Power chip finished product detection device

By introducing automatic swinging, pallet clamping and flip mechanisms into the chip finished product detection device, the problem of low efficiency of traditional detection devices is solved, and efficient multi-chip detection and double-sided detection are achieved.

CN119503417AInactive Publication Date: 2025-02-25DALIAN POWER SUPPLY COMPANY STATE GRID LIAONING ELECTRIC POWER
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Patent Information

Application Number
CN202510103701.6
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-01-23
Publication Date
2025-02-25
Estimated Expiration
Not applicable · inactive patent

AI Technical Summary

Technical Problem

Traditional chip finished product testing devices have low detection efficiency and are difficult to meet the efficient needs of large-scale production.

Method used

A power chip finished product detection device is designed, using an automatic sway mechanism and a pallet clamping and flip mechanism to realize automated processing and double-sided detection of chip pallets.

Benefits of technology

It greatly improves the chip detection efficiency, can detect a large number of chips at the same time, and double-sided detection is achieved through automatic flip, without manual operation, reducing the risk of damage to the chip by manual operation.

✦ Generated by Eureka AI based on patent content.

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Abstract

The invention relates to the related technical field of chip finished product detection, and discloses a power chip finished product detection device, through the arrangement of a tray clamping mechanism and a tray turn-over mechanism, after a first optical detection probe detects one side of a chip, the tray clamping mechanism can buckle another chip tray on a chip tray supporting the chip, so that the chip can be conveniently and rapidly turned over, and the detection efficiency is improved. And then the tray turnover mechanism can clamp and turn over the two chip trays, so that a large number of chips are turned over at the same time, a second optical detection probe can conveniently detect the other sides of the chips, automatic turnover of double-sided detection of the chips is achieved, manpower is not needed, and the detection efficiency is greatly improved.
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Description

Technical Field

[0001] The present invention relates to the technical field related to finished chip detection, and in particular to a finished power chip detection device. Background Art

[0002] To solve the current environmental problems and energy crisis, achieving higher energy conversion efficiency and power transmission efficiency is the core element. As the core technology to improve the grid's clean energy acceptance capacity, intelligence, resource allocation capabilities, and improve safety, stability and reliability, the development of high-power power electronic device technology is inseparable from the improvement of the performance of basic components.

[0003] Traditional chip finished product detection devices, such as the optoelectronic chip finished product detection device disclosed in Chinese patent CN215005017U, use pressing or pulling to fix the chip for detection, which can improve the speed of chip detection. However, this type of device can only detect one chip at a time. For large-scale produced chips, the detection efficiency is low and it is difficult to meet the needs of efficient production. Summary of the invention

[0004] The purpose of the present invention is to provide a power chip finished product detection device to solve the problem raised in the above background technology that the current traditional chip finished product detection device has low detection efficiency and is difficult to meet the demand for efficient production.

[0005] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: a finished product inspection device for electric chips, comprising an inspection workbench, a stepper motor is arranged at one end of the inspection workbench, the stepper motor is connected to a transmission roller through a first pulley transmission mechanism (the prior art, composed of large and small pulleys and belts), a synchronous conveyor belt is arranged on the transmission roller, two synchronous conveyor belts are arranged and are located on both sides of the inspection workbench, a tray supporting mechanism is mounted on the inspection workbench, a chip tray is placed on the synchronous conveyor belt, an automatic plate swinging mechanism is arranged at the front end of the inspection workbench, a detection adjustment mechanism is arranged on one side of the inspection workbench, a first optical detection probe and a second optical detection probe are arranged on the detection adjustment mechanism, and a tray clamping mechanism and a tray flipping mechanism are movably installed on both sides of the inspection workbench through side slide rails.

[0006] Furthermore, the tray supporting mechanism includes a fixed support frame, the fixed support frame is provided with an upward lifting pneumatic guide rail, the upward lifting pneumatic guide rail is fixedly connected to a tray support platform, the chip tray is mounted on the tray support platform, tray positioning pins are provided at the diagonals of both ends of the tray support platform, and tray positioning grooves are opened on both sides of the chip tray corresponding to the tray positioning pins.

[0007] Furthermore, the width of the tray support is smaller than the spacing between the synchronous conveyor belts, and the width of the chip tray is larger than the spacing between the synchronous conveyor belts.

[0008] Furthermore, the chip tray is provided with a large number of chip placement slots, the size of which matches the chip to be tested, anti-bias positioning pins are provided at the four corners of the bottom of the chip tray, and anti-bias positioning slots are provided at the four corners of the upper portion of the chip tray.

[0009] Furthermore, the automatic plate swing mechanism includes a transverse pneumatic guide rail, a group of transverse pneumatic guide rails are arranged on each side of the detection workbench, a gantry is mounted on the transverse pneumatic guide rail, a longitudinal pneumatic guide rail is arranged on the gantry, a transverse slider is slidably connected to the longitudinal pneumatic guide rail, a lifting pneumatic guide rail is vertically arranged on the transverse slider, a pneumatic picking suction cup for picking up power chips is fixedly installed on the lifting pneumatic guide rail, and a chip loading tray is arranged on the inner side of the transverse pneumatic guide rail.

[0010] Furthermore, the detection and adjustment mechanism includes a detection fixed seat, longitudinal adjustment slide rails are arranged on both sides above the detection fixed seat, a longitudinal moving frame is movably connected to the longitudinal adjustment slide rails, a longitudinal adjustment motor is arranged on the detection fixed seat, an output end of the longitudinal adjustment motor is transmission-connected with a longitudinal adjustment screw rod through a second pulley transmission mechanism (existing technology, composed of large and small pulleys and belts), the longitudinal adjustment screw rod is transmission-connected with the longitudinal moving frame through a first screw rod nut, a transverse adjustment motor is arranged on the longitudinal moving frame, an output end of the transverse adjustment motor is fixedly connected with a transverse adjustment screw rod, the transverse adjustment screw rod is transmission-connected with the transverse adjustment frame through a second screw rod nut, a first probe mounting frame is fixedly connected to the left side of the transverse adjustment frame, a first optical detection probe is transmission-connected to the first probe mounting frame through a first height adjustment cylinder, a second probe mounting frame is fixedly connected to the right side of the transverse adjustment frame, and a second optical detection probe is transmission-connected to the second probe mounting frame through a second height adjustment cylinder.

[0011] Furthermore, the first optical inspection probe and the second optical inspection probe are respectively located above two groups of tray supporting mechanisms, and there is one group of tray supporting mechanisms between the two groups of tray supporting mechanisms, and the tray clamping mechanism and the tray flipping mechanism are respectively located on both sides of the tray supporting mechanism between the first optical inspection probe and the second optical inspection probe.

[0012] Furthermore, the pallet clamping mechanism includes a clamping bracket, a linear slide rail is fixedly connected to the clamping bracket, a linear slider is movably connected to the linear slide rail, a longitudinal movable screw rod is arranged on one side of the linear slide rail, the longitudinal movable screw rod is transmission connected to the linear slider via a third screw rod nut, a servo motor is fixedly connected to one end of the longitudinal movable screw rod, and an electric pallet clamping claw is transmission connected to the linear slider via a clamping pneumatic guide rail.

[0013] Furthermore, the pallet flipping mechanism includes a flipping support frame, a lifting slide rail is provided on the flipping support frame, a lifting slider is movably connected to the lifting slide rail, a lifting cylinder is provided below the lifting slider, a telescopic pneumatic guide rail is provided on the lifting slider, the telescopic pneumatic guide rail is horizontally arranged, an electric flipping clamp is fixedly connected to the telescopic pneumatic guide rail by bolts, and a flipping motor is provided at the rear of the electric flipping clamp.

[0014] Furthermore, the stroke of the lifting cylinder and the length of the lifting slide rail are both greater than half the width of the chip tray.

[0015] Compared with the prior art, the present invention has the following beneficial effects: 1. The present invention provides a finished product testing device for power chips. Through an automatic tray placement mechanism and a chip tray, a chip tray can support a large number of chips for testing at the same time, which greatly improves the testing efficiency. At the same time, the automatic tray placement mechanism can also perform automatic tray placement operations to arrange the chips quickly and reasonably, thereby improving the testing efficiency and avoiding the terrible and corrosion risks caused to the chips by manual operation.

[0016] 2. The present invention provides a finished product inspection device for electric chips. Through the arrangement of a tray clamping mechanism and a tray flipping mechanism, after the first optical inspection probe inspects one side of the chip, the tray clamping mechanism can buckle another chip tray on the chip tray supporting the chip, and then the tray flipping mechanism can clamp and flip the two chip trays, thereby turning over a large number of chips at the same time, making it convenient for the second optical inspection probe to inspect the other side of the chip, thereby realizing double-sided inspection and automatic flipping of the chip without manual work, and greatly improving the inspection efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 The structure of the present invention is shown in FIG. Figure 1 ; Figure 2 This is a schematic diagram of the structure of the detection workbench of the present invention; Figure 3 It is a structural schematic diagram of the tray supporting mechanism of the present invention; Figure 4 This is a schematic diagram of the structure of the automatic plate-stirring mechanism of the present invention; Figure 5For the present invention Figure 4 The enlarged structural diagram at A in the middle; Figure 6 Schematic diagram of the detection and adjustment mechanism structure of the present invention Figure 1 ; Figure 7 Schematic diagram of the detection and adjustment mechanism structure of the present invention Figure 2 ; Figure 8 The structure of the tray clamping mechanism and the tray turning mechanism of the present invention is schematically shown. Figure 1 ; Fig. 9 The structure of the tray clamping mechanism and the tray turning mechanism of the present invention is schematically shown. Figure 2 ; Fig.10 This is a schematic diagram of the chip tray structure of the present invention.

[0018] Numbers in the figure: 1. Detection workbench; 2. Stepper motor; 3. First pulley transmission mechanism; 4. Transmission roller; 5. Synchronous conveyor belt; 6. Tray supporting mechanism; 601. Fixed support frame; 602. Upper pneumatic guide rail; 603. Tray support platform; 604. Tray positioning pin; 7. Chip tray; 701. Tray positioning groove; 702. Chip placement groove; 703. Anti-bias positioning pin; 704. Anti-bias positioning groove; 8. Automatic plate swing mechanism; 801. Horizontal pneumatic guide rail; dynamic guide rail; 802, gantry; 803, longitudinal pneumatic guide rail; 804, transverse slide block; 805, lifting pneumatic guide rail; 806, pneumatic pickup suction cup; 807, chip loading tray; 9, detection and adjustment mechanism; 901, detection fixed seat; 902, longitudinal adjustment slide rail; 903, longitudinal adjustment motor; 904, second pulley transmission mechanism; 905, longitudinal adjustment screw rod; 906, first screw rod nut; 907, longitudinal moving frame; 908 , lateral adjustment motor; 909, lateral adjustment screw; 910, second screw nut; 911, lateral adjustment frame; 912, first probe mounting frame; 913, first height adjustment cylinder; 914, second probe mounting frame; 915, second height adjustment cylinder; 10, first optical detection probe; 11, second optical detection probe; 12, side slide rail; 13, tray clamping mechanism; 1301, clamping bracket; 1302, linear slide rail; 1 303, linear slider; 1304, longitudinal moving lead screw; 1305, third lead screw nut; 1306, servo motor; 1307, clamping pneumatic guide rail; 1308, electric pallet clamping claw; 14, pallet flipping mechanism; 1401, flipping support frame; 1402, lifting slide rail; 1403, lifting slider; 1404, lifting cylinder; 1405, telescopic pneumatic guide rail; 1406, electric flipping claw; 1407, flipping motor. DETAILED DESCRIPTION

[0019] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0020] In order to further understand the content of the present invention, the present invention is described in detail in conjunction with the accompanying drawings.

[0021] See also Figure 1 A finished product inspection device for electric chips comprises an inspection workbench 1, a stepper motor 2 is arranged at one end of the inspection workbench 1, the stepper motor 2 is connected to a transmission roller 4 through a first pulley transmission mechanism 3, a synchronous conveyor belt 5 is arranged on the transmission roller 4, two synchronous conveyor belts 5 are arranged and are located on both sides of the inspection workbench 1, a tray supporting mechanism 6 is mounted on the inspection workbench 1, a chip tray 7 is placed on the synchronous conveyor belt 5, an automatic plate swinging mechanism 8 is arranged at the front end of the inspection workbench 1, an inspection adjustment mechanism 9 is arranged on one side of the inspection workbench 1, a first optical inspection probe 10 and a second optical inspection probe 11 are arranged on the inspection adjustment mechanism 9, and a tray clamping mechanism 13 and a tray turning mechanism 14 are movably installed on both sides of the inspection workbench 1 through side slide rails 12.

[0022] See also Figure 2 and Figure 3 The tray supporting mechanism 6 includes a fixed support frame 601, on which an upward pneumatic guide rail 602 is arranged, and a tray support platform 603 is fixedly connected to the upward pneumatic guide rail 602. The chip tray 7 is mounted on the tray support platform 603, and tray positioning pins 604 are arranged at the diagonals of both ends of the tray support platform 603, and tray positioning grooves 701 are opened on both sides of the chip tray 7 corresponding to the tray positioning pins 604. The width of the tray support platform 603 is less than the spacing between the synchronous conveyor belts 5, and the width of the chip tray 7 is greater than the spacing between the synchronous conveyor belts 5. Therefore, the upward pneumatic guide rail 602 is started to make the tray support platform 603 rise upward, and the tray support platform 603 will lift the chip tray 7 upward, so that the chip tray 7 is out of contact with the synchronous conveyor belt 5, so that the chip tray 7 stops and is positioned, and the tray positioning pins 604 on the tray support platform 603 cooperate with the tray positioning grooves 701 on the chip tray 7 to prevent the chip tray 7 from deflecting.

[0023] See also Fig.10A large number of chip placement grooves 702 are provided on the chip tray 7, and the size of the chip placement grooves 702 matches the chip to be detected. Anti-bias positioning pins 703 are provided at the four corners of the bottom of the chip tray 7, and anti-bias positioning grooves 704 are provided at the four corners of the upper part of the chip tray 7, so that the chips can be evenly placed in the chip placement grooves 702. At the same time, when the two groups of chip trays 7 are buckled and flipped, they can also be positioned by the cooperation of the anti-bias positioning pins 703 and the anti-bias positioning grooves 704 to avoid the chip being unable to flip due to offset.

[0024] See also Figure 4 and Figure 5 The automatic plate swing mechanism 8 includes a transverse pneumatic guide rail 801, and a group of transverse pneumatic guide rails 801 are arranged on both sides of the detection workbench 1. A gantry 802 is mounted on the transverse pneumatic guide rail 801, and a longitudinal pneumatic guide rail 803 is arranged on the gantry 802. A transverse slider 804 is slidably connected to the longitudinal pneumatic guide rail 803, and a lifting pneumatic guide rail 805 is vertically arranged on the transverse slider 804. A pneumatic pickup suction for picking up the power chip is fixedly installed on the lifting pneumatic guide rail 805. Plate 806, a chip loading plate 807 is arranged on the inner side of the transverse pneumatic guide rail 801. After the automatic plate swinging mechanism 8 is started, the pneumatic picking suction cup 806 can realize all-round movement through the transverse pneumatic guide rail 801, the longitudinal pneumatic guide rail 803 and the lifting pneumatic guide rail 805, so as to be able to move to the chip loading plate 807, and then the pneumatic picking suction cup 806 can pick up the chip through negative pressure and accurately place it in the chip placement groove 702 on the chip tray 7, thereby realizing automatic plate swinging.

[0025] See also Figure 6 and Figure 7, the detection and adjustment mechanism 9 includes a detection fixed seat 901, longitudinal adjustment slide rails 902 are arranged on both sides above the detection fixed seat 901, and a longitudinal moving frame 907 is movably connected to the longitudinal adjustment slide rails 902, and a longitudinal adjustment motor 903 is arranged on the detection fixed seat 901, and the output end of the longitudinal adjustment motor 903 is connected to the longitudinal adjustment screw rod 905 through the second pulley transmission mechanism 904, and the longitudinal adjustment screw rod 905 is connected to the longitudinal moving frame 907 through the first screw rod nut 906, and a transverse adjustment motor 908 is arranged on the longitudinal moving frame 907, and the output end of the transverse adjustment motor 908 is fixedly connected to the transverse adjustment screw rod 909, and the transverse adjustment screw rod 909 is connected to the transverse adjustment frame 911 through the second screw rod nut 910, and the left side of the transverse adjustment frame 911 is fixedly connected to the first probe mounting frame 912, and the first probe mounting frame 912 is connected to the first optical detection probe 10 through the first height adjustment cylinder 913, and the right side of the transverse adjustment frame 911 is fixedly connected to the first optical detection probe 10 through the first height adjustment cylinder 913. A second probe mounting frame 914 is fixedly connected, and a second optical detection probe 11 is connected to the second probe mounting frame 914 through a second height adjustment cylinder 915, so that the position and height of the first optical detection probe 10 and the second optical detection probe 11 can be moved through the detection adjustment mechanism 9. When the detection adjustment mechanism 9 is working, the longitudinal adjustment motor 903 can drive the longitudinal adjustment screw 905 to rotate through the second pulley transmission mechanism 904, so that the longitudinal moving frame 907 can be driven to move along the longitudinal adjustment slide rail 902 through the screw transmission, so as to realize the front and rear position adjustment of the first optical detection probe 10 and the second optical detection probe 11. The lateral adjustment motor 908 can drive the lateral adjustment screw 909 to rotate, and the lateral adjustment screw 909 can drive the lateral adjustment frame 911 to move left and right through the screw transmission, and the first optical detection probe 10 and the second optical detection probe 11 can be moved separately through the first height adjustment cylinder 913 and the second height adjustment cylinder 915 respectively.

[0026] See also Figure 1 and Figure 6 The first optical inspection probe 10 and the second optical inspection probe 11 are respectively located above the two groups of tray supporting mechanisms 6, and there is another group of tray supporting mechanisms 6 between the two groups of tray supporting mechanisms 6. The tray clamping mechanism 13 and the tray flipping mechanism 14 are respectively located on both sides of the tray supporting mechanism 6 between the first optical inspection probe 10 and the second optical inspection probe 11, so that after the first optical inspection probe 10 completes the inspection, the tray clamping mechanism 13 and the tray flipping mechanism 14 can have sufficient space to flip the chip, so as to inspect the other side of the chip.

[0027] See also Figure 8 and Fig. 9The pallet clamping mechanism 13 includes a clamping bracket 1301, a linear guide rail 1302 is fixedly connected to the clamping bracket 1301, a linear slider 1303 is movably connected to the linear guide rail 1302, a longitudinal moving screw rod 1304 is arranged on one side of the linear guide rail 1302, the longitudinal moving screw rod 1304 is transmission-connected to the linear slider 1303 through a third screw rod nut 1305, a servo motor 1306 is fixedly connected to one end of the longitudinal moving screw rod 1304, an electric pallet clamping claw 1308 is transmission-connected to the linear slider 1303 through a clamping pneumatic guide rail 1307, after the servo motor 1306 on the pallet clamping mechanism 13 is started, The linear slider 1303 can be driven by the transmission of the third screw nut 1305 to move along the linear slide rail 1302, so that the electric tray clamping claw 1308 moves with the chip tray 7 to just above the chip tray 7 supporting the chip on the tray supporting mechanism 6, and then the clamping pneumatic guide rail 1307 drives the electric tray clamping claw 1308 to descend and buckle the chip tray 7 on the chip tray 7 supporting the chip. The two groups of chip trays 7 are precisely positioned by the anti-bias positioning pins 703 and the anti-bias positioning grooves 704 to prevent deviation. Then, after the chip tray 7 is flipped over, the electric tray clamping claw 1308 can also remove the upper chip tray 7.

[0028] See also Figure 8 and Fig. 9 The tray turning mechanism 14 includes a turning support frame 1401, a lifting rail 1402 is arranged on the turning support frame 1401, a lifting slide 1403 is movably connected to the lifting slide 1402, a lifting cylinder 1404 is arranged below the lifting slide 1403, a telescopic pneumatic guide rail 1405 is arranged on the lifting slide 1403, the telescopic pneumatic guide rail 1405 is arranged horizontally, an electric turning clamp 1406 is fixedly connected to the telescopic pneumatic guide rail 1405 by bolts, a turning motor 1407 is arranged at the rear of the electric turning clamp 1406, and the stroke of the lifting cylinder 1404 and the length of the lifting rail 1402 are both greater than half the width of the chip tray 7. After the tray flipping mechanism 14 is started, the telescopic pneumatic guide rail 1405 can drive the electric flipping claw 1406 to move forward and clamp the two groups of chip trays 7 together. Then the lifting cylinder 1404 drives the electric flipping claw 1406 to rise along the lifting slide rail 1402, and then the flipping motor 1407 can drive the two groups of chip trays 7 to flip 180° to turn the chips over. Then the electric flipping claw 1406 puts the two groups of chip trays 7 back on the tray supporting mechanism 6, and at the same time the tray clamping mechanism 13 removes the chip tray 7 covering the top, so that the chip tray 7 supporting the chip can be moved to the bottom of the second optical detection probe 11 to detect the other side.

[0029] Working principle: When using this kind of power chip finished product detection device, the chip tray 7 can be placed on the left end of the synchronous conveyor belt 5 first, and then the chip can be placed on the chip loading tray 807 on one side of the automatic plate swinging mechanism 8. Then the equipment can be started, and the stepper motor 2 will drive one end of the synchronous conveyor belt 5 through the first pulley transmission mechanism 3 to send the chip tray 7 to the top of the tray supporting mechanism 6 at the automatic plate swinging mechanism 8, and then the upper pneumatic guide rail 602 is started to make the tray support platform 603 rise upward, and the tray support platform 603 will lift the chip tray 7 upward, so that the chip tray 7 is out of contact with the synchronous conveyor belt 5, so that the chip tray 7 stays at the automatic plate swinging mechanism 8, and the tray positioning pin 604 on the tray support platform 603 cooperates with the tray positioning groove 701 on the chip tray 7 to prevent the chip tray 7 from deflecting; Then the automatic tray swing mechanism 8 is started, and the pneumatic pick-up suction cup 806 can move in all directions through the horizontal pneumatic guide rail 801, the longitudinal pneumatic guide rail 803 and the lifting pneumatic guide rail 805, so as to move to the chip loading tray 807, and then the pneumatic pick-up suction cup 806 can pick up the chip through negative pressure and accurately place it in the chip placement groove 702 on the chip tray 7; After the chips are placed, the tray support 603 will descend and put the chip tray 7 back on the synchronous conveyor 5. Then the chip tray 7 moves backward to under the first optical detection probe 10. The tray support mechanism 6 at the first optical detection probe 10 lifts the chip tray 7 to position it. Then the first optical detection probe 10 performs optical detection on all the chips on the chip tray 7 at the same time. After the detection is completed, the chip tray 7 is conveyed to the tray support mechanism 6 between the first optical detection probe 10 and the second optical detection probe 11. The tray support mechanism 6 at this position lifts the chip tray 7 to position it. Then the support mechanism 6 The servo motor 1306 on the tray clamping mechanism 13 is started, and the linear slider 1303 is driven to move along the linear slide rail 1302 through the transmission of the third screw nut 1305, so that the electric tray clamping claw 1308 moves with the chip tray 7 to the top of the chip tray 7 supporting the chip on the tray supporting mechanism 6, and then the clamping pneumatic guide rail 1307 drives the electric tray clamping claw 1308 to descend, and buckles the chip tray 7 on the chip tray 7 supporting the chip, and the two groups of chip trays 7 are accurately positioned by the anti-bias positioning pin 703 and the anti-bias positioning groove 704 to prevent deviation; Then the tray turning mechanism 14 is started, and the telescopic pneumatic guide rail 1405 drives the electric turning clamp 1406 to move forward to clamp the two groups of chip trays 7 together, and then the lifting cylinder 1404 drives the electric turning clamp 1406 to rise along the lifting slide rail 1402, and then the turning motor 1407 can drive the two groups of chip trays 7 to turn 180 degrees to turn the chips over, and then the electric turning clamp 1406 puts the two groups of chip trays 7 back on the tray supporting mechanism 6, and at the same time the tray clamping mechanism 13 takes away the chip tray 7 covered on the top, so that the chip tray 7 supporting the chip can be moved to the bottom of the second optical detection probe 11 to detect the other side; The position and height of the first optical inspection probe 10 and the second optical inspection probe 11 can be accurately adjusted by the inspection and adjustment mechanism 9. When a problem is found in a chip on the chip tray 7 after inspection and comparison, the position and height of the first optical inspection probe 10 and the second optical inspection probe 11 can be confirmed by moving the inspection and adjustment mechanism 9. When the inspection and adjustment mechanism 9 is working, the longitudinal adjustment motor 903 can drive the longitudinal adjustment screw 905 to rotate through the second pulley transmission mechanism 904, so that the longitudinal moving frame 907 can be driven by the screw transmission to move along the longitudinal adjustment slide rail 902 to achieve the front and rear position adjustment of the first optical inspection probe 10 and the second optical inspection probe 11. The lateral adjustment motor 908 can drive the lateral adjustment screw 909 to rotate, and the lateral adjustment screw 909 can drive the lateral adjustment frame 911 to move left and right through the screw transmission, while the first optical inspection probe 10 and the second optical inspection probe 11 can be moved separately through the first height adjustment cylinder 913 and the second height adjustment cylinder 915 respectively.

[0030] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A finished product testing device for power chips, comprising a testing workbench (1), characterized in that: A stepper motor (2) is arranged at one end of the detection workbench (1), and the stepper motor (2) is connected to a transmission roller (4) through a first pulley transmission mechanism (3). A synchronous conveyor belt (5) is arranged on the transmission roller (4), and two synchronous conveyor belts (5) are arranged and are located on both sides of the detection workbench (1). A tray supporting mechanism (6) is mounted on the detection workbench (1), and a chip tray (7) is placed on the synchronous conveyor belt (5). An automatic tray swinging mechanism (8) is arranged at the front end of the detection workbench (1), and a detection adjustment mechanism (9) is arranged on one side of the detection workbench (1). A first optical detection probe (10) and a second optical detection probe (11) are arranged on the detection adjustment mechanism (9). A tray clamping mechanism (13) and a tray turning mechanism (14) are movably installed on both sides of the detection workbench (1) through side slide rails (12).

2. A finished power chip detection device according to claim 1, characterized in that: The tray supporting mechanism (6) comprises a fixed support frame (601), the fixed support frame (601) is provided with an upward-lifting pneumatic guide rail (602), the upward-lifting pneumatic guide rail (602) is fixedly connected with a tray support platform (603), the chip tray (7) is mounted on the tray support platform (603), tray positioning pins (604) are provided at the diagonal positions at both ends of the tray support platform (603), and tray positioning grooves (701) are provided at the positions corresponding to the tray positioning pins (604) on both sides of the chip tray (7).

3. A finished power chip detection device according to claim 2, characterized in that: The width of the tray support platform (603) is smaller than the spacing between the synchronous conveyor belts (5), and the width of the chip tray (7) is larger than the spacing between the synchronous conveyor belts (5).

4. The power chip finished product detection device according to claim 1, characterized in that: The chip tray (7) is provided with a large number of chip placement slots (702), the size of the chip placement slots (702) matching the chip to be tested, anti-deflection positioning pins (703) are provided at the four corners of the bottom of the chip tray (7), and anti-deflection positioning slots (704) are provided at the four corners of the upper portion of the chip tray (7).

5. The power chip finished product detection device according to claim 1, characterized in that: The automatic plate swing mechanism (8) comprises a transverse pneumatic guide rail (801), a group of transverse pneumatic guide rails (801) are arranged on both sides of the detection workbench (1), a gantry (802) is mounted on the transverse pneumatic guide rail (801), a longitudinal pneumatic guide rail (803) is arranged on the gantry (802), a transverse slider (804) is slidably connected to the longitudinal pneumatic guide rail (803), a lifting pneumatic guide rail (805) is vertically arranged on the transverse slider (804), a pneumatic pickup suction cup (806) for picking up power chips is fixedly installed on the lifting pneumatic guide rail (805), and a chip loading tray (807) is arranged on the inner side of the transverse pneumatic guide rail (801).

6. A finished power chip detection device according to claim 1, characterized in that: The detection and adjustment mechanism (9) comprises a detection fixed seat (901), longitudinal adjustment slide rails (902) are arranged on both sides above the detection fixed seat (901), a longitudinal moving frame (907) is movably connected to the longitudinal adjustment slide rails (902), a longitudinal adjustment motor (903) is arranged on the detection fixed seat (901), an output end of the longitudinal adjustment motor (903) is transmission-connected to a longitudinal adjustment screw rod (905) via a second pulley transmission mechanism (904), the longitudinal adjustment screw rod (905) is transmission-connected to the longitudinal moving frame (907) via a first screw rod nut (906), a transverse adjustment motor (908) is arranged on the longitudinal moving frame (907), and the detection fixed seat (901) is provided with a longitudinal adjustment motor (903). The output end of the lateral adjustment motor (908) is fixedly connected to a lateral adjustment screw rod (909), and the lateral adjustment screw rod (909) is connected to a lateral adjustment frame (911) through a second screw rod nut (910). The left side of the lateral adjustment frame (911) is fixedly connected to a first probe mounting frame (912), and the first probe mounting frame (912) is connected to a first optical detection probe (10) through a first height adjustment cylinder (913). The right side of the lateral adjustment frame (911) is fixedly connected to a second probe mounting frame (914), and the second probe mounting frame (914) is connected to a second optical detection probe (11) through a second height adjustment cylinder (915).

7. The power chip finished product detection device according to claim 1, characterized in that: The first optical detection probe (10) and the second optical detection probe (11) are respectively located above the two groups of tray supporting mechanisms (6), and there is another group of tray supporting mechanisms (6) between the two groups of tray supporting mechanisms (6), and the tray clamping mechanism (13) and the tray turning mechanism (14) are respectively located on both sides of the tray supporting mechanism (6) between the first optical detection probe (10) and the second optical detection probe (11).

8. The power chip finished product detection device according to claim 1, characterized in that: The tray clamping mechanism (13) comprises a clamping bracket (1301), the clamping bracket (1301) is fixedly connected to a linear slide rail (1302), the linear slide rail (1302) is movably connected to a linear slider (1303), a longitudinal movable lead screw (1304) is arranged on one side of the linear slide rail (1302), the longitudinal movable lead screw (1304) is transmission-connected to the linear slider (1303) via a third lead screw nut (1305), one end of the longitudinal movable lead screw (1304) is fixedly connected to a servo motor (1306), and the linear slider (1303) is transmission-connected to an electric tray clamping claw (1308) via a clamping pneumatic guide rail (1307).

9. The power chip finished product detection device according to claim 1, characterized in that: The tray turning mechanism (14) comprises a turning support frame (1401), the turning support frame (1401) is provided with a lifting rail (1402), the lifting rail (1402) is movably connected with a lifting slider (1403), a lifting cylinder (1404) is provided below the lifting slider (1403), a telescopic pneumatic guide rail (1405) is provided on the lifting slider (1403), the telescopic pneumatic guide rail (1405) is arranged horizontally, an electric turning clamp (1406) is fixedly connected to the telescopic pneumatic guide rail (1405) by bolts, and a turning motor (1407) is provided at the rear of the electric turning clamp (1406).

10. A finished power chip detection device according to claim 9, characterized in that: The stroke of the lifting cylinder (1404) and the length of the lifting slide rail (1402) are both greater than half the width of the chip tray (7).

Citation Information

Patent Citations

  • Photoelectric chip finished product detection device

    CN215005017U

  • Chip resistor screening device

    CN110882937A

  • Chip tray placing machine

    CN216548585U

  • Turnover blister tray

    CN219970310U