Test method and device based on comb signal

Abstract

The invention relates to the technical field of electromagnetism, in particular to a testing method and device based on comb-shaped signals, and the method comprises the steps: obtaining at least one frequency point based on the comb-shaped signals and the amplitude corresponding to each frequency point in the at least one frequency point; performing time domain conversion on the at least one frequency point and the amplitude corresponding to each frequency point in the at least one frequency point to obtain time domain data corresponding to the at least one frequency point; performing signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data; controlling the spectrum analyzer to collect the target spectrum data to obtain a target spectrogram; and determining whether the test system meets a test standard or not according to the target spectrogram. According to the method, the flexibility and accuracy of the electromagnetic compatibility test are improved, the test process is simplified, the frequency coverage range is expanded, meanwhile, the hardware dependence is reduced, and the test standardization and automation are promoted.

Description

Technical Field

[0001] The present application relates to the field of electromagnetic technology, and in particular to a testing method and device based on comb signals. Background Art

[0002] In the field of electromagnetic compatibility (EMC) testing, it is crucial to ensure that the test environment and layout meet the requirements of the standard. This process usually includes regular verification of the test system to verify whether it meets the predetermined test standards. In order to verify the conducted and radiated interference system, a comb signal source is traditionally used as the emission source. A comb signal source is a device that can generate a signal with multiple equally spaced frequency components. Its signal spectrum presents a comb-like shape on the frequency axis, so it is called a "comb signal."

[0003] Although this traditional method can effectively generate and measure signals with multiple frequency components, its limitations are also obvious. Traditional comb signal sources can usually only generate fixed frequency points and corresponding amplitudes based on their hardware characteristics. Although this fixed frequency point and amplitude setting can meet basic test requirements, it lacks flexibility and cannot verify specific, user-defined frequency points. Therefore, the customized requirements for frequency points during the test cannot be met, which limits the scope of application and flexibility of the test system. This limitation means that when detailed verification of specific frequency points is required, the traditional method cannot provide sufficient support, resulting in information loss during the test and analysis process. Summary of the invention

[0004] An object of an embodiment of the present invention is to provide a test method and device based on comb signals, so as to solve the technical problem that a user-defined frequency point cannot be tested during electromagnetic compatibility laboratory testing.

[0005] In a first aspect, an embodiment of the present invention provides a comb signal-based test method, which is applied to a test system, wherein the test system includes a spectrum analyzer, and the method includes:

[0006] Acquire at least one frequency point based on the comb signal and an amplitude corresponding to each frequency point in the at least one frequency point;

[0007] Performing time domain conversion on the at least one frequency point and the amplitude corresponding to each frequency point in the at least one frequency point to obtain time domain data corresponding to the at least one frequency point;

[0008] According to the acquired acquisition parameters, signal processing is performed on the time domain data corresponding to the at least one frequency point to obtain target spectrum data;

[0009] Controlling the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph;

[0010] Determine whether the test system meets the test standard according to the target frequency spectrum.

[0011] In combination with the first aspect, in a possible implementation method, the at least one frequency point and the amplitude corresponding to each of the at least one frequency point are converted into time domain to obtain time domain data corresponding to the at least one frequency point, including: generating a spectrum data matrix according to the at least one frequency point and the amplitude corresponding to each of the at least one frequency point; performing an inverse Fourier transform calculation on the spectrum data matrix to obtain the time domain data corresponding to the at least one frequency point.

[0012] In combination with the first aspect, in a possible implementation method, the acquisition parameters include a sampling rate and a sampling time; the signal processing is performed on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data, including: determining the number of sampling points according to the sampling rate and the sampling time; performing data preprocessing on the time domain data corresponding to the at least one frequency point to obtain a plurality of preprocessed time domain data; dividing the plurality of preprocessed time domain data into a plurality of target segments according to the sampling time, the data length of each target segment being equal to the number of sampling points; performing Fourier transform calculation on the plurality of target segments to obtain spectrum data corresponding to each of the plurality of target segments; and determining that the spectrum data corresponding to all of the target segments is the target spectrum data.

[0013] In combination with the first aspect, in a possible implementation method, controlling the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph includes: setting the sampling rate corresponding to the spectrum analyzer and the sampling rate corresponding to the acquisition parameter to the same value; controlling the spectrum analyzer to collect the target spectrum data according to the sampling rate corresponding to the acquisition parameter to obtain a target spectrum graph.

[0014] In combination with the first aspect, in a possible implementation, before determining whether the test system meets the test criteria based on the target spectrum diagram, the method also includes: obtaining a first spectrum diagram based on the acquired acquisition parameters and time domain data corresponding to the at least one frequency point.

[0015] In combination with the first aspect, in a possible implementation method, determining whether the test system meets the test standard based on the target spectrum graph includes: comparing the target spectrum graph with the first spectrum graph to determine whether an offset point appears; determining whether the offset point is within a preset offset range; if it is within the preset offset range, determining that the current test system meets the test standard; or, if it is not within the preset offset range, determining that the current test system does not meet the test standard.

[0016] In combination with the first aspect, in a possible implementation, after determining that the current test system does not meet the test standard if it is not within the preset offset range, the method also includes: obtaining the position and amplitude of the offset point, and the degree of deviation of the offset point; analyzing the offset point to obtain adjustment parameters, and the adjustment parameters are used to adjust the test system; and retesting according to the adjustment parameters.

[0017] In a second aspect, an embodiment of the present invention provides a test device based on a comb signal, which is applied to a test system, wherein the test system includes a spectrum analyzer, and the device includes:

[0018] An acquisition unit, configured to acquire at least one frequency point based on the comb signal and an amplitude corresponding to each frequency point in the at least one frequency point;

[0019] A conversion unit, configured to perform time domain conversion on the at least one frequency point and the amplitude corresponding to each frequency point in the at least one frequency point to obtain time domain data corresponding to the at least one frequency point;

[0020] A determination unit, configured to perform signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data;

[0021] The determination unit is further used to control the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph;

[0022] The determination unit is further configured to determine whether the test system meets a test standard according to the target frequency spectrum.

[0023] In a third aspect, an embodiment of the present invention provides a computer device, including:

[0024] at least one processor; and,

[0025] a memory communicatively connected to the at least one processor; wherein,

[0026] The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the method according to the first aspect.

[0027] In a fourth aspect, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores a computer program, wherein the computer program includes program instructions, and when the program instructions are executed by a processor, the processor executes the method as described in the first aspect.

[0028] In the scheme implemented by the above-mentioned test method, device, equipment and storage medium based on comb signals, this method obtains and defines multiple frequency points and their corresponding amplitudes, so that users can customize the frequency components of the test signal according to specific needs, thereby improving the flexibility of the test, so that the test can be accurately checked for specific frequency points without being restricted by the fixed frequency points of the traditional comb signal source; further, the frequency points and their amplitudes are converted into the time domain, and then the spectrum analyzer is controlled to collect these data, so that a more accurate target spectrum diagram can be obtained, which is helpful to identify and quantify performance deviations in the test system; and by analyzing the target spectrum diagram, it is determined whether the test system meets the predetermined test standards. Automated standard compliance detection improves the efficiency of the test process, reduces the need for manual intervention, and can more easily identify problem points in the test system, such as offset, interference, etc., and then determine whether the system has deviations or does not meet the standards; thereby, this method provides a more efficient, accurate and flexible testing method, which helps to improve the reliability and efficiency of the entire test process. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments of the present invention will be briefly introduced below. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative labor.

[0030] Figure 1 is a schematic diagram of a test system in one embodiment of the present invention;

[0031] Figure 2 is a flow chart of a test method based on comb signals in one embodiment of the present invention;

[0032] Figure 3 is a structural schematic diagram of a comb signal-based testing device in one embodiment of the present invention;

[0033] Figure 4 It is a schematic diagram of the structure of a computer device in one embodiment of the present invention. DETAILED DESCRIPTION

[0034] In order to make the purpose, technical scheme and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0035] It should be noted that, if there is no conflict, the various features in the embodiments of the present invention can be combined with each other, all within the scope of protection of the present invention. In addition, although the functional modules are divided in the device schematic diagram and the logical order is shown in the flow chart, in some cases, the steps shown or described can be performed in a different order from the module division in the device or the flow chart. Furthermore, the words "first", "second", "third", etc. used in the present invention do not limit the data and execution order, but only distinguish the same items or similar items with basically the same functions and effects.

[0036] The technical solution of the present application can be applied to various testing scenarios.

[0037] In the comb-based test method, applied to the test system, see Figure 1 , Figure 1 A schematic diagram of a test system provided in an embodiment of the present application, the test system 10 includes an acquisition card 20, a host computer 30, a test device (such as a conducted and radiated disturbance system) 40, and a spectrum analyzer 50.

[0038] The test system 10 is a configuration designed for electromagnetic compatibility (EMC) testing, and is intended to detect and analyze the performance and response of a test device (such as a conducted or radiated disturbance system) 40 in an electromagnetic environment.

[0039] The acquisition card 20 is a data acquisition device connected to the host computer for receiving and storing time domain signal data. It can set the sampling rate according to the instructions of the host computer, and convert the analog signal into a digital signal, or convert the digital signal into an analog signal for output. Specifically, the acquisition card 20 will receive the test signal sent from the host computer and the corresponding test signal parameters to digitize the time domain signal data, and then output the signal through the signal output port, and transmit it to the spectrum analyzer for further analysis.

[0040] The host computer 30 is usually a computer equipped with special software for generating and converting test signals. The host computer can be programmed to generate the frequency and amplitude parameters of the test signal, and convert these parameters into time domain data through inverse Fourier transform, and then send the time domain data of the test signal to the acquisition card through the network port.

[0041] Specifically, the host computer generates a signal to be sent according to the frequency point set by the user to ensure that the signal source outputs the correct frequency component; the host computer sets the amplitude of the test signal to ensure that the signal source outputs an appropriate signal strength. Optionally, the host computer monitors the test process in real time and records all relevant data, including the actual output parameters of the signal source, the spectrum data collected by the spectrum analyzer, etc.

[0042] The test equipment (such as conducted and radiated disturbance system) 40 refers to a device used to actually test conducted disturbance or radiated disturbance, which may include an antenna, a test bench, a receiving sensor, etc. These devices are used to capture the signal generated by the acquisition card and simulate the electromagnetic environment under actual working conditions. Specifically, after receiving the signal from the acquisition card, the system response is evaluated; the test signal results (such as output signal, interference level, etc.) are provided to the spectrum analyzer for analysis.

[0043] The spectrum analyzer 50 is used to measure and analyze the spectrum characteristics of the signal, including amplitude and frequency distribution. Specifically, it receives the spectrum data corresponding to the digitized time domain signal data transmitted from the acquisition card at a specific sampling rate, generates a target spectrum graph based on the collected spectrum data, and transmits the spectrum graph data to the host computer for further analysis and judgment.

[0044] It can be seen from the above components that the host computer 30 generates parameters (such as frequency, amplitude, etc.) of the comb signal source through instruction configuration, and sends these parameters to the acquisition card 20; the acquisition card 20 converts the analog signal into a digital signal, stores the time domain data in the memory, and cyclically outputs the instructions of the host computer according to the sampling rate set by the host computer to generate a specific signal, and transmits it to the test equipment 40; after receiving the signal, the test equipment 40 processes it (for example, simulates the conduction or radiation effect), and transmits the processed signal to the acquisition card 20; after receiving the signal output by the acquisition card 20, the spectrum analyzer 50 converts it into a spectrum diagram, and the tester can use the spectrum diagram to verify whether the system meets the test standards.

[0045] Therefore, the test system 10 can effectively evaluate and ensure the electromagnetic compatibility of the test equipment and meet the test requirements of various application scenarios.

[0046] In view of this, the present application proposes a test method based on comb signals to solve the above problems, which will be described in detail below.

[0047] See also Figure 2 , Figure 2 A flow chart of a comb signal-based testing method provided by an embodiment of the present invention, the method comprising the following steps:

[0048] S10. Obtain at least one frequency point based on a comb signal and an amplitude corresponding to each frequency point in the at least one frequency point.

[0049] The acquisition process can set the frequency points to be tested according to the test requirements. The frequency points can be fixed or customized according to the test requirements. The frequency points may cover the entire frequency range or be concentrated in a specific frequency band. For example, for electromagnetic compatibility (EMC) testing, it may be necessary to focus on certain key frequency points to evaluate the performance of the system at these frequency points.

[0050] The amplitude refers to the strength or level of the signal at that frequency point, which is usually set based on the requirements of the test standard or the characteristics of the device under test.

[0051] In the specific implementation, the host computer inputs or selects the frequency points to be tested. For example, the tester may select frequency points such as 100kHz, 500kHz, 1MHz, etc.; set the amplitude for each selected frequency point, such as -30dBm, -20dBm, etc., depending on the test requirements; the host computer sends these frequency points and amplitude information to the acquisition card, and the acquisition card generates the corresponding signal according to these parameters, that is, the acquisition card outputs a composite signal, which contains all the selected frequency points and their corresponding amplitudes. This signal will be used as a test signal for electromagnetic compatibility testing of the device under test.

[0052] It can be seen that in this embodiment, by acquiring and defining multiple frequency points and their corresponding amplitudes, the user can customize the frequency components of the test signal according to specific needs, thereby improving the flexibility of the test and allowing the test to be accurately verified at specific frequency points without being restricted by the fixed frequency points of the traditional comb signal source.

[0053] S20. Perform time domain conversion on the at least one frequency point and the amplitude corresponding to each frequency point in the at least one frequency point to obtain time domain data corresponding to the at least one frequency point.

[0054] Among them, the frequency domain describes the distribution of the signal at different frequencies. The amplitude and phase of each frequency point can be seen through the spectrum diagram; the time domain describes the change of the signal over time. The time domain data is the actual performance of the signal on the time axis, which can intuitively display the waveform and changes of the signal.

[0055] Among them, the frequency point is a specific frequency component in the comb signal, and each frequency point has a corresponding amplitude in the spectrum; the amplitude is the amplitude at each frequency point, which represents the signal strength at that frequency, and the amplitude is used to describe the intensity distribution of the signal in the frequency domain.

[0056] Among them, time domain data is usually an array of real numbers, representing the amplitude of the signal at a series of discrete time points. The length of the time domain data determines the time resolution, that is, the time interval that can be distinguished. The longer the length, the higher the time resolution, but the greater the computational workload and storage requirements. Converting frequency domain information to time domain information can help analyze the performance of the signal under actual test conditions.

[0057] Among them, the purpose of time domain conversion is to convert discrete frequency points and amplitude information in the frequency domain into continuous signals in the time domain, so as to observe the changes of the signal over time.

[0058] It can be seen that in this embodiment, a time domain signal for electromagnetic compatibility testing can be generated from the perspective of the frequency domain, which is crucial for subsequent signal acquisition and analysis.

[0059] In one embodiment, performing time domain conversion on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point to obtain time domain data corresponding to the at least one frequency point includes: generating a spectrum data matrix based on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point; and performing inverse Fourier transform calculation on the spectrum data matrix to obtain time domain data corresponding to the at least one frequency point.

[0060] The spectrum data matrix is ​​a data structure in matrix form, which is used to store each frequency point and its corresponding amplitude and phase. The spectrum data matrix can contain data of multiple frequency points, and each row usually represents the amplitude and phase of a frequency point.

[0061] Specifically, the frequency points and corresponding amplitude data set by the host computer are organized into a matrix. For example, each row of the matrix may represent the amplitude and (optional) phase information of a frequency point.

[0062] Specifically, the Inverse Fourier Transform is a mathematical transformation used to convert frequency domain data (i.e., frequency points and their amplitudes) into time domain data (i.e., signal changes over time). The time domain signal waveform can be obtained by combining the frequency components of the frequency domain signal.

[0063] For example, set the frequency points to be converted (e.g., 100kHz, 200kHz, ...) and the amplitudes corresponding to these frequency points (e.g., 1V, 0.5V, ...); create a spectrum data matrix, whose size is usually the same as the number of sampling points. If the sampling rate is Fs and the maximum duration of the signal to be analyzed is T, the number of sampling points is Fs*T. In the matrix, rows represent sampling points and columns represent frequency components; in the spectrum data matrix, fill the columns corresponding to the selected frequency points with the corresponding amplitudes. The columns corresponding to other unselected frequency points remain zero. If the phase is considered, the amplitude needs to be combined with the phase information into a complex form for filling; due to the symmetry of the Fourier transform, if you only care about the positive frequency part, then before IFFT, you may need to symmetrically expand the spectrum data to ensure that the time domain signal is real; perform calculations on the filled spectrum data matrix according to the inverse Fourier transform. After the calculation is completed, the result is a time domain data array, which represents the waveform of the original comb signal on the time axis. This array contains the amplitude information of the signal changing over time.

[0064] It can be seen that in this embodiment, by constructing a spectrum data matrix and performing inverse Fourier transform calculation on it, the corresponding time domain data can be obtained from the frequency domain data, providing necessary information for signal testing and system analysis.

[0065] S30. Perform signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data.

[0066] The acquisition parameters refer to various settings for controlling signal acquisition, including but not limited to sampling rate, sampling time, bandwidth, etc. The acquisition parameters may be manually set by the user according to the test requirements, or automatically generated by the test software according to the preset test standards, and are not limited here.

[0067] Specifically, the sampling rate refers to the number of times data is collected from a continuous signal per second, usually in Hertz (Hz). The sampling rate directly affects the frequency resolution and time resolution of the signal. According to the highest frequency of the signal, the sampling rate should be at least twice the highest frequency of the signal to meet the Nyquist theorem and avoid aliasing.

[0068] For example, choose an appropriate sampling rate based on the bandwidth and frequency range of the signal. For example, for a signal with a bandwidth of 20kHz, the sampling rate should be at least 40kHz. If higher frequency resolution is required, a higher sampling rate can be selected.

[0069] Before starting the acquisition, you need to set the sampling rate of the acquisition card according to the test requirements. This can be done through the control software of the acquisition card, and ensure that the internal sampling rate of the spectrum analyzer is synchronized with the sampling rate of the acquisition card to ensure data consistency and accuracy.

[0070] Furthermore, when the acquisition card configuration is completed, the spectrum analyzer is controlled to start acquiring the frequency domain data sent by the acquisition card, and the acquisition card will cyclically output the signal at the set sampling rate.

[0071] Optionally, the frequency domain data collected by the spectrum analyzer can be analyzed and processed by a host computer.

[0072] Among them, the target spectrum diagram is an image generated after the spectrum analyzer collects frequency domain data, showing the intensity or power distribution of the signal at different frequencies. The target spectrum diagram reflects the frequency components and amplitudes of the signal.

[0073] It can be seen that in this embodiment, by performing signal processing on the time domain data and then acquiring the target spectrum data, the reliability and efficiency of the entire test process can be significantly improved.

[0074] In one embodiment, the acquisition parameters include sampling rate and sampling time; the signal processing is performed on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data, including: determining the number of sampling points according to the sampling rate and the sampling time; performing data preprocessing on the time domain data corresponding to the at least one frequency point to obtain a plurality of preprocessed time domain data; dividing the plurality of preprocessed time domain data into a plurality of target segments according to the sampling time, the data length of each target segment being equal to the number of sampling points; performing Fourier transform calculation on the plurality of target segments to obtain spectrum data corresponding to each of the plurality of target segments; and determining that the spectrum data corresponding to all of the target segments is the target spectrum data.

[0075] The number of sampling points is the total number of samples collected during the entire sampling time; the number of sampling points is equal to the sampling rate multiplied by the sampling time.

[0076] Among them, data preprocessing aims to improve the quality of collected data in order to perform more accurate spectrum analysis. Preprocessing steps usually include operations such as denoising, signal detrending and windowing. Specifically, denoising can apply filters or denoising algorithms (such as mean filtering, median filtering) to reduce random noise in the signal and improve clarity; detrending is to eliminate long-term trends or DC offsets in time domain data to avoid misleading the spectrum graph; windowing is to use window functions (such as Hamming window, Hanning window) to reduce spectrum leakage caused by signal truncation and improve the frequency resolution of the spectrum graph.

[0077] As a result, the preprocessed time domain data is cleaner, more consistent, and more suitable for subsequent data conversion and analysis.

[0078] Specifically, the preprocessed time domain data is divided into multiple target segments according to the sampling time. The data length of each target segment should be equal to the number of sampling points, that is, the entire time domain data is divided into continuous blocks, each block contains N samples, and N corresponds to the number of sampling points.

[0079] The calculation in this step refers to converting the time domain data into frequency domain data through Fourier transform so as to analyze the frequency components of the signal. The spectrum data includes the frequency components and their corresponding amplitudes (sometimes also phase information).

[0080] In the process of implementing the calculation, a fast Fourier transform (FFT) is performed on the preprocessed time domain data to convert the data from the time domain to the frequency domain, and the amplitude and frequency information are extracted from the frequency domain data to form spectrum data, and it is ensured that the frequency axis in the spectrum data correctly corresponds to the actual frequency point.

[0081] Specifically, the spectrum data of each target segment includes the frequency components and corresponding amplitudes of the signal of that segment; by combining the spectrum data of all target segments, the target spectrum data within the entire acquisition time is obtained.

[0082] It can be seen that in this embodiment, preprocessing is performed to improve data quality and conversion from the time domain to the frequency domain is performed to reveal the frequency characteristics of the signal.

[0083] S40, controlling the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph.

[0084] In a specific implementation, the target spectrum data is the data sent cyclically by the acquisition card, and the cyclic sending can send the target spectrum data cyclically to the spectrum analyzer through a data interface (such as USB, Ethernet, PCIe, etc.). The cyclic sending is a repeated measurement process, and its purpose is to continuously collect data so as to perform multiple measurements to obtain more accurate results.

[0085] Among them, the spectrum data is visualized and the target spectrum diagram is generated to facilitate the analysis and interpretation of the frequency domain characteristics of the signal.

[0086] In a specific implementation, the drawing process may be setting the coordinate axes, labels, and legends of the drawing. The horizontal axis usually represents the frequency, and the vertical axis represents the amplitude or power; the spectrum data is drawn into a graph using a drawing tool or software (such as Matlab, Python's Matplotlib, Excel, etc.); frequency axis: the horizontal axis represents the frequency range; amplitude axis: the vertical axis represents the amplitude or power of the signal at different frequency points.

[0087] Specifically, controlling the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph includes: setting a sampling rate corresponding to the spectrum analyzer and a sampling rate corresponding to the acquisition parameter to the same value; controlling the spectrum analyzer to collect the target spectrum data according to the sampling rate corresponding to the acquisition parameter to obtain a target spectrum graph.

[0088] The spectrum analyzer needs to be configured according to the acquisition parameters to ensure that the target spectrum data sent is correctly received and processed. After receiving the target spectrum data, the spectrum analyzer will collect it according to the set parameters. This may include setting appropriate trigger conditions to ensure the consistency of data collection.

[0089] It can be seen that in this embodiment, by ensuring that the spectrum analyzer correctly acquires frequency domain data according to the sampling rate of the acquisition card and generates an accurate spectrum diagram, effective electromagnetic compatibility testing and analysis can be performed.

[0090] S50: Determine whether the test system meets a test standard according to the target frequency spectrum.

[0091] The test standard is a set of parameters or performance indicators defined in advance, which are used to evaluate and verify whether the system, component or device has achieved the expected performance level. These standards can be industry standards, international standards, company internal standards, etc. Specifically, in this embodiment, the test standard may include specific requirements for the spectrum, such as the allowed amplitude range, frequency distribution, interference level, etc.

[0092] Among them, the test standards may include parameters such as signal strength at a specific frequency point, signal-to-noise ratio (SNR), harmonic distortion level, spurious emission level, frequency stability, etc.

[0093] The target spectrum provides a frequency domain view of the test system output signal. By analyzing this spectrum, the system's frequency response, signal purity, interference level and other performance indicators can be measured and evaluated. The performance indicators extracted from the spectrum are compared with the requirements in the test standard to determine whether the test system meets the standard. For example, if the test standard requires the signal-to-noise ratio to be no less than a specific value, then the analysis can clearly show whether the test system meets this requirement.

[0094] It can be seen that in this embodiment, by systematically evaluating whether the test system meets the standard requirements of the electromagnetic compatibility test, it is ensured that the product or device can work normally in the electromagnetic environment without causing harmful interference.

[0095] By acquiring and defining multiple frequency points and their corresponding amplitudes, the method allows users to customize the frequency components of the test signal according to specific needs, thereby improving the flexibility of the test and allowing the test to accurately check specific frequency points without being restricted by the fixed frequency points of the traditional comb signal source; further, the frequency points and their amplitudes are converted into the time domain, and then the data are collected by controlling the spectrum analyzer to obtain a more accurate target spectrum diagram, which helps to identify and quantify performance deviations in the test system; and by analyzing the target spectrum diagram, it is determined whether the test system meets the predetermined test standards. Automated standard compliance detection improves the efficiency of the test process, reduces the need for manual intervention, and can more easily identify problem points in the test system, such as offset, interference, etc., and then determine whether the system has deviations or does not meet the standards; thus, the method provides a more efficient, accurate and flexible test method, which helps to improve the reliability and efficiency of the entire test process.

[0096] In one embodiment, before determining whether the test system meets the test standard according to the target spectrum diagram, the method further includes: obtaining a first spectrum diagram according to the acquired acquisition parameters and the time domain data corresponding to the at least one frequency point.

[0097] Among them, the first spectrum diagram is a theoretical spectrum diagram, that is, a theoretical spectrum diagram generated under an ideal state according to the acquired acquisition parameters and the time domain data corresponding to the at least one frequency point. Specifically, the ideal state is a state without actual noise or interference. That is, under an ideal state, the noise, interference and non-ideal factors in the actual measurement are not considered. The generated spectrum diagram is called a theoretical spectrum diagram, which assumes that the acquisition equipment and the test environment are perfect and do not introduce any errors.

[0098] Therefore, the theoretical spectrum diagram is generated under the assumption that all equipment and environmental conditions are optimal, so it represents the spectral characteristics of the signal under ideal conditions; since the uncertainties in actual measurements are not taken into account, the theoretical spectrum diagram usually has very high accuracy and can be used as a reference standard; the theoretical spectrum diagram is used to compare with the spectrum diagram obtained by actual measurements to evaluate performance deviations in actual measurements.

[0099] It can be seen that in this embodiment, a theoretical frequency spectrum is obtained, which serves as a reference for subsequent actual measured frequency spectrum and is used to compare and evaluate the performance of the actual test system.

[0100] In one embodiment, determining whether the test system meets the test standard based on the target spectrum graph includes: comparing the target spectrum graph with the first spectrum graph to determine whether an offset point appears; determining whether the offset point is within a preset offset range; if it is within the preset offset range, determining that the current test system meets the test standard; or, if it is not within the preset offset range, determining that the current test system does not meet the test standard.

[0101] The target spectrum is the actual measured spectrum, which is generated based on the time domain data and acquisition parameters obtained in the actual test. It reflects the frequency domain characteristics of the test system under actual working conditions. The target spectrum can be used to compare the theoretical expected spectrum to confirm whether the actual performance of the system meets expectations.

[0102] The first spectrum graph is a spectrum graph generated based on a theoretical model or under ideal conditions. It shows the expected frequency domain characteristics of the signal under ideal conditions based on preset theoretical data and ideal acquisition parameters. The first spectrum graph is used as a comparison benchmark to compare with the actually measured target spectrum graph.

[0103] In a specific implementation, two spectrograms are overlapped and placed on the same frequency axis for comparison so as to visually compare the differences between them. The comparison can be performed by visual inspection or by using software tools to automatically identify the differences between corresponding frequency points in the two spectrograms, which is not limited here.

[0104] The offset point refers to a frequency point in the target spectrum graph whose amplitude or phase is different from the corresponding point in the first spectrum graph.

[0105] The preset offset range is the maximum allowable amplitude or phase deviation range defined in the test standard or specification. The preset offset range is usually based on the performance requirements of the test system and the specifications of the device under test.

[0106] Specifically, if the deviations of all offset points are within the preset offset range, then the performance of the test system can be considered acceptable and it meets the test standard; if the deviation of any offset point exceeds the preset offset range, then the performance of the test system is considered unqualified and it does not meet the test standard.

[0107] It can be seen that in this embodiment, whether the test system meets the test requirements is evaluated by comparing the actual measurement results with the theoretical expectations, thereby ensuring the accuracy and reliability of the test system.

[0108] In one embodiment, after determining that the current test system does not meet the test standard if it is not within the preset offset range, the method further includes: obtaining the position and amplitude of the offset point, and the degree of deviation of the offset point; analyzing the offset point to obtain adjustment parameters, which are used to adjust the test system; and retesting according to the adjustment parameters.

[0109] The position of the offset point refers to the specific frequency point on the frequency axis in the spectrum graph where the amplitude deviates. It is usually expressed as a frequency value (Hz); the amplitude of the offset point refers to the difference between the actual measured signal amplitude and the theoretical expected amplitude at this frequency point.

[0110] Specifically, the position of the offset point can be found by comparing the target spectrum diagram (actual measurement) and the first spectrum diagram (theoretical prediction) to find the frequency point in the actual measured spectrum that is different from the theoretical value; the amplitude of the offset point can be extracted from the spectrum diagram by extracting the actual measured amplitude and the theoretical expected amplitude, and calculating the difference between them.

[0111] The degree of deviation refers to the difference between the actual measured value and the expected value, which can also be the difference in amplitude or phase, and is usually expressed in decibels (dB) or degrees (°). The degree of deviation can be quantified by calculating the absolute difference or relative difference (for example, percentage deviation) in amplitude.

[0112] The purpose of analyzing the offset points is to understand the causes of the deviations and determine how to adjust the test system to eliminate or reduce these deviations. The analysis may include checking the calibration status of the test equipment, changes in the test environment, interference in the signal path, instrument settings, etc. This usually involves professional knowledge and technical experience.

[0113] The analysis process may include but is not limited to the following: if there is a single-point offset, it means that the deviation of a certain frequency point may be due to a specific hardware or setting problem; if there are multiple-point offsets, it means that the deviation of multiple frequency points may indicate an overall setting problem of the system or environmental interference.

[0114] Further, the causes of the offset may include but are not limited to the following: hardware problems, such as nonlinearity or drift of the signal source or test equipment; setup errors, such as incorrect sampling rate settings or inaccurate system calibration; environmental influences, such as external electromagnetic interference or changes in the test environment.

[0115] Among them, the adjustment parameters may include gain adjustment, filter setting, frequency correction, power management, etc. The adjustment parameters are intended to correct the offset and improve the performance of the test system to make it closer to the theoretical expectations.

[0116] Specifically, the test system is modified accordingly according to the obtained adjustment parameters, which may involve hardware reconfiguration, software parameter update or test environment optimization.

[0117] In specific implementation, the purpose of retesting is to verify whether the adjusted parameters are effective and whether the test system now meets the test standards; according to the same test procedures and conditions, data is collected again, a new spectrum diagram is generated, and the previous comparison and analysis steps are repeated; if the adjusted test results show that the offset point is within the preset offset range, it can be considered that the test system has met the test standards; if the problem still exists, further adjustment and analysis may be required.

[0118] It can be seen that the iterative method in this embodiment ensures that the test system can accurately measure the signal in actual operation and meets the predetermined test standard.

[0119] It should be noted that, in each of the above-mentioned embodiments, there is not necessarily a certain order between the above-mentioned steps. A person skilled in the art can understand, based on the description of the embodiments of the present application, that in different embodiments, the above-mentioned steps may have different execution orders, that is, they may be executed in parallel, may be executed interchangeably, and so on.

[0120] As another aspect of the embodiment of the present application, the embodiment of the present application provides a test device based on comb signals. The test device based on comb signals can be a software module, which includes several instructions stored in a memory, and the processor can access the memory and call the instructions for execution to complete the test method based on comb signals described in the above embodiments.

[0121] See also Figure 3 , Figure 3 is a schematic diagram of the structure of a test device based on comb signals provided in an embodiment of the present application. Figure 3 As shown, the comb signal-based test device 300 includes:

[0122] An acquisition unit 301 is used to acquire at least one frequency point based on a comb signal and an amplitude corresponding to each frequency point in the at least one frequency point;

[0123] A conversion unit 302 is used to perform time domain conversion on the at least one frequency point and the amplitude corresponding to each frequency point in the at least one frequency point to obtain time domain data corresponding to the at least one frequency point;

[0124] The determination unit 303 is used to perform signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data;

[0125] The determining unit 303 is further used to control the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph;

[0126] The determining unit 303 is further configured to determine whether the test system meets a test standard according to the target frequency spectrum.

[0127] By acquiring and defining multiple frequency points and their corresponding amplitudes, the method allows users to customize the frequency components of the test signal according to specific needs, thereby improving the flexibility of the test and allowing the test to accurately check specific frequency points without being restricted by the fixed frequency points of the traditional comb signal source; further, the frequency points and their amplitudes are converted into the time domain, and then the data are collected by controlling the spectrum analyzer to obtain a more accurate target spectrum diagram, which helps to identify and quantify performance deviations in the test system; and by analyzing the target spectrum diagram, it is determined whether the test system meets the predetermined test standards. Automated standard compliance detection improves the efficiency of the test process, reduces the need for manual intervention, and can more easily identify problem points in the test system, such as offset, interference, etc., and then determine whether the system has deviations or does not meet the standards; thus, the method provides a more efficient, accurate and flexible test method, which helps to improve the reliability and efficiency of the entire test process.

[0128] In one embodiment, in the step of performing time domain conversion on the at least one frequency point and the amplitude corresponding to each of the at least one frequency point to obtain the time domain data corresponding to the at least one frequency point, the conversion unit 302 is further used to generate a spectrum data matrix according to the at least one frequency point and the amplitude corresponding to each of the at least one frequency point; and perform inverse Fourier transform calculation on the spectrum data matrix to obtain the time domain data corresponding to the at least one frequency point.

[0129] In one embodiment, in the process of performing signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain the target spectrum data, the determination unit 303 is further used to determine the number of sampling points according to the sampling rate and the sampling time; perform data preprocessing on the time domain data corresponding to the at least one frequency point to obtain a plurality of preprocessed time domain data; divide the plurality of preprocessed time domain data into a plurality of target segments according to the sampling time, the data length of each target segment being equal to the number of sampling points; perform Fourier transform calculation on the plurality of target segments to obtain the spectrum data corresponding to each of the plurality of target segments; and determine that the spectrum data corresponding to all of the target segments is the target spectrum data.

[0130] In one embodiment, in controlling the spectrum analyzer to collect the target spectrum data and obtain a target spectrum graph, the determination unit 303 is further used to set the sampling rate corresponding to the spectrum analyzer and the sampling rate corresponding to the acquisition parameter to the same value; control the spectrum analyzer to collect the target spectrum data according to the sampling rate corresponding to the acquisition parameter to obtain a target spectrum graph.

[0131] In one embodiment, before determining whether the test system meets the test standard according to the target spectrum diagram, the determination unit 303 is further used to obtain a first spectrum diagram according to the acquired acquisition parameters and the time domain data corresponding to the at least one frequency point.

[0132] In one embodiment, in determining whether the test system meets the test standard based on the target spectrum diagram, the determination unit 303 is further used to compare the target spectrum diagram with the first spectrum diagram to determine whether an offset point appears; determine whether the offset point is within a preset offset range; if it is within the preset offset range, determine that the current test system meets the test standard; or, if it is not within the preset offset range, determine that the current test system does not meet the test standard.

[0133] In one embodiment, after determining that the current test system does not meet the test standard if it is not within the preset offset range, the determination unit 303 is further used to obtain the position and amplitude of the offset point, and the degree of deviation of the offset point; analyze the offset point to obtain adjustment parameters, and the adjustment parameters are used to adjust the test system; and re-test according to the adjustment parameters.

[0134] It should be noted that the above-mentioned test device based on comb signals can execute the test method based on comb signals provided in the embodiment of the present application, and has the functional modules and beneficial effects corresponding to the execution method. For technical details not fully described in the embodiment of the test device based on comb signals, please refer to the test method based on comb signals provided in the embodiment of the present application.

[0135] See also Figure 4 , Figure 4 4 is a schematic diagram of a computer device provided in an embodiment of the present application. The computer device includes one or more processors 41 and a memory 42. The memory 42 is connected to the one or more processors 41, for example, connected to the processor 41 via a bus.

[0136] The processor 41 is configured to support the computer device to perform the corresponding functions in the method in the above method embodiment. The processor 41 can be a central processing unit (CPU), a network processor (NP), a hardware chip or any combination thereof. The above hardware chip can be an application specific integrated circuit (ASIC), a programmable logic device (PLD) or a combination thereof. The above PLD can be a complex programmable logic device (CPLD), a field-programmable gate array (FPGA), a generic array logic (GAL) or any combination thereof.

[0137] The memory 42 is used to store program codes, etc. The memory 42 may include a volatile memory (VM), such as a random access memory (RAM); the memory 42 may also include a non-volatile memory (NVM), such as a read-only memory (ROM), a flash memory, a hard disk drive (HDD) or a solid-state drive (SSD); the memory 42 may also include a combination of the above-mentioned types of memories.

[0138] The memory 42 can be used to store non-volatile software programs, non-volatile computer executable programs and modules, such as program instructions / modules corresponding to the comb signal-based test method in the embodiment of the present application. The processor 41 executes various functional applications and data processing of the comb signal-based test method and the comb signal-based test device by running the non-volatile software programs, instructions and modules stored in the memory 42, that is, realizes the functions of each module or unit of the comb signal-based test method and the comb signal-based test device provided in the above method embodiment.

[0139] The memory 42 may include a program storage area and a data storage area, wherein the program storage area may store an operating system and an application required by at least one function. The data storage area may store data created according to the use of the comb signal-based test device, etc. In some embodiments, the memory 42 may optionally include a memory 42 remotely arranged relative to the processor 41, and these remote memories 42 may be connected to the comb signal-based test device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0140] The one or more modules are stored in the memory 42, and when executed by the one or more processors 41, perform the comb signal-based test method in any of the above-mentioned method embodiments, for example, execute the method steps described in the above-mentioned method embodiments to realize the functions of the modules described in the above-mentioned device embodiments.

[0141] An embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, wherein the computer program includes program instructions, and when the program instructions are executed by a computer, the computer executes the method described in the above embodiment.

[0142] A person skilled in the art can understand that all or part of the processes in the above-mentioned embodiments can be implemented by instructing the relevant hardware through a computer program, and the program can be stored in a computer-readable storage medium, and when the program is executed, it can include the processes of the embodiments of the above-mentioned methods. The storage medium can be a disk, an optical disk, a read-only memory (ROM) or a random access memory (RAM), etc.

[0143] The above disclosure is only the preferred embodiment of the present application, which certainly cannot be used to limit the scope of rights of the present application. Therefore, equivalent changes made according to the claims of the present application are still within the scope covered by the present application.

Claims

1. A test method based on comb signals, characterized in that: Applied to a test system, the test system includes a spectrum analyzer, and the method includes: Acquire at least one frequency point based on the comb signal and an amplitude corresponding to each frequency point in the at least one frequency point; Performing time domain conversion on the at least one frequency point and the amplitude corresponding to each frequency point in the at least one frequency point to obtain time domain data corresponding to the at least one frequency point; According to the acquired acquisition parameters, signal processing is performed on the time domain data corresponding to the at least one frequency point to obtain target spectrum data; Controlling the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph; Determine whether the test system meets the test standard according to the target frequency spectrum.

2. The method according to claim 1, characterized in that: The step of performing time domain conversion on the at least one frequency point and the amplitude corresponding to each frequency point in the at least one frequency point to obtain time domain data corresponding to the at least one frequency point includes: Generate a frequency spectrum data matrix according to the at least one frequency point and the amplitude corresponding to each frequency point in the at least one frequency point; Perform inverse Fourier transform calculation on the frequency spectrum data matrix to obtain time domain data corresponding to the at least one frequency point.

3. The method according to claim 1, characterized in that The acquisition parameters include a sampling rate and a sampling time; and the signal processing is performed on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain the target spectrum data, including: Determine the number of sampling points according to the sampling rate and the sampling time; Performing data preprocessing on the time domain data corresponding to the at least one frequency point to obtain a plurality of preprocessed time domain data; Dividing the preprocessed multiple time domain data into multiple target segments according to the sampling time, wherein the data length of each target segment is equal to the number of sampling points; Performing Fourier transform calculation on the multiple target segments to obtain frequency spectrum data corresponding to each target segment in the multiple target segments; Determine that the spectrum data corresponding to each of the target segments is the target spectrum data.

4. The method according to claim 1, characterized in that The controlling the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph includes: The sampling rate corresponding to the spectrum analyzer and the sampling rate corresponding to the acquisition parameter are set to the same value; The spectrum analyzer is controlled to collect the target spectrum data according to the sampling rate corresponding to the acquisition parameter to obtain a target spectrum graph.

5. The method according to claim 1, characterized in that: Before determining whether the test system meets the test standard according to the target spectrum diagram, the method further includes: A first spectrum diagram is obtained according to the acquired acquisition parameters and the time domain data corresponding to the at least one frequency point.

6. The method according to claim 5, characterized in that The step of determining whether the test system meets the test standard according to the target frequency spectrum diagram includes: Comparing the target spectrum graph with the first spectrum graph to determine whether an offset point occurs; Determining whether the offset point is within a preset offset range; If it is within the preset offset range, it is determined that the current test system meets the test standard; or, If it is not within the preset offset range, it is determined that the current test system does not meet the test standard.

7. The method according to claim 6, characterized in that After determining that the current test system does not meet the test standard if the value is not within the preset offset range, the method further includes: Obtaining the position and amplitude of the offset point, and the degree of deviation of the offset point; Analyzing the offset point to obtain adjustment parameters, wherein the adjustment parameters are used to adjust the test system; Re-run the test according to the adjustment parameters.

8. A test device based on comb signals, applied to a test system, the test system comprising a spectrum analyzer, the device comprising: An acquisition unit, configured to acquire at least one frequency point based on the comb signal and an amplitude corresponding to each frequency point in the at least one frequency point; A conversion unit, configured to perform time domain conversion on the at least one frequency point and the amplitude corresponding to each frequency point in the at least one frequency point to obtain time domain data corresponding to the at least one frequency point; A determination unit, configured to perform signal processing on the time domain data corresponding to the at least one frequency point according to the acquired acquisition parameters to obtain target spectrum data; The determination unit is further used to control the spectrum analyzer to collect the target spectrum data to obtain a target spectrum graph; The determination unit is further configured to determine whether the test system meets a test standard according to the target frequency spectrum.

9. A computer device, comprising a memory and a processor, wherein the memory is connected to the processor, and the processor is used to execute one or more computer programs stored in the memory, and when the processor executes the one or more computer programs, the computer device implements the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, wherein the computer program includes program instructions, and when the program instructions are executed by a processor, the processor is caused to perform the method according to any one of claims 1 to 7.

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