A chip capacitor testing device

Abstract

The present invention belongs to the field of chip capacitor testing, and specifically relates to a chip capacitor testing device, comprising a loading device for loading chip capacitors, an electrical performance testing device for testing the electrical performance of chip capacitors, a tray for storing electrically defective products, an appearance testing device for testing the appearance of chip capacitors, a unloading device for storing qualified chip capacitors that have passed the inspection, a tray for storing appearance-defective products, and a turntable conveyor device for adsorbing and grasping chip capacitors and rotating to change the working position of the chip capacitors; wherein the loading device, the electrical performance testing device, the tray for electrically defective products, the appearance testing device, the unloading device for qualified products, and the tray for appearance-defective products are arranged in a circle on the outside of the turntable conveyor.

Description

Technical Field

[0001] The invention belongs to the field of chip capacitor testing, and in particular relates to a chip capacitor testing device. Background Art

[0002] After production, chip capacitors require electrical performance and appearance testing. Existing chip capacitor testing is mostly done manually. Disadvantages of manual testing include: 1. Low efficiency; 2. High labor costs; 3. Long production cycles; 4. High turnover costs; 5. High energy consumption; and 6. Inconsistency in manual inspection standards.

[0003] Therefore, the existing technology still needs to be improved and developed. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to provide a chip capacitor detection device in response to the above-mentioned defects of the prior art, so as to solve the problems caused by the existing manual detection of chip capacitors, such as low work efficiency, high cost, long production cycle, high turnover cost, high energy consumption, and low consistency of inspection standards.

[0005] The technical solution adopted by the present invention to solve its technical problems is: to provide a chip capacitor detection equipment, including a loading device for loading chip capacitors, an electrical performance detection device for detecting the electrical performance of chip capacitors, a tray for storing electrically defective products, an appearance detection device for testing the appearance of chip capacitors, a qualified product unloading device for storing and transmitting qualified chip capacitors, a defective appearance tray for storing defective appearance products, and a turntable conveyor device for adsorbing and grasping chip capacitors and rotating and changing the working position of the chip capacitors; wherein the loading device, the electrical performance detection device, the tray for electrically defective products, the appearance detection device, the qualified product unloading device, and the tray for defective appearance are arranged in a circle in sequence on the outside of the turntable conveyor.

[0006] A further preferred embodiment of the present invention is that the turntable conveying device includes: a first turntable, a first turntable driving mechanism for driving the first turntable to rotate, a first conductive suction nozzle for adsorbing and grabbing chip capacitors, a first position adjustment mechanism for adjusting the position of the first conductive suction nozzle, a suction nozzle cylinder mechanism for pushing the first conductive suction nozzle to move downward, and an elastic lifting mechanism for providing an elastic lifting force for the first conductive suction nozzle; wherein, the first position adjustment mechanism is arranged on the first turntable, the suction nozzle is arranged to slide up and down on the first position adjustment mechanism, the elastic lifting mechanism is arranged between the first conductive suction nozzle and the first position adjustment mechanism, and the suction nozzle cylinder mechanism is arranged above the first turntable.

[0007] A further preferred embodiment of the present invention is that the first position adjustment mechanism includes a first nozzle mounting block, a first nozzle adjustment block, a first adjusting screw assembly, and a second adjusting screw assembly; the first nozzle adjustment block is slidably arranged on the first turntable along a first direction, the first nozzle mounting block is slidably arranged on the first nozzle adjustment block along a second direction, the first adjusting screw assembly drives the first nozzle adjustment block to slide along the first direction, and the second adjusting screw assembly drives the first nozzle mounting block to move along the second direction, the first conductive nozzle is mounted on the first nozzle mounting block, and the first direction and the second direction are perpendicular to each other;

[0008] The elastic rising mechanism includes a nozzle mounting rod that is slidably passed through the first nozzle mounting block, a first compression spring that is sleeved on the nozzle mounting rod, a guide rod that is slidably passed through the first nozzle mounting block and is parallel to the nozzle mounting rod, a connecting block that is fixedly connected to the guide rod and the nozzle mounting rod at both ends, and a second compression spring that is sleeved on the guide rod; the first conductive nozzle is fixed to one end of the nozzle mounting rod, and the two ends of the first compression spring are respectively connected to the other end of the nozzle mounting rod and the first nozzle mounting block; the two ends of the second compression spring are respectively connected to the first nozzle mounting block and the connecting block.

[0009] A further preferred embodiment of the present invention is that the loading device includes: a first material box tray for placing material boxes, a first XY movable platform for adjusting the position of the first material box tray, and a first CCD camera assembly positioned by the first material box tray, and the first material box tray is provided with a plurality of material box slots adapted to the shape of the material box.

[0010] A further preferred embodiment of the present invention is that the electrical performance detection device includes a test frame, a first electrode test platform arranged on the test frame, a retractable second electrode ejector arranged above the first electrode test platform, and a tester for electrical performance testing of chip capacitors, the first electrode test platform and the second electrode ejector are connected to the tester, and the second electrode ejector is slidably penetrated on the test frame; wherein, the first conductive suction nozzle absorbs and grasps the chip capacitor and is connected to one electrode plate thereof and moves downward, sequentially completing the contact between the side of the first conductive suction nozzle and the second electrode ejector, and the contact between the lower end of the chip capacitor as the other electrode plate and the first electrode test frame to form a test loop.

[0011] A further preferred embodiment of the present invention is that the appearance testing mechanism includes a first upper end face detection component, a second upper end face detection component, and a second turntable, which are sequentially arranged on one side of the first turntable, a second conductive suction nozzle arranged on the second turntable, and a first lower end face detection component and a second lower end face detection component arranged on one side of the second turntable; the first conductive suction nozzle on the first turntable absorbs and grabs the chip capacitor, and after passing through the first upper end face detection component or the second upper end face detection component, the second conductive suction nozzle on the second turntable absorbs and grabs the chip capacitor on the first conductive suction nozzle and transfers it to the first lower end face detection component and the second lower end face detection component.

[0012] A further preferred embodiment of the present invention is that the qualified product unloading device includes: a lifting box mechanism for placing and adjusting the height of the box, a second XY movable platform for adjusting the position of the box, a conveyor belt mechanism for unloading the box, and a clamping mechanism for grabbing the box; the first turntable and the conveyor belt mechanism are respectively arranged at both ends of the second XY movable platform, the lifting box mechanism is arranged between the conveyor belt mechanism and the second XY movable platform, and the clamping mechanism can be moved to the top of the conveyor belt mechanism, the second XY movable platform, and the lifting box mechanism to take and place the box.

[0013] A further preferred embodiment of the present invention is that the second XY movable platform includes: a second material box tray for placing material boxes, a first material box clamp arranged on the second material box tray for fixing the material boxes, a first translation electric cylinder for driving the second material box tray to translate back and forth between the first conductive suction nozzle and the conveyor belt mechanism, and a second translation electric cylinder arranged between the second material box tray and the first translation electric cylinder for adjusting the position of the second material box tray; the movement direction of the first translation electric cylinder is perpendicular to the movement direction of the second translation electric cylinder.

[0014] A further preferred embodiment of the present invention is that the chip capacitor testing equipment also includes an electrical performance good product unloading device arranged between the electrical performance testing device and the electrical performance defective product tray, and the electrical performance good product unloading device includes an electrical performance good product tray for loading chip capacitors, and a third XY movable platform for driving the electrical performance good product tray to adjust its position.

[0015] A further preferred embodiment of the present invention is that the suction nozzle cylinder mechanism includes a cylinder mounting plate, a mounting bracket for supporting the cylinder mounting plate arranged on one side of the first turntable, at least five suction nozzle driving cylinders arranged on the cylinder mounting plate, and a rotation auxiliary part fixed on the cylinder mounting plate, the first turntable is rotatably connected to the rotation auxiliary part, and the five suction nozzle driving cylinders are respectively arranged at positions corresponding to the loading device, the electrical performance good product unloading device, the electrical performance detection device, the qualified product unloading device, and the second turntable.

[0016] The beneficial effect of the present invention is that, through the loading device, electrical performance detection device, electrical performance defective product tray, appearance detection device, qualified product unloading device, and appearance defective product tray, the loading, electrical performance testing, electrical performance defective product unloading, appearance detection, qualified product unloading, and appearance defective product unloading of chip capacitors can be completed respectively, and then the turntable conveying device can be used to realize the transmission of chip capacitors between various devices. The entire inspection and selection process is completed mechanically, which effectively improves the inspection efficiency, reduces the inspection cost, shortens the production cycle, reduces the high turnover cost, reduces energy consumption, and ensures the consistency of inspection standards. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The present invention will be further described below with reference to the accompanying drawings and embodiments, in which:

[0018] Figure 1 It is a structural schematic diagram of the chip capacitor detection device of the present invention;

[0019] Figure 2 It is a schematic structural diagram of the chip capacitor detection equipment (rotary disk conveyor) of the present invention;

[0020] Figure 3 It is a schematic structural diagram of the turntable conveyor of the present invention;

[0021] Figure 4 Schematic diagram of the structure of the turntable conveyor of the present invention (omitting the nozzle cylinder mechanism);

[0022] Figure 5 yes Figure 4 A partial enlarged view of part A in the middle;

[0023] Figure 6 It is a structural schematic diagram of the first position adjustment mechanism and the elastic lifting mechanism of the present invention;

[0024] Figure 7 It is a structural schematic diagram of the feeding device of the present invention;

[0025] Figure 8 It is a schematic diagram of the planar structure of the electrical performance detection device of the present invention;

[0026] Figure 9 yes Figure 8 A partial enlarged view of part B in the middle;

[0027] Figure 10 It is a structural schematic diagram of the appearance inspection device of the present invention;

[0028] Figure 11 It is a structural schematic diagram of the qualified product unloading device of the present invention;

[0029] Figure 12is a schematic structural diagram of the second XY moving platform of the present invention;

[0030] Figure 13 It is a structural schematic diagram of the lifting box mechanism of the present invention;

[0031] Figure 14 It is a structural schematic diagram of the conveyor belt mechanism of the present invention;

[0032] Figure 15 It is a structural schematic diagram of the electrical performance good product blanking device of the present invention. DETAILED DESCRIPTION

[0033] The present invention provides a chip capacitor testing device. To make the objectives, technical solutions, and effects of the present invention more clear and explicit, the present invention is further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are merely illustrative of the present invention and are not intended to limit the present invention.

[0034] like Figure 1-14 As shown, the chip capacitor detection equipment of this embodiment includes a loading device 1 for loading chip capacitors 91, an electrical performance detection device 2 for detecting the electrical performance of the chip capacitors 91, an electrical performance defective product tray 3 for accommodating electrical performance defective products, an appearance detection device 4 for testing the appearance of the chip capacitors 91, a qualified product unloading device 5 for accommodating and transmitting chip capacitors 91 that have passed the inspection, a defective appearance tray 6 for accommodating appearance defective products, and a turntable conveyor 7 for adsorbing and grasping the chip capacitors 91 and rotating and changing the working position of the chip capacitors 91; wherein, the loading device 1, the electrical performance detection device 2, the electrical performance defective product tray 3, the appearance detection device 4, the qualified product unloading device 5, and the defective appearance tray 6 are arranged in a circle on the outside of the turntable conveyor 7.

[0035] Through the loading device 1, the electrical performance testing device 2, the tray for defective electrical performance products 3, the appearance testing device 4, the unloading device 5 for qualified products, and the tray for defective appearance 6, the loading, electrical performance testing, unloading of defective electrical performance products, appearance testing, unloading of qualified products, and unloading of defective appearance products of the chip capacitor 91 can be completed respectively. The turntable conveying device can then realize the transmission of the chip capacitor 91 between various devices. The entire inspection and selection process is completed mechanically, which effectively improves the inspection efficiency, reduces the inspection cost, shortens the production cycle, reduces the high turnover cost, reduces energy consumption, and ensures the consistency of the inspection standards.

[0036] Further, such as Figure 1 、 Figure 3 、 Figure 4 、 Figure 5 、 Figure 6As shown, the turntable conveyor 7 includes: a first turntable 71, a first turntable driving mechanism 72 for driving the first turntable to rotate, a first conductive suction nozzle 73 for adsorbing and grabbing the chip capacitor 91, a first position adjustment mechanism 74 for adjusting the position of the first conductive suction nozzle 73, a suction nozzle cylinder mechanism 75 for pushing the first conductive suction nozzle 73 to move downward, and an elastic lifting mechanism 76 for providing an elastic lifting force for the first conductive suction nozzle 73; wherein, the first position adjustment mechanism 74 is arranged on the first turntable 71, the suction nozzle is arranged to slide up and down on the first position adjustment mechanism 74, the elastic lifting mechanism 76 is arranged between the first conductive suction nozzle 73 and the first position adjustment mechanism 74, and the suction nozzle cylinder mechanism 75 is arranged above the first turntable 71.

[0037] The first turntable driving mechanism 72 includes a motor and a divider.

[0038] The first position adjustment mechanism 74 can be used to adjust the position of the first conductive suction nozzle 73, effectively reducing the assembly precision requirements between the first conductive suction nozzle 73 and the first turntable 71, thereby reducing production costs. The nozzle cylinder mechanism 75 cooperates with the elastic lifting mechanism 76 to drive the first conductive suction nozzle 73 up and down, achieving mechanized grasping of the chip capacitor 91, which is convenient and fast.

[0039] Further, such as Figure 1 、 Figure 3 、 Figure 4 、 Figure 5 、 Figure 6 As shown, the first position adjustment mechanism 74 includes a first nozzle mounting block 741, a first nozzle adjustment block 742, a first adjusting screw assembly 743, and a second adjusting screw assembly 744; the first nozzle adjustment block 742 is slidably arranged on the first turntable 71 along the first direction, and the first nozzle mounting block 741 is slidably arranged on the first nozzle adjustment block 742 along the second direction, the first adjusting screw assembly 743 drives the first nozzle adjustment block 742 to slide along the first direction, and the second adjusting screw assembly 744 drives the first nozzle mounting block 741 to move along the second direction, and the first conductive nozzle 73 is mounted on the first nozzle mounting block 741, and the first direction and the second direction are perpendicular to each other;

[0040] Among them, the first adjusting screw assembly 743 is rotatably set on the first turntable 71, and one end is threadedly connected to the first suction nozzle adjustment block 742. The position of the first suction nozzle adjustment block 742 can be adjusted by rotating the first adjusting screw assembly 743; the second adjusting screw assembly 744 is rotatably set on the first suction nozzle adjustment block 742, and one end is threadedly connected to the first suction nozzle mounting block 741. The position of the first suction nozzle mounting block 741 can be adjusted by rotating the second adjusting screw assembly 744.

[0041] By adjusting the positions of the first nozzle mounting block 741 and the first nozzle adjustment block 742 respectively through the first adjusting screw assembly 743 and the second adjusting screw assembly 744, the position of the first conductive nozzle 73 installed on the first nozzle mounting block 741 can be adjusted quickly and conveniently.

[0042] A groove and a protrusion are provided between the first nozzle adjustment block 742 and the first turntable 71 to guide the first nozzle adjustment block 742 to slide in a first direction, and a groove and a protrusion are provided between the first nozzle adjustment block 742 and the first nozzle mounting block 741 to guide the first nozzle mounting block 741 to slide in a second direction. After the position of the first conductive nozzle 73 is adjusted, the first position adjustment mechanism 74 is fixed with bolts.

[0043] Further, such as Figure 1 、 Figure 3 、 Figure 4 、 Figure 5 、 Figure 6 As shown, the elastic rising mechanism 76 includes a nozzle mounting rod 761 that is slidably inserted into the first nozzle mounting block 741, a first compression spring 762 that is sleeved on the nozzle mounting rod 761, a guide rod 763 that is slidably inserted into the first nozzle mounting block 741 and is parallel to the nozzle mounting rod 761, a connecting block 764 that is fixedly connected between the guide rod 763 and the nozzle mounting rod 761 at both ends, and a second compression spring 765 that is sleeved on the guide rod 763; the first conductive nozzle 73 is fixed at one end of the nozzle mounting rod 761, and the two ends of the first compression spring 762 are respectively connected to the other end of the nozzle mounting rod 761 and the first nozzle mounting block 741; the two ends of the second compression spring 765 are respectively connected to the first nozzle mounting block 741 and the connecting block 764.

[0044] The addition of a first compression spring 762 provides an elastic upward force for the first conductive nozzle 73, resulting in a simple structure and effectively reducing production costs. Furthermore, the addition of a guide rod 763 and a connecting block 764 guides the movement direction of the nozzle mounting rod 761, ensuring the stability of the first conductive nozzle 73.

[0045] Further, such as Figure 1 、 Figure 3As shown, the suction nozzle cylinder mechanism 75 includes a cylinder mounting plate 751, a mounting bracket 752 arranged on one side of the first turntable 71 for supporting the cylinder mounting plate 751, at least five suction nozzle driving cylinders 753 arranged on the cylinder mounting plate 751, and a rotation auxiliary part 754 fixed on the cylinder mounting plate 751. The first turntable 71 is rotatably connected to the rotation auxiliary part 754, and the five suction nozzle driving cylinders 753 are respectively arranged at positions corresponding to the loading device 1, the electrical performance good product unloading device 8, the electrical performance detection device 2, the qualified product unloading device 5, and the second turntable 43.

[0046] The nozzle drive cylinder 753 can push the nozzle mounting rod 761 downward, that is, push the first conductive nozzle 73 downward, and cooperate with the elastic lifting mechanism 76 to achieve the height adjustment of the first conductive nozzle 73. In this embodiment, there are 16 first conductive nozzles 73 and 5 nozzle drive cylinders 753. The height adjustment can be achieved by installing nozzle mounting rods 761 at positions where height adjustment is required, such as the loading device 1, the electrical performance good product unloading device 8, the electrical performance detection device 2, the qualified product unloading device 5, and the second turntable 43. There is no need to correspond the number of nozzle mounting rods 761 to the number of first conductive nozzles 73, which can effectively reduce production costs. By adding a rotation auxiliary component 754, it can be used to assist the rotation of the first turntable 71 and improve the stability of the first turntable 71 during rotation.

[0047] Further, such as Figure 1 、 Figure 7 As shown, the loading device 1 includes: a first material box tray 11 for placing the material box 92, a first XY movable platform 12 for adjusting the position of the first material box tray 11, and a first CCD camera assembly 13 positioned by the first material box tray 11, and the first material box tray 11 is provided with a plurality of material box slots (not shown in the figure) adapted to the shape of the material box 92.

[0048] In this embodiment, six magazine slots are provided. The first XY movable platform 12 drives the first magazine tray 11 to move within a plane, thereby transferring the magazine 92 to the bottom of the first conductive suction nozzle 73. The first conductive suction nozzle 73 then grabs the chip capacitor 91 in the magazine 92 to achieve loading. The first CCD camera assembly 13 can be used to detect the position of the magazine 92 to ensure the normal loading of the chip capacitor 91.

[0049] Further, such as Figure 1 、 Figure 2 、 Figure 8 、 Figure 9As shown, the electrical performance detection device 2 includes a test frame 21, a first electrode test platform 22 arranged on the test frame 21, a retractable second electrode ejector pin 23 arranged above the first electrode test platform 22, and a tester 24 for electrical performance testing of the chip capacitor 91. The first electrode test platform 22 and the second electrode ejector pin 23 are connected to the tester 24, and the second electrode ejector pin 23 is slidably penetrated on the test frame 21; wherein, the first conductive suction nozzle 73 absorbs and grasps the chip capacitor 91 and connects to one electrode plate thereof and moves downward, and sequentially completes the contact between the side of the first conductive suction nozzle 73 and the second electrode ejector pin 23, and the lower end of the chip capacitor 91 as another electrode plate contacts the first electrode test frame 22, thereby forming a test loop.

[0050] The chip capacitor 91 is grabbed and fixed by the first conductive suction nozzle 73 and connected to one of the electrode plates of the chip capacitor 91, wherein the second electrode ejector pin 23 is retractably arranged above the first electrode test bench 22. When the first conductive suction nozzle 73 moves downward, the second electrode ejector pin 23 that touches the first conductive suction nozzle 73 will shrink and abut against the side of the first conductive suction nozzle 73 until the lower end of the other electrode plate of the chip capacitor 91 on the first conductive suction nozzle 73 contacts the first electrode test bench 22 to form a test loop, and then the electrical performance test can be carried out in conjunction with the tester 24, which is convenient and fast, effectively shortens the test time, and improves the test efficiency.

[0051] Further, such as Figure 1 、 Figure 2 、 Figure 10 As shown, the appearance testing mechanism 4 includes a first upper end surface detection component 41, a second upper end surface detection component 42, and a second turntable 43, which are sequentially arranged on one side of the first turntable 71, a second conductive suction nozzle 44 is arranged on the second turntable 43, and a first lower end surface detection component 45 and a second lower end surface detection component 46 are arranged on one side of the second turntable 43; the first conductive suction nozzle 73 on the first turntable 71 sucks and grabs the chip capacitor 91, and after passing through the first upper end surface detection component 41 or the second upper end surface detection component 42, the second conductive suction nozzle 44 on the second turntable 43 sucks and grabs the chip capacitor 91 on the first conductive suction nozzle 73 and transfers it to the first lower end surface detection component 45 or the second lower end surface detection component 46.

[0052] Among them, the first upper end face detection component 41, the second upper end face detection component 42, the first lower end face detection component 45, and the second lower end face detection component 46 are all CCD camera components, and the detection focal lengths of the two are different; among them, the first upper end face detection component 41 and the first lower end face detection component 45 are used to cooperate in detecting chip capacitors 91 of one size; the second upper end face detection component 42 and the second lower end face detection component 46 are used to cooperate in detecting chip capacitors 91 of another size.

[0053] The grabbing direction of the second conductive nozzle 44 is opposite to that of the first conductive nozzle 73 . By cooperating with the second conductive nozzle 44 and the first conductive nozzle 73 , the detection of both end faces of the chip capacitor 91 can be realized quickly and conveniently.

[0054] The first turntable 71 drives the chip capacitor 91 through the first conductive suction nozzle 73 to pass over the first upper end surface detection assembly 41 or the second upper end surface detection assembly 42. After the upper end surface of the chip capacitor 91 is inspected, the second conductive suction nozzle 44 on the second turntable 43 sucks and grabs the chip capacitor 91 on the first conductive suction nozzle 73 (the lower end surface of the chip capacitor 91 is now exposed). The chip capacitor 91 then passes through the first lower end surface detection assembly 45 or the second lower end surface detection assembly 46 to complete the inspection of both end surfaces of the chip capacitor 91.

[0055] Further, such as Figure 1 、 Figure 2 、 Figure 11 As shown, the qualified product unloading device 5 includes: a lifting box mechanism 51 for placing and lifting and adjusting the position of the material box 92, a second XY movable platform 52 for adjusting the position of the material box 92, a conveyor belt mechanism 53 for unloading the material box 92, and a clamping mechanism 54 for grabbing the material box 92; the first turntable 71 and the conveyor belt mechanism 53 are respectively arranged at both ends of the second XY movable platform 52, the lifting box mechanism 51 is arranged between the conveyor belt mechanism 53 and the second XY movable platform 52, and the clamping mechanism 54 can be moved to the conveyor belt mechanism 53, the second XY movable platform 52, and the lifting box mechanism 51 above the material box 92 to take and place the material box.

[0056] The lifting mechanism 51 can be used to provide a material box 92. The gripper mechanism 54 can then grab an empty material box 92 and place it on the second XY movable platform 52. The second XY movable platform 52 then transfers the empty material box 92 to the bottom of the first conductive suction nozzle 73, where it is loaded. The loaded material box 92 is then driven by the second XY movable platform 52 to one end of the conveyor mechanism 53. The gripper mechanism 54 grabs the material box 92 and transfers it to the conveyor mechanism 53 for unloading. This qualified product unloading device 5 can unload chip capacitors 91 without manual intervention, resulting in short unloading times and high production efficiency.

[0057] Among them, such as Figure 1 、 Figure 2 、 Figure 11 、 Figure 13As shown, the magazine lifting mechanism 51 comprises a magazine rack 511 for placing magazines 92, a lifting frame 512 disposed within the magazine rack 511 for driving the magazines 92 up and down, and an electric lifting cylinder 513 for driving the lifting frame 512 up and down. The addition of the magazine rack 511 allows for empty magazines 92 to be placed, providing a protective carrier for unloading chip capacitors 91. The lifting frame 512 and electric lifting cylinder 513 can be used to adjust the height of the magazine 92, facilitating gripping by the gripper mechanism 54 and improving work efficiency. In this embodiment, a sensor 514 is located above the magazine rack 511 to sense the height of the magazine 92. This sensor, in conjunction with the electric lifting cylinder 513, automatically adjusts the height of the magazine 92.

[0058] Among them, such as Figure 1 、 Figure 2 、 Figure 11 、 Figure 14 As shown, the gripper mechanism 54 includes a second magazine gripper 541 for gripping the magazine 92, a third translation cylinder 542 for driving the second magazine gripper 541 to translate, and a second lift cylinder 543 for driving the second magazine gripper 541 to move up and down. The second lift cylinder 543 and the second magazine gripper 541 work together to grip or lower the magazine 92. The third translation cylinder 542 then drives the magazine 92 back and forth between the conveyor mechanism 53, the second XY movable platform 52, and the magazine lift mechanism 51, thereby transferring the magazine 92.

[0059] Among them, such as Figure 1 、 Figure 2 、 Figure 11 、 Figure 12 As shown, the second XY movable platform 52 includes: a second material box tray 521 for placing the material box 92, a first material box clamp 522 arranged on the second material box tray 521 for fixing the material box 92, a first translation electric cylinder 523 for driving the second material box tray 521 to translate back and forth between the first conductive suction nozzle 73 and the conveyor belt mechanism 53, and a second translation electric cylinder 524 arranged between the second material box tray 521 and the first translation electric cylinder 523 for adjusting the position of the second material box tray 521; the movement direction of the first translation electric cylinder 523 and the movement direction of the second translation electric cylinder 524 are perpendicular to each other.

[0060] The first and second translation cylinders 523 and 524 are used to move the second magazine tray 521, adjusting the position of the magazine 92 to facilitate unloading of the chip capacitor 91 by the first conductive suction nozzle 73. The magazine 92 can also be moved back and forth between the suction nozzle 1 and the conveyor mechanism 5. Furthermore, the addition of the first magazine clamp 522 can be used to secure the magazine 92 on the second magazine tray 521, preventing it from loosening and falling during movement.

[0061] Further, such as Figure 1 、 Figure 2 、 Figure 15 As shown, the chip capacitor 91 detection equipment also includes an electrical performance good product unloading device 8 arranged between the electrical performance detection device 2 and the electrical performance defective product tray 3, and the electrical performance good product unloading device 8 includes an electrical performance good product tray 81 for loading the chip capacitor 91, and a third XY movable platform 82 for driving the electrical performance good product tray to adjust the position.

[0062] The third XY movable platform 82 drives the electrical performance qualified product tray 81 to adjust its position below the first conductive nozzle 73 to unload the chip capacitor 91. During the production of chip capacitors 91, different customer requirements for different products lead to different testing procedures for chip capacitors 91. The addition of the electrical performance qualified product unloading device 8 is intended to meet the production needs of chip capacitors 91 with less stringent appearance requirements, allowing unloading to proceed directly after electrical performance testing.

[0063] It should be understood that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Those skilled in the art may modify the technical solutions described in the above embodiments, or make equivalent replacements for some of the technical features therein; and all these modifications and replacements should fall within the scope of protection of the claims attached to the present invention.

Claims

1. A chip capacitor testing device, characterized in that: include: Loading device, used for loading chip capacitors; Electrical performance testing device, used to test the electrical performance of chip capacitors; The tray for defective electrical performance products is used to store defective electrical performance products; Appearance inspection device, used to test the appearance of chip capacitors; Qualified product unloading device, used to receive and convey qualified chip capacitors; Defective appearance tray, used to store defective products; A turntable conveyor is used to absorb and grab chip capacitors and rotate to change the working position of chip capacitors; Among them, the loading device, electrical performance testing device, electrical performance defective product tray, appearance testing device, qualified product unloading device, and appearance defective product tray are arranged in a circle on the outside of the turntable conveyor device; The turntable conveyor device includes: a first turntable, a first turntable driving mechanism for driving the first turntable to rotate, a first conductive suction nozzle for sucking and grabbing chip capacitors, a first position adjustment mechanism for adjusting the position of the first conductive suction nozzle, a nozzle cylinder mechanism for pushing the first conductive suction nozzle downward, and an elastic lifting mechanism providing an elastic lifting force for the first conductive suction nozzle; wherein, the first position adjustment mechanism is arranged on the first turntable, the suction nozzle is arranged to slide up and down on the first position adjustment mechanism, the elastic lifting mechanism is arranged between the first conductive suction nozzle and the first position adjustment mechanism, and the suction nozzle cylinder mechanism is arranged above the first turntable; The electrical performance detection device includes a test frame, a first electrode test platform arranged on the test frame, a retractable second electrode ejector arranged above the first electrode test platform, and a tester for electrical performance testing of chip capacitors, the first electrode test platform and the second electrode ejector are connected to the tester, and the second electrode ejector is slidably penetrated on the test frame; wherein, the first conductive suction nozzle absorbs and grasps the chip capacitor and connects to one electrode plate thereof and moves downward, sequentially completing the contact between the side surface of the first conductive suction nozzle and the second electrode ejector, and the contact between the lower end of the chip capacitor as the other electrode plate and the first electrode test frame, thereby forming a test loop.

2. The chip capacitor detection device according to claim 1, characterized in that The first position adjustment mechanism includes a first nozzle mounting block, a first nozzle adjustment block, a first adjusting screw assembly, and a second adjusting screw assembly; the first nozzle adjustment block is slidably arranged on the first turntable along a first direction, and the first nozzle mounting block is slidably arranged on the first nozzle adjustment block along a second direction, the first adjusting screw assembly drives the first nozzle adjustment block to slide along the first direction, and the second adjusting screw assembly drives the first nozzle mounting block to move along the second direction, the first conductive nozzle is mounted on the first nozzle mounting block, and the first direction and the second direction are perpendicular to each other; The elastic rising mechanism includes a nozzle mounting rod that is slidably passed through the first nozzle mounting block, a first compression spring that is sleeved on the nozzle mounting rod, a guide rod that is slidably passed through the first nozzle mounting block and is parallel to the nozzle mounting rod, a connecting block that is fixedly connected to the guide rod and the nozzle mounting rod at both ends, and a second compression spring that is sleeved on the guide rod; the first conductive nozzle is fixed to one end of the nozzle mounting rod, and the two ends of the first compression spring are respectively connected to the other end of the nozzle mounting rod and the first nozzle mounting block; the two ends of the second compression spring are respectively connected to the first nozzle mounting block and the connecting block.

3. The chip capacitor detection device according to claim 1, characterized in that The loading device includes: a first material box tray for placing material boxes, a first XY movable platform for adjusting the position of the first material box tray, and a first CCD camera assembly positioned by the first material box tray. The first material box tray is provided with a plurality of material box slots adapted to the shape of the material box.

4. The chip capacitor testing device according to claim 1, characterized in that The appearance inspection device includes a first upper end surface inspection component, a second upper end surface inspection component, and a second turntable, which are sequentially arranged on one side of the first turntable, a second conductive suction nozzle arranged on the second turntable, and a first lower end surface inspection component and a second lower end surface inspection component arranged on one side of the second turntable; the first conductive suction nozzle on the first turntable absorbs and grabs the chip capacitor, and after passing through the first upper end surface inspection component or the second upper end surface inspection component, the second conductive suction nozzle on the second turntable absorbs and grabs the chip capacitor on the first conductive suction nozzle and transfers it to the first lower end surface inspection component and the second lower end surface inspection component.

5. The chip capacitor testing device according to claim 4, characterized in that The qualified product unloading device includes: a lifting box mechanism for placing and adjusting the height of the box, a second XY movable platform for adjusting the position of the box, a conveyor belt mechanism for unloading the box, and a clamping mechanism for grabbing the box; the first turntable and the conveyor belt mechanism are respectively arranged at both ends of the second XY movable platform, the lifting box mechanism is arranged between the conveyor belt mechanism and the second XY movable platform, and the clamping mechanism can be moved to the top of the conveyor belt mechanism, the second XY movable platform, and the lifting box mechanism to take and place the box.

6. The chip capacitor testing device according to claim 5, characterized in that The second XY movable platform includes: a second material box tray for placing material boxes, a first material box clamp arranged on the second material box tray for fixing the material boxes, a first translation electric cylinder for driving the second material box tray to translate back and forth between the first conductive suction nozzle and the conveyor belt mechanism, and a second translation electric cylinder arranged between the second material box tray and the first translation electric cylinder for adjusting the position of the second material box tray; the movement direction of the first translation electric cylinder is perpendicular to the movement direction of the second translation electric cylinder.

7. The chip capacitor testing device according to claim 6, characterized in that The chip capacitor testing equipment also includes an electrical performance good product unloading device arranged between the electrical performance testing device and the electrical performance defective product tray. The electrical performance good product unloading device includes an electrical performance good product tray for loading chip capacitors, and a third XY movable platform for driving the electrical performance good product tray to adjust its position.

8. The chip capacitor testing device according to claim 1, characterized in that The suction nozzle cylinder mechanism includes a cylinder mounting plate, a mounting bracket arranged on one side of the first turntable for supporting the cylinder mounting plate, at least five suction nozzle driving cylinders arranged on the cylinder mounting plate, and a rotating auxiliary part fixed on the cylinder mounting plate. The first turntable is rotatably connected to the rotating auxiliary part. The five suction nozzle driving cylinders are respectively arranged at positions corresponding to the loading device, the electrical performance good product unloading device, the electrical performance detection device, the qualified product unloading device, and the second turntable.

Images