Double-sided device testing device and method

Abstract

The present invention relates to a double-sided device testing device and method, the device comprises a test frame, a test needle plate, a test tray cover plate, a test adapter plate, an adapter plate with springs, a test tray and a test base, the test tray is provided with grooves for embedding two adapter plates with springs and a test adapter plate at positions corresponding to the positive and negative electrode pads and connectors of a PCB board to be tested, the corresponding adapter plates with springs and the test adapter plate are embedded in the grooves, so that when the PCB board is installed on the test tray, the two adapter plates with springs are respectively in contact with the positive and negative electrode pads of the PCB board, and the test adapter plate is snap-connected with the connector of the PCB board to transfer the test point on the front side of the PCB board to the back side. The device and method are conducive to simplifying the test operation, improving the test efficiency, and reducing the tooling design, processing difficulty and manufacturing cost.

Description

Technical Field

[0001] The invention belongs to the technical field of PCB board testing, and in particular relates to a double-sided device testing device and method. Background Art

[0002] Due to the structural limitations of the PCB board, the test points cannot be concentrated on the same surface for testing. Existing test solutions basically use double-sided needle implantation for testing, that is, the test points under the tooling are moved to a specific area by means of jumpers, and the area is connected to the test pins set on the tooling to achieve conversion testing. This method has the following disadvantages: 1. The tooling design and wiring are cumbersome; 2. The tooling processing accuracy requirements are high, and the cost is correspondingly high; 3. The test false alarm rate is high. Summary of the invention

[0003] The object of the present invention is to provide a double-sided device testing device and method, which are conducive to simplifying the testing operation, improving the testing efficiency, and reducing the tooling design, processing difficulty and manufacturing cost.

[0004] To achieve the above-mentioned purpose, the technical solution adopted by the present invention is: a double-sided device testing device, including a test frame, a test needle plate, a test tray cover, a test adapter plate, an adapter plate with spring clips, a test tray and a test base, wherein the test tray is provided with grooves for embedding two adapter plates with spring clips and a test adapter plate at positions corresponding to the positive and negative electrode pads and connectors of the PCB board to be tested, and the corresponding adapter plates with spring clips and the test adapter plate are embedded in the grooves, so that when the PCB board is installed on the test tray, the two adapter plates with spring clips are respectively in contact with the positive and negative electrode pads of the PCB board, and the test adapter plate is snap-fitted and connected with the connector of the PCB board to transfer the test points on the front side of the PCB board to the back side.

[0005] Furthermore, the test tray row is provided with a plurality of test stations, each station is provided with the groove and a corresponding adapter plate with a spring sheet and a test adapter plate are embedded therein, so as to test a plurality of PCB boards at the same time.

[0006] Furthermore, an integrated board removal steel sheet is provided on multiple test adapter plates arranged in one direction, and the PCB board is arranged on the integrated board removal steel sheet and is fastened and connected to the test adapter plate through a through hole opened on the integrated board removal steel sheet. After the test is completed, the PCB board fastened to the test adapter plate is quickly removed through the integrated board removal steel sheet.

[0007] Furthermore, a supporting pin is provided at the lower side of the test pin plate corresponding to the pad position of the PCB board, so that the test tray cover and the PCB board can be pressed onto the test tray during installation test to ensure that the spring clips on the spring clip adapter board are in good contact with the positive and negative pads of the PCB board.

[0008] Furthermore, two test points are provided on the adapter board with spring clips, and the two test points are respectively connected to a test pad. One test point is provided with two spring clips, and the other test point is provided with one spring clip. The test point with two spring clips carries a large current, and the test point with a single spring clip carries a compensation signal.

[0009] Furthermore, the adapter plate with spring sheets is fixedly connected to the test tray by screws.

[0010] The present invention also provides a double-sided device testing method, comprising the following steps:

[0011] Two adapter plates with springs and one test adapter plate are respectively installed in the grooves corresponding to the positive and negative pads and connector positions of the PCB board to be tested on each test station of the test tray;

[0012] Install the PCB board and the test tray cover on the test tray;

[0013] Plant the test pin on the center of the test pad extending from the adapter board with spring clips. When wiring, weld the test pin on the adapter board with spring clips to the connector of the test equipment according to polarity;

[0014] Two support pins are installed at the positive and negative pad positions of the test pin board corresponding to the PCB board. During the test, the support pins hold up the PCB board so that the PCB board has good contact with the springs on the spring adapter board.

[0015] Furthermore, the double-sided test fixture base is eliminated, and the test points on the front side of the PCB board are transferred to the back side, converting the double-sided test into a single-sided test.

[0016] Compared with the prior art, the present invention has the following beneficial effects: the device and method convert the double-sided test into a single-sided test, cancel the double-sided test tool base and do not need a separate jumper, which is not only simple to implement, simplifies the test operation, improves the test efficiency, but also reduces the design and processing difficulty of the test tool and its manufacturing cost. Therefore, the present invention has strong practicality and broad application prospects. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 Schematic diagram of the device structure of an embodiment of the present invention.

[0018] Figure 2 It is a schematic diagram of the connection structure of the test tray, the test adapter board, the adapter board with springs and the PCB board in an embodiment of the present invention.

[0019] Figure 3 Schematic diagram of the structure of the test tray in the embodiment of the present invention.

[0020] Figure 4 Schematic diagram of the structure of the adapter plate with springs in an embodiment of the present invention.

[0021] Figure 5 It is a schematic diagram of the connection structure between the test adapter plate and the integrated plate-taking steel sheet in an embodiment of the present invention.

[0022] Figure 6 It is a schematic diagram of the front structure of a PCB board in an embodiment of the present invention. DETAILED DESCRIPTION

[0023] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0024] like Figure 1-6 As shown, the present invention provides a double-sided device testing device, including a test frame 1, a test pin plate 2, a test tray cover plate 3, a test adapter plate 4, an adapter plate with springs 5, a test tray 6 and a test base 7, wherein the test tray 6 is provided with grooves 61, 62, 63 for embedding two adapter plates with springs 5 ​​and one test adapter plate 4 at positions corresponding to the positive and negative electrode pads and connectors of the PCB board to be tested, and the corresponding adapter plates with springs 5 ​​and the test adapter plate 4 are embedded in the grooves, so that when the PCB board 10 is installed on the test tray 6, the two adapter plates with springs 5 ​​are respectively in contact with the positive and negative electrode pads of the PCB board, and the test adapter plate 4 is snap-connected with the connector of the PCB board, so that the pins on the connector of the PCB board are transferred to the test adapter plate 4, and the test points on the front side of the PCB board are transferred to the back side.

[0025] In this embodiment, in order to test multiple PCB boards at the same time, the test tray is arranged with multiple test stations, each station is provided with the groove and embedded with the corresponding adapter plate with spring sheet and test adapter plate. An integrated board removal steel sheet 8 is provided on the multiple test adapter plates arranged in one direction, and the PCB board 10 is arranged on the integrated board removal steel sheet 8 and is connected with the test adapter plate 4 by snapping through the through hole opened on the integrated board removal steel sheet 8. After the test is completed, the PCB board snapped with the test adapter plate is quickly removed by the integrated board removal steel sheet.

[0026] The adapter plate with springs 5 ​​is provided with two test points 51 and 52, which are respectively connected to test pads 53 and 54. Two springs are provided on one test point 51, and one spring is provided on the other test point 52. The test point with two springs carries a large current, and the test point with a single spring carries a compensation signal. The adapter plate with springs 5 ​​is fixedly connected to the test tray 6 by screws.

[0027] In this embodiment, a supporting pin is provided on the lower side of the test pin plate corresponding to the pad position of the PCB board, so that the test tray cover and the PCB board can be pressed against the test tray during installation test to ensure that the spring clip on the spring clip adapter board is in good contact with the positive and negative pads of the PCB board.

[0028] The present invention also provides a double-sided device testing method, comprising the following steps:

[0029] Two adapter plates with springs and one test adapter plate are respectively installed in the grooves corresponding to the positive and negative pads and connector positions of the PCB board to be tested on each test station of the test tray;

[0030] Install the PCB board and the test tray cover on the test tray;

[0031] Plant the test pin on the center of the test pad extending from the adapter board with spring clips. When wiring, weld the test pin on the adapter board with spring clips to the connector of the test equipment according to polarity;

[0032] Two support pins are installed at the positive and negative pad positions of the test pin board corresponding to the PCB board. During the test, the support pins hold up the PCB board so that the PCB board has good contact with the springs on the spring adapter board.

[0033] The present invention eliminates the double-sided test fixture base, transfers the test points on the front side of the PCB board to the back side, and converts the double-sided test into a single-sided test.

[0034] The above are preferred embodiments of the present invention. Any changes made according to the technical solution of the present invention, as long as the resulting functions do not exceed the scope of the technical solution of the present invention, belong to the protection scope of the present invention.

Claims

1. A double-sided device testing device, characterized in that: It comprises a test stand, a test needle plate, a test tray cover plate, a test adapter plate, an adapter plate with springs, a test tray and a test base. The test tray is provided with grooves for embedding two adapter plates with springs and a test adapter plate at positions corresponding to the positive and negative pads and connectors of the PCB to be tested. The corresponding adapter plates with springs and the test adapter plate are embedded in the grooves, so that when the PCB is installed on the test tray, the two adapter plates with springs are respectively in contact with the positive and negative pads of the PCB, and the test adapter plate is snap-connected with the connector of the PCB to transfer the test points on the front of the PCB to the back. The test tray is arranged with a plurality of test stations, each of which is provided with the groove and embedded with a corresponding adapter plate with a spring sheet and a test adapter plate, so as to test a plurality of PCB boards at the same time; an integrated board-taking steel sheet is provided on the plurality of test adapter plates arranged in one direction, the PCB board is arranged on the integrated board-taking steel sheet and is buckled and connected with the test adapter plate through a through hole provided on the integrated board-taking steel sheet, and after the test is completed, the PCB board buckled with the test adapter plate is quickly taken out through the integrated board-taking steel sheet; A support pin is provided at the lower side of the test pin plate corresponding to the pad position of the PCB board, so as to press the test tray cover and the PCB board onto the test tray during the installation test, and ensure that the spring clip on the spring clip adapter board is in good contact with the positive and negative pads of the PCB board; The adapter board with springs is provided with two test points, the two test points are respectively connected to a test pad, one test point is provided with two springs, and the other test point is provided with one spring, the test point provided with two springs carries a large current, and the test point provided with a single spring carries a compensation signal; The double-sided device testing method based on the double-sided device testing device comprises the following steps: Two adapter plates with springs and one test adapter plate are respectively installed in the grooves corresponding to the positive and negative pads and connector positions of the PCB board to be tested on each test station of the test tray; Install the PCB board and the test tray cover on the test tray; Plant the test pin on the center of the test pad extending from the adapter board with spring clips. When wiring, weld the test pin on the adapter board with spring clips to the connector of the test equipment according to polarity; Install two support pins at the positive and negative pad positions of the PCB board corresponding to the test pin board. During the test, the support pins hold the PCB board to ensure good contact between the PCB board and the spring on the spring adapter board. The double-sided test fixture base was removed, and the test points on the front of the PCB board were transferred to the back, converting the double-sided test into a single-sided test.

2. A double-sided device testing device according to claim 1, characterized in that: The adapter plate with spring pieces is fixedly connected to the test tray by screws.

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