Epoxy resin and glue impregnated paper sample wafer aging defect diagnosis and service life prediction system

Through the integration of a system of multiple test and analysis modules, the problem of unclear understanding of the aging mechanism of epoxy resin and impregnated paper and insufficient research on the influence of dielectric characteristics is solved, and the accurate evaluation of the aging state of the capacitor core and the accurate prediction of the lifespan are achieved. Improves the reliability and service life of electrical equipment.

CN119395274AInactive Publication Date: 2025-02-07GUANGZHOU POWER SUPPLY BUREAU GUANGDONG POWER GRID CO LTD
View PDF 4 Cites 0 Cited by

Patent Information

Application Number
CN202411288457.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-09-14
Publication Date
2025-02-07
Estimated Expiration
Not applicable · inactive patent

AI Technical Summary

Technical Problem

In the prior art, the aging mechanism of epoxy resin and impregnated paper is unclear, and the dielectric properties impacts are insufficient, making it difficult to accurately diagnose aging defects and predict lifespan.

Method used

Develop a system that integrates multiple test and analysis modules, including thermal aging processing module, dielectric characteristic testing module, main control module, mass loss calculation module, aging degree analysis module, physical and chemical characteristic detection module and life prediction module for Accurately evaluate the aging state of the capacitor core and predict its remaining life.

Benefits of technology

By simulating the heat influence during the operation of the transformer, combined with dielectric characteristic testing, mass loss calculation and physical and chemical characteristic testing, a comprehensive evaluation of the aging degree and accurate prediction of the life of epoxy resin and impregnated paper is achieved, and the reliability of electrical equipment is improved and service life.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN119395274A_ABST
    Figure CN119395274A_ABST
Patent Text Reader

Abstract

The invention belongs to the technical field of epoxy resin and impregnated paper sample wafer aging defect diagnosis, and discloses an epoxy resin and impregnated paper sample wafer aging defect diagnosis and service life prediction system. Comprising a thermal aging treatment module, a dielectric property test module, a main control module, a mass loss calculation module, an aging degree analysis module, a physicochemical property detection module and a life prediction module. According to the invention, a thermal aging test platform for the epoxy resin sample wafer and the epoxy impregnated paper sample wafer is established, the research on the aging degree rule of the sample wafer is completed from multiple angles of dielectric properties, Fourier infrared spectroscopy, mass loss rate and scanning electron microscope, and the research on the aging degree rule of the epoxy resin sample wafer and the epoxy impregnated paper sample wafer along with the deepening of the aging degree is elaborated. The changes of the surface appearance and the micromolecular structure of the dry-type bushing are explained in combination with the dielectric property, and a theoretical basis is provided for subsequent dry-type bushing aging degree judgment.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] The invention belongs to the technical field of epoxy resin and impregnated paper sample aging defect diagnosis, and in particular relates to an epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system. Background Art

[0002] As electrical insulation materials, epoxy resin and glue-impregnated paper are susceptible to thermal stress and aging during long-term operation, resulting in degradation of their insulation performance, posing a serious threat to the safe operation of equipment. Therefore, in-depth research on their aging mechanism and impact is of great significance for improving the reliability and service life of electrical equipment.

[0003] The research on the aging of epoxy resin has made some progress. Through accelerated aging experiments, scholars have conducted in-depth research on its thermal aging characteristics from the aspects of surface morphology and electrical parameters. Preetha P et al. found that thermal aging will cause the resistivity of epoxy resin and the dielectric loss value in the low-frequency band of the dielectric spectrum to increase significantly, and the aging rate of pure epoxy resin is faster. Gong Jin et al.'s research shows that high temperature can cause the cracking of epoxy resin materials and reduce their insulation properties, while the addition of inorganic nano-alumina particles can inhibit this aging process. Yang Y et al.'s experiment further revealed that thermal aging causes the oxidation and re-crosslinking of epoxy molecular chains, which in turn causes the glass transition temperature to drop. In addition, Wang et al.'s research also discovered the role of hot electrons in the aging process of epoxy resin, which will aggravate the occurrence of local discharge and lead to the generation of new radicals. These studies provide a theoretical basis for the aging status assessment of electrical equipment such as dry-type transformers. However, despite many studies, the specific changes in the dielectric properties of epoxy resin during aging and its relationship with aging time still need to be further explored.

[0004] The aging of insulating paper is also an important issue. Insulating paper is mainly composed of α-cellulose, and its thermal aging process is essentially the breaking of glycosidic bonds in cellulose molecules and the reduction of the number of glucose monomers. The "10°C aging criterion" proposed by Montsinger reveals the relationship between the aging rate of insulating paper and temperature. Zhang et al. constructed a model of cellulose pyrolysis by molecular dynamics method, which provided a new idea for the evaluation of the aging state of insulating paper. The research of Jocelyn J et al. found that the content of methanol in transformer oil can be used as an indicator to judge the average degree of polymerization of cellulose. These studies provide a useful reference for the evaluation of the degree of deterioration of insulating paper. However, there are currently more studies on oil-paper insulation, while there are relatively few studies on the characteristics of epoxy impregnated paper insulation. With the large-scale use of glue-impregnated paper bushings, it is particularly important to explore the insulation properties and aging mechanism of epoxy impregnated paper insulation.

[0005] In summary, current research has made some progress in the aging mechanism and impact of epoxy resin and insulating paper, but there are still many shortcomings. In particular, the aging mechanism of epoxy impregnated paper and its impact on dielectric properties need to be further explored. Therefore, developing a system that can accurately diagnose the aging defects of epoxy resin and glue-impregnated paper samples and predict their lifespan is of urgent practical significance for improving the reliability and service life of electrical equipment. Summary of the invention

[0006] In view of the problem that the aging mechanism of epoxy resin and impregnated paper is not clearly understood in the prior art and the influence of its dielectric properties is insufficiently studied, the present invention proposes a comprehensive epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system. This system integrates multiple test and analysis modules to accurately evaluate the aging state of the capacitor core and predict its remaining life.

[0007] The system described in the present invention mainly includes the following modules:

[0008] Thermal aging treatment module: This module is closely connected with the main control module and is specifically used to simulate the thermal impact of long-term operation of the transformer, study the changes in the physical and chemical properties of the insulation material under elevated temperature conditions, and the resulting aging phenomenon.

[0009] Dielectric property test module: This module is also connected to the main control module and is responsible for dielectric response testing of epoxy resin and epoxy impregnated paper samples at different aging stages to obtain data on changes in their dielectric properties. The test conditions are set at 50°C temperature and 200V output voltage to ensure the consistency and accuracy of the test.

[0010] Main control module: As the core of the system, the main control module is connected to all other modules and is responsible for coordinating and controlling the normal operation of each module to ensure the smooth progress of the testing and analysis process.

[0011] Mass loss calculation module: This module uses a precision weighing balance (range 120g, sensitivity 0.0001g) to weigh the sample before and after the experiment, calculate and record the mass loss of the sample, and provide important data for the analysis of the degree of aging.

[0012] Aging degree analysis module: Based on the data from the mass loss calculation module, this module further analyzes the aging degree of epoxy resin and impregnated paper samples to provide a basis for subsequent life prediction.

[0013] Physical and chemical properties detection module: This module uses Fourier transform infrared spectroscopy (FTIR) and scanning electron microscopy (SEM) to detect the physical and chemical properties of aged samples. FTIR is used to analyze the chemical bonds and functional group composition inside the material, while SEM is used to observe and record the surface morphology changes under different insulation defects.

[0014] Life prediction module: Based on the data and analysis results of the previous modules, this module is responsible for predicting the remaining life of epoxy resin and impregnated paper samples, providing a scientific basis for equipment maintenance and replacement.

[0015] Further, the dielectric property test module method:

[0016] Based on the dielectric response test platform, the test temperature was set to 50°C, the output voltage of the dielectric response diagnostic instrument was set to 200V, and dielectric response tests were carried out on epoxy resin and epoxy impregnated paper samples under different aging conditions.

[0017] Further, the mass loss calculation module method:

[0018] Before the aging experiment begins, weigh the sample and record the initial mass of the sample. Weighing is performed using a precision weighing balance with a range of 120g and a sensitivity of 0.0001g.

[0019] Before the thermal aging experiment, the initial mass of the epoxy resin sample was measured using a precise electronic balance. After each cycle of the aging experiment, the samples were taken out and the mass was measured again after cooling to obtain the mass loss of the sample before and after the experiment. The mass loss rate is shown in the formula:

[0020]

[0021] Where: m0 is the initial mass of the sample before the experiment; m i is the sample mass after the experiment; m0-m i is the mass loss before and after the test; η is the mass loss rate of the sample; i is the sample number.

[0022] Further, the physical and chemical properties detection module method:

[0023] (1) Fourier transform infrared spectroscopy FTIR;

[0024] (2) Scanning electron microscope (SEM) surface morphology observation.

[0025] Further, the Fourier transform infrared spectroscopy FTIR:

[0026] The different chemical bonds inside the polymer and the atoms that make up the chemical groups are constantly moving, and their vibration modes and frequencies are different. When the vibration frequency of the infrared light irradiated on the polymer is the same as the vibration frequency of the chemical bonds and groups, the infrared light will be absorbed. By analyzing the Fourier transform infrared spectrum, the composition of the chemical bonds and functional groups inside the substance can be obtained.

[0027] Further, the scanning electron microscope (SEM) surface morphology observation:

[0028] SEM can be used to record the surface morphology of epoxy resin and epoxy impregnated paper materials under different insulation defects, and to explain the reasons for the changes in their dielectric properties from another perspective. The steps for using scanning electron microscope SEM to observe the surface morphology in the thermal aging experiment of epoxy resin and impregnated paper are as follows:

[0029] The surfaces of epoxy resin and impregnated paper samples were treated with gold spraying;

[0030] After the processed sample to be tested is subjected to gold spraying treatment, it is pasted on a slide;

[0031] The surface morphology of epoxy resin before and after aging was observed using scanning electron microscopy.

[0032] In addition, the present invention also proposes a method for diagnosing aging defects and predicting life of epoxy resin and impregnated paper samples, the method comprising the following steps:

[0033] Step 1: Use the thermal aging treatment module to simulate the heat impact during transformer operation to cause aging of the insulation material.

[0034] Step 2: Perform dielectric response tests on samples under different aging conditions using the dielectric properties test module.

[0035] Step 3: The main control module calls the mass loss calculation module to calculate the mass loss of the sample.

[0036] Step 4: The aging degree analysis module evaluates the aging degree of the capacitor core based on the mass loss data.

[0037] Step 5: The physical and chemical properties detection module performs detailed physical and chemical properties detection on the aged samples.

[0038] Step 6: The life prediction module predicts the remaining life of the capacitor core based on the aforementioned data and analysis results.

[0039] In order to further realize the functions of the present invention, the present invention also proposes a computer device, which includes a memory and a processor. The memory stores a computer program, and when the program is executed by the processor, all steps of the above-mentioned epoxy resin and impregnated paper sample aging defect diagnosis and life prediction method will be executed.

[0040] At the same time, the present invention also proposes a computer-readable storage medium, on which a computer program is stored. When the program is executed by a processor, all the steps of the above method will also be executed.

[0041] Finally, the present invention also proposes an information data processing terminal, which is specially used to realize all the functions of the above-mentioned epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system.

[0042] In summary, the present invention provides a comprehensive and accurate epoxy resin and impregnated paper aging defect diagnosis and life prediction system and method by integrating multiple testing and analysis modules, providing a scientific basis for the maintenance and replacement of electrical equipment.

[0043] In combination with the above technical solutions and the technical problems solved, the advantages and positive effects of the technical solutions to be protected by the present invention are as follows:

[0044] First, the present invention has built a thermal aging test platform for epoxy resin samples and epoxy impregnated paper samples, and completed a 21-day aging process at three temperatures of 150°C, 180°C, and 200°C for the aged samples under thermal stress. The present invention integrates a thermal aging treatment module, a dielectric property test module, a main control module, a mass loss calculation module, an aging degree analysis module, a physical and chemical property detection module, and a life prediction module to construct a comprehensive epoxy resin and epoxy impregnated paper thermal aging defect diagnosis and life prediction system. The system can simulate the heat effects of the transformer in long-term operation, perform aging treatment on the insulating material, and obtain the change data of its dielectric properties through dielectric response testing. Combined with mass loss calculation and physical and chemical property detection, the present invention can accurately evaluate the aging degree of epoxy resin and epoxy impregnated paper, and predict its remaining life based on these data.

[0045] The technical solution of the present invention has shown remarkable creativity in solving the above-mentioned technical problems. First, by simulating the heat effects in the actual operation of the transformer, the present invention can more realistically reflect the aging of the insulating material in the capacitor core during long-term use, thereby improving the accuracy of aging defect diagnosis. Secondly, the present invention combines multiple means such as dielectric property testing, mass loss calculation and physical and chemical property testing to provide more comprehensive aging assessment information. For example, the dielectric property test can sensitively capture the changes in the dielectric constant and dielectric loss of the capacitor core, which are often closely related to the degree of aging. The mass loss calculation can reflect the quality changes of epoxy resin and epoxy impregnated paper during the aging process, providing an important basis for evaluating the degree of aging. The physical and chemical property testing can further reveal the chemical mechanism of aging of epoxy resin and epoxy impregnated paper, providing a scientific basis for formulating effective maintenance strategies.

[0046] The creative technical effects of the present invention are also reflected in the following aspects: First, by integrating multiple testing and analysis methods, the present invention provides more comprehensive aging defect diagnosis information, which helps to more accurately judge the aging state of the capacitor core. Secondly, based on big data and machine learning algorithms, the present invention realizes accurate prediction of the life of epoxy resin and epoxy impregnated paper. This prediction result can provide a scientific basis for the maintenance and replacement of electrical equipment, avoiding waste of resources or equipment failure caused by premature or late maintenance. Finally, the application of the present invention also helps to improve the operating safety and reliability of electrical equipment and reduce the risk of failure caused by equipment aging.

[0047] In summary, the present invention solves the key technical problems in the diagnosis of aging defects and life prediction of epoxy resin and impregnated paper samples through innovative technical solutions, and demonstrates significant creative technical effects. In practical applications, the present invention is expected to provide a more scientific and accurate basis for the maintenance and replacement of electrical equipment.

[0048] Second, the expected benefits and commercial value of the technical solution of the present invention after transformation are:

[0049] The present invention proposes an innovative epoxy resin and glue-impregnated paper sample aging defect diagnosis and life prediction system, which integrates core modules such as thermal aging treatment, dielectric property test, mass loss calculation, physical and chemical property detection and life prediction. This technical solution is expected to significantly improve the scientificity and accuracy of electrical equipment maintenance, reduce the risk of failure caused by equipment aging, thereby bringing significant economic and social benefits, and filling the technical gap in the field of epoxy resin and impregnated paper sample aging diagnosis and life prediction at home and abroad.

[0050] The technical solution of the present invention fills the technical gap in the industry at home and abroad:

[0051] The technical solution of the present invention fills the technical gap in comprehensive diagnosis of aging defects and accurate life prediction of epoxy resin and epoxy impregnated paper. By simulating actual operating conditions and integrating multiple testing and analysis methods, the present invention achieves a comprehensive and accurate assessment of the aging state of epoxy resin and epoxy impregnated paper, and predicts the life based on these data. The proposal and implementation of this technical solution overcomes the previous technical bias of relying only on a single test method or simple model for aging assessment, and provides a more reliable technical guarantee for the maintenance and operation safety of electrical equipment.

[0052] (3) The technical solution of the present invention solves the technical problems that people have been eager to solve but have never been able to solve successfully:

[0053] For a long time, the diagnosis of aging defects and life prediction of epoxy resin and epoxy impregnated paper have been a difficult problem in the field of electrical engineering. The existing technology is difficult to accurately evaluate the aging state and remaining life of epoxy resin and epoxy impregnated paper. The present invention successfully solves this technical problem by comprehensively applying a variety of testing means and analysis methods, provides a scientific basis for the maintenance and replacement of electrical equipment, and overcomes the prejudice in the previous technology that it is impossible to comprehensively and accurately diagnose and predict the aging state of epoxy resin and epoxy impregnated paper.

[0054] Third, the existing technical problems solved by the technical solution and the significant technological progress.

[0055] 1. Existing technical problems solved

[0056] In the prior art, the aging diagnosis and life prediction methods of insulating materials such as epoxy resin and impregnated paper have the following main problems:

[0057] Aging detection is not comprehensive: Traditional methods usually only focus on one aspect of aging characteristics, such as dielectric loss or mechanical strength, and lack a comprehensive assessment of the material aging process, making it difficult to accurately reflect the overall aging status of the material.

[0058] Insufficient accuracy of life prediction: Most existing life prediction models are based on a single factor, such as temperature or stress, and ignore the coupling of multiple factors, resulting in low accuracy and reliability of life prediction results.

[0059] Lack of automation and real-time performance: Traditional aging diagnosis and life prediction rely on manual operations and offline data analysis, lacking real-time and automation capabilities, and unable to meet the needs of modern industry for fast and accurate diagnosis.

[0060] 2. Significant technological progress

[0061] The present invention provides an epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system, which integrates multiple modules to achieve all-round detection of insulation material aging and accurate life prediction, and has the following significant technical advances:

[0062] Comprehensive aging evaluation: Through the collaborative work of the thermal aging treatment module, the dielectric property test module, the mass loss calculation module, and the physical and chemical property detection module, the present invention can comprehensively evaluate the physical, chemical, electrical and other properties of the epoxy resin and the impregnated paper sample during the aging process, and realize a comprehensive diagnosis of the material aging status.

[0063] High-precision life prediction: The life prediction module of the present invention is based on a variety of aging data and a variety of life prediction algorithms. It provides more accurate life prediction results by comprehensively analyzing the aging rate and a variety of environmental factors. This combination of multiple factors and multiple models significantly improves the accuracy and reliability of life prediction.

[0064] Automation and real-time diagnosis: The system adopts a main control module to realize the automated operation and data collection of each detection and analysis module. It can monitor the aging status of insulation materials in real time and perform diagnosis and prediction immediately, meeting the industrial field's demand for fast and efficient diagnosis.

[0065] Data fusion and intelligent analysis: The system introduces data fusion and intelligent analysis technology to deeply integrate and analyze the data obtained from each module. It can identify subtle aging characteristics and potential defects, thereby providing more accurate data support for maintenance decisions.

[0066] Through the above technological advances, the present invention significantly improves the ability of insulation material aging diagnosis and life prediction, has high application value, and provides important guarantee for the safe operation of equipment such as power transformers. BRIEF DESCRIPTION OF THE DRAWINGS

[0067] Figure 1 It is a structural block diagram of the epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system provided by an embodiment of the present invention.

[0068] Figure 2 It is a flow chart of the method for diagnosing aging defects and predicting life of epoxy resin and impregnated paper samples provided by an embodiment of the present invention.

[0069] Figure 3 These are pictures of epoxy resin samples at different aging temperatures provided by the embodiments of the present invention; (a) 150°C, (b) 180°C, and (c) 200°C.

[0070] Figure 4 2 are pictures of epoxy impregnated paper samples at different aging temperatures provided in the embodiments of the present invention; (a) 150°C, (b) 180°C, (c) 200°C.

[0071] Figure 5 It is a graph of tanδ-f curves (50°C) of pure epoxy resin at different aging times provided in an embodiment of the present invention.

[0072] Figure 6 ε*-f curves of epoxy resins with different aging times provided in the embodiments of the present invention; (a) ε'-f curve, (b) ε"-f curve.

[0073] Figure 7 It is a tanδ-f curve diagram of epoxy impregnated paper with different aging times provided in an embodiment of the present invention.

[0074] Figure 8 ε*-f curves of epoxy impregnated paper with different aging times provided in the embodiments of the present invention; (a) ε'-f curve, (b) ε"-f curve.

[0075] Fig. 9 1 is a mass change trend diagram of aged samples at 150° C. provided in an embodiment of the present invention; (a) EP-3, (b) mass change curve diagram after translation.

[0076] Fig.10 2. The graph of mass loss rate of aged samples at different temperatures provided by the embodiments of the present invention; (a) epoxy sample, (b) epoxy impregnated paper sample.

[0077] Fig.11 This is a graph showing the FTIR test results of an aged sample provided by an embodiment of the present invention.

[0078] Fig.12 It is a reaction diagram of the change of absorption peak intensity near 2931cm-1 provided in an embodiment of the present invention.

[0079] Fig.13 This is a picture of an epoxy sample after gold spraying treatment provided by an embodiment of the present invention.

[0080] Fig.14 This is a surface morphology diagram of an unaged sample provided by an embodiment of the present invention.

[0081] Fig.15 The surface morphology of the aged sample provided by the embodiment of the present invention is as follows: (a) agglomeration (b) protrusion (c) damage (d) accumulation of foreign matter.

[0082] Figure 1 In: 1. Thermal aging treatment module; 2. Dielectric properties test module; 3. Main control module; 4. Mass loss calculation module; 5. Aging degree analysis module; 6. Physical and chemical properties detection module; 7. Life prediction module. DETAILED DESCRIPTION

[0083] In order to make the purpose, technical solution and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0084] Embodiment 1

[0085] like Figure 1 As shown, the embodiment of the present invention provides a highly integrated epoxy resin and glue-impregnated paper sample aging defect diagnosis and life prediction system including:

[0086] Thermal aging treatment module 1, dielectric property test module 2, main control module 3, mass loss calculation module 4, aging degree analysis module 5, physical and chemical property detection module 6, life prediction module 7.

[0087] The heat aging treatment module 1 is connected to the main control module 3 and is used to simulate the heat accumulation effect during the long-term operation of the transformer, which causes the temperature of the insulating material (especially epoxy resin and glue-impregnated paper) to rise, thereby causing changes in its physical and chemical properties, and ultimately causing material aging;

[0088] The dielectric property test module 2 is connected to the main control module 3 and is used to perform dielectric response tests on epoxy resin and epoxy impregnated paper samples at different aging stages. By setting specific test conditions (such as temperature 50°C, output voltage 200V), the changes in the dielectric properties of the material with aging can be accurately captured;

[0089] The main control module 3 is connected with the thermal aging treatment module 1, the dielectric property test module 2, the mass loss calculation module 4, the aging degree analysis module 5, the physical and chemical property detection module 6, and the life prediction module 7, and is responsible for coordinating and controlling the normal operation of all other modules to ensure the smooth data flow and the accurate execution of the processing logic;

[0090] The mass loss calculation module 4 is connected to the main control module 3 and is used to calculate the mass loss of the sample before and after the experiment;

[0091] An aging degree analysis module 5, connected to the main control module 3, is used to analyze the aging degree of the epoxy resin and the impregnated paper sample;

[0092] The physical and chemical property detection module 6 is connected to the main control module 3 and is used to detect the physical and chemical properties of the aged sample;

[0093] The life prediction module 7 is connected to the main control module 3 and is used to predict the life of the epoxy resin and the impregnated paper sample.

[0094] Working principle of aging defect diagnosis and life prediction system for epoxy resin and impregnated paper samples.

[0095] 1. Working principle of thermal aging treatment module

[0096] The thermal aging treatment module is responsible for simulating the thermal effects generated by the transformer during long-term operation. By controlling the sample to undergo a long-term thermal aging treatment at a certain temperature, the module exposes the epoxy resin and impregnated paper samples to a high temperature environment to accelerate the aging process of the insulation material. During the thermal aging process, the physical and chemical properties of the sample will change, such as pyrolysis, oxidation and cross-linking reactions, resulting in material deterioration. By precisely controlling the temperature and time, the thermal aging treatment module can effectively simulate the aging process in actual operation and provide reliable basic data for subsequent dielectric property testing and life prediction.

[0097] 2. Working principle of dielectric properties test module

[0098] The dielectric properties test module is used to perform dielectric response tests on epoxy resin and impregnated paper samples under different aging conditions. The module measures key parameters such as the dielectric constant and dielectric loss factor of the samples by applying an electric field within a certain frequency range. These dielectric parameters can reflect the insulation performance and electrical property changes of the material, thereby identifying defects and performance degradation caused by aging. By comparing the dielectric property data under different aging conditions, the test module can provide detailed information on the degree of material aging and assist in judging the health status of the insulating material.

[0099] 3. Working principle of mass loss calculation module

[0100] The mass loss calculation module is used to calculate the mass change of the sample before and after thermal aging treatment. The module measures the initial mass and the mass after aging of the sample through a precision balance to calculate the mass loss rate. The mass loss rate is one of the important indicators for evaluating the degree of thermal aging of materials, which can reflect the loss of volatile components and structural decomposition in the material. By correlating mass loss with aging time and temperature, the mass loss calculation module provides quantitative data support for subsequent aging degree analysis and life prediction.

[0101] 4. Working principle of aging degree analysis module

[0102] The aging degree analysis module comprehensively utilizes the data obtained from the thermal aging treatment, dielectric property test and mass loss calculation modules to analyze the aging degree of epoxy resin and impregnated paper samples. This module uses a variety of analysis algorithms, such as accelerated aging curve fitting, dielectric loss analysis and mass loss curve analysis, to quantitatively evaluate the aging state of the material. By comparing with standard aging data, this module can identify defects and performance degradation of the material in actual operation, thereby providing reliable diagnostic results.

[0103] 5. Working principle of the physical and chemical properties detection module

[0104] The physical and chemical properties detection module is used to detect the physical and chemical properties of the aged samples, such as mechanical strength, molecular structure, chemical composition, etc. This module uses thermogravimetric analysis, tensile testing, infrared spectroscopy and other methods to analyze in detail the changes in the physical and chemical properties of the samples during the aging process. These physical and chemical property data can supplement the information that cannot be fully reflected by dielectric property testing and mass loss calculation, providing the system with a more complete basis for aging diagnosis.

[0105] 6. Working principle of life prediction module

[0106] The life prediction module uses the life prediction algorithm to predict the remaining life of epoxy resin and impregnated paper samples based on the data provided by the above modules. This module uses the Arrhenius model, accelerated life test model or machine learning algorithm to predict the remaining service life of the samples under different operating conditions based on the aging rate and existing aging degree of the material. By comparing the results of different prediction models, the life prediction module can provide accurate life estimates and provide a scientific basis for the maintenance and replacement of transformers.

[0107] Through the coordinated work of various modules, this system achieves comprehensive diagnosis and life prediction of the aging process of epoxy resin and impregnated paper samples, effectively improving the reliability assessment capability of the transformer insulation system.

[0108] The dielectric property test module method provided by the embodiment of the present invention:

[0109] Based on the dielectric response test platform, the test temperature was set to 50°C, the output voltage of the dielectric response diagnostic instrument was set to 200V, and dielectric response tests were carried out on epoxy resin and epoxy impregnated paper samples under different aging conditions.

[0110] The quality loss calculation module method provided by the embodiment of the present invention is as follows:

[0111] Before the aging experiment begins, weigh the sample and record the initial mass of the sample. Weighing is performed using a precision weighing balance with a range of 120g and a sensitivity of 0.0001g.

[0112] Before the thermal aging experiment, the initial mass of the epoxy resin sample was measured using a precise electronic balance. After each cycle of the aging experiment, the samples were taken out and the mass was measured again after cooling to obtain the mass loss of the sample before and after the experiment. The mass loss rate is shown in the formula:

[0113]

[0114] Where: m0 is the initial mass of the sample before the experiment; m i is the sample mass after the experiment; m0-m i is the mass loss before and after the test; η is the mass loss rate of the sample; i is the sample number.

[0115] The physical and chemical property detection module method provided by the embodiment of the present invention:

[0116] (1) Fourier transform infrared spectroscopy FTIR;

[0117] (2) Scanning electron microscope (SEM) surface morphology observation.

[0118] The Fourier transform infrared spectrum FTIR provided by the embodiment of the present invention is:

[0119] The different chemical bonds inside the polymer and the atoms that make up the chemical groups are constantly moving, and their vibration modes and frequencies are different. When the vibration frequency of the infrared light irradiated on the polymer is the same as the vibration frequency of the chemical bonds and groups, the infrared light will be absorbed. By analyzing the Fourier transform infrared spectrum, the composition of the chemical bonds and functional groups inside the substance can be obtained.

[0120] Scanning electron microscope (SEM) surface morphology observation provided by the embodiment of the present invention:

[0121] SEM can be used to record the surface morphology of epoxy resin and epoxy impregnated paper materials under different insulation defects, and explain the reasons for the changes in their dielectric properties from another perspective; when using scanning electron microscope SEM to observe the surface morphology in the epoxy resin thermal aging experiment, the surface of the epoxy resin sample is sprayed with gold;

[0122] After the processed sample to be tested is subjected to gold spraying treatment, it is pasted on a slide;

[0123] The surface morphology of epoxy resin before and after aging was observed using scanning electron microscopy.

[0124] Embodiment 2

[0125] like Figure 2 As shown, an epoxy resin and impregnated paper sample aging defect diagnosis and life prediction method provided by an embodiment of the present invention includes:

[0126] S101, using the thermal aging treatment module, simulates the heat accumulation effect of the transformer in long-term operation, which causes the temperature of the insulating material (especially epoxy resin and glue-impregnated paper) to rise. Under this effect, the physical and chemical properties of the insulating material will change, which will cause the aging and deterioration of the material;

[0127] S102, through the dielectric properties test module, the dielectric response test of epoxy resin and epoxy impregnated paper samples under different aging conditions is carried out systematically. The test conditions are strictly controlled (such as the temperature is set at 50°C and the output voltage is 200V) to ensure the accuracy and repeatability of the data, so as to accurately capture the changes in the dielectric properties of the material with the degree of aging;

[0128] S103, the main control module calls the mass loss calculation module to perform high-precision mass weighing of the samples before and after the experiment (using a precision balance with a range of 120g and a sensitivity of 0.0001g), and calculate the mass loss, which provides an important quantitative basis for the analysis of the degree of aging;

[0129] S104, analyzing the aging degree of the epoxy resin and the impregnated paper samples through an aging degree analysis module;

[0130] S105, through the physical and chemical properties detection module to detect the physical and chemical properties of the aged samples, using two core technologies: Fourier transform infrared spectroscopy (FTIR) and scanning electron microscope (SEM) surface morphology observation. FTIR technology is used to analyze the changes in chemical bonds and functional groups inside the material, while SEM technology directly observes the microscopic structural changes on the surface of the material. The combination of the two can comprehensively analyze the aging mechanism from the molecular level to the macroscopic morphology;

[0131] S106, predicting the remaining service life of the epoxy resin and the epoxy impregnated paper by integrating the data and analysis results of all the above steps through the service life prediction module.

[0132] Another object of the present invention is to provide a computer device, which includes a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor executes the steps of the epoxy resin and impregnated paper sample aging defect diagnosis and life prediction method.

[0133] Another object of the present invention is to provide a computer-readable storage medium storing a computer program, which, when executed by a processor, enables the processor to execute the steps of the epoxy resin and impregnated paper sample aging defect diagnosis and life prediction method.

[0134] Another object of the present invention is to provide an information data processing terminal, which is used to implement the epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system.

[0135] The epoxy resin and glue-impregnated paper sample aging defect diagnosis and life prediction system proposed in the present invention has a wide range of innovative and significant technical value in the field of electrical engineering. The following is a detailed description of the application examples of the technical solution in specific products and related technologies:

[0136] The system of the present invention can be widely used in the aging diagnosis and life prediction of insulation materials of high-voltage electrical equipment such as power transformers, capacitors, and cables. In particular, the present invention has demonstrated outstanding technical advantages in the aging management of epoxy resin and impregnated paper samples. By accurately diagnosing the aging defects of epoxy resin and impregnated paper samples and combining them with advanced life prediction models, the present invention provides a scientific basis for the maintenance and management of electrical equipment, effectively improving the safe operation level and service life of the equipment.

[0137] In addition, in the relevant technical field, the present invention also provides a new aging defect diagnosis and life prediction tool for the equipment operation and maintenance department of the power industry. By regularly testing and evaluating the electrical equipment in operation, the operation and maintenance department can promptly discover potential aging problems and take effective repair or replacement measures, thereby avoiding power outages and economic losses caused by equipment failures.

[0138] In summary, the epoxy resin and glue-impregnated paper sample aging defect diagnosis and life prediction system of the present invention is not only innovative in technical solutions, but also demonstrates significant technical value and application potential in specific products and related technical fields. The successful implementation of this invention will bring revolutionary changes to the maintenance and management of electrical equipment and promote the sustainable and healthy development of the power industry.

[0139] The present invention aims to solve the problem of performance degradation and potential failure of epoxy resin and glue-impregnated paper composite materials due to aging during long-term use in the prior art. By integrating advanced detection and analysis technologies, the present invention realizes effective monitoring of the material aging process and accurate prediction of the remaining life, providing reliable technical support for engineering applications, as follows:

[0140] Epoxy resin and epoxy impregnated paper samples at different aging stages Figure 3 and Figure 4 shown.

[0141] Among them, from left to right and from top to bottom in the figure are epoxy resin and epoxy impregnated paper samples aged for 1, 3, 6, 9, 12, 15, 18, and 21 days. At the same aging temperature, as the aging time increases, the color of the epoxy resin and epoxy impregnated paper samples gradually deepens; when the aging time is the same, the higher the aging temperature, the greater the degree of aging of the sample. It can be clearly observed that as the degree of aging gradually deepens, the color of the sample gradually changes from transparent-light yellow-yellow-brown-dark brown-black; at an aging temperature of 200°C, the aging progress is extremely rapid, and the sample becomes brittle and easy to break in the later stage of aging.

[0142] Dielectric properties of aged samples

[0143] Based on the dielectric response test platform, the test temperature was set to 50°C, the output voltage of the dielectric response diagnostic instrument was set to 200V, and dielectric response tests were carried out on epoxy resin and epoxy impregnated paper samples under different aging conditions.

[0144] (1) Epoxy resin sample

[0145] The tanδ-f curves of epoxy resin under different aging times are as follows Figure 5As shown in the figure. As the frequency increases, the tangent value of the dielectric loss angle tanδ first decreases and then increases. When the aging time gradually increases, the tanδ-f curve of epoxy resin shows varying degrees of changes. Based on the changes in dielectric properties in different frequency bands, the tanδ-f curve is divided into three regions as shown in Figure 5 S1(0.001Hz < f < 0.01Hz), S2(0.01Hz < f < 100Hz), and S3(100Hz < f < 5000Hz). When the aging degree deepens, the changes in regions S1 and S3 are not obvious; however, it can be clearly found from region S2 that the longer the aging time, the greater the tangent value of the dielectric loss angle tanδ in this region. During the aging process, the sample to be measured is always in a high-temperature environment. Under the action of thermal stress, the main chain and side chains of epoxy resin begin to crack and oxidize, and a large number of free radicals and dipoles fill the material interior; at the same time, since the curing agent gradually decomposes into free acids at high temperatures, the generation of polar groups causes a significant increase in material polarization. Under the action of an alternating voltage, the dielectric loss value of epoxy resin gradually increases.

[0146] The ε*-f curves of epoxy resin under different aging times are as shown in Figure 6 the figure, Figure 6 (a) As the frequency of the externally applied excitation signal decreases, the real part of the dielectric constant of different aging times shows a gradually increasing trend. In the frequency range of 1 - 5000Hz, the increase in ε' of each aged sample is not obvious; while when the frequency is between 0.001 - 1Hz, ε' increases approximately exponentially with decreasing frequency, and the slope of the curve gradually increases. The real part of the dielectric constant and the real part of the capacitance have the same physical meaning and can characterize the ability of the dielectric to store charge. At lower frequencies, the amplitude of the ε'-f curve is larger, indicating that the charge storage ability of epoxy resin at low frequencies is stronger and the polarity is greater. The longer the aging time, the larger the real part of the dielectric constant of epoxy resin in the low-frequency band (0.001 - 1Hz), indicating that polar molecules are generated during the aging process, and the molecular chains of epoxy resin break under the action of high temperature, generating substances with stronger polarity. The change in the amplitude of the real part in the high-frequency band (1 - 5000Hz) is not obvious because the relaxation polarization characteristic frequency of the generated polar substances is closer to the low-frequency band. Figure 6 (b) The variation trend of the amplitude of ε” with frequency and aging time is similar to the variation trend of tanδ, which is because their physical meanings both represent the energy loss generated inside the dielectric when an external excitation signal is applied to the dielectric. Therefore, the reason for the change in the ε”-f curve is similar to that of the tanδ-f curve.

[0147] (2) Epoxy-impregnated paper specimens

[0148] The tanδ-f curves of epoxy-impregnated paper under different aging times are as shown in Figure 7As shown. As the aging time increases, the dielectric loss values in each frequency band of the dielectric spectroscopy curve increase to varying degrees. When 0.02 Hz < f < 1 Hz, the dielectric loss value tanδ does not show an obvious change; when 1 Hz < f < 5000 Hz, the dielectric loss value tanδ gradually increases, and the tanδ-f curves under different aging times are in the shape of a "shuttle", that is, the growth rate in the middle frequency band (about 500 Hz) is greater than that at both ends. As the aging degree deepens, a loss peak gradually appears in this frequency band. This is because the longer the aging time, the more severe the cleavage of the epoxy resin molecular chain, and the characteristic frequency of the generated polar small molecular chains is consistent with the frequency of the applied external electric field, resulting in the appearance of the characteristic loss peak; when 0.001 Hz < f < 0.02 Hz, the dielectric loss value in the low-frequency band shows a significant increase, which is related to the small molecules such as acids generated by epoxy resin and cellulose molecules under thermal aging. Under the action of oxygen, epoxy resin will generate a large number of substances containing carbonyl groups such as acids, aldehydes, and ketones. On the other hand, under high-temperature conditions, water molecules are easily hydrogen-bonded to cellobiose molecules, destroying the cellobiose structure, and the cleavage of cellobiose will produce water and acids. Among them, moisture and small molecules of acid will significantly increase the low-frequency conductivity loss of epoxy-impregnated paper, which is reflected in Figure 7 as an increase in the slope of the low-frequency segment of the tanδ-f curve.

[0149] The ε*-f curves of epoxy-impregnated paper with different aging times are as shown in Figure 8 shown, Figure 8 (a). As the excitation voltage frequency decreases, ε’ as a whole shows an upward trend; as the aging degree deepens, compared with pure epoxy resin, the amplitudes in each frequency band of epoxy-impregnated paper have increased to a greater extent. This is because the degree of thermal aging of crepe paper is more sensitive, that is, in a high-temperature environment for a certain period of time, the degree of fracture of the main component cellulose molecules of crepe paper is greater than that of pure epoxy resin, and the reaction is more intense, and at the same time, more polar molecules can be generated. Therefore, not only in the low-frequency band, but also the growth rate of ε’ of epoxy-impregnated paper in the high-frequency band is greater than that of epoxy resin. Similar to epoxy resin, the imaginary part of the complex dielectric constant of epoxy-impregnated paper has a similar physical meaning to the dielectric loss, so the curve change rules of the two are similar.

[0150] Relationship between mass loss and aging degree

[0151] Before the aging experiment, the samples were weighed and the initial mass of the samples was recorded. The weighing was carried out using a precision weighing balance with a measuring range of 120 g and a sensitivity of 0.0001 g. To reduce accidental errors caused by operation, measurement or other factors, 3 samples of epoxy resin and epoxy-impregnated paper were taken for thermal aging tests, and the mass after each aging cycle was recorded.

[0152] During the aging process from 0 to 21 days, the mass change curve of the No. 3 sample of epoxy resin at an aging temperature of 150 °C is as shown in Fig. 9 As shown in (a), the mass changes of all samples are plotted as a curve and offset as shown in Fig. 9 As shown in (b), it can be clearly observed that the quality has a significant decline in the first cycle of the aging test. This is because the unaged epoxy sample contains a small amount of moisture. In the first cycle of aging, the moisture gradually evaporates and dissipates, resulting in an approximately exponential decline in the initial quality. In the later stage of aging, the quality change rate gradually slows down. The quality change trends of the pure epoxy sample and the epoxy impregnated paper sample are exactly the same. Therefore, in subsequent experiments, the aging quality loss of epoxy resin and epoxy impregnated paper samples are based on the data of sample No. 1 as the standard.

[0153] Since the factors such as incomplete drying of moisture and post-curing of the sample affect the quality change during the first day of aging, the present invention uses the mass measured after the first day of aging as the initial mass m0 when analyzing the mass loss rate. The mass loss rates of epoxy resin samples and epoxy impregnated paper samples at different temperatures (all based on the data of sample No. 1) are shown in Table 1:

[0154] Table 1 Mass loss rate of epoxy resin samples at different experimental temperatures

[0155]

[0156]

[0157] According to the data in Table 1, draw a curve graph, such as Fig.10 As shown, the horizontal axis is the sample aging time, and the vertical axis is the sample mass loss rate.

[0158] Depend on Fig.10 The curve analysis shows that if the experimental temperature is kept constant, the mass loss rate will continue to increase with the increase of aging time in the experiment; if the aging time is kept constant, the higher the experimental temperature, the more mass loss of the sample; at different experimental temperatures, the growth rate of mass loss is different with the increase of aging time. The lower the temperature, the smaller the growth rate and the slower the mass loss. By comparing the three curves, it can be clearly seen that at the experimental temperatures of 150℃ and 180℃, the mass loss rate increases slowly before the aging time of 200h, but the change amplitude is slow. After 200h, the growth rate of mass loss tends to be stable until 504h, when the mass loss rate reaches 1 to 2 times of the initial one. The curve with an experimental temperature of 200℃ is quite special. At the beginning of aging, the growth rate of mass loss is very large, and with the increase of aging time, the growth rate of mass loss rate gradually decreases. When the aging time reaches 504h, the mass loss is very large, which is more than ten times of the initial one, far exceeding the mass loss at the other two temperatures.

[0159] Table 2 shows the functional groups corresponding to each absorption frequency of FTIR.

[0160]

[0161] Fig.11 The phenomenon presented by the middle curve is that at the beginning of thermal aging, water molecules and small molecules in the epoxy resin will volatilize, resulting in a certain amount of mass loss; as the aging time in the experiment continues to increase, the epoxy resin undergoes chemical reactions to produce some small molecules, which continue to volatilize, causing the sample quality to further decrease; when the aging time is longer, the epoxy resin begins to oxidatively decompose and loses more mass; eventually, the thermal aging effect accumulates to a certain extent, the epoxy resin undergoes macromolecular group cracking, and the insulation is further damaged. The aging effect presented by the sample is different at different experimental temperatures and the same aging time. This is because the higher the temperature, the easier it is for chemical reactions to occur, the deeper the degree of cracking of the epoxy resin, and the faster the development of insulation damage. Therefore, the experimental results at 200°C are obviously different. The insulation damage is much faster than at lower temperatures, and even the quality loss in the later stage increases exponentially.

[0162] Physical and chemical properties testing of aging samples

[0163] (1) Fourier transform infrared spectroscopy (FTIR)

[0164] The samples aged at 150℃ for 11 days, 21 days and unaged were tested. The results are as follows: Fig.11 As shown. The horizontal axis in the figure represents the wavelength of the spectrum, and the vertical axis represents the infrared light absorption rate of the epoxy resin for the response wavelength. Observation of the image shows that the intensity of each absorption peak varies due to the differences in chemical bonds and groups. The weak absorption peak at 3500cm-1 is produced by the OH stretching vibration of the hydroxyl group, indicating the presence of high molecular weight substances; 1510cm-1 characterizes the vibration of the aromatic C=C bond, and 1042-1259cm-1 is mainly caused by the vibration of the CO bond; the absorption peak near 1739cm-1 is caused by the stretching vibration of the C=O group in the ester group, and the intensity increases with the increase of aging time. This result can be attributed to the oxidation of hydroxyl groups to form carbonyl groups; the absorption peak intensity near 2931cm-1 decreases with the extension of thermal aging time, which is caused by the characteristic stretching vibration of the CH bond in the methyl ethyl group. This result confirms that the oxidation of hydrogen on the tertiary carbon at the a position of the ester is related to the breakage of the molecular chain, leading to the formation of various carbonyl groups, especially ketones and ester groups. The reaction is as follows Fig.12 shown.

[0165] The absorption curves of the spectra under different aging times are similar in shape, and there are corresponding absorption peaks in the wavelength bands corresponding to the main chemical bonds. The longer the aging time, the lower the corresponding peak value, indicating that under high temperature environment, thermal stress causes the breakage of the epoxy resin molecular chain, and each chemical bond breaks to varying degrees.

[0166] (2) Scanning electron microscope (SEM) surface morphology observation

[0167] Scanning electron microscope (SEM) is an important microscopic morphology observation equipment. SEM can be used to record the surface morphology of epoxy resin and epoxy impregnated paper materials under different insulation defects, which can supplement the explanation of the reasons for the changes in their dielectric properties from another perspective.

[0168] After the treated sample is sprayed with gold, it is pasted on the slide as follows Fig.13 As shown;

[0169] The surface morphology of epoxy resin before aging was observed using scanning electron microscopy, such as Fig.14 As shown in the figure. Before aging, the surface of the epoxy resin is relatively flat and smooth, and no foreign matter such as particles is obviously observed on the surface; after aging, the surface of the epoxy resin sample is as follows Fig.15 As shown in the figure, the sample surface is uneven in some areas, with particles gathering, agglomeration, and damage. This is because the molecular chain of the epoxy resin is destroyed under high temperature, generating small molecules such as carbonyl acids, aldehydes, and ketones, which gather into particles on the surface of the sample. The formation of particles indicates that the insulation properties of the sample are deteriorating, which is reflected in the physical properties as a decrease in insulation performance.

[0170] It should be noted that the embodiments of the present invention can be implemented by hardware, software, or a combination of software and hardware. The hardware part can be implemented using dedicated logic; the software part can be stored in a memory and executed by an appropriate instruction execution system, such as a microprocessor or dedicated design hardware. It can be understood by a person of ordinary skill in the art that the above-mentioned devices and methods can be implemented using computer executable instructions and / or contained in a processor control code, such as a carrier medium such as a disk, CD or DVD-ROM, a programmable memory such as a read-only memory (firmware), or a data carrier such as an optical or electronic signal carrier. Such code is provided on the carrier medium. The device and its modules of the present invention can be implemented by hardware circuits such as very large-scale integrated circuits or gate arrays, semiconductors such as logic chips, transistors, etc., or programmable hardware devices such as field programmable gate arrays, programmable logic devices, etc., can also be implemented by software executed by various types of processors, and can also be implemented by a combination of the above-mentioned hardware circuits and software, such as firmware.

[0171] The above description is only a specific implementation mode of the present invention, but the protection scope of the present invention is not limited thereto. Any modifications, equivalent substitutions and improvements made by any technician familiar with the technical field within the technical scope disclosed by the present invention and within the spirit and principle of the present invention should be covered by the protection scope of the present invention.

Claims

1. An epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system, characterized in that: include: The heat aging treatment module is connected to the main control module and is used to change the physical and chemical properties of the insulation material under the effect of the increase in insulation temperature caused by the heat generated during long-term operation of the transformer, causing it to deteriorate and age; The dielectric property test module is connected to the main control module and is used to perform dielectric response tests on epoxy resin and epoxy impregnated paper samples under different aging conditions; The main control module is connected with the thermal aging treatment module, the dielectric property test module, the mass loss calculation module, the aging degree analysis module, the physical and chemical property detection module, and the life prediction module to control the normal operation of each module; The mass loss calculation module is connected to the main control module and is used to calculate the mass loss of the sample before and after the experiment; An aging degree analysis module, connected to the main control module, is used to analyze the aging degree of epoxy resin and impregnated paper samples; The physical and chemical properties detection module is connected to the main control module and is used to detect the physical and chemical properties of the aging samples; The life prediction module is connected to the main control module and is used to predict the life of epoxy resin and impregnated paper samples.

2. The epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system as claimed in claim 1, characterized in that: The dielectric properties test module method: Based on the constructed dielectric response test platform, the test temperature was set to 50°C, the output voltage of the dielectric response diagnostic instrument was set to 200V, and dielectric response tests were carried out on epoxy resin and epoxy impregnated paper samples under different aging conditions.

3. The epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system as claimed in claim 1, characterized in that: The mass loss calculation module method: Before the aging experiment, the samples were weighed and the initial mass of the samples was recorded. The weighing was performed using a precision weighing balance with a range of 120 g and a sensitivity of 0.0001 g. Before the thermal aging experiment, the initial mass of the epoxy resin sample was measured using a precise electronic balance. After each cycle of the aging experiment, the samples were taken out and the mass was measured again after cooling. The mass loss of the sample before and after the experiment was obtained. The mass loss rate is shown in the formula: Where: m0 is the initial mass of the sample before the experiment; m i is the sample mass after the experiment; m0-m i is the mass loss before and after the test; η is the mass loss rate of the sample; i is the sample number.

4. The epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system as claimed in claim 1, characterized in that: The physical and chemical properties detection module method: (1) Fourier transform infrared spectroscopy (FTIR); (2) Scanning electron microscope (SEM) surface morphology observation.

5. The epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system as claimed in claim 4, characterized in that: The Fourier transform infrared spectroscopy FTIR: The different chemical bonds inside the polymer and the atoms that make up the chemical groups are constantly moving, and their vibration modes and frequencies are different. When the vibration frequency of the infrared light irradiated on the polymer is the same as the vibration frequency of the chemical bonds and groups, the infrared light will be absorbed. By analyzing the Fourier transform infrared spectrum, the composition of the chemical bonds and functional groups inside the substance can be obtained.

6. The epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system as claimed in claim 4, characterized in that: The scanning electron microscope SEM surface morphology observation: The surface morphology of epoxy resin and epoxy impregnated paper materials under different insulation defects was recorded by SEM, which supplemented the explanation of the change of dielectric properties from another perspective; when using scanning electron microscope SEM to observe the surface morphology in the epoxy resin thermal aging experiment, the surface of the epoxy resin sample was sprayed with gold; After the processed sample to be tested is subjected to gold spraying treatment, it is pasted on a slide; The surface morphology of epoxy resin before and after aging was observed using scanning electron microscopy.

7. A method for diagnosing aging defects and life prediction of epoxy resin and impregnated paper samples according to any one of claims 1 to 6, characterized in that: The epoxy resin and impregnated paper sample aging defect diagnosis and life prediction method comprises: Step 1: The heat generated by the heat aging treatment module during long-term operation of the transformer causes the temperature of the insulation to rise, causing the physical and chemical properties of the insulation material to change, resulting in its deterioration and aging; Step 2, performing dielectric response tests on epoxy resin and epoxy impregnated paper samples under different aging conditions through a dielectric property test module; Step 3, the main control module calculates the mass loss of the sample before and after the experiment through the mass loss calculation module; Step 4, analyzing the aging degree of the epoxy resin and the impregnated paper samples through an aging degree analysis module; Step 5, detecting the physical and chemical properties of the aged sample by a physical and chemical property detection module; Step 6: predict the life of the epoxy resin and impregnated paper samples through the life prediction module.

8. A computer device, characterized in that: The computer device includes a memory and a processor, the memory stores a computer program, and when the computer program is executed by the processor, the processor executes the steps of the epoxy resin and impregnated paper sample aging defect diagnosis and life prediction method as described in claim 7.

9. A computer-readable storage medium storing a computer program, wherein when the computer program is executed by a processor, the processor executes the steps of the method for diagnosing aging defects and predicting life of epoxy resin and impregnated paper samples as claimed in claim 7.

10. An information data processing terminal, characterized in that: The information data processing terminal includes the epoxy resin and impregnated paper sample aging defect diagnosis and life prediction system as described in any one of claims 1-6.

Citation Information

Patent Citations

  • Device and method for evaluating oil paper insulation aging and predicting service life of transformer

    CN103245519A

  • Method for analyzing service life of low-resistance anti-corona paint material of high-voltage motor

    CN111426597A

  • Method for testing and evaluating aging resistance of glass fiber reinforced epoxy resin insulating material for high-voltage dry-type reactor

    CN118033348A

  • Epoxy resin insulator aging degree detection method, device, equipment and medium

    CN118429668A