Non-contact high temperature detector based on visible light spectrometer and full spectrum method
The non-contact temperature measurement system using a visible light spectrometer and full-spectrum method improves precision by correcting optical aberrations and eliminating noise, ensuring accurate temperature readings in complex steelmaking environments.
Patent Information
- Application Number
- CN202510410462.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-04-02
- Publication Date
- 2025-07-15
AI Technical Summary
The existing non-contact high-temperature detectors are susceptible to environmental factors at the steel smelting site, resulting in a decrease in detection accuracy and cannot meet the accurate measurements in complex environments such as high temperature, high humidity, atmospheric attenuation and dust.
A non-contact high-temperature detector based on visible light spectrometer and full spectrum method is used to obtain the spontaneous radiant light of the target to be detected through the full spectrum collection system and the spectral analysis system, perform dispersed spectral and data processing, eliminate impurities and background radiation interference, and accurately identify the target spectrum and temperature using the spectral database and temperature calculation module.
It significantly improves the accuracy and stability of temperature detection, can maintain high resolution and high reliability in complex environments, and is suitable for various steel smelting scenarios.
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Figure CN120313754A_ABST
Abstract
Description
Technical Field
[0001] This application belongs to the technical field of spectral measurement, and more specifically, relates to a non-contact high-temperature detector based on a visible light spectrometer and the full-spectrum method. Background Art
[0002] In the actual production of detecting the temperature of steel smelting, due to the relatively complex environment at the steel production site, there are influencing factors such as high temperature, high humidity, atmospheric attenuation, environmental dust, and interference from other high-temperature targets. As a result, non-contact temperature measurement with a single wavelength is easily affected by environmental factors, leading to a decrease in detection accuracy, inaccurate measured temperature, and hindrance to production. Summary of the Invention
[0003] Aiming at the defects of the prior art, the purpose of this application is to provide a non-contact high-temperature detector based on a visible light spectrometer and the full-spectrum method, aiming to solve the problem of low detection accuracy caused by the susceptibility of existing non-contact temperature measurement to environmental factors.
[0004] To achieve the above purpose, in the first aspect, this application provides a non-contact high-temperature detector based on a visible light spectrometer and the full-spectrum method, including a full-spectrum collection system and a spectral analysis system: The output end of the full-spectrum collection system is connected to the input end of the spectral analysis system, and is used to obtain the spontaneous emission light of the target to be detected, and perform dispersion spectroscopy on the radiation light to obtain visible light full-band spectral data; The spectral analysis system is used to analyze and process the visible light full-band spectral data, obtain the spectrum of the target to be detected, and obtain the temperature based on the spectrum of the target to be detected.
[0005] This application performs dispersion spectroscopy on the radiation light of the target to be detected to obtain visible light full-band spectral data, which includes the spectrum of the target to be detected and the spectra of interference substances such as impurities and background radiation. Then, by analyzing and processing the visible light full-band spectral data, only the spectrum of the target to be detected is extracted, and the temperature is obtained based on the spectrum of the target to be detected, which can significantly enhance the accuracy of temperature detection.
[0006] According to a non-contact high-temperature detector based on a visible light spectrometer and the full-spectrum method provided by this application, the full-spectrum collection system includes a photon collection module and a visible light spectrometer based on the Czerny-Turner (C-T) structure: The output end of the photon collection module is connected to the input end of the visible light spectrometer based on the C-T structure, and is used to collect the spontaneous emission light of the target to be detected; The visible light spectrometer based on the C-T structure is used to perform dispersion spectroscopy on the radiation light.
[0007] First, the present application collects the spontaneous emission light of the target to be detected through a photon collection module, and then uses a visible light spectrometer with a C-T structure for dispersion spectroscopy, which can effectively correct aberrations such as spherical aberration and coma, improve the resolution. In addition, the symmetry of the optical path can reduce astigmatism.
[0008] According to a non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method provided by the present application, the photon collection module includes a reflective Cassegrain telescope for collecting the spontaneous emission light of the target to be detected.
[0009] According to a non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method provided by the present application, the visible light spectrometer with a C-T structure includes an entrance slit, a collimating mirror, a diffraction grating, a focusing mirror, and an exit slit: The entrance slit is used for spatial filtering of the radiation light; The collimating mirror is used for reflecting the spatially filtered radiation light and converting it into a collimated parallel beam; The diffraction grating is used for dispersing the parallel beam to form multiple parallel beams arranged by wavelength; The focusing mirror is used for reflecting the multiple parallel beams and focusing them on the focal plane to obtain the focused radiation light; The exit slit is used for eliminating stray light in the focused radiation light.
[0010] According to a non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method provided by the present application, the exit slit is connected to a fiber optic coupling interface, and the fiber optic coupling interface is used for restricting the optical flux of the light beam.
[0011] The present application connects the exit slit to the fiber optic coupling interface to restrict the optical flux of the light beam, thereby improving the spectral resolution.
[0012] According to a non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method provided by the present application, the full-spectrum collection system further includes a charge coupled device (CCD) array and an analog to digital converter (ADC) module. The output end of the CCD array is connected to the input end of the ADC module, and is used for performing full-spectrum integration sampling on the radiation light after dispersion spectroscopy to obtain visible light full-band spectral data; The ADC module is used for performing analog-to-digital conversion on the visible light full-band spectral data.
[0013] A non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method provided by the present application. The full-spectrum collection system further includes a synchronous acquisition module for outputting a synchronous pulse signal, and the synchronous pulse signal is used to trigger the area array CCD to perform full-spectrum integration sampling on the dispersed and spectrally decomposed radiation light.
[0014] Through the synchronous acquisition module of the present application, the area array CCD is controlled by the synchronous pulse signal to perform full-spectrum integration sampling on the dispersed and spectrally decomposed radiation light, eliminating the timing error of time-division sampling and ensuring the accuracy and real-time performance of data acquisition.
[0015] A non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method provided by the present application. The spectral analysis system includes a noise elimination module, a spectral separation module, and a temperature calculation module: The output end of the noise elimination module is connected to the input end of the spectral separation module, and is used to eliminate the noise in the visible light full-band spectral data; The output end of the spectral separation module is connected to the input end of the temperature calculation module, and is used to separate the visible light full-band spectral data to obtain the spectrum of the target to be detected; The temperature calculation module is used to obtain the temperature of the target to be detected based on the spectrum of the target to be detected.
[0016] A non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method provided by the present application. The spectral separation module is specifically used for: Establish an impurity absorption spectrum and an environmental spectrum database; Based on the impurity absorption spectrum and the environmental spectrum database, separate the visible light full-band spectral data to obtain the spectrum of the target to be detected.
[0017] The present application establishes an impurity absorption spectrum and an environmental spectrum database, separates and processes the collected visible light spectrum. By comparing and matching the spectral characteristics in the database, the impurity absorption spectrum and the environmental spectrum parts can be accurately identified and removed, and only the spectral signal of the object to be measured is retained to ensure the accuracy and reliability of the separation.
[0018] A non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method provided by the present application. The temperature calculation module is specifically used for: Construct and train a temperature analysis model; Based on the spectrum of the target to be detected and the trained temperature analysis model, obtain the temperature of the target to be detected.
[0019] Generally speaking, compared with the prior art, the above technical solutions conceived by the present application have the following beneficial effects: (1) By dispersing and spectroscopically analyzing the radiation light of the target to be detected, the visible light full-band spectral data is obtained, which includes the spectrum of the target to be detected and the spectra of interfering substances such as impurities and background radiation. Then, by analyzing and processing the visible light full-band spectral data, only the spectrum of the target to be detected is extracted, and the temperature is obtained based on the spectrum of the target to be detected, which can significantly enhance the accuracy of temperature detection.
[0020] (2) The radiation light of the target to be detected is collected by the photon collection module, and then a visible light spectrometer with a C-T structure is used for dispersive spectroscopy, which can effectively correct aberrations such as spherical aberration and coma, improve the resolution. In addition, the symmetry of the optical path can reduce astigmatism.
[0021] (3) Through the synchronous acquisition module, the area array CCD is controlled by a synchronous pulse signal to perform full-spectrum integration sampling on the radiation light after dispersive spectroscopy, eliminating the timing error of time-sharing sampling and ensuring the accuracy and real-time nature of data acquisition.
[0022] (4) An impurity absorption spectrum and environmental spectrum database are established, and the collected visible light spectra are separated and processed. By comparing and matching the spectral characteristics in the database, the impurity absorption spectrum and environmental spectrum parts can be accurately identified and removed, and only the spectral signal of the object to be measured is retained to ensure the accuracy and reliability of the separation. Description of the Drawings
[0023] In order to more clearly illustrate the technical solutions in the present application or the prior art, the following will briefly introduce the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings in the following description are some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.
[0024] Figure 1 It is a schematic structural diagram of a non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method provided by an embodiment of the present application; Figure 2 It is a schematic principle diagram of a reflective Cassegrain telescope provided by an embodiment of the present application; Figure 3 It is a schematic structural diagram of a visible light spectrometer with a C-T structure provided by an embodiment of the present application; Figure 4 It is a schematic diagram of the measurement result provided by an embodiment of the present application. Specific Embodiments
[0025] In order to make the purpose, technical solutions and advantages of the present application clearer, the following further details the present application in combination with the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.
[0026] As used herein, the term "and / or" describes the relationship between associated objects and indicates that there can be three relationships. For example, A and / or B can represent three cases: A exists alone, A and B exist simultaneously, and B exists alone. In this text, the symbol " / " indicates that the associated objects are in an "or" relationship. For example, A / B means A or B.
[0027] In the embodiments of this application, words such as "exemplary" or "for example" are used to give examples, illustrations, or explanations. Any embodiment or design described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or having more advantages than other embodiments or designs. Rather, the use of words such as "exemplary" or "for example" is intended to present relevant concepts in a specific manner.
[0028] In the description of the embodiments of this application, unless otherwise specified, the meaning of "a plurality of" refers to two or more. For example, a plurality of processing units refers to two or more processing units, and a plurality of elements refers to two or more elements, etc.
[0029] First, the following content will be introduced: China's steel production accounts for half of the world's total output. With the development of science and technology, the demand for steel in all industries is increasing, and the requirements for steel quality are also getting higher and higher. Reducing energy consumption, improving efficiency, green development, and increasing precision are the pursuits of steel development. In steel smelting, temperature is one of the key factors for preparing high-quality steel. Real-time and high-precision detection of the steel smelting temperature directly affects product quality. At the same time, it can reduce material and fuel consumption, lower energy consumption costs, meet the requirements of environmental protection and energy conservation, and is also an essential step in promoting steel automation production.
[0030] In actual production applications, common temperature measurement technologies are divided into contact temperature measurement and non-contact temperature measurement according to whether they are directly in contact with the target to be measured. Contact temperature measurement mainly uses thermocouples. When measuring temperature, the thermocouple probe needs to be in full contact with the surface of the steel to be measured and wait for 3 - 20 seconds. Although the unit price of thermocouples is relatively cheap, the temperature measurement time is long, the consumption is large, and it will also damage a certain temperature field. At the same time, due to the high temperature, it is impossible to find very good high-temperature resistant materials to produce reusable temperature measurement products. There are only disposable thermocouples on the market, resulting in great waste and unable to meet actual production applications; non-contact temperature measurement is mainly based on single / double wavelength detection. The detector receives the single wavelength light emitted by the target to be measured and converts it into an electrical signal that can be measured, thereby calculating the corresponding temperature. Compared with contact temperature measurement, infrared temperature measurement has a faster temperature measurement speed and a longer temperature measurement distance.
[0031] However, due to the relatively complex environment at the steel production site, there are influencing factors such as high temperature, high humidity, atmospheric attenuation, environmental dust, and interference from other high-temperature targets. Single-wavelength detection is easily affected by environmental factors, resulting in a decline in detection accuracy and inaccurate measured temperature, which hinders production. In addition to accuracy, in enterprise production, the pursuit of miniaturization can not only save production costs, but also reduce operating costs, lower maintenance difficulty, and better meet actual needs.
[0032] Next, in combination with Figures 1 - 4 the non-contact high-temperature detector based on a visible light spectrometer and the full-spectrum method provided in the embodiments of the present application will be introduced.
[0033] Figure 1 is a schematic structural diagram of the non-contact high-temperature detector based on a visible light spectrometer and the full-spectrum method provided in the embodiments of the present application. As Figure 1 shown, the high-temperature detector 100 includes a full-spectrum collection system 110 and a spectral analysis system 120, where: The output end of the full-spectrum collection system 110 is connected to the input end of the spectral analysis system 120, which is used to obtain the spontaneous emission light of the target to be detected, disperse and split the radiation light, and obtain the visible light full-band spectral data; The spectral analysis system 120 is used to analyze and process the visible light full-band spectral data, obtain the spectrum of the target to be detected, and obtain the temperature based on the spectrum of the target to be detected.
[0034] The present application uses the full-spectrum method to measure the temperature of the target to be detected. The full-spectrum method is a temperature measurement technology based on spectral analysis in the visible light band. First, the complete spectral signal of the target to be detected needs to be collected through the full-spectrum collection system. This signal contains the spectrum of the target to be detected, the impurity absorption spectrum, and the environmental spectrum. After the spectral data collection is completed, the collected visible light spectrum is separated and processed by the spectral analysis system to accurately identify and remove the impurity absorption spectrum and the environmental spectrum part, and only the spectral signal of the target to be detected is retained. Finally, based on the spectrum of the target to be detected, its temperature is calculated through a physical model.
[0035] Through the spectral analysis strategy of dynamically separating the radiation of the target to be measured from the background noise, the anti-interference ability of this device to impurity absorption peaks and background radiation can be significantly enhanced, and there is no need to customize algorithms according to different objects to be measured and different application scenarios. It can work stably in various complex environments and has high universality, stability, and reliability.
[0036] A non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method provided by the present application disperses and spectroscopically analyzes the radiation light of a target to be detected to obtain visible light full-band spectral data, which includes the spectrum of the target to be detected and the spectra of interference substances such as impurities and background radiation. Then, by analyzing and processing the visible light full-band spectral data, only the spectrum of the target to be detected is extracted, and the temperature is obtained based on the spectrum of the target to be detected, which can significantly enhance the accuracy of temperature detection.
[0037] In some embodiments, the full-spectrum collection system 110 includes a photon collection module and a visible light spectrometer based on a C-T structure: The output end of the photon collection module is connected to the input end of the visible light spectrometer based on the C-T structure, and is used to collect the spontaneous radiation light of the target to be detected; The visible light spectrometer based on the C-T structure is used to disperse and spectroscopically analyze the radiation light.
[0038] Optionally, considering the on-site environment of high-temperature measurement, the service life of the system, and the measurement accuracy, a photon collection system is adopted to collect the spectrum of the object to be measured at a distance of 15 meters, and is transmitted into the visible light spectrometer based on the C-T structure through an optical fiber.
[0039] The visible light spectrometer based on the C-T structure uses a combination of two reflecting mirrors (a collimating mirror and a focusing mirror) and a plane diffraction grating to achieve a symmetric optical path, and achieves high resolution and low aberration in a wide wavelength range.
[0040] The C-T structure optical path has the following advantages: The two reflecting mirrors can respectively control the collimation and focusing processes, which can effectively correct aberrations such as spherical aberration and coma, and effectively improve the resolution; in addition, the symmetry of the optical path can reduce astigmatism, especially maintaining the stability of spectral quality in a wide wavelength range.
[0041] In some embodiments, the photon collection module includes a reflective Cassegrain telescope for collecting the spontaneous radiation light of the target to be detected.
[0042] Considering the long detection distance and small acceptance angle, a reflective Cassegrain telescope can be used to collect the radiation light of the target to be detected.
[0043] Figure 2 is a schematic diagram of the principle of the reflective Cassegrain telescope provided by the embodiments of the present application. As Figure 2 shown, the Cassegrain telescope realizes long focal length imaging under a compact structure through the combination of a parabolic primary mirror and a hyperbolic secondary mirror, and effectively corrects aberrations in combination with the geometric characteristics of the reflecting mirror.
[0044] In some embodiments, the visible light spectrometer with a C-T structure includes an entrance slit, a collimating mirror, a diffraction grating, a focusing mirror, and an exit slit: The entrance slit is used for spatially filtering the radiation light; The collimating mirror is used for reflecting the spatially filtered radiation light and converting it into a collimated parallel beam; The diffraction grating is used for dispersing the parallel beam to form multiple parallel beams arranged by wavelength; The focusing mirror is used for reflecting the multiple parallel beams and focusing them onto the focal plane to obtain the focused radiation light; The exit slit is used for eliminating the stray light in the focused radiation light.
[0045] Figure 3 is a schematic structural diagram of the visible light spectrometer with a C-T structure provided by an embodiment of the present application. As Figure 3 shown, after the radiation light is introduced into the visible light spectrometer with a C-T structure through an optical fiber or a front optical lens, it first undergoes spatial filtering through the entrance slit. Then, the divergent light is subsequently reflected by the collimating mirror and converted into a collimated parallel beam. This parallel light then irradiates onto the plane diffraction grating, and the light of different wavelengths is dispersed at a specific angle through the periodic grooves on the grating surface to form multiple parallel beams arranged by wavelength. These dispersed lights are reflected by the focusing mirror and focused onto the focal plane. Finally, after the stray light is eliminated by the exit slit, the light enters the exit optical fiber.
[0046] Optionally, the collimating mirror and the focusing mirror can respectively be concave mirrors with focal lengths of 45 mm and 75 mm.
[0047] Optionally, the diffraction grating can be a ruled reflection diffraction grating with a size of 12.7×12.7×6 mm3, a blaze wavelength of 750 nm, 600 lines per mm, a blaze angle of 13°, and a diffraction efficiency of 60%-80% at the blaze wavelength.
[0048] In some embodiments, the exit slit is connected to the fiber optic coupling interface, and the fiber optic coupling interface is used to limit the optical flux of the light beam.
[0049] The exit slit is connected to the fiber optic coupling interface and is used to limit the optical flux of the light beam, thereby improving the spectral resolution.
[0050] Optionally, in order to reduce costs, the materials of the entrance slit and the exit slit can be selected as stainless steel.
[0051] Optionally, the slit can be processed on a stainless steel sheet with a thickness of 0.05 mm through laser processing technology. The slit width is 50 μm, the height is 6.15 mm, and the overall size of the slit sheet is 20×13×0.05 mm3.
[0052] Optionally, to reduce surface reflection, the slit sheet is treated by oxidation to blacken it, so as to further optimize its optical performance.
[0053] In some embodiments, the full-spectrum collection system further includes a charge-coupled device (CCD) array and an analog-to-digital converter (ADC) module. The output end of the CCD array is connected to the input end of the ADC module, which is used to perform full-spectrum integration sampling on the dispersed and spectrally analyzed radiation light to obtain visible light full-band spectral data. The ADC module is used to perform analog-to-digital conversion on the visible light full-band spectral data.
[0054] After the visible light spectrometer with a C-T structure performs spectral analysis, the full-band spectral data of visible light is synchronously collected and output through the CCD array, and then digitized through a high-precision ADC module.
[0055] In some embodiments, the full-spectrum collection system further includes a synchronous acquisition module, which is used to output a synchronous pulse signal for triggering the CCD array to perform full-spectrum integration sampling on the dispersed and spectrally analyzed radiation light.
[0056] The synchronous acquisition module realizes the triggering of the pulse sequence and the timing alignment of the optoelectronic signal acquisition through program control.
[0057] Specifically, the synchronous acquisition module adopts a hardware-level synchronous acquisition architecture to achieve high-precision timing alignment of multi-source signals, including a spectrometer, an embedded AD module, a microcontroller, and a motor drive unit. Based on the hardware trigger synchronization mechanism, the microcontroller unit (MCU) outputs a synchronous pulse signal through its timer module, which simultaneously triggers the detector module to sample, eliminating the timing cumulative error of traditional time-sharing acquisition.
[0058] Optionally, the visible light spectrometer based on the C-T structure adopts a grating-motor linkage structure. The MCU precisely controls the rotation speed of the stepper motor through pulse width modulation (PWM) waves, and the motor encoder real-time feedbacks the grating rotation angle. When the grating reaches the preset diffraction angle, it triggers the CCD array to perform full-spectrum integration sampling, and the acquisition time is dynamically matched with the grating movement speed to ensure high resolution.
[0059] In some embodiments, the spectral analysis system includes a noise cancellation module, a spectral separation module, and a temperature calculation module. The output end of the noise cancellation module is connected to the input end of the spectral separation module, which is used to cancel the noise in the visible light full-band spectral data. The output end of the spectral separation module is connected to the input end of the temperature calculation module, which is used to separate the visible light full-band spectral data to obtain the spectrum of the target to be detected. The temperature calculation module is used to obtain the temperature of the target to be detected based on the spectrum of the target to be detected.
[0060] The temperature measurement process by the full-spectrum method includes steps such as spectral collection, noise elimination, and data processing. After completing spectral collection, the noise in the visible light full-band spectral data can be eliminated through the noise elimination module to eliminate the interference of non-target signal noise.
[0061] Then, the visible light full-band spectral data is separated through the spectral separation module to obtain the spectrum of the target to be detected.
[0062] Finally, the temperature of the target to be detected is obtained through the temperature calculation module.
[0063] In some embodiments, the spectral separation module is specifically used for: Establish an impurity absorption spectrum and environmental spectrum database; Separate the visible light full-band spectral data based on the impurity absorption spectrum and environmental spectrum database to obtain the spectrum of the target to be detected.
[0064] To accurately measure the temperature, a detailed impurity absorption spectrum and environmental spectrum database need to be established. The establishment of these databases depends on the systematic collection and analysis of spectra under various known impurities and environmental conditions.
[0065] After the spectral data collection is completed, using the established impurity absorption spectrum and environmental spectrum database, the collected visible light spectrum is separated and processed. By comparing and matching the spectral characteristics in the database, the impurity absorption spectrum and environmental spectrum parts can be accurately identified and removed, and only the spectral signal of the object to be measured is retained.
[0066] Optionally, when separating, statistical methods such as multiple linear regression and principal component analysis can be used to ensure the accuracy and reliability of the separation.
[0067] In some embodiments, the temperature calculation module is specifically used for: Construct and train a temperature analysis model; Based on the spectrum of the target to be detected and the trained temperature analysis model, obtain the temperature of the target to be detected.
[0068] When calculating the temperature based on the spectrum, it depends on the spectral radiation characteristics of the target to be detected and combines Planck's law and other related thermal radiation theories.
[0069] According to the radiation law, any object with a temperature higher than the thermodynamic lowest temperature will radiate energy outward, and this radiated energy is positively correlated with the object's own temperature. An idealized object that can completely absorb all incident radiation energy, does not reflect or transmit, and releases the maximum radiation energy at the corresponding temperature is called a blackbody. The radiance of a blackbody is calculated by Planck's formula, and the formula is as follows:
[0070] wherein, is the wavelength, is the measured temperature, and are the first and second Planck radiation constants.
[0071] The spectral radiance of any real object has the following relationship with the radiance of a black body at the same temperature:
[0072] is the spectral absorptivity of the real object, which can actually be used to describe the difference between the radiation characteristics of the real object and those of the black body. According to Kirchhoff's law of thermal radiation, under thermal equilibrium conditions, the absorption ratio of an object to thermal radiation is always equal to the emissivity at the same temperature. Therefore, the spectral radiance of a real object can be expressed as:
[0073] Therefore, when performing visible light full-spectrum analysis to obtain the temperature, it is first necessary to establish a temperature analysis model. By using a high-temperature source with a known temperature, radiation spectrum data is obtained at different set temperatures. Multiple temperatures and wavelengths are selected, and the radiation spectra obtained from these experiments are compared with the theoretical black body radiation spectrum. The actual emissivity is analyzed and calculated to obtain .
[0074] Next, the radiation spectrum predicted by the model is compared and analyzed with the experimental measurement values. If there is a large difference between the two, the model parameters need to be adjusted or the emissivity needs to be refitted.
[0075] Finally, based on the established model and the actually measured radiation spectrum data, an inversion method is used to solve for the true temperature of the target object.
[0076] Optionally, in the data processing stage, the Levenberg-Marquardt (LM) algorithm is used to establish a mathematical model between the spectral data and the temperature of the object under test. This is an iterative numerical algorithm widely used for nonlinear least squares optimization problems, especially suitable for scenarios such as parameter estimation, curve fitting, and model calibration.
[0077] The LM algorithm adjusts the damping factor. In the initial stage, it is similar to the gradient descent method and gradually transitions to the Gauss-Newton method as it approaches the optimal solution, achieving an adaptive balance between the gradient descent method and the Gauss-Newton method, and having both global convergence and local fast convergence characteristics.
[0078] During the model training process, a large number of calibrated sample data are used to improve the algorithm's parsing ability under different temperature conditions. After the training is completed, by evaluating the model's performance on the test data, its effectiveness and accuracy in practical applications are further verified.
[0079] Figure 4 It is a schematic diagram of the measurement results provided by an embodiment of the present application. In an embodiment of the present application, the temperature measurement results are as Figure 4 shown.
[0080] The high-temperature model based on the full-spectrum method proposed in the present application expands the temperature measurement range of the device to 1000 - 2000 °C and achieves a measurement accuracy of up to ±1%. Even in extreme outdoor environments with complex background stray light such as sunlight, lamp light, and firelight, the device can still maintain a measurement accuracy within ±2% of the reading value.
[0081] It can be understood that the processor in the embodiment of the present application can be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application specific integrated circuits (ASICs), field programmable gate arrays (FPGAs), or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. The general-purpose processor can be a microprocessor or any conventional processor.
[0082] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented using software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the processes or functions described in the embodiments of the present application are generated in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable devices. The computer instructions can be stored in a computer-readable storage medium or transmitted through the computer-readable storage medium. The computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center in a wired manner (such as coaxial cable, optical fiber, digital subscriber line (DSL)) or a wireless manner (such as infrared, wireless, microwave, etc.). The computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device such as a server or a data center that includes one or more integrated available media. The available medium can be a magnetic medium (such as a floppy disk, hard disk, magnetic tape), an optical medium (such as a DVD), or a semiconductor medium (such as a solid state disk (SSD)), etc.
[0083] It can be understood that the various digital numbers involved in the embodiments of the present application are only for the convenience of description and are not used to limit the scope of the embodiments of the present application.
[0084] Those skilled in the art can easily understand that the above are only the preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements, and improvements made within the spirit and principles of the present application shall be included in the protection scope of the present application.
Claims
1. A non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method, characterized in that, It includes a full-spectrum collection system and a spectral analysis system: The output end of the full-spectrum collection system is connected to the input end of the spectral analysis system, which is used to obtain the spontaneous emission light of the target to be detected, disperse and spectrally analyze the radiation light, and obtain the visible light full-band spectral data; The spectral analysis system is used to analyze and process the visible light full-band spectral data, obtain the spectrum of the target to be detected, and obtain the temperature based on the spectrum of the target to be detected.
2. The non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method according to claim 1, wherein The full-spectrum collection system includes a photon collection module and a visible light spectrometer based on the C-T structure: The output end of the photon collection module is connected to the input end of the visible light spectrometer based on the C-T structure, which is used to collect the spontaneous emission light of the target to be detected; The visible light spectrometer based on the C-T structure is used to disperse and spectrally analyze the radiation light.
3. The non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method according to claim 2, wherein The photon collection module includes a reflective Cassegrain telescope, which is used to collect the spontaneous emission light of the target to be detected.
4. The non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method according to claim 2, characterized in that, The visible light spectrometer based on the C-T structure includes an entrance slit, a collimating mirror, a diffraction grating, a focusing mirror, and an exit slit: The entrance slit is used to perform spatial filtering on the radiation light; The collimating mirror is used to reflect and re-collimate the spatially filtered radiation light into a parallel beam; The diffraction grating is used to disperse the parallel beam to form multiple parallel beams arranged by wavelength; The focusing mirror is used to reflect and focus the multiple parallel beams onto the focal plane to obtain the focused radiation light; The exit slit is used to eliminate the stray light in the focused radiation light.
5. The non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method according to claim 4, wherein, The exit slit is connected to an optical fiber coupling interface, and the optical fiber coupling interface is used to limit the optical flux of the light beam.
6. The non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method according to claim 2, characterized in that The full-spectrum collection system further includes a charge-coupled device (CCD) array and an analog-to-digital converter (ADC) module. The output end of the CCD array is connected to the input end of the ADC module, which is used to perform full-spectrum integration sampling on the radiation light after dispersion and spectral analysis to obtain the visible light full-band spectral data; The ADC module is used to perform analog-to-digital conversion on the visible light full-band spectral data.
7. The non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method according to claim 6, wherein The full-spectrum collection system further includes a synchronous acquisition module, which is used to output a synchronous pulse signal, and the synchronous pulse signal is used to trigger the CCD array to perform full-spectrum integration sampling on the radiation light after dispersion and spectral analysis.
8. The non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method according to claim 1, characterized in that, The spectral analysis system includes a noise cancellation module, a spectral separation module, and a temperature calculation module: The output end of the noise cancellation module is connected to the input end of the spectral separation module, which is used to eliminate the noise in the visible light full-band spectral data; The output end of the spectral separation module is connected to the input end of the temperature calculation module, which is used to separate the visible light full-band spectral data to obtain the spectrum of the target to be detected; The temperature calculation module is used to obtain the temperature of the target to be detected based on the spectrum of the target to be detected.
9. The non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method according to claim 8, characterized in that, The spectral separation module is specifically used for: Establishing an impurity absorption spectrum and an environmental spectrum database; Separating the visible light full-band spectral data based on the impurity absorption spectrum and the environmental spectrum database to obtain the spectrum of the target to be detected.
10. The non-contact high-temperature detector based on a visible light spectrometer and a full-spectrum method according to claim 8, wherein The temperature calculation module is specifically configured to: Construct and train a temperature analysis model; Based on the spectrum of the target to be detected and the trained temperature analysis model, obtain the temperature of the target to be detected.
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