1results about How to "Solve inflexibility" patented technology

This application relates to an integrated circuit testing method, apparatus, device, and storage medium. The method includes: after mounting the integrated circuit under test (ICT) onto a test socket and initiating the testing process, triggering the application of continuous dynamic stress required for the current testing scenario to the IC; acquiring a multi-dimensional dynamic response signal generated by the IC in response to the dynamic stress; constructing dynamic behavioral fingerprint data characterizing the performance features of the IC based on the multi-dimensional dynamic response signal; analyzing the dynamic behavioral fingerprint data of the IC, making adaptive decisions for the IC, and executing the corresponding testing process. This application's solution at least addresses the problem of inflexibility in existing chip testing technologies using static testing modes.