Data processing method, device, equipment and medium based on data structure model

Abstract

The present application provides a data processing method, device, equipment and medium based on a data structure model, which is applied to the field of production process control technology. The method includes establishing three-layer data models based on statistical process control system judgment rules, control chart types and data parameter names; determining the update logic corresponding to each layer of the data model in the three-layer data model; obtaining modification data for the target layer data judgment rule model in the three-layer data model; modifying the target layer data judgment rule model in the three-layer data model based on the modification data, and updating the three-layer data model according to the update logic corresponding to the target layer data judgment rule model; and making compliance judgments on the process control parameters in the production process according to the updated three-layer data model. The present application sets judgment rules in the three-layer data model, and can refine the judgment rules when one judgment rule is applied to the judgment process of different products to meet different judgment requirements.

Description

Technical Field

[0001] The present application relates to the technical field of production process control, and in particular to a data processing method, device, equipment and medium based on a data structure model. Background Art

[0002] In modern manufacturing, companies use Manufacturing Execution System (MES) and Statistical Process Control (SPC) systems to assist production and quality departments in monitoring and controlling production quality.

[0003] Statistical process control systems generally collect data according to the manufacturing execution system or equipment automation system, and calculate a number of statistical values ​​based on the collected data, such as: mean, maximum, minimum, range, median, standard deviation and other statistical parameters, and then make rule judgments based on the calculated sample parameters; however, the current binding relationship between manufacturing production processes and data models is too simple to meet the requirements of the process department and the quality department for refined management of manufactured products during the manufacturing process. Summary of the invention

[0004] In view of this, an embodiment of the present application provides a data processing method based on a data structure model, and establishes management and control rules and mechanisms of the statistical process control system according to the statistical process control system judgment rules, thereby realizing easy-to-operate rule configuration and flexible control of the production quality range affected by the product.

[0005] In a first aspect, an embodiment of the present application provides a data processing method based on a data structure model, the method comprising:

[0006] Based on the industry standard statistical process control system judgment rules, control chart types and data parameter names, the first layer data judgment rule model, the second layer data judgment rule model and the third layer data judgment rule model in the three-layer data model are established respectively;

[0007] Determine the update logic corresponding to each layer of the three-layer data model;

[0008] Acquire modification data of the target layer data determination rule model in the three-layer data model;

[0009] Modifying the target layer data determination rule model in the three-layer data model based on the modification data, and updating the three-layer data model according to the update logic corresponding to the target layer data determination rule model;

[0010] Compliance determination is performed on process control parameters during the production process based on the updated three-layer data model.

[0011] In one embodiment of the present application, based on the industry standard statistical process control system judgment rules, control chart types and data parameter names, the first layer data judgment rule model, the second layer data judgment rule model and the third layer data judgment rule model in the three-layer data model are respectively established, including:

[0012] Create the first-level data judgment rule model based on the industry standard statistical process control system judgment rules;

[0013] Based on the standard of the first-level data judgment rule model, it is decomposed into the second-level data judgment rule model according to the type of control chart;

[0014] On the basis of the second-layer data judgment rule model based on the control chart type, it is decomposed into the third-layer data judgment rule model according to the data parameter name.

[0015] In an embodiment of the present application, determining the update logic corresponding to each layer of the data model in the three-layer data model includes:

[0016] The update logic corresponding to the first-layer data determination rule model is: if the first-layer data determination rule model in the three-layer data model is changed, then based on the modified first-layer data determination rule model, the second-layer data determination rule model and the third-layer data determination rule model subordinate to the first-layer data determination rule model are changed;

[0017] The update logic corresponding to the second-layer data judgment rule model is: if the second-layer data judgment rule model in the three-layer data model is changed, then based on the modified second-layer data judgment rule model, the third-layer data judgment rule model subordinate to the second-layer data judgment rule model is changed, and the first-layer data judgment rule model is not changed.

[0018] The update logic corresponding to the third-layer data determination rule model is: if the third-layer data determination rule model in the three-layer data model is changed, the third-layer data determination rule model is modified, and the first-layer data determination rule model and the second-layer data determination rule model are not changed.

[0019] In an embodiment of the present application, obtaining modification data of the target layer data determination rule model in the three-layer data model includes:

[0020] Obtain data to modify the number of checkpoints in the control rules in the target layer data judgment rule model or to modify the number of points exceeded.

[0021] In an embodiment of the present application, compliance determination of process control parameters in the production process is performed according to the updated three-layer data model, further comprising:

[0022] Determine a data determination rule model for making compliance determinations on data parameters of process control in the production process in the updated three-layer data model;

[0023] The measured values ​​corresponding to the process control data parameters are input into the third layer data judgment rule model to obtain the output judgment result.

[0024] In a second aspect, an embodiment of the present application further provides a data processing device based on a data structure model, the device comprising:

[0025] Establishing modules for establishing the first layer data determination rule model, the second layer data determination rule model and the third layer data determination rule model in the three-layer data model based on the industry standard statistical process control system determination rules, control chart types and data parameter names;

[0026] A determination module, used to determine the update logic corresponding to each layer of the data model in the three-layer data model;

[0027] A modification module, used for obtaining modification data of the target layer data determination rule model in the three-layer data model;

[0028] A logic module, used to modify the target layer data determination rule model in the three-layer data model based on the modification data, and update the three-layer data model according to the update logic corresponding to the target layer data determination rule model;

[0029] A determination module is used to make compliance determinations on process control parameters in the production process according to the updated three-layer data model.

[0030] In combination with the second aspect, the embodiment of the present application provides a first possible implementation of the second aspect, wherein the establishment module specifically includes:

[0031] A first model unit, for creating a first-layer data determination rule model based on industry standard statistical process control system determination rules;

[0032] The second model unit is used to decompose the first-layer data determination rule model into a second-layer data determination rule model based on the standard of the first-layer data determination rule model and according to the control chart type;

[0033] The third model unit is used to decompose the second layer data judgment rule model based on the control chart type into a third layer data judgment rule model according to the data parameter name.

[0034] In combination with the second aspect, the embodiment of the present application provides a second possible implementation of the second aspect, wherein the logic module specifically includes:

[0035] The first logic unit is used for the update logic corresponding to the first-layer data determination rule model: if the first-layer data determination rule model in the three-layer data model is changed, then based on the modified first-layer data determination rule model, the second-layer data determination rule model and the third-layer data determination rule model subordinate to the first-layer data determination rule model are changed;

[0036] The second logic unit is used for the update logic corresponding to the second-layer data determination rule model: if the second-layer data determination rule model in the three-layer data model is changed, then based on the modified second-layer data determination rule model, the third-layer data determination rule model subordinate to the second-layer data determination rule model is changed, and the first-layer data determination rule model is not changed;

[0037] The third logic unit is used for the update logic corresponding to the third-layer data judgment rule model: if the third-layer data judgment rule model in the three-layer data model is changed, the third-layer data judgment rule model is modified, and the first-layer data judgment rule model and the second-layer data judgment rule model are not changed.

[0038] In a third aspect, an embodiment of the present application further provides a computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements steps of a data processing method based on a data structure model when executing the computer program.

[0039] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, steps of a data processing method based on a data structure model are executed.

[0040] The embodiments of the present application provide a data processing method, apparatus, device and medium based on a data structure model, and establish management and control rules and mechanisms of a statistical process control system according to the statistical process control system judgment rules, thereby achieving easy-to-operate rule configuration and flexible control of the production quality range affected by the product.

[0041] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0043] Figure 1 A schematic flow chart of a data processing method based on a data structure model provided in an embodiment of the present application is shown.

[0044] Figure 2 A schematic diagram of a process for establishing a three-layer data model in another data processing method based on a data structure model provided in an embodiment of the present application is shown.

[0045] Figure 3 A structural schematic diagram of the first-layer data determination rule model in the data processing method based on the data structure model provided in an embodiment of the present application is shown.

[0046] Figure 4 A structural schematic diagram of the second-layer data determination rule model in the data processing method based on the data structure model provided in an embodiment of the present application is shown.

[0047] Figure 5 A structural schematic diagram of the third-layer data determination rule model in the data processing method based on the data structure model provided in an embodiment of the present application is shown.

[0048] Figure 6 A schematic diagram of a flow chart for determining the eligibility of data parameters in another data processing method based on a data structure model provided in an embodiment of the present application is shown.

[0049] Figure 7 A flow chart of an application example of another data processing method based on a data structure model provided in an embodiment of the present application is shown.

[0050] Figure 8 A structural schematic diagram of a data processing device based on a data structure model provided in an embodiment of the present application is shown.

[0051] Fig. 9 A schematic diagram of the structure of a computer device provided in an embodiment of the present application is shown. DETAILED DESCRIPTION

[0052] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. The components of the embodiments of the present application generally described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present application.

[0053] Considering that the binding relationship between product manufacturing process and data model is too simple at the current stage, based on this, the embodiment of the present application provides a data processing method and device based on the data structure model, which is described below through embodiments.

[0054] A flow chart of a data processing method based on a data structure model provided in an embodiment of the present application; Figure 1 As shown, the specific steps include:

[0055] Step S10, based on the industry standard statistical process control system judgment rules, control chart types and data parameter names, respectively establish the first layer data judgment rule model, the second layer data judgment rule model and the third layer data judgment rule model in the three-layer data model.

[0056] In the specific implementation of step S10, the determination rule of the above statistical process control system can be the Western Electric Rule or the Nielsen Rule. In this embodiment, the Western Electric Rule (such as WE1-WE8) is adopted. The determination rule set in the statistical process control system can be any of the following:

[0057] Decision rule WE1: Single point exceeds the control limit;

[0058] Judgment rule WE2: 9 consecutive points are located on one side of the center line;

[0059] Judgment rule WE3: 6 points rise or fall continuously;

[0060] Judgment rule WE4: 14 consecutive points rise or fall alternately;

[0061] Judgment rule WE5: 2 of the 3 consecutive points are located outside 2 standard deviations on the same side of the center line;

[0062] Judgment rule WE6: 4 out of 5 consecutive points are located outside 1 standard deviation on the same side of the center line;

[0063] Judgment rule WE7: 15 consecutive points are located outside 1 standard deviation on both sides of the center line;

[0064] Judgment rule WE8: 8 consecutive points are located outside 1 standard deviation on both sides of the center line.

[0065] Control chart types include: average value chart, Sigma chart, Raw box chart, etc.; data parameter names include: wafer thickness (Thickness), dust particle size (Particle), etc.

[0066] In the above steps, the statistical process control system establishes a three-layer data model through the first-layer data judgment rule model, the second-layer data judgment rule model and the third-layer data judgment rule model, which can meet the data maintenance of each layer and increase the configuration flexibility of the judgment rules of the statistical process control system. The judgment rules are modified for the first-layer data judgment rule model, the second-layer data judgment rule model and the third-layer data judgment rule model respectively. When a judgment rule is applied to the judgment process of different products, the judgment rule can be refined to meet different judgment requirements in the production process and flexibly control the affected scope.

[0067] Step S20, determining the update logic corresponding to each layer of the three-layer data model.

[0068] During the specific implementation of step S20, the update logic corresponding to the first-layer data determination rule model is as follows: if the first-layer data determination rule model in the three-layer data model is changed, then based on the modified first-layer data determination rule model, the second-layer data determination rule model and the third-layer data determination rule model subordinate to the first-layer data determination rule model are changed; the update logic corresponding to the second-layer data determination rule model is as follows: if the second-layer data determination rule model in the three-layer data model is changed, then based on the modified second-layer data determination rule model, the third-layer data determination rule model subordinate to the second-layer data determination rule model is changed, and the first-layer data determination rule model is not changed; the update logic corresponding to the third-layer data determination rule model is as follows: if the third-layer data determination rule model in the three-layer data model is changed, then the third-layer data determination rule model is modified, and the first-layer data determination rule model and the second-layer data determination rule model are not changed.

[0069] Step S30, obtaining modification data of the target layer data determination rule model in the three-layer data model.

[0070] In the specific implementation of step S30, the modified data is data for modifying the checkpoints of the judgment rules in the first layer data judgment rule model, the second layer data judgment rule model or the third layer data judgment rule model in the three-layer data model or the number of excess points exceeding the judgment rules according to the product manufacturing requirements. For example, the checkpoints of the judgment rules are modified, and the content is as follows:

[0071] For example: the number of consecutive 8 checkpoints in the judgment rule WE8 of the first-layer data judgment rule model is modified to the number of consecutive 5 checkpoints. After the first-layer data judgment rule model is modified, according to the update logic corresponding to each layer of the data model, based on the modified first-layer data judgment rule model, the second-layer data judgment rule model and the third-layer data judgment rule model subordinate to the first-layer data judgment rule model are changed. Therefore, the judgment rules based on the modified first-layer data judgment rule model have a great impact on product manufacturing quality control, and also affect the modification scope of the second-layer data judgment rule model and the third-layer data judgment rule model.

[0072] If the number of consecutive 8 checkpoints in the judgment rule XBARWE8 in the second-layer data judgment rule model is modified to a number of consecutive 5 checkpoints, after the second-layer data judgment rule model is modified, according to the update logic corresponding to each layer of data model, the third-layer data judgment rule model subordinate to the second-layer data judgment rule model is changed based on the modified second-layer data judgment rule model; therefore, the influence of the judgment rules based on the modified second-layer data model on product manufacturing quality control is less than that of modifying the first-layer data judgment rule model, which only affects the judgment rules in the next-layer data judgment rule model;

[0073] If the number of consecutive checkpoints of 8 points in the judgment rule in the third-layer data judgment rule model is modified to the number of consecutive checkpoints of 5 points, the first-layer data judgment rule model and the second-layer data judgment rule model will not be updated. The impact of modifying the number of checkpoints in the third-layer data structure model on product manufacturing quality control is very small.

[0074] Step S40, modifying the target layer data determination rule model in the three-layer data model based on the modification data, and updating the three-layer data model according to the update logic corresponding to the target layer data determination rule model.

[0075] When step S40 is specifically implemented, based on the modified data, the first layer data determination rule model, the second layer data determination rule model and the third layer data determination rule model included in the target layer data determination rule model are respectively updated;

[0076] When the target layer data determination model is the first layer data determination rule model, the model is modified according to the update logic of the first layer data determination rule in the three-layer data model, wherein the update logic corresponding to the first layer data determination rule model is: if the first layer data determination rule model in the three-layer data model is modified, then based on the modified first layer data determination rule model, the second layer data determination rule model and the third layer data determination rule model subordinate to the first layer data determination rule model are modified;

[0077] When the target layer data determination model is the second layer data determination rule model, the model is modified according to the update logic of the second layer data determination rule in the third layer data model, wherein the update logic corresponding to the second layer data determination rule model is: if the second layer data determination rule model in the three-layer data model is modified, then based on the modified second layer data determination rule model, the third layer data determination rule model subordinate to the second layer data determination rule model is modified;

[0078] When the target layer data judgment model is the third layer data judgment rule model, changes are made according to the update logic of the first layer data judgment rule in the third layer data model, wherein the update logic corresponding to the third layer data judgment rule model is: if changes are made to the third layer data judgment rule model in the three-layer data model, the third layer data judgment rule model is modified, and the first layer data judgment rule model and the second layer data judgment rule model are not changed.

[0079] Step S50, performing compliance determination on process control parameters in the production process according to the updated three-layer data model.

[0080] When step S50 is implemented, in actual application scenarios, it is often necessary to modify the data in the three-layer data model. Since a large number of engineering verification products need to be put into production in the R&D production line, different engineering verification products need to be controlled by different judgment rules. It is often necessary to use different degrees of strictness to perform differentiated quality management on different products based on the same judgment rule. This solution perfectly solves this series of quality control problems.

[0081] In summary, the data processing method based on the data structure model provided in the embodiment of the present application constructs a hierarchical data model, sets different judgment rules in the model, and flexibly establishes a control mechanism for a statistical process control system. Compared with the control rules in the statistical process control system in the prior art in a one-dimensional data model, the present solution is based on the statistical process control system judgment rules, control chart types and data parameter names of the industry standard, and respectively establishes the first layer data judgment rule model, the second layer data judgment rule model and the third layer data judgment rule model in the three-layer data model. Different judgment rules are set in the established three-layer data model. When each judgment rule is applied to the judgment process of different products, the judgment rule can be refined to meet different judgment requirements in the production process. Based on the corresponding update logic of each layer of the data model in the three-layer data model, the modification data of the selected target layer data judgment rule model can flexibly establish a control mechanism for the statistical process control system, thereby realizing easy-to-operate rule configuration, flexibly controlling the production quality range affected by the product, helping to improve the production quality of the product and the production and operation environment of the enterprise, helping the production process department and the quality management department to control the quality of the product, and reducing the manufacturing cost of the enterprise.

[0082] like Figure 2 As shown, an implementation of step S10 in a data processing method based on a data structure model provided in an embodiment of the present application specifically includes the following contents:

[0083] Step S101 : creating a first-layer data judgment rule model based on industry standard statistical process control system judgment rules.

[0084] In the specific implementation of step S101, based on the statistical process control system judgment rules of the industry standard, the first layer of the three-layer data model is established. Figure 3 As shown, the judgment rules in the first-layer data judgment rule model include rule ID, judgment rules, checkpoint number, exceedance point number, and rule description, wherein the judgment rules of the first-layer data judgment rule model are mainly used to define the basic information that needs to be controlled.

[0085] Step S102, based on the standard of the first layer data determination rule model, decompose it into a second layer data determination rule model according to the control chart type.

[0086] In the specific implementation of step S102, the first-layer data judgment rule model is bound to the control chart type based on the established standard to obtain the second-layer data judgment rule model in the three-layer data model; Figure 4As shown, the second-layer data judgment rule model includes rule ID, control chart type, rule name, number of check points, number of exceedance points, and rule description, wherein the first-layer data judgment rule model is bound to the control chart type on the basis of the standard to generate a new rule ID for the second-layer data judgment rule model.

[0087] Step S103, based on the second layer data determination rule model based on the control chart type, decompose it into a third layer data determination rule model according to the data parameter name.

[0088] In the specific implementation of step S103, the established second-layer data determination rule model is bound to the data parameter name to obtain the third-layer data determination rule model, such as Figure 5 As shown, the third-layer data judgment rule model includes product data parameter serial number, rule ID, data parameter name, check point number, exceedance point number, and rule description.

[0089] For example: a first-layer data judgment rule model is set according to at least one judgment rule in a statistical process control system, and a second-layer data judgment rule model is obtained by binding any one of the judgment rules pre-selected in the first-layer data judgment rule model with the control chart type, and then the second-layer data judgment rule model is bound to the data parameter name of the product manufacturing process to obtain a third-layer data judgment rule model.

[0090] After the above three-layer data model is configured, the three-layer data model of the judgment rule in the statistical process control system has been generated. Engineers modify the data according to the first-layer data judgment rule model, the second-layer data judgment rule model or the third-layer data judgment rule model in the three-layer data model. According to the update logic corresponding to each layer of the data model in the three-layer data model, the scope of the modified data is different.

[0091] like Figure 6 As shown, an implementation of step S50 in a data processing method based on a data structure model provided in an embodiment of the present application specifically includes the following contents:

[0092] Step S501, determining a data determination rule model for making compliance determination on data parameters of process control in the production process in the updated three-layer data model.

[0093] Step S502, inputting the measured values ​​corresponding to the process control data parameters into the third-layer data judgment rule model to obtain the output judgment result.

[0094] During the specific implementation of steps S501 and S502, according to the updated first-layer data judgment rule model, the second-layer data judgment rule model and the third-layer data judgment rule model, the inspection points of the process control parameters are judged according to the pre-selected judgment rules and the set number of inspection points in the data judgment rule model, and the measured values ​​corresponding to the process control data parameters are respectively input into the selected third-layer data judgment rule model to obtain the output judgment results.

[0095] To further illustrate the present solution, the present application provides a specific application embodiment of a data processing method based on a data structure model, such as Figure 7 As shown, it specifically includes the following contents:

[0096] Step 1, start modifying the judgment rule operation in the statistical process control system;

[0097] Step 2: Confirm the scope to be modified: The user confirms the scope affected by the modification of the judgment rule;

[0098] Step 3: Modify the third-layer data determination rule model. If the user only allows the modification to act on the third-layer data determination rule model, that is, the data parameter name of the current corresponding product process, the data of the third-layer data determination rule model is modified;

[0099] Step 4: Modify the second-layer data determination rule model. If the user only allows the modification to act on the second-layer data determination rule model, that is, a specific control chart type, then modify the data of the second-layer data determination rule model;

[0100] Step 5: Modify the first-layer data judgment rule model. If the user requires the modification to be applied to the first-layer data judgment rule model, that is, all control chart types and data parameter names of the judgment rules in the statistical process control system, the data of the first-layer data judgment rule model is modified.

[0101] Step 6: End the operation of modifying the judgment rules in the statistical process control system.

[0102] The above steps modify the data of the first layer data judgment rule model or / and the second layer data judgment rule model or / and the third layer data judgment rule model in the three-layer data model according to the actual business needs of the user, and control the scope affected by the modified judgment rule according to the corresponding update logic of each layer of the data model, so that the user can use one judgment rule to implement different judgment standards with different parameter ranges in different products or data parameter names, so that the three-layer data model of the judgment rule in the statistical process control system is expanded from a single one-dimensional data model to a three-layer data model, making the underlying structure of the data model more flexible and scalable, and based on three different business operation modes, the production process department and the quality management department can control the quality of the product, thereby improving the convenience of the statistical process control system.

[0103] Figure 8 FIG. 6 shows a schematic diagram of a data processing device 60 based on a data structure model provided in an embodiment of the present application. Figure 8 As shown, the device comprises:

[0104] Establishing module 601, for establishing the first layer data determination rule model, the second layer data determination rule model and the third layer data determination rule model in the three-layer data model respectively based on the statistical process control system determination rule, control chart type and data parameter name in the industry standard;

[0105] The logic module 602 is used to determine the update logic corresponding to each layer of the three-layer data model;

[0106] The modification module 603 is used to obtain modification data of the target layer data determination rule model in the three-layer data model;

[0107] The processing module 604 is used to modify the target layer data determination rule model in the three-layer data model based on the modification data, and update the three-layer data model according to the update logic corresponding to the target layer data determination rule model;

[0108] The determination module 605 is used to perform compliance determination on the process control parameters in the production process according to the updated three-layer data model.

[0109] In a feasible implementation scheme, the above-mentioned establishment module specifically includes:

[0110] The first model unit 6011 is used to create a first-layer data judgment rule model based on industry standard statistical process control system judgment rules;

[0111] The second model unit 6012 is used to decompose the first-layer data determination rule model into a second-layer data determination rule model based on the standard of the first-layer data determination rule model and according to the control chart type;

[0112] The third model unit 6013 is used to classify the second-layer data judgment rule model based on the control chart type into a third-layer data judgment rule model according to the data parameter name.

[0113] In a feasible implementation scheme, the above-mentioned device logic module specifically includes:

[0114] The first logic unit 6021 is used for the update logic corresponding to the first-layer data determination rule model: if the first-layer data determination rule model in the three-layer data model is changed, then based on the modified first-layer data determination rule model, the second-layer data determination rule model and the third-layer data determination rule model subordinate to the first-layer data determination rule model are changed;

[0115] The second logic unit 6022 is used for the update logic corresponding to the second-layer data judgment rule model: if the second-layer data judgment rule model in the three-layer data model is changed, then based on the modified second-layer data judgment rule model, the third-layer data judgment rule model subordinate to the second-layer data judgment rule model is changed, and the first-layer data judgment rule model is not changed.

[0116] The third logic unit 6023 is used for the update logic corresponding to the third-layer data judgment rule model: if the third-layer data judgment rule model in the three-layer data model is changed, the third-layer data judgment rule model is modified, and the first-layer data judgment rule model and the second-layer data judgment rule model are not changed.

[0117] When the above-mentioned device is implemented specifically, based on the statistical process control system judgment rules, control chart types and data parameter names of industry standards, the first layer data judgment rule model, the second layer data judgment rule model and the third layer data judgment rule model in the three-layer data model are respectively established, and different judgment rules are set in the established three-layer data model. When each judgment rule is applied to the judgment process of different products, the judgment rule can be refined to meet different judgment requirements in the production process. Based on the update logic corresponding to each layer of the data model in the three-layer data model, the modification data of the selected target layer data judgment rule model can flexibly establish a management and control mechanism of the statistical process control system, thereby realizing easy-to-operate rule configuration, flexibly controlling the production quality range affected by the product, helping to improve the production quality of the product and the production and operation environment of the enterprise, helping the production process department and the quality management department to control the quality of the product, and reducing the manufacturing cost of the enterprise.

[0118] Corresponds to Figure 1 The data processing method based on the data structure model in the present application embodiment further provides a computer device 60, Fig. 9 ,like Fig. 9 As shown, the device includes a memory 701, a processor 702, and a computer program stored in the memory 701 and executable on the processor 702, wherein the processor 702 implements the method when executing the computer program.

[0119] Based on the industry standard statistical process control system judgment rules, control chart types and data parameter names, the first layer data judgment rule model, the second layer data judgment rule model and the third layer data judgment rule model in the three-layer data model are established respectively;

[0120] Determine the update logic corresponding to each layer of the three-layer data model;

[0121] Obtaining modification data of the target layer data determination rule model in the three-layer data model;

[0122] Modify the target layer data determination rule model in the three-layer data model based on the modified data, and update the three-layer data model according to the update logic corresponding to the target layer data determination rule model;

[0123] Compliance determination is performed on process control parameters during the production process based on the updated three-layer data model.

[0124] Corresponds to Figure 1 The data processing method based on the data structure model in the embodiment of the present application also provides a computer-readable storage medium, on which a computer program is stored, and the computer program is executed by a processor to perform the following steps:

[0125] Based on the industry standard statistical process control system judgment rules, control chart types and data parameter names, the first layer data judgment rule model, the second layer data judgment rule model and the third layer data judgment rule model in the three-layer data model are established respectively;

[0126] Determine the update logic corresponding to each layer of the three-layer data model;

[0127] Obtaining modification data of the target layer data determination rule model in the three-layer data model;

[0128] Modify the target layer data determination rule model in the three-layer data model based on the modified data, and update the three-layer data model according to the update logic corresponding to the target layer data determination rule model;

[0129] Compliance determination is performed on process control parameters during the production process based on the updated three-layer data model.

[0130] Based on the above analysis, it can be seen that compared with the overly simple binding relationship between product manufacturing process and data model in related technologies, the data processing method based on the data structure model provided in the embodiment of the present application sets judgment rules in the three-layer data model respectively, so as to realize the use of specific tools to assist in the analysis of the production process at the production site. When a judgment rule is applied to the judgment process of different products, the judgment rule can be refined to meet different judgment requirements.

[0131] The data processing device based on the data structure model provided in the embodiment of the present application can be specific hardware on the device or software or firmware installed on the device. The device provided in the embodiment of the present application, its implementation principle and the technical effect produced are the same as those in the aforementioned method embodiment. For the sake of brief description, the parts not mentioned in the device embodiment can refer to the corresponding contents in the aforementioned method embodiment. It can be clearly understood by those skilled in the art that for the convenience and simplicity of description, the specific working processes of the systems, devices and units described above can all refer to the corresponding processes in the aforementioned method embodiment, and will not be repeated here.

[0132] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, and the indirect coupling or communication connection of the devices or units can be electrical, mechanical or other forms.

[0133] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0134] In addition, each functional unit in the embodiments provided in the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0135] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods described in each embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0136] It should be noted that similar numbers and letters represent similar items in the following figures. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures. In addition, the terms "first", "second", "third", etc. are only used to distinguish the description and are not to be understood as indicating or implying relative importance.

[0137] Finally, it should be noted that the above-mentioned embodiments are only specific implementation methods of the present application, which are used to illustrate the technical solutions of the present application, rather than to limit them. The protection scope of the present application is not limited thereto. Although the present application is described in detail with reference to the above-mentioned embodiments, ordinary technicians in the field should understand that any technician familiar with the technical field can still modify the technical solutions recorded in the above-mentioned embodiments within the technical scope disclosed in the present application, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application. They should all be included in the protection scope of the present application.

Claims

1. A data processing method based on a data structure model, characterized in that: include: Based on the industry standard statistical process control system judgment rules, control chart types and data parameter names, the first layer data judgment rule model, the second layer data judgment rule model and the third layer data judgment rule model in the three-layer data model are established respectively; Determine the update logic corresponding to each layer of the three-layer data model; Acquire modification data of the target layer data determination rule model in the three-layer data model; Modifying the target layer data determination rule model in the three-layer data model based on the modification data, and updating the three-layer data model according to the update logic corresponding to the target layer data determination rule model; Conducting compliance determination of process control parameters in the production process according to the updated three-layer data model; Based on the industry standard statistical process control system judgment rules, control chart types and data parameter names, the first layer data judgment rule model, the second layer data judgment rule model and the third layer data judgment rule model in the three-layer data model are established respectively, including: Create the first-level data judgment rule model based on the industry standard statistical process control system judgment rules; Based on the standard of the first-level data judgment rule model, it is decomposed into the second-level data judgment rule model according to the type of control chart; On the basis of the second-layer data judgment rule model based on the control chart type, it is decomposed into the third-layer data judgment rule model according to the data parameter name; Determining the update logic corresponding to each layer of the data model in the three-layer data model includes: The update logic corresponding to the first-layer data determination rule model is: if the first-layer data determination rule model in the three-layer data model is changed, then based on the modified first-layer data determination rule model, the second-layer data determination rule model and the third-layer data determination rule model subordinate to the first-layer data determination rule model are changed; The update logic corresponding to the second-layer data determination rule model is: if the second-layer data determination rule model in the three-layer data model is changed, then based on the modified second-layer data determination rule model, the third-layer data determination rule model subordinate to the second-layer data determination rule model is changed, and the first-layer data determination rule model is not changed; The update logic corresponding to the third-layer data determination rule model is: if the third-layer data determination rule model in the three-layer data model is changed, the third-layer data determination rule model is modified, and the first-layer data determination rule model and the second-layer data determination rule model are not changed.

2. The data processing method based on the data structure model according to claim 1 is characterized in that: Acquiring modification data of the target layer data determination rule model in the three-layer data model includes: Obtain data to modify the number of checkpoints in the control rules in the target layer data judgment rule model or to modify the number of points exceeded.

3. The data processing method based on the data structure model according to claim 1, characterized in that: The process control parameters in the production process are judged for compliance based on the updated three-layer data model, including: Determine a data determination rule model for making compliance determinations on data parameters of process control in the production process in the updated three-layer data model; The measured values ​​corresponding to the process control data parameters are input into the third layer data judgment rule model to obtain the output judgment result.

4. A data processing device based on a data structure model, characterized in that: The device comprises: Establishing modules for establishing the first layer data determination rule model, the second layer data determination rule model and the third layer data determination rule model in the three-layer data model based on the industry standard statistical process control system determination rules, control chart types and data parameter names; A determination module, used to determine the update logic corresponding to each layer of the data model in the three-layer data model; A modification module, used for obtaining modification data of the target layer data determination rule model in the three-layer data model; A logic module, used to modify the target layer data determination rule model in the three-layer data model based on the modification data, and update the three-layer data model according to the update logic corresponding to the target layer data determination rule model; A determination module, used for making compliance determination on process control parameters in the production process according to the updated three-layer data model; The establishment module specifically includes: A first model unit, for creating a first-layer data determination rule model based on industry standard statistical process control system determination rules; The second model unit is used to decompose the first-layer data determination rule model into a second-layer data determination rule model based on the standard of the first-layer data determination rule model and according to the control chart type; The third model unit is used to decompose the second-layer data determination rule model based on the control chart type into a third-layer data determination rule model according to the data parameter name; The logic modules include: The first logic unit is used for the update logic corresponding to the first-layer data determination rule model: if the first-layer data determination rule model in the three-layer data model is changed, then based on the modified first-layer data determination rule model, the second-layer data determination rule model and the third-layer data determination rule model subordinate to the first-layer data determination rule model are changed; The second logic unit is used for the update logic corresponding to the second-layer data determination rule model: if the second-layer data determination rule model in the three-layer data model is changed, then based on the modified second-layer data determination rule model, the third-layer data determination rule model subordinate to the second-layer data determination rule model is changed, and the first-layer data determination rule model is not changed; The third logic unit is used for the update logic corresponding to the third-layer data judgment rule model: if the third-layer data judgment rule model in the three-layer data model is changed, the third-layer data judgment rule model is modified, and the first-layer data judgment rule model and the second-layer data judgment rule model are not changed.

5. A computer device comprising a memory, a processor, and a computer program stored in the memory and running on the processor, characterized in that: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 3 are implemented.

6. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 3 are executed.

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