On-load test intelligent remote data monitoring device

Abstract

The invention discloses an intelligent remote data monitoring device for on-load testing, and relates to the technical field of power system testing and monitoring. The method comprises the following steps: an acquisition module used for acquiring electrical parameters of a to-be-tested circuit in real time and summarizing the electrical parameters to obtain summarized data; the encryption gateway is electrically connected with the acquisition module and is used for receiving the summarized data, encrypting the summarized data to obtain encrypted data and transmitting the encrypted data; the server is in signal connection with the encryption gateway and is used for receiving the encrypted data; and the intelligent terminal is in signal connection with the server, obtains the encrypted data through the server, decrypts the encrypted data and then generates an experiment report. According to the invention, the accuracy of on-load test intelligent remote data monitoring is improved.

Description

Technical Field

[0001] The present application relates to the technical field of power system testing and monitoring, and in particular to an intelligent remote data monitoring device for load testing. Background Art

[0002] In the power system, load testing is an important link before the substation is put into operation and during maintenance. It is mainly used to verify the correctness of the wiring of the secondary current and voltage circuits, and to ensure that accurate AC sampling is provided to the protection device during actual operation. However, there are some obvious problems and defects in the implementation of load testing in the existing technology. Although the existing technology can realize the collection and storage of test data to a certain extent, it usually lacks remote data transmission and intelligent analysis functions, and the test results cannot be viewed and analyzed in real time and remotely. In addition, most of the existing devices are independent working modes, and it is impossible to achieve synchronous measurement and centralized data management under the conditions of multiple devices and multiple measuring points, which increases the complexity and error rate of the test.

[0003] To address these problems, the present invention proposes an intelligent remote data monitoring device for load testing to achieve remote data monitoring and intelligent analysis, reduce dependence on personnel skills, improve test efficiency and data accuracy, and provide a more efficient and reliable solution for load testing. Summary of the invention

[0004] The purpose of the present invention is to provide an intelligent remote data monitoring device for load testing to solve the problems raised in the above background technology.

[0005] The present application provides a load test intelligent remote data monitoring device, which adopts the following technical solution:

[0006] The acquisition module is used to acquire the electrical parameters of the circuit to be tested in real time and to obtain summary data after summarizing the electrical parameters;

[0007] An encryption gateway, electrically connected to the acquisition module, is used to receive the summary data, encrypt the summary data to obtain encrypted data, and transmit the encrypted data;

[0008] A server, connected to the encryption gateway signal, for receiving encrypted data;

[0009] The intelligent terminal is connected to the server signal, obtains the encrypted data through the server and generates an experimental report after decryption.

[0010] Preferably, the acquisition module includes a host and a slave;

[0011] The slave machine is used to collect electrical parameters of the circuit to be tested in real time and record them as slave machine electrical parameters;

[0012] The host is connected to the slave by signal, and is used to receive the electrical parameters of the slave, collect the electrical parameters of the circuit to be tested in real time and record them as the electrical parameters of the host, and combine the electrical parameters of the slave and the electrical parameters of the host to form summary data.

[0013] Preferably, the host comprises an electrical parameter acquisition module, a main control chip, a communication circuit module, a power circuit module and a peripheral circuit module;

[0014] The main control chip is used to receive control instructions from users and record them as user instructions;

[0015] The electrical parameter acquisition module is electrically connected to the main control chip, and is used to receive user instructions and acquire electrical parameters of the circuit to be tested in real time according to the user instructions;

[0016] The communication circuit module is electrically connected to the main control chip, and is used to receive user instructions and realize wireless data transmission between the master and slave machines according to the user instructions;

[0017] The power circuit module is electrically connected to all modules of the host and is used to supply power to all modules of the host;

[0018] The peripheral circuit module is electrically connected to the main control chip and is used to stabilize the main control chip.

[0019] Preferably, the peripheral circuit module includes an external clock circuit unit, a reset circuit unit and a protection circuit unit;

[0020] The external clock circuit unit is electrically connected to the main control chip, and includes a crystal oscillator and two capacitors, and is used to provide a clock signal to the main control chip;

[0021] The reset circuit unit is electrically connected to the main control chip and is configured as a reset button for manually resetting the main control chip;

[0022] The protection circuit unit is electrically connected to the main control chip and is used to stabilize the power supply voltage of the main control chip.

[0023] Preferably, the step of collecting electrical parameters of the circuit to be tested in real time according to user instructions is specifically:

[0024] Obtain a circuit to be tested, and connect a voltage sensor clip and a current sensor clip to the circuit to be tested;

[0025] Collect and cache the real-time electrical parameters of the circuit to be tested, and transmit them to the main control chip through the serial port of the main control chip;

[0026] After receiving the real-time electrical parameters, the main control chip caches the electrical parameters.

[0027] Preferably, the step of collecting the electrical parameters of the circuit to be tested in real time and recording them as the host electrical parameters, and combining the electromechanical parameters and the host electrical parameters to form summary data is specifically:

[0028] Get all hosts and slaves and record them as acquisition devices, get the address code of the acquisition device and record it as the device address code;

[0029] Find the acquisition device with device address code 0 as the host and initialize the host;

[0030] Get the host's setting parameters, and use the setting parameters as the reference parameters to establish a LoRa communication connection line between the host and the slave;

[0031] The electrical parameters of the host are extracted, and the electrical parameters of the slave are received, and the electrical parameters of the host and the slave are combined to obtain summary data.

[0032] Preferably, the step of collecting the electrical parameters of the circuit to be tested in real time and recording them as electromechanical parameters is specifically as follows:

[0033] Find the acquisition device whose device address code is not 0 as the slave, and use all the slaves to measure the current data synchronously at multiple points;

[0034] The A-phase voltage of the host is extracted according to the reference parameters, and the electrical parameters of the circuit to be tested are collected in real time and recorded as the original parameters;

[0035] The slave is used to measure current data at multiple points synchronously, and uses the A-phase voltage of the host as the reference and original parameters to synthesize and display the vector diagram as the slave parameters.

[0036] Preferably, the step of encrypting the summary data to obtain encrypted data and transmitting the encrypted data is specifically:

[0037] The aggregated data is encrypted using SSL to obtain encrypted data;

[0038] Upload the encrypted data to the server via the MQTT protocol.

[0039] Preferably, the step of obtaining the encrypted data through the server and generating the experimental report after decryption is specifically as follows:

[0040] The intelligent terminal receives the encrypted data from the server and decrypts the encrypted data to obtain the real-time measurement value;

[0041] Perform vector synthesis based on real-time measurement values ​​and draw a data vector diagram;

[0042] Determine whether the wiring is correct based on the preset load type and data vector diagram, and generate intelligent judgment results;

[0043] Set the report template for the test report and generate the experimental report based on the intelligent judgment results and report template.

[0044] In summary, the present application includes at least one of the following beneficial technical effects:

[0045] 1. Through the remote real-time monitoring and intelligent analysis functions of the intelligent terminal, the dependence on on-site professionals is reduced, and testers do not need to manually record and calculate data, thereby reducing human errors. The accuracy of intelligent remote data monitoring of load testing is improved.

[0046] 2. Through the communication circuit module of the host, the test data can be transmitted in real time and processed centrally, and the synchronous measurement of multiple test points realizes the synthetic analysis of the data at each point. The test results show that the synchronous measurement based on this system can improve the timeliness and consistency of data compared with the traditional single-point measurement.

[0047] 3. The device has the function of automatically generating test reports, recording various test data in real time and outputting reports in a standard format, which significantly reduces the time for data collation and analysis, and provides convenience for subsequent data analysis and fault diagnosis. At the same time, it reduces the demand for senior professionals, optimizes human resource allocation, and reduces labor costs. In addition, the load test process does not require long-term occupation of on-site personnel, improves the overall operation and maintenance efficiency of the power system, and indirectly reduces the cost of power equipment operation and maintenance. In addition, the remote operation and monitoring functions improve the safety and reliability of substation testing, reduce the probability of on-site accidents, and provide guarantees for the safe and stable operation of the power system. BRIEF DESCRIPTION OF THE DRAWINGS

[0048] Figure 1 The present invention is a schematic diagram of module connection of an embodiment of an intelligent remote data monitoring device for load testing.

[0049] Figure 2 It is a schematic diagram of a main control chip of an embodiment of an intelligent remote data monitoring device with load testing of the present invention.

[0050] Figure 3 It is a schematic diagram of a communication circuit module of an embodiment of an intelligent remote data monitoring device for load testing of the present invention.

[0051] Figure 4 It is a schematic diagram of an encryption gateway of an embodiment of an intelligent remote data monitoring device with load testing of the present invention.

[0052] Figure 5 The present invention is a schematic diagram of a power circuit module of an embodiment of an intelligent remote data monitoring device for load testing.

[0053] Figure 6It is a schematic diagram of a collection interface of an embodiment of an intelligent remote data monitoring device with load testing of the present invention.

[0054] Figure 7 It is a schematic diagram of a debugging interface of an embodiment of an intelligent remote data monitoring device for load testing of the present invention. DETAILED DESCRIPTION

[0055] Below is a combination of the embodiments and Figure 1-Figure 7 The present invention is further described in detail, but the embodiments of the present invention are not limited thereto.

[0056] The present invention discloses an intelligent remote data monitoring device for load testing, which specifically comprises:

[0057] The acquisition module is used to acquire the electrical parameters of the circuit to be tested in real time and to obtain summary data by summarizing the electrical parameters.

[0058] The encryption gateway is electrically connected to the acquisition module and is used for receiving the summary data, encrypting the summary data to obtain the encrypted data and transmitting the encrypted data.

[0059] The server is connected to the encryption gateway signal and is used to receive encrypted data.

[0060] The intelligent terminal is connected to the server signal, obtains the encrypted data through the server and generates an experimental report after decryption.

[0061] In actual use, current load tests usually rely on protection professionals to manually measure and analyze test data on site, which is a time-consuming process and requires high skill levels of personnel. At the same time, since most tests are conducted at night to reduce the impact on normal power consumption, this increases the difficulty of on-site work and the reliance on personnel responsibility. In addition, traditional testing methods require protection professionals to be on duty on site to manually record and calculate measurement data, which is prone to human errors and reduces the accuracy of test results. Through wireless communication, encrypted gateways, smart terminals and other technologies, remote data monitoring and intelligent analysis can be achieved, reducing reliance on personnel skills, improving test efficiency and data accuracy, and providing a more efficient and reliable solution for load testing.

[0062] The acquisition module includes a host and a slave.

[0063] The slave machine is used to collect the electrical parameters of the circuit to be tested in real time and record them as the slave machine electrical parameters.

[0064] The host is connected to the slave by signal, and is used to receive the electrical parameters of the slave, collect the electrical parameters of the circuit to be tested in real time and record them as the electrical parameters of the host, and merge the electrical parameters of the slave and the electrical parameters of the host to form summary data.

[0065] In actual use, the host has the functions of collecting, processing and transmitting data. It is connected to multiple slaves through the LoRa wireless communication module, and the collected test data is uploaded to the server through the encrypted gateway. The slave is used to measure the current data synchronously at multiple points, and synthesize the display vector diagram based on the A phase voltage of the host. The simultaneous use of the host and the slave can collect data faster and more conveniently.

[0066] The host includes an electrical parameter acquisition module, a main control chip, a communication circuit module, a power circuit module and a peripheral circuit module.

[0067] The main control chip is used to receive control instructions from the user and record them as user instructions.

[0068] Main control chip: MCU chip, which is a microcontroller responsible for controlling the operation of the entire system. It performs functions such as collecting data, controlling communication modules, sending and receiving data through programming logic. Pin function: Power pin (VDD, GND): The MCU operating voltage is usually 3.3V. The circuit provides a stable 3.3V power supply to the MCU to enable it to work normally. Clock input pin (OSC_IN, OSC_OUT): These pins are connected to the external crystal oscillator circuit to provide a stable clock signal to ensure the timing accuracy of the MCU. Common crystal oscillator frequencies are 8MHz or higher to meet the needs of different application scenarios. Reset pin (NRST): This pin is used to reset the MCU. When the system is abnormal, the reset pin can be used to restart the MCU and restore it to the initial state.

[0069] The electrical parameter acquisition module is electrically connected to the main control chip and is used to receive user instructions and acquire the electrical parameters of the circuit to be tested in real time according to the user instructions.

[0070] The communication circuit module is electrically connected to the main control chip and is used to receive user instructions and realize wireless data transmission between the master and slave machines according to the user instructions.

[0071] The communication circuit module is a LoRa module. The MCU is connected to the LoRa module through a set of I / O pins to realize wireless data transmission between the master and slave devices.

[0072] The power circuit module is electrically connected to all modules of the host and is used to supply power to all modules of the host.

[0073] Power supply circuit: The MCU circuit requires a stable 3.3V voltage. The power supply module in the circuit steps down the input voltage to 3.3V through a voltage regulator and provides it to the MCU. Multiple decoupling capacitors are usually placed near the VDD pin of the MCU to filter out noise in the power supply, ensure the stability of the voltage provided to the MCU, and avoid the impact of power supply fluctuations on the MCU.

[0074] The peripheral circuit module is electrically connected to the main control chip and is used to stabilize the main control chip.

[0075] In actual use, the host is mainly responsible for collecting data from the acquisition module. The hardware circuits of the master and slave are basically the same, and the master and slave are defined by software programming. It is mainly composed of MCU main control chip and peripheral circuits, LoRa communication circuit, encryption gateway RS485 interface circuit, power supply circuit, acquisition and debugging interface circuit, specifically:

[0076] There is usually a serial port (UART) or dedicated RS485 communication pins on the MCU for communication with the RS485 encryption gateway. The data summarized by the host is sent to the gateway via the RS485 bus, and the gateway is responsible for encrypting and transmitting the data to the remote server. These pins are connected to the RS485 physical interface through a level conversion chip to adapt to the RS485 communication standard. RS485 is a commonly used serial communication standard that supports data transmission over long distances and multi-device connections, and has strong anti-interference capabilities.

[0077] Acquisition interface pins: The acquisition interface of the MCU circuit is connected to the external electrical parameter acquisition module to collect sensor data. Usually these pins are analog input pins or ADC (analog-to-digital conversion) pins, which are used to collect analog signals from sensors and convert them into digital data for MCU processing. The signals received by these pins are converted to digital by the ADC module inside the MCU, and the converted digital signals are used for further analysis and processing.

[0078] SWD interface (debugging and downloading): In the MCU circuit, an interface for debugging and program downloading is usually provided, such as the SWD (Serial Wire Debug) interface. Through this interface, developers can debug programs, monitor the operating status of the MCU, and perform firmware upgrades. This interface is connected to a computer through a dedicated debugging tool (such as ST-Link), helping developers directly access the internal registers and program memory of the MCU.

[0079] The peripheral circuit module includes an external clock circuit unit, a reset circuit unit and a protection circuit unit.

[0080] The external clock circuit unit is electrically connected to the main control chip, and includes a crystal oscillator and two capacitors, and is used to provide a clock signal for the main control chip.

[0081] The external clock circuit includes a crystal oscillator and two capacitors, which are usually used to provide a more accurate clock signal for the MCU. The frequency of the crystal oscillator directly affects the operating speed and communication rate of the MCU. The OSC_IN and OSC_OUT pins of the MCU chip are connected to the crystal oscillator to ensure the timing accuracy of the MCU, which is very important for real-time control and data processing.

[0082] The reset circuit unit is electrically connected to the main control chip and is configured as a reset button for manually resetting the main control chip.

[0083] The reset circuit contains a reset button, which is used to manually reset the MCU. When an error occurs in the system or a restart is required, the MCU can be reloaded and started by pressing the reset button. A pull-up resistor is usually used to stabilize the reset pin to prevent accidental reset when there is no manual reset.

[0084] The protection circuit unit is electrically connected to the main control chip and is used to stabilize the power supply voltage of the main control chip.

[0085] The bypass capacitor between VDD and GND is used to suppress power ripple and transient voltage, ensure the stability of the MCU's power supply voltage, and prevent external noise from affecting the normal operation of the MCU. Some I / O pins may be equipped with pull-up or pull-down resistors to stabilize unused pins or specific signals to prevent malfunctions caused by floating states.

[0086] In actual use, when reset or debugging is required, the reset button or debug interface can be used to restart the system, or the operating status of the MCU can be debugged through the SWD interface.

[0087] The steps of collecting the electrical parameters of the circuit to be tested in real time according to the user's instructions are as follows:

[0088] Get the circuit to be tested, and connect the voltage sensor clip and the current sensor clip to the circuit to be tested.

[0089] The real-time electrical parameters of the circuit to be tested are collected and cached, and transmitted to the main control chip through the serial port of the main control chip.

[0090] After receiving the real-time electrical parameters, the main control chip caches the electrical parameters.

[0091] In actual use, after the electrical parameter acquisition modules of the host and slave are connected to the circuit under test, they collect parameters such as voltage, current, and phase in real time, and transmit the data to the MCU through the TTL serial port for cache processing. Through the data acquisition interface, the MCU obtains data from the external electrical parameter acquisition module, and the slave or host can send commands through the TTL serial port to read the required data. The MCU converts the analog signal into a digital signal through its internal ADC module, ready for further processing and transmission. The TTL interface is an interface for transmitting data in parallel. When using this interface, it is not necessary to use a dedicated interface circuit on the driver board and LCD panel of the LCD display. Instead, the TTL data signal output by the driver board main control chip is directly transmitted to the input interface of the LCD panel via a cable. Parameter indicators of the electrical parameter acquisition module:

[0092] (1) Voltage measurement range: 0-600V effective value, accuracy 0.1V

[0093] (2) Current measurement range: 0-20A, accuracy 2mA.

[0094] (3) Phase measurement range: 0-360°, accuracy 0.1°

[0095] (4) Active power measurement range: 0-12KW, accuracy 0.2W.

[0096] (5) Reactive power measurement range: 0-12Kavr, accuracy 0.2avr.

[0097] (6) Apparent power measurement range: 0-12KVA, accuracy 0.2VA.

[0098] (7) Frequency measurement range: 45-65Hz, accuracy 0.05Hz.

[0099] (8) Power factor measurement range: -1 to 1, accuracy 0.005

[0100] (9) Communication protocol: TTL serial port, baud rate 4800-115200.

[0101] The steps of collecting the electrical parameters of the circuit to be tested in real time and recording them as the host electrical parameters, and combining the electromechanical parameters and the host electrical parameters to form summary data are as follows:

[0102] Get all hosts and slaves and record them as acquisition devices, get the address codes of the acquisition devices and record them as device address codes.

[0103] Find the acquisition device with device address code 0 as the host and initialize the host.

[0104] Get the host's setting parameters, and use the setting parameters as the reference parameters to establish a LoRa communication connection line between the host and the slave.

[0105] The electrical parameters of the host are extracted, and the electrical parameters of the slave are received, and the electrical parameters of the host and the slave are combined to obtain summary data.

[0106] In actual use, when the circuit is powered on, the MCU obtains a stable 3.3V voltage through its power circuit and starts running the program. The external clock circuit provides a stable clock signal to ensure that the MCU runs at the set frequency. After power-on, the host and slave are initialized to establish a LoRa communication connection. The host is set as the reference, and the slave address code is set by the MCU chip button. If the address code is 0, the device is the host, and the remaining slave address codes are set starting from 1.

[0107] The steps of collecting the electrical parameters of the circuit to be tested in real time and recording them as the mechanical and electrical parameters are as follows:

[0108] Find the acquisition devices whose device address code is not 0 as slaves, and use all slaves for multi-point synchronous measurement of current data.

[0109] The A-phase voltage of the host is extracted based on the reference parameters, and the electrical parameters of the circuit to be tested are collected in real time and recorded as original parameters.

[0110] The slave is used to measure current data at multiple points synchronously, and uses the A-phase voltage of the host as the reference and original parameters to synthesize and display the vector diagram as the slave parameters.

[0111] In actual application, the slave is used to synchronously measure current data at multiple points and synthesize and display a vector diagram based on the A-phase voltage of the host.

[0112] The steps of encrypting the summary data to obtain encrypted data and transmitting the encrypted data are specifically as follows:

[0113] The aggregated data is encrypted using SSL to obtain encrypted data.

[0114] Upload the encrypted data to the server via the MQTT protocol.

[0115] In actual use, the slave sends data to the host through the LoRa module, and the host transmits the aggregated data to the encryption gateway through the RS485 interface. The encryption gateway encrypts the data with SSL and uploads it to the remote server using the MQTT protocol to ensure data transmission security. SSL is a network data encryption protocol used to ensure the security of data transmission. MQTT is a lightweight message transmission protocol suitable for inter-device communication in low-bandwidth and unstable networks. LoRa is a low-power wide area network wireless communication technology suitable for long-distance, low-rate data transmission.

[0116] The steps to obtain encrypted data from the server and generate a lab report after decryption are as follows:

[0117] The intelligent terminal receives the encrypted data from the server and decrypts the encrypted data to obtain the real-time measurement value.

[0118] Vector synthesis is performed based on real-time measurement values, and a data vector diagram is drawn.

[0119] Determine whether the wiring is correct based on the preset load type and data vector diagram, and generate intelligent judgment results.

[0120] Set the report template for the test report and generate the experimental report based on the intelligent judgment results and report template.

[0121] In actual use, the smart terminal receives data from the server and displays real-time measurement values. The APP performs vector synthesis on the collected data, draws a vector diagram, and determines the correctness of the wiring. The data is analyzed according to the preset load type and an intelligent judgment result is generated, and finally a standardized test report is generated. Users can view and save the test report through the smart terminal. The report includes important test data such as voltage, current, phase, power factor, and their analysis results.

[0122] The device supports remote operation and monitoring, so that new testers can also complete load testing with the assistance of the intelligent system, no longer relying on rich field experience, and significantly improving operational safety. Especially in night test scenarios, remote data access reduces the risk of personnel staying on site for a long time, indirectly improving operational safety.

[0123] The above are all preferred embodiments of the present application, and the protection scope of the present application is not limited thereto. Therefore, any equivalent changes made according to the structure, shape, and principle of the present application should be included in the protection scope of the present application.

Claims

1. An intelligent remote data monitoring device for load testing, characterized in that: include: The acquisition module is used to acquire the electrical parameters of the circuit to be tested in real time and to obtain summary data after summarizing the electrical parameters; An encryption gateway, electrically connected to the acquisition module, is used to receive the summary data, encrypt the summary data to obtain encrypted data, and transmit the encrypted data; A server, connected to the encryption gateway signal, for receiving encrypted data; The intelligent terminal is connected to the server signal, obtains the encrypted data through the server and generates an experimental report after decryption.

2. The intelligent remote data monitoring device for load testing according to claim 1 is characterized in that: The acquisition module includes a host and a slave; The slave machine is used to collect electrical parameters of the circuit to be tested in real time and record them as slave machine electrical parameters; The host is connected to the slave by signal, and is used to receive the electrical parameters of the slave, collect the electrical parameters of the circuit to be tested in real time and record them as the electrical parameters of the host, and combine the electrical parameters of the slave and the electrical parameters of the host to form summary data.

3. The intelligent remote data monitoring device for load testing according to claim 2 is characterized in that: The host includes an electrical parameter acquisition module, a main control chip, a communication circuit module, a power circuit module and a peripheral circuit module; The main control chip is used to receive control instructions from users and record them as user instructions; The electrical parameter acquisition module is electrically connected to the main control chip, and is used to receive user instructions and acquire electrical parameters of the circuit to be tested in real time according to the user instructions; The communication circuit module is electrically connected to the main control chip, and is used to receive user instructions and realize wireless data transmission between the master and slave machines according to the user instructions; The power circuit module is electrically connected to all modules of the host and is used to supply power to all modules of the host; The peripheral circuit module is electrically connected to the main control chip and is used to stabilize the main control chip.

4. The intelligent remote data monitoring device for load testing according to claim 3 is characterized in that: The peripheral circuit module includes an external clock circuit unit, a reset circuit unit and a protection circuit unit; The external clock circuit unit is electrically connected to the main control chip, and includes a crystal oscillator and two capacitors, and is used to provide a clock signal to the main control chip; The reset circuit unit is electrically connected to the main control chip and is configured as a reset button for manually resetting the main control chip; The protection circuit unit is electrically connected to the main control chip and is used to stabilize the power supply voltage of the main control chip.

5. The intelligent remote data monitoring device for load testing according to claim 1 is characterized in that: The step of collecting the electrical parameters of the circuit to be tested in real time according to the user's instructions is specifically as follows: Obtain a circuit to be tested, and connect a voltage sensor clip and a current sensor clip to the circuit to be tested; Collect and cache the real-time electrical parameters of the circuit to be tested, and transmit them to the main control chip through the serial port of the main control chip; After receiving the real-time electrical parameters, the main control chip caches the electrical parameters.

6. The intelligent remote data monitoring device for load testing according to claim 5 is characterized in that: The step of collecting the electrical parameters of the circuit to be tested in real time and recording them as the host electrical parameters, and combining the electromechanical parameters and the host electrical parameters to form summary data is specifically as follows: Get all hosts and slaves and record them as acquisition devices, get the address code of the acquisition device and record it as the device address code; Find the acquisition device with device address code 0 as the host and initialize the host; Get the host's setting parameters, and use the setting parameters as the reference parameters to establish a LoRa communication connection line between the host and the slave; The electrical parameters of the host are extracted, and the electrical parameters of the slave are received, and the electrical parameters of the host and the slave are combined to obtain summary data.

7. The intelligent remote data monitoring device for load testing according to claim 6 is characterized in that: The step of collecting the electrical parameters of the circuit to be tested in real time and recording them as the electromechanical parameters is specifically as follows: Find the acquisition device whose device address code is not 0 as the slave, and use all the slaves to measure the current data synchronously at multiple points; The A-phase voltage of the host is extracted according to the reference parameters, and the electrical parameters of the circuit to be tested are collected in real time and recorded as the original parameters; The slave is used to measure current data at multiple points synchronously, and uses the A-phase voltage of the host as the reference and original parameters to synthesize and display the vector diagram as the slave parameters.

8. The intelligent remote data monitoring device for load testing according to claim 1 is characterized in that: The step of encrypting the summary data to obtain encrypted data and transmitting the encrypted data is specifically as follows: The aggregated data is encrypted using SSL to obtain encrypted data; Upload the encrypted data to the server via the MQTT protocol.

9. The intelligent remote data monitoring device for load testing according to claim 1 is characterized in that: The steps of obtaining encrypted data through the server and generating a test report after decryption are specifically as follows: The intelligent terminal receives the encrypted data from the server and decrypts the encrypted data to obtain the real-time measurement value; Perform vector synthesis based on real-time measurement values ​​and draw a data vector diagram; Determine whether the wiring is correct based on the preset load type and data vector diagram, and generate intelligent judgment results; Set the report template for the test report and generate the experimental report based on the intelligent judgment results and report template.

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