Buried point test method and related equipment

Abstract

The present application discloses a method for burying point testing and related equipment. The method includes: receiving a first test operation of a user on a first control in a first interactive page; in response to the first test operation, obtaining a first burying point event corresponding to the first test operation; calling a first event processing function corresponding to the first burying point event in a configuration information library to obtain first burying point data for the first control; based on the first burying point data, obtaining a first burying point test result, the first burying point test result is used to indicate whether the first interactive page is normal. Through the above method, burying point testing can be completed while performing terminal version testing, reducing the number of terminal tests, shortening the test cycle, and avoiding repeating the same test operations.

Description

Technical Field

[0001] The present application belongs to the field of computer technology, and in particular, relates to a buried point testing method and related equipment. Background Art

[0002] Developers first conduct delivery testing of the terminal version to determine whether the terminal version is usable. Then, developers use hard-coding to set tracking points in the terminal and conduct tracking point testing of the terminal to confirm whether the implementation of the terminal's application functions matches the design. Using the above testing method, developers need to conduct multiple tests to complete the terminal test of this version, which has a long test cycle and requires repeated terminal testing operations. Summary of the invention

[0003] In view of this, an embodiment of the present application provides a tracking point testing method and related equipment, which can complete tracking point testing while performing terminal version testing, reduce the number of terminal tests, shorten the test cycle, and avoid repeating the same test operations.

[0004] In a first aspect, an embodiment of the present application provides a buried point test method, the buried point test method comprising:

[0005] Receiving a first test operation of a user on a first control in a first interactive page;

[0006] In response to the first test operation, obtaining a first tracking event corresponding to the first test operation;

[0007] Calling a first event processing function corresponding to a first embedding event in a configuration information library to obtain first embedding data of a first control;

[0008] Based on the first buried point data, a first buried point test result is obtained, and the first buried point test result is used to indicate whether the first interactive page is normal.

[0009] In some embodiments, before calling the first event processing function corresponding to the first burying point event in the configuration information table to obtain the first burying point data of the first control, the burying point testing method further includes:

[0010] Get configuration information, including preset tracking events of tracking controls;

[0011] Based on the preset tracking event in the configuration information, configure the event processing function corresponding to the preset tracking event;

[0012] Generate a configuration information library based on the configuration information and event processing functions.

[0013] In some embodiments, obtaining configuration information includes:

[0014] Obtaining at least one interactive page image;

[0015] Identify at least one interactive page image according to the control cut-image library, determine at least one embeddable control in a second interactive page corresponding to the at least one interactive page image, the control cut-image library contains control cut-images of each embeddable control in the second interactive page, and the second interactive page includes an interactive page that matches the first interactive page;

[0016] Get the preset tracking event associated with at least one tracking control;

[0017] Configuration information is obtained based on at least one embeddable control and a preset embedding event.

[0018] In some embodiments, the configuration information library further includes a first identifier corresponding to a preset burying point event, and based on the first burying point data, obtaining a first burying point test result includes:

[0019] When the first identifier indicates that the first buried point data is useful, a first buried point test result is obtained based on the first buried point data.

[0020] In some embodiments, after calling the first event processing function corresponding to the first burying point event in the configuration information library to obtain the first burying point data of the first control, the burying point testing method further includes:

[0021] When the first identifier indicates that the first burying point data is useless, counting the number of times the first burying point event occurs within a preset time period;

[0022] Based on the number of events, a second buried point test result is obtained, and the second buried point test result is used to indicate whether the user's test operation within a preset time period is a valid test operation.

[0023] In some embodiments, after receiving a first test operation of a user on a first control in a first interactive page, the tracking test method further includes:

[0024] Receiving a second test operation of the user on a second control in the first interactive page, where the second control is a embeddable control that is not in the configuration information library;

[0025] In response to the second test operation, a second burying event corresponding to the second test operation is obtained, where the second burying event is a preset burying event corresponding to a third control in the configuration information library, and the third control is a buryable control of the same control type as the second control;

[0026] Calling a second event processing function corresponding to the second embedding event in the configuration information library to obtain second embedding data of the second control;

[0027] Based on the second buried point data, a third buried point test result is obtained, and the third buried point test result is used to indicate that there is an abnormality in the first interactive page.

[0028] In a second aspect, an embodiment of the present application provides a buried point test device, the buried point test device comprising:

[0029] A first receiving module, used to receive a first test operation of a user on a first control in a first interactive page;

[0030] A first acquisition module, configured to acquire, in response to a first test operation, a first tracking event corresponding to the first test operation;

[0031] A first calling module, used to call a first event processing function corresponding to a first burying point event in a configuration information library to obtain first burying point data of a first control;

[0032] The first result obtaining module is used to obtain a first buried point test result based on the first buried point data, and the first buried point test result is used to indicate whether the first interactive page is normal.

[0033] In some embodiments, the buried point testing device further includes:

[0034] A second acquisition module is used to acquire configuration information before calling the first event processing function corresponding to the first embedding event in the configuration information table to obtain the first embedding data of the first control, wherein the configuration information includes preset embedding events of the embeddable control;

[0035] A configuration module, used to configure an event processing function corresponding to a preset embedding event based on the preset embedding event in the configuration information;

[0036] The generation module is used to generate a configuration information library based on the configuration information and the event processing function.

[0037] In some embodiments, the second acquisition module includes:

[0038] A first acquisition submodule acquires at least one interactive page image;

[0039] A determination submodule is provided, wherein at least one interactive page image is identified according to a control cut-image library, and at least one embeddable control in a second interactive page corresponding to the at least one interactive page image is determined, wherein the control cut-image library contains control cut-images of each embeddable control in the second interactive page, and the second interactive page includes an interactive page that matches the first interactive page;

[0040] A second acquisition submodule is used to acquire a preset embedding event associated with at least one embeddable control;

[0041] A submodule is obtained, which is used to obtain configuration information based on at least one embeddable control and a preset embedding event.

[0042] In some embodiments, the first result obtaining module is specifically used to configure the information library to also include a first identifier corresponding to a preset buried point event. When the first identifier indicates that the first buried point data is useful, a first buried point test result is obtained based on the first buried point data.

[0043] In some embodiments, the buried point testing device further includes:

[0044] A statistics module, for, after calling a first event processing function corresponding to a first burying point event in a configuration information library and obtaining first burying point data of a first control, counting the number of events of the first burying point event occurring within a preset time period when a first identifier indicates that the first burying point data is useless;

[0045] The second result obtaining module is used to obtain a second buried point test result based on the number of events, and the second buried point test result is used to indicate whether the user's test operation within a preset time period is a valid test operation.

[0046] In some embodiments, the buried point testing device further includes:

[0047] A second receiving module is used to receive a second test operation of the user on a second control in the first interactive page, where the second control is a embeddable control that is not in the configuration information library;

[0048] A third acquisition module is used to obtain a second burying point event corresponding to the second test operation in response to the second test operation, where the second burying point event is a preset burying point event corresponding to a third control in the configuration information library, and the third control is a burying point control of the same control type as the second control;

[0049] A second calling module is used to call a second event processing function corresponding to a second burying point event in a configuration information library to obtain second burying point data of a second control;

[0050] The third result obtaining module is used to obtain a third buried point test result based on the second buried point data, and the third buried point test result is used to indicate that there is an abnormality in the first interactive page.

[0051] In a third aspect, an embodiment of the present application provides a computer device, the device comprising: a processor and a memory storing computer program instructions;

[0052] When the processor executes the computer program instructions, the buried point testing method as described in the first aspect is implemented.

[0053] In a fourth aspect, an embodiment of the present application provides a computer storage medium having computer program instructions stored thereon, and when the computer program instructions are executed by a processor, the buried point testing method as described in the first aspect is implemented.

[0054] In a fifth aspect, an embodiment of the present application provides a computer program product, including a computer program or instructions, characterized in that when the computer program or instructions are executed by a processor, the embedded point testing method as described in the first aspect is implemented.

[0055] The embodiments of the present application provide a method, device, computer equipment, computer storage medium, and computer program product for burying point testing, which can respond to a user's first test operation on a first control in a first interactive page, obtain a burying point event corresponding to the first test operation, call a first event processing function corresponding to the first burying point event in a configuration information library, obtain first burying point data for the first control, and obtain a first burying point test result based on the first burying point data. In this way, based on the configuration information library, during the burying point testing process, an event processing function corresponding to the burying point event can be separately configured to obtain burying point data, so that the burying point test can be completed while the terminal version test is being performed, thereby reducing the number of terminal tests, shortening the test cycle, and avoiding repeated terminal test operations. BRIEF DESCRIPTION OF THE DRAWINGS

[0056] In order to more clearly illustrate the technical solution of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0057] Figure 1 A schematic diagram showing a flow chart of a buried point testing method provided in an embodiment of the present application is shown;

[0058] Figure 2 A schematic diagram showing a flow chart of another buried point testing method provided in an embodiment of the present application;

[0059] Figure 3 A schematic diagram of a process of S21 provided by the present application is shown;

[0060] Figure 4 A schematic diagram showing a flow chart of another buried point testing method provided in an embodiment of the present application;

[0061] Figure 5 A schematic diagram of the structure of a buried point testing device provided in an embodiment of the present application is shown;

[0062] Figure 6 A schematic diagram of the hardware structure of a computer device provided by the present application is shown. DETAILED DESCRIPTION

[0063] The features and exemplary embodiments of various aspects of the present application will be described in detail below. In order to make the purpose, technical solutions and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are only intended to explain the present application, rather than to limit the present application. For those skilled in the art, the present application can be implemented without the need for some of these specific details. The following description of the embodiments is only to provide a better understanding of the present application by illustrating the examples of the present application.

[0064] Currently, developers first conduct delivery tests on the terminal version to determine whether the terminal version is usable. Then, developers use hard-coding to set tracking points in the terminal and conduct tracking point tests on the terminal to confirm whether the terminal implementation matches the design. In this way, the terminal test of this version is completed. In this way, completing a terminal version test requires multiple stages of testing, a long test cycle, and repeated testing operations.

[0065] In addition, there are multiple applications in the terminal, and there may be multiple development frameworks and specifications. Using hard coding to write tracking code in the application code may lead to a high error rate of terminal tracking. In addition, only developers with higher technical skills can set terminal tracking, which is not user-friendly to other users.

[0066] Also, after a terminal version is released, the tracking point cannot be changed. If there are defects in the tracking point data of the terminal, the tracking point needs to be modified again and the version needs to be released again. In this way, the tracking point modification cycle is long and the terminal version needs to be updated frequently.

[0067] Based on this, the embodiments of the present application provide a method, device, computer equipment, computer storage medium, and computer program product for burying point testing, which can first obtain the test operation for the control in the interactive page during the burying point testing process, and then obtain the burying point event corresponding to the test operation based on the test operation, call the event processing function corresponding to the burying point event in the configuration information library, obtain the burying point data of the control, and finally obtain the first burying point test result based on the burying point data. In this way, based on the configuration information library, during the burying point testing process, the event processing function corresponding to the burying point event can be separately configured to obtain the burying point data, so that the burying point test can be completed while the terminal version test is being performed, reducing the number of terminal tests, shortening the test cycle, and avoiding repeated terminal test operations.

[0068] An embodiment of the present application provides a buried point testing method. Figure 1 The flowchart of a method for burying point testing provided by an embodiment of the present application is shown. The execution subject of the method for burying point testing may be a burying point testing device. Figure 1As shown, the buried point testing method may include S11 to S14.

[0069] S11, receiving a first test operation from a user on a first control in a first interactive page.

[0070] S12, in response to the first test operation, obtaining a first burying point event corresponding to the first test operation.

[0071] S13, calling the first event processing function corresponding to the first embedding event in the configuration information library to obtain the first embedding data of the first control.

[0072] In the above embodiment, in response to the user's first test operation on the first control in the first interactive page, it is possible to obtain a buried point event corresponding to the first test operation, call the first event processing function corresponding to the first buried point event in the configuration information library, obtain the first buried point data of the first control, and obtain the first buried point test result based on the first buried point data. In this way, based on the configuration information library, during the buried point test process, the event processing function corresponding to the buried point event can be separately configured to obtain the buried point data, so that the buried point test can be completed while the terminal version test is being performed, thereby reducing the number of terminal tests, shortening the test cycle, and avoiding repeated terminal test operations.

[0073] In S11, the first interactive page may be a page for the application to interact with the user, wherein the application may be an application integrated on the terminal. For example, the first interactive page of a social program on the vehicle-mounted terminal. In the embodiment of the present application, the first interactive page may be one or more pages.

[0074] In S11, the first control may be a control on the first interactive page. For example, a button control on the first interactive page. In the embodiment of the present application, the first control may be one control or multiple controls. The control type of the first control may include, but is not limited to, page controls such as buttons, horizontal sliders, vertical sliders, data links, and operation links.

[0075] In S11, the first test operation may be an input operation for the first control, and the first test operation may include but is not limited to control operations such as clicking, dragging, zooming in and out.

[0076] In S12, the first burying point event may be an operation event corresponding to the first test operation. In the embodiment of the present application, the first burying point event may include but is not limited to control operation events such as click events, drag events, zoom-in events, and zoom-out events.

[0077] Here, the first buried event may be an operation event pre-bound to the first control. The operation event corresponds to the control type of the first control. In an embodiment of the present application, the first control may be a control in the first interactive page where a buried event is set.

[0078] In the embodiment of the present application, S12 can be specifically performed as follows: the burying point test device can obtain the first burying point event corresponding to the first test operation according to the preset correspondence between the test operation and the operation event. The preset correspondence between the test operation and the operation event can include but is not limited to the correspondence between the click operation and the click event, and the correspondence between the drag operation and the drag event.

[0079] In one example, when the first test operation is a single-click operation, the embedded test device obtains a single-click event of the first control.

[0080] In S13, the configuration information library may include preset embedding events and corresponding event processing functions. For example, the configuration information library may include preset click events and corresponding click event processing functions.

[0081] In S13, the first event processing function is an event processing function corresponding to the first embedding event. For example, when the first embedding event is a single-click event of a button, the event processing function corresponding to the first embedding event is buttononclick().

[0082] It should be noted that, in the embodiment of the present application, the configuration information library may be a separate configuration file.

[0083] In S13, the first buried data may be statistical data when the first test operation is executed. The first buried data may be buried data of the first control, which is data associated with the first buried event. And the first buried data is data generated for the first test data.

[0084] Optionally, the first burying point data may include but is not limited to the specific content of the first burying point event, etc. Among them, the specific content of the first burying point event includes but is not limited to the identifier of the first control, the result of the first burying point event, the time of event occurrence, the terminal identifier, the user identifier and the operating environment, etc.

[0085] In an embodiment of the present application, S13 can be specifically executed as follows: the burying point testing device searches the configuration information library for a first event processing function corresponding to the first burying point event, and calls the first event processing function to obtain the first burying point data of the first control.

[0086] In S14, the first buried point test result is used to indicate whether the first interactive page is normal. Wherein, whether the first interactive page is normal may refer to whether the design and implementation of the first interactive page match.

[0087] In the embodiment of the present application, the design of the first interactive page can be a design based on the human-machine interface (HMI) specification of the user. For example, the HMI design of the vehicle terminal. The implementation of the first interactive page can refer to the actual operation result of the first interactive page.

[0088] Optionally, in the case where the design and implementation of the first interaction page do not match, it is determined that the first interaction page is abnormal. In the case where the design and implementation of the first interaction page do not match, it is determined that the first interaction page is normal.

[0089] In S14, the burying point testing device can determine whether the design of the first interactive page matches the actual application through the first burying point data, thereby obtaining the first burying point testing result.

[0090] Specifically, the burying point testing device can determine whether the design and implementation of the first interactive page match by analyzing the specific content of the first burying point event in the first burying point data, thereby obtaining the first burying point test result.

[0091] In one example, when the first control is a return to home page control, the first test operation is a single-click operation, and the first buried event is a single-click event, the user performs a single-click operation on the return to home page control. First, the buried test device receives the single-click operation of the return to home page control, and obtains the single-click event of the return to home page control in response to the single-click operation. Secondly, the buried test device calls the first event processing function corresponding to the single-click event of the return to home page control in the configuration information library to obtain the first buried data. Finally, the buried test device determines through analysis of the first buried data that after clicking the first control, the first interactive page does not jump to the home page, thereby determining that the design and implementation of the first interactive page do not match, and then obtaining the first buried test result indicating that the first interactive page is abnormal.

[0092] In some embodiments, in order to obtain the buried point event in time, S12 can be specifically performed as follows: the buried point test device obtains the operation event corresponding to the first test operation through the event listener registered on the first control in response to the first test operation. In this way, the first buried point event can be obtained quickly and timely through the event listener.

[0093] Figure 2 FIG. 1 is a flow chart of another method for testing a point in the present application. In some embodiments, in order to accurately and quickly obtain a configuration information library, such as Figure 2As shown, in S13, before calling the first event processing function corresponding to the first burying point event in the configuration information table to obtain the first burying point data of the first control, the burying point testing method also includes S21 to S23.

[0094] S21, obtaining configuration information.

[0095] Here, the configuration information may include preset embedding events for embeddable controls. Among them, embeddable controls can be controls that can set embedding points in the interactive page of the application, which can be determined according to user needs or HMI design specifications. The preset embedding event can be a preset default embedding event corresponding to the embeddable control.

[0096] In the embodiment of the present application, the embeddable control may be one or more controls. The embeddable control includes but is not limited to page controls such as buttons, horizontal sliders, vertical sliders, data links, and operation links. The preset embedding events may include but are not limited to control operation events such as click, drag, zoom in and zoom out.

[0097] In S21, the configuration information can be obtained by the burying point test device from other devices (such as a cloud platform), or can be generated by the burying point test device itself. In the embodiment of the present application, there is no limitation on the method of obtaining the configuration information.

[0098] S22: Based on the preset embedding event in the configuration information, configure an event processing function corresponding to the preset embedding event.

[0099] Here, the event processing function corresponding to the preset embedding event may be a function for executing the preset embedding event.

[0100] In S22, the burying point testing device may obtain event processing functions of various events, and based on the preset burying point events in the configuration information, configure the event processing function corresponding to the preset burying point events.

[0101] In an embodiment of the present application, the buried point test device can obtain the event processing functions of various events through the event processing functions stored locally or in other devices. It can also obtain the event processing functions of various events by receiving the function code input by the user. Here, there is no restriction on the method of obtaining the event processing function.

[0102] S23, generating a configuration information library based on the configuration information and the event processing function.

[0103] Here, the configuration information library may include configuration information and event processing functions. The embedding test device generates the configuration information library based on the preset embedding events of the embeddable controls in the configuration information and the event processing functions corresponding to the preset embedding events.

[0104] It should be noted that, in the embodiment of the present application, a point-embedding control may correspond to one or more preset point-embedding events. A preset point-embedding event corresponds to an event processing function.

[0105] Optionally, the configuration information library may include embeddable controls, preset embeddable events corresponding to the embeddable controls, and event processing functions corresponding to the preset embeddable events.

[0106] In the above embodiment, it is possible to configure an event processing function corresponding to a preset embedding event of a embedding control according to the configuration information, and generate a configuration information library based on the configuration information and the event processing function, thereby obtaining an event processing function corresponding to the preset embedding data, so that during the embedding test process, the event processing function corresponding to the embedding event can be independently configured.

[0107] Figure 3 A schematic diagram of a process of S21 provided by the present application is shown. In some embodiments, in order to quickly identify the embeddable controls in the interactive page, such as Figure 3 As shown, S21, obtaining configuration information may include S31 to S34.

[0108] S31, obtaining at least one interactive page image.

[0109] Here, the interactive page image may be a design overview of the interactive page of at least one application in the terminal. The interactive page image may include a static image of all page elements in the interactive page. For example, the interactive page image may be a snapshot of the interactive page.

[0110] In an embodiment of the present application, at least one interaction page image may include an interaction page image that matches the first interaction page.

[0111] S32, identifying at least one interactive page image according to the control cutting library, and determining at least one embeddable control in the second interactive page corresponding to the at least one interactive page image.

[0112] Here, the second interactive page includes an interactive page that matches the first interactive page. The second interactive page can be multiple interactive pages of at least one application of the terminal. The number of second interactive pages is the same as the number of acquired interactive page images. The second interactive page can be one or more interactive pages. The control cut-picture library includes control cut-pictures for each embedded control in the second interactive page. The control cut-picture library can be provided according to user needs, which can meet the HMI design specifications. Each embedded control in the second interactive page can correspond to a control cut-picture in the control cut-picture library.

[0113] In an embodiment of the present application, the second interaction page includes an interaction page that matches the first interaction page. It can be understood that the second interaction page includes an interaction page whose matching threshold with the first interaction page is lower than a preset threshold, that is, the first interaction page can be the same as or have slight differences with one or more interaction pages in the second interaction page.

[0114] For example, the second interaction page may include all interaction pages of an application A in the terminal, while the first interaction page may be the third interaction page of the application A, and the second interaction page includes interaction pages matching the first interaction page.

[0115] It should be noted that, when the first interactive page is generated according to the interactive page image, the first interactive page is the same as one of the second interactive pages. When the first interactive page is generated according to other information loading, the first interactive page is the same as one of the second interactive pages or has slight differences.

[0116] In S32, the embedding test device identifies all interactive page images based on the control cut-picture of each embeddable control in the control cut-picture library, and can determine all embeddable controls of the second interactive page corresponding to all interactive page images.

[0117] S33, obtaining a preset embedding event associated with at least one embeddable control.

[0118] Here, the preset embedding event associated with each embeddable control in the second interactive page is obtained. In the embodiment of the present application, there are multiple ways to obtain the preset embedding event, which may include but are not limited to obtaining it through the control cutting library when the control cutting library includes the relationship between the control cutting and the preset embedding event, obtaining it from the preset embedding event library, and obtaining it from the embedding test device according to user input, etc.

[0119] S34, obtaining configuration information based on at least one embeddable control and a preset embeddable event.

[0120] Here, the embedding test device obtains configuration information based on each embeddable control in the second interactive page and its corresponding preset embedding event.

[0121] In the above embodiment, the interactive page image is identified through the control cutting library, the embedded point controls in the interactive page are determined, and the embedded point controls are associated with the preset embedded point events, thereby generating configuration information. In this way, the embedded point controls in the interactive page that meet the user's needs can be determined through the image recognition algorithm, which improves the accuracy and efficiency of identifying the embedded point controls. In addition, the embedded point controls are associated with the embedded point events, so that the embedded point configuration information that meets the user's needs can be obtained.

[0122] It should be noted that, when the interactive page images are all interactive page images of at least one application in a terminal, the configuration information may be embeddable controls in all interactive pages of at least one application in the terminal and the corresponding preset embedding events.

[0123] In the application embodiment, in order to facilitate searching, the configuration information can exist in the form of a database.

[0124] In some embodiments, after S33, S21 may further include:

[0125] When an exception occurs in a embeddable control, exception information is generated.

[0126] Here, the abnormal situation of the embeddable controls may be at least one of the following: the number of embeddable controls is different from the number of control cuts, and there is at least one embeddable control that is not associated with the preset embedding event.

[0127] In the embodiment of the present application, the number of embeddable controls is different from the number of control cuts, which can be understood as the number of embeddable controls equal to the number of control cuts not being determined in the interactive page, that is, the embeddable controls in the interactive page do not match the user's embedding requirements. The situation where the number of embeddable controls is different from the number of control cuts may be that not all control cuts are fully identified.

[0128] Here, the exception information can be used to indicate the abnormal situation of determining the embeddable control. The exception information may include unrecognized control cut-outs and embeddable controls that are not associated with embedding events. Among them, the unrecognized control cut-outs may refer to control cut-outs that do not match the interactive page image. The embeddable control that is not associated with a embedding event may refer to a second control cut-out that is not associated with a preset embedding event.

[0129] In the above embodiment, by generating exception information, the user can be prompted that there is an abnormal situation in the embeddable control in the interactive page, and it is convenient for the user to modify the configuration information according to the exception information so that the configuration information meets the user's expectations.

[0130] In some embodiments, in order to facilitate modification of configuration information, after S33, S21 may further include:

[0131] Based on at least one embeddable control and a preset embeddable event, a embeddable configuration page corresponding to the second interactive page is generated.

[0132] Here, the embedding configuration page is a static page of the second interactive page, wherein the embedding control after the embedding configuration page can be operated. After the embedding control is selected, the preset embedding event corresponding to the embedding control can be displayed.

[0133] In the above embodiment, by visually displaying the controls that can be embedded, it is convenient for users to check whether the controls for setting the embedding points are correct.

[0134] In some embodiments, in order to quickly modify the configuration information, after generating the embedding configuration page corresponding to the second interactive page, the S21 further includes:

[0135] Update the configuration information based on the modification information on the tracking point configuration page.

[0136] Here, the modification information may include at least one of the following information: modification information of a page area and modification information of a buried event. The modification information of a page area may refer to information about modifying a certain area in an interactive page, for example, information about modifying a control area.

[0137] Optionally, the modification information of the embedding event may refer to adding an embedding event so that each embeddable control has a corresponding preset embedding event.

[0138] In an embodiment of the present application, the modification information of the tracking point configuration page can be determined based on the user's modification operation.

[0139] In an embodiment of the present application, updating configuration information may refer to updating the embeddable controls of the configuration information and their corresponding preset embeddable events.

[0140] In the above embodiment, the configuration information can be updated by modifying the embedding configuration page, which can make the embedding configuration in the interactive page more perfect and facilitate users to change the configuration information.

[0141] In some embodiments, S32, identifying at least one interactive page image according to the control cut-image library, and determining at least one embeddable control in the second interactive page corresponding to the at least one interactive page image, can be specifically performed as follows:

[0142] Determining, according to each first control slice in the control slice library, layout parameters of at least one second control slice in the interactive image;

[0143] Based on the layout parameters of at least one second control cut image, at least one embeddable control in the second interactive page corresponding to the interactive page image is determined.

[0144] Here, the first control cut image is a control cut image of a preset embeddable control in the second interactive page. One second control cut image corresponds to one first control cut image. The second control cut image is an image that matches the first control cut image in the interactive page image. Figure 1 One to one correspondence.

[0145] In an embodiment of the present application, the layout parameters may include the relative position and relative size of the second control cut in the interactive page image. For example, the relative position and relative size of the second control cut are 10 units from the left border of the interactive page, 30 units from the upper border of the interactive page, the height of the control is 40 units, and the width of the control is 50 units.

[0146] Optionally, the embedded point testing device can use an image recognition algorithm to determine the layout parameters of at least one second control cut image in each interactive image based on each first control cut image in the control cut image library.

[0147] In one example, the embedded point testing device can search for an image area in the interactive page image that matches the shape parameters and pixel values ​​of each first control cut in the control cut library, determine the image area as the second control cut corresponding to the first control cut, and determine the position parameters and size parameters of the image area as the layout parameters of the second control cut in the interactive page image.

[0148] Here, the layout parameters of the second control cut are the layout parameters of the embeddable controls corresponding to the second control cut in the second interactive page. The embedding test device can determine the embeddable controls corresponding to the second control cut in the second interactive page based on the layout parameters of the second control cut.

[0149] In the above embodiment, by using the control cut-picture in the control cut-picture library to identify the layout parameters of the embeddable controls on the interactive page, the accuracy and efficiency of identifying the embeddable controls can be improved, so that the embeddable controls can meet user needs.

[0150] In some embodiments, based on different data collection purposes, some buried point data must be analyzed, and some buried point data may not be analyzed. Therefore, in order to quickly distinguish the type of buried point data, the configuration information library also includes a first identifier corresponding to a preset buried point event.

[0151] In the embodiment of the present application, the first identifier can be used to identify whether the buried point data is useful. For example, the first identifier can be "Y" or "N", "Y" indicates that the buried point data is useful, and "N" indicates that the buried point data is useless.

[0152] It is understandable that whether the buried data is useful may refer to whether the buried data is required by the user, or whether it is the data required for the normal interaction page of the analysis terminal, etc.

[0153] In an embodiment of the present application, the first identifier can be obtained through user input, or by identifying a control that can be embedded, or by other means. For example, the first identifier is obtained by identifying the importance of the control that can be embedded, the type of control, or a preset embedding event. Here, there is no restriction on the method of obtaining the first identifier.

[0154] In some embodiments, S14, obtaining a first burying point test result based on the first burying point data may include:

[0155] When the first identifier indicates that the first buried point data is useful, a first buried point test result is obtained based on the first buried point data.

[0156] Here, the buried point test device determines the first identifier corresponding to the first buried point event from the configuration information library, and based on the first identifier, it can determine whether the first buried point data corresponding to the first buried point event is useful. When the first identifier indicates that the first buried point data is useful, the buried point test device parses the first buried point data to obtain the first buried point test result.

[0157] Here, the steps of parsing the first buried point data are similar to those in the aforementioned embodiment and will not be repeated here for the sake of brevity.

[0158] In the above embodiment, when the first identifier indicates that the buried point data is useful, the buried point data can be analyzed to obtain effective buried point test results, thereby improving the accuracy of the buried point test.

[0159] In some embodiments, at S13, after calling a first event processing function corresponding to the first burying point event in the configuration information library to obtain first burying point data of the first control, the burying point testing method further includes:

[0160] When the first identifier indicates that the first burying point data is useless, counting the number of times the first burying point event occurs within a preset time period;

[0161] Based on the number of events, the second buried point test result is obtained.

[0162] Here, the preset time period can be a time period of any length. For example, the preset time period can be 24 hours. The second buried point test result can be used to indicate whether the user's test operation within the preset time period is a valid test operation. In other words, the second buried point test result can be used to indicate whether the buried point data generated for the user's test operation within the preset time period can be used to analyze whether the terminal is normal.

[0163] When the first identifier indicates that the first buried point data is useless, the buried point test device can discard the first buried point data and count the number of events of the first buried point event within the preset time period. The buried point test device analyzes the number of events to determine whether the first test operation is valid within the preset time period, thereby obtaining the second test result.

[0164] Optionally, obtaining a second tracking point test result based on the number of events may include:

[0165] When the number of events is greater than the preset number of times, it is determined that the second test result indicates that the test operations of the user within the preset time period are all valid test operations.

[0166] When the number of events is not greater than the preset number of times, it is determined that the second test result indicates that all the first test operations within the preset time period are invalid test operations.

[0167] Optionally, the preset number of times may be at least 8 times or more.

[0168] In the above embodiment, when the first identifier indicates that the buried point data is useless, whether the test operation is valid within the preset time period is determined based on the number of times the event occurs, thereby avoiding the analysis of invalid buried point data and reducing the computational burden.

[0169] Figure 4 A flow chart of another method for embedding a test provided by an embodiment of the present application is shown. In some embodiments, in order to promptly detect abnormalities in the interactive page, such as Figure 4 As shown, in S11, after receiving the first test operation of the user on the first control in the first interactive page, the tracking point testing method also includes S41 to S44.

[0170] S41, receiving a second test operation from the user on a second control in the first interactive page.

[0171] Here, the second control is a embeddable control that is not in the configuration information library. The second control may include but is not limited to page controls such as buttons, horizontal sliders, vertical sliders, data links, and operation links. The second test operation may be an input operation for the second control, and the second test operation may include but is not limited to control operations such as clicking, dragging, zooming in and out.

[0172] S42, in response to the second test operation, obtaining a second burying point event corresponding to the second test operation.

[0173] Here, the second embedding event is a preset embedding event corresponding to the third control in the configuration information library, wherein the third control is a embeddable control of the same control type as the second control.

[0174] Specifically, in S42, the embedding point testing device detects whether the second control is a embeddable control in the configuration information library. In the case that the second control is not an embeddable control in the configuration information library, the embedding point testing device searches the configuration information library for an embeddable control of the same control type as the second control, that is, the third control, and then searches for a preset embedding point event corresponding to the third control, a preset embedding point event of the same type as the operation event corresponding to the second test operation, and uses the preset embedding point event as the second embedding point event.

[0175] S43, calling the second event processing function corresponding to the second embedding event in the configuration information library to obtain the second embedding data of the second control.

[0176] Here, S43 is similar to S13 method, and for the sake of brevity, it will not be repeated here.

[0177] S44, based on the second burying point data, obtain a third burying point test result.

[0178] Here, the second buried point data can be statistical data when the second test operation is executed. The third buried point test result is used to indicate abnormal information existing in the first interactive page. Since the second control is no longer configured in the information library, the second control is an abnormal control of the first interactive page, so the second buried point data is also abnormal buried point data, and the third buried point test result obtained based on the second buried point data can be used to indicate that there is an abnormality in the first interactive page.

[0179] Optionally, in S44, the tracking point test device analyzes the second tracking point data to obtain the specific content of the second tracking point event, thereby generating a third tracking point test result. In this way, the abnormal information of the first interactive page can be further understood through the third tracking point test result.

[0180] In the above embodiment, during the tracking point test, when there is an abnormal tracking point control on the interactive page, that is, when the control under test is no longer in the configuration information library, the tracking point control information of the same type as the abnormal tracking point control in the configuration information library is called, so that the tracking point event processing function of the abnormal tracking point control can be configured separately. And, based on the abnormal tracking point data, a tracking point test result indicating that there is an abnormality in the interactive page can be obtained.

[0181] Based on the same technical concept as the above-mentioned buried point testing method, an embodiment of the present application also provides a buried point testing device. Figure 5 A schematic diagram of the structure of a buried point test device provided in an embodiment of the present application is shown as follows: Figure 5 As shown, the buried point testing device 50 may include:

[0182] The first receiving module 51 is used to receive a first test operation of a user on a first control in a first interactive page.

[0183] The first acquisition module 52 is used to obtain a first burying event corresponding to the first test operation in response to the first test operation.

[0184] The first calling module 53 is used to call the first event processing function corresponding to the first burying point event in the configuration information library to obtain the first burying point data of the first control.

[0185] The first result obtaining module 54 is used to obtain a first buried point test result based on the first buried point data, and the first buried point test result is used to indicate whether the first interactive page is normal.

[0186] In the above embodiment, in response to the user's first test operation on the first control in the first interactive page, it is possible to obtain a buried point event corresponding to the first test operation, call the first event processing function corresponding to the first buried point event in the configuration information library, obtain the first buried point data of the first control, and obtain the first buried point test result based on the first buried point data. In this way, based on the configuration information library, during the buried point test process, the event processing function corresponding to the buried point event can be separately configured to obtain the buried point data, so that the buried point test can be completed while the terminal version test is being performed, thereby reducing the number of terminal tests, shortening the test cycle, and avoiding repeated terminal test operations.

[0187] In some embodiments, the buried point testing device 50 further includes:

[0188] A second acquisition module is used to acquire configuration information before calling the first event processing function corresponding to the first embedding event in the configuration information table to obtain the first embedding data of the first control, wherein the configuration information includes preset embedding events of the embeddable control;

[0189] A configuration module, used to configure an event processing function corresponding to a preset embedding event based on the preset embedding event in the configuration information;

[0190] The generation module is used to generate a configuration information library based on the configuration information and the event processing function.

[0191] In some embodiments, the second acquisition module includes:

[0192] A first acquisition submodule acquires at least one interactive page image;

[0193] A determination submodule is provided, wherein at least one interactive page image is identified according to a control cut-image library, and at least one embeddable control in a second interactive page corresponding to the at least one interactive page image is determined, wherein the control cut-image library contains control cut-images of each embeddable control in the second interactive page, and the second interactive page includes an interactive page that matches the first interactive page;

[0194] A second acquisition submodule is used to acquire a preset embedding event associated with at least one embeddable control;

[0195] A submodule is obtained, which is used to obtain configuration information based on at least one embeddable control and a preset embedding event.

[0196] In some embodiments, the first result obtaining module 54 is specifically used to configure the information library to also include a first identifier corresponding to a preset buried point event. When the first identifier indicates that the first buried point data is useful, a first buried point test result is obtained based on the first buried point data.

[0197] In some embodiments, the buried point testing device 50 further includes:

[0198] A statistics module, for, after calling a first event processing function corresponding to a first burying point event in a configuration information library and obtaining first burying point data of a first control, counting the number of events of the first burying point event occurring within a preset time period when a first identifier indicates that the first burying point data is useless;

[0199] The second result obtaining module is used to obtain a second buried point test result based on the number of events, and the second buried point test result is used to indicate whether the user's test operation within a preset time period is a valid test operation.

[0200] In some embodiments, the buried point testing device 50 further includes:

[0201] A second receiving module is used to receive a second test operation of the user on a second control in the first interactive page, where the second control is a embeddable control that is not in the configuration information library;

[0202] A third acquisition module is used to obtain a second burying point event corresponding to the second test operation in response to the second test operation, where the second burying point event is a preset burying point event corresponding to a third control in the configuration information library, and the third control is a burying point control of the same control type as the second control;

[0203] A second calling module is used to call a second event processing function corresponding to a second burying point event in a configuration information library to obtain second burying point data of a second control;

[0204] The third result obtaining module is used to obtain a third buried point test result based on the second buried point data, and the third buried point test result is used to indicate that there is an abnormality in the first interactive page.

[0205] Based on the same technical concept as the aforementioned buried point testing method, an embodiment of the present application also provides a computer device. Figure 6 A schematic diagram of the hardware structure of a computer device provided by the present application is shown.

[0206] like Figure 6As shown, the electronic device may include a processor 61 and a memory 62 storing computer program instructions.

[0207] Specifically, the processor 61 may include a central processing unit (CPU), or an application specific integrated circuit (ASIC), or may be configured to implement one or more integrated circuits of the embodiments of the present application.

[0208] The memory 62 may include a large capacity memory for data or instructions. By way of example and not limitation, the memory 62 may include a hard disk drive (HDD), a floppy disk drive, a flash memory, an optical disk, a magneto-optical disk, a magnetic tape, or a universal serial bus (USB) drive or a combination of two or more of these. In appropriate cases, the memory 62 may include a removable or non-removable (or fixed) medium. In appropriate cases, the memory 62 may be inside or outside the integrated gateway disaster recovery device. In a specific embodiment, the memory 62 is a non-volatile solid-state memory.

[0209] The memory 62 may include a read-only memory (ROM), a random access memory (RAM), a magnetic disk storage media device, an optical storage media device, a flash memory device, an electrical, optical or other physical / tangible memory storage device. Thus, typically, the memory includes one or more tangible (non-transitory) computer-readable storage media (e.g., a memory device) encoded with software including computer-executable instructions, and when the software is executed (e.g., by one or more processors), it is operable to perform the operations described with reference to the method according to an aspect of the present application.

[0210] The processor 61 implements any one of the buried point testing methods in the above embodiments by reading and executing computer program instructions stored in the memory 62.

[0211] In one example, the computer device may further include a communication interface 63 and a bus 64. Figure 6 As shown, the processor 61, the memory 62, and the communication interface 63 are connected via a bus 64 and communicate with each other.

[0212] The communication interface 63 is mainly used to implement communication between various modules, devices, units and / or equipment in the embodiments of the present application.

[0213] Bus 64 includes hardware, software or both, and the parts of electronic equipment are coupled to each other. For example, but not limitation, bus may include accelerated graphics port (AGP) or other graphics bus, enhanced industrial standard architecture (EISA) bus, front side bus (FSB), hypertransport (HT) interconnection, industrial standard architecture (ISA) bus, infinite bandwidth interconnection, low pin count (LPC) bus, memory bus, micro channel architecture (MCA) bus, peripheral component interconnection (PCI) bus, PCI- Express (PCI-X) bus, serial advanced technology attachment (SATA) bus, video electronics standard association local (VLB) bus or other suitable bus or two or more of these combinations. In appropriate cases, bus 64 may include one or more buses. Although the present application embodiment describes and shows a specific bus, the present application considers any suitable bus or interconnection.

[0214] The electronic device can implement the method in the embodiment of the present application to achieve the combination Figure 1 to Figure 5 The invention describes a buried point testing method and a device.

[0215] In addition, in combination with the embedding test method in the above embodiment, the embodiment of the present application can provide a computer storage medium for implementation. The computer storage medium stores computer program instructions; when the computer program instructions are executed by a processor, any one of the embedding test methods in the above embodiment is implemented.

[0216] In addition, in combination with the tracking test method in the above-mentioned embodiment, an embodiment of the present application provides a computer program product, including a computer program or instructions, which implements any one of the tracking test methods in the above-mentioned embodiments when the computer program or instructions are executed by a processor.

[0217] It should be clear that the present application is not limited to the specific configuration and processing described above and shown in the figures. For the sake of simplicity, a detailed description of the known method is omitted here. In the above embodiments, several specific steps are described and shown as examples. However, the method process of the present application is not limited to the specific steps described and shown, and those skilled in the art can make various changes, modifications and additions, or change the order between the steps after understanding the spirit of the present application.

[0218] The functional blocks shown in the above-described block diagram can be implemented as hardware, software, firmware or a combination thereof. When implemented in hardware, it can be, for example, an electronic circuit, an application specific integrated circuit (ASIC), appropriate firmware, a plug-in, a function card, etc. When implemented in software, the elements of the present application are programs or code segments that are used to perform the required tasks. The program or code segment can be stored in a machine-readable medium, or transmitted on a transmission medium or a communication link by a data signal carried in a carrier wave. "Machine-readable medium" can include any medium capable of storing or transmitting information. Examples of machine-readable media include electronic circuits, semiconductor memory devices, ROM, flash memory, erasable ROM (EROM), floppy disks, CD-ROMs, optical disks, hard disks, optical fiber media, radio frequency (RF) links, etc. The code segment can be downloaded via a computer network such as the Internet, an intranet, etc.

[0219] It should also be noted that the exemplary embodiments mentioned in this application describe some methods or systems based on a series of steps or devices. However, this application is not limited to the order of the above steps, that is, the steps can be performed in the order mentioned in the embodiment, or in a different order from the embodiment, or several steps can be performed simultaneously.

[0220] The above referenced the flowcharts and / or block diagrams of the buried point test methods, devices, computer equipment, computer storage media and computer program products according to the embodiments of the present application, described various aspects of the present application. It should be understood that each box in the flowchart and / or block diagram and the combination of each box in the flowchart and / or block diagram can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device to produce a machine so that these instructions executed by the processor of the computer or other programmable data processing device enable the implementation of the functions / actions specified in one or more boxes of the flowchart and / or block diagram. Such a processor can be, but is not limited to, a general-purpose processor, a special-purpose processor, a special application processor or a field programmable logic circuit. It can also be understood that each box in the block diagram and / or flowchart and the combination of boxes in the block diagram and / or flowchart can also be implemented by dedicated hardware that performs a specified function or action, or can be implemented by a combination of dedicated hardware and computer instructions.

[0221] The above is only a specific implementation of the present application. Those skilled in the art can clearly understand that for the convenience and simplicity of description, the specific working processes of the systems, modules and units described above can refer to the corresponding processes in the aforementioned method embodiments, and will not be repeated here. It should be understood that the protection scope of the present application is not limited to this. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed in this application, and these modifications or replacements should be included in the protection scope of this application.

Claims

1. A buried point testing method, characterized in that: include: Receiving a first test operation of a user on a first control in a first interactive page; In response to the first test operation, obtaining a first tracking event corresponding to the first test operation; Obtain configuration information, wherein the configuration information includes preset tracking events of tracking controls; Based on the preset tracking event in the configuration information, configure an event processing function corresponding to the preset tracking event; Based on the configuration information and the event processing function, generate a configuration information library; Calling a first event processing function corresponding to the first buried point event in a configuration information library to obtain first buried point data of the first control; Based on the first embedding data, a first embedding test result is obtained, where the first embedding test result is used to indicate whether the first interactive page is normal; The obtaining of configuration information includes: Obtaining at least one interactive page image; Identify the at least one interactive page image according to the control cut-picture library, determine at least one embeddable control in a second interactive page corresponding to the at least one interactive page image, the control cut-picture library contains control cut-pictures of each embeddable control in the second interactive page, and the second interactive page includes an interactive page that matches the first interactive page; Obtaining a preset tracking event associated with the at least one tracking control; Configuration information is obtained based on the at least one embeddable control and the preset embedding event.

2. The method according to claim 1, characterized in that: The configuration information library also includes a first identifier corresponding to the preset burying point event, and obtaining a first burying point test result based on the first burying point data includes: When the first identifier indicates that the first buried point data is useful, a first buried point test result is obtained based on the first buried point data.

3. The method according to claim 2, characterized in that After obtaining the first burying point data of the first control by calling the first event processing function corresponding to the first burying point event in the configuration information library, the method further includes: When the first identifier indicates that the first burying point data is useless, counting the number of times the first burying point event occurs within a preset time period; Based on the number of events, a second buried point test result is obtained, and the second buried point test result is used to indicate whether the user's test operation within the preset time period is a valid test operation.

4. The method according to any one of claims 1 to 3, characterized in that: After receiving a first test operation of the user on the first control in the first interactive page, the method further includes: Receiving a second test operation of the user on a second control in the first interactive page, where the second control is a embeddable control that is not in the configuration information library; In response to the second test operation, a second burying event corresponding to the second test operation is obtained, where the second burying event is a preset burying event corresponding to a third control in the configuration information library, and the third control is a buryable control of the same control type as the second control; Calling a second event processing function corresponding to the second buried point event in the configuration information library to obtain second buried point data of the second control; Based on the second buried point data, a third buried point test result is obtained, and the third buried point test result is used to indicate that there is an abnormality in the first interactive page.

5. A buried point testing device, characterized in that: include: A first receiving module, used to receive a first test operation of a user on a first control in a first interactive page; A first acquisition module, configured to acquire, in response to the first test operation, a first tracking event corresponding to the first test operation; A second acquisition module is used to acquire configuration information, wherein the configuration information includes preset embedding events of embeddable controls; A configuration module, configured to configure an event processing function corresponding to a preset embedding event based on the preset embedding event in the configuration information; A generating module, used for generating a configuration information library based on the configuration information and the event processing function; A first calling module, used to call a first event processing function corresponding to the first buried point event in a configuration information library to obtain first buried point data of the first control; A first result obtaining module, used for obtaining a first buried point test result based on the first buried point data, wherein the first buried point test result is used for indicating whether the first interactive page is normal; Wherein, the second acquisition module includes: A first acquisition submodule, used to acquire at least one interactive page image; A determination submodule, configured to identify the at least one interactive page image according to a control cut-picture library, and determine at least one embeddable control in a second interactive page corresponding to the at least one interactive page image, wherein the control cut-picture library contains control cut-pictures of each embeddable control in the second interactive page, and the second interactive page includes an interactive page that matches the first interactive page; A second acquisition submodule is used to acquire a preset burying event associated with the at least one buryable control; A submodule is obtained, which is used to obtain configuration information based on the at least one embeddable control and the preset embedding event.

6. A computer device, characterized in that: The device comprises: a processor and a memory storing computer program instructions; When the processor executes the computer program instructions, the buried point testing method as described in any one of claims 1 to 4 is implemented.

7. A computer storage medium, characterized in that: The computer storage medium stores computer program instructions, and when the computer program instructions are executed by the processor, the buried point testing method as described in any one of claims 1-4 is implemented.

8. A computer program product comprising a computer program or instructions, characterized in that When the computer program or instruction is executed by the processor, the buried point testing method as described in any one of claims 1-4 is implemented.

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