Performance test method, terminal, first device, system, and storage medium

Abstract

The present disclosure provides a performance test method, a terminal, a first device, a system, and a storage medium. The method comprises: receiving first indication information sent by a first device, and a first reference signal corresponding to each beam in a beam subset; by means of an AI model, predicting a first measurement value corresponding to each beam in the beam set; sending first information to the first device; receiving second indication information sent by the first device on the basis of a changed mapping relationship, and a second reference signal corresponding to each beam in the beam set; and sending second information to the first device. In the present disclosure, the terminal needs to truthfully report related information of a predicted first beam and an actual measurement result, thereby improving the reliability of AI-based beam management and achieving high availability.

Description

Performance testing methods, terminals, first devices, systems, and storage media Technical Field

[0001] This disclosure relates to the field of communications, and more particularly to performance testing methods, terminals, first devices, systems, and storage media. Background Technology

[0002] Beam management based on artificial intelligence (AI) refers to the process of effectively controlling and optimizing beam transmission and reception in wireless communication systems.

[0003] Summary of the Invention

[0004] To improve the reliability of AI-based beam management, embodiments of this disclosure provide a performance testing method, a terminal, a first device, a system, and a storage medium.

[0005] According to a first aspect of the present disclosure, a performance testing method is provided, the method being executed by a terminal, the method comprising:

[0006] The system receives first indication information sent by a first device, and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, and the mapping relationship is the mapping relationship between each beam in the beam subset and the first reference signal;

[0007] The first reference signal corresponding to each beam in the beam subset is measured, and based on the obtained first measurement value, the first measurement value corresponding to each beam in the beam subset is predicted by an artificial intelligence (AI) model.

[0008] Send first information to the first device; wherein the first information is information related to the first beam; wherein the first beam is a beam selected in the beam set according to the order of the first measurement value predicted by the AI ​​model from largest to smallest;

[0009] The system receives second indication information sent by the first device based on the modified mapping relationship, and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate the index of each second reference signal;

[0010] For each of the second reference signals, a measurement is performed, and based on the obtained second measurement value, second information is sent to the first device; wherein the second information is information related to the third reference signal, which is a second reference signal selected in descending order of the second measurement values.

[0011] According to a second aspect of the present disclosure, a performance testing method is provided, the method being executed by a first device, the method comprising:

[0012] Send a first indication message and a first reference signal corresponding to each beam in the beam subset; wherein the first indication message is used to indicate a mapping relationship, the mapping relationship being the mapping relationship between each beam in the beam subset and the first reference signal;

[0013] Receive first information; wherein the first information is information related to the first beam; wherein the first beam is the beam selected by the terminal in the beam set by the first measurement value predicted by the artificial intelligence AI model in descending order;

[0014] Based on the modified mapping relationship, a second indication information and a second reference signal corresponding to each beam in the beam set are sent; wherein, the second indication information is used to indicate the index of each second reference signal;

[0015] Receive second information; wherein the second information is information related to the third reference signal, the third reference signal being the second measurement value obtained by the terminal for each of the second reference signals, and the second reference signals selected in descending order;

[0016] Based on the first information and the second information, the performance of the AI ​​model on the terminal is tested.

[0017] According to a third aspect of the present disclosure, a terminal is provided, comprising:

[0018] The transceiver module is configured to receive first indication information sent by the first device, and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, the mapping relationship being the mapping relationship between each beam in the beam subset and the first reference signal;

[0019] The processing module is configured to measure the first reference signal corresponding to each beam in the beam subset, and based on the obtained first measurement value, predict the first measurement value corresponding to each beam in the beam subset using an artificial intelligence (AI) model.

[0020] The transceiver module is further configured to send first information to the first device; wherein the first information is information related to the first beam; wherein the first beam is a beam selected within the beam set in descending order of the first measurement value predicted by the AI ​​model;

[0021] The transceiver module is further configured to receive second indication information sent by the first device based on the modified mapping relationship, and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate the index of each second reference signal;

[0022] The transceiver module is further configured to measure each of the second reference signals and send second information to the first device based on the obtained second measurement value; wherein the second information is information related to the third reference signal, and the third reference signal is a second reference signal selected in descending order of the second measurement values.

[0023] According to a fourth aspect of the present disclosure, a first device is provided, comprising:

[0024] The transceiver module is configured to transmit first indication information and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, the mapping relationship being the mapping relationship between each beam in the beam subset and the first reference signal;

[0025] The transceiver module is further configured to receive first information; wherein the first information is information related to a first beam; wherein the first beam is the beam selected by the terminal in the beam set by the first measurement value predicted by the artificial intelligence AI model in descending order;

[0026] The transceiver module is also configured to send second indication information and a second reference signal corresponding to each beam in the beam set based on the modified mapping relationship; wherein the second indication information is used to indicate the index of each second reference signal;

[0027] The transceiver module is further configured to receive second information; wherein the second information is information related to a third reference signal, the third reference signal being a second measurement value obtained by the terminal for each second reference signal, and the second reference signals selected in descending order;

[0028] The processing module is configured to perform performance testing on the AI ​​model on the terminal based on the first information and the second information.

[0029] According to a fifth aspect of the present disclosure, a terminal is provided, comprising:

[0030] One or more processors;

[0031] The processor is used to execute the performance testing method described in any one of the first aspects.

[0032] According to a sixth aspect of the present disclosure, a first device is provided, comprising:

[0033] One or more processors;

[0034] The processor is used to execute the performance testing method described in any one of the second aspects.

[0035] According to a seventh aspect of the present disclosure, a communication system is provided, comprising:

[0036] A terminal, the terminal being configured to implement the performance testing method described in any one of the first aspects;

[0037] A first device is configured to implement the performance testing method described in any one of the second aspects.

[0038] According to an eighth aspect of the present disclosure, a storage medium is provided that stores instructions which, when executed on an electronic device, cause the electronic device to perform a performance testing method as described in any one of the first or second aspects.

[0039] According to a ninth aspect of the present disclosure, a computer program product is provided, including a computer program that, when executed by a processor, is used to implement the performance testing method described in any one of the first or second aspects.

[0040] In this embodiment of the disclosure, when the first device sends the second reference signal corresponding to the beam set, it changes the mapping relationship, and the terminal cannot obtain the changed mapping relationship. This requires the terminal to truthfully report the relevant information of the predicted first beam and the actual measurement results, which improves the reliability and availability of AI-based beam management.

[0041] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0042] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0043] Figure 1A is an exemplary schematic diagram of the architecture of a communication system provided according to an embodiment of the present disclosure.

[0044] Figure 1B is a schematic diagram of an exemplary scenario of duration provided according to an embodiment of the present disclosure.

[0045] Figure 2 is an exemplary interactive schematic diagram of a performance testing method provided according to an embodiment of the present disclosure.

[0046] Figure 3A is one of the exemplary flowcharts of a performance testing method provided according to an embodiment of the present disclosure.

[0047] Figure 3B is a second exemplary flowchart of a performance testing method provided according to an embodiment of the present disclosure.

[0048] Figure 3C is a third exemplary flowchart of a performance testing method provided according to an embodiment of the present disclosure.

[0049] Figure 3D is a fourth exemplary flowchart of a performance testing method provided according to an embodiment of the present disclosure.

[0050] Figure 4A is an exemplary flowchart of an AI model performance test provided according to an embodiment of the present disclosure.

[0051] Figure 4B is one of the exemplary scenario diagrams of the mapping relationship provided according to the embodiments of this disclosure.

[0052] Figure 4C is a second exemplary scenario diagram of the mapping relationship provided according to an embodiment of the present disclosure.

[0053] Figure 4D is an exemplary scenario diagram of the modified mapping relationship provided according to an embodiment of the present disclosure.

[0054] Figure 5A is an exemplary block diagram of a terminal provided according to an embodiment of the present disclosure.

[0055] Figure 5B is an exemplary block diagram of a first device provided according to an embodiment of the present disclosure.

[0056] Figure 6A is an exemplary interactive schematic diagram of a communication device provided according to an embodiment of the present disclosure.

[0057] Figure 6B is an exemplary interactive schematic diagram of a chip provided according to an embodiment of the present disclosure. Detailed Implementation

[0058] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numerals in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Rather, they are merely examples of apparatuses and methods consistent with some aspects of the invention as detailed in the appended claims.

[0059] This disclosure provides a performance testing method, a terminal, a first device, a system, and a storage medium.

[0060] In a first aspect, embodiments of this disclosure propose a performance testing method, executed by a terminal, the method comprising: receiving first indication information sent by a first device, and a first reference signal corresponding to each beam in a beam subset; wherein the first indication information is used to indicate a mapping relationship, the mapping relationship being a mapping relationship between each beam in the beam subset and the first reference signal; measuring the first reference signal corresponding to each beam in the beam subset, and based on the obtained first measurement value, predicting the first measurement value corresponding to each beam in the beam subset using an artificial intelligence (AI) model; and sending first information to the first device; wherein the first information is related to the first beam... The relevant information includes: the first beam being selected within the beam set in descending order of the first measured values ​​predicted by the AI ​​model; receiving second indication information sent by the first device based on the modified mapping relationship, and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate the index of each second reference signal; measuring each second reference signal, and sending second information to the first device based on the obtained second measured value; wherein the second information is related to a third reference signal, which is a second reference signal selected in descending order of the second measured values.

[0061] In conjunction with some embodiments of the first aspect, in some embodiments, the first indication information is used to indicate at least one of the following: the index of each beam in the beam set, and the index of the first reference signal corresponding to each beam in the beam set; the index of each first reference signal; and the index of the mapping relationship.

[0062] In conjunction with some embodiments of the first aspect, in some embodiments, the method further includes any one of the following: determining the mapping relationship based on the index of the mapping relationship; determining the mapping relationship based on a predefined method and the index of each of the first reference signals.

[0063] In conjunction with some embodiments of the first aspect, in some embodiments, the first information includes at least one of the following: an index of each first beam; an index of the first reference signal corresponding to each first beam; and the first measurement value corresponding to each first beam.

[0064] In conjunction with some embodiments of the first aspect, in some embodiments, the second information includes at least one of the following: an index of each of the third reference signals; and the second measurement value corresponding to each of the third reference signals.

[0065] Secondly, embodiments of this disclosure propose a performance testing method, executed by a first device, the method comprising: sending first indication information and a first reference signal corresponding to each beam in a beam subset; wherein the first indication information is used to indicate a mapping relationship, the mapping relationship being a mapping relationship between each beam in the beam subset and the first reference signal; receiving first information; wherein the first information is information related to the first beam; wherein the first beam is a beam selected by the terminal in the beam subset by the first measurement value predicted by an artificial intelligence (AI) model in descending order; based on the modified mapping relationship, sending second indication information and a second reference signal corresponding to each beam in the beam subset; wherein the second indication information is used to indicate the index of each second reference signal; receiving second information; wherein the second information is information related to a third reference signal, the third reference signal being a second measurement value obtained by the terminal measuring each second reference signal, selected by the terminal in descending order; and performing performance testing on the AI ​​model on the terminal based on the first information and the second information.

[0066] In conjunction with some embodiments of the second aspect, in some embodiments, the first indication information is used to indicate at least one of the following: the index of each beam in the beam set, and the index of the first reference signal corresponding to each beam in the beam set; the index of each first reference signal; and the index of the mapping relationship.

[0067] In conjunction with some embodiments of the second aspect, in some embodiments, the first information includes at least one of the following: an index of each first beam; an index of the first reference signal corresponding to each first beam; and the first measurement value corresponding to each first beam.

[0068] In conjunction with some embodiments of the second aspect, in some embodiments, the second information includes at least one of the following: an index of each of the third reference signals; and the second measurement value corresponding to each of the third reference signals.

[0069] In conjunction with some embodiments of the second aspect, in some embodiments, the performance testing of the AI ​​model on the terminal based on the first information and the second information includes at least one of the following: the first information includes the index of each first beam, the second information includes the index of each third reference signal, and based on the modified mapping relationship, the index of each second beam corresponding to the index of each third reference signal is determined; the performance testing of the AI ​​model on the terminal is performed based on the index of each first beam and the index of each second beam.

[0070] In conjunction with some embodiments of the second aspect, in some embodiments, the performance testing of the AI ​​model on the terminal based on the first information and the second information includes at least one of the following: the first information includes the index of the first reference signal corresponding to each first beam, the second information includes the index of each third reference signal, the index of the first beam corresponding to each index of the first reference signal is determined based on the mapping relationship, and the index of each second beam corresponding to each index of the third reference signal is determined based on the modified mapping relationship; the performance testing of the AI ​​model on the terminal is performed based on the index of each first beam and the index of each second beam.

[0071] In conjunction with some embodiments of the second aspect, in some embodiments, the performance test of the AI ​​model on the terminal based on the index of each first beam and the index of each second beam includes: determining a first ratio of the first number of times to the total number of times; wherein, the first number of times is the number of times the index of the second beam is the same as the index of the first beam; if the first ratio is greater than or equal to a first value, the performance test result of the AI ​​model is determined to be passed; or if the first ratio is less than the first value, the performance test result of the AI ​​model is determined to be failed.

[0072] In conjunction with some embodiments of the second aspect, in some embodiments, the performance test of the AI ​​model on the terminal based on the first information and the second information includes at least one of the following: the first information includes the first measurement value corresponding to each first beam, the second information includes the second measurement value corresponding to each third reference signal, determining the difference between each second measurement value and the corresponding first measurement value; determining a second ratio of the second number to the total number of times; wherein the second number of times is the number of times the difference is less than or equal to the second value; if the second ratio is greater than or equal to the third value, the performance test result of the AI ​​model is determined to be passed; or if the second ratio is less than the third value, the performance test result of the AI ​​model is determined to be failed. Thirdly, embodiments of this disclosure provide a terminal, comprising: a transceiver module configured to receive first indication information sent by a first device, and a first reference signal corresponding to each beam in a beam subset; wherein the first indication information is used to indicate a mapping relationship, the mapping relationship being a mapping relationship between each beam in the beam subset and the first reference signal; a processing module configured to measure the first reference signal corresponding to each beam in the beam subset, and based on the obtained first measurement value, predict the first measurement value corresponding to each beam in the beam subset using an artificial intelligence (AI) model; the transceiver module is further configured to send first information to the first device; wherein the first information is information related to a first beam. The first beam is selected within the beam set in descending order of the first measured values ​​predicted by the AI ​​model. The transceiver module is further configured to receive second indication information sent by the first device based on the modified mapping relationship, and a second reference signal corresponding to each beam in the beam set. The second indication information is used to indicate the index of each second reference signal. The transceiver module is further configured to measure each second reference signal and send second information to the first device based on the obtained second measured value. The second information is related to a third reference signal, which is a second reference signal selected in descending order of the second measured values.

[0073] Fourthly, embodiments of this disclosure propose a first device, comprising: a transceiver module configured to transmit first indication information and a first reference signal corresponding to each beam in a beam subset; wherein the first indication information is used to indicate a mapping relationship, the mapping relationship being a mapping relationship between each beam in the beam subset and the first reference signal; the transceiver module is further configured to receive first information; wherein the first information is information related to a first beam; wherein the first beam is a beam selected by the terminal in the beam subset by the first measurement value predicted by an artificial intelligence (AI) model in descending order; the transceiver module further... The transceiver module is configured to send second indication information and a second reference signal corresponding to each beam in the beam set based on the modified mapping relationship; wherein the second indication information is used to indicate the index of each second reference signal; the transceiver module is also configured to receive second information; wherein the second information is information related to a third reference signal, the third reference signal being a second measurement value obtained by the terminal for each second reference signal, and the second reference signals selected in descending order; the processing module is configured to perform performance testing on the AI ​​model on the terminal based on the first information and the second information.

[0074] Fifthly, embodiments of this disclosure provide a terminal comprising: one or more processors; wherein the processors are configured to execute the performance testing method described in any one of the first aspects.

[0075] In a sixth aspect, embodiments of this disclosure provide a first device comprising: one or more processors; wherein the processors are configured to perform the performance testing method described in any one of the second aspects.

[0076] In a seventh aspect, embodiments of this disclosure provide a communication system comprising: a terminal configured to implement the performance testing method described in any one of the first aspects; and a first device configured to implement the performance testing method described in any one of the second aspects.

[0077] Eighthly, embodiments of this disclosure provide a storage medium storing instructions that, when executed on an electronic device, cause the electronic device to perform a performance testing method as described in any one of the first or second aspects.

[0078] In a ninth aspect, embodiments of this disclosure provide a computer program product, including a computer program that, when executed by a processor, is used to implement the performance testing method described in any one of the first or second aspects.

[0079] In a tenth aspect, embodiments of this disclosure provide a chip or chip system. The chip or chip system includes processing circuitry configured to perform the method described according to an optional implementation of the first or second aspect above.

[0080] It is understood that the aforementioned terminal, first device, communication system, storage medium, computer program product, chip, or chip system are all used to execute the methods proposed in the embodiments of this disclosure. Therefore, the beneficial effects that can be achieved can be referred to the beneficial effects in the corresponding methods, and will not be repeated here.

[0081] This disclosure provides the invention title. In some embodiments, the terms performance testing method and communication method, information transmission method, etc., can be used interchangeably; the terms beam measurement device and communication device, information transmission device, etc., can be used interchangeably; and the terms communication system, beam measurement system, information transmission system, etc., can be used interchangeably.

[0082] This disclosure is not exhaustive, but merely illustrative of some embodiments, and is not intended to limit the scope of protection of this disclosure. Unless otherwise specified, each step in a particular embodiment can be implemented as an independent embodiment, and the steps can be arbitrarily combined. For example, a solution after removing some steps in a particular embodiment can also be implemented as an independent embodiment, and the order of the steps in a particular embodiment can be arbitrarily interchanged. Furthermore, the optional implementation methods in a particular embodiment can be arbitrarily combined; moreover, the embodiments can be arbitrarily combined, for example, some or all steps of different embodiments can be arbitrarily combined, and a particular embodiment can be arbitrarily combined with the optional implementation methods of other embodiments.

[0083] In each of the disclosed embodiments, unless otherwise specified or in case of logical conflict, the terminology and / or descriptions of the embodiments are consistent and can be referenced by each other. Technical features in different embodiments can be combined to form new embodiments based on their inherent logical relationships.

[0084] The terminology used in the embodiments of this disclosure is for the purpose of describing particular embodiments only and is not intended to limit the scope of this disclosure.

[0085] In this embodiment of the disclosure, unless otherwise stated, elements expressed in the singular form, such as "a," "an," "the," "the," "the," "the," "the," "the," "this," etc., can mean "one and only one," or "one or more," "at least one," etc. For example, when using articles such as "a," "an," "the," etc. in translation, the noun following the article can be understood as either a singular expression or a plural expression.

[0086] In the embodiments disclosed herein, "multiple" refers to two or more.

[0087] In some embodiments, the terms “at least one of”, “one or more”, “a plurality of”, “multiple”, etc., may be used interchangeably.

[0088] In some embodiments, the notation "at least one of A and B", "A and / or B", "A in one case, B in another", "in response to one case A, in response to another case B", etc., may include the following technical solutions depending on the situation: in some embodiments, A (execute A regardless of B); in some embodiments, B (execute B regardless of A); in some embodiments, execution is selected from A and B (A and B are selectively executed); in some embodiments, A and B (both A and B are executed). The same applies when there are more branches such as A, B, C, etc.

[0089] In some embodiments, the notation "A or B" may include the following technical solutions, depending on the situation: in some embodiments, A (execution of A regardless of B); in some embodiments, B (execution of B regardless of A); in some embodiments, execution is selected from A and B (A and B are selectively executed). The same applies when there are more branches such as A, B, C, etc.

[0090] The prefixes "first," "second," etc., used in the embodiments of this disclosure are merely for distinguishing different descriptive objects and do not impose restrictions on the position, order, priority, quantity, or content of the descriptive objects. The description of the descriptive objects is found in the claims or the context of the embodiments, and the use of prefixes should not constitute unnecessary restrictions. For example, if the descriptive object is a "field," the ordinal numbers preceding "field" in "first field" and "second field" do not restrict the position or order of the "fields." "First" and "second" do not restrict whether the "fields" they modify are in the same message, nor do they restrict the order of "first field" and "second field." Similarly, if the descriptive object is a "level," the ordinal numbers preceding "level" in "first level" and "second level" do not restrict the priority between "levels." Furthermore, the number of descriptive objects is not limited by ordinal numbers and can be one or more. For example, in "first device," the number of "devices" can be one or more. Furthermore, the objects modified by different prefixes can be the same or different. For example, if the object being described is "device", then "first device" and "second device" can be the same device or different devices, and their types can be the same or different. Similarly, if the object being described is "information", then "first information" and "second information" can be the same information or different information, and their content can be the same or different.

[0091] In some embodiments, “including A,” “containing A,” “for indicating A,” and “carrying A” can be interpreted as directly carrying A or indirectly indicating A.

[0092] In some embodiments, the terms “in response to…”, “in response to determining…”, “in the case of…”, “when…”, “if…”, “if…”, etc., can be used interchangeably.

[0093] In some embodiments, the terms “greater than,” “greater than or equal to,” “not less than,” “more than,” “more than or equal to,” “not less than,” “higher than,” “higher than or equal to,” “not lower than,” and “above” can be used interchangeably, as can the terms “less than,” “less than or equal to,” “not greater than,” “less than,” “less than or equal to,” “not more than,” “lower than,” “lower than or equal to,” “not higher than,” and “below”.

[0094] In some embodiments, devices, etc., can be interpreted as physical or virtual, and their names are not limited to the names recorded in the embodiments. Terms such as “device”, “equipment”, “circuit”, “network element”, “node”, “function”, “unit”, “section”, “system”, “network”, “chip”, “chip system”, “entity”, and “subject” can be used interchangeably.

[0095] In some embodiments, the terms "terminal", "terminal device", "user equipment (UE)", "user terminal", "mobile station (MS)", "mobile terminal (MT)", "subscriber station", "mobile unit", "subscriber unit", "wireless unit", "remote unit", "mobile device", "wireless device", "wireless communication device", "remote device", "mobile subscriber station", "access terminal", "mobile terminal", "wireless terminal", "remote terminal", "handset", "user agent", "mobile client", and "client" can be used interchangeably.

[0096] In some embodiments, the terminal may be replaced by an access network device, a core network device, or a network device. In this case, the access network device, core network device, or network device may also be configured to have all or some of the functions of the terminal.

[0097] In some embodiments, the acquisition of data, information, etc., may comply with the laws and regulations of the country where the location is situated.

[0098] In some embodiments, data, information, etc., may be obtained with the user's consent.

[0099] Furthermore, each element, each row, or each column in the table of this disclosure can be implemented as an independent embodiment, and any combination of any element, any row, or any column can also be implemented as an independent embodiment.

[0100] Figure 1A is a schematic diagram of the architecture of a communication system according to an embodiment of the present disclosure.

[0101] As shown in Figure 1A, the communication system 100 includes a terminal 101 and a first device 102.

[0102] In some embodiments, terminal 101 includes, but is not limited to, at least one of the following: mobile phone, wearable device, Internet of Things device, car with communication function, smart car, tablet computer, computer with wireless transceiver function, virtual reality (VR) terminal device, augmented reality (AR) terminal device, wireless terminal device in industrial control, wireless terminal device in self-driving, wireless terminal device in remote medical surgery, wireless terminal device in smart grid, wireless terminal device in transportation safety, wireless terminal device in smart city, and wireless terminal device in smart home.

[0103] In some embodiments, an AI model is deployed on terminal 101, which can be used to predict the optimal beam.

[0104] In some embodiments, the first device 102 may be a test equipment (TE). The TE may be deployed separately and may be used to test the performance of the AI ​​model described above on the terminal 101.

[0105] In some embodiments, the first device 102 can be a network device, such as deploying TE on a network device so that the network device can test the performance of the AI ​​model on the terminal 101. The network device may include, but is not limited to, at least one of access network devices and core network devices.

[0106] In some embodiments, the access network device is, for example, a node or device that connects a terminal to a wireless network. The access network device may include, but is not limited to, at least one of the following in a 5G communication system: evolved Node B (eNB), next-generation eNB (ng-eNB), next-generation Node B (gNB), node B (NB), home node B (HNB), home evolved node B (HeNB), radio backhaul device, radio network controller (RNC), base station controller (BSC), base transceiver station (BTS), base band unit (BBU), mobile switching center, base station in a 6G communication system, open RAN, cloud RAN, base station in other communication systems, and access node in a Wi-Fi system.

[0107] In some embodiments, the technical solutions of this disclosure can be applied to the Open RAN architecture. In this case, the interfaces between or within access network devices involved in the embodiments of this disclosure can be transformed into internal interfaces of Open RAN. The processes and information interactions between these internal interfaces can be implemented by software or programs.

[0108] In some embodiments, the access network device may be composed of a central unit (CU) and a distributed unit (DU). The CU may also be called a control unit. The CU-DU structure can separate the protocol layer of the access network device. Some of the protocol layer functions are centrally controlled by the CU, while the remaining part or all of the protocol layer functions are distributed in the DU and centrally controlled by the CU. However, this is not the only possibility.

[0109] In some embodiments, the core network equipment may be a single device comprising multiple network elements, or it may be multiple devices or a group of devices, each comprising all or part of the multiple network elements. Network elements may be virtual or physical. The core network may include, for example, at least one of the Evolved Packet Core (EPC), 5G Core Network (5GCN), and Next Generation Core (NGC).

[0110] In some embodiments, the AI-based beam measurement management process may include:

[0111] First, the terminal performs measurements, and then the terminal predicts the optimal beam based on these measurements or results.

[0112] Among these, AI models can be used to predict the reference signal receiving power (RSRP) of the beam based on the above measurements or results, and the predictive performance of the AI ​​models needs to be evaluated.

[0113] The RSRP predicted by the AI ​​model will be compared with a reference RSRP, which can refer to either the ideal RSRP or the actual RSRP.

[0114] When determining the reference RSRP, for a multipath channel, the Layer 1 Reference Signal Receiving Power (L1-RSRP) will depend on many factors. If the first device 102 is aware of all these factors, then determining the reference L1-RSRP is feasible. These factors include:

[0115] - Channel spatial domain information, such as Angle of Arrival (AOA), Angle of Departure (DOA), Zenith Angle of Arrival (ZOA), Zenith Angle of Departure (ZOD), multipath power, etc.

[0116] - Channel time-domain information, such as direction of movement, speed, power, multipath delay, etc.

[0117] - Transmit (Tx) beamforming gain

[0118] - Information related to the terminal implementation, such as which reference signal (RS) is used for the receive (Rx) beamforming gain, etc.

[0119] In practice, the first device 102 is similar to a simulator, capable of knowing all channel model-related information and the implementation on the transmit Tx side, except for the terminal implementation. Among these factors, the first device 102 knows the channel space, time-domain information, and / or Tx beamforming gain; the unknown part is the terminal implementation, such as the Rx beamforming gain.

[0120] Since the first device 102 is unaware of the terminal's Rx beamforming gain, it is difficult for the first device 102 to know the actual ground conditions in advance. In this case, one possible way to determine the reference RSRP is for the terminal to measure the RSRP and report the actual measured RSRP value.

[0121] The AI-based beam measurement process is divided into two durations, such as duration 1 and duration 2, hereinafter referred to as T1 and T2.

[0122] For example, as shown in Figure 1B, during time period T1, terminal 101 will report the predicted best beam. During time period T2, terminal 101 will measure all beams and report the best measured beam. First device 102 can use the actually measured best beam as a reference and compare it with the predicted best beam, for example, comparing whether the predicted beam is the same as the reference beam.

[0123] Since both the predicted beam and the reference beam are reported by the terminal, if the terminal 101 fails to report truthfully, the first device 102 will also be unable to know, resulting in the first device 102's performance test result for the AI ​​model on the terminal 101 being "passed".

[0124] For example, suppose that during time period T1, terminal 101 reports that the predicted optimal RS index is 7. And during time period T2, after measuring all RSs, terminal 101 finds the optimal beam in RS#6. At this point, terminal 101 can report to first device 102 that the best measured RS index is 7. Since first device 102 does not know which beam is best, it will compare the two indices reported by terminal 101 at T1 and T2. If the two indices are the same, first device 102 will assume that the predicted optimal beam is correct.

[0125] Obviously, the reliability of AI-based beam management in the above process is low. Therefore, in order to improve its reliability, this disclosure provides the following performance testing method, terminal, first device, system and storage medium.

[0126] Figure 2 is an interactive schematic diagram of a performance testing method according to an embodiment of the present disclosure. As shown in Figure 2, the embodiments of the present disclosure relate to a performance testing method, which includes:

[0127] In step S2101, the first device 102 sends the first instruction information to the terminal 101.

[0128] In some embodiments, the first device 102 may be a separately deployed device for testing the performance of an AI model on the terminal 101.

[0129] In some embodiments, the first device 102 may be deployed on a network device, which then tests the performance of the AI ​​model on the terminal 101 during beam measurement.

[0130] In some embodiments, the AI ​​model deployed on terminal 101 can be used to perform optimal beam prediction.

[0131] In some embodiments, the first indication information may be used to indicate a mapping relationship.

[0132] In one example, the mapping relationship could be a mapping relationship between each beam in the beam set and the first reference signal.

[0133] In one example, the beam set includes the beams that need to be sent to terminal 101 when performing beam measurements.

[0134] In one example, there can be a one-to-one correspondence between the beam and the reference signal (RS).

[0135] For example, each beam will be transmitted via an RS.

[0136] In one example, this mapping could be used to identify a one-to-one mapping between each beam in beamset A and the first reference signal.

[0137] For example, the beam set includes beams #1 to #8, and the mapping relationship is as follows: beam #1 corresponds to RS#1, beam #2 corresponds to RS#2, beam #3 corresponds to RS#3, beam #4 corresponds to RS#4, beam #5 corresponds to RS#5, beam #6 corresponds to RS#6, beam #7 corresponds to RS#7, and beam #8 corresponds to RS#8.

[0138] For example, the first indication information can explicitly indicate the above mapping relationship.

[0139] Specifically, in one embodiment, the first indication information can directly indicate the index of each beam in the beam set, and the index of the first reference signal corresponding to each beam in the beam set.

[0140] For example, the first indication information sent by the first device 102 can indicate that: beam #1 corresponds to RS #1, beam #2 corresponds to RS #2, beam #3 corresponds to RS #3, beam #4 corresponds to RS #4, beam #5 corresponds to RS #5, beam #6 corresponds to RS #6, beam #7 corresponds to RS #7, and beam #8 corresponds to RS #8.

[0141] In another implementation, the first indication information may indicate the index of the mapping relationship.

[0142] Terminal 101 can determine the mapping relationship based on the index of the mapping relationship. The index table of the mapping relationship is shown in Table 1, for example.

[0143] Table 1

[0144] For example, assuming that the mapping relationship determined by the first device 102 is that beam #1 corresponds to RS #1, beam #2 corresponds to RS #4, beam #3 corresponds to RS #2, beam #4 corresponds to RS #3, beam #5 corresponds to RS #7, beam #6 corresponds to RS #8, beam #7 corresponds to RS #6, and beam #8 corresponds to RS #5, then based on Table 1, the first indication information sent by the first device 102 can indicate the index of the mapping relationship, and the index of the mapping relationship is 2.

[0145] For example, the first indication information may also only indicate the RS index, that is, the index of each of the first reference signals.

[0146] For example, the first indication information indicates that the index of the first RS signal includes 1, 2, ... 8. After receiving the information, terminal 101 can determine the above mapping relationship based on a predefined method.

[0147] In some embodiments, in order to save information resources, the first indication information may also be used to indicate the mapping relationship between the index of each beam in the beam subset B and the corresponding first reference signal.

[0148] In one example, beam subset B is a subset of beam set A, and beam subset B includes some or all of the beams in beam set A. For example, beam set A is {beam #1, beam #2, ..., beam #8}, and beam subset B can be {beam #1, beam #2, beam #5}.

[0149] For example, the first indication information can explicitly indicate the above mapping relationship.

[0150] Specifically, in one implementation, the first indication information may directly indicate the index of each beam in the beam subset B, and the index of the first reference signal corresponding to each beam in the beam subset B.

[0151] For example, beam subset B can be {beam #1, beam #2, beam #5}, where beam #1 has a mapping relationship with RS #1, beam #2 has a mapping relationship with RS #2, and beam #5 has a mapping relationship with RS #5. That is, beam #1 is transmitted through RS #1, beam #2 is transmitted through RS #2, and beam #5 is transmitted through RS #5. In this case, the first indication information can directly indicate the above mapping relationship.

[0152] In another implementation, the first indication information may indicate the index of the mapping relationship.

[0153] Terminal 101 can determine the mapping relationship based on the index of the mapping relationship. The index table of the mapping relationship is shown in Table 2, for example.

[0154] Table 2

[0155] The difference between Table 2 and Table 1 is that the mapping relationship in Table 1 is the mapping relationship between each beam in beam set A and the first RS, while the mapping relationship in Table 2 may only include the mapping relationship between each beam in beam subset B and the first RS.

[0156] For example, assuming that the mapping relationship determined by the first device 102 is that beam #1 corresponds to RS #1, beam #2 corresponds to RS #2, and beam #5 corresponds to RS #5, then based on Table 2, the first indication information sent by the first device 102 can indicate the index of the mapping relationship, and the index of the mapping relationship is 1.

[0157] In some embodiments, terminal 101 receives the first instruction information.

[0158] In step S2102, terminal 101 determines the mapping relationship.

[0159] In some embodiments, if the first indication information directly indicates the above mapping relationship, step S2102 may not be performed.

[0160] In some embodiments, the first indication information indicates an index of the mapping relationship, and the terminal 101 can determine the mapping relationship based on Table 1 or Table 2.

[0161] In some embodiments, the first indication information indicates the index of each first RS, and the terminal 101 can determine the mapping relationship based on a predefined method.

[0162] In one example, the beam index corresponding to the index of each RS can be agreed upon by the protocol. For example, if the index of the first RS includes 1, 2, and 5, then terminal 101 determines that beam #1 corresponds to RS #1, beam #2 corresponds to RS #2, and beam #5 corresponds to RS #5.

[0163] The above is merely an illustrative example, and all schemes by which terminal 101 determines the mapping relationship should fall within the protection scope of this disclosure.

[0164] In step S2103, the first device 102 sends a first reference signal corresponding to each beam in the beam subset to the terminal 101.

[0165] In some embodiments, the first device 102 sends a first reference signal corresponding to each beam in the beam subset B to the terminal 101.

[0166] For example, beam subset B includes beam #1, beam #2 and beam #5, which correspond to RS#1, RS#2 and RS#5 respectively. The first device 102 transmits beam #1 through RS#1, transmits beam #2 through RS#2 and transmits beam #5 through RS#5.

[0167] In some embodiments, terminal 101 receives a first reference signal corresponding to each beam of beam subset B.

[0168] In step S2104, terminal 101 measures each first reference signal to obtain a first measurement value.

[0169] In some embodiments, the first measurement value may be the RSRP value, specifically, the L1-RSRP value.

[0170] It is understood that the first measurement value may also be the Reference Signal Receiving Quality (RSRQ) value, the Signal to Interference plus Noise Ratio (SINR) value, etc., and this disclosure does not limit it.

[0171] In step S2105, terminal 101 predicts the first measurement value corresponding to each beam in the beam set using an AI model.

[0172] In some embodiments, the AI ​​model can be used for optimal beam prediction.

[0173] In some embodiments, the AI ​​model can predict a first measurement value corresponding to each beam in beam set A, for example, the AI ​​model can predict the RSRP value of each beam in beam set A.

[0174] In one example, the first measurement value corresponding to each beam in the subset B of the set measured by terminal 101 can be used as the input value of the AI ​​model to obtain the RSRP value of each beam in the predicted beam set A output by the AI ​​model.

[0175] In step S2106, terminal 101 sends first information to first device 102.

[0176] In some embodiments, the first information is information related to the first beam.

[0177] In one example, the first beam is a beam selected from beam set A in descending order of the predicted first measurement value.

[0178] For example, if the number of the first beam is 1, then the terminal 101 uses the RSRP value of each beam in the beam set A output by the AI ​​model as the first beam.

[0179] For example, if the number of first beams is K, where K is a positive integer greater than 1, then the RSRP values ​​of each beam in beam set A output by terminal 101 based on the AI ​​model are sorted in descending order, and the beams corresponding to the first K RSRP values ​​are selected as the K first beams.

[0180] The above is merely an illustrative example, and this disclosure does not limit the prediction methods of AI models.

[0181] In some embodiments, the first information may include, but is not limited to, at least one of the following:

[0182] Index of each of the first beams;

[0183] The index of the first reference signal corresponding to each of the first beams;

[0184] The first measurement value corresponding to each of the first beams.

[0185] In one example, the first information may include one or K indices of the first beam, where K is a positive integer greater than 1.

[0186] For example, the first information may indicate the indices of the K first beams in descending order of the first measurement values ​​of the first beam.

[0187] For example, the number of first beams is 3, and the indices of the first beams corresponding to the first measurement values ​​from largest to smallest are 7, 5, and 1, respectively. The first information can be sequentially indicated as 7, 5, and 1.

[0188] In one example, the first information may include the indices of the first RS corresponding to one or K first beams, where K is a positive integer greater than 1.

[0189] For example, if the number of the first beam is 1 and the index of the first beam is 7, and the index of the corresponding first RS is 6, then the first information may include the index 6 of the first RS.

[0190] For example, if the number of first beams is 3, and the indices of the first beams are 7, 5, and 1, and the indices of the corresponding first RSs are 6, 1, and 4, then the first information may include the indices of the first RSs 6, 1, and 4.

[0191] For example, the first information may indicate the indices of the K first RS in descending order of the first measurement values.

[0192] In one example, the first information may be the first measurement value corresponding to each of the first beams.

[0193] For example, if the number of the first beams is 1 and the maximum value of the first measurement is value #1, then the first information may include value #1.

[0194] For example, if the number of first beams is 3, and the three largest first measurement values ​​are value #1, value #2, and value #3, then the first information may include value #1, value #2, and value #3.

[0195] The above is merely an illustrative example, and this disclosure does not limit the content of the first information.

[0196] In some embodiments, the first device 102 receives first information.

[0197] In some embodiments, the name of the first information is not limited and can be interchanged with prediction result information, prediction information, etc.

[0198] Step S2107: The first device 102 changes the mapping relationship.

[0199] In some embodiments, after receiving the first information, the first device 102 may change the mapping relationship between each beam in the beam subset and the first reference signal.

[0200] For example, the previous mapping was beam #1 corresponding to RS #1, beam #2 corresponding to RS #2, ..., beam #8 corresponding to RS #8. The changed mapping could be: beam #1 corresponding to RS #1, beam #2 corresponding to RS #4, beam #3 corresponding to RS #2, beam #4 corresponding to RS #3, beam #5 corresponding to RS #7, beam #6 corresponding to RS #8, beam #7 corresponding to RS #6, and beam #8 corresponding to RS #5.

[0201] In step S2108, the first device 102 sends the second instruction information to the terminal 101.

[0202] In some embodiments, the second indication information may be used to indicate the index of the second reference signal corresponding to each beam in the beam set A after the mapping relationship has been changed.

[0203] In some embodiments, the first device 102 sends the second indication information based on the modified mapping relationship.

[0204] In this process, the first device 102 will not send the modified mapping relationship to the terminal 101, but will only send the index of the second reference signal to the terminal 101.

[0205] In some embodiments, terminal 101 receives second instruction information.

[0206] In step S2109, the first device 102 sends a second reference signal corresponding to each beam in the beam set to the terminal 101.

[0207] In some embodiments, the first device 102 sends each second reference signal based on the modified mapping relationship.

[0208] In some embodiments, terminal 101 receives the second reference signal. Each second reference signal corresponds to one beam.

[0209] In some embodiments, the transmission power, period, and other parameters of the second reference signal and the first reference signal may be the same or different, and this disclosure does not limit this.

[0210] In step S2110, terminal 101 measures each of the second reference signals to obtain a second measurement value.

[0211] In some embodiments, the terminal needs to measure each second reference signal to obtain a second measurement value, such as the RSRP value.

[0212] For example, the second reference signals include RS#1 to RS#8. Terminal 101 needs to measure each RS to obtain the RSRP value.

[0213] In step S2111, terminal 101 sends second information to first device 102.

[0214] In some embodiments, the second information is information related to the third reference signal.

[0215] The third reference signal is the second reference signal selected in descending order of the second measured values.

[0216] In some embodiments, the second information may include, but is not limited to, at least one of the following:

[0217] The index of each of the third reference signals;

[0218] The second measurement value corresponding to each of the third reference signals.

[0219] For example, the second information may include indices of one or K third reference signals.

[0220] For example, the second information may include RSRP values ​​corresponding to one or K third reference signals.

[0221] For example, the second information may include the indexes of one or K third reference signals, and the RSRP values ​​corresponding to one or K third reference signals.

[0222] In some embodiments, the first device 102 receives second information.

[0223] In some embodiments, the name of the second information is not limited and can be interchanged with measurement information, measurement result information, etc.

[0224] In step S2112, the first device 102 performs a performance test on the AI ​​model on the terminal 101 based on the first information and the second information.

[0225] In some embodiments, the first information includes an index of each first beam, and the second information includes an index of each third reference signal. The first device 102 can determine the index of the second beam corresponding to the index of each third reference signal based on the modified mapping relationship.

[0226] Furthermore, if the index of the second beam is the same as the index of the first beam, then the first count is incremented by 1. Here, the first count is the number of times the index of the second beam is the same as the index of the first beam, and the initial value of the first count is 0.

[0227] Furthermore, the first device 102 calculates the first ratio of the first count to the total number of counts.

[0228] If the first ratio is greater than or equal to the first value, the performance test result of the AI ​​model is determined to be passed.

[0229] If the first ratio is less than the first value, the performance test result of the AI ​​model is determined to be unsuccessful.

[0230] The first value can be agreed upon by the agreement or set by the first device 102, and this disclosure does not limit it.

[0231] In some embodiments, the first information includes an index of the first reference signal corresponding to each first beam, and the second information includes an index of the third reference signal. The first device 102 can determine the index of the first beam corresponding to each index of the first reference signal based on the unchanged mapping relationship, and determine the index of the second beam corresponding to each index of the third reference signal based on the changed mapping relationship.

[0232] Furthermore, if the index of the second beam is the same as the index of the first beam, then the first count is incremented by 1. Here, the first count is the number of times the index of the second beam is the same as the index of the first beam, and the initial value of the first count is 0.

[0233] Furthermore, the first device 102 calculates the first ratio of the first count to the total number of counts.

[0234] If the first ratio is greater than or equal to the first value, the performance test result of the AI ​​model is determined to be passed.

[0235] If the first ratio is less than the first value, the performance test result of the AI ​​model is determined to be unsuccessful.

[0236] The first value can be agreed upon by the agreement or set by the first device 102, and this disclosure does not limit it.

[0237] In some embodiments, the first information includes the first measurement value corresponding to each of the first beams, and the second information includes the second measurement value corresponding to each of the third reference signals. The first device 102 can calculate the difference between the second measurement value and the corresponding first measurement value. If the difference is greater than or equal to the second value, the second number is incremented by 1. The second number is the number of times the difference is less than or equal to the second value, and the initial value of the second number is 0.

[0238] Furthermore, the first device 102 calculates the second ratio of the second count to the total number of counts.

[0239] If the second ratio is greater than or equal to the second value, the performance test result of the AI ​​model is determined to be passed.

[0240] If the second ratio is less than the second value, the performance test result of the AI ​​model is determined to be unsuccessful.

[0241] The second value can be agreed upon by the agreement or set by the first device 102, and this disclosure does not limit it.

[0242] The above is merely an illustrative example, and this disclosure does not limit the scheme for testing the AI ​​model performance of the first device 102.

[0243] In some embodiments, the names of information, etc., are not limited to the names described in the embodiments. Terms such as "information", "message", "signal", "signaling", "report", "configuration", "indication", "instruction", "command", "channel", "parameter", "domain", "field", "symbol", "symbol", "codebook", "codeword", "codepoint", "bit", "data", "program", and "chip" can be used interchangeably.

[0244] In some embodiments, terms such as “moment,” “point in time,” “time,” and “time location” can be used interchangeably, as can terms such as “duration,” “segment,” “time window,” “window,” and “time.”

[0245] In some embodiments, “get,” “obtain,” “receive,” “transmit,” “bidirectional transmission,” and “send and / or receive” can be used interchangeably and can be interpreted as receiving from other entities, obtaining from protocols, obtaining from higher layers, obtaining through self-processing, or autonomous implementation, among other meanings.

[0246] In some embodiments, terms such as “send,” “transmit,” “report,” “distribute,” “transfer,” “bidirectional transmission,” “send and / or receive” can be used interchangeably.

[0247] The information transmission method involved in the embodiments of this disclosure may include at least one of steps S2101 to S2112. For example, step S2101 can be implemented as an independent embodiment, step S2102 can be implemented as an independent embodiment, step S2101+S2102 can be implemented as an independent embodiment, step S2103 can be implemented as an independent embodiment, step S2104 can be implemented as an independent embodiment, step S2103+S2104 can be implemented as an independent embodiment, step S2105 can be implemented as an independent embodiment, step S2106 can be implemented as an independent embodiment, and step S2105+S2106 can be implemented as an independent embodiment. As an independent embodiment, step S2107 can be implemented as an independent embodiment, step S2108 can be implemented as an independent embodiment, step S2109 can be implemented as an independent embodiment, step S2107+S2108+S2109 can be implemented as an independent embodiment, step S2110 can be implemented as an independent embodiment, step S2111 can be implemented as an independent embodiment, step S2110+S2111 can be implemented as an independent embodiment, step S2112 can be implemented as an independent embodiment, and steps S2101 to S2112 can be implemented as independent embodiments, but are not limited thereto.

[0248] In some embodiments, step S2102 is optional, and one or more of these steps may be omitted or substituted in different embodiments. For example, if the first indication information directly indicates the above mapping relationship, step S2102 may not be performed.

[0249] In some embodiments, step S2105 is optional, and one or more of these steps may be omitted or substituted in different embodiments. For example, if no AI model is deployed on terminal 101, step S2105 may not be executed.

[0250] In some embodiments, step S2112 is optional, and one or more of these steps may be omitted or substituted in different embodiments. For example, if the AI ​​model on the terminal is being tested by another entity, step S2112 may not be executed.

[0251] In some embodiments, steps S2101 to S2112 are optional, and one or more of these steps may be omitted or substituted in different embodiments.

[0252] In some embodiments, the execution order of steps S2101 to S2112 is not limited.

[0253] In the above embodiments, when the first device sends the second reference signal corresponding to the beam set, it changes the mapping relationship, and the terminal cannot obtain the changed mapping relationship. This requires the terminal to truthfully report the relevant information of the predicted first beam and the actual measurement results, which improves the reliability and availability of AI-based beam management.

[0254] Figure 3A is a flowchart illustrating a performance testing method according to an embodiment of the present disclosure. As shown in Figure 3A, this embodiment of the disclosure relates to a performance testing method, which is executed by terminal 101, and includes:

[0255] Step S3101: Obtain the first instruction information.

[0256] In some embodiments, the first indication information may be used to indicate a mapping relationship.

[0257] In one example, the mapping relationship could be a mapping relationship between each beam in the beam set and the first reference signal.

[0258] In one example, the mapping relationship could be a mapping relationship between each beam in the beam subset and the first reference signal.

[0259] In some embodiments, terminal 101 may obtain first instruction information from first device 102, but is not limited thereto, and may also receive first instruction information sent by other entities.

[0260] In some embodiments, terminal 101 obtains first instruction information as defined by the protocol.

[0261] In some embodiments, terminal 101 obtains first indication information from upper layer(s).

[0262] In some embodiments, the terminal 101 processes the information to obtain the first instruction information.

[0263] In some embodiments, step S3101 is omitted, and the terminal 101 autonomously implements the function indicated by the first instruction information, or the terminal 101 obtains the first instruction information based on predefined rules or protocol agreements, or the above function is a default or default setting.

[0264] In some embodiments, optional implementations of step S3101 can be found in optional implementations of step S2101 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0265] Step S3102: Determine the mapping relationship.

[0266] In some embodiments, optional implementations of step S3102 can be found in optional implementations of step S2102 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0267] Step S3103: Obtain the first reference signal.

[0268] In some embodiments, the terminal 101 acquires a first reference signal corresponding to each beam in the beam subset.

[0269] In some embodiments, terminal 101 may obtain a first reference signal from first device 102, but is not limited thereto, and may also receive a first reference signal sent by other entities.

[0270] In some embodiments, terminal 101 acquires a first reference signal defined by a protocol.

[0271] In some embodiments, terminal 101 obtains a first reference signal from upper layer(s).

[0272] In some embodiments, terminal 101 performs processing to obtain a first reference signal.

[0273] In some embodiments, step S3103 is omitted, and the terminal 101 autonomously implements the function indicated by the first reference signal, or the terminal 101 obtains the first reference signal based on predefined rules or protocol agreements, or the above function is a default or default setting.

[0274] In some embodiments, optional implementations of step S3103 can be found in optional implementations of step S2103 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0275] Step S3104: Determine the first measurement value.

[0276] In some embodiments, optional implementations of step S3104 can be found in optional implementations of step S2104 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0277] Step S3105: Predict the first measurement value.

[0278] In some embodiments, optional implementations of step S3105 can be found in optional implementations of step S2105 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0279] Step S3106: Send the first message.

[0280] In some embodiments, the first information is information related to the first beam.

[0281] In one example, the first beam is a beam selected from beam set A in descending order of the predicted first measurement value.

[0282] In some embodiments, terminal 101 sends first information to first device 102.

[0283] In some embodiments, the first device 102 receives first information.

[0284] In some embodiments, optional implementations of step S3106 can be found in optional implementations of step S2106 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0285] Step S3107: Obtain the second instruction information.

[0286] In some embodiments, the second indication information may be used to indicate the index of the second reference signal corresponding to each beam in the beam set A after the mapping relationship has been changed.

[0287] In some embodiments, terminal 101 may obtain second instruction information from first device 102, but is not limited thereto, and may also receive second instruction information sent by other entities.

[0288] In some embodiments, terminal 101 obtains second instruction information as defined by the protocol.

[0289] In some embodiments, terminal 101 obtains second indication information from upper layer(s).

[0290] In some embodiments, the terminal 101 processes the information to obtain the second instruction information.

[0291] In some embodiments, step S3107 is omitted, and the terminal 101 autonomously implements the function indicated by the second instruction information, or the terminal 101 obtains the second instruction information based on predefined rules or protocol agreements, or the above function is a default or default setting.

[0292] In some embodiments, optional implementations of step S3107 can be found in optional implementations of step S2108 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0293] Step S3108: Obtain the second reference signal.

[0294] In some embodiments, the terminal 101 acquires a second reference signal corresponding to each beam in the beam set.

[0295] In some embodiments, terminal 101 may obtain a second reference signal from first device 102, but is not limited thereto, and may also receive a second reference signal sent by other entities.

[0296] In some embodiments, terminal 101 acquires a second reference signal defined by a protocol.

[0297] In some embodiments, terminal 101 obtains a second reference signal from upper layer(s).

[0298] In some embodiments, terminal 101 performs processing to obtain a second reference signal.

[0299] In some embodiments, step S3108 is omitted, and the terminal 101 autonomously implements the function indicated by the second reference signal, or the terminal 101 obtains the second reference signal based on predefined rules or protocol agreements, or the above function is a default or default setting.

[0300] In some embodiments, optional implementations of step S3108 can be found in optional implementations of step S2109 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0301] Step S3109: Determine the second measurement value.

[0302] In some embodiments, optional implementations of step S3109 can be found in optional implementations of step S2110 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0303] Step S3110: Send the second message.

[0304] In some embodiments, the second information is information related to the third reference signal.

[0305] The third reference signal is the second reference signal selected in descending order of the second measured values.

[0306] In some embodiments, terminal 101 sends second information to first device 102.

[0307] In some embodiments, the first device 102 receives second information.

[0308] In some embodiments, optional implementations of step S3110 can be found in optional implementations of step S2111 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0309] In some embodiments, steps S3101 to S3111 are optional, and one or more of these steps may be omitted or substituted in different embodiments.

[0310] In some embodiments, the execution order of steps S3101 to S3111 is not limited.

[0311] In the above embodiments, the terminal cannot obtain the changed mapping relationship, which requires the terminal to truthfully report the relevant information of the predicted first beam and the actual measurement results, thereby improving the reliability and availability of AI-based beam management.

[0312] Figure 3B is a flowchart illustrating a performance testing method according to an embodiment of the present disclosure. As shown in Figure 3B, this embodiment of the disclosure relates to a performance testing method, which is executed by terminal 101, and includes:

[0313] Step S3201: Obtain the first indication information and the first reference signal.

[0314] In some embodiments, optional implementations of step S3201 can be found in step S2101 and step S2103 of FIG2, as well as other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0315] Step S3202: Predict the first measurement value.

[0316] In some embodiments, optional implementations of step S3202 can be found in optional implementations of steps S2104 and S2105 in FIG2, as well as other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0317] Step S3203: Send the first message.

[0318] In some embodiments, optional implementations of step S3203 can be found in optional implementations of step S2106 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0319] Step S3204: Obtain the second indication information and the second reference signal.

[0320] In some embodiments, optional implementations of step S3204 can be found in optional implementations of steps S2108 and S2109 in FIG2, as well as other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0321] Step S3205: Send the second message.

[0322] In some embodiments, optional implementations of step S3205 can be found in step S2110 and step S2111 of FIG2, as well as other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0323] In some embodiments, steps S3201 to S3205 are optional, and one or more of these steps may be omitted or substituted in different embodiments.

[0324] In some embodiments, the execution order of steps S3201 to S3205 is not limited.

[0325] In the above embodiments, the terminal cannot obtain the changed mapping relationship, which requires the terminal to truthfully report the relevant information of the predicted first beam and the actual measurement results, thereby improving the reliability and availability of AI-based beam management.

[0326] Figure 3C is a schematic flowchart illustrating a performance testing method according to an embodiment of the present disclosure. As shown in Figure 3C, this embodiment of the disclosure relates to a performance testing method, which is executed by a first device 102, and includes:

[0327] Step S3301: Send the first instruction information.

[0328] In some embodiments, the first indication information may be used to indicate a mapping relationship.

[0329] In one example, the mapping relationship could be a mapping relationship between each beam in the beam set and the first reference signal.

[0330] In one example, the mapping relationship could be a mapping relationship between each beam in the beam subset and the first reference signal.

[0331] In some embodiments, the first device 102 sends a first instruction message to the terminal 101.

[0332] In some embodiments, terminal 101 receives first instruction information.

[0333] In some embodiments, optional implementations of step S3301 can be found in optional implementations of step S2101 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0334] Step S3302: Send the first reference signal.

[0335] In some embodiments, the first device 102 transmits a first reference signal corresponding to each beam in the beam subset.

[0336] In some embodiments, the first device 102 sends a first reference signal to the terminal 101.

[0337] In some embodiments, terminal 101 receives a first reference signal.

[0338] In some embodiments, optional implementations of step S3302 can be found in optional implementations of step S2103 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0339] Step S3303: Obtain the first information.

[0340] In some embodiments, the first information is information related to the first beam.

[0341] In one example, the first beam is a beam selected from beam set A in descending order of the predicted first measurement value.

[0342] In some embodiments, the first device 102 may obtain first information from the terminal 101, but is not limited thereto, and may also receive first information sent by other entities.

[0343] In some embodiments, the first device 102 acquires first information as defined by a protocol.

[0344] In some embodiments, the first device 102 obtains first information from the upper layer(s).

[0345] In some embodiments, the first device 102 processes information to obtain first information.

[0346] In some embodiments, step S3303 is omitted, the first device 102 autonomously implements the function indicated by the first information, or the first device 102 obtains the first information based on predefined rules or protocol agreements, or the above function is a default or default setting.

[0347] In some embodiments, optional implementations of step S3303 can be found in optional implementations of step S2106 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0348] Step S3304: Change the mapping relationship.

[0349] In some embodiments, optional implementations of step S3304 can be found in optional implementations of step S2107 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0350] Step S3305: Send the second instruction information.

[0351] In some embodiments, the second indication information may be used to indicate the index of the second reference signal corresponding to each beam in the beam set A after the mapping relationship has been changed.

[0352] In some embodiments, the first device 102 sends a second instruction message to the terminal 101.

[0353] In some embodiments, terminal 101 receives second instruction information.

[0354] In some embodiments, optional implementations of step S3304 can be found in optional implementations of step S2108 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0355] Step S3306: Send the second reference signal.

[0356] In some embodiments, the first device 102 transmits a second reference signal corresponding to each beam in the beam set.

[0357] In some embodiments, the first device 102 sends a second reference signal to the terminal 101.

[0358] In some embodiments, terminal 101 receives a second reference signal.

[0359] In some embodiments, optional implementations of step S3306 can be found in optional implementations of step S2109 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0360] Step S3307: Obtain the second information.

[0361] In some embodiments, the second information is information related to the third reference signal.

[0362] The third reference signal is the second reference signal selected in descending order of the second measured values.

[0363] In some embodiments, the first device 102 may obtain second information from the terminal 101, but is not limited thereto, and may also receive second information sent by other entities.

[0364] In some embodiments, the first device 102 acquires second information as defined by the protocol.

[0365] In some embodiments, the first device 102 obtains second information from the upper layer(s).

[0366] In some embodiments, the first device 102 processes the information to obtain the second information.

[0367] In some embodiments, step S3307 is omitted, the first device 102 autonomously implements the function indicated by the second information, or the first device 102 obtains the second information based on predefined rules or protocol agreements, or the above function is a default or default setting.

[0368] In some embodiments, optional implementations of step S3307 can be found in optional implementations of step S2111 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0369] Step S3308: Perform performance testing.

[0370] In some embodiments, optional implementations of step S3308 can be found in optional implementations of step S2112 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0371] In some embodiments, steps S3301 to S3308 are optional, and one or more of these steps may be omitted or substituted in different embodiments.

[0372] In some embodiments, the execution order of steps S3301 to S3308 is not limited.

[0373] In the above embodiments, the first device does not send the changed mapping relationship to the terminal, so that the terminal needs to truthfully report the relevant information of the predicted first beam and the actual measurement results, which improves the reliability and availability of AI-based beam management.

[0374] Figure 3D is a flowchart illustrating a performance testing method according to an embodiment of the present disclosure. As shown in Figure 3D, the present disclosure relates to a performance testing method, which is executed by a first device 102, and includes:

[0375] Step S3401: Send the first instruction information and the first reference signal.

[0376] In some embodiments, the first device 102 sends a first instruction message and a first reference signal to the terminal 101.

[0377] In some embodiments, terminal 101 receives first instruction information and a first reference signal.

[0378] In some embodiments, optional implementations of step S3401 can be found in step S2101 and step S2103 of FIG2, as well as other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0379] Step S3402: Obtain the first information.

[0380] In some embodiments, optional implementations of step S3402 can be found in optional implementations of step S2106 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0381] Step S3403: Send the second instruction information and the second reference signal.

[0382] In some embodiments, the first device 102 sends a second instruction message and a second reference signal to the terminal 101.

[0383] In some embodiments, terminal 101 receives second instruction information and a second reference signal.

[0384] In some embodiments, optional implementations of step S3403 can be found in optional implementations of steps S2108 and S2109 in FIG2, as well as other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0385] Step S3404: Obtain the second information.

[0386] In some embodiments, optional implementations of step S3404 can be found in optional implementations of step S2111 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0387] Step S3405: ​​Perform performance measurements.

[0388] In some embodiments, optional implementations of step S3405 can be found in optional implementations of step S2112 in FIG2 and other related parts in the embodiments involved in FIG2, which will not be repeated here.

[0389] In some embodiments, steps S3401 to S3405 are optional, and one or more of these steps may be omitted or substituted in different embodiments.

[0390] In some embodiments, the execution order of steps S3401 to S3405 is not limited.

[0391] In the above embodiments, the first device does not send the changed mapping relationship to the terminal, so that the terminal needs to truthfully report the relevant information of the predicted first beam and the actual measurement results, which improves the reliability and availability of AI-based beam management.

[0392] The above process is further illustrated with examples below.

[0393] 1. AI-based T1 and T2 beam management reports

[0394] During time period T1, the TE (the same device as the first device mentioned above) transmits multiple RSs corresponding to multiple beams in beam set B, where set B is a subset of set A. The terminal measures the L1-RSRP of beam set B and predicts the optimal beam in set A.

[0395] - Option 1: The terminal reports the RS index corresponding to 1 or K optimal beams to the TE.

[0396] - Option 2: The terminal reports the L1-RSRP corresponding to 1 or K best beams to the TE.

[0397] - Option 3: The terminal reports the RS index and L1-RSRP corresponding to 1 or K best beams to the TE.

[0398] During time slot T2, the TE transmits multiple RSs corresponding to multiple beams in beam set A. The terminal measures the L1-RSRP of all beams in set A, and the measured L1-RSRP is used as a reference. The terminal then reports. Several options are available:

[0399] - Option 1: The terminal reports the RS index corresponding to the largest 1 or K L1-RSRPs.

[0400] - Option 2: The terminal reports 1 or K optimal beams based on the RS index and the corresponding L1-RSRP.

[0401] - Option 3, the terminal reports L1-RSRP for all RS indices.

[0402] 2. Mapping between beam indices in set A and set B

[0403] - Option 1, explicitly provides a beam index set for set B.

[0404] For example, suppose set A has 8 beams, and 3 beams are selected for set B. For example, {beam #1, beam #2, beam #5} or {beam #3, beam #5, beam #8}.

[0405] - Option 2, implicitly provides a beam index for set B by defining a mapping table.

[0406] For example, if there are 8 beams, the mapping table would require a total of 3 bits. The reduced number of bits can also be defined by considering only partial cases.

[0407] 3. Mapping between RS index and beam index.

[0408] Each beam will be transmitted by one RS. This means that the TE will transmit different RSs through different beams. There is a mapping between beam indices and RS indices.

[0409] Among them, the beam index and RS index have the following two options:

[0410] - Option A: The mapping between the beam index and the RS index is explicit.

[0411] Option A-1 explicitly indicates both the beam index and the RS index to the terminal. There is a one-to-one mapping between the two indices.

[0412] For example, the beam index is {beam #1, beam #4, beam #8}. The RS index is {RS #1, RS #2, RS #3}. Beam #1 will be transmitted on RS #1, and beam #4 will be transmitted on RS #2.

[0413] Option A-2 explicitly indicates the RS index and beam RS mapping format index to the terminal.

[0414] For example, the RS index is {RS#1, RS#2, RS#3}. The beam RS mapping format is #1. Mapping index #1 means that {beam #1, beam #5, beam #8} will be transmitted on {RS#1, RS#2, RS#3}. Mapping index #2 means that {beam #2, beam #6, beam #8} will be transmitted on {RS#1, RS#2, RS#3}.

[0415] Option B indicates only the RS index to the terminal.

[0416] There is an implicit relationship between the beam index and the RS index.

[0417] For example, the RS index and beam index are aligned. For instance, beam #1 will be transmitted on RS #1, and beam #4 will be transmitted on RS #4.

[0418] 4. The performance testing process is shown in Figure 4A, and includes the following steps:

[0419] In step S4101, for T1, the TE indicates the RS index and beam index to the terminal. Alternatively, the TE will indicate the RS index and the mapping format index of the beam RS to the terminal. The TE will also indicate the beam pattern between set B and set A to the terminal.

[0420] The mapping relationship between the beam index and the RS index is shown in Figure 4B.

[0421] In step S4102, the terminal will perform L1-RSRP measurements on RS#1, RS#4 and RS#8 respectively.

[0422] The terminal can know the L1-RSRP of beam #1, beam #4 and beam #8, as shown in Figure 4C.

[0423] Step S4103: The terminal predicts the best beam in set A based on the L1-RSRP of the beams in set B.

[0424] In step S4104, the terminal will report the best beam index or RS index, or L1-RSRP, to the TE.

[0425] In step S4105, for T2, the TE retransmits all beams in set A on all RSs. The TE will configure the L1-RSRP of the RS index indicated by the terminal measurement and report the optimal beam RS index. The TE will change the mapping relationship between the RS index and the beam index.

[0426] For example, as shown in Figure 4D, to verify whether the terminal has reported the correct optimal beam index, in T2, the TE will retransmit all beams in set A on all RSs. The terminal will measure the L1-RSRP of all RSs and sort the L1-RSRPs. The terminal will then report the optimal RS index to the TE.

[0427] For T2, only the RS index will be indicated to the terminal, and the TE will change the mapping between the RS index and the beam index. For example, the RS index is {RS#1, RS#2, RS#3, RS#4, RS#5, RS#6, RS#7, RS#8}. The beam index is changed to {beam#5, beam#6, beam#7, beam#8, beam#1, beam#2, beam#3, beam#4}, and the mapping is shown in Figure 4C.

[0428] This means that beam #5 will be transmitted on RS #1, beam #6 will be transmitted on RS #2, beam #7 will be transmitted on RS #3, and so on.

[0429] Therefore, the terminal doesn't know which beam to transmit on which RS. The terminal will honestly measure the L1-RSRP of all RS indices. This allows the terminal to report truthfully. If the mapping hasn't changed, the terminal can easily pass the test, for reasons explained earlier. Suppose that in T1, the terminal reports the best predicted RS index as 7. And in T2, after measuring all RSs, the terminal finds the best beam in RS 6. However, the terminal can only report to the TE that the best measured RS index is 7. Therefore, in T2, the mapping between beam indices and RS indices will be different from T1.

[0430] In step S4106, the terminal measures all RSs and sorts the L1-RSRPs. The terminal reports the best RS index and / or L1-RSRP.

[0431] In step S4107, the TE calculates the corresponding optimal measurement beam index based on the mapping relationship between the RS index and the beam index. The TE compares the optimal measurement beam index reported in T2 with the optimal predicted beam index reported in T1. If they are equal, then the prediction is correct. If the terminal reports L1-RSRP in step S4104, the TE can also compare the L1-RSRP between the two steps in step S4107.

[0432] Step S4108: Repeat the test multiple times. If the prediction is correct in 90% of cases, or the L1-RSRP increment between two steps is less than the 90% threshold, the AI ​​model on the terminal passes the test.

[0433] This disclosure also provides embodiments of an apparatus for implementing any of the above methods. For example, an apparatus is provided that includes units or modules for implementing the steps performed by the terminal in any of the above methods. Furthermore, another apparatus is provided that includes units or modules for implementing the steps performed by the network device in any of the above methods.

[0434] It should be understood that the division of units or modules in the above device is only a logical functional division. In actual implementation, they can be fully or partially integrated into a single physical entity, or they can be physically separated. Furthermore, the units or modules in the device can be implemented by a processor calling software: for example, the device includes a processor connected to a memory containing instructions. The processor calls the instructions stored in the memory to implement any of the above methods or to implement the functions of the units or modules in the above device. The processor can be, for example, a general-purpose processor, such as a Central Processing Unit (CPU) or a microprocessor, and the memory can be internal or external to the device. Alternatively, the units or modules in the device can be implemented in the form of hardware circuits. The functionality of some or all of the units or modules can be achieved through the design of these hardware circuits, which can be understood as one or more processors. For example, in one implementation, the hardware circuit is an application-specific integrated circuit (ASIC). The functionality of some or all of the units or modules is achieved through the design of the logical relationships between the components within the circuit. In another implementation, the hardware circuit can be implemented using a programmable logic device (PLD). Taking a field-programmable gate array (FPGA) as an example, it can include a large number of logic gates. The connection relationships between the logic gates are configured through configuration files, thereby achieving the functionality of some or all of the units or modules. All units or modules of the above device can be implemented entirely through processor-called software, entirely through hardware circuits, or partially through processor-called software with the remaining parts implemented through hardware circuits.

[0435] In this embodiment, the processor is a circuit with signal processing capabilities. In one implementation, the processor can be a circuit with instruction read and execute capabilities, such as a Central Processing Unit (CPU), a microprocessor, a graphics processing unit (GPU) (which can be understood as a microprocessor), or a digital signal processor (DSP). In another implementation, the processor can implement certain functions through the logical relationships of hardware circuits. The logical relationships of the aforementioned hardware circuits are fixed or reconfigurable. For example, the processor is a hardware circuit implemented using an application-specific integrated circuit (ASIC) or a programmable logic device (PLD), such as an FPGA. In a reconfigurable hardware circuit, the process of the processor loading a configuration document and configuring the hardware circuit can be understood as the process of the processor loading instructions to implement the functions of some or all of the above units or modules. Furthermore, it can also be a hardware circuit designed for artificial intelligence, which can be understood as an ASIC, such as a Neural Network Processing Unit (NPU), a Tensor Processing Unit (TPU), or a Deep Learning Processing Unit (DPU).

[0436] Figure 5A is a schematic diagram of the structure of the terminal proposed in an embodiment of this disclosure. As shown in Figure 5A, the terminal 5100 may include: a transceiver module 5101 and a processing module 5102.

[0437] In some embodiments, the transceiver module 5101 is configured to receive first indication information sent by the first device, and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, the mapping relationship being the mapping relationship between each beam in the beam subset and the first reference signal.

[0438] In some embodiments, the processing module 5102 is configured to measure the first reference signal corresponding to each beam in the beam subset, and based on the obtained first measurement value, predict the first measurement value corresponding to each beam in the beam subset using an artificial intelligence (AI) model.

[0439] In some embodiments, the transceiver module 5101 is further configured to send first information to the first device; wherein the first information is information related to a first beam; wherein the first beam is a beam selected in the beam set in descending order of the first measurement values ​​predicted by the AI ​​model; receive second indication information sent by the first device based on a modified mapping relationship, and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate the index of each second reference signal; measure each second reference signal, and send second information to the first device based on the obtained second measurement value; wherein the second information is information related to a third reference signal, the third reference signal being a second reference signal selected in descending order of the second measurement values.

[0440] Optionally, the transceiver module 5101 is used to perform at least one of the communication steps such as sending and / or receiving performed by the terminal 5100 in any of the above methods (e.g., steps S2101, S2103, S2106, S2108, S2109, S2111, but not limited thereto), which will not be elaborated here.

[0441] Optionally, the processing module 5102 is used to execute at least one of the other communication steps (such as steps S2102, S2104, S2105, and S2110, but not limited thereto) executed by the terminal 5100 in any of the above methods, which will not be described in detail here.

[0442] Figure 5B is a schematic diagram of the structure of the first device proposed in an embodiment of this disclosure. As shown in Figure 5B, the first device 5200 may include: a transceiver module 5201 and a processing module 5202.

[0443] In some embodiments, the transceiver module 5201 is configured to transmit first indication information and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, the mapping relationship being the mapping relationship between each beam in the beam subset and the first reference signal.

[0444] In some embodiments, the transceiver module 5201 is further configured to receive first information; wherein the first information is information related to a first beam; wherein the first beam is a beam selected by the terminal in the beam set according to the order of the first measurement value predicted by the artificial intelligence AI model in descending order; based on the modified mapping relationship, send second indication information and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate the index of each second reference signal; receive second information; wherein the second information is information related to a third reference signal, the third reference signal is a second reference signal selected by the terminal in descending order of the second measurement value obtained by measuring each second reference signal.

[0445] In some embodiments, the processing module 5202 is configured to perform performance testing on the AI ​​model on the terminal based on the first information and the second information.

[0446] Optionally, the transceiver module 5201 is used to perform at least one of the sending and / or receiving communication steps performed by the first device 5200 in any of the above methods (e.g., steps S2101, S2103, S2106, S2108, S2109, S2111, but not limited thereto), which will not be elaborated here.

[0447] Optionally, the processing module 5202 is used to execute at least one of the other steps (such as step S2107, step S2112, but not limited thereto) executed by the first device 5200 in any of the above methods, which will not be described in detail here.

[0448] In some embodiments, the transmitting module and / or receiving module may be referred to as a transceiver module, which may be separate or integrated. Optionally, the transceiver module may be interchangeable with a transceiver.

[0449] In some embodiments, the processing module may be a single module or may include multiple sub-modules. Optionally, the multiple sub-modules may each perform all or part of the steps required by the processing module. Optionally, the processing module may be interchangeable with a processor.

[0450] Figure 6A is a schematic diagram of the structure of the communication device 6100 proposed in an embodiment of this disclosure. The communication device 6100 can be a terminal (e.g., user equipment, vehicle, IoT device, etc.) or a first device (e.g., test equipment, access network equipment, core network equipment, etc.), or it can be a chip, chip system, or processor that supports the terminal in implementing any of the above methods, or it can be a chip, chip system, or processor that supports the network device in implementing any of the above methods. The communication device 6100 can be used to implement the methods described in the above method embodiments; for details, please refer to the descriptions in the above method embodiments.

[0451] As shown in Figure 6A, the communication device 6100 includes one or more processors 6101. The processor 6101 can be a general-purpose processor or a dedicated processor, such as a baseband processor or a central processing unit (CPU). The baseband processor can be used to process communication protocols and communication data, while the CPU can be used to control communication devices (e.g., test equipment, base station, baseband chip, terminal equipment, terminal equipment chip, DU or CU, etc.), execute programs, and process program data. Optionally, the communication device 6100 can be used to execute any of the above methods. Optionally, one or more processors 6101 can be used to invoke instructions to cause the communication device 6100 to execute any of the above methods.

[0452] In some embodiments, the communication device 6100 further includes one or more transceivers 6102. When the communication device 6100 includes one or more transceivers 6102, the transceivers 6102 perform at least one of the communication steps such as sending and / or receiving in the above method (e.g., steps S2101, S2103, S2106, S2108, S2109, S2111, but not limited thereto), and the processor 7101 performs at least one of other steps (e.g., steps S2102, S2104, S2105, S2107, S2110, S2112, but not limited thereto). In optional embodiments, the transceivers may include a receiver and / or a transmitter, which may be separate or integrated together. Optionally, terms such as transceiver, transceiver unit, transceiver, transceiver circuit, interface circuit, and interface can be used interchangeably; terms such as transmitter, transmitting unit, transmitter, and transmitting circuit can be used interchangeably; and terms such as receiver, receiving unit, receiver, and receiving circuit can be used interchangeably.

[0453] In some embodiments, the communication device 6100 further includes one or more memories 6103 for storing data. Optionally, all or part of the memories 6103 may be located outside the communication device 6100. In optional embodiments, the communication device 6100 may include one or more interface circuits 6104. Optionally, the interface circuits 6104 are connected to the memories 6103 and can be used to receive data from the memories 6103 or other devices, and to send data to the memories 6103 or other devices. For example, the interface circuits 6104 can read data stored in the memories 6103 and send that data to the processor 6101.

[0454] The communication device 6100 described in the above embodiments may be a network device or a terminal, but the scope of the communication device 6100 described in this disclosure is not limited thereto, and the structure of the communication device 6100 may not be limited by FIG. 6A. The communication device may be a standalone device or a part of a larger device. For example, the communication device may be: (1) a standalone integrated circuit IC, or chip, or chip system or subsystem; (2) a collection of one or more ICs, optionally, the IC collection may also include storage components for storing data and programs; (3) an ASIC, such as a modem; (4) a module that can be embedded in other devices; (5) a receiver, terminal device, smart terminal device, cellular phone, wireless device, handheld device, mobile unit, vehicle device, network device, cloud device, artificial intelligence device, etc.; (6) others, etc.

[0455] Figure 6B is a schematic diagram of the structure of chip 6200 according to an embodiment of this disclosure. For cases where the communication device 6100 can be a chip or a chip system, please refer to the schematic diagram of chip 6200 shown in Figure 6B, but it is not limited thereto.

[0456] Chip 6200 includes one or more processors 6201. Chip 6200 is used to perform any of the methods described above.

[0457] In some embodiments, chip 6200 further includes one or more interface circuits 6202. Optionally, terms such as interface circuit, interface, and transceiver pin can be used interchangeably. In some embodiments, chip 6200 further includes one or more memories 6203 for storing data. Optionally, all or part of the memories 6203 may be located outside chip 6200. Optionally, interface circuit 6202 is connected to memory 6203, and interface circuit 6202 can be used to receive data from memory 6203 or other devices, and interface circuit 6202 can be used to send data to memory 6203 or other devices. For example, interface circuit 6202 can read data stored in memory 6203 and send the data to processor 6201.

[0458] In some embodiments, the interface circuit 6202 performs at least one of the communication steps such as sending and / or receiving in the above method (e.g., steps S2101, S2103, S2106, S2108, S2109, S2111, but not limited thereto). The interface circuit 6202 performing the communication steps such as sending and / or receiving in the above method refers, for example, to the interface circuit 6202 performing data interaction between the processor 6201, the chip 6200, the memory 6203, or the transceiver device. In some embodiments, the processor 6201 performs at least one of other steps (e.g., steps S2102, S2104, S2105, S2107, S2110, S2112, but not limited thereto).

[0459] The modules and / or devices described in the various embodiments, such as virtual devices, physical devices, and chips, can be combined or separated arbitrarily as needed. Optionally, some or all steps can also be performed collaboratively by multiple modules and / or devices, which is not limited here.

[0460] This disclosure also proposes a storage medium storing instructions that, when executed on the communication device 6100, cause the communication device 6100 to perform any of the above methods. Optionally, the storage medium is an electronic storage medium. Optionally, the storage medium is a computer-readable storage medium, but not limited thereto; it may also be a storage medium readable by other devices. Optionally, the storage medium may be a non-transitory storage medium, but not limited thereto; it may also be a temporary storage medium.

[0461] This disclosure also provides a program product that, when executed by the communication device 6100, causes the communication device 6100 to perform any of the above methods. Optionally, the program product is a computer program product.

[0462] This disclosure also proposes a computer program that, when run on a computer, causes the computer to perform any of the above methods.

[0463] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This disclosure is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the following claims.

[0464] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

Claims

1. A performance testing method, characterized in that, The method is executed by a terminal, and the method includes: The system receives first indication information sent by a first device, and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, and the mapping relationship is the mapping relationship between each beam in the beam subset and the first reference signal; The first reference signal corresponding to each beam in the beam subset is measured, and based on the obtained first measurement value, the first measurement value corresponding to each beam in the beam subset is predicted by an artificial intelligence (AI) model. Send first information to the first device; wherein the first information is information related to the first beam; wherein the first beam is a beam selected in the beam set according to the order of the first measurement value predicted by the AI ​​model from largest to smallest; The system receives second indication information sent by the first device based on the modified mapping relationship, and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate the index of each second reference signal; For each of the second reference signals, a measurement is performed, and based on the obtained second measurement value, second information is sent to the first device; wherein the second information is information related to the third reference signal, which is a second reference signal selected in descending order of the second measurement values.

2. The method according to claim 1, characterized in that, The first indication information is used to indicate at least one of the following: The index of each beam in the beam set, and the index of the first reference signal corresponding to each beam in the beam set; The index of each of the first reference signals; The index of the mapping relationship.

3. The method according to claim 2, characterized in that, The method further includes any one of the following: The mapping relationship is determined based on the index of the mapping relationship; The mapping relationship is determined based on a predefined method and the index of each of the first reference signals.

4. The method according to any one of claims 1-3, characterized in that, The first information includes at least one of the following: Index of each of the first beams; The index of the first reference signal corresponding to each of the first beams; The first measurement value corresponding to each of the first beams.

5. The method according to any one of claims 1-4, characterized in that, The second information includes at least one of the following: The index of each of the third reference signals; The second measurement value corresponding to each of the third reference signals.

6. A performance testing method, characterized in that, The method is performed by a first device, and the method includes: Send a first indication message and a first reference signal corresponding to each beam in the beam subset; wherein the first indication message is used to indicate a mapping relationship, the mapping relationship being the mapping relationship between each beam in the beam subset and the first reference signal; Receive first information; wherein the first information is information related to the first beam; wherein the first beam is the beam selected by the terminal in the beam set by the first measurement value predicted by the artificial intelligence AI model in descending order; Based on the modified mapping relationship, a second indication information and a second reference signal corresponding to each beam in the beam set are sent; wherein, the second indication information is used to indicate the index of each second reference signal; Receive second information; wherein the second information is information related to the third reference signal, the third reference signal being the second measurement value obtained by the terminal for each of the second reference signals, and the second reference signals selected in descending order; Based on the first information and the second information, the performance of the AI ​​model on the terminal is tested.

7. The method according to claim 6, characterized in that, The first indication information is used to indicate at least one of the following: The index of each beam in the beam set, and the index of the first reference signal corresponding to each beam in the beam set; The index of each of the first reference signals; The index of the mapping relationship.

8. The method according to claim 6 or 7, characterized in that, The first information includes at least one of the following: Index of each of the first beams; The index of the first reference signal corresponding to each of the first beams; The first measurement value corresponding to each of the first beams.

9. The method according to any one of claims 6-8, characterized in that, The second information includes at least one of the following: The index of each of the third reference signals; The second measurement value corresponding to each of the third reference signals.

10. The method according to any one of claims 6-9, characterized in that, The performance test of the AI ​​model on the terminal based on the first information and the second information includes at least one of the following: The first information includes the index of each first beam, the second information includes the index of each third reference signal, and based on the modified mapping relationship, the index of each second beam corresponding to the index of each third reference signal is determined; The performance of the AI ​​model on the terminal is tested based on the index of each of the first beams and the index of each of the second beams.

11. The method according to any one of claims 6-9, characterized in that, The performance test of the AI ​​model on the terminal based on the first information and the second information includes at least one of the following: The first information includes the index of the first reference signal corresponding to each first beam, the second information includes the index of each third reference signal, the index of the first beam corresponding to the index of each first reference signal is determined based on the mapping relationship, and the index of each second beam corresponding to the index of each third reference signal is determined based on the modified mapping relationship. The performance of the AI ​​model on the terminal is tested based on the index of each of the first beams and the index of each of the second beams.

12. The method according to claim 10 or 11, characterized in that, The performance test of the AI ​​model on the terminal based on the index of each first beam and the index of each second beam includes: Determine a first ratio of the first count to the total count; wherein the first count is the number of times the index of the second beam is the same as the index of the first beam; If the first ratio is greater than or equal to the first value, the performance test result of the AI ​​model is determined to be passed; or If the first ratio is less than the first value, the performance test result of the AI ​​model is determined to be unsuccessful.

13. The method according to any one of claims 6-12, characterized in that, The performance test of the AI ​​model on the terminal based on the first information and the second information includes at least one of the following: The first information includes the first measurement value corresponding to each first beam, the second information includes the second measurement value corresponding to each third reference signal, and the difference between each second measurement value and the corresponding first measurement value is determined; Determine a second ratio of the second number to the total number of times; wherein the second number is the number of times the difference is less than or equal to the second value; If the second ratio is greater than or equal to the third value, the performance test result of the AI ​​model is determined to be passed; or If the second ratio is less than the third value, the performance test result of the AI ​​model is determined to be unsuccessful.

14. A terminal, characterized in that, include: The transceiver module is configured to receive first indication information sent by the first device, and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, the mapping relationship being the mapping relationship between each beam in the beam subset and the first reference signal; The processing module is configured to measure the first reference signal corresponding to each beam in the beam subset, and based on the obtained first measurement value, predict the first measurement value corresponding to each beam in the beam subset using an artificial intelligence (AI) model. The transceiver module is further configured to send first information to the first device; wherein the first information is information related to the first beam; wherein the first beam is a beam selected within the beam set in descending order of the first measurement value predicted by the AI ​​model; The transceiver module is further configured to receive second indication information sent by the first device based on the modified mapping relationship, and a second reference signal corresponding to each beam in the beam set; wherein the second indication information is used to indicate the index of each second reference signal; The transceiver module is further configured to measure each of the second reference signals and send second information to the first device based on the obtained second measurement value; wherein the second information is information related to the third reference signal, and the third reference signal is a second reference signal selected in descending order of the second measurement values.

15. A first device, characterized in that, include: The transceiver module is configured to transmit first indication information and a first reference signal corresponding to each beam in the beam subset; wherein the first indication information is used to indicate a mapping relationship, the mapping relationship being the mapping relationship between each beam in the beam subset and the first reference signal; The transceiver module is further configured to receive first information; wherein the first information is information related to the first beam; wherein the first beam is the beam selected by the terminal in the beam set by the first measurement value predicted by the artificial intelligence AI model in descending order; The transceiver module is also configured to send second indication information and a second reference signal corresponding to each beam in the beam set based on the modified mapping relationship; wherein the second indication information is used to indicate the index of each second reference signal; The transceiver module is further configured to receive second information; wherein the second information is information related to a third reference signal, the third reference signal being a second measurement value obtained by the terminal for each second reference signal, and the second reference signals selected in descending order; The processing module is configured to perform performance testing on the AI ​​model on the terminal based on the first information and the second information.

16. A terminal, characterized in that, include: One or more processors; The processor is used to execute the performance testing method according to any one of claims 1-5.

17. A first device, characterized in that, include: One or more processors; The processor is used to execute the performance testing method according to any one of claims 6-13.

18. A communication system, characterized in that, include: A terminal, configured to implement the performance testing method according to any one of claims 1-5; A first device, configured to implement the performance testing method according to any one of claims 6-13.

19. A storage medium storing instructions, characterized in that, When the instructions are executed on an electronic device, the electronic device causes the electronic device to perform the performance testing method as described in any one of claims 1-5 or 6-13.

20. A computer program product, comprising a computer program, characterized in that, When executed by a processor, the computer program is used to implement the performance testing method according to any one of claims 1-5 or 6-13.

Images