Test fixture and test equipment

Abstract

The present invention provides a test fixture and test equipment. The test fixture includes a probe holder, a compensation structure, and an electrical connector. The probe holder is provided with a receiving groove and a probe socket connected to the receiving groove and used for inserting a probe of an electronic component. The compensation structure is used to compensate for the length of the probe. One end of the compensation structure is electrically connected to the electrical connector, and the end of the compensation structure away from the electrical connector extends into the receiving groove and is used to connect with the probe of the electronic component. The electrical connector is used to connect to a tester. When the test fixture of the present invention is applied to the insertion loss test of a filter, the compensation structure can compensate for the length of the probe, thereby avoiding the situation where the insertion loss curve of the filter is offset due to shearing of the pin, thereby accurately measuring the insertion loss of the filter, so as to facilitate comparison of the insertion loss test result of the filter with the initial value requirement and determine the stability of the filter.

Description

Technical Field

[0001] The present invention belongs to the technical field of insertion loss test fixtures, and more particularly, relates to a test fixture and a test device. Background Art

[0002] The lead-out terminals of filters currently used in the market are all of standard length. During the production, use, and testing (vibration, impact, overload, moisture resistance, and lifespan, etc.), the lead-out terminals of the filters are processed twice or three times (cutting or welding, etc.), which changes the length of the lead-out terminals of the filters and causes a decrease in their distributed inductance. According to the formula: like Figure 1 As shown in the figure (the capacitance of the test product is 22pF), due to the decrease in inductance L, the increase in resonant frequency f, and the offset of the insertion loss curve, the test results are often significantly different from the initial values. As a result, the insertion loss test results of the filter cannot be compared with the initial value requirements, resulting in the inability to determine the stability of the filter. Summary of the Invention

[0003] The purpose of the embodiments of the present invention is to provide a test fixture and a test device to solve the technical problem in the prior art that it is difficult to accurately measure the insertion loss of a filter, resulting in an inability to determine the stability of the filter.

[0004] To achieve the above-mentioned purpose, the technical solution adopted by the present invention is: to provide a test fixture, including a probe seat, a compensation structure and an electrical connector for connecting to a tester, the probe seat is provided with a receiving groove and a probe socket connected to the receiving groove and used for inserting the probe of the electronic component, the compensation structure is used to compensate for the length of the probe, one end of the compensation structure is electrically connected to the electrical connector, and the end of the compensation structure away from the electrical connector extends into the receiving groove and is used to connect to the probe of the electronic component.

[0005] Furthermore, the probe seat includes a seat body and a cover plate, the seat body and the cover plate enclose the accommodating groove, and the probe socket is provided on the seat body.

[0006] Furthermore, the accommodating groove has an opening, the electrical connector is a circuit board, and the circuit board cover is arranged on the opening of the accommodating groove.

[0007] Furthermore, a circuit for connecting to a tester is provided on the circuit board, and one end of the compensation structure is welded to the circuit board and electrically connected to the circuit.

[0008] Furthermore, the base is provided with a port for inserting a terminal of the tester and electrically connecting it to the circuit.

[0009] Furthermore, the test fixture further comprises a circuit board seat for supporting the circuit board, and the circuit board seat is arranged on a side of the circuit board away from the probe seat.

[0010] Furthermore, the test fixture further comprises a base provided on a side of the circuit board seat away from the circuit board, and a ground foot is provided on the side of the base away from the circuit board seat.

[0011] Furthermore, the compensation structure is a pin.

[0012] Furthermore, the test fixture also includes a bayonet, the probe seat has a through hole corresponding to the bayonet, both ends of the bayonet are respectively arranged in the corresponding through holes, the middle of the bayonet is located in the accommodating groove and is used to limit the compensation structure.

[0013] The present invention also provides a testing device, comprising the testing fixture described above.

[0014] The beneficial effects of the test fixture and test equipment provided by the present invention are as follows: the test fixture of the present invention includes a probe holder, a compensation structure and an electrical connector, the probe holder is provided with a receiving groove and a probe socket connected to the receiving groove and used for inserting the probe of the electronic component, the compensation structure is used to compensate for the length of the probe, one end of the compensation structure is electrically connected to the electrical connector, the end of the compensation structure away from the electrical connector extends into the receiving groove and is used to connect with the probe of the electronic component, and the electrical connector is used to connect to a tester. When the test fixture of the present invention is applied to the insertion loss test of the filter, the probe of the filter is inserted into the receiving groove through the probe socket, and the probe is overlapped on the compensation structure, and then the electrical connector is connected to the tester, so that the tester can perform insertion loss test on the filter through the electrical connector and the compensation structure. Since the compensation structure can compensate for the length of the probe, it can avoid the situation where the insertion loss curve of the filter is offset due to shearing of the pin, so that the insertion loss of the filter can be accurately measured, so that the insertion loss test result of the filter can be compared with the initial value requirement and the stability of the filter can be determined.

[0015] The test equipment of the present invention comprises the above-mentioned test fixture, and can accurately measure the insertion loss of the filter and determine the stability of the filter. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0017] Figure 1 The following is a comparison chart of the insertion loss curves of the existing filter before and after the test;

[0018] Figure 2 A schematic diagram of the three-dimensional structure of a test fixture provided in an embodiment of the present invention;

[0019] Figure 3 A schematic diagram of the exploded structure of a test fixture provided in an embodiment of the present invention;

[0020] Figure 4 A schematic diagram of a top view of a test fixture provided in an embodiment of the present invention;

[0021] Figure 5 For the Figure 4 Schematic diagram of the cross-sectional structure in the AA direction.

[0022] Among them, the reference numerals in the figures are:

[0023] 100-probe seat; 110-seat body; 111-first screw hole; 112-probe socket; 113-port; 114-through hole; 115-fourth screw hole; 120-cover plate; 121-first mounting hole; 130-accommodating groove; 200-compensation structure; 300-electrical connector; 310-circuit; 320-third mounting hole; 400-circuit board seat; 410-second mounting hole; 500-pin; 600-base; 610-foot; 620-fourth mounting hole. DETAILED DESCRIPTION

[0024] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention more clearly understood, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0025] It should be noted that when an element is referred to as being “fixed on” or “disposed on” another element, it may be directly on the other element or indirectly on the other element. When an element is referred to as being “connected to” another element, it may be directly connected to the other element or indirectly connected to the other element.

[0026] It should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operate in a specific orientation, and therefore cannot be understood as limiting the present invention.

[0027] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of the technical features being referred to. Thus, a feature identified as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0028] See also Figure 2 and Figure 3 The embodiment of the present invention provides a test fixture, including a probe seat 100, combined with Figure 4 and Figure 5 The probe seat 100 is provided with a receiving groove 130 and a probe socket 112 that are interconnected. The probe socket 112 is used for inserting the probe of the electronic component (which can be but is not limited to a filter). Through the above arrangement, the probe of the electronic component can extend into the receiving groove 130 through the probe socket 112, thereby fixing the electronic component on the probe seat 100.

[0029] Specifically, if Figure 2 、 Figure 3 and Figure 5 As shown, the test fixture also includes a compensation structure 200 and an electrical connector 300. One end of the compensation structure 200 is electrically connected to the electrical connector 300. The end of the compensation structure 200 away from the electrical connector 300 extends into the receiving groove 130 and is used to connect to the probe of the electronic component. The electrical connector 300 is used to connect to the tester. In the embodiment of the present invention, the compensation structure 200 is used to compensate for the length of the probe. When the probe of the electronic component is inserted into the receiving groove 130 from the probe socket 112 of the probe holder 100, the probe can overlap on the end of the compensation structure 200 away from the electrical connector 300, thereby conducting the probe and the compensation structure 200, so that the compensation structure 200 can be used as an external extension of the probe. That is, the compensation structure 200 can compensate for the part of the electronic component probe that is sheared off during production, use and testing (vibration, impact, overload, moisture resistance and life, etc.), so that the external dimensions of the electronic component probe are restored to the state before operation, achieving a compensation effect.

[0030] The beneficial effect of the test fixture of the embodiment of the present invention is that: when the test fixture of the present invention is applied to the insertion loss test of the filter, the probe of the filter is inserted into the receiving groove 130 through the probe socket 112, and the probe is overlapped on the compensation structure 200, and then the electrical connector 300 is connected to the tester, so that the tester can perform an insertion loss test on the filter through the electrical connector 300 and the compensation structure 200. Since the compensation structure 200 can compensate for the length of the probe, it can avoid the situation where the insertion loss curve of the filter is biased due to shearing the pin, so that the insertion loss of the filter can be accurately measured, so that the insertion loss test result of the filter can be compared with the initial value requirement and the stability of the filter can be determined.

[0031] It should be noted that the test fixture of the embodiment of the present invention is mainly used to assist in measuring the insertion loss of the three-terminal filter. Therefore, the number of compensation structures 200 of the test fixture and the number of pins of the three-terminal filter are both three. The number of compensation structures 200 can be appropriately adjusted according to the actual situation and specific needs, as long as the number of compensation structures 200 is compatible with the number of pins of the filter. No sole limitation is made here.

[0032] Specifically, if Figure 3 and Figure 5 As shown, as a specific embodiment of the present invention, the probe seat 100 includes a seat body 110 and a cover plate 120, the seat body 110 and the cover plate 120 enclose a receiving groove 130, and the probe socket 112 is provided on the seat body 110. Under this structure, the probe seat 100 of the embodiment of the present invention is simple in structure and easy to assemble, which can effectively improve the production efficiency of the test fixture. It is understandable that, according to the actual choice and specific needs, the structure of the probe seat 100 can also be assembled from other structures, and this is not the only limitation.

[0033] Optionally, the probe base 100 further includes a plurality of first locking members (not shown), which may be, but are not limited to, screws. The base body 110 is provided with first screw holes 111 corresponding to the plurality of first locking members, and the cover plate 120 is provided with first mounting holes 121 corresponding to the plurality of first locking members. One end of each first locking member passes through the corresponding first mounting hole 121 in sequence and is threadedly connected to the first screw hole 111, thereby fixing the cover plate 120 to the base body 110. It is understandable that, according to the actual choice and specific needs, the cover plate 120 can be fixed to the base body 110 in other ways, which is not the only limitation here.

[0034] Specifically, if Figure 3 and Figure 5As shown, as a specific embodiment of the present invention, the electrical connector 300 can be, but is not limited to, a circuit board. The receiving slot 130 has an opening, and the probe socket 112 and the opening are located at the top and bottom of the receiving slot 130, respectively. The circuit board is placed over the opening of the receiving slot 130 from bottom to top, thereby forming a sealed cavity for the receiving slot 130. In this structure, the compensation structure 200 is located within the sealed cavity, effectively protecting the compensation structure 200 and preventing it from being squeezed or collided and broken.

[0035] Specifically, if Figure 3 and Figure 5 As shown, as a specific embodiment of the present invention, a circuit board is provided with a circuit 310 for connecting to a tester, and one end of the compensation structure 200 is welded to the circuit board and electrically connected to the circuit 310, thereby making the structure of the test fixture compact and improving the reliability of the test fixture.

[0036] It should be noted that to avoid affecting the test results, the internal resistance of the circuit board must be consistent with the internal resistance of the tester's output line. Generally speaking, the internal resistance of the tester's output line is 50 ohms, 75 ohms, or 100 ohms. Therefore, the internal resistance of the circuit board should be designed to be 50 ohms, 75 ohms, or 100 ohms. It is understood that the internal resistance of the circuit board can also be other resistance values ​​based on actual selection and specific needs, as long as the internal resistance of the circuit board is consistent with the internal resistance of the tester's output line. This is not a strict limitation here.

[0037] Specifically, if Figure 3 and Figure 5 As shown, as a specific embodiment of the present invention, the output line of the tester is usually provided with a terminal, and the base body 110 is provided with a port 113 for inserting the terminal of the tester and electrically connecting to the circuit 310 on the circuit board, which can realize the rapid plugging of the test fixture and greatly improve the convenience of using the test fixture.

[0038] Alternatively, external threads may be provided on the terminals of the tester, and correspondingly, internal threads may be provided on the port 113 of the base body 110, so that the external threads of the terminals match the internal threads of the port 113. Under this structure, the terminals of the tester can be quickly plugged into the port 113 of the base body 110. Of course, depending on the actual situation and specific needs, the terminals of the tester can be quickly plugged into the port 113 of the base body 110 by means of other methods, which is not limited here.

[0039] Specifically, if Figure 2 and Figure 3As shown, as a specific embodiment of the present invention, the test fixture also includes a circuit board seat 400 for supporting the circuit board. The circuit board seat 400 is arranged on the side of the circuit board away from the probe seat 100. Under this structure, the circuit board is clamped between the circuit board seat 400 and the probe seat 100, which can protect the circuit board and prevent the circuit board from being mechanically damaged (bumped, scratched, etc.).

[0040] Optionally, the test fixture further includes a plurality of second locking members (not shown), which may be, but are not limited to, screws. Second mounting holes 410 are provided on the circuit board base 400 corresponding to the plurality of second locking members, and third mounting holes 320 are provided on the circuit board corresponding to the plurality of second locking members. Second screw holes (not shown) are provided on the base body 110 corresponding to the plurality of second locking members. Each second locking member passes through the second mounting hole 410 and the third mounting hole 320 in sequence and is then threadedly connected to the second screw hole, thereby fixing the circuit board base 400, the circuit board, and the probe base 100 together. Of course, according to the actual choice and specific needs, the circuit board base 400, the circuit board, and the probe base 100 are fixed together by means of a belt, which is not the only limitation here.

[0041] Specifically, if Figure 2 and Figure 3 As shown, as a specific embodiment of the present invention, the test fixture also includes a base 600 arranged on the side of the circuit board holder 400 away from the circuit board, and a plurality of pins 610 are provided on the side of the base 600 away from the circuit board holder 400, so that the test fixture can be stably placed on a desktop (or other supporting surface).

[0042] Optionally, the test fixture further includes a plurality of third locking members (not shown), which may be, but are not limited to, screws. Fourth mounting holes 620 are provided on the base 600 corresponding to the plurality of third locking members, and third screw holes (not shown) are provided on the circuit board holder 400 corresponding to the plurality of third locking members. Each third locking member passes through the fourth mounting hole 620 and is then threadedly connected to the third screw hole, thereby securing the base 600 and the circuit board holder 400 together. Of course, depending on the actual situation and specific needs, the base 600 and the circuit board holder 400 may be fixedly connected together by means of a belt, which is not the only limitation herein.

[0043] Specifically, as a specific embodiment of the present invention, compensation structure 200 is a pin, which can be made of the same material as the filter pins, thereby improving the product's conductivity and reducing contact error. In this embodiment, to further improve the product's conductivity and reduce contact error, the circuit board's traces 310 and compensation structure 200 can be gold-plated.

[0044] Specifically, as a specific embodiment of the present invention, Figure 2 、 Figure 3 and Figure 5 As shown, the test fixture also includes a latch 500. A through hole 114 is formed on the base 110 of the probe holder 100, corresponding to the latch 500. The two ends of the latch 500 are respectively disposed within the corresponding through holes 114. The middle portion of the latch 500 is located within the receiving slot 130 and is used to limit the position of the compensation structure 200. In this structure, the compensation structure 200 is clamped between the latch 500 and the sidewalls of the receiving slot 130. The latch 500 prevents the compensation structure 200 from shaking, allowing the filter pins to be inserted into the receiving slot 130 and overlap the compensation structure 200, thereby improving the ease of use of the test fixture.

[0045] Optionally, the test fixture further includes a plurality of fourth locking members (not shown), and fourth screw holes 115 are provided on the base body 110 corresponding to the fourth locking members. One end of each fourth locking member is threadedly connected to the fourth screw hole 115 and abuts against the bayonet 500, thereby fixing the bayonet 500 to the base body 110. Of course, depending on the actual situation and specific needs, the bayonet 500 and the base body 110 can be fixed together by means of a belt, which is not limited here.

[0046] An embodiment of the present invention further provides a test device, comprising the test fixture and a tester as described above, wherein the tester may be, but is not limited to, a spectrum analyzer. The test device of the present invention can accurately measure the insertion loss of the filter and determine the stability of the filter.

[0047] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A test fixture, characterized in that: The device is used for inserting loss testing of filters and comprises a probe holder, a compensation structure, and an electrical connector for connecting to a tester. The probe holder is provided with a receiving slot and a probe socket connected to the receiving slot and for inserting a probe of an electronic component. The compensation structure is used to compensate for the length of the probe. One end of the compensation structure is electrically connected to the electrical connector, and the end of the compensation structure away from the electrical connector extends into the receiving slot and is used to connect to the probe of the electronic component. The probe seat includes a seat body and a cover plate, wherein the seat body and the cover plate enclose the accommodating groove, and the probe socket is provided on the seat body; The receiving groove has an opening, the electrical connector is a circuit board, and the circuit board cover is disposed on the opening of the receiving groove, so that the receiving groove forms a sealed cavity; The circuit board is provided with a circuit for connecting to a tester, the compensation structure is located in the sealed cavity, one end of the compensation structure is welded to the circuit board and electrically connected to the circuit, the compensation structure and the pins of the filter are made of the same material, and the internal resistance of the circuit board is consistent with the internal resistance of the output line of the tester; The test fixture also includes a bayonet, the probe seat has a through hole corresponding to the bayonet, both ends of the bayonet are respectively arranged in the corresponding through holes, the middle of the bayonet is located in the accommodating groove and is used to limit the compensation structure.

2. The test fixture according to claim 1, wherein: The seat is provided with a port for inserting a terminal of the tester and electrically connecting the terminal to the circuit.

3. The test fixture according to claim 1, wherein: The test fixture further includes a circuit board seat for supporting the circuit board. The circuit board seat is arranged on a side of the circuit board away from the probe seat.

4. The test fixture according to claim 3, wherein: The test fixture further comprises a base provided on a side of the circuit board seat away from the circuit board, and a ground foot is provided on the side of the base away from the circuit board seat.

5. The test fixture according to any one of claims 1 to 4, wherein: The compensation structure is a pin.

6. A testing device, characterized in that: The test fixture comprises the test fixture according to any one of claims 1 to 5.

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