Laser processing part processing point quality detection method, device and system

Abstract

The embodiments of the present application disclose a method, device and system for detecting the quality of processing points of laser-processed parts, which receives a light radiation signal from at least one processing point in a laser processing path, wherein the light radiation signal includes one or more of an infrared radiation signal, a visible light radiation signal and a processing laser reflection signal; converts the received light radiation signal into an electrical signal through a single-point photoelectric sensor; establishes a corresponding relationship that characterizes the change of the laser processing point corresponding to the electrical signal during the laser processing process; and determines the quality of the processing point of the laser-processed part according to the corresponding relationship and the normal electrical signal corresponding to the processing point of the pre-stored laser processing standard part. The embodiments of the present application determine the quality of the processing point of the laser-processed part under a given process parameter so that the detection device can obtain a higher-precision quality detection result, and the hardware used is simple and effective, which reduces the detection cost and the complexity of the structure of the processing point quality detection device.

Description

Technical Field

[0001] The present application relates to the field of laser processing, and in particular to a method, device and system for detecting the quality of processing points of laser processed parts during laser welding. Background Art

[0002] The laser processing process is a process of interaction between light and materials. It mainly uses the laser beam emitted by the laser to transmit through optical fiber and lens and then focus on the surface of the material. The material absorbs the laser energy to cause melting or even gasification, thereby achieving the purpose of material processing. Due to the thermal effect of the laser, a molten pool will form in the processing area of ​​the material to be processed, and multiple signals such as plasma, metal vapor, radiation light signal and radiation sound signal will be radiated. A large number of studies have shown that the above signals are closely related to the quality of laser processing. If defects such as humps, incomplete penetration, spatter, and contamination occur during laser processing, the above radiation signals will reflect different signal representations.

[0003] In the current existing laser processing detection scheme, a reflective loop optical lens is generally set on the laser light path, the optical signal of the workpiece is obtained through a series of optical lenses, and the optical signal is processed and output through a CCD camera, and then the output result of the CCD signal is used to monitor or evaluate the quality of the laser processed workpiece.

[0004] For example, Chinese patent CN109128497A provides a laser welding head device, in which the visual detection component inside the device uses a CCD imaging system to track and observe the weld. German patent DE102014008265C5 provides a visual imaging method when the laser beam swings. The visual imaging beam and the processing beam are synchronized through a deflection mechanism so that the current processing position is always in the center of the visual imaging area. This can reduce the total area that needs to be imaged. At the same time, with a special image processing method, it can simplify the complexity of image processing and speed up image processing.

[0005] During the course of their work and research, the inventors discovered that in existing laser processing detection solutions, when using traditional sensors such as photoelectric coupled sensors (CCD or CMOS) or linear array or area array photoelectric detectors to obtain optical signals from laser processing points, there are problems such as excessively high software and hardware costs, low sampling frequency of computing data, and insufficient real-time detection capabilities during laser processing. Summary of the invention

[0006] The present application proposes a method, device and system for detecting the quality of processing points of laser-processed parts, which can perform low-cost and high-precision quality detection on the processing points of laser-processed parts. The detection equipment has a simple structure and also improves the real-time performance of the detection.

[0007] This application is implemented using the following technical solutions:

[0008] In a first aspect, an embodiment of the present application provides a method for detecting the quality of processing points of laser-processed parts, comprising: receiving a light radiation signal of at least one processing point in a laser processing path, the light radiation signal comprising: one or more of an infrared radiation signal, a visible light radiation signal, and a processing laser reflection signal; converting the received light radiation signal into an electrical signal by means of a single-point photoelectric sensor; establishing a correspondence relationship between the changes in the electrical signal corresponding to the laser processing point during the laser processing process; determining the quality of the processing point of the laser-processed part according to the correspondence relationship and a normal electrical signal corresponding to the processing point of a pre-stored laser processing standard part; wherein the normal electrical signal is the range of amplitude values ​​of the electrical signal corresponding to the changes in the processing point of the laser-processed part during a qualified processing under a certain process parameter.

[0009] In the above-mentioned laser processing part processing point quality detection method, by establishing a corresponding relationship between the electrical signal converted by photoelectric conversion of the light radiation signal of the laser processing point and the quality value of the laser processing point, the quality of the laser processing point is determined under a given process parameter, so that the detection equipment can obtain a higher-precision quality detection result, and at the same time, the corresponding relationship of the electrical signal change and the normal electrical signal can bring a more intuitive quality monitoring experience to the user. The detection equipment is simple and effective, which reduces the detection cost and the complexity of the structure of the processing point quality detection equipment.

[0010] In combination with the first aspect, in some embodiments, receiving the optical radiation signal of at least one processing point within the laser processing point coverage range includes: receiving the optical radiation signal of at least one processing point within the laser processing point coverage range includes: receiving different optical radiation signals of the same processing point under the determined process parameters on the laser processing path. Then, by performing data fitting on the different optical radiation signals of the same processing point under the determined process parameters, a more accurate correspondence between the processing point quality and the electrical signal is obtained at the processing point.

[0011] The above-mentioned photoelectric conversion of the received light radiation signal into an electrical signal by a single-point photoelectric sensor can be specifically as follows: based on the different light radiation signals received corresponding to the same processing point of the determined parameter process, the different light radiation signals are sampled and photoelectrically converted into an average value of the electrical signal, and the electrical signal corresponding to the same processing part is represented by the average value.

[0012] In combination with the first aspect, in some embodiments, the received radiation signal is photoelectrically converted into an electrical signal through a single-point photoelectric sensor, including: obtaining the corresponding voltage value V1 through an infrared radiation signal sensor, obtaining the corresponding voltage value V2 through a visible light radiation signal sensor, and obtaining the corresponding voltage value V3 through a laser processing reflection signal sensor, and outputting adjusted electrical signals after gain adjustment for the corresponding V1, V2 and V3 respectively.

[0013] In combination with the first aspect, in some embodiments, a corresponding relationship is established to characterize the change in the electrical signal corresponding to the laser processing point during the laser processing process, including: establishing a corresponding relationship between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point; the corresponding relationship is used to reflect the processing point quality value of the laser processing point according to the size of the adjusted electrical signal corresponding to the laser processing point on the laser processing path.

[0014] In combination with the first aspect, in some embodiments, the received radiation signal is photoelectrically converted into an electrical signal through a single-point photoelectric sensor, and also includes: receiving infrared radiation signals with a wavelength in the range of 1250nm to 1700nm through an infrared radiation signal sensor; and correspondingly receiving visible light radiation signals in the range of 400nm to 700nm through a visible light radiation signal sensor.

[0015] In combination with the first aspect, in some embodiments, a corresponding relationship is established to characterize the change in the electrical signal corresponding to the laser processing point during the laser processing process, including: pre-acquiring the electrical signal corresponding to the normal laser processing point, wherein the electrical signal corresponding to the normal laser processing point is the light radiation signal of the normal laser processing point at the processing point output after photoelectric conversion and gain adjustment.

[0016] In combination with the first aspect, in some embodiments, the received radiation signal is photoelectrically converted into an electrical signal through a single-point photoelectric sensor, including: obtaining the corresponding voltage value V1 through an infrared radiation signal sensor, obtaining the corresponding voltage value V2 through a visible light radiation signal sensor, and obtaining the corresponding voltage value V3 through a laser processing reflection signal sensor. The obtained electrical signal is V=m*V1+n*V2+k*V3, where m, n, and k are all constants, and m+n+k=1.

[0017] In the second aspect, an embodiment of the present application provides a quality detection device for processing points of laser-processed parts, including a single-point photoelectric sensor and a data processing module, wherein: the single-point photoelectric sensor is used to receive a light radiation signal of at least one processing point in the laser processing path, and convert the received light radiation signal into an electrical signal by photoelectric conversion, wherein the light radiation signal includes: one or more of an infrared radiation signal, a visible light radiation signal, and a processing laser reflection signal; the data processing module: establishes a corresponding relationship that characterizes the change of the laser processing point corresponding to the electrical signal during the laser processing process, and determines the quality of the laser processing point according to the corresponding relationship and the normal electrical signal corresponding to the pre-stored laser processing standard part processing point; wherein the normal electrical signal is the range of electrical signal values ​​corresponding to the change in the laser processing point during the qualified processing of the laser processing point under a certain process parameter.

[0018] In the above-mentioned laser processing part processing point quality detection device, a corresponding relationship is established between the electrical signal obtained by photoelectrically converting the light radiation signal of the laser processing point and the processing point quality value of the laser processing point, and the quality of the laser processing point of the laser processing part is determined under a given process parameter, so that the detection equipment can obtain a higher-precision quality detection result. At the same time, the corresponding relationship between the electrical signal change and the normal electrical signal can bring a more intuitive quality monitoring experience to the user, realize the processing point quality detection at a low cost, and reduce the complexity of data analysis of the processing point quality detection.

[0019] In combination with the second aspect, in some embodiments, the laser processing part processing point quality detection device also includes a memory, and the memory is used to pre-store the electrical signal of the laser processing standard part processing point after photoelectric conversion.

[0020] In combination with the second aspect, in some embodiments, the single-point photoelectric sensor is also used to receive different light radiation signals of the same processing point corresponding to the determined process parameters on the laser processing path; based on the different light radiation signals of the same processing point corresponding to the received determined process parameters, different light radiation signals are sampled for photoelectric conversion into an average value of electrical signals, and the electrical signal corresponding to the same processing part is represented by the average value.

[0021] In combination with the second aspect, in some embodiments, the single-point photoelectric sensor includes: one or more of an infrared radiation signal sensor, a visible light radiation signal sensor, and a laser processing reflection signal sensor.

[0022] In conjunction with the second aspect, in some embodiments, the single-point photoelectric sensor includes: an infrared radiation signal sensor, a visible light radiation signal sensor, and a laser processing reflection signal sensor; the corresponding voltage value V1 is obtained through the infrared radiation signal sensor, the corresponding voltage value V2 is obtained through the visible light radiation signal sensor, and the corresponding voltage value V3 is obtained through the laser processing reflection signal sensor. The data processing module is also used to: respectively establish a corresponding relationship between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point; the corresponding relationship is used to reflect one or two of the processing point quality values ​​of the laser processing point according to the size of the adjustment electrical signal corresponding to the laser processing point on the laser processing path.

[0023] In combination with the second aspect, in some embodiments, the data processing module is also used to determine whether the characterization data of the real-time processing point quality detection of the laser processing point during the laser processing process meets the normal standards based on the normal adjustment electrical signal corresponding to the pre-stored laser processing standard part processing point.

[0024] In the third aspect, the embodiment of the present application provides a laser processing part processing point quality detection system, including: a single-point photoelectric sensor, a memory, a data processor and a display module, wherein the single-point photoelectric sensor is used to receive the optical radiation signal of at least one processing point in the laser processing path, and convert the received optical radiation signal into an electrical signal by photoelectric conversion, wherein the optical radiation signal includes: one or more of an infrared radiation signal, a visible light radiation signal, and a processing laser reflection signal; the data processor is used to establish a corresponding relationship between the processing point quality value and the electrical signal according to the actual processing point quality value of at least one processing point of the laser welding point, and determine the quality of the laser processing part processing point according to the corresponding relationship and the pre-stored normal electrical signal corresponding to the laser processing standard part processing point; wherein the normal electrical signal is the corresponding change of the electrical signal value amplitude range of the laser processing part processing point in a qualified processing process under a process parameter. The memory is used to pre-store the electrical signal of the laser processing standard part processing point after photoelectric conversion; the display module is used to compare and output the corresponding relationship between the electrical signal of the actual processing point quality value and the electrical signal corresponding to the laser processing standard part output by the memory on the image interface.

[0025] In the above-mentioned laser processing part processing point quality detection system, a corresponding relationship is established between the electrical signal obtained by photoelectrically converting the light radiation signal of the laser processing point and the quality value of the laser processing point, and the quality of the laser processing point is determined under a given process parameter, so that the detection equipment can obtain a higher-precision quality detection result. At the same time, the corresponding relationship between the electrical signal change and the normal electrical signal can provide users with a more intuitive quality monitoring experience, realize the processing point quality detection at a low cost, and reduce the complexity of data analysis of the processing point quality detection.

[0026] In combination with the third aspect, in some embodiments, the single-point photoelectric sensor is also used to receive different light radiation signals of the same processing point corresponding to a process parameter on the laser processing path; based on the different light radiation signals of the same processing point corresponding to the received process parameter, the different light radiation signals are sampled and photoelectrically converted into an average value of electrical signals, and the electrical signal corresponding to the same processing part is characterized by the average value. Data processor: used to generate a pre-stored electrical signal of the laser processing standard part processing point after photoelectric conversion based on the electrical signal corresponding to the same processing point corresponding to the process parameter received by the single-point photoelectric sensor, and output it to the memory.

[0027] In conjunction with the third aspect, in some embodiments, the single-point photoelectric sensor includes: an infrared radiation signal sensor, a visible light radiation signal sensor, and a laser processing reflection signal sensor; the corresponding voltage value V1 is obtained through the infrared radiation signal sensor, the corresponding voltage value V2 is obtained through the visible light radiation signal sensor, and the corresponding voltage value V3 is obtained through the laser processing reflection signal sensor. The data processor is also used to: respectively establish a corresponding relationship between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point; the corresponding relationship is used to reflect the processing point quality value of the laser processing point according to the size of the adjustment electrical signal corresponding to the laser processing point on the laser processing path.

[0028] In combination with the third aspect, in some embodiments, the display module is also used to establish a correspondence between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point and display them on the graphical interface.

[0029] In combination with the third aspect, in some embodiments, the data processing module is also used to: determine whether the characterization data of the real-time processing point quality detection of the laser processing point during the laser processing process meets the normal standards based on the normal adjustment electrical signal corresponding to each processing point of the pre-stored laser processing standard parts.

[0030] In a fourth aspect, the present application provides a computer-readable storage medium, which stores a computer program. When the computer program is executed, it is used to execute the method in the first aspect or any possible implementation of the first aspect, or to execute the method in the second aspect or any possible implementation of the second aspect, or to execute the method in the third aspect or any possible implementation of the third aspect.

[0031] The present application provides a method, device, system and computer-readable storage medium for detecting the quality of processing points of laser-processed parts. According to the quality characteristics of the processing points of laser-processed parts and the characteristics related to optical signals, the quality of the processing points of laser-processed parts is determined under a given process parameter so that the detection equipment can obtain a higher-precision quality detection result. At the same time, the corresponding relationship between the changes in electrical signals and normal electrical signals can provide users with a more intuitive quality monitoring experience, making the detection equipment simple and effective, reducing the detection cost, and reducing the complexity of the structure of the processing point quality detection equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1 This is a schematic diagram of the structure of a quality detection device for laser processing points of a workpiece according to an embodiment of the present application;

[0033] Figure 2 This is a schematic diagram of the relationship between the quality of a standard laser processing point and a signal in an embodiment of the present application;

[0034] Figure 3 This is a schematic diagram of the relationship between the real-time laser processing point quality and the signal under a laser process in an embodiment of the present application;

[0035] Figure 4 This is a schematic diagram of the corresponding relationship between the changes in the electrical signals corresponding to the laser processing points during real-time detection by multiple sensors in an embodiment of the present application;

[0036] Figure 5 This is a schematic diagram of the structure of a quality inspection system for laser-processed workpiece processing points according to an embodiment of the present application;

[0037] Figure 6 A schematic diagram of the structure of a single-point photoelectric sensor in an embodiment of the present application; and

[0038] Figure 7 This is a flow chart of a method for detecting quality of processing points of laser-processed parts according to an embodiment of the present application. DETAILED DESCRIPTION

[0039] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0040] In order to better understand the technical solution of the present invention, the embodiments of the present application are described in detail below with reference to the accompanying drawings.

[0041] The terms used in the embodiments of the present application are only for the purpose of describing specific embodiments, and are not intended to limit the present invention. The singular forms "a", "said" and "the" used in the embodiments of the present application and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings.

[0042] It should be understood that the term "and / or" used in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0043] It should be understood that, although the terms first, second, etc. may be used to describe the set thresholds in the embodiments of the present application, these set thresholds should not be limited to these terms. These terms are only used to distinguish the set thresholds from each other. For example, without departing from the scope of the embodiments of the present application, the first set threshold may also be referred to as the second set threshold, and similarly, the second set threshold may also be referred to as the first set threshold.

[0044] At present, in the laser processing detection equipment on the market, such as laser welding process detection equipment, in the process of welding along the laser beam axis of the laser processing beam, various laser welding defects will be generated due to abnormal shielding gas, power attenuation, defocus change, protection mirror pollution, gap change and other reasons, such as cold welding, laser processing point surface pollution, incomplete penetration, weld nodules, collapse, spatter, weld deviation and other welding defects. The related defects in the laser welding process belong to welding defects, which are difficult to be found, thus bringing hidden dangers to product quality and have always troubled manufacturers. Especially in some industries with high quality requirements, such as mass production in the fields of batteries and precision consumer electronics, it is a technical problem that manufacturers urgently need to solve. In the field of power battery welding, the explosion-proof valve sealing welding requires that the explosion-proof valve and the cover plate ensure complete sealing welding, and there must be no leakage welding, cold welding, and biased welding that cannot be sealed. In the pole ear welding part, the copper sheet and the aluminum material need to be welded together. Due to the characteristics of different material welding processes and deformation during sheet welding, cold welding is prone to occur, resulting in poor welding structure. Battery shell sealing welding is an important process for power batteries. The welding quality has a direct impact on the overall sealing and compressive strength of the battery, thereby affecting the service life and safety performance. Battery pack series and parallel welding is also an important process for the output efficiency of the battery pack. The difficulty lies in the need to ensure the welding depth and welding strength.

[0045] To do this, refer to Figure 1 An embodiment of the present application provides a laser processing workpiece processing point quality detection device 10, including: a single-point photoelectric sensor 11 and a data processing module 12.

[0046] A single-point photoelectric sensor 11 is used to receive a light radiation signal from at least one processing point in the laser processing path, and to convert the received light radiation signal into an electrical signal by photoelectric conversion, wherein the light radiation signal includes: one or more of an infrared radiation signal, a visible light radiation signal, and a processing laser reflection signal; a data processing module 12 is used to establish a corresponding relationship characterizing the change in the electrical signal corresponding to the laser processing point during the laser processing process, and to determine the quality of the laser processing point according to the corresponding relationship and the normal electrical signal corresponding to the pre-stored laser processing standard part processing point; wherein the normal electrical signal is the range of the value of the electrical signal corresponding to the change in the laser processing point during the qualified processing under a certain process parameter.

[0047] The laser processing point quality detection device 10 provided in the embodiment of the present application, the single-point photoelectric sensor 11 is generally used to receive the light radiation signal corresponding to the processing point on the external laser processing part 20. By establishing a corresponding relationship that characterizes the change of the electrical signal corresponding to the laser processing point during the laser processing process. And according to the corresponding relationship and the normal electrical signal corresponding to the processing point of the pre-stored laser processing standard part, it is determined whether the quality of the laser processing point meets the requirements. Please refer to Figure 2 In an embodiment of the present application, when a standard laser processed part is processed in a qualified manner under a certain process parameter, the area actually processed by the laser can be divided into interval 1 (L1-L2), interval 2 (L3-L4), interval 3 (L5-L6), and interval 4 (L7-L8). The normal electrical signals of these four intervals can be obtained by the quality detection device disclosed in the present application. Then, the normal electrical signal value is obtained as follows: when the processing point of the laser processed part is processed in a qualified manner under a certain process parameter, the corresponding variable electrical signal value amplitude range is (V-, V+). Then, under a certain process parameter, the laser processing point associates the laser processing quality with the electrical signal obtained by the single-point photoelectric sensor. Then, combined with the corresponding variable electrical signal value amplitude range under the normal electrical signal of the laser processing standard part, the quality of the processing point during real-time laser processing is determined. The detection equipment provided by the present application uses a single-point photoelectric sensor to obtain the corresponding characteristics of the voltage on the laser processing path. The cost is lower than that of the CCD sensor. The analysis of the electrical signal obtained by the single-point photoelectric sensor is better than the real-time detection output of the image detection. Determining the quality of the processing point of the laser processed part under a given process parameter enables the present detection equipment to obtain a higher-precision quality detection result. At the same time, combining the corresponding relationship of the electrical signal change and the normal electrical signal can bring a more intuitive quality monitoring experience to the user. Compared with the quality detection of traditional optical modules such as CCD, the detection equipment provided by the present application is simple and effective, which reduces the detection cost and the complexity of the structure of the processing point quality detection equipment.

[0048] The single-point photoelectric sensor used in this application can be understood as the traditional single-point scanning of the light radiation signal into a voltage value signal indicating the intensity of the single-point light, and relative to the array scanning output of the traditional linear array CCD and area array CCD. A process parameter used in this application can be understood as a determined parameter configuration of different laser welding parameters when a certain curve segment or a certain surface of the same batch of laser processed parts is batch processed. For example, a process parameter is: a configuration of one or more parameters such as different welding speeds a, different welding laser defocus amounts b, and different welding powers c. It can be understood that a determined process parameter can be a determined combination of the three parameters a, b, and c.

[0049] It can be understood that the data processing module determines the quality of the laser processing point based on the corresponding relationship and the normal electrical signal corresponding to the pre-stored laser processing standard part processing point; and can introduce quality evaluation standards through external or internal memory to compare and judge the characterization data obtained by real-time detection or perform other numerical analysis and judgment.

[0050] Furthermore, in order to more intuitively reflect the quality of the processing point, the laser processing part processing point quality detection device 10 also includes a memory. The memory is used to pre-store the electrical signal of the laser processing standard part processing point after photoelectric conversion. Then the data processing module can directly retrieve the electrical signal of the memory for output, or obtain the normal electrical signal of the corresponding laser processing point by the table lookup method.

[0051] It can be understood that the electrical signal after photoelectric conversion of the processing point of the pre-stored laser processing standard part can be the normal adjustment electrical signal corresponding to the processing point of the pre-stored laser processing standard part. Furthermore, by adjusting the electrical signal normally, it can be determined whether the characterization data of the real-time processing point quality detection of the laser processing point during the laser processing process meets the normal standard. Optionally, the normal adjustment electrical signal corresponding to each processing point of the pre-stored laser processing standard part can be: pre-acquire the electrical signal corresponding to the normal laser processing point, wherein the electrical signal corresponding to the normal laser processing point is the light radiation signal of the normal laser processing point at the processing point obtained after photoelectric conversion and gain adjustment. It can be understood that the gain adjustment can be to establish a corresponding conversion relationship between the electrical signal and the laser processing quality. Here, the gain adjustment forms the processing point quality value output adjustment electrical signal, and the gain adjustment is consistent with the parameter selection for gain adjustment of the real-time electrical signal during real-time detection.

[0052] The normal adjustment electrical signal corresponding to each processing point of the pre-stored laser processing standard parts can also be determined based on the experience value during laser processing production. In the laser processing production process, when the laser equipment is set with the determined laser power, defocus, processing speed and other parameters, the same type of workpiece (welding of the same type of welding materials) can be welded / 3D printed by the same laser equipment. The standard correspondence between the processing point quality value (one or more combinations of processing point welding quality defects) and the electrical signal can be judged by the experience value, such as displaying a straight line or curve processing point quality envelope under the horizontal coordinate of the welding path. In addition, a standard corresponding model can be established in advance, so that when the laser processed parts are subsequently inspected in real time, the standard corresponding model can be used to refer to the quality of the processing point of the workpiece during real-time processing.

[0053] In the process of industrial laser processing, a laser processing machine will use the processing laser to repeatedly batch process the laser processing points corresponding to many identical or similar workpieces. For example, in laser welding applications, a processing laser is used to batch process a certain point, a certain curve segment or a certain surface of the corresponding part of the same batch of workpieces. Correspondingly, the laser processing point can be the processing point corresponding to the same part of the same batch of laser processed parts, such as a certain welding point of laser welding, or a certain welding point in a welding line segment of a straight line or curve, or a certain welding point of a butterfly weld / seam weld of a welding laser, or a certain fusion point of a single dot during laser 3D printing, etc. Physically, the above-mentioned welding points or fusion points of the same or similar parts of the same batch of laser processed parts are a processing point in the laser processing path. The optical radiation signal of the processing point is collected by a single-point photoelectric sensor, and the corresponding electrical signal is formed after photoelectric conversion by the single-point photoelectric sensor. Finally, the quality of the processing points of these processing points is characterized based on the differences of these electrical signals. Please refer to Figure 3 When laser welding is performed on a straight weld 210 in a laser processed part of the same batch of laser processed parts, the laser processing path direction is from left to right, so six processing points 201 can be selected at the weld 210 for processing point quality detection. In this way, the light radiation signal of the processing point 201 will be detected by the single-point photoelectric sensor 11, and then a corresponding relationship between the processing point quality and the detected electrical signal value V is formed on the welding path length L. Figure 3 It can be seen that the electrical signal value V obtained by the processing point quality of the laser processing point is related. The electrical signals corresponding to the six processing points 201 with obvious differences in processing point quality protrude upward, forming identifiable feature points in the voltage value. Figure 3 As shown, if the normal electrical signal corresponding to the pre-stored laser processing standard part processing point corresponds to the variable electrical signal value range of (V-, V+), then among the six processing points 201, the voltage values ​​of the leftmost and rightmost laser processing points do not reach the (V-, V+) range, indicating that the welding of the leftmost and rightmost laser processing points in this laser welding is abnormal and the laser processing quality is unqualified.

[0054] It can be understood that when a certain curve segment or a certain surface of the same batch of laser processed parts is batch processed, the welding area is longer, and different welding process parameters (such as different welding speeds, different welding laser defocus amounts, different welding powers, and other configurations of one or more parameters) have inconsistent effects on the processing point quality of a single processing point. Therefore, when receiving the optical radiation signal of a single processing point in the laser processing path, a certain welding process parameter can be used to sample the optical radiation signal of multiple corresponding processing points of the same batch of laser processed parts. The optical radiation signal sampled at the processing point under the determined process parameters will eventually obtain an electrical signal under the determined process parameters, and then the electrical signal under the related determined process parameters will be mathematically averaged, such as summing different electrical signals and then taking the average value.

[0055] It can be understood that, taking multiple laser processed parts in the same batch, a certain process parameter is used to process the four laser processed parts respectively. A laser processed part can have one or more processing points. If a processed part is spot welded, then a processed part can have only one processing point for spot welding. By fitting the processing point quality and voltage of several processing points in the laser processed parts under the certain process parameters respectively, and combining the above corresponding data, the corresponding relationship between the radiation photoelectric signal of a type of processing point and the quality of the processing point in the same batch of processed parts can be obtained. It can be understood that at least two sets of process parameters can be used to fit the corresponding relationship between the radiation photoelectric signal of the same type of processing point and the quality of the processing point. And on the laser processing path, when a single-point photoelectric sensor detects the light radiation signal of a processing point, by receiving different light radiation signals of the same processing point corresponding to at least two process parameters at different times, the corresponding relationship between the quality value of the laser processing point and the electrical signal can be established.

[0056] It can be understood that on the laser processing path, the single-point photoelectric sensor receives different light radiation signals of the same processing point corresponding to the process parameter determination process. The received light radiation signal is photoelectrically converted into an electrical signal by the single-point photoelectric sensor, including: according to the different light radiation signals of the same processing point corresponding to the process parameter determination process received, different light radiation signals are sampled and photoelectrically converted into an average value of the electrical signal, and the electrical signal corresponding to the same processing part is characterized by the average value. The corresponding relationship can be preliminarily fitted based on the quality of the processing point and the corresponding electrical signal.

[0057] Specifically, the single-point photoelectric sensor is a single-point photoelectric sensor, which is used to receive radiation light and convert the radiation light into a corresponding light intensity electrical signal, including: an infrared radiation signal sensor, a visible light radiation signal sensor, and a laser processing reflection signal sensor. In general, the infrared radiation signal sensor can correspond to receiving infrared radiation signals with wavelengths in the range of 1250nm to 1700nm. The visible light radiation signal sensor can correspond to receiving visible light radiation signals in the range of 400nm to 700nm. The laser processing reflection signal sensor can correspond to receiving the processing laser reflection signal during actual laser processing, such as the processing laser wavelength of 915nm, 1064nm, 1080nm, etc. The wavelength of the processing laser is related to the wavelength of the laser actually used. Those skilled in the art can understand that the light radiation signal of at least one processing point in the laser processing path received by the single-point photoelectric sensor 11 in the present application is related to the spectrum detectable by the single-point photoelectric sensor itself. In some use environments, the suitable interval of the infrared radiation signal can be extended beyond the interval of 1250nm to 1700nm. In some usage environments, the visible light radiation signal may extend beyond the 400nm to 700nm range. Or the relevant light radiation signal may be a certain section of the relevant range or certain specific spectra. For example, specific blue light, specific green light, etc. The embodiment of the present application can compare and characterize the laser processing quality by taking values ​​of three sections: infrared radiation signal, visible light radiation signal, and processing laser reflection signal, and thus can more accurately detect the quality of laser processing points.

[0058] Specifically, the single-point photoelectric sensor converts the received radiation signal into an electrical signal by photoelectric conversion, including: obtaining the corresponding voltage value V1 through the infrared radiation signal sensor, obtaining the corresponding voltage value V2 through the visible light radiation signal sensor, and obtaining the corresponding voltage value V3 through the laser processing reflection signal sensor, and adjusting the corresponding V1, V2 and V3 respectively after gain adjustment to output the adjusted electrical signal. The gain adjustment here can be understood as: in order to more intuitively and conveniently characterize the processing point quality value of the corresponding laser processing point through the voltage value, the voltage values ​​of V1, V2 and V3 are appropriately adjusted within a certain range, so that the change in voltage value can intuitively reflect the change in the processing point quality of the laser processing point. In the embodiment of the present application, the received radiation signal is converted into an electrical signal by the single-point photoelectric sensor, and the obtained electrical signal can be V=m*V1+n*V2+k*V3, where m, n, k are all constants, and m+n+k=1.

[0059] See also Figure 4The data processing module of the present application establishes a corresponding relationship between the quality value of the laser processing point and the electrical signal according to the actual quality value of the laser processing point, including: respectively establishing a corresponding relationship between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the quality value of the laser processing point; the corresponding relationship is used to reflect the quality value of the laser processing point according to the size of the adjustment electrical signal corresponding to the laser processing point on the laser processing path; it can be understood that the quality value of the processing point described in the embodiment of the present application includes: whether the processing point has a cold weld, spatter, weld nodule, surface contamination, etc. The change of the adjustment electrical signal can reflect the change of the quality of the processing point alone, or it can reflect the weighted change of the quality of the processing point.

[0060] Further, generating characterization data for quality detection of laser processing points according to the corresponding relationship also includes: determining whether the characterization data of real-time quality detection of laser processing points during laser processing meets the normal standard according to the normal adjustment electrical signal corresponding to each processing point of the pre-stored laser processing standard parts. In the embodiment of the present application, during the laser processing process, such as batch welding of a certain type of processed parts, it is necessary to detect in real time whether the quality of the welding points of this type of processed parts meets the product qualification requirements. According to the above scheme, it is necessary to detect the light radiation signals of the above processing points at the same or similar parts of the batch of laser processed parts in real time, and then establish the corresponding relationship between the quality value of the processing point of the real-time laser processing point and the electrical signal. Because the real-time corresponding relationship requires a standard reference table for comparison and judgment, for example, it is necessary to determine the corresponding relationship between the quality value of the processing point of the pre-stored standard processing point and the voltage, and then judge whether the quality value of the processing point of the real-time processing point is abnormal according to the voltage value obtained in real time. It can be understood that the corresponding relationship between the quality value of the processing point of the pre-stored standard processing point and the voltage can be an envelope surface, that is, in the same laser processing path, the corresponding curve of the quality value of the processing point of the standard processing point formed by fitting several laser processing points and the voltage can have an upper limit and a lower limit. When the correspondence between the quality value of the real-time laser processing point and the processing path of the electrical signal fitting meets the upper and lower limits of the correspondence between the quality value of the standard processing point and the voltage, it is judged that the quality value of the real-time laser processing point meets the laser processing standard.

[0061] The memory of the embodiment of the present application pre-acquires the electrical signal corresponding to the normal laser processing point, wherein the electrical signal corresponding to the normal laser processing point is obtained after the light radiation signal of the normal laser processing point at the processing point is photoelectrically converted and gain adjusted. When the value of the radiation signal of laser processing obtained by the single-point photoelectric sensor fluctuates in a very small range, such as fluctuating around 1.5V. In order to obtain a more intuitive graphic detection, a gain adjustment can be made to the floating value in a smaller range, such as increasing the gain by 5 times, so that the value of 7.5 is displayed in the attached figure in the graphical interface, thereby performing more intuitive graphic monitoring. It can be understood that after the gain adjustment, the electrical signal parameter output can be displayed, or the electrical signal corresponding to the normal laser processing point can be the light radiation signal of the normal laser processing point at the processing point obtained after photoelectric conversion and gain adjustment to obtain the corresponding processing point quality value output.

[0062] Correspondingly, in real-time detection, the single-point photoelectric sensor converts the received light radiation signal into an electrical signal with the same gain adjustment as above, and obtains the corresponding processing point quality value parameter display after adjustment. Then, according to the actual processing point quality value of the laser processing point, the corresponding relationship between the laser processing point quality value and the electrical signal is established. According to the corresponding relationship, the characterization data for laser processing point quality detection is generated, which can be specifically through the corresponding relationship between the laser processing path and the processing point quality value, and intuitively display the corresponding relationship between the real-time processing point quality value and the normal adjustment processing point quality value of the corresponding processing point of the pre-stored laser processing standard part.

[0063] It can be understood that in the embodiment of the present application, a correspondence is established between the electrical signal obtained by photoelectrically converting the light radiation signal of the laser processing point on the external laser processing part 20 and the quality value of the laser processing point, and then the quality of the laser processing point is characterized by the correspondence. Characterization data for laser processing point quality detection is generated according to the correspondence. The embodiment of the present application uses the light signal radiated during processing of the processing point for photoelectric conversion and then detection, and determines the quality of the laser processing point under a given process parameter so that the detection equipment can obtain a higher-precision quality detection result, and at the same time, the corresponding relationship of the electrical signal change and the normal electrical signal can bring a more intuitive quality monitoring experience to the user. Compared with the quality detection of traditional optical modules such as CCD, the hardware used in the present application is simple and effective, which reduces the detection cost and reduces the complexity of the structure of the processing point quality detection equipment.

[0064] Please refer to Figure 5, the embodiment of the present application discloses a laser processing part processing point quality detection system 500, including: a single-point photoelectric sensor 510, a memory 520, a data processor 530 and a display module 540, wherein the single-point photoelectric sensor 510 is used to receive the optical radiation signal of at least one processing point in the laser processing path, and photoelectrically convert the received optical radiation signal into an electrical signal, wherein the optical radiation signal includes: one or more of an infrared radiation signal, a visible light radiation signal, and a processing laser reflection signal. The data processor 530 is used to establish a corresponding relationship between the processing point quality value and the electrical signal according to the actual processing point quality value of at least one processing point of the laser welding point; determine the quality of the laser processing part processing point according to the corresponding relationship and the pre-stored normal electrical signal corresponding to the processing point of the laser processing standard part; wherein the normal electrical signal is the range of the value of the electrical signal corresponding to the change in the qualified processing process of the laser processing part processing point under a process parameter. The memory 520: is used to pre-store the electrical signal of the normal processing standard part after photoelectric conversion. Display module 540: used for comparing and outputting on a graphic interface the correspondence between the change in the electrical signal of the actual processing point quality value and the electrical signal corresponding to the laser processing standard part output by the memory.

[0065] It can be understood that in the embodiment of the present application, the data processor 530 establishes a corresponding relationship between the electrical signal converted from the optical radiation signal of the laser processing point by photoelectric conversion and the quality value of the laser processing point, and determines the quality of the laser processing point under a given process parameter so that the detection equipment can obtain a higher-precision quality detection result. At the same time, the corresponding relationship of the electrical signal change and the normal electrical signal can bring a more intuitive quality monitoring experience to the user. Compared with the quality detection of traditional optical modules such as CCD, the hardware used in this application is simple and effective, which reduces the detection cost and the complexity of the structure of the processing point quality detection equipment.

[0066] Specifically: the display module 540 is used to compare and output the characterization data for processing point quality detection and the electrical signal obtained by the memory 520 on the image interface. In real-time detection, the display module 540 is used to convert the received light radiation signal into an electrical signal by the single-point photoelectric sensor 510, and then adjust the gain. The corresponding processing point quality value parameter after adjustment is output and displayed through the electrical signal. Then, according to the actual processing point quality value of the laser processing point, the corresponding relationship between the processing point quality value of the laser processing point and the processing point quality value parameter electrical signal is established.

[0067] The memory 520 is used to pre-store the electrical signal of the normal processing standard part after photoelectric conversion. The pre-stored normal adjustment electrical signal corresponding to the processing point of the normal laser processing standard part is the electrical signal corresponding to the normal laser processing point obtained in advance, wherein the electrical signal corresponding to the normal laser processing point is the light radiation signal of the normal laser processing point at the processing point obtained after photoelectric conversion and gain adjustment. The gain adjustment is consistent with the parameter selection of gain adjustment of the real-time electrical signal during real-time detection.

[0068] Then, the real-time characterization data for quality detection of the processing points and the electrical signal obtained by the memory 520 are compared and output on the image interface through the display module 540 .

[0069] For details, please refer to Figure 6 , the single-point photoelectric sensor 510 includes: an infrared radiation signal sensor 512, a visible light radiation signal sensor 513, a laser processing reflection signal sensor 514 and an optical lens module 515. The optical lens module 515 is used to receive and process the radiation beams transmitted from the infrared radiation signal sensor 512, the visible light radiation signal sensor 513 and the laser processing reflection signal sensor 514 respectively; and adjust the received sensing signals and output them. Among them, the infrared radiation signal sensor 511, the visible light radiation signal sensor 512, and the laser processing reflection signal sensor 513 can all be single-point photoelectric sensors. The single-point photoelectric sensor 510 receives different light radiation signals of the same processing point corresponding to a process parameter on the laser processing path. Then, the single-point photoelectric sensor 510 can selectively receive one or more of infrared radiation signals, visible light radiation signals and laser processing reflection signals. In this way, the single-point photoelectric sensor 510 samples different light radiation signals according to the different light radiation signals of the same processing point corresponding to a parameter process received, and converts the different light radiation signals into the average value of the electrical signal for photoelectric conversion, and the electrical signal corresponding to the same processing part is characterized by the average value. The data processor 530 is used to generate and pre-store an electrical signal of a laser processing standard part processing point after photoelectric conversion according to the electrical signal corresponding to the same processing point corresponding to the process parameters received by the single-point photoelectric sensor 510, and output it to the memory 520.

[0070] Specifically, the data processor 530 is further used to: establish a corresponding relationship between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point; the corresponding relationship is used to reflect the processing point quality value of the laser processing point according to the size of the adjustment electrical signal corresponding to the laser processing point on the laser processing path. The display module is used to establish a corresponding relationship between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point and display them on the graphical interface.

[0071] Among them, the data processor 530 determines whether the characterization data of the real-time processing point quality detection of the laser processing point during the laser processing process meets the normal standard according to the normal adjustment electrical signal corresponding to each processing point of the pre-stored laser processing standard part. In real-time detection, the single-point photoelectric sensor 510 converts the received light radiation signal into an electrical signal and adjusts the gain. The gain adjustment here can be understood as: in order to more intuitively and conveniently characterize the processing point quality value of the corresponding laser processing point through voltage value or other parameters, the voltage values ​​of V1, V2 and V3 are appropriately adjusted within a certain range, so that the change of voltage value or other parameters can intuitively reflect the change of processing point quality of the laser processing point. In the embodiment of the present application, the received radiation signal is photoelectrically converted into an electrical signal by a single-point photoelectric sensor, and the electrical signal obtained can be V=m*V1+n*V2+k*V3, where m, n, and k are all constants, and m+n+k=1.

[0072] Please refer to Figure 7 The present application discloses a method for detecting the quality of a processing point of a laser-processed part, comprising the following steps:

[0073] Step 710: receiving a light radiation signal of at least one processing point in a laser processing path, the light radiation signal comprising: one or more of an infrared radiation signal, a visible light radiation signal, and a processing laser reflection signal;

[0074] Step 720: Photoelectrically converting the received optical radiation signal into an electrical signal by a single-point photoelectric sensor;

[0075] Step 730: establishing a corresponding relationship representing the change of the laser processing point corresponding to the electrical signal during the laser processing process;

[0076] Step 740: Determine the quality of the laser-processed part processing point based on the corresponding relationship and the normal electrical signal corresponding to the pre-stored laser-processed standard part processing point; wherein the normal electrical signal is the range of electrical signal values ​​corresponding to the change during the qualified processing of the laser-processed part processing point under a certain process parameter.

[0077] The laser processing part processing point quality detection method provided in the embodiment of the present application has a better real-time detection effect than image detection output by analyzing the electrical signal obtained by a single-point photoelectric sensor; the quality of the laser processing part processing point is determined under a given process parameter so that the detection equipment can obtain a higher-precision quality detection result, and at the same time, the corresponding relationship between the electrical signal change and the normal electrical signal can bring a more intuitive quality monitoring experience to the user. Compared with the quality detection of traditional optical modules such as CCD, the detection equipment provided by the present application is simple and effective, which reduces the detection cost and the complexity of the structure of the processing point quality detection equipment.

[0078] Specifically, step 710 also includes: receiving different light radiation signals of the same processing point corresponding to the determined process parameters on the laser processing path. In combination with the aforementioned embodiments of the present application, it can be seen that in this step, the processing point quality value signals of multiple processing points on the laser processing standard parts can be calibrated in a standard manner during normal processing, and a corresponding relationship between the standard processing point quality value and the electrical signal can be established. The same processing point or the same type of processing points are calibrated in a standard manner through a variety of process parameters, so that the processing point quality values ​​and corresponding electrical signals of the processing points of the same batch of workpieces meet the corresponding relationship.

[0079] Specifically, in step 720, the received light radiation signal is photoelectrically converted into an electrical signal through a single-point photoelectric sensor, including: based on different light radiation signals corresponding to the same processing point of the received determined parameter process, sampling different light radiation signals for photoelectric conversion to obtain an average value of the electrical signal, and using the average value to characterize the electrical signal corresponding to the same processing part.

[0080] It is understandable that step 710 and step 720 can be performed in real time when the laser processed part is processed. When processing a standard laser part, the corresponding relationship between the processing point quality value and the electrical signal data of the standard laser processing point can be pre-established under different environments.

[0081] The corresponding voltage value V1 can be obtained through the infrared radiation signal sensor, the corresponding voltage value V2 can be obtained through the visible light radiation signal sensor, and the corresponding voltage value V3 can be obtained through the laser processing reflection signal sensor, and the corresponding V1, V2 and V3 can be output as voltage value electrical signals respectively; the corresponding V1, V2 and V3 can also be output as adjusted voltage value electrical signals after gain adjustment; the corresponding V1, V2 and V3 can also be output as adjusted electrical signals reflecting the quality value of the processing point after gain adjustment; the corresponding V1, V2 and V3 can also be fitted into one or more composite electrical signals to reflect the quality value of the processing point; the corresponding V1, V2 and V3 can also be fitted into one or more composite electrical signals, and the composite electrical signals can be adjusted for gain to form the processing point quality value output. The laser processing reflection signal here can be understood as the laser signal formed after being reflected from the surface of the processing part during laser processing.

[0082] Specifically, in step 730, a corresponding relationship can be established between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point; the corresponding relationship is used to reflect the processing point quality value of the laser processing point according to the size of the adjusted electrical signal corresponding to the laser processing point on the laser processing path. In some application scenarios, since the electrical signal and the processing quality are not linearly related, it is necessary to output multiple charts through the corresponding relationship to characterize the processing point quality.

[0083] Specifically, in step 740, the quality of the laser processing part processing point is determined according to the corresponding relationship and the normal electrical signal corresponding to the processing point of the pre-stored laser processing standard part; wherein the normal electrical signal is the range of the value of the corresponding variable electrical signal during the qualified processing of the laser processing part processing point under a process parameter, which can be: according to the normal adjustment electrical signal corresponding to the pre-stored laser processing standard part processing point, determine whether the characterization data of the real-time processing point quality detection of the laser processing point during the laser processing process meets the normal standard. Optionally, the normal adjustment electrical signal corresponding to each processing point of the pre-stored laser processing standard part can be: pre-acquire the electrical signal corresponding to the normal laser processing point, wherein the electrical signal corresponding to the normal laser processing point is obtained after the light radiation signal of the normal laser processing point at the processing point is photoelectrically converted and gain adjusted. It can be understood that the gain adjustment here forms the processing point quality value output adjustment electrical signal, and the gain adjustment is consistent with the parameter selection of the real-time electrical signal gain adjustment during real-time detection. Optionally, the normal adjustment electrical signal corresponding to each processing point of the pre-stored laser processing standard part can also be determined according to the experience value during laser processing production. In the laser processing production process, when a certain laser equipment is welding / 3D printing the same type of workpiece (welding of the same type of welding materials) under certain laser power, defocus, processing speed and other parameter settings, the standard correspondence between the processing point quality value (one or more combinations of processing point welding quality defects) and the electrical signal can be judged by empirical values, such as displaying the processing point quality of a straight line or curve under the horizontal coordinate of the welding path. In addition, a standard corresponding model can be established in advance, so that when the laser processed parts are subsequently inspected in real time, the standard corresponding model can be used to refer to the quality of the processing point of the workpiece during real-time processing.

[0084] It can be understood that the characterization data for processing point quality detection is generated according to the corresponding relationship. It can be that the real-time processing point quality detection signal value is simply output on the corresponding laser processing detection path to characterize the detection quality, or the quality evaluation standard can be introduced through an external or internal memory to compare and judge the characterization data obtained by real-time detection or perform other numerical analysis and judgment.

[0085] Optionally, in the above scheme, the received radiation signal is photoelectrically converted into an electrical signal through a single-point photoelectric sensor, including: obtaining a corresponding voltage value V1 through an infrared radiation signal sensor, obtaining a corresponding voltage value V2 through a visible light radiation signal sensor, and obtaining a corresponding voltage value V3 through a laser processing reflection signal sensor, and then the obtained electrical signal is V=m*V1+n*V2+k*V3, wherein m, n, and k are all constants, and m+n+k=1. Furthermore, through the above settings, when displayed through an external display device, it can be displayed as an electrical signal of a single sensor or a single spectrum and the corresponding processing point quality value; it can also be displayed as an electrical signal of several sensors or several spectrums and the corresponding processing point quality value; it can also be displayed as a signal fitted by multiple sensors or multiple spectrums The electrical signals are displayed with the corresponding processing point quality value. For example, if m is set to 1, and n and k are both set to 0, the corresponding voltage value is displayed for a single infrared radiation signal sensor. If the coordinate unit needs to be changed at this time, the gain of the m value can be further adjusted to form a signal value under the coordinate unit, which can be displayed more intuitively in the output device or used conveniently for subsequent statistical calculations.

[0086] It can be understood that the laser processing point quality detection method provided in the embodiment of the present application and the laser processing point quality detection device and system using the method establish a corresponding relationship between the electrical signal converted from the optical radiation signal of the laser processing point on the external laser processing part and the laser processing point quality value, and generate characterization data for laser processing point quality detection according to the corresponding relationship. The embodiment of the present application uses the optical signal radiated during processing of the processing point for photoelectric conversion and then detection, and the hardware used is simple and effective, which reduces the detection cost and reduces the complexity of the structure of the processing point quality detection equipment.

[0087] In the method, device and system for detecting the quality of processing points of laser processed parts provided in the embodiments of the present application, infrared radiation signals with wavelengths in the range of 1250nm to 1700nm are received correspondingly by an infrared radiation signal sensor. Visible light radiation signals in the range of 400nm to 700nm are received correspondingly by a visible light radiation signal sensor. The processing laser reflection signal during actual laser processing is received correspondingly by a laser processing reflection signal sensor, for example, the processing laser wavelengths are 915nm, 1064nm, 1080nm, etc. The wavelength of the processing laser is related to the wavelength of the laser actually used. Furthermore, the embodiments of the present application can characterize the quality of the processing points of laser processed parts by combining and comparing the three values ​​of infrared radiation signal, visible light radiation signal and processing laser reflection signal, and thus can more accurately detect the quality of the processing points of laser processed parts.

[0088] Those skilled in the art can understand that the optical radiation signal of at least one processing point in the laser processing path received by the single-point photoelectric sensor or the single-point photoelectric sensor in the present application is related to the spectrum detectable by the single-point photoelectric sensor itself. In some use environments, the suitable range of infrared radiation signals can be extended outside the range of 1250nm to 1700nm. In some use environments, the visible light radiation signal can be extended outside the range of 400nm to 700nm. Or the relevant optical radiation signal can be a certain section of the relevant range or some specific spectra. For example, blue light, green light, etc. of a specific spectrum.

[0089] Those of ordinary skill in the art will appreciate that the various units and algorithm steps described in the embodiments disclosed herein can be implemented in a combination of electronic hardware, computer software, and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0090] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0091] In several embodiments provided in the present application, any function can be stored in a computer-readable storage medium if it is implemented in the form of a software functional unit and sold or used as an independent product. Based on this understanding, the technical solution of the present application can be essentially or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods of each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (Read-Only Memory; hereinafter referred to as: ROM), random access memory (Random Access Memory; hereinafter referred to as: RAM), disk or optical disk, and other media that can store program codes.

[0092] The above is only a specific implementation of the present application. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. The protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A method for detecting the quality of processing points of laser processed parts, characterized in that: The following steps are involved: Receiving a light radiation signal of at least one processing point in a laser processing path, the light radiation signal comprising: an infrared radiation signal, a visible light radiation signal, and a processing laser reflection signal; The received optical radiation signal is photoelectrically converted into an electrical signal through a single-point photoelectric sensor; an infrared radiation signal with a wavelength in the range of 1250nm to 1700nm is received through an infrared radiation signal sensor; and a visible light radiation signal with a wavelength in the range of 400nm to 700nm is received through a visible light radiation signal sensor; a corresponding voltage value V1 is obtained through the infrared radiation signal sensor, a corresponding voltage value V2 is obtained through the visible light radiation signal sensor, and a corresponding voltage value V3 is obtained through the laser processing reflection signal sensor, and the corresponding V1, V2 and V3 are outputted as adjusted electrical signals after gain adjustment respectively; Establish a corresponding relationship between the laser processing point and the change of the electrical signal during the laser processing process; establish a corresponding relationship between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point and display them on a graphical interface; obtain an electrical signal V=m*V1+n*V2+k*V3, where m, n, and k are all constants; The quality of the laser-processed part processing point is determined based on the corresponding relationship and the pre-stored normal electrical signal corresponding to the laser-processed standard part processing point; wherein the normal electrical signal is the range of electrical signal values ​​corresponding to the change during the qualified processing of the laser-processed part processing point under a certain process parameter.

2. The method for detecting the quality of processing points of laser processed parts according to claim 1, characterized in that: Receiving a light radiation signal of at least one processing point in the laser processing point coverage range includes: receiving different light radiation signals of the same processing point under determined process parameters on the laser processing path.

3. The method for detecting the quality of processing points of laser-processed parts according to claim 2, characterized in that: The received light radiation signal is photoelectrically converted into an electrical signal through a single-point photoelectric sensor, including: based on different light radiation signals corresponding to the same processing point of the determined parameter process, sampling the different light radiation signals for photoelectric conversion to obtain an average value of the electrical signal, and using the average value to characterize the electrical signal corresponding to the same processing point.

4. The method for detecting the quality of processing points of laser processed parts according to claim 3, characterized in that: Establishing a corresponding relationship between the changes in the electrical signal corresponding to the laser processing point during the laser processing process, including: establishing a corresponding relationship between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point; the corresponding relationship is used to reflect the processing point quality value of the laser processing point according to the size of the adjusted electrical signal corresponding to the laser processing point on the laser processing path.

5. The method for detecting the quality of processing points of laser processed parts according to claim 4, characterized in that: Establishing a corresponding relationship between the laser processing point and the change of the electrical signal during the laser processing process includes: pre-acquiring the electrical signal corresponding to the normal laser processing point, wherein the electrical signal corresponding to the normal laser processing point is the output of the light radiation signal of the normal laser processing point at the processing point after photoelectric conversion and gain adjustment.

6. The method for detecting the quality of processing points of laser processed parts according to any one of claims 1 to 5, characterized in that: The received radiation signal is photoelectrically converted into an electrical signal through a single-point photoelectric sensor, including: obtaining a corresponding voltage value V1 through an infrared radiation signal sensor, obtaining a corresponding voltage value V2 through a visible light radiation signal sensor, and obtaining a corresponding voltage value V3 through a laser processing reflection signal sensor. The obtained electrical signal is V=m*V1+n*V2+k*V3, wherein m, n, and k are all constants, and m+n+k=1.

7. A laser processing part processing point quality detection device, comprising a single-point photoelectric sensor and a data processing module, characterized in that: A single-point photoelectric sensor is used to receive a light radiation signal of at least one processing point in a laser processing path, and to photoelectrically convert the received light radiation signal into an electrical signal, wherein the light radiation signal includes: an infrared radiation signal, a visible light radiation signal, and a processing laser reflection signal; the single-point photoelectric sensor includes: an infrared radiation signal sensor, a visible light radiation signal sensor, and a laser processing reflection signal sensor; infrared radiation signals with wavelengths in the range of 1250nm to 1700nm are received by the infrared radiation signal sensor; visible light radiation signals in the range of 400nm to 700nm are received by the visible light radiation signal sensor; a corresponding voltage value V1 is obtained by the infrared radiation signal sensor, a corresponding voltage value V2 is obtained by the visible light radiation signal sensor, and a corresponding voltage value V3 is obtained by the laser processing reflection signal sensor, and the corresponding V1, V2, and V3 are output as adjusted electrical signals after gain adjustment respectively; Data processing module: establish a corresponding relationship between the laser processing point and the change of the electrical signal during the laser processing process, and determine the quality of the laser processing part processing point according to the corresponding relationship and the normal electrical signal corresponding to the pre-stored laser processing standard part processing point; wherein the normal electrical signal is the range of the value of the electrical signal corresponding to the change in the laser processing part processing point during the qualified processing under a certain process parameter; the data processing module establishes a corresponding relationship between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point; establishes a corresponding relationship between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point and displays them on the graphical interface; obtains the electrical signal V=m*V1+n*V2+k*V3, wherein m, n and k are all constants; the corresponding relationship is used to reflect the processing point quality value of the laser processing point according to the size of the adjusted electrical signal corresponding to the laser processing point on the laser processing path.

8. The laser processing workpiece processing point quality detection device according to claim 7, characterized in that: Also includes: The memory is used to pre-store the electrical signal of the laser processing standard part processing point after photoelectric conversion.

9. The laser processing workpiece processing point quality detection device according to claim 7, characterized in that: The single-point photoelectric sensor is also used to receive different light radiation signals of the same processing point corresponding to the determined process parameters on the laser processing path; based on the different light radiation signals of the same processing point corresponding to the received determined process parameters, the different light radiation signals are sampled for photoelectric conversion into an average value of electrical signals, and the electrical signal corresponding to the same processing point is represented by the average value.

10. The laser processing workpiece processing point quality detection device according to any one of claims 7 to 9, characterized in that: Data processing module: It is also used to determine whether the characterization data of the real-time processing point quality detection of the laser processing point during the laser processing process meets the normal standard according to the normal adjustment electrical signal corresponding to the pre-stored laser processing standard part processing point.

11. A laser processing part processing point quality detection system, comprising: Single-point photoelectric sensor, memory, data processor and display module, characterized in that: A single-point photoelectric sensor is used to receive a light radiation signal of at least one processing point in a laser processing path, and to perform photoelectric conversion of the received light radiation signal into an electrical signal, wherein the light radiation signal includes: an infrared radiation signal, a visible light radiation signal, and a processing laser reflection signal; infrared radiation signals with a wavelength in the range of 1250nm to 1700nm are received by the infrared radiation signal sensor; visible light radiation signals with a wavelength in the range of 400nm to 700nm are received by the visible light radiation signal sensor; a corresponding voltage value V1 is obtained by the infrared radiation signal sensor, a corresponding voltage value V2 is obtained by the visible light radiation signal sensor, and a corresponding voltage value V3 is obtained by the laser processing reflection signal sensor; A data processor is used to establish a corresponding relationship between the processing point quality value and the electrical signal according to the actual processing point quality value of at least one processing point of the laser welding point, and determine the quality of the laser processing part processing point according to the corresponding relationship and the normal electrical signal corresponding to the pre-stored laser processing standard part processing point; wherein the normal electrical signal is the range of the value amplitude of the corresponding change of the electrical signal during the qualified processing of the laser processing part processing point under a certain process parameter; the data processor respectively establishes a corresponding relationship between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point; the corresponding relationship is used to reflect the processing point quality value of the laser processing point according to the size of the adjustment electrical signal corresponding to the laser processing point on the laser processing path; Memory: used to pre-store the electrical signals of laser processing standard parts processing points after photoelectric conversion; Display module: used to establish a correspondence between the change in the electrical signal of the actual processing point quality value and the electrical signal corresponding to the laser processing standard part output by the memory, and respectively establish a correspondence between the V1, V2 and V3 voltage values ​​corresponding to each processing point of the laser processing standard part and the processing point quality value of the laser processing point and display them on the graphical interface to obtain the electrical signal V=m*V1+n*V2+k*V3, where m, n, k are all constants;.

12. The laser processing part processing point quality detection system according to claim 11, characterized in that: Single-point photoelectric sensor: used to receive different light radiation signals of the same processing point corresponding to a process parameter on the laser processing path; based on the different light radiation signals of the same processing point corresponding to a process parameter received, sample the different light radiation signals for photoelectric conversion into an average value of electrical signals, and use the average value to characterize the electrical signal corresponding to the same processing point; Data processor: used to generate and pre-store the electrical signal of the laser processing standard part processing point after photoelectric conversion according to the electrical signal corresponding to the same processing point corresponding to the process parameters received by the single-point photoelectric sensor, and output it to the memory.

13. The laser processing part processing point quality detection system according to any one of claims 11 to 12, characterized in that: The data processor is also used to determine whether the characterization data of the real-time quality detection of the laser processing point during the laser processing process meets the normal standard according to the normal adjustment electrical signal corresponding to each processing point of the pre-stored laser processing standard part.

14. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, which, when executed on a computer, enables the computer to execute the method according to any one of claims 1 to 6.

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