Method and device for detecting defects of perovskite photovoltaic module, and storage medium

Abstract

The invention discloses a perovskite photovoltaic module defect detection method and device and a storage medium, and belongs to the field of perovskite photovoltaics. The method comprises the following steps: irradiating the back surface of a to-be-detected perovskite photovoltaic module, performing first image acquisition on a perovskite layer in the to-be-detected perovskite photovoltaic module to obtain a first image, and determining defect position information and film thickness information in the first image based on the first image; performing second image acquisition on the position of the defect based on the position information of the defect to obtain a second image; based on the second image, judging the types of the defects, and counting the types of the defects to obtain the number of each type of defects; and judging whether the to-be-detected perovskite photovoltaic module is qualified or not based on the number of various types of defects or the film thickness information of the first image. According to the invention, the defects of the to-be-detected perovskite photovoltaic module can be rapidly detected, analyzed, judged and early warned, so that the yield of products can be improved.

Description

Technical Field

[0001] The present invention belongs to the field of perovskite photovoltaic technology, and in particular relates to a method and device for detecting defects in a perovskite photovoltaic module, and a storage medium. Background Art

[0002] With the continuous advancement of solar cell technology, the third generation of solar cells has emerged. The third generation of solar cells refers to solar cells with a perovskite crystal structure, which uses perovskite-type organic metal halide semiconductors as light-absorbing materials to form a new concept of solar cells with a perovskite crystal structure. Perovskite solar cells have received widespread attention in recent years due to their advantages such as high efficiency, low cost and processability. The excellent optoelectronic properties of perovskite materials give them great application potential in the photovoltaic field. At present, in the preparation process of perovskite solar cells, the coating process of the perovskite layer has an important influence on the performance and stability of the final device.

[0003] Among them, Figure 1 As shown, the perovskite photovoltaic module mainly uses TCO glass 13 as a substrate, and deposits a hole transport layer 14, a perovskite layer 15, an electron transport layer 16, and an electrode layer 17 on the TCO glass 13, and then laminates butyl rubber 19, POE film 12 and cover glass 18 for packaging, and finally laminates tempered glass 11 on the back of the TCO glass 13.

[0004] However, since the perovskite layer in the perovskite photovoltaic module is usually prepared by a coating process, the coating uniformity is poor due to factors such as the low viscosity of the perovskite solution, the surface cleanliness of the substrate, and the difference in material wettability. There may be defects such as holes on the film surface after coating. In addition, the color of the perovskite layer after coating is usually gray-black, and the defects and poor uniformity of the film surface after coating are not easy to be observed in time, which can easily lead to unstable product quality and thus low reliability of perovskite solar cells.

[0005] At present, there is no fast and accurate method for online detection of defects in the perovskite layer in the prior art. Usually, the operator observes the perovskite layer by visual inspection, and the product needs to be taken into the atmospheric environment. However, the perovskite layer in the perovskite photovoltaic module is easily corroded by water vapor during this process, thereby affecting the reliability of the product. In addition, smaller defects in the perovskite layer are not easy to be observed. In addition, operators usually use SEM and other methods to observe and test the film layers in each region to confirm the uniformity of the perovskite layer formed by coating. However, the efficiency of using SEM for film thickness uniformity testing is low, and it is impossible to effectively detect defects in mass-produced products in a timely manner. Summary of the invention

[0006] The purpose of the present invention is to provide a method and device for detecting defects in a perovskite photovoltaic module, and a storage medium, so as to solve the technical problem that the prior art cannot quickly and accurately identify the defects generated after the perovskite layer in the perovskite photovoltaic module is coated, and effectively monitor the uniformity of the perovskite layer in the perovskite photovoltaic module after coating.

[0007] In order to achieve the above object, the present invention provides the following technical solutions: In a first aspect, the present invention provides a method for detecting defects in a perovskite photovoltaic module, characterized in that the method comprises the following steps: Acquire a first image, wherein the first image is obtained by irradiating the back side of the perovskite photovoltaic component to be detected and performing a first image acquisition on the perovskite layer in the perovskite photovoltaic component to be detected; Based on the first image, determining position information of defects in the first image and film thickness information of the first image; Based on the position information of the defect, a second image is acquired, where the second image is acquired by performing a second image acquisition at the position of the defect; Based on the second image, determining the type of the defect, and counting the types of the defect to obtain the number of defects of each type; Based on the number of defects of each type or the film thickness information of the first image, determining whether the perovskite photovoltaic module to be inspected is qualified; When it is judged that the perovskite photovoltaic component to be detected is qualified, the perovskite photovoltaic component to be detected is transported to the next process; when it is judged that the perovskite photovoltaic component to be detected is unqualified, an unqualified alarm instruction is issued.

[0008] Preferably, based on the first image, determining the position information of the defect in the first image and the film thickness information of the first image includes: Based on the first image, determining a grayscale image of the first image; Comparing the grayscale image of the first image with the grayscale image of a standard defect-free film layer to determine the position information of the defects in the first image; Based on the first image, a film thickness data map corresponding to the first image is acquired to determine film thickness information of the first image.

[0009] Preferably, based on the position information of the defect, a second image is acquired, wherein the second image is acquired by performing a second image acquisition at the position of the defect, including: Based on the position information of the defect, 3D imaging is performed on the position of the defect to obtain a second image.

[0010] Preferably, judging the type of the defect based on the second image includes: determining a height and a diameter of the defect based on the second image; If the diameter or height of the defect is greater than 200 microns, the defect is determined to be a large defect; If the diameter or height of the defect is in the range of 50 μm to 200 μm, the defect is determined to be a medium defect; If the diameter or height of the defect is less than 50 micrometers, the defect is determined to be a small defect.

[0011] Preferably, judging whether the perovskite photovoltaic module to be inspected is qualified based on the number of defects of each type or the film thickness information of the first image includes: Warning values ​​for the number of the large defects, the medium defects, and the small defects are set respectively. If the number of the large defects, the medium defects, or the small defects exceeds the warning value, the perovskite photovoltaic module to be tested is judged to be unqualified.

[0012] Preferably, the film thickness information of the first image includes: the maximum value of the film thickness of the first image, the minimum value of the film thickness of the first image, and the uniformity of the film thickness of the first image; judging whether the perovskite photovoltaic module to be inspected is qualified based on the number of defects of each type or the film thickness information of the first image, further includes: The maximum value of the film thickness, the minimum value of the film thickness and the warning value of the uniformity of the film thickness are set respectively. If the maximum value of the film thickness or the minimum value of the film thickness or the uniformity of the film thickness exceeds the warning value, the perovskite photovoltaic module to be tested is judged to be unqualified.

[0013] In a second aspect, the present application provides a device for detecting defects of a perovskite photovoltaic module, the device comprising: An illumination module, used to illuminate the back side of the perovskite photovoltaic module to be inspected; A first acquisition module is used to acquire a first image, wherein the first image is obtained by irradiating the back side of the perovskite photovoltaic component to be detected and performing a first image acquisition on the perovskite layer in the perovskite photovoltaic component to be detected; A determination module, configured to determine, based on the first image, location information of defects in the first image and film thickness information of the first image; A second acquisition module, used to acquire a second image based on the position information of the defect, wherein the second image is obtained by performing a second image acquisition at the position of the defect; A first judgment module is used to judge the type of the defect based on the second image, and to count the types of the defect to obtain the number of defects of each type; A second judgment module is used to judge whether the perovskite photovoltaic module to be inspected is qualified based on the number of defects of each type or the film thickness information of the first image; The third judgment module is used to convey the perovskite photovoltaic component to be detected to the next process when it is judged that the perovskite photovoltaic component to be detected is qualified; and to issue an unqualified alarm instruction when it is judged that the perovskite photovoltaic component to be detected is unqualified.

[0014] Preferably, the illumination module comprises: a light source assembly; the light source assembly comprises a light guide plate, a light diffusion plate is arranged above the light emitting surface of the light guide plate, a reflective film is arranged below the light emitting surface of the light guide plate, and a light source is arranged on the side of the light guide plate. In a third aspect, the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores at least one instruction, at least one program, a code set or an instruction set, and the at least one instruction, the at least one program, the code set or the instruction set is loaded and executed by a processor to implement a method for detecting defects in a perovskite photovoltaic module as described in any one of claims 1 to 7.

[0015] Compared with the prior art, the present invention has the following beneficial effects: The present invention scans and photographs the perovskite layer in the perovskite photovoltaic module to be detected, quickly locates the defects of the perovskite layer by scanning the image, and determines the type of defects by 3D imaging, so that the defects of the perovskite layer can be quickly detected and analyzed, and early warning can be determined, thereby improving the yield of the perovskite photovoltaic module product. The film thickness information of the perovskite layer can also be analyzed by scanning the image, the uniformity of the film thickness of the perovskite layer can be judged, and an early warning can be given, effectively solving the problem of monitoring the lack of film thickness information during the production process, so that the staff can timely understand the film thickness information of the perovskite layer, and at the same time, the efficiency of perovskite coating process debugging and optimization can be improved. The present invention monitors the defects and film thickness uniformity of the perovskite layer, improves the product yield of the perovskite photovoltaic module, and reduces the rework and scrapping caused by the defects of the perovskite layer in the perovskite photovoltaic module, which can improve production efficiency and reduce production costs; at the same time, high-quality products can also improve the competitiveness of the perovskite photovoltaic module in the market.

[0016] Furthermore, the method provided by the present invention is operated in a constant temperature and humidity environment to prevent the perovskite photovoltaic module to be tested, which has a perovskite layer on the top, from being exposed to the atmospheric environment and being corroded and polluted by water vapor.

[0017] The online defect detection device provided by the present invention can quickly detect whether there are defects in the perovskite layer and the uniformity of the film layer, and issue an early warning, thereby improving the yield of the perovskite photovoltaic module and reducing production costs; it can also meet different production requirements. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0019] Figure 1 This is a schematic diagram of the film structure of an existing perovskite solar cell; Figure 2 It is a structural block diagram of a perovskite photovoltaic module defect detection system provided in an embodiment of the present application; Figure 3 It is a flow chart of a method for detecting defects in a perovskite photovoltaic module provided in the present application; Figure 4 It is a schematic diagram of the perovskite layer in the perovskite photovoltaic module to be tested provided in the present application after being irradiated by the light source module; Figure 5 is a scanned image provided by this application; Figure 6 is another scanned image provided by this application; Figure 7 This application provides a film thickness data map converted from a scanned image; Figure 8 is a schematic diagram of 3D imaging of defects provided by the present application; Fig. 9 It is a structural schematic diagram of a light source assembly provided in this application.

[0020] In the figure, 1. computer equipment; 2. optical detection camera equipment; 3. light source assembly; 11. tempered glass; 12. POE film; 13. TCO glass; 14. hole transport layer; 15. perovskite layer; 16. electron transport layer; 17. electrode layer; 18. cover glass; 19. butyl rubber; 31. light source; 32 light guide plate; 33 reflective film; 34. light diffuser plate. DETAILED DESCRIPTION

[0021] In order to enable those skilled in the art to understand the characteristics and effects of the present invention, the following is a general description and definition of the terms and expressions mentioned in the specification and claims. Unless otherwise specified, all technical and scientific terms used in the text are the common meanings understood by those skilled in the art for the present invention. In the event of a conflict, the definition in this specification shall prevail.

[0022] The theories or mechanisms described and disclosed herein, whether correct or incorrect, should not limit the scope of the present invention in any way, that is, the present invention can be implemented without being limited by any specific theory or mechanism.

[0023] In this article, all features such as values, quantities, contents and concentrations defined in the form of numerical ranges or percentage ranges are for simplicity and convenience only. Accordingly, the description of numerical ranges or percentage ranges should be considered to have included and specifically disclosed all possible secondary ranges and individual values ​​within the range (including integers and fractions).

[0024] In this document, unless otherwise specified, “includes,” “including,” “contains,” “has,” or similar terms cover the meanings of “consisting of” and “mainly consisting of,” for example, “A includes a” covers the meanings of “A includes a and other” and “A only includes a.”

[0025] In this document, in order to make the description concise, not all possible combinations of various technical features in various embodiments or examples are described. Therefore, as long as there is no contradiction in the combination of these technical features, the various technical features in various embodiments or examples can be combined arbitrarily, and all possible combinations should be considered to be within the scope of this specification.

[0026] Please refer to Figure 2 The perovskite photovoltaic module defect detection system may include: a computer device 1 and an optical detection camera device 2.

[0027] The computer device 1 may be a computer, or a server, or a server cluster consisting of several servers, or a cloud computing service center.

[0028] The optical inspection camera device 2 can be used to collect information about the perovskite photovoltaic module to be inspected.

[0029] In the present application, the computer device 1 can establish a communication connection with the optical detection camera device 2 via a wired network or a wireless network.

[0030] The perovskite photovoltaic module to be tested in the present invention refers to a semi-finished module obtained by using TCO glass as a substrate, depositing a hole transport layer on the TCO glass, coating a perovskite layer, decompressing and drying, and completing an annealing process. Here, the side containing the perovskite layer is defined as the front side of the perovskite photovoltaic module to be tested; the opposite side is defined as the back side of the perovskite photovoltaic module to be tested.

[0031] The method for detecting defects of perovskite photovoltaic modules provided by the present invention can be carried out in a sealed constant temperature and low humidity environment, for example, in an environment with a humidity of less than 30% and a temperature of 23°C. In this way, the perovskite photovoltaic module to be detected can be prevented from being corroded by water vapor in the environment, thereby reducing the risk of contamination of the perovskite photovoltaic module to be detected. The method is to place the perovskite photovoltaic module to be detected above the light source component, and use the light source component to illuminate the back of the perovskite photovoltaic module to be detected, so that the defects of the perovskite layer are clearly displayed; then the defects of the perovskite layer and the thickness of the film layer are analyzed to determine whether the perovskite photovoltaic module to be detected is qualified.

[0032] Please refer to Figure 3 The method for detecting defects of perovskite photovoltaic modules provided by the present invention has the following specific implementation steps: S1: Acquire a first image, wherein the first image is obtained by irradiating the back side of the perovskite photovoltaic module to be detected and performing a first image acquisition on the perovskite layer in the perovskite photovoltaic module to be detected; For example, first, the perovskite photovoltaic module to be inspected can be placed above the light source module by a manipulator, so that the back of the perovskite photovoltaic module to be inspected faces the light source module; then, the light source module is turned on, so that the light emitted by the light source module irradiates the entire back of the perovskite photovoltaic module to be inspected. Then, a scanning camera in the optical inspection camera device is used to perform a first image acquisition of the perovskite layer in the perovskite photovoltaic module to be inspected, and a first image is obtained.

[0033] The light source component needs to provide a sufficiently large luminous flux. When the luminous flux is large and the brightness is high, the defects of the perovskite layer to be detected can be clearly displayed. Figure 4 As shown, the black dotted frame is the defect of the perovskite layer to be detected after being irradiated by the light source component.

[0034] S2: Based on the first image, determining the position information of the defect in the first image and the film thickness information of the first image; Based on the first image, the computer device can obtain a grayscale image corresponding to the first image, and compare the grayscale image corresponding to the first image with a grayscale image of a standard defect-free film layer to determine the location information of the defects in the first image.

[0035] Based on the first image, the computer device can obtain the film thickness data graph corresponding to the first image and determine the film thickness information of the first image. Here, the film thickness information of the first image may include: the maximum value of the film thickness of the first image, the minimum value of the film thickness of the first image, and the uniformity of the film thickness of the first image. It should be noted that the uniformity of the film thickness of the first image refers to: (maximum value of the film thickness - minimum value of the film thickness) / (maximum value of the film thickness + minimum value of the film thickness))*100%.

[0036] For example, a qualified perovskite film surface should be smooth, such as Figure 5 In the first image shown, many black spots can be observed. The black spots marked by the black dotted box are defects. Figure 5 The first image is used to obtain a corresponding grayscale image, and then the grayscale image of the first image is compared with the grayscale image of the standard defect-free film layer to determine Figure 5 The position information of the defect in the first image.

[0037] For example, Figure 6 and Figure 7 As shown, the computer device obtains Figure 6 After the first image shown in FIG. 1 is obtained, the first image can be uniformly converted by digitalization to obtain the following Figure 7 The film thickness data graph shown in FIG. 1 can be used to determine the maximum value of the film thickness of the first image, the minimum value of the film thickness of the first image, and the uniformity of the film thickness of the first image.

[0038] S3: acquiring a second image based on the position information of the defect, where the second image is acquired by performing a second image acquisition at the position of the defect; It should be noted that the 3D camera in the optical inspection camera device can be controlled to start working, and according to the location information of the defect, the 3D camera in the optical inspection camera device is used to perform a 360-degree scan on the location of the defect, perform 3D imaging, and obtain a second image.

[0039] S4: based on the second image, determining the type of the defect, counting the types of the defect, and obtaining the number of defects of each type; The computer device can determine the defect type based on the second image. For example, the computer device can determine whether the defect is a pit or a protrusion, as well as the height and diameter of the defect based on the second image. The type of defect can be determined based on the height and diameter of the defect and statistics can be performed to obtain the number of defects of each type.

[0040] It should be noted that according to the process control standards, defects can be divided into three specifications: large defects, medium defects and small defects; When the diameter or height of the defect is greater than 200 microns, the computer equipment can determine that the defect is a large defect; When the diameter or height of the defect is between 50 microns and 200 microns, the computer device can determine that the defect is a medium defect; When the diameter or height of the defect is less than 50 microns, the computer equipment can determine that the defect is a small defect.

[0041] For example, Figure 8 As shown, it shows the 3D imaging of defects provided by the embodiment of the present invention. Among them, a defect presents a bulge with a diameter of 150 microns and a height of 36 microns, and the defect is determined to be a medium-sized defect; another defect presents a pit with a diameter of 274 microns and a height of 120 microns, and the defect is determined to be a large defect.

[0042] S5: judging whether the perovskite photovoltaic module to be inspected is qualified based on the number of defects of each type or the film thickness information of the first image; It should be noted that the warning values ​​of the number of large defects, medium defects and small defects, as well as the maximum value of the film thickness, the minimum value of the film thickness and the uniformity of the film thickness are set in the computer equipment respectively.

[0043] If any of the number of large defects, the number of medium defects, the number of small defects, the maximum film thickness, the minimum film thickness and the uniformity of the film thickness exceeds the warning value, the perovskite photovoltaic module to be tested is judged to be an unqualified module.

[0044] If any of the number of large defects, the number of medium defects, the number of small defects, the maximum value of the film thickness, the minimum value of the film thickness and the uniformity of the film thickness does not exceed the warning value, the perovskite photovoltaic module to be tested is judged to be a qualified module.

[0045] For example, the warning values ​​of various types of defects are set as follows: Generally, the number of large defects is limited to no more than 5. For example, when the number of large defects is 6, the perovskite photovoltaic module to be tested is judged to be unqualified.

[0046] Generally, the number of medium defects is limited to no more than 20. For example, when the number of medium defects is 25, the perovskite photovoltaic module to be tested is judged to be unqualified.

[0047] Generally, the number of small defects is limited to no more than 50. For example, when the number of small defects is 60, the perovskite photovoltaic module to be tested is judged to be unqualified.

[0048] In this application, the warning value of the film thickness information of the first image is set as follows: The minimum value of the film layer thickness in the first image is not less than 450 micrometers; the maximum value of the film layer thickness in the first image is not greater than 700 micrometers; and the uniformity of the film layer thickness in the first image does not exceed 10%.

[0049] For example, if the minimum value of the film thickness in the first image is 400 microns, or the maximum value of the film thickness in the first image is 800 microns, or the uniformity of the film thickness in the first image is 15%, then the perovskite photovoltaic module to be inspected is judged to be unqualified.

[0050] S6: When it is determined that the perovskite photovoltaic component to be tested is qualified, the perovskite photovoltaic component to be tested is transported to the next process; when it is determined that the perovskite photovoltaic component to be tested is unqualified, an unqualified alarm instruction is issued to alarm and remind engineers to conduct investigation and processing; It should be noted that when the perovskite photovoltaic module to be tested is judged to be unqualified, an alarm can be issued, such as a buzzer or a flash. In order to avoid false detection, at least two detection processes can be performed. When the perovskite photovoltaic module to be tested is judged to be unqualified for two or more consecutive detection processes, an alarm can be issued, such as a buzzer twice or a continuous buzzer, or the flash is always on, etc. Compared with the alarm intensity during a single failure, it is stronger to remind the staff to conduct investigation and processing. It should be noted that an alarm can be used here to issue an unqualified alarm instruction, and the alarm can be a commonly used alarm, and the present invention does not make specific restrictions on this.

[0051] In the present application, the present invention also provides a device for detecting defects of a perovskite photovoltaic module, the device comprising: An illumination module, used to illuminate the back side of the perovskite photovoltaic module to be inspected; A first acquisition module is used to acquire a first image, wherein the first image is obtained by irradiating the back side of the perovskite photovoltaic component to be detected and performing a first image acquisition on the perovskite layer in the perovskite photovoltaic component to be detected; A determination module, configured to determine, based on the first image, location information of defects in the first image and film thickness information of the first image; A second acquisition module, used to acquire a second image based on the position information of the defect, wherein the second image is obtained by performing a second image acquisition at the position of the defect; A first judgment module is used to judge the type of the defect based on the second image, and to count the types of the defect to obtain the number of defects of each type; A second judgment module is used to judge whether the perovskite photovoltaic module to be inspected is qualified based on the number of defects of each type or the film thickness information of the first image; The third judgment module is used to convey the perovskite photovoltaic component to be detected to the next process when it is judged that the perovskite photovoltaic component to be detected is qualified; and to issue an unqualified alarm instruction when it is judged that the perovskite photovoltaic component to be detected is unqualified.

[0052] It should be noted that the illumination module may include: a light source component 3; the light source component 3 may be arranged below the perovskite photovoltaic component to be inspected to illuminate the back side of the perovskite photovoltaic component to be inspected; the light source component 3 needs to have a large luminous flux and high brightness so that small defects in the perovskite layer can be clearly displayed.

[0053] Here, if Fig. 9 As shown, the light source assembly 3 may include: a frame (not shown in the figure), and a side-entry light source 31, a light guide plate 32, a reflective film 33 and a light diffusion plate 34 located in the frame.

[0054] A light diffuser plate 34 is arranged above the light emitting surface of the light guide plate 32, a reflective film 33 is arranged below the light emitting surface of the light guide plate 32, and a light source 31 is arranged on the side of the light guide plate 32. The light source 31 can be an LED light source, and the luminous flux of the LED light source is 100lm / W~110lm / W. The light emitting surface of the light source can be facing the side of the light guide plate, and the light emitted by the light source is homogenized by the light guide plate, and then passes through the light diffuser plate to irradiate the back of the perovskite photovoltaic component to be tested. For example, the light source assembly has a uniform brightness distribution, constitutes a complete planar light source, can efficiently emit a whole surface of white light, and the entire light source assembly can achieve low energy consumption.

[0055] The present invention also provides a storage medium, specifically a computer-readable storage medium (Memory), which is a memory device in a terminal device for storing programs and data. It can be understood that the computer-readable storage medium here can include both the built-in storage medium in the terminal device and the extended storage medium supported by the terminal device. The computer-readable storage medium provides a storage space, which stores the operating system of the terminal. In addition, one or more instructions suitable for being loaded and executed by the processor are also stored in the storage space, and these instructions can be one or more computer programs (including program codes). It should be noted that the computer-readable storage medium here can be a high-speed RAM memory or a non-volatile memory (Non-Volatile Memory), such as at least one disk memory.

[0056] One or more instructions stored in a computer-readable storage medium may be loaded and executed by a processor to implement the corresponding steps of the above-mentioned calculation method; one or more instructions in the computer-readable storage medium are loaded and executed by a processor as follows: Acquire a first image, wherein the first image is obtained by irradiating the back side of the perovskite photovoltaic component to be detected and performing a first image acquisition on the perovskite layer in the perovskite photovoltaic component to be detected; Based on the first image, determining position information of defects in the first image and film thickness information of the first image; Based on the position information of the defect, a second image is acquired, where the second image is acquired by performing a second image acquisition at the position of the defect; Based on the second image, determining the type of the defect, and counting the types of the defect to obtain the number of defects of each type; Based on the number of defects of each type or the film thickness information of the first image, determining whether the perovskite photovoltaic module to be inspected is qualified; When it is judged that the perovskite photovoltaic component to be detected is qualified, the perovskite photovoltaic component to be detected is transported to the next process; when it is judged that the perovskite photovoltaic component to be detected is unqualified, an unqualified alarm instruction is issued.

[0057] The above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit the same. Although the present invention has been described in detail with reference to the above embodiments, a person skilled in the art can still modify or make equivalent substitutions to the specific implementations of the present invention. Any modifications or equivalent substitutions that do not depart from the spirit and scope of the present invention are within the scope of protection of the claims of the present invention to be approved.

Claims

1. A method for detecting defects in a perovskite photovoltaic module, characterized in that: The following steps are involved: Acquire a first image, wherein the first image is obtained by irradiating the back side of the perovskite photovoltaic component to be detected and performing a first image acquisition on the perovskite layer in the perovskite photovoltaic component to be detected; Based on the first image, determining position information of defects in the first image and film thickness information of the first image; Based on the position information of the defect, a second image is acquired, where the second image is acquired by performing a second image acquisition at the position of the defect; Based on the second image, determining the type of the defect, and counting the types of the defect to obtain the number of defects of each type; Based on the number of defects of each type or the film thickness information of the first image, determining whether the perovskite photovoltaic module to be inspected is qualified; When it is judged that the perovskite photovoltaic component to be detected is qualified, the perovskite photovoltaic component to be detected is transported to the next process; when it is judged that the perovskite photovoltaic component to be detected is unqualified, an unqualified alarm instruction is issued.

2. A method for detecting defects in a perovskite photovoltaic module according to claim 1, characterized in that: Determining, based on the first image, location information of defects in the first image and film thickness information of the first image, includes: Based on the first image, determining a grayscale image of the first image; Comparing the grayscale image of the first image with the grayscale image of a standard defect-free film layer to determine the position information of the defects in the first image; Based on the first image, a film thickness data map corresponding to the first image is acquired to determine film thickness information of the first image.

3. A method for detecting defects in a perovskite photovoltaic module according to claim 1, characterized in that: Based on the position information of the defect, a second image is acquired, where the second image is acquired by performing a second image acquisition at the position of the defect, including: Based on the position information of the defect, 3D imaging is performed on the position of the defect to obtain a second image.

4. A method for detecting defects in a perovskite photovoltaic module according to claim 1, characterized in that: Determining the type of the defect based on the second image includes: determining a height and a diameter of the defect based on the second image; If the diameter or height of the defect is greater than 200 microns, the defect is determined to be a large defect; If the diameter or height of the defect is in the range of 50 μm to 200 μm, the defect is determined to be a medium defect; If the diameter or height of the defect is less than 50 micrometers, the defect is determined to be a small defect.

5. A method for detecting defects in a perovskite photovoltaic module according to claim 4, characterized in that: Based on the number of defects of each type or the film thickness information of the first image, judging whether the perovskite photovoltaic module to be inspected is qualified includes: Warning values ​​for the number of the large defects, the medium defects, and the small defects are set respectively. If the number of the large defects, the medium defects, or the small defects exceeds the warning value, the perovskite photovoltaic module to be tested is judged to be unqualified.

6. A method for detecting defects in a perovskite photovoltaic module according to claim 1, characterized in that: The film thickness information of the first image includes: a maximum value of the film thickness of the first image, a minimum value of the film thickness of the first image, and uniformity of the film thickness of the first image; judging whether the perovskite photovoltaic module to be inspected is qualified based on the number of defects of each type or the film thickness information of the first image, further comprising: The maximum value of the film thickness, the minimum value of the film thickness and the warning value of the uniformity of the film thickness are set respectively. If the maximum value of the film thickness or the minimum value of the film thickness or the uniformity of the film thickness exceeds the warning value, the perovskite photovoltaic module to be tested is judged to be unqualified.

7. A device for detecting defects in perovskite photovoltaic modules, characterized in that: The device comprises: An illumination module, used to illuminate the back side of the perovskite photovoltaic module to be inspected; A first acquisition module is used to acquire a first image, wherein the first image is obtained by irradiating the back side of the perovskite photovoltaic component to be detected and performing a first image acquisition on the perovskite layer in the perovskite photovoltaic component to be detected; A determination module, configured to determine, based on the first image, location information of defects in the first image and film thickness information of the first image; A second acquisition module, used to acquire a second image based on the position information of the defect, wherein the second image is obtained by performing a second image acquisition at the position of the defect; A first judging module is used to judge the type of the defect based on the second image, and to count the types of the defect to obtain the number of defects of each type; A second judgment module is used to judge whether the perovskite photovoltaic module to be inspected is qualified based on the number of defects of each type or the film thickness information of the first image; The third judgment module is used to convey the perovskite photovoltaic component to be detected to the next process when it is judged that the perovskite photovoltaic component to be detected is qualified; and to issue an unqualified alarm instruction when it is judged that the perovskite photovoltaic component to be detected is unqualified.

8. A device for detecting defects of a perovskite photovoltaic module according to claim 7, characterized in that: The illumination module comprises: a light source assembly; the light source assembly comprises a light guide plate, a light diffusion plate is arranged above the light emitting surface of the light guide plate, a reflective film is arranged below the light emitting surface of the light guide plate, and a light source is arranged on the side of the light guide plate.

9. A computer-readable storage medium, characterized in that The computer-readable storage medium stores at least one instruction, at least one program, a code set or an instruction set, and the at least one instruction, the at least one program, the code set or the instruction set is loaded and executed by a processor to implement a method for detecting defects in a perovskite photovoltaic module as described in any one of claims 1 to 6.

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