of columnar rubber members, or may include a single plate-shaped rubber member. When a plate-shaped rubber member is disposed as the first elastic member 132 or the second elastic member 232, the rubber member may be configured to directly contact the inspection object 100 without providing a separate floating member.

[0083] As an example, the first biasing portion 13 may include a spring as the first elastic member 132, and the second biasing portion 23 may include a rubber member as the second elastic member 232. With this configuration, it becomes easy to set the biasing force of the second biasing portion 23 to be greater than the biasing force of the first biasing portion 13.

[0084] The inspection socket 1 may be configured to be able to inspect an inspection target 100 other than the optical module shown in FIG.

[0085] For example, the inspection socket 1 shown in FIGS. 13A to 13C is configured to inspect a compound eye camera module having two lens units 102A and 102B. Each lens unit 102A and 102B is located on a corresponding holder unit 101A and 101B. The inspection socket 1 has two lens openings 26A and 26B corresponding to the lens units 102A and 102B. The first biasing unit 13 of the first member 10 includes two first floating members 131A and 131B spaced apart from each other and a single first pushing member 133. Each of the first floating members 131A and 131B is configured to contact the lower surface of the corresponding holder unit 101A and 101B. Meanwhile, the second biasing unit 23 of the second member 20 includes a single second floating member 231 and a single second pushing member 233. The second floating member 231 is configured to come into contact with the upper surfaces of the two holder parts 101A and 101B and the first surface 111 of the first base part 11.

[0086] The second biasing portion 23 may include two second floating members arranged at a distance from each other. Each second floating member may be configured to contact a corresponding one of the holder portions 101A and 101B. This allows the tilts of the holder portions 101A and 101B to be controlled independently of each other.

[0087] Furthermore, the inspection socket 1 is not limited to being used for optical modules, and may be configured to be used for inspecting other electronic modules such as IC packages and connectors, as well as for inspecting circuit boards. If the object under inspection does not have a lens portion, the inspection socket 1 does not need to be provided with a lens opening 26 corresponding to the lens portion. Furthermore, the posture of the object under inspection 100 held in the closed inspection socket 1 can be changed as desired depending on the type, structure, etc. of the object under inspection 100.

[0088] Various embodiments of the present disclosure have been described in detail above with reference to the drawings. Finally, various aspects of the present disclosure will be described. Note that in the following description, reference numerals will also be used as examples.

[0089] The test socket 1 according to the first embodiment of the present disclosure includes: An inspection socket 1 includes a first member 10 and a second member 20, the first member 10 and the second member 20 facing each other in a first direction Z, configured to be able to hold an inspection object 100 between the first member 10 and the second member 20, and capable of inspecting the inspection object 100 in a closed state in which the inspection object 100 is held by the first member 10 and the second member 20, The first member 10 is a first inspection unit 12 configured to accommodate the inspection target 100 in the closed state; a first base portion (11) having a first biasing portion (13) configured to bias the first inspection portion (12) in the first direction Z from the first member (10) toward the second member (20); The second member 20 is a second inspection unit (22) configured to face the first inspection unit (12) in the closed state and to be able to hold the inspection object (100) together with the first inspection unit (12); a second base portion (21) having a second biasing portion (23) that biases the second inspection portion (22) in the first direction Z from the second member (20) toward the first member (10); The second biasing portion 23 is configured so that the biasing force is greater than that of the first biasing portion 13.

[0090] The test socket 1 of the second embodiment of the present disclosure is the test socket 1 of the first embodiment, the first base portion 11 faces the second member 20 in the closed state and has a first surface 111 on which the first inspection portion 12 is provided; In the closed state, the second biasing portion 23 is configured to contact the object to be inspected 100 and a portion of the first surface 111 that is in a position that does not overlap with the first inspection portion 12 when viewed along the first direction Z.

[0091] The test socket 1 of the third aspect of the present disclosure is the test socket 1 of the second aspect, The first base portion 11 has a second surface 112 facing the first surface 111, The second surface 112 and the first surface 111 are configured to be parallel to each other.

[0092] The inspection socket 1 of a fourth aspect of the present disclosure is the inspection socket 1 of any one of the first to third aspects, the second base portion 21 faces the first member 10 in the closed state and has a third surface 211 on which the second inspection portion 22 is provided, In the closed state, The second biasing portion 23 has a first portion p1 extending along the third surface 211 and where the second inspection portion 22 is located, and a second portion p2 located around the first portion p1 in a direction intersecting the first direction, protruding from the first portion p1 toward the first member 10 and contacting the first base portion 11.

[0093] The test socket 1 of the fifth aspect of the present disclosure is the test socket 1 of the fourth aspect, The second portion p2 surrounds the first portion p1.

[0094] The test socket 1 of the sixth aspect of the present disclosure is the test socket 1 of the fourth or fifth aspect, In the closed state, when viewed along the first direction Z, the first inspection unit 12 is positioned so as not to overlap the second portion p2.

[0095] The inspection socket 1 of a seventh aspect of the present disclosure is the inspection socket 1 of any one of the first to sixth aspects, The first base portion 11 has a recess configured to be able to accommodate at least a part of the inspection object 100 therein.

[0096] The inspection socket 1 of an eighth aspect of the present disclosure is the inspection socket 1 of any one of the first to seventh aspects, The inspection object 100 is an optical module having a lens portion, The first member 10 has an opening 26 at a position corresponding to the lens portion, The first biasing portion 13 has at least one elastic member 132, The elastic member 132 is positioned around the opening 26 .

[0097] The inspection socket 1 of a ninth aspect of the present disclosure is the inspection socket 1 of any one of the first to eighth aspects, The first biasing portion 13 includes at least one first elastic member 132 and a first floating member 131 that is disposed on the second member 20 side of the first elastic member 132 and on which the first inspection portion 12 is located; The second biasing portion 23 includes at least one second elastic member 232 and a second floating member 231 that is arranged on the first member 10 side of the second elastic member 232 and on which the second inspection portion 22 is located.

[0098] The present disclosure allows any of the above-described various embodiments and modifications to be combined as appropriate. Combinations of embodiments and / or modifications include combinations of configurations included in the embodiments and / or configurations included in the examples.

[0099] The present disclosure has been fully described through the above-described embodiments and / or modifications with reference to the accompanying drawings, but the above-described embodiments and / or modifications do not cover all of the present disclosure. Many modifications and variations are possible for those skilled in the art in the technical field of the present disclosure. Such modifications and variations should be understood to be included in the present disclosure as long as they do not deviate from the scope of the present disclosure. [Industrial Applicability]

[0100] The test socket of the present disclosure can be applied to a test device used to test electronic modules such as optical modules, for example. [Explanation of symbols]

[0101] 1 Inspection socket 10 First member 11 First base part 12 First Inspection Department 13 First biasing section 14 First Housing 20 Second member 21 Second base part 22 Second Inspection Department 23 Second biasing section 24 Second Housing 26, 26A, 26B Lens openings 41 Rotating part 42, 43 Latch 100 Inspection object 101, 101A, 101B holder part 102, 102A, 102B Lens section 103 Main body 111 Page 1 112 Side 2 131, 131A, 131B First floating member 132 first elastic member 133 First push member 141 First Opening 211 Page 3 231 Second floating member 232 Second elastic member 233 Second push member 241 Second Opening p1 1st part p2 2nd part p3 3rd part

Claims

1. An inspection socket comprising a first member and a second member, the first member and the second member facing each other in a first direction, configured to be able to hold an inspection object between the first member and the second member, and capable of inspecting the inspection object in a closed state in which the inspection object is held by the first member and the second member, The first member is a first inspection unit configured so that the object to be inspected is positioned in the closed state; and a first biasing portion configured to bias the first inspection portion in the first direction from the first member toward the second member; a first base portion having a first surface facing the second member in the closed state and on which the first inspection portion is provided; The second member is a second inspection unit configured to face the first inspection unit in the closed state and to be able to hold the inspection object together with the first inspection unit; a second biasing portion that biases the second inspection portion in the first direction from the second member toward the first member; a second base portion having an opposing surface that faces the first member in the closed state and on which the second inspection portion is provided, the first biasing portion includes a first floating member on which the first inspection portion is located, and at least one first elastic member configured to bias the first floating member toward the second member, the first floating member is movable in the first direction relative to a first peripheral portion of the first surface that is located at a position that does not overlap with the first inspection portion when viewed along the first direction, the second biasing portion includes a second floating member on which the second inspection portion is located, and at least one second elastic member configured to bias the second floating member toward the first member, the second floating member is movable in the first direction relative to a second peripheral portion of the opposing surface that is located at a position that does not overlap with the second inspection portion when viewed along the first direction, the second floating member is configured to have a first portion that contacts the test object and a second portion that contacts the first peripheral portion in the closed state; The at least one second elastic member has a greater biasing force than the at least one first elastic member, and the at least one second elastic member and the at least one first elastic member are configured such that, in the closed state, the first portion of the second floating member is in contact with the object to be tested and the second portion is in contact with the first peripheral portion, and the first floating member biases the object to be tested toward the second member, thereby managing the inclination of the object to be tested.

2. the first base portion has a second surface opposite to the first surface, The test socket of claim 1 , wherein the second surface and the first surface are configured to be parallel.

3. In the closed state, 3. The inspection socket according to claim 1, wherein the first portion of the second floating member extends along the opposing surface and is a portion where the second inspection portion is located, and the second portion is a portion located around the first portion in a direction intersecting the first direction and protruding from the first portion toward the first member to contact the first peripheral portion.

4. 4. The test socket of claim 3, wherein the second portion surrounds the first portion.

5. The test socket according to claim 3 , wherein in the closed state, the first test portion is positioned so as not to overlap the second portion when viewed along the first direction.

6. 3. The test socket according to claim 1, wherein the first base portion has a recess configured to be able to accommodate at least a portion of the object under test.

7. the inspection object is an optical module having a lens unit, the first member has an opening at a position corresponding to the lens portion, The test socket of claim 1 or 2, wherein the at least one first resilient member is positioned around the opening.

8. the test socket further includes a test pin electrically connected to an external device; the object to be inspected comprises a main body and a connector portion for electrical connection to the inspection pin, the main body of the object to be inspected is placed in the first inspection unit and the second inspection unit; the second floating member contacts the main body of the object to be inspected in the closed state; In the closed state, the connector portion and the test pin are electrically connected at a position that does not overlap with either the first floating member or the second floating member when viewed along the first direction, a first surface of the first floating member opposite the second member having a rectangular shape; the at least one first elastic member includes four first elastic members arranged at respective corners of the first surface of the first floating member; a second surface of the second floating member opposite the first member is rectangular; 3. The test socket according to claim 1, wherein the at least one second elastic member includes four second elastic members disposed at each corner of the second surface of the second floating member.

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